CN105005141A - Dustproof microscope - Google Patents

Dustproof microscope Download PDF

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Publication number
CN105005141A
CN105005141A CN201510454631.5A CN201510454631A CN105005141A CN 105005141 A CN105005141 A CN 105005141A CN 201510454631 A CN201510454631 A CN 201510454631A CN 105005141 A CN105005141 A CN 105005141A
Authority
CN
China
Prior art keywords
dust excluding
excluding plate
sample pallet
chute
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201510454631.5A
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Chinese (zh)
Inventor
陈国玉
童学权
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Nanguang Electronic Technology Co Ltd
Original Assignee
Suzhou Nanguang Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Nanguang Electronic Technology Co Ltd filed Critical Suzhou Nanguang Electronic Technology Co Ltd
Priority to CN201510454631.5A priority Critical patent/CN105005141A/en
Publication of CN105005141A publication Critical patent/CN105005141A/en
Withdrawn legal-status Critical Current

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Abstract

The invention relates to a dustproof microscope which comprises a microscope body (1), a number of chutes (3) and a number of dustproof plates (4). The microscope body (1) comprises a sample tray (2). Both ends of each side of the sample tray (2) are respectively fixed with a chute (3). A dustproof plate (4) is movably arranged between two chutes (3) on corresponding sides of the sample tray (2). A dustproof plate (4) slides along two chutes (3), wherein the dustproof plate (4) is movably arranged between two chutes (3). According to the invention, the dustproof microscope is improved based on the structure of the existing microscope; a sample is prevented from being contaminated by dust in the surrounding environment to the greatest extent; and sample observation is effective and accurate in practical application.

