CN105021968A - Accelerated on-line test system for service life of LED - Google Patents
Accelerated on-line test system for service life of LED Download PDFInfo
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Abstract
The invention discloses an accelerated on-line test system for the service life of an LED, and relates to an LED test system. The system comprises an aging device, a spectrum collection device, an electric test device, and a computer control processing module. The aging device is provided with a constant temperature controller and an aging constant current source. The spectrum collection device is provided with at least one optical path, a cosine collector, a testing sampling clamping tool, a sixteen-way optical multiplexer, and a spectrometer. The electric test device is provided with an electric matrix switch and a testing source meter. The computer control processing module comprises a computer control part and a computer processing part. A PID heater is employed for the direct temperature control of an LED heat sink, thereby not only enabling the system to achieve miniaturization and temperature control to be more accurate and stable, but also saving a large amount of energy. Moreover, the heater is provided with a thermal insulation device, thereby preventing high temperature from affecting testing equipment. An on-line testing result is more continuous, and an error caused by the inconsistence of testing conditions is avoided. Testing parameters are complete. The service life can be predicted more accurately in a short time through the combination of a physical model and a mathematic model.
Description
Technical field
The present invention relates to LED test macro, particularly relate to and accelerate Online Transaction Processing based on temperature and electric current as a kind of LED life-span of accelerated stress.
Background technology
LED, as forth generation lighting source, has the plurality of advantages such as energy-saving and environmental protection, long-life, high reliability, has been widely used in the field such as display backlight, nightscape lighting.But the long-life of LED (can by 100,000 hours) causes the time, the man power and material that need at substantial in LED life-span and reliability testing thereof.At present, LED durability test often adopts the method for life-span accelerated test, and by applying big current, high temperature equal stress, LED is aging in acceleration.(J.Zhang, C.Liu, X.Chen, G.Chengand A.X.Zhou, " Study on constant-step stress accelerated life tests in white organiclight-emitting diodes ", LUMINESCENCE, VOL.29, NO.7,933-937 (2014); Zhao Min, Zhang Wansheng, Xu Lisheng, LED acceleration service life test method, infotech and standardization, VOL.5 (2009)).Life-span accelerated test can predict the life-span of LED at short notice, and carries out reliability and Analysis of Failure Mechanism, thus improves the design of LED, technique and using method.
Tradition life-span accelerated test method adopts off-line test mostly, puts into high-temperature cabinet, carries out temperature control by high-temperature cabinet to LED, and provide electric current to carry out life-span accelerated test by constant current source by LED sample.Aging light a period of time after, after LED sample cool to room temperature, take off sample, respectively the photoelectric color thermal parameter of each sample tested respectively by instruments such as spectrometer, thermal resistance instrument, constant current sources, and record data respectively.The method of off-line test is inconvenient, and dismounting and heating and cooling can cause LED sample to occur extremely continually, and can introduce personal error impact (a kind of LED life-span test system and method for testing thereof, Chinese patent ZL201210055631.4).At present, instrument company both domestic and external and scientific research institution are also proposed some online life-span accelerated test systems, but all not mature enough.The existing LED life-span on the market accelerates In-circiut tester, all adopt constant temperature oven to apply temperature stress and carry out LED life-span acceleration, by luminosity probe, light signal is converted to electric signal again, but lacks the delta data of the key characteristics such as the optics of LED in gatherer process, electricity, colorimetry and calorifics.And then occurring some new improvement projects, is the improvement for optical color parameter test mostly.In order to observe the optical color parameter of LED sample change in real time, resistant to elevated temperatures detector (optical fiber or integrating sphere) being placed in high-temperature cabinet, and being tested by spectrometer or photometer.(Q.Chen, Q.Chen, S.Liu, and X.Luo, " A Design for In-Situ Measurement of Optical Degradation of HighPower Light-Emitting Diodes Under Accelerated Life Test ", IEEE TRANSACTIONS ON DEVICEAND MATERIALS RELIABILITY, VOL.14, NO.2,645-650 (2014); LED life-span real-time detection apparatus, Chinese patent CN201120418147.4).But high temperature also has adverse effect to miscellaneous equipments such as integrating spheres, the method can introduce new loss error, and often can only test for single led when adopting optical fiber or integrating sphere to carry out on-line testing, other LED to be measured needs to suspend power supply, causes the change of ageing state.
Said method comes with some shortcomings, and is mainly manifested in:
1, aging equipment and test macro discrete, parameter testing needs off-line to carry out, and test not only bothers and also can introduce extra error, and amount of test data is often on the low side, and result is discontinuous.Minority adopts the equipment of on-line testing mode to cause test result deviation because state that is aging and test is inconsistent.
