CN105095035A - PCIE (Peripheral Component Interface Express) test card used for mass production test of computer motherboard - Google Patents
PCIE (Peripheral Component Interface Express) test card used for mass production test of computer motherboard Download PDFInfo
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- CN105095035A CN105095035A CN201510529992.1A CN201510529992A CN105095035A CN 105095035 A CN105095035 A CN 105095035A CN 201510529992 A CN201510529992 A CN 201510529992A CN 105095035 A CN105095035 A CN 105095035A
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- pcie
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- card
- test card
- computer motherboard
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Abstract
The invention discloses a PCIE (Peripheral Component Interface Express) test card used for a mass production test of a computer motherboard, and belongs to a field of PCIE test cards. The PCIE test card uses a cheap PCIE patch, wherein the patch can be made into three PCIE test cards, namely X4, X8 and X16; the X4, X8 and X16 three cards are unified as a production test item, so that PCIE test equipment can be standardized. The PCIE test card can be used for testing PCIE slots of different speeds, so that one card can have multiple functions and uses and the use cost and time can be saved.
Description
Technical field
The present invention relates to PCIE test card field, specifically a kind of PCIE test card for computer motherboard large-scale production test.
Background technology
In current computer systems, mainboard generally all can comprise 3 ~ 8 PCIe interface slots or PCIe interface adapter also has PCIe slot, whether production test all needs to test these slot functions when often planting mainboard perfect, to guarantee mainboard as well plate, in mainboard production run before, the test of PCIe slot is general uses various network interface card, HBA, SAS card, video card etc., these card costs used are very high, and the PCIe test card of often kind of mainboard use mixes, testing apparatus management and control bothers, each mainboard shares test card difficulty, cause testing apparatus with high costs, utilization rate is low.
summary of the invention
Technical assignment of the present invention is to provide a kind of PCIE test card for computer motherboard large-scale production test, solves above technical matters.
The technical solution adopted for the present invention to solve the technical problems is:
This PCIE test card uses a kind of PCIE paster of cheapness, and described paster can make X4, X8, X16 tri-kinds of PCIE test cards, is blocked by described X4, X8, X16 tri-kinds unified as production test article, makes the standardization of PCIE testing apparatus.
Described PCIE test card is by toggle switch governing speed, and described speed is divided into three gears, and three described gears are respectively Gen1, Gen2, Gen3.
A kind of PCIE test card for computer motherboard large-scale production test of the present invention compared to the prior art, there is following beneficial effect: this PCIE test card may be used for the test of friction speed PCIe slot, accomplish a card multipotency, one card for multiple uses, save use cost and time.
Accompanying drawing explanation
Below in conjunction with accompanying drawing, the present invention is further described.
Accompanying drawing 1 is a kind of FB(flow block) of the PCIE test card for computer motherboard large-scale production test.
Embodiment
Below in conjunction with the drawings and specific embodiments, the invention will be further described.
As shown in Figure 1, a kind of PCIE test card for computer motherboard large-scale production test of the present invention, its structure comprises a kind of PCIE paster of cheapness, described paster can make X4, X8, X16 tri-kinds of PCIE test cards, described X4, X8, X16 tri-kinds is blocked unified as production test article, make the standardization of PCIE testing apparatus.Described PCIE test card is by toggle switch governing speed, and described speed is divided into three gears, and three described gears are respectively Gen1, Gen2, Gen3.
In use, Test Engineer determines to select which kind of test board (X4, X8, X16 see PCIE bandwidth usually, the test card according to bandwidth selection is suitable for), then carry out the test of PCIe slot according to PCIe slot bandwidth; If the PCIe slot of same bandwidth, but speed is different, can arrange the speed changing test card, realize versatility by toggle switch.
By embodiment above, described those skilled in the art can be easy to realize the present invention.But should be appreciated that the present invention is not limited to above-mentioned embodiment.On the basis of disclosed embodiment, described those skilled in the art can the different technical characteristic of combination in any, thus realizes different technical schemes.
Claims (2)
1. the PCIE test card for computer motherboard large-scale production test, it is characterized in that this PCIE test card uses a kind of PCIE paster of cheapness, described paster can make X4, X8, X16 tri-kinds of PCIE test cards, described X4, X8, X16 tri-kinds is blocked unified as production test article, make the standardization of PCIE testing apparatus.
2. a kind of PCIE test card for computer motherboard large-scale production test according to claim 1, it is characterized in that described PCIE test card is by toggle switch governing speed, described speed is divided into three gears, and three described gears are respectively Gen1, Gen2, Gen3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510529992.1A CN105095035A (en) | 2015-08-26 | 2015-08-26 | PCIE (Peripheral Component Interface Express) test card used for mass production test of computer motherboard |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510529992.1A CN105095035A (en) | 2015-08-26 | 2015-08-26 | PCIE (Peripheral Component Interface Express) test card used for mass production test of computer motherboard |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105095035A true CN105095035A (en) | 2015-11-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510529992.1A Pending CN105095035A (en) | 2015-08-26 | 2015-08-26 | PCIE (Peripheral Component Interface Express) test card used for mass production test of computer motherboard |
Country Status (1)
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| CN (1) | CN105095035A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402867A (en) * | 2017-07-07 | 2017-11-28 | 山东超越数控电子有限公司 | Health and fitness information collection and fan control system and implementation method based on Shen prestige platform |
| CN110287071A (en) * | 2019-06-13 | 2019-09-27 | 安徽科达自动化集团股份有限公司 | The compatible PCIE interface of high low speed tests the speed card |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101276304A (en) * | 2007-03-30 | 2008-10-01 | 鸿富锦精密工业（深圳）有限公司 | PCIE test card |
-
2015
- 2015-08-26 CN CN201510529992.1A patent/CN105095035A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101276304A (en) * | 2007-03-30 | 2008-10-01 | 鸿富锦精密工业（深圳）有限公司 | PCIE test card |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107402867A (en) * | 2017-07-07 | 2017-11-28 | 山东超越数控电子有限公司 | Health and fitness information collection and fan control system and implementation method based on Shen prestige platform |
| CN110287071A (en) * | 2019-06-13 | 2019-09-27 | 安徽科达自动化集团股份有限公司 | The compatible PCIE interface of high low speed tests the speed card |
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| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20151125 |
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| RJ01 | Rejection of invention patent application after publication |