CN105043579A - Electronic temperature measurement circuit structure - Google Patents
Electronic temperature measurement circuit structure Download PDFInfo
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- CN105043579A CN105043579A CN201510455850.5A CN201510455850A CN105043579A CN 105043579 A CN105043579 A CN 105043579A CN 201510455850 A CN201510455850 A CN 201510455850A CN 105043579 A CN105043579 A CN 105043579A
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Abstract
The invention relates to an electronic temperature measurement circuit structure which comprises a thermistor, a reference resistor, an oscillation circuit module, a temperature measurement and counting module, a storage module, a measurement information output module, a self-regulation module and a test change-over switch. The thermistor and the reference resistor are connected with the measurement information output module through the oscillation circuit module, the temperature measurement and counting module and the storage module. The oscillation circuit module is connected with the self-regulation module and the temperature measurement and counting module through the test change-over switch. Output signals of the self-regulation module are transmitted to the storage module. According to the electronic temperature measurement circuit structure, an internal preset temperature curve of the thermistor is self-regulated based on the central resistance value of the thermistor, and a correction coefficient can be stored, so that temperature curves of thermistors with different central resistance values can be fitted better; besides, the test cost is reduced and meanwhile, measurement errors are reduced; and the structure is simple and practical, stable and reliable in work performance and wide in application scope.
Description
Technical field
The application relates to field of temperature measurement, particularly electron temperature measurement technical field, specifically refers to a kind of electron temperature measurement circuit structure.
Background technology
In prior art, electronic thermometer is generally that the temperature of the thermistor being a specific electrical resistance (such as specified temp 37 DEG C, central resistance value is 30K) and value relatable are stored in internal storage by central resistance value.But the central resistance value of thermistor allows the error of 1% (29.7K to 30.3K) usually, and due to the nonlinear characteristic of thermistor itself, the thermistor of different central resistance value, its temperature curve is not identical, and the temperature curve that chip internal is preset is unique, thus cause the error of measurement.
Refer to shown in Fig. 1, it is the module diagram of traditional electric body-temperature metering circuit, and RS is thermistor, and RF is reference resistance.According to RC vibration theory, the waveform of thermometric counting module to reference resistance and thermistor counts respectively.Suppose, in identical Measuring Time, to count down to a certain fixed value N37 to reference resistance RF, N1 is count down to thermistor RS, then meets formula N37 × TRF=N1 × TRS.According to count results because this algorithm can the impact of oscillation-damped device constant kosc substantially, be therefore proportional to resistance value oscillation period, according to the value of N1, in ROM look-up table, search corresponding temperature, exported by output module.Due to the normally specified temp 37 DEG C stored in ROM look-up table, central resistance value is the temperature curve of the thermistor of 30K, and external reference resistance normally 30K.Therefore 37 DEG C time, N1=N37.But because the central resistance value error of thermistor is generally 1% (29.7K to 30.3K), its temperature curve of the thermistor of different central resistance value is not identical, thus result in the error of measurement.
Therefore roughly there are two kinds of Improving ways when production test:
One is when testing, completely according to the curve of the thermistor of reality, and the temperature curve of rewritting circuit inside;
Two is that utilize outside corrective system to choose suitable compensation combination, utilize and increase voltage, the modes such as current fusing retain selected parameter group at the built-in resistance of circuit and capacitance compensation network and switch control logic or built-in parameter list.
Rewrite temperature curve completely and need the debug time of at substantial aborning, the support utilizing outside corrective system to carry out parametric compensation then to need outside software and hardware, adds production cost.
Summary of the invention
The object of the application overcomes above-mentioned shortcoming of the prior art, provide a kind of can preset according to the central resistance value self-regulation of thermistor thermistor curve, better realize the different central resistance value of matching thermistor temperature curve, significantly reduce testing cost, obviously reduce measuring error, simple and practical, stable and reliable working performance, scope of application electron temperature measurement circuit structure comparatively widely.