Description

A kind of dustproof microscope
Technical field
The present invention relates to oneplant dustproof microscope, belong to intelligent microscope technical field.
Background technology
Microscope is a kind of optical instrument be made up of the combination of lens or several lens, is that the mankind enter atom-age mark, is mainly used in amplifying that small items becomes is the instrument that the naked eyes of people can be seen.Along with the development of mankind's science and technology, constantly there is mend gene in existing microscope, such as the patent No.: 200910208377.5, discloses a kind of microscope, and this microscope can reduce manufacturing cost.This microscope possesses: pedestal; Objective table, it is arranged on pedestal, make sample relative to pedestal along the longitudinal direction or left and right directions move; Framework, the converter being equipped with object lens is installed on the frame in the mode that can be elevated; Three pillars, its one end is arranged on pedestal, and the other end is arranged on framework; And lens barrel, it is arranged on framework, and can eyepiece be assembled, light path is guaranteed between object lens and the eyepiece assembled, therefore, it is possible to manufacture pedestal, framework and pillar respectively, and form microscope body by assembling above-mentioned parts, therefore do not need large-scale manufacturing installation, and do not need very large space during keeping.
Also has number of patent application: 201210449542.8, disclose a kind of microscope, comprise lens barrel and image collecting device, multiple light path is had in its lens barrel, described light path comprises main microscope unit light path, auxiliary microscope unit light path and image acquisition light path, in described image acquisition light path, have a catoptron, catoptron is positioned at microscopical objective end, and the light reflection directly reflected by observed object is to the harvester being positioned at lens barrel outside.Image collector in technique scheme is outside setting in lens barrel, its volume is not by lens barrel volume constraint, it is higher that equipment performance can be done, collection effect is better, and the reflective mirror of lens barrel inside belongs to non-damageable element, need not frequently change, when image collecting device breaks down, can directly place under repair separately or change, plant maintenance be more convenient.
Moreover, number of patent application: 201210564443.4, discloses a kind of microscope, comprises the microscope of image pick-up element, light source, optical system, control module and sensor.Control module control by use sensor with the acquisition of information needed when performing the second image pickup event of image pick-up element of the first image pickup event concurrency of image pick-up element.For microscopical sensor to comprising pair of sensors.First sensor in pair of sensors provides the signal of the environmental variance of the first area represented in first time period.The second sensor in pair of sensors provides the quality of the ability of the signal of the environmental variance of the second area represented in the representative first time period of first sensor, and wherein, the second sensor is adjacent with first sensor.
As can be seen from above-mentioned prior art, existing microscope is many starts with from structure, in conjunction with more advanced optics science and technology, to realize more accurate observation effect, but in the middle of actual application, some trickle deficiencies, are not but easily designed person and ignore, such as, operator is when observing sample, sample is placed on sample pallet, but sample pallet is only a plane, does not around block, like this, dust in environment is easy to invade and pollutes on sample, will badly influence the observation of sample like this, and then can have influence on observed result.
Summary of the invention
For above-mentioned technical matters, technical matters to be solved by this invention is to provide one and improves for existing microscopic structure, can effectively avoid sample to be subject to the pollution of dust, ensures the dustproof microscope of sample view accuracy.
The present invention is in order to solve the problems of the technologies described above by the following technical solutions: the present invention devises a kind of dustproof microscope, comprises microscope body, and wherein, microscope body comprises sample pallet; Also comprise several chute and several piece dust excluding plate, wherein, described sample pallet is polygon; The quantity of chute is the twice of sample pallet number of sides, the two ends of each bar side of sample pallet are fixedly installed a chute respectively, and the chute mouth of two chutes on each bar side of sample pallet is toward each other, each slide direction place straight line and face, sample pallet place perpendicular; The quantity of dust excluding plate is equal with the quantity of sample pallet side; Each piece of dust excluding plate respectively with each bar side one_to_one corresponding on sample pallet, the width of the sample pallet side corresponding to it respectively of the width in each piece of dust excluding plate horizontal direction adapts, the width of chute upper hopper chute mouth and the thickness of dust excluding plate adapt, each piece of dust excluding plate is movably arranged between two chutes on its corresponding sample pallet side respectively, each piece of dust excluding plate respectively along its movable two chutes arranged slide.
As a preferred technical solution of the present invention: described dust excluding plate is that light screening material is made.
As a preferred technical solution of the present invention: described dust excluding plate is that plastic sunscreen material is made.
As a preferred technical solution of the present invention: described chute is that plastic material is made.
As a preferred technical solution of the present invention: described sample pallet is rectangle.
A kind of dustproof microscope of the present invention adopts above technical scheme compared with prior art, has following technique effect:
(1) dustproof microscope of the present invention's design, improve based on existing microscopic structure basis, at the dust excluding plate that the design introducing polylith that makes a circle in sample pallet week can slide, thus, by around the sample pallet each piece of dust excluding plate of a week, avoid sample to be subject to the pollution of dust in surrounding environment to greatest extent, effectively ensure that the accuracy of sample observation in practical application;
