CN105043242B - 一种对比式抗干扰阶梯平面反射镜激光干涉仪及标定方法和测量方法 - Google Patents
一种对比式抗干扰阶梯平面反射镜激光干涉仪及标定方法和测量方法 Download PDFInfo
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Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN105371755B (zh) * | 2015-11-27 | 2018-02-06 | 成都信息工程大学 | 一种采用波长修正式多光束阶梯平面反射镜激光干涉仪的激光波长修正方法 |
CN105352435B (zh) * | 2015-11-27 | 2018-03-27 | 成都信息工程大学 | 采用激光波长修正式角反射镜激光干涉仪的测量方法 |
CN105300275B (zh) * | 2015-11-27 | 2018-02-06 | 成都信息工程大学 | 一种采用波长修正式多光束阶梯平面反射镜激光干涉仪的测量方法 |
CN105371753B (zh) * | 2015-11-27 | 2018-03-27 | 成都信息工程大学 | 一种采用波长修正式多光束角阶梯反射镜激光干涉仪的激光波长修正方法 |
CN105509636B (zh) * | 2015-11-27 | 2018-02-06 | 成都信息工程大学 | 一种采用波长修正式多光束角阶梯反射镜激光干涉仪的测量方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4702603A (en) * | 1985-07-23 | 1987-10-27 | Cmx Systems, Inc. | Optical phase decoder for interferometers |
CN2193993Y (zh) * | 1994-02-03 | 1995-04-05 | 艾勇 | 反馈型激光干涉计 |
CN102016549A (zh) * | 2008-05-08 | 2011-04-13 | 佳能株式会社 | 光学相干断层成像装置和光学相干断层成像方法 |
CN102458226A (zh) * | 2009-06-25 | 2012-05-16 | 佳能株式会社 | 使用光学相干断层成像的摄像设备及摄像方法 |
CN204740000U (zh) * | 2015-05-29 | 2015-11-04 | 北方民族大学 | 一种对比式抗干扰阶梯平面反射镜激光干涉仪 |
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JPH11142243A (ja) * | 1997-11-13 | 1999-05-28 | Yokogawa Electric Corp | 干渉計及びこれを用いたフーリエ変換型分光装置 |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4702603A (en) * | 1985-07-23 | 1987-10-27 | Cmx Systems, Inc. | Optical phase decoder for interferometers |
CN2193993Y (zh) * | 1994-02-03 | 1995-04-05 | 艾勇 | 反馈型激光干涉计 |
CN102016549A (zh) * | 2008-05-08 | 2011-04-13 | 佳能株式会社 | 光学相干断层成像装置和光学相干断层成像方法 |
CN102458226A (zh) * | 2009-06-25 | 2012-05-16 | 佳能株式会社 | 使用光学相干断层成像的摄像设备及摄像方法 |
CN204740000U (zh) * | 2015-05-29 | 2015-11-04 | 北方民族大学 | 一种对比式抗干扰阶梯平面反射镜激光干涉仪 |
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