CN105137243A - Method for measuring degeneration power threshold value and damage power threshold value of low noise amplifier - Google Patents
Method for measuring degeneration power threshold value and damage power threshold value of low noise amplifier Download PDFInfo
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- CN105137243A CN105137243A CN201510573741.3A CN201510573741A CN105137243A CN 105137243 A CN105137243 A CN 105137243A CN 201510573741 A CN201510573741 A CN 201510573741A CN 105137243 A CN105137243 A CN 105137243A
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Abstract
The invention discloses a method for measuring a degeneration power threshold value and a damage power threshold value of a low noise amplifier. The method includes the steps of: 1. building a test platform; 2. constructing injection signals; 3. performing testing: (1) measuring a small signal S parameter |S21| and a noise factor NF of a sample to be tested, (2) performing continuous injection on the sample to be tested form a certain time, (3) measuring |S21| and NF of the sample to be tested after the injection, and (4) increasing average power of the injected signals, and repeating the Steps (2) and (3) till acute deterioration of |S21| and NF occurs; 4. drawing a double-y-axis coordinate system curve chart of changes of |S21| and NF as injection power Pin increases, and extracting the degeneration power threshold value and the damage power threshold value from the double-y-axis coordinate system curve chart. The beneficial effects of the method are that a power injection power is good, and a threshold value measuring result can well reflect the anti-power degree of the lower noise amplifier under actual working conditions; and a degeneration power threshold value can be obtained, and high reliability of the lower noise amplifier and a requirement for low noise when the low noise amplifier is used in high-sensitivity electronic equipment are satisfied.
Description
Technical field
The present invention relates to a kind of method measuring microelectronic component and circuit performance parameters, be specifically related to a kind of method measuring LNA degeneration power threshold and damage power threshold, belong to microelectronics technology.
Background technology
Along with the complexity day by day of electromagnetic environment, the threat that microelectronic component and circuit are subject to is increasing.Microelectronic component and circuit can with to degenerate or damage power threshold characterizes to the susceptibility of electromagnetic pulse environment.But, microelectronic component and circuit degradation or damage threshold can be supplied at present to measure the experimental technique Jin You People's Republic of China (PRC) GJB " semiconductor devices Electromagnetic pulse damage threshold experimental technique " of reference, the standard specifies the basic skills and the requirement that measure the Electromagnetic pulse damage threshold of semiconductor devices (discrete device, microcircuit) with direct injection.This standard is applicable to general semiconductor devices and the circuit of radiation hardening requirement, but its experiment belongs to destructive test, and recording threshold value is damage threshold.
Low noise amplifier (lownoiseamplifier, LNA, be called for short LNA) is the amplifier that a kind of noise figure is very low, be generally used for radio frequency electric system front end and have high sensitivity to require electronic equipment in.For LNA, often occurrence features degradation effect there is destructive damage effect under electromagnetic pulse environment before, and for the electronic equipment that radio frequency electric system front end and high sensitivity require, the performance degradation of LNA also can not be ignored, but does not but measure the experimental technique of LNA degeneration power threshold at present.In addition, noise figure is an important indicator of LNA, control noises, raising signal to noise ratio (S/N ratio) are amplified feeble signal minimizing for LNA and are disturbed very important, therefore, extremely irrational in the situation of change judging not this index of reference noise coefficient in whether LNA is damaged, even if reference noise coefficient can not according to usual adopt go to implement with the judgment mode of performance parameter variations 50%, so need badly at present one reasonably, based on the criterion of application demand and statistics experience.
Summary of the invention
For solving the deficiencies in the prior art, the object of the present invention is to provide a kind of method measuring LNA degeneration power threshold and damage power threshold, this assay method not only can realize the estimation of LNA degeneration power threshold to meet LNA high reliability demand, and degree of accuracy and the rationality of LNA damage power threshold mensuration can be improved, also there is the simple advantage of test process simultaneously.