(2) in the dustproof microscope that the present invention designs, for dust excluding plate, design adopts light screening material to make further, sample effectively can be avoided to be subject to the stimulation of surrounding environment light, and then further ensure the accuracy of sample observation; And adopt plastic sunscreen material to make dust excluding plate further, and for chute, design is adopted made of plastic further, effectively ensure that the lightweight of project organization, does not affect microscopical mobility.
Accompanying drawing explanation
Fig. 1 is the structural representation that the present invention designs dustproof microscope.
Wherein, 1. microscope body, 2. sample pallet, 3. chute, 4. dust excluding plate.
Embodiment
Be described in further detail for the specific embodiment of the present invention below in conjunction with Figure of description.
As shown in Figure 1, a kind of dustproof microscope of the present invention's design, comprise microscope body 1, wherein, microscope body 1 comprises sample pallet 2; Also comprise several chute 3 and several piece dust excluding plate 4, wherein, described sample pallet 2 is polygon; The quantity of chute 3 is the twice of sample pallet 2 number of sides, the two ends of each bar side of sample pallet 2 are fixedly installed a chute 3 respectively, and the chute mouth of two chutes 3 on each bar side of sample pallet 2 is toward each other, each chute 3 glide direction place straight line and face, sample pallet 2 place perpendicular; The quantity of dust excluding plate 4 is equal with the quantity of sample pallet 2 side; Each piece of dust excluding plate 4 respectively with each bar side one_to_one corresponding on sample pallet 2, the width of sample pallet 2 side corresponding to it respectively of the width in each piece of dust excluding plate 4 horizontal direction adapts, the width of chute 3 upper hopper chute mouth and the thickness of dust excluding plate 4 adapt, each piece of dust excluding plate 4 is movably arranged between two chutes 3 on its corresponding sample pallet 2 side respectively, each piece of dust excluding plate 4 respectively along its movable two chutes 3 arranged slide.The dustproof microscope of technique scheme design, improve based on existing microscopic structure basis, make a circle at sample pallet the dust excluding plate 4 designing and introduce polylith and can slide for 2 weeks, thus, by around the sample pallet each piece of dust excluding plate 4 of 2 one weeks, avoid sample to be subject to the pollution of dust in surrounding environment to greatest extent, effectively ensure that the accuracy of sample observation in practical application.
On basis based on above-mentioned design dustproof microscope technical scheme, the present invention also devises following optimal technical scheme further: for dust excluding plate 4, further design adopts light screening material to make, sample effectively can be avoided to be subject to the stimulation of surrounding environment light, and then to further ensure the accuracy of sample observation; And adopt plastic sunscreen material to make dust excluding plate 4 further, and for chute 3, design is adopted made of plastic further, effectively ensure that the lightweight of project organization, does not affect microscopical mobility.
The present invention designs a kind of dustproof microscope in the middle of actual application, comprises microscope body 1, and wherein, microscope body 1 comprises sample pallet 2; Also comprise several chute 3 and several piece dust excluding plate 4, wherein, dust excluding plate 4 is made for plastic sunscreen material, and chute 3 is made for plastic material; Described sample pallet 2 is rectangle; The quantity of chute 3 is the twice of sample pallet 2 number of sides, namely 8, the two ends of each bar side of sample pallet 2 are fixedly installed a chute 3 respectively, and the chute mouth of two chutes 3 on each bar side of sample pallet 2 is toward each other, each chute 3 glide direction place straight line and face, sample pallet 2 place perpendicular; The quantity of dust excluding plate 4 is equal with the quantity of sample pallet 2 side, namely 4 pieces; Each piece of dust excluding plate 4 respectively with each bar side one_to_one corresponding on sample pallet 2, the width of sample pallet 2 side corresponding to it respectively of the width in each piece of dust excluding plate 4 horizontal direction adapts, the width of chute 3 upper hopper chute mouth and the thickness of dust excluding plate 4 adapt, each piece of dust excluding plate 4 is movably arranged between two chutes 3 on its corresponding sample pallet 2 side respectively, each piece of dust excluding plate 4 respectively along its movable two chutes 3 arranged slide.In practical application, model to be observed is placed on sample pallet 2 by operating personnel, then, adjust for sample pallet 2, after the adjustment of sample pallet 2 position is determined, manual upward sliding is around the sample pallet each piece of dust excluding plate 4 of 2 one weeks, sample packages to be observed on sample pallet 2 is fenced up by each piece of dust excluding plate 4, then, operating personnel can carry out observation operation, because each piece of dust excluding plate 4 is centered around one week of sample pallet 2, therefore, based on the dustproof microscope of the present invention's design, pass through aforesaid operations, sample to be observed can be avoided to greatest extent to be subject to the pollution of surrounding environment, effectively ensure that the accuracy of obtained sample observation data to be observed, corresponding, after personnel's observation to be operated terminates, manual slide downward, around the sample pallet each piece of dust excluding plate 4 of 2 one weeks, cancels the state of siege of each piece of dust excluding plate 4 for sample to be observed on sample pallet 2.
Be explained in detail for embodiments of the present invention in conjunction with Figure of description above, but the present invention is not limited to above-mentioned embodiment, in the ken that those of ordinary skill in the art possess, can also make a variety of changes under the prerequisite not departing from present inventive concept.

