CN105136810A - Steel plate defect detecting platform based on high-strength lighting - Google Patents
Steel plate defect detecting platform based on high-strength lighting Download PDFInfo
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Abstract
The invention relates to a steel plate defect detecting platform based on high-strength lighting. The steel plate defect detecting platform comprises a high-strength lighting light source, a CCD camera, defect information obtaining equipment and a digital signal processor, wherein the CCD camera is used for imaging a steel plate under lighting of the high-strength lighting light source to obtain a steel plate image; the defect information obtaining equipment is connected with the CCD camera and used for obtaining defect information in the steel plate image; the digital signal processor is connected with the defect information obtaining equipment and used for treating the steel plate based on the defect information. By means of the steel plate defect detecting platform, the steel plate with defects can be accurately marked, which facilitates follow-up treatment on the steel plate.
Description
Technical field
The present invention relates to steel plate detection field, particularly relate to a kind of steel plate defect detection platform based on high intensity illumination.
Background technology
Existing steel plate defect detects exists following drawback: lower detection is penetrated in (1) common illumination, and Detection results is not good; (2) lack automatic defect marking mechanism, cause flaw labeling inefficiency; (3) image segmentation threshold selects difficulty, and steel plate background segment is clean not; (4) effective defects detection mechanism is lacked.
For this reason, the present invention proposes a kind of steel plate defect detection platform based on high intensity illumination, high intensity light illumination source can be utilized to throw light on to steel plate to be detected, and efficient automatic defect mark, steel plate background segment and steel plate defect can be realized detect, improve the reliability that steel plate defect detects.
Summary of the invention
In order to solve the technical matters that prior art exists, the invention provides a kind of steel plate defect detection platform based on high intensity illumination, high intensity light illumination source is adopted to throw light on to steel plate to be detected, build detection and the mark structure of streamline, use the pattern of adaptive threshold selection and error image defect location, simultaneously, carry out specific implementation by EPLD control circuit, high-speed cache dual port RAM, fpga chip and institute's digital signal processor, improve precision and the efficiency of steel plate defect detection on the whole.
According to an aspect of the present invention, provide a kind of steel plate defect detection platform based on high intensity illumination, described detection platform comprises high intensity light illumination source, CCD camera, defect information obtains equipment and digital signal processor, described CCD camera carries out imaging to steel plate under the illumination of described high intensity light illumination source, to obtain steel plate image, described defect information obtains equipment and is connected with described CCD camera, for obtaining the defect information in described steel plate image, described digital signal processor and described defect information obtain equipment connection, based on described defect information, steel plate is processed.
More specifically, described based in the steel plate defect detection platform of high intensity illumination, also comprise: flaw labeling mechanism, be connected with described digital signal processor, for receiving the marking signal that described digital signal processor sends, flaw labeling is carried out to corresponding steel plate, synchronizing linkage, obtain equipment connection with described flaw labeling mechanism and described defect information, for synchronization mark signal and existing defects signal, transfer structure, transmits steel plate to be detected for block-by-block, portable hard drive, for prestoring steel plate gray threshold scope and default defect threshold value, also for prestoring benchmark steel plate image, described benchmark steel plate image is take to benchmark steel plate block the image only including steel plate block pixel obtained, high-speed cache dual port RAM, is arranged on described defect information and obtains between equipment and described digital signal processor, EPLD control circuit, connect described high-speed cache dual port RAM, described defect information obtains equipment and described digital signal processor, for controlling described high-speed cache dual port RAM, described defect information obtains data interaction between equipment and described digital signal processor and sequential, power-supply unit, comprise solar powered device, commercial power interface, change-over switch and electric pressure converter, described change-over switch is connected respectively with described solar powered device and described commercial power interface, line voltage size according to commercial power interface place determines whether be switched to described solar powered device to be powered by described solar powered device, described electric pressure converter is connected with described change-over switch, with the 5V voltage transitions will inputted by change-over switch for 3.3V voltage, described high intensity light illumination source is high-frequency florescent lamp, is arranged on directly over described transfer structure, described CCD camera adopts double focus system, is arranged on directly over described transfer structure together with described high intensity light illumination source, described defect information obtains equipment and comprises Image semantic classification subset, Threshold selection subset, Target Segmentation subset and defect extraction subset, described Image semantic classification subset is connected with described CCD camera, for receiving described steel plate image, and edge enhancing process, wavelet