In order to realize above-mentioned target, the present invention adopts following technical scheme:
Measure a method for LNA degeneration power threshold and damage power threshold, it is characterized in that, comprise the following steps:
One, test platform is built:
Signal source, pulse signal generator, power amplifier, adjustable attenuator, power meter, SONOAN, vector network analyzer and directional coupler is utilized to build test platform,
Signal is produced by signal source, this signal pulsed signal generator forms pulse signal, this pulse signal is carried out modulation and obtains pulse modulated carrier signal, pulse modulated carrier signal is amplified through radio-frequency power amplifier, and this signal is connected adjustable attenuator, be connected on power meter by directional coupler to observe Injection Signal power again, finally signal is accessed testing sample input end, simultaneously testing sample input end and output terminal by switch in parallel SONOAN and vector network analyzer for measure power inject before and after LNA small-signal behaviour parameter,
Two, construct Injection Signal pattern, test parameter be set:
The Injection Signal of structure is the periodic modulation rectangular wave pulse signal of sine wave carrier;
Pulse signal generator is set to recurrent pulses export, pulse width τ, recurrence interval T and the pulse number n of pulse signal generator output are set according to testing sample, the carrier frequency f of signalization source output simultaneously, said carrier frequency f within the scope of testing sample working band, and keeps this carrier frequency f constant in test process;
Three, test:
(1) small signal S-parameters of testing sample, is measured with vector network analyzer and SONOAN | S
21| with noise figure NF, and make respective record;
(2), by regulating radio-frequency power amplifier and adjustable attenuator setting Injection Signal average power, continue to inject certain time interval T to testing sample
d=nT, and record this injecting power value;
(3), after this injects and terminates, by switching over utilize vector network analyzer and SONOAN only measure this inject after the small signal S-parameters of testing sample | S
21| with noise figure NF, and note down;
(4), increase Injection Signal average power and inject next time, repeatedly carry out the (2) and the (3) two step, until the small signal S-parameters that measurement obtains | S
21| till there is acute exacerbation with noise figure NF, the maximum number of repetitions that each group testing sample is used for power injection is no more than 4 times;
Four, degeneration power threshold and damage power threshold is extracted:
(1) data processing software, is utilized to draw small signal S-parameters | S
21| with noise figure NF along with injecting power P
inincrease and two y-axis coordinate system curve maps of change;
(2), observe two curves, injecting power stepping increase process in, by first time meet noise figure NF worsen more than 0.4dB time corresponding injecting power be designated as degeneration power threshold, will small signal S-parameters be met | S
21| reduce by more than 50% or noise figure NF when deteriorating to any one condition of more than 10dB corresponding injecting power be designated as damage power threshold.
Aforesaid assay method, it is characterized in that, also comprise in aforementioned test platform: the first isolator and the second isolator, the pulse signal that pulse signal generator is formed first enters power amplifier again through the first isolator, and testing sample output terminal connects load by the second isolator.
Aforesaid assay method, is characterized in that, also comprises: circulator in aforementioned test platform, and aforementioned toroidal device is connected between adjustable attenuator and directional coupler.
Aforesaid assay method, is characterized in that, in step 3, power stepping increasing degree is set to 1dB.
Aforesaid assay method, is characterized in that, in step 3, and small signal S-parameters | S
21| the standard that acute exacerbation occurs with noise figure NF is: small signal S-parameters | S
21| reduce by more than 50%, noise figure NF deteriorates to more than 10dB.
Usefulness of the present invention is:
(1) assay method of the present invention adopts pulse modulated carrier signal as Injection Signal pattern, and carrier frequency is set as the frequency values in LNA working band, make power inject better effects if, threshold measurement result more can reflect the anti-power level under LNA actual operating conditions;
(2) assay method of the present invention utilizes noise figure for referencial use, can obtain LNA degeneration power threshold, meets current LNA high reliability and the requirement for low noise in electronic system front end and high sensitivity electronic equipment;
(3) mensuration of assay method of the present invention to damage power threshold adds noise figure and worsens this as criterion, conscientiously combines the embody rule background of LNA, and has increased substantially measuring accuracy.
