Summary of the invention
For solving the problem, the invention provides a kind of electric propulsion spacecraft plume parameter acquiring method.
Electric propulsion spacecraft plume parameter acquiring method of the present invention, it comprises the following steps:
Step 1, all parts of assembling electric propulsion spacecraft plume parameter obtaining device: head end vacuum storehouse view window being located at vacuum storehouse; Vacuum-pumping system, air feed bottle are communicated with the tail end in vacuum storehouse respectively; Connected with electric thruster by IGNITION CONTROL cabinet, computing machine connects with two electric thruster multiparameter diagnostic devices respectively; Arrange installing plate in inside, vacuum storehouse, the first electric thruster multiparameter diagnostic device is installed in this installing plate one end, and the other end fixes travel(l)ing rest; Electric thruster is installed on fixing travel(l)ing rest; Movable on the vacuum storehouse inwall fixing electric thruster one end place at installing plate the second electric thruster multiparameter diagnostic device is installed, controls the second electric thruster multiparameter diagnostic device according to the instruction of computing machine and move to assigned address along the sliding rail on the inwall of vacuum storehouse; And the first electric thruster multiparameter diagnostic device place is parallel to each other perpendicular to the radial section of installing plate and the electric thruster place radial section perpendicular to installing plate, and the distance between two radial sections is greater than 100cm;
Step 2, design and installation two electric thruster multiparameter diagnostic devices (3, 6) each composition structure, select entity case as test bracket, counterbore has been dug at the end face of entity case, quartz crystal microbalance QCM is installed in counterbore, and by Langmuir probe LP, retardance potential analysis instrument RPA is installed on the end face of entity case, by the centre of sphere of Langmuir probe LP, the center of retardance potential analysis instrument RPA and the center of quartz crystal microbalance QCM all project on the end face of entity case, then Langmuir probe LP, retardance potential analysis instrument RPA, the installation site of quartz crystal microbalance QCM meets:
Between the gnomonic projection of Langmuir probe LP and the central projection of retardance potential analysis instrument RPA, straight line minor increment is greater than measured plasma Debye length; Between the gnomonic projection of Langmuir probe LP and the central projection of quartz crystal microbalance QCM, straight line minor increment is greater than measured plasma Debye length; Between the central projection of retardance potential analysis instrument RPA and the central projection of quartz crystal microbalance QCM, straight line minor increment is greater than measured plasma Debye length;
Step 3, starts vacuum-pumping system, makes vacuum storehouse be operated in molecular flow duty; Treat that the vacuum tightness in vacuum storehouse is better than 1 × 10
-3after Pa after 30 minutes, the quartz crystal microbalance contamination monitoring system of start-up simulation machine, and adjust the zero point of quartz crystal microbalance; Until quartz crystal microbalance QCM (15) steady operation after more than 30 minutes, open air feed bottle, utilize IGNITION CONTROL cabinet to control electric thruster igniting, electric thruster jet plasma, plasma sputtering produces pollutant; Electric thruster constant ignition keeps after more than 30 minutes, the online in-situ monitoring Langmuir probe equipment of start-up simulation machine, obtains electric current-voltage curve and I-V curve of Langmuir probe LP; The online in-situ monitoring retardance potential analysis instrument equipment of start-up simulation machine, obtains I-V curve of retardance potential analysis instrument RPA; And frequency and the temperature of quartz crystal microbalance QCM is obtained by the quartz crystal microbalance contamination monitoring system of computing machine; After closing electric thruster, close quartz crystal microbalance contamination monitoring system, online in-situ monitoring Langmuir probe equipment, online in-situ monitoring retardance potential analysis instrument equipment successively, finally close vacuum-pumping system.
Further, the acquisition speed of I-V curve of LP, I-V curve of RPA, the frequency of QCM and temperature is all greater than 1 time/Min.
Further, the thermal interface of 70mm × 70mm is set in quartz crystal microbalance QCM bottom surface.
Further, the scanning voltage of described Langmuir probe LP is-50 ~ 100V.
Further, the hinders voltage of described retardance potential analysis instrument RPA is 60V, and scanning voltage is 0 ~ 100V.
Further, the eigenfrequency of described quartz crystal microbalance QCM is 10MHz, 15MHz, 20MHz.