In order to realize above-mentioned object, the electron temperature measurement circuit structure of the application has following formation:
This electron temperature measurement circuit structure, comprise thermistor, reference resistance, oscillatory circuit module, thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, thermometric counting module, memory module is connected with described metrical information output module, its principal feature is, self-regulation module and test change-over switch is also comprised in described circuit structure, described oscillatory circuit module is connected with thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module delivers to described memory module, the central resistance value of this self-regulation module according to described thermistor and the oscillation frequency of reference resistance, the temperature curve preset in described memory module is revised, and correction factor is preserved.
Self-regulation module in this electron temperature measurement circuit structure comprises:
Counting unit, is connected with described test change-over switch, for counting the central value of described thermistor and the waveform of reference resistance in same time;
Comparer, is connected with described counting unit, for comparing count results, obtains correction factor α;
Correction factor storage unit, is connected with described comparer, for storing correction factor α.
Oscillatory circuit module in this electron temperature measurement circuit structure is RC oscillator.
Memory module in this electron temperature measurement circuit structure is ROM storer.
Have employed the electron temperature measurement circuit structure of this application, because it does not need to rely on outside software and hardware, can according to the central resistance value of thermistor, the thermistor temp curve of self-regulation internal preset, and correction factor can be preserved, thus the temperature curve of the thermistor of the different central resistance value of better matching, while reduction testing cost, reduce measuring error, and simple and practical, stable and reliable working performance, the scope of application is comparatively extensive.
Accompanying drawing explanation
Fig. 1 is temperature measuring circuit high-level schematic functional block diagram of the prior art.
Fig. 2 is the electron temperature measurement circuit structure high-level schematic functional block diagram of the application.
Fig. 3 is the internal functional elements schematic diagram of the self-regulation module in the electron temperature measurement circuit structure of the application.
Embodiment
In order to the technology contents of the application more clearly can be understood, describe in detail especially exemplified by following examples.
Refer to shown in Fig. 2 and Fig. 3, this electron temperature measurement circuit structure, comprise thermistor, reference resistance, oscillatory circuit module, thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, thermometric counting module, memory module is connected with described metrical information output module, wherein, self-regulation module and test change-over switch is also comprised in described circuit structure, described oscillatory circuit module is connected with thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module delivers to described memory module, the central resistance value of this self-regulation module according to described thermistor and the oscillation frequency of reference resistance, the temperature curve preset in described memory module is revised, and correction factor is preserved.
Wherein, described self-regulation module comprises:
(1) counting unit, is connected with described test change-over switch, for counting the central value of described thermistor and the waveform of reference resistance in same time;
(2) comparer, is connected with described counting unit, for comparing count results, obtains correction factor α;
(3) correction factor storage unit, is connected with described comparer, for storing correction factor α.
Meanwhile, when the central resistance value error of described thermistor is ± 1%, the scope of described correction factor α is 0.99 ~ 1.01; The duty of described test switching switch control circuit, when this test change-over switch is set to test pattern, the central value of described thermistor and the oscillation frequency of reference resistance deliver to described self-regulation module, produce correction factor α; When this test change-over switch is set to normal using forestland, described thermistor and the oscillation frequency of reference resistance deliver to described thermometric counting module, according to count results, and the correction factor α described in combining, in described memory module, find out correct corresponding temperature.
In the middle of reality uses, thermistor in the application, reference resistance, oscillatory circuit module, thermometric counting module, memory module and metrical information output module, self-regulation module and test change-over switch, and counting unit in self-regulation module, comparer, correction factor storage unit all can correspond to the particular hardware circuit in circuit structure, therefore these module/unit only utilize hardware circuit just can realize, and do not need to assist namely automatically to realize corresponding function with specific control software design.
Meanwhile, the self-regulation involved by thermometer measure circuit of the application is the production field for factory, is to solve the bad problem of thermistor consistance.And in test process, the temperature curve that chip internal is preset is revised, namely preserve, can not revise again.
The thermistor wherein related to, reference resistance is by RC oscillatory circuit, directly becomes clock signal, for rolling counters forward, meanwhile, the application is by the comparison to rolling counters forward result, obtain concrete corrected parameter, the standard temperature curve prestored is modified, and preserve in ROM.