2, the appliance requires such as high-temperature cabinet, constant current source, spectrometer, thermal resistance instrument operates separately, is not easy to control simultaneously.
3, high-temperature cabinet volume is large, power is large, cost is high, causes the significant wastage on space and the energy, and high-temperature cabinet is not specially for the ageing system of LED, does not consider the singularity of LED itself, is difficult to carry out accurate temperature control to LED.Also there is adverse influence to testing apparatuss such as probes in hot environment simultaneously, is unfavorable for that system is applied.
4, the junction temperature of LED is the Important Parameters in reflection LED life-span, and current age accelerated test system generally lacks junction temperature measuring and calculating.
5, color drift is also weigh the important indicator of luminous mass, CIE (International Commission on Illumination) is one of index color drift being weighed the LED life-span as, and existing system all only considered that light is logical maintains life prediction, a life-span in conjunction with light decay and color change really could reflect life-span of LED.
Summary of the invention
For above-mentioned deficiency, in order to carry out LED accelerated life test better, a kind of LED life-span that the invention provides new lightweight robotization accelerates Online Transaction Processing.
The present invention is provided with:
Aging equipment, aging equipment is provided with 2 ~ 4 groups of radiator valves and aging constant current source; Described radiator valve is provided with well heater and heating radiator; Heating radiator is located at below well heater, well heater is fixed at least one group of LED sample clamp;
Spectra collection device, spectra collection device is provided with at least 1 road optical fiber, cosine collector, test sample fixture, 16 road optical multiplexer and spectrometers; Cosine collector is used for spectral radiance sampling, collects the light in 180 ° of solid angles, thus eliminates the problem for radiation direction in fiber geometric; Optical fiber puts cosine collector, be fixed on test sample fixture as light inlet, described test sample fixture is provided with sleeve, optical fiber-cosine collector fixed support, structure of fiber_optic, optical fiber-cosine collector fixed support is located at upper cartridge, make the sensitive surface of cosine collector vertical with incident ray direction, sleeve is used for separating each LED, avoids light mutually to disturb; Structure of fiber_optic is located at above fixed support, for avoiding optical fiber too bending; Optical multiplexer is the device by electric machine rotation switches light passage, 16 light inlets pass through conputer controlled, select wherein 1 passage to be connected with delivery outlet and realize light output, the light of 16 LED samples is transferred in optical multiplexer respectively by 16 optical fiber, 16 road optical multiplexers switch the optical channel of output in turn, and by optical fiber, output light being transferred to spectrometer from light-emitting window, light is carried out light splitting by grating by spectrometer, and gathers light signal by CCD;
Electric test device, electric test device is provided with electric matrix switch and test source table; Each node of electric matrix switch is a switch, for multiple stage testing tool is connected to multiple measured device, by test source list catenation on a row port of electric matrix switch, 16 paths of LEDs two ends are connected on respectively on 16 row ports of electric matrix switch;
Computing machine controls processing module, and computing machine controls processing module and comprises computing machine control section and computer disposal part, for carrying out control treatment by self-editing software, computing machine control section comprises aging constant current source control section, PID heated constant temperature control section, spectrometer collection control section and optical multiplexer passage bridge control section, electric matrix switching control section, test source table control section, computing machine controls aging constant current source and PID heating thermostat arranges LED aging test condition and lights, test is started after electric current and temperature stabilization, optic test is that computing machine passes through control optical multiplexer and spectra collection is carried out in spectrometer combination, first sampling interval and integral time is set, then computing machine controls optical multiplexer selector channel automatically, spectra collection is carried out by spectrometer, in this way the spectrum on 16 tunnels is gathered one by one, the electrical testing stage, first aging constant current source is suspended, then tested by computing machine control electric matrix switch and test source table, the electrical characteristics of LED sample are tested, computer digital animation part is divided into parameter calculating, these two parts of life prediction, parameter calculates and comprises optical, electrical, look, heat four parts, optics and colorimetry part, by by spectrometer collection to spectrum carry out optical color parameter calculating, as irradiance, illuminance, chromaticity coordinates, colour temperature, colour rendering index, peak wavelength, predominant wavelength etc., thermal portion, the present invention adopts spectroscopic methodology to test junction temperature, namely first calculates the coefficient that one group of junction temperature and spectrum peak wavelength or spectrum halfwidth are drifted about before experiment, goes to calculate junction temperature by collection spectral analysis peak wavelength drift or spectrum halfwidth, electricity part, is combined by test source table and electric matrix switch, the I-V characteristic of test LED.