filtering process, image expansion process, Image erosion process and gray processing process are performed successively, to obtain gray level image to described steel plate image, described Threshold selection subset is connected respectively with described portable hard drive and described Image semantic classification subset, for selecting a value as preliminary election gray threshold successively from described steel plate gray threshold scope, preliminary election gray threshold is adopted gray level image to be divided into preliminary election background area and pre-selected target region, calculate the area ratio area ratio as a setting that preliminary election background area occupies gray level image, calculate the pixel average gray value average gray value as a setting of preliminary election background area, calculate pre-selected target region and occupy the area ratio of gray level image as target area ratio, calculate the pixel average gray value in pre-selected target region as target average gray value, background average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by background area than to obtain the first product, target average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by target area than to obtain the second product, by the first sum of products second product addition to obtain and value, select and be worth maximum preliminary election gray threshold as target gray threshold value, described Target Segmentation subset is connected with described Threshold selection subset, for adopting target gray threshold value, gray level image is divided into background image and target image, described defect is extracted subset and is connected respectively with described Target Segmentation subset and described portable hard drive, the gray-scale value summation calculating all pixels in target image is using as the first gray-scale value summation, in Calculation Basis steel plate image, the gray-scale value summation of all pixels is using as the second gray-scale value summation, first gray-scale value summation is deducted the absolute value of the difference that the second gray-scale value summation obtains as defect reference value, when defect reference value is greater than default defect threshold value, judge steel plate existing defects and export existing defects signal, when defect reference value is less than or equal to default defect threshold value, judge steel plate not existing defects export not existing defects signal, described digital signal processor and described defect information obtain equipment and described flaw labeling mechanism is connected respectively, for when receiving described existing defects signal, sending marking signal and carrying out flaw labeling to control described flaw labeling mechanism to corresponding steel plate, wherein, described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect extraction subset adopts the fpga chip of different model to realize respectively.
More specifically, based in the steel plate defect detection platform of high intensity illumination, described detection platform also comprises: display device described, is connected with described Target Segmentation subset, for showing the target image that described Target Segmentation subset exports in real time.
More specifically, described based in the steel plate defect detection platform of high intensity illumination: described display device is LCDs.
More specifically, described based in the steel plate defect detection platform of high intensity illumination: described CCD camera comprises line array CCD camera.
More specifically, described based in the steel plate defect detection platform of high intensity illumination: described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect extract subset be integrated on one piece of surface-mounted integrated circuit.
Accompanying drawing explanation
Below with reference to accompanying drawing, embodiment of the present invention are described, wherein:
Fig. 1 is the block diagram of the steel plate defect detection platform based on high intensity illumination illustrated according to an embodiment of the present invention.
Reference numeral: 1 high intensity light illumination source; 2CCD camera; 3 defect information obtain equipment; 4 digital signal processors
Embodiment
Below with reference to accompanying drawings the embodiment of the steel plate defect detection platform based on high intensity illumination of the present invention is described in detail.
Steel plate is the conventional material of building field, and its quality directly determines the reliability of building finished product.In order to effectively detect the steel plate of oneself firm finished product, each Plate Production manufacturer generally adopts common visible ray to detect steel plate to be detected, and the steel plate defect detection scheme precision based on image procossing adopted at present is all not satisfactory.
In order to overcome above-mentioned deficiency, the present invention has built a kind of steel plate defect detection platform based on high intensity illumination, high intensity light illumination source is adopted to throw light on to steel plate to be detected, for the external appearance characteristic of steel plate and steel plate defect, introduce various image processing equipment and carry out image procossing targetedly, thus solve the problem.
Fig. 1 is the block diagram of the steel plate defect detection platform based on high intensity illumination illustrated according to an embodiment of the present invention, described detection platform comprises high intensity light illumination source, CCD camera, defect information obtains equipment and digital signal processor, described CCD camera carries out imaging to steel plate under the illumination of described high intensity light illumination source, to obtain steel plate image, described defect information obtains equipment and is connected with described CCD camera, for obtaining the defect information in described steel plate image, described digital signal processor and described defect information obtain equipment connection, based on described defect information, steel plate is processed.