Further, described Langmuir probe LP is hollow ball shape Langmuir probe, and with cleaning assembly, this cleaning assembly comprises:
Comprise halogen lamp, halogen lamp ceramic bracket, halogen lamp service cable, ceramic insulation base, hollow metallic rod, temperature detecting resistance, temperature detecting resistance service cable;
If the hollow ball shape Langmuir probe center of circle is O point, be Z axis straight up, XOY plane is perpendicular to OZ axle; 9 halogen lamps are evenly installed by 60 ° of angular separation in the inner XOZ plane of hollow ball shape Langmuir probe and YOZ planar interior surfaces, and the hollow ball shape Langmuir probe inside surface of OZ axle negative sense has cabling mouth, does not install halogen lamp; Temperature detecting resistance Surface Mount is in hollow ball shape Langmuir probe inside surface, and halogen lamp service cable and temperature detecting resistance service cable adopt multicore single layer dielectrics shielded cable to be connected with halogen lamp and temperature detecting resistance respectively through hollow metallic rod; Hollow metallic rod adopts vacuum brazing to be fixed in the ducted body of ceramic insulation base; Halogen lamp service cable is connected computing machine with temperature detecting resistance service cable.
Further, described computing machine utilizes temperature measurement circuit module and halogen lamp supply module to carry out the cleaning of hollow ball shape Langmuir probe surface contaminant;
Temperature measurement circuit module, after the thermometric instruction receiving computing machine, is powered to temperature detecting resistance, from temperature detecting resistance collecting temperature data; Halogen lamp supply module, after receiving the clear instruction of computing machine, carries out confession electrical heating to halogen lamp; And from temperature measurement circuit module reading temperature data, when judging that hollow ball shape Langmuir probe surface temperature reaches setting warm temperature K according to temperature data, continuing heating one section of redundancy time T, then stopping heating, cleaning complete; Described warm temperature K span is 300 DEG C ~ 400 DEG C; Redundancy time T span is 20 seconds ~ 300 seconds.
Further, in described Langmuir probe LP, retardance potential analysis instrument RPA, quartz crystal microbalance QCM, all insulation assemblies adopt Al
2o
3stupalith.
Further, in described step 2: the height of described entity case is 36mm, the bottom surface of counterbore is 55mm × 55mm, is highly 36mm; The end face of entity case is provided with LP erecting bed and RPA erecting bed, is respectively used to Langmuir probe LP and retardance potential analysis instrument RPA is installed; And the maximum height of LP erecting bed and installation Langmuir probe LP is 126 ± 1mm; Bottom surface and the end face of RPA erecting bed are tangent, and the angle between end face and bottom surface is 30 degree, and the maximum height of end face and bottom surface is 27.5mm.
Beneficial effect:
(1) the present invention is under Simulated Spacecraft orbital environment condition, testing plasma bulk potential, plasma density, electron temperature, plasma ion power spectrum, electric propulsion plume contamination thing deposition etc., thruster surrounding space parameter distribution.
(2) the present invention is under Simulated Spacecraft orbital environment condition, improves the sensitivity of China's electric propulsion engine plume plasma contamination monitoring, can reach 1.10 × 10
-9~ 4.42 × 10
-9g/cm
2;
(3) use of oil-free vacuum system in the present invention, for this method providing thin atmosphere and clean environment condition, considerably increasing the accuracy of measurement data in process of the test, reducing electric thruster test run risk.
(4) measurement of contamination data and collection in electric thruster multiparameter diagnostic device in the present invention, electric propulsion spacecraft plasma plume parameter distribution and spacecraft on-orbit performance decline situation under simulated space condition can be estimated, for the development of electric propulsion spacecraft and life prediction provide guidance and foundation, thus ensure that electric propulsion spacecraft space works safely and reliably, process of the test is reliable and stable, and repdocutbility is good.
(5) the present invention has the advantages that to adapt to the characteristic test of electric propulsion spacecraft engine plume, and is adapted to scale test.
Embodiment
Electric propulsion spacecraft plume parameter acquiring method of the present invention, it comprises the following steps:
Step 1, as shown in Figure 1, all parts of assembling electric propulsion spacecraft plume parameter obtaining device: head end vacuum storehouse view window 1 being located at vacuum storehouse 2; Vacuum-pumping system 9, air feed bottle 10 communicate with the tail end in vacuum storehouse 2 respectively; IGNITION CONTROL cabinet 8 connects with electric thruster 4, and computing machine 7 connects with two electric thruster multiparameter diagnostic devices (3,6) respectively.Arrange installing plate in inside, vacuum storehouse 2, the first electric thruster multiparameter diagnostic device 3 is installed in this installing plate one end, and the other end fixes travel(l)ing rest 5, and electric thruster 4 is installed on fixing travel(l)ing rest 5; Movable on vacuum storehouse 2 inwall fixing electric thruster 4 one end place at installing plate the second electric thruster multiparameter diagnostic device 6 is installed, controls the second electric thruster multiparameter diagnostic device 6 according to the instruction of computing machine 7 and move to assigned address along the sliding rail on the inwall of vacuum storehouse 2.Second electric thruster multiparameter diagnostic device 6 plays supplementary function to the first electric thruster multiparameter diagnostic device 3, according to the position determining the second electric thruster multiparameter diagnostic device 6 in actual job according to the plasma potential of spacecraft correspondence position, plasma density, electron temperature, plasma ion power spectrum, electric propulsion plume contamination thing deposition parameter.