Accompanying drawing explanation
Fig. 1 is the FB(flow block) of assay method of the present invention;
Fig. 2 is the composition schematic diagram of test platform in assay method of the present invention;
Fig. 3 is the Injection Signal pattern diagram constructed in assay method of the present invention;
Fig. 4 is the small signal S-parameters that assay method of the present invention obtains | S
21| with noise figure NF along with injecting power P
inincrease and two y-axis coordinate system curve maps of change.
Embodiment
For making object of the present invention, feature and advantage more obviously and easy to understand, below in conjunction with the drawings and specific embodiments, concrete introduction is done to the present invention.
With reference to Fig. 1, the method for mensuration LNA degeneration power threshold of the present invention and damage power threshold comprises the following steps:
One, test platform is built
First, the composition of this test platform is introduced.
With reference to Fig. 2, this test platform builds primarily of signal source, pulse signal generator, power amplifier, adjustable attenuator, directional coupler, power meter, SONOAN and vector network analyzer etc.
In order to avoid the impact of undesired signal, test platform also comprises: the first isolator and the second isolator, and wherein, the first isolator is connected between pulse signal generator and power amplifier, and it can avoid interacting between the instrument of front and back; Second isolator is connected to testing sample output terminal between load, and it can absorb the output power of testing sample, and ensures that testing sample avoids coming from the signal disturbing of absorbing load.
In order to the damage protecting instrument to avoid reflected microwave pulse, test platform also comprises: circulator.Circulator is connected between adjustable attenuator and directional coupler, and it can protect prime instrument to avoid the damage of reflected microwave pulse.
Next, the job order of this test platform is introduced.
With reference to Fig. 2, first a certain frequency signal is produced by signal source, this signal pulsed signal generator forms pulse signal, then this pulse signal is carried out modulation and obtain pulse modulated carrier signal, pulse modulated carrier signal is amplified through the first isolator and radio-frequency power amplifier, the pulse-modulated signal with higher power density is produced after amplifying, this signal of the pulsed modulation of this high power density is successively through adjustable attenuator, testing sample input end can be injected into after circulator and directional coupler, be connected to the power meter in addition on directional coupler simultaneously, power meter is in order to monitor the actual average power be injected in testing sample, testing sample output terminal connects load by the second isolator.The input end of testing sample and output terminal are by switch in parallel SONOAN and vector network analyzer, and SONOAN and vector network analyzer inject the LNA small-signal behaviour parameter of front and back in order to measure power each time.
Two, construct Injection Signal pattern, test parameter is set
Structure Injection Signal pattern as shown in Figure 3, the feature of this Injection Signal pattern is: the periodic modulation rectangular wave pulse signal of sine wave carrier.
The concrete steps realizing the Injection Signal pattern shown in Fig. 3 are as follows:
1, pulse signal generator is set to recurrent pulses export, pulse width τ, recurrence interval T and the pulse number n of pulse signal generator output is set according to testing sample.
2, according to the carrier frequency f in testing sample signalization source, this carrier frequency f within the scope of testing sample working band, and keeps this carrier frequency f constant in test process.
Three, test
1, the small signal S-parameters of testing sample is measured with vector network analyzer | S
21|, measure the noise figure NF of testing sample with SONOAN, the small signal S-parameters of record testing sample | S
21| with noise figure NF.
2, by regulating the output power of radio-frequency power amplifier and the damping capacity of adjustable attenuator, the average power of adjustment Injection Signal, continues to inject certain time interval T to testing sample
d=nT, and record this actual injecting power value injected according to power meter.
3, after this injects and terminates, vector network analyzer and SONOAN is utilized only to measure the small signal S-parameters of the rear testing sample of this injection by switching over | S
21| with noise figure NF, and note down.