Then, continue to be further detailed the concrete structure of the steel plate defect detection platform based on high intensity illumination of the present invention.
Described detection platform also comprises: flaw labeling mechanism, is connected with described digital signal processor, for receiving the marking signal that described digital signal processor sends, carries out flaw labeling to corresponding steel plate.
Described detection platform also comprises: synchronizing linkage, obtains equipment connection with described flaw labeling mechanism and described defect information, for synchronization mark signal and existing defects signal.
Described detection platform also comprises: transfer structure, transmits steel plate to be detected for block-by-block.
Described detection platform also comprises: portable hard drive, for prestoring steel plate gray threshold scope and default defect threshold value, also for prestoring benchmark steel plate image, described benchmark steel plate image is take to benchmark steel plate block the image only including steel plate block pixel obtained.
Described detection platform also comprises: high-speed cache dual port RAM, is arranged on described defect information and obtains between equipment and described digital signal processor.
Described detection platform also comprises: EPLD control circuit, connect described high-speed cache dual port RAM, described defect information obtains equipment and described digital signal processor, for controlling described high-speed cache dual port RAM, described defect information obtains data interaction between equipment and described digital signal processor and sequential.
Described detection platform also comprises: power-supply unit, comprise solar powered device, commercial power interface, change-over switch and electric pressure converter, described change-over switch is connected respectively with described solar powered device and described commercial power interface, line voltage size according to commercial power interface place determines whether be switched to described solar powered device to be powered by described solar powered device, described electric pressure converter is connected with described change-over switch, with the 5V voltage transitions will inputted by change-over switch for 3.3V voltage.
Described high intensity light illumination source is high-frequency florescent lamp, is arranged on directly over described transfer structure.
Described CCD camera adopts double focus system, is arranged on directly over described transfer structure together with described high intensity light illumination source.
Described defect information obtains equipment and comprises Image semantic classification subset, Threshold selection subset, Target Segmentation subset and defect extraction subset.
Described Image semantic classification subset is connected with described CCD camera, for receiving described steel plate image, and edge enhancing process, wavelet filtering process, image expansion process, Image erosion process and gray processing process are performed successively, to obtain gray level image to described steel plate image.
Described Threshold selection subset is connected respectively with described portable hard drive and described Image semantic classification subset, for selecting a value as preliminary election gray threshold successively from described steel plate gray threshold scope, preliminary election gray threshold is adopted gray level image to be divided into preliminary election background area and pre-selected target region, calculate the area ratio area ratio as a setting that preliminary election background area occupies gray level image, calculate the pixel average gray value average gray value as a setting of preliminary election background area, calculate pre-selected target region and occupy the area ratio of gray level image as target area ratio, calculate the pixel average gray value in pre-selected target region as target average gray value, background average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by background area than to obtain the first product, target average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by target area than to obtain the second product, by the first sum of products second product addition to obtain and value, select and be worth maximum preliminary election gray threshold as target gray threshold value.
Described Target Segmentation subset is connected with described Threshold selection subset, for adopting target gray threshold value, gray level image is divided into background image and target image.
Described defect is extracted subset and is connected respectively with described Target Segmentation subset and described portable hard drive, the gray-scale value summation calculating all pixels in target image is using as the first gray-scale value summation, in Calculation Basis steel plate image, the gray-scale value summation of all pixels is using as the second gray-scale value summation, first gray-scale value summation is deducted the absolute value of the difference that the second gray-scale value summation obtains as defect reference value, when defect reference value is greater than default defect threshold value, judge steel plate existing defects and export existing defects signal, when defect reference value is less than or equal to default defect threshold value, judge steel plate not existing defects export not existing defects signal.
Described digital signal processor and described defect information obtain equipment and described flaw labeling mechanism is connected respectively, for when receiving described existing defects signal, sending marking signal and carrying out flaw labeling to control described flaw labeling mechanism to corresponding steel plate; Wherein, described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect extraction subset adopts the fpga chip of different model to realize respectively.
Alternatively, in described detection platform: described detection platform also comprises: display device, be connected with described Target Segmentation subset, for showing the target image that described Target Segmentation subset exports in real time; Described display device is LCDs; Described CCD camera comprises line array CCD camera; And described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect extraction subset can be integrated on one piece of surface-mounted integrated circuit.