Wherein, the first electric thruster multiparameter diagnostic device 3 place is parallel to each other perpendicular to the radial section of installing plate and the electric thruster 4 place radial section perpendicular to installing plate, and the distance between two radial sections is greater than 100cm.
Step 2, design and installation two electric thruster multiparameter diagnostic devices 3, each composition structure of 6, as shown in Figure 4 and Figure 5, select entity case as test bracket 21, counterbore 27 has been dug at the end face of entity case, quartz crystal microbalance QCM25 is installed in counterbore 27, and by Langmuir probe LP22, retardance potential analysis instrument RPA23 is installed on the end face of entity case, by the centre of sphere of Langmuir probe LP22, the center of retardance potential analysis instrument RPA23 and the center of quartz crystal microbalance QCM25 all project on the end face of entity case, then Langmuir probe LP22, retardance potential analysis instrument RPA23, the installation site of quartz crystal microbalance QCM25 meets:
Between the gnomonic projection of Langmuir probe LP22 and the central projection of retardance potential analysis instrument RPA23, straight line minor increment is greater than measured plasma Debye length; Between the gnomonic projection of Langmuir probe LP22 and the central projection of quartz crystal microbalance QCM25, straight line minor increment is greater than measured plasma Debye length; Between the central projection of retardance potential analysis instrument RPA23 and the central projection of quartz crystal microbalance QCM25, straight line minor increment is greater than measured plasma Debye length.
Wherein, LP main application measures electric thruster exchange charge to produce plasma plume parameter, comprises exchange charge plasma density, electron temperature, plasma potential; RPA is used for exchange charge plasma intermediate ion spectral distribution; QCM is used for the plume contamination thing deposition that thruster exchange charge plasma causes.
Effect is good, and Langmuir probe LP is greater than 55mm with the straight line minor increment of retardance potential analysis instrument RPA; The straight line minor increment of Langmuir probe LP and quartz crystal microbalance QCM is greater than 55mm; The straight line minor increment of retardance potential analysis instrument RPA and quartz crystal microbalance QCM is greater than 55mm.
The scanning voltage of described Langmuir probe LP is-50 ~ 100V or other appropriate voltage scopes;
The hinders voltage of described retardance potential analysis instrument RPA is 60V or other appropriate voltage, and scanning voltage is 0 ~ 100V or other appropriate voltage scopes;
The eigenfrequency of described quartz crystal microbalance QCM is 10MHz, 15MHz, 20MHz or higher frequency;
The vacuum tightness in described vacuum storehouse 2 is better than 1 × 10
-3pa;
Vacuum system is generally oil-free vacuum system, and vacuum pump starts general by starting cold-trap, and startup mechanical pump, the mode starting molecular pump is carried out.
In described electric thruster multiparameter diagnostic device, master system embedded electric thruster multiparameter diagnostic software, can carry out man-machine interaction.
Electric thruster 4 is xenon ion engine 4.
When installing each structure of electric propulsion spacecraft plume parameter acquiring method, by vacuum storehouse view window 1 observation experiment equipment state;
The height of described entity case is 36mm, and the bottom surface of counterbore (27) is 55mm × 55mm, is highly 36mm; The end face of entity case is provided with LP erecting bed (26) and RPA erecting bed (24), is respectively used to Langmuir probe LP (22) and retardance potential analysis instrument RPA (23) are installed; And the maximum height of LP erecting bed (26) and installation Langmuir probe LP (22) is 126 ± 1mm; Bottom surface and the end face of RPA erecting bed (24) are tangent, and the angle between end face and bottom surface is 30 degree, and the maximum height of end face and bottom surface is 27.5mm.