Claims (5)

1. a dustproof microscope, comprises microscope body (1), and wherein, microscope body (1) comprises sample pallet (2); It is characterized in that: also comprise several chute (3) and several piece dust excluding plate (4), wherein, described sample pallet (2) is polygon; The quantity of chute (3) is the twice of sample pallet (2) number of sides, the two ends of each bar side of sample pallet (2) are fixedly installed a chute (3) respectively, and the chute mouth of two chutes (3) on each bar side of sample pallet (2) is toward each other, each chute (3) glide direction place straight line and sample pallet (2) face, place perpendicular; The quantity of dust excluding plate (4) is equal with the quantity of sample pallet (2) side; Each piece of dust excluding plate (4) respectively with each bar side one_to_one corresponding on sample pallet (2), the width of sample pallet (2) side corresponding to it respectively of the width in each piece of dust excluding plate (4) horizontal direction adapts, the width of chute (3) upper hopper chute mouth and the thickness of dust excluding plate (4) adapt, each piece of dust excluding plate (4) is movably arranged between two chutes (3) on its corresponding sample pallet (2) side respectively, each piece of dust excluding plate (4) respectively along its movable two chutes (3) arranged slide.
2. a kind of dustproof microscope according to claim 1, is characterized in that: described dust excluding plate (4) is made for light screening material.
3. a kind of dustproof microscope according to claim 2, is characterized in that: described dust excluding plate (4) is made for plastic sunscreen material.
4. a kind of dustproof microscope according to claim 1, is characterized in that: described chute (3) is made for plastic material.
5. a kind of dustproof microscope according to claim 1, is characterized in that: described sample pallet (2) is rectangle.
CN201510454631.5A 2015-07-30 2015-07-30 Dustproof microscope Withdrawn CN105005141A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510454631.5A CN105005141A (en) 2015-07-30 2015-07-30 Dustproof microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510454631.5A CN105005141A (en) 2015-07-30 2015-07-30 Dustproof microscope

Publications (1)

Publication Number Publication Date
CN105005141A true CN105005141A (en) 2015-10-28

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510454631.5A Withdrawn CN105005141A (en) 2015-07-30 2015-07-30 Dustproof microscope

Country Status (1)

Country Link
CN (1) CN105005141A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4593980A (en) * 1985-02-21 1986-06-10 Magnetic Activated Particle Sorting, Inc. Microscope assembly for magnetic specimens
JP2000241712A (en) * 1999-02-24 2000-09-08 Tokai Rika Co Ltd Holder for mounting particle moving/fixing device
CN2564583Y (en) * 2002-07-26 2003-08-06 宋传琳 Microbe auto-analysis all-colour device for sperm
CN203551878U (en) * 2013-10-22 2014-04-16 浙江吉利控股集团有限公司 Metallographic microscope carrier protective device
CN204065546U (en) * 2014-09-17 2014-12-31 冯燕 A kind of Novel microscope

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4593980A (en) * 1985-02-21 1986-06-10 Magnetic Activated Particle Sorting, Inc. Microscope assembly for magnetic specimens
JP2000241712A (en) * 1999-02-24 2000-09-08 Tokai Rika Co Ltd Holder for mounting particle moving/fixing device
CN2564583Y (en) * 2002-07-26 2003-08-06 宋传琳 Microbe auto-analysis all-colour device for sperm
CN203551878U (en) * 2013-10-22 2014-04-16 浙江吉利控股集团有限公司 Metallographic microscope carrier protective device
CN204065546U (en) * 2014-09-17 2014-12-31 冯燕 A kind of Novel microscope

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Application publication date: 20151028