In addition, FPGA (Field-ProgrammableGateArray), i.e. field programmable gate array, he is the product further developed on the basis of the programming devices such as PAL, GAL, CPLD.He occurs as a kind of semi-custom circuit in special IC (ASIC) field, has both solved the deficiency of custom circuit, overcomes again the shortcoming that original programming device gate circuit number is limited.
With the circuit design that hardware description language (Verilog or VHDL) completes, can through simple comprehensive and layout, being burned onto fast on FPGA and testing, is the technology main flow of modern IC designs checking.These can be edited element and can be used to realize some basic logic gates (such as AND, OR, XOR, NOT) or more more complex combination function such as demoder or mathematical equation.Inside most FPGA, in these editable elements, also comprise memory cell such as trigger (Flip-flop) or other more complete block of memory.System designer can be coupled together the logical block of FPGA inside by editable connection as required, just looks like that a breadboard has been placed in a chip.One dispatch from the factory after the logical block of finished product FPGA can change according to deviser with being connected, so FPGA can complete required logic function.
FPGA is in general slow than the speed of ASIC (special IC), realizes same function ratio ASIC circuit area and wants large.But they also have a lot of advantages such as can finished product fast, can be modified the mistake in correction program and more cheap cost.Manufacturer also may provide the FPGA of cheap still edit capability difference.Because these chips have poor can edit capability, so exploitations of these designs complete on common FPGA, then design is transferred to one and is similar on the chip of ASIC.Another method is with CPLD (ComplexProgrammableLogicDevice, CPLD).The exploitation of FPGA has a great difference relative to the exploitation of conventional P C, single-chip microcomputer.FPGA, based on concurrent operation, realizes with hardware description language; Very large difference is had compared to the sequential operation of PC or single-chip microcomputer (no matter being von Neumann structure or Harvard structure).
As far back as 1980 mid-nineties 90s, FPGA takes root in PLD equipment.CPLD and FPGA includes the Programmadle logic unit of some relatively large amount.The density of CPLD logic gate is between several thousand to several ten thousand logical blocks, and FPGA normally arrives millions of several ten thousand.The key distinction of CPLD and FPGA is their system architecture.CPLD is a somewhat restrictive structure.This structure is arranged by the logical groups of one or more editable result sum and forms with the register of the locking of some relatively small amounts.Such result lacks editor's dirigibility, but but have the time delay and logical block that can estimate to the advantage of linkage unit height ratio.And FPGA has a lot of linkage units, although allow him edit more flexibly like this, structure is complicated many.
Adopt the steel plate defect detection platform based on high intensity illumination of the present invention, not high and lack the technical matters of efficient detection platform for general lighting light accuracy of detection in prior art, by building of the structure of pipeline and mark, high intensity light illumination source is adopted to irradiate steel plate to be detected, more crucially, introduce the image processing equipment of various applicable steel plate profile, improve efficiency and the robotization level of detection platform on the whole.
Be understandable that, although the present invention with preferred embodiment disclose as above, but above-described embodiment and be not used to limit the present invention.For any those of ordinary skill in the art, do not departing under technical solution of the present invention ambit, the technology contents of above-mentioned announcement all can be utilized to make many possible variations and modification to technical solution of the present invention, or be revised as the Equivalent embodiments of equivalent variations.Therefore, every content not departing from technical solution of the present invention, according to technical spirit of the present invention to any simple modification made for any of the above embodiments, equivalent variations and modification, all still belongs in the scope of technical solution of the present invention protection.
Claims (6)
1. the steel plate defect detection platform based on high intensity illumination, described detection platform comprises high intensity light illumination source, CCD camera, defect information acquisition equipment and digital signal processor, described CCD camera carries out imaging to steel plate under the illumination of described high intensity light illumination source, to obtain steel plate image, described defect information obtains equipment and is connected with described CCD camera, for obtaining the defect information in described steel plate image, described digital signal processor and described defect information obtain equipment connection, process steel plate based on described defect information.