4, increase Injection Signal average power to inject, power stepping increasing degree is set to 1dB, repeatedly carries out the 2nd and the 3rd liang of step next time, until measure the small signal S-parameters obtained | S
21| with noise figure NF occur acute exacerbation (small signal S-parameters | S
21| reduce by more than 50%, noise figure NF deteriorates to more than 10dB) till.
If sample yet acute exacerbation does not occur after the continuous stepping of injecting power increases by 4 times, then change one group of testing sample, the maximum number of repetitions that namely each group testing sample injects for power is no more than 4 times, to avoid repeating to inject the cumulative damage effect brought.
Four, degeneration power threshold and damage power threshold is extracted
1, according to the injecting power that records of power injection experiments and the S parameter recorded after injecting and noise figure each time in the 3rd step, data processing software is utilized to draw small signal S-parameters | S
21| with noise figure NF along with injecting power P
inincrease and two y-axis coordinate system curve maps of change.
2, observe two curves, injecting power stepping increase process in, by first time meet noise figure NF worsen more than 0.4dB time corresponding injecting power be designated as degeneration power threshold, will small signal S-parameters be met | S
21| reduce by more than 50% or noise figure NF when deteriorating to any one condition of more than 10dB corresponding injecting power be designated as damage power threshold.
In order to can clearer understanding technical scheme of the present invention, we be for certain model gallium arsenide microwave LNA, further illustrate the method measuring its degeneration power threshold and damage power threshold.
The normal bias voltage of this model gallium arsenide microwave LNA is 2V, and quiescent current is 10mA, and its normal operating center frequency is f
0.
The first step, connects experimental instrument and equipment according to Fig. 2, builds test platform.
Second step, determines Injection Signal pattern and parameter, and carries out the setting of signal source and pulse signal generator, specific as follows:
(1) arranging pulse signal generator is that recurrent pulses export, and the pulse width of output is 60 μ s, and the recurrence interval is 3ms, 10 minutes pulse action duration;
(2) the carrier frequency f that signalization source exports is the normal operating center frequency f of LNA
0.
3rd step, carries out power injection experiments, records the performance number of power injection each time and obtains testing sample small-signal parameter, specific as follows:
(1) before the 1st power injects, the small signal S-parameters of sample is recorded with vector network analyzer | S
21| be 34.5dB, the noise figure NF recording sample with SONOAN is 0.7dB;
(2) constantly Injection Signal power is increased, and record injecting power value each time and the sample small-signal parameter value after injecting;
The small signal S-parameters of sample is recorded after (3) the 35th times power injects | S
21| be 30.4dB, noise figure NF is 2dB;
The small signal S-parameters of sample is recorded after (4) the 36th times power injects | S
21| be-21dB, noise figure NF is 29dB, now small signal S-parameters | S
21| decrease beyond 50%, and noise figure NF deteriorates to more than 10dB, judge that sample damages.
4th step, extracts degeneration power threshold and damage power threshold, specific as follows:
(1) according to the value of injecting power each time recorded in previous step and the small-signal parameter recorded after injecting, draw and obtain the two y-axis coordinate system curve maps shown in Fig. 4;
(2) as can be seen from Figure 4, when power is P
1signal injection after the NF of sample deteriorate to 1.7dB, its deterioration amplitude is that 1dB, NF worsen amplitude first time more than 0.4dB compared with before non-Injection Signal, gets P
1for the degeneration power threshold of LNA;
The performance number of (3) (n+1)th power injections is P
2, the small signal S-parameters of sample after injection | S
21| deteriorate to-21dB, noise figure NF deteriorates to 29dB, small signal S-parameters | S
21| decrease beyond 50%, and noise figure NF deteriorates to more than 10dB, gets P
2for the damage power threshold of LNA.
As can be seen here, assay method of the present invention adopts pulse modulated carrier signal as Injection Signal pattern, and carrier frequency is set as the frequency values in LNA working band, make power inject better effects if, threshold measurement result more can reflect the anti-power level under LNA actual operating conditions.