Step 3, starts vacuum-pumping system 9, makes vacuum storehouse 2 be operated in molecular flow duty; Effect is good, and the vacuum tightness meeting vacuum storehouse 2 is better than 1 × 10
-3pa, by vacuum storehouse view window 1 observation experiment equipment state; The vacuum tightness of vacuum system is better than 1 × 10
-3after Pa after 30 minutes, the quartz crystal microbalance contamination monitoring system of start-up simulation machine 7, and adjust the zero point of quartz crystal microbalance; Quartz crystal microbalance steady operation, after more than 30 minutes, is opened air feed bottle 11, is utilized IGNITION CONTROL cabinet 8 to control electric thruster 4 and light a fire, make its jet plasma, and plasma sputtering produces pollutant; Electric thruster 4 constant ignition keeps after more than 30 minutes, the online in-situ monitoring Langmuir probe equipment of start-up simulation machine 7, obtains I-V curve of Langmuir probe LP; The online in-situ monitoring retardance potential analysis instrument equipment of start-up simulation machine 7, obtains I-V curve of retardance potential analysis instrument RPA; Obtained the various parameters of quartz crystal microbalance QCM by the quartz crystal microbalance contamination monitoring system of computing machine 7, mainly comprise frequency and thermograph and preserve various parameter and data record; Close electric thruster 4, then close quartz crystal microbalance contamination monitoring system, online in-situ monitoring Langmuir probe equipment, online in-situ monitoring retardance potential analysis instrument equipment successively, close vacuum-pumping system 9.Open air feed bottle 10, make vacuum storehouse 2 return to test original state.
Obtaining parameters in the mode (1s) of Langmuir probe I-V curve (1s), retardance potential analysis instrument equipment I-V curve (1s), quartz crystal microbalance frequency and temperature variation picking number is averaging mode and obtains plasma parameter (1min).
Wherein, in measuring process, obtain in each I-V curve, in I-V curve, likely corner position can not be accurate, and we adopt variable step mode poll, accurately obtain the corner position in I-V curve.
Langmuir probe (LP) I-V curve acquisition speed is greater than 1 time/Min; Middle retardance potential analysis instrument (RPA) I-V curve acquisition speed is greater than 1 time/Min; Situ monitoring quartz crystal microbalance frequency and temperature monitoring data rate are greater than 1 time/Min; Resolution is less than ± 1Hz/s.
Further, in Langmuir probe LP, retardance potential analysis instrument RPA, quartz crystal microbalance QCM: all insulation assemblies adopt Al
2o
3stupalith, the resistivity of this kind of material is up to 10
17Ω m, have effectively achieved the isolation of nA level tiny signal in Langmuir probe LP, retardance potential analysis instrument RPA, quartz crystal microbalance QCM equipment; The process of surface gold-plating modification technology is taked on surface, in measuring process, effectively suppress photocurrent, improves the detection accuracy of nA level tiny signal; Langmuir probe LP, retardance potential analysis instrument RPA adopt electric riveting method, and draw reliable respectively for each electric signal, riveting method improves the reliability of test result further compared with welding manner; In Langmuir probe LP, retardance potential analysis instrument RPA, quartz crystal microbalance QCM, each power supply is connected with signal employing double layer screen signal wire, shielded power supply line, in electrical wire extraction measurement, effectively avoid crosstalk each other, avoid the undesired signal of plasma in wire; Langmuir probe LP, retardance potential analysis instrument RPA, quartz crystal microbalance QCM take into full account plasma environment feature, and avoid the impact mutually between probe, the distance between each probe is greater than plasma environment Debye length.
Effect is good, Langmuir probe LP is hollow ball shape Langmuir probe, and with cleaning assembly, as shown in Figure 2, this cleaning assembly comprises: halogen lamp 11, halogen lamp ceramic bracket 12, halogen lamp service cable 14, ceramic insulation base 15, hollow metallic rod 16, temperature detecting resistance 18, temperature detecting resistance service cable 17.
If hollow ball shape Langmuir probe 19 center of circle is O point, be Z axis straight up, XOY plane crosses the center of circle perpendicular to OZ axle.
9 halogen lamps 11 are evenly installed by 60 ° of angular separation in the inner XOZ plane of hollow ball shape Langmuir probe 19 and YOZ planar interior surfaces, and the hollow ball shape Langmuir probe inside surface of OZ axle negative sense has cabling mouth, does not install halogen lamp.Temperature detecting resistance 18 Surface Mount is in hollow ball shape Langmuir probe 19 inside surface.Halogen lamp service cable 14 and temperature detecting resistance service cable 17 adopt multicore single layer dielectrics shielded cable to be connected with halogen lamp 11 and temperature detecting resistance 18 respectively through hollow metallic rod 16 equally.Hollow metallic rod 16 adopts vacuum brazing to be fixed in the ducted body of ceramic insulation base 15.Halogen lamp service cable 14 is connected computing machine 7 with temperature detecting resistance service cable 17.