2., as claimed in claim 1 based on the steel plate defect detection platform of high intensity illumination, it is characterized in that, described detection platform also comprises:
Flaw labeling mechanism, is connected with described digital signal processor, for receiving the marking signal that described digital signal processor sends, carries out flaw labeling to corresponding steel plate;
Synchronizing linkage, obtain equipment connection with described flaw labeling mechanism and described defect information, for synchronization mark signal and existing defects signal;
Transfer structure, transmits steel plate to be detected for block-by-block;
Portable hard drive, for prestoring steel plate gray threshold scope and default defect threshold value, also for prestoring benchmark steel plate image, described benchmark steel plate image is take to benchmark steel plate block the image only including steel plate block pixel obtained;
High-speed cache dual port RAM, is arranged on described defect information and obtains between equipment and described digital signal processor;
EPLD control circuit, connect described high-speed cache dual port RAM, described defect information obtains equipment and described digital signal processor, for controlling described high-speed cache dual port RAM, described defect information obtains data interaction between equipment and described digital signal processor and sequential;
Power-supply unit, comprise solar powered device, commercial power interface, change-over switch and electric pressure converter, described change-over switch is connected respectively with described solar powered device and described commercial power interface, line voltage size according to commercial power interface place determines whether be switched to described solar powered device to be powered by described solar powered device, described electric pressure converter is connected with described change-over switch, with the 5V voltage transitions will inputted by change-over switch for 3.3V voltage;
Described high intensity light illumination source is high-frequency florescent lamp, is arranged on directly over described transfer structure;
Described CCD camera adopts double focus system, is arranged on directly over described transfer structure together with described high intensity light illumination source;
Described defect information obtains equipment and comprises Image semantic classification subset, Threshold selection subset, Target Segmentation subset and defect extraction subset, described Image semantic classification subset is connected with described CCD camera, for receiving described steel plate image, and edge enhancing process, wavelet filtering process, image expansion process, Image erosion process and gray processing process are performed successively, to obtain gray level image to described steel plate image, described Threshold selection subset is connected respectively with described portable hard drive and described Image semantic classification subset, for selecting a value as preliminary election gray threshold successively from described steel plate gray threshold scope, preliminary election gray threshold is adopted gray level image to be divided into preliminary election background area and pre-selected target region, calculate the area ratio area ratio as a setting that preliminary election background area occupies gray level image, calculate the pixel average gray value average gray value as a setting of preliminary election background area, calculate pre-selected target region and occupy the area ratio of gray level image as target area ratio, calculate the pixel average gray value in pre-selected target region as target average gray value, background average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by background area than to obtain the first product, target average gray value is deducted the overall average gray-scale value of gray level image, the difference obtained square to be multiplied by target area than to obtain the second product, by the first sum of products second product addition to obtain and value, select and be worth maximum preliminary election gray threshold as target gray threshold value, described Target Segmentation subset is connected with described Threshold selection subset, for adopting target gray threshold value, gray level image is divided into background image and target image, described defect is extracted subset and is connected respectively with described Target Segmentation subset and described portable hard drive, the gray-scale value summation calculating all pixels in target image is using as the first gray-scale value summation, in Calculation Basis steel plate image, the gray-scale value summation of all pixels is using as the second gray-scale value summation, first gray-scale value summation is deducted the absolute value of the difference that the second gray-scale value summation obtains as defect reference value, when defect reference value is greater than default defect threshold value, judge steel plate existing defects and export existing defects signal, when defect reference value is less than or equal to default defect threshold value, judge steel plate not existing defects export not existing defects signal,
Described digital signal processor and described defect information obtain equipment and described flaw labeling mechanism is connected respectively, for when receiving described existing defects signal, sending marking signal and carrying out flaw labeling to control described flaw labeling mechanism to corresponding steel plate;
Wherein, described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect extraction subset adopts the fpga chip of different model to realize respectively.
3. steel plate defect detection platform as claimed in claim 2, it is characterized in that, described detection platform also comprises:
Display device, is connected with described Target Segmentation subset, for showing the target image that described Target Segmentation subset exports in real time.
4. steel plate defect detection platform as claimed in claim 3, is characterized in that:
Described display device is LCDs.
5. steel plate defect detection platform as claimed in claim 2, is characterized in that:
Described CCD camera comprises line array CCD camera.
6. steel plate defect detection platform as claimed in claim 2, is characterized in that:
Described Image semantic classification subset, described Threshold selection subset, described Target Segmentation subset and described defect are extracted subset and are integrated on one piece of surface-mounted integrated circuit.
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Application publication date: 20151209 |