In addition, assay method of the present invention utilizes noise figure for referencial use, can obtain LNA degeneration power threshold, meets current LNA high reliability and the requirement for low noise in electronic system front end and high sensitivity electronic equipment.
Meanwhile, the mensuration of assay method of the present invention to damage power threshold adds noise figure and worsens this as criterion, conscientiously combines the embody rule background of LNA, and has increased substantially measuring accuracy.
It should be noted that, above-described embodiment does not limit the present invention in any form, the technical scheme that the mode that all employings are equal to replacement or equivalent transformation obtains, and all drops in protection scope of the present invention.
Claims (5)
1. measure a method for LNA degeneration power threshold and damage power threshold, it is characterized in that, comprise the following steps:
One, test platform is built:
Signal source, pulse signal generator, power amplifier, adjustable attenuator, power meter, SONOAN, vector network analyzer and directional coupler is utilized to build test platform,
Signal is produced by signal source, this signal pulsed signal generator forms pulse signal, this pulse signal is carried out modulation and obtains pulse modulated carrier signal, pulse modulated carrier signal is amplified through radio-frequency power amplifier, and this signal is connected adjustable attenuator, be connected on power meter by directional coupler to observe Injection Signal power again, finally signal is accessed testing sample input end, simultaneously testing sample input end and output terminal by switch in parallel SONOAN and vector network analyzer for measure power inject before and after LNA small-signal behaviour parameter,
Two, construct Injection Signal pattern, test parameter be set:
The Injection Signal of structure is the periodic modulation rectangular wave pulse signal of sine wave carrier;
Pulse signal generator is set to recurrent pulses export, pulse width τ, recurrence interval T and the pulse number n of pulse signal generator output are set according to testing sample, the carrier frequency f of signalization source output simultaneously, described carrier frequency f within the scope of testing sample working band, and keeps this carrier frequency f constant in test process;
Three, test:
(1) small signal S-parameters of testing sample, is measured with vector network analyzer and SONOAN | S
21| with noise figure NF, and make respective record;
(2), by regulating radio-frequency power amplifier and adjustable attenuator setting Injection Signal average power, continue to inject certain time interval T to testing sample
d=nT, and record this injecting power value;
(3), after this injects and terminates, by switching over utilize vector network analyzer and SONOAN only measure this inject after the small signal S-parameters of testing sample | S
21| with noise figure NF, and note down;
(4), increase Injection Signal average power and inject next time, repeatedly carry out the (2) and the (3) two step, until the small signal S-parameters that measurement obtains | S
21| till there is acute exacerbation with noise figure NF, the maximum number of repetitions that each group testing sample is used for power injection is no more than 4 times;
Four, degeneration power threshold and damage power threshold is extracted:
(1) data processing software, is utilized to draw small signal S-parameters | S
21| with noise figure NF along with injecting power P
inincrease and two y-axis coordinate system curve maps of change;
(2), observe two curves, injecting power stepping increase process in, by first time meet noise figure NF worsen more than 0.4dB time corresponding injecting power be designated as degeneration power threshold, will small signal S-parameters be met | S
21| reduce by more than 50% or noise figure NF when deteriorating to any one condition of more than 10dB corresponding injecting power be designated as damage power threshold.
2. assay method according to claim 1, it is characterized in that, also comprise in described test platform: the first isolator and the second isolator, the pulse signal that pulse signal generator is formed first enters power amplifier again through the first isolator, and testing sample output terminal connects load by the second isolator.
3. assay method according to claim 1 and 2, is characterized in that, also comprises: circulator in described test platform, and described circulator is connected between adjustable attenuator and directional coupler.
4. assay method according to claim 1, is characterized in that, in step 3, power stepping increasing degree is set to 1dB.
5. the assay method according to claim 1 or 4, is characterized in that, in step 3, and small signal S-parameters | S
21| the standard that acute exacerbation occurs with noise figure NF is: small signal S-parameters | S
21| reduce by more than 50%, noise figure NF deteriorates to more than 10dB.
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