Hollow ball shape Langmuir probe 19 adopts upper and lower hemispheres to design, and is convenient to maintenance and installs.Half ball material adopts low-density and high-strength titanium alloy.Hemisphere inside surface boss 13 adopts entirety to draw miller skill to become to be integrated with hemisphere inside surface, and for installing halogen lamp ceramic bracket 12, halogen lamp ceramic bracket 12 is fixed on boss 13 by screw 113.Halogen lamp bracket employing stupalith mainly ensures the high-insulation between halogen lamp and Langmuir spheric probe, and prevent halogen lamp leakage current on the impact of Langmuir probe plasma collected current, in addition, this bracket boss mounting means ensure that the steadiness of halogen lamp.
As shown in Figure 3, halogen lamp ceramic bracket 12 adopts circular flange to design, the boss 13 interface consistent size of flange-interface and hollow ball shape Langmuir probe 19 hemisphere inside surface.It is inner that positive metal electrode 111 and negative metal electrode 112 are fixed on halogen lamp ceramic bracket 12 by vacuum brazing, through wires hole 110 is offered in halogen lamp ceramic bracket 12 side, halogen lamp service cable 14 enters from through wires hole 110, and the power supply positive pole in halogen lamp service cable 14 and negative pole are connected with the positive metal electrode 111 of halogen lamp ceramic bracket 12 inside and negative metal electrode 112 respectively.This method for designing can avoid halogen lamp service cable directly to contact with Langmuir probe spherical inside surface, because wire leakage current is on the impact of Langmuir probe plasma collected current when preventing the wire of halogen lamp service cable from occurring damaged.
Positive metal electrode 111 is circle copper sheet structure, is close to ceramic bracket bottom interior surface by vacuum brazing; Negative metal electrode 112 is tubular scale copper structure, and be close to ceramic bracket side wall inner surfaces by vacuum brazing, this ceramic bracket structural design can ensure with commercial halogen lamp interface well compatible.
Hollow ball shape Langmuir probe 19 is fixedly connected with by EBW (electron beam welding) with hollow metallic rod 16, and spherical part and limb junction adopt arc-shaped transition, and ensure good mechanical strength, the circular upper shed of arc-shaped transition and ceramic insulation base 15 fits tightly; The cabling mouth that the OZ axle negative sense of hollow ball shape Langmuir probe 19 inside is offered, there is arc-shaped transition at its edge, in order to avoid cause damage to service cable.
Halogen lamp service cable 14 and temperature detecting resistance service cable 17 are all boundlings in hollow metallic rod 16 inside, after cable enters probe interior by the cabling mouth bottom hollow ball shape Langmuir probe 19, beam splitting bottom probe inside surface, to realize powering to every halogen lamp or powering and signals collecting to temperature detecting resistance.
In the present embodiment, halogen lamp service cable adopts 2 group of 10 core cable to power to 19 halogen lamps, and every 2 wires after beam splitting are used for every halogen lamp; Temperature detecting resistance service cable adopts 1 group of 4 core cable, 2 wires after beam splitting give warm resistance power, other 2 for temperature signal collection.
The wire silica gel solid of hollow ball shape Langmuir probe 19 inside fixes on ball inside surface, to strengthen mechanical property.
In order to improve accuracy of detection, temperature detecting resistance 18 is more than 2, and even Surface Mount, in hollow ball shape Langmuir probe 19 inside surface, is averaged after so computer acquisition temperature.
Halogen lamp 11 can select power to be the halogen lamp of " 12V, 6W ", " 12W, 9W " or " 12V, 12W ", effectively enhances detecting probe surface pollutant cleansing power.
Computing machine is by controlling temperature measurement circuit module and halogen lamp supply module realization cleaning.Wherein,
Temperature measurement circuit module, after the thermometric instruction receiving computing machine, is powered to temperature detecting resistance 18, from temperature detecting resistance 18 collecting temperature data.
Halogen lamp supply module, after receiving the clear instruction of computing machine, carries out confession electrical heating to halogen lamp 11; And from temperature measurement circuit module reading temperature data, when judging that hollow ball shape Langmuir probe 19 surface temperature reaches setting warm temperature K according to temperature data, continuing heating one section of redundancy time T, then stopping heating, cleaning complete; Described warm temperature K span is 300 DEG C ~ 400 DEG C; Redundancy time T span is 20 seconds ~ 300 seconds.In the preferred embodiment, warm temperature K is taken as 350 DEG C, if spherical probes surface temperature surpasses 350 DEG C, continues heating 30 seconds, then stop heating.
Certainly; the present invention also can have other various embodiments; when not deviating from the present invention's spirit and essence thereof; those of ordinary skill in the art are when making various corresponding change and distortion according to the present invention, but these change accordingly and are out of shape the protection domain that all should belong to the claim appended by the present invention.