Refer to shown in Fig. 2 be described in the application can self-regulating electric body-temperature metering circuit.This circuit contains a self-regulation module and test change-over switch TEST.Work as TEST=1, circuit enters test pattern, and the central value of thermistor and the oscillation frequency of reference resistance enter self-regulation module, through process, obtains correction factor, and preserves.Work as TEST=0, circuit enters normal using forestland, and the oscillation frequency of thermistor and reference resistance then enters thermometric counting module, according to count results, and in conjunction with correction factor, finds out correct corresponding temperature in ROM.
Fig. 3 is a specific embodiment of the self-regulation module that the electric body-temperature metering circuit described in the application comprises, and can comprise counting module, comparer and correction factor storage unit.When the central value of thermistor and the oscillation frequency of reference resistance enter self-regulation module, counter counts oscillator signal respectively in same time, and at one time, the count value of the oscillator signal of thermistor central value is N2.Compared by the N37 of N2 and standard in comparing unit, correction factor α, according to comparative result, is stored in correction factor storage unit, revises the temperature curve in circuit by control module.
When the electric body-temperature metering circuit described in the application normally works, suppose that the number of oscillation of thermistor waveform is N1, be so then modified to N1+N37 (1-a) by this corrected parameter.When the central value of thermistor is higher than reference resistance, according to RC vibration, the oscillation frequency of thermistor lower than the oscillation frequency of reference resistance, N2 < N37, correction factor a < 1.When the central value of thermistor is lower than reference resistance, according to RC vibration, the oscillation frequency of thermistor higher than the oscillation frequency of reference resistance, N2 > N37, correction factor a > 1.When the central value of thermistor equals reference resistance, N2=N37, correction factor a=1.When the central resistance value error of thermistor is generally 1% (29.7K to 30.3K), the scope of correction factor a is 0.99 ~ 1.01.
The application's can self-regulating thermometer measure circuit, wherein contains a self-regulation module and test change-over switch TEST.
This can in self-regulating thermometer measure circuit, and described test change-over switch TEST can the duty of control circuit.As test change-over switch TEST=1, circuit enters test pattern, and the central value of thermistor and the oscillation frequency of reference resistance enter self-regulation module, produces correction factor α.As test TEST=0, circuit enters normal using forestland, and the oscillation frequency of thermistor and reference resistance then enters thermometric counting module, according to count results, and in conjunction with correction factor α, finds out correct corresponding temperature in ROM.
This self-regulation module can comprise in self-regulating thermometer measure circuit:
Counting module, for counting the central value of thermistor and the waveform of reference resistance in same time;
Comparer, for count results being compared, obtains correction factor α;
Correction factor storage unit, for storing correction factor α.
Have employed above-mentioned electron temperature measurement circuit structure, because it does not need to rely on outside software and hardware, can according to the central resistance value of thermistor, the thermistor temp curve of self-regulation internal preset, and correction factor can be preserved, thus the temperature curve of the thermistor of the different central resistance value of better matching, while reduction testing cost, reduce measuring error, and simple and practical, stable and reliable working performance, the scope of application is comparatively extensive.
Claims (1)
1. an electron temperature measurement circuit structure, comprise thermistor, reference resistance, oscillatory circuit module, thermometric counting module, memory module and metrical information output module, described thermistor and reference resistance are all by described oscillatory circuit module, thermometric counting module, memory module is connected with described metrical information output module, it is characterized in that, self-regulation module and test change-over switch is also comprised in described circuit structure, described oscillatory circuit module is connected with thermometric counting module with described self-regulation module respectively by described test change-over switch, and the output signal of described self-regulation module delivers to described memory module, the central resistance value of this self-regulation module according to described thermistor and the oscillation frequency of reference resistance, the temperature curve preset in described memory module is revised, and correction factor is preserved.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510455850.5A CN105043579A (en) | 2015-07-30 | 2015-07-30 | Electronic temperature measurement circuit structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510455850.5A CN105043579A (en) | 2015-07-30 | 2015-07-30 | Electronic temperature measurement circuit structure |
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| Publication Number | Publication Date |
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| CN105043579A true CN105043579A (en) | 2015-11-11 |
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| CN201510455850.5A Pending CN105043579A (en) | 2015-07-30 | 2015-07-30 | Electronic temperature measurement circuit structure |
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2015
- 2015-07-30 CN CN201510455850.5A patent/CN105043579A/en active Pending
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Application publication date: 20151111 |