For life prediction part, adopt the method that combines with mathematical model of physical model, set up light decay life model and color lifetime model respectively, get light and lead to smaller value in maintenance life-span and color lifetime as the life-span under LED actual service conditions.Light decay life model, first carries out prediction extrapolation by the particle filter method on mathematical statistics to the life-span of LED, obtains LED sample optical power attenuation model P under stress
t=P
0(-β t), and can calculate the life-span of light decay to 70% or 50% to exp
the life-span is maintained, β=I again by the light under Arrhenius relationship derivation normal service condition is logical
fβ
0exp (-E
a/ kT
j), wherein β is attenuation coefficient, E
afor energy of activation, T
jfor junction temperature, namely energy of activation can be derived by this model
namely the activation energy of sample is gone out by the life-span projection under junction temperature and stress, thus the light logical maintenance life-span under extrapolating normal service condition
in addition, because color drift is also the important indicator affecting the LED life-span, the present invention also sets up color lifetime model.According to chromaticity coordinates change Modling model, chromaticity coordinates change is no more than the criterion of scope as useful life of four step mark Adam ellipses of initial color coordinates.Calculated the scope of four step MacAdam's ellipses of its initial value by non-linear interpolation, by the chromaticity coordinates variation tendency in ageing process, set up color lifetime model, calculate color lifetime.
Described electric matrix switch can adopt the matrix of 4 × 16 (or larger) to form, and each node is a switch, multiple stage testing tool can be connected on multiple measured device.
In test process, first suspend aging constant current source, by controlling the break-make of these 16 nodes, powering with test source table and testing I-V or other electrical characteristics of this 16 paths of LEDs respectively.
With existing life-span accelerated test systematic comparison, the present invention has the following advantages:
1, adopt PID well heater to carry out direct temperature control to LED is heat sink, not only make system realize miniaturization, temperature control is accurate stable more, and has saved mass energy, and well heater has adiabatic apparatus, avoids the impact of high temperature on testing apparatus;
2, the method for on-line testing, aging and test is carried out under the same conditions, and test result is more continuous, and avoids because the error of the inconsistent introducing of test condition;
3, test system and test parameter is complete, contains this several LED key characteristic of photoelectric color heat.Spectroscopic methodology is adopted to calculate junction temperature, need not off-line test, realize variations injunction temperature in Real-Time Monitoring ageing process;
4, leading at traditional light and maintain on basis that the life-span calculates, adding color lifetime, and by physical model and mathematical model being combined, at short notice bimetry more exactly.
Accompanying drawing explanation
Fig. 1 is embodiment of the present invention structure composition schematic diagram.
Embodiment
See Fig. 1, the embodiment of the present invention is provided with:
Aging equipment, aging equipment is provided with 2 ~ 4 groups of radiator valves 2 and aging constant current source 3; Described radiator valve 2 is provided with well heater and heating radiator; Heating radiator is located at below well heater, well heater is fixed at least one group of LED sample clamp 1;
Spectra collection device, spectra collection device is provided with at least 1 road optical fiber 6, cosine collector 7, test sample fixture 8,16 road optical multiplexer 9 and spectrometer 10; Cosine collector 7, for spectral radiance sampling, collects the light in 180 ° of solid angles, thus eliminates the problem for radiation direction in fiber geometric; Optical fiber 6 puts cosine collector 7, be fixed on test sample fixture 8 as light inlet, described test sample fixture 8 is provided with sleeve, optical fiber-cosine collector fixed support, structure of fiber_optic, optical fiber-cosine collector fixed support is located at upper cartridge, make the sensitive surface of cosine collector vertical with incident ray direction, sleeve is used for separating each LED, avoids light mutually to disturb; Structure of fiber_optic is located at above fixed support, for avoiding optical fiber too bending; Optical multiplexer is the device by electric machine rotation switches light passage, 16 light inlets pass through conputer controlled, select wherein 1 passage to be connected with delivery outlet and realize light output, the light of 16 LED samples is transferred in optical multiplexer respectively by 16 optical fiber, 16 road optical multiplexers switch the optical channel of output in turn, and by optical fiber, output light being transferred to spectrometer from light-emitting window, light is carried out light splitting by grating by spectrometer, and gathers light signal by CCD;
Electric test device, electric test device is provided with electric matrix switch 4 and test source table 5; Each node of electric matrix switch is a switch, for multiple stage testing tool is connected to multiple measured device, by test source list catenation on a row port of electric matrix switch, 16 paths of LEDs two ends are connected on respectively on 16 row ports of electric matrix switch;
Computing machine controls processing module 11, and computing machine controls processing module 11 and comprises computing machine control section and computer disposal part, for carrying out control treatment by self-editing software, computing machine control section comprises aging constant current source control section, PID heated constant temperature control section, spectrometer collection control section and optical multiplexer passage bridge control section, electric matrix switching control section, test source table control section, computing machine controls aging constant current source and PID heating thermostat arranges LED aging test condition and lights, test is started after electric current and temperature stabilization, optic test is that computing machine passes through control optical multiplexer and spectra collection is carried out in spectrometer combination, first sampling interval and integral time is set, then computing machine controls optical multiplexer selector channel automatically, spectra collection is carried out by spectrometer, in this way the spectrum on 16 tunnels is gathered one by one, the electrical testing stage, first aging constant current source is suspended, then tested by computing machine control electric matrix switch and test source table, the electrical characteristics of LED sample are tested, computer digital animation part is divided into parameter calculating, these two parts of life prediction, parameter calculates and comprises optical, electrical, look, heat four parts, optics and colorimetry part, by by spectrometer collection to spectrum carry out optical color parameter calculating, as irradiance, illuminance, chromaticity coordinates, colour temperature, colour rendering index, peak wavelength, predominant wavelength etc., thermal portion, the present invention adopts spectroscopic methodology to test junction temperature, namely first calculates the coefficient that one group of junction temperature and spectrum peak wavelength or spectrum halfwidth are drifted about before experiment, goes to calculate junction temperature by collection spectral analysis peak wavelength drift or spectrum halfwidth, electricity part, is combined by test source table and electric matrix switch, the I-V characteristic of test LED.
For life prediction part, adopt the method that combines with mathematical model of physical model, set up light decay life model and color lifetime model respectively, get light and lead to smaller value in maintenance life-span and color lifetime as the life-span under LED actual service conditions.Light decay life model, first carries out prediction extrapolation by the particle filter method on mathematical statistics to the life-span of LED, obtains LED sample optical power attenuation model P under stress
t=P
0(-β t), and can calculate the life-span of light decay to 70% or 50% to exp
the life-span is maintained, β=I again by the light under Arrhenius relationship derivation normal service condition is logical
fβ
0exp (-E
a/ kT
j), wherein β is attenuation coefficient, E
afor energy of activation, T
jfor junction temperature, namely energy of activation can be derived by this model
namely the activation energy of sample is gone out by the life-span projection under junction temperature and stress, thus the light logical maintenance life-span under extrapolating normal service condition
in addition, because color drift is also the important indicator affecting the LED life-span, the present invention also sets up color lifetime model.According to chromaticity coordinates change Modling model, chromaticity coordinates change is no more than the criterion of scope as useful life of four step mark Adam ellipses of initial color coordinates.Calculated the scope of four step MacAdam's ellipses of its initial value by non-linear interpolation, by the chromaticity coordinates variation tendency in ageing process, set up color lifetime model, calculate color lifetime.
Described electric matrix switch can adopt the matrix of 4 × 16 (or larger) to form, and each node is a switch, multiple stage testing tool can be connected on multiple measured device.
In test process, first suspend aging constant current source, by controlling the break-make of these 16 nodes, powering with test source table and testing I-V or other electrical characteristics of this 16 paths of LEDs respectively.
Below provide specific embodiment:
(1) choose same batch of 20 ~ 30 samples, carry out 100 DEG C of high temperature storage 100h preagings, reject the sample of rapid failure.
(2) sample is fixed on sample clamp, and connects test apparatus by Fig. 1.Test screen is done to the sample after preaging, chooses the sample of 16 similar nature as laboratory sample.
(3) experiment stress is chosen.Choose 2 ~ 4 temperature spots or current point per sample as accelerated stress, by computer installation temperature, electric current, carry out temperature control to LED is heat sink, light LED by aging constant current source.As according to TM-21 standard, select 55 DEG C, 85 DEG C, 115 DEG C these three temperature spots as accelerated stress, adopt rated current to power, the sample number often organized is respectively 5,5,6, tests.
(4) test phase.By the test interval that computing machine pre-sets, real-time online collection is carried out to optical, electrical, look, the thermal parameter of each sample, parameter calculates and data analysis.Often gather one group of data and carried out fail-ure criterion, if there is sample to occur losing efficacy, then suspended the test of this sample, and take off inefficacy sample; Continue test again, until all samples all reaches failure criteria.
(5) durability analysis.System calculates each sample light logical maintenance life-span and color drift automatically according to aging physics and mathematical model.
Claims (10)
1. the LED life-span accelerates an Online Transaction Processing, it is characterized in that being provided with:
Aging equipment, aging equipment is provided with radiator valve and aging constant current source; Described radiator valve is provided with well heater and heating radiator; Heating radiator is located at below well heater, and LED sample clamp is fixing on the heaters;
Spectra collection device, spectra collection device is provided with at least 1 road optical fiber, cosine collector, test sample fixture, optical multiplexer and spectrometer; Cosine collector is used for spectral radiance sampling, collect the light in 180 ° of solid angles, optical fiber puts cosine collector, be fixed on test sample fixture as light inlet, described test sample fixture is provided with sleeve, optical fiber-cosine collector fixed support, structure of fiber_optic, and optical fiber-cosine collector fixed support is located at upper cartridge, makes the sensitive surface of cosine collector vertical with incident ray direction, sleeve is used for separating each LED, avoids light mutually to disturb; Structure of fiber_optic is located at above fixed support, for avoiding optical fiber too bending; The light of LED sample is by Optical Fiber Transmission in optical multiplexer, and optical multiplexer switches the optical channel of output in turn, and is transferred to spectrometer by output light from light-emitting window by optical fiber, and light is carried out light splitting by grating by spectrometer, and gathers light signal by CCD;
Electric test device, electric test device is provided with electric matrix switch and test source table; Each node of electric matrix switch is a switch, for multiple stage testing tool is connected to multiple measured device, by test source list catenation on a row port of electric matrix switch, is connected on respectively at LED two ends on the row port of electric matrix switch;
Computing machine controls processing module, and computing machine controls processing module and comprises computing machine control section and computer disposal part, for carrying out control treatment by self-editing software.
2. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 1, it is characterized in that described electric matrix switch adopts the matrix composition of 4 × 16.
3. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 1, it is characterized in that described computing machine control section comprises aging constant current source control section, PID heated constant temperature control section, spectrometer collection control section and optical multiplexer passage bridge control section, electric matrix switching control section, test source table control section, computing machine controls aging constant current source and PID heating thermostat arranges LED aging test condition and lights, test is started after electric current and temperature stabilization, optic test is that computing machine passes through control optical multiplexer and spectra collection is carried out in spectrometer combination, first sampling interval and integral time is set, then computing machine controls optical multiplexer selector channel automatically, spectra collection is carried out by spectrometer, in this way spectrum is gathered one by one.
4. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 1, and it is characterized in that described computer digital animation part comprises parameter and calculates and life prediction two parts, parameter calculates and comprises optics, electricity, colorimetry, calorifics.
5. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 4, it is characterized in that described optics, colorimetry part, by by spectrometer collection to spectrum carry out optical color parameter calculating, described optical color parameter includes but not limited to irradiance, illuminance, chromaticity coordinates, colour temperature, colour rendering index, peak wavelength, predominant wavelength.
6. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 4, it is characterized in that described thermal portion, adopt spectroscopic methodology test junction temperature, namely first calculate the coefficient that one group of junction temperature and spectrum peak wavelength or spectrum halfwidth are drifted about before experiment, go to calculate junction temperature by collection spectral analysis peak wavelength drift or spectrum halfwidth.
7. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 4, it is characterized in that described electricity part, is combined by test source table and electric matrix switch, the I-V characteristic of test LED.
8. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 4, it is characterized in that described life prediction part, adopt the method that physical model combines with mathematical model, set up light decay life model and color lifetime model respectively, get light and lead to and maintain smaller value in life-span and color lifetime as the life-span under LED actual service conditions.
9. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 8, it is characterized in that described light decay life model, first carries out prediction extrapolation by the particle filter method on mathematical statistics to the life-span of LED, obtains LED sample optical power attenuation model P under stress
t=P
0(-β t), and can calculate the life-span of light decay to 70% or 50% to exp
the life-span is maintained, β=I again by the light under Arrhenius relationship derivation normal service condition is logical
fβ
0exp (-E
a/ kT
j), wherein β is attenuation coefficient, E
afor energy of activation, T
jfor junction temperature, namely energy of activation can be derived by this model
namely the activation energy of sample is gone out by the life-span projection under junction temperature and stress, thus the light logical maintenance life-span under extrapolating normal service condition
10. a kind of LED life-span accelerates Online Transaction Processing as claimed in claim 8, it is characterized in that described color lifetime model, according to chromaticity coordinates change Modling model, chromaticity coordinates change is no more than the criterion of scope as useful life of four step mark Adam ellipses of initial color coordinates, the scope of four step MacAdam's ellipses of its initial value is calculated by non-linear interpolation, by the chromaticity coordinates variation tendency in ageing process, set up color lifetime model, calculate color lifetime.
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