CN104931343A - Metal Young-modulus measuring system based on photoelectric sensor - Google Patents
Metal Young-modulus measuring system based on photoelectric sensor Download PDFInfo
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- CN104931343A CN104931343A CN201510348763.XA CN201510348763A CN104931343A CN 104931343 A CN104931343 A CN 104931343A CN 201510348763 A CN201510348763 A CN 201510348763A CN 104931343 A CN104931343 A CN 104931343A
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Abstract
The invention discloses a metal Young-modulus measuring system based on a photoelectric sensor. The metal Young-modulus measuring system comprises a photoelectric conversion module, a current/voltage conversion module, an amplifying circuit, a filter circuit, an analog-digital conversion module, a microcontroller module and a display module. The photoelectric conversion module is connected with the microcontroller module by the current/voltage conversion module, the amplifying circuit, the filter circuit and the analog-digital conversion module. The display module is connected with a corresponding port of the microcontroller module. The photoelectric conversion module comprises a power source and a silicon photocell which are connected in sequence.
Description
Technical field
The present invention relates to a kind of measuring system of metal Young modulus, particularly relate to a kind of measuring system of the metal Young modulus based on photoelectric sensor, belong to the Survey control field of metal Young modulus.
Background technology
The measurement of metal material Young modulus is one of experiment must done in university and engineering and polytechnic universities' Physical Experiment.The key that tinsel Young's modulus of elasticity is measured is the accurate measurement to tiny length amount wiry, what the laboratory of more domestic universities and colleges still adopted is that optical lever method measures tiny length variable wiry, and this measuring method has strict requirement for the adjustment of light path, measure difficulty greatly and not easily grasp, operate more loaded down with trivial details, and easily make mistakes in reading process, consuming time longer.And answer current situation and the demand for development of domestic Experiment of College Physics, application high-tech constantly improves Physical Experiment equipment, and the Aulomatizeted Detect and the control that realize experimental facilities become main trend, and thus we need separately to ward off new measuring method to improve experimental apparatus.
Such as application number is a kind of Young modulus tester of " 201210520291.8 ", comprise hydrostatic column, and be arranged on the disk of hydrostatic column port part, described hydrostatic column is provided with the conduit of connection, and this tube at one end is provided with a fluid injection chamber, is connected one shows thin glass tube with fluid injection chamber, and with display thin glass tube corresponding to have an index dial, also comprise and be configured with counterweight, this counterweight is connected with the tinsel to be measured be connected on support, and counterweight is acted on disk.Therefore, by measuring the quality of counterweight, the radius of thin glass tube, the height that in thin glass tube, solution rises, just can calculate the size of the power of drawing metal, then measure length wiry and cross-sectional area, just can calculate Young modulus.Solving the operation of current experimental apparatus comes complicated, the error problem of measurement data.
And for example application number is the Young modulus measuring method of a kind of metal of " 201410217146.1 ", comprise step: measure metal sample thermal expansivity at multiple temperatures and Young modulus at normal temperatures, wherein, described temperature is the extraneous temperature of described metal sample oxidizing temperature; According to the Young modulus under the Young modulus under described normal temperature, thermal expansivity calculating corresponding temperature, obtain multiple temperature-Young modulus data group; The matching regression equation of vertical temperature-Young modulus is set up according to each described temperature-Young modulus data; According to the Young modulus under described matching regression equation determination high temperature.The limitation of existing method of testing and means is solved, the difficult problem that cannot obtain of the high-temperature material characteristic of some refractory metal materials by this scheme of the invention.And the measurement accuracy rate of metal Young modulus under high temperature can be improved, the Young modulus in particular improved under refractory metal high temperature measures accuracy rate.
Summary of the invention
Technical matters to be solved by this invention is the measuring system providing a kind of metal Young modulus based on photoelectric sensor for the deficiency of background technology.
The present invention is for solving the problems of the technologies described above by the following technical solutions:
Based on a measuring system for the metal Young modulus of photoelectric sensor, comprise photoelectric conversion module, current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module, micro controller module and display module; Described photoelectric conversion module is connected with micro controller module by current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module successively, and described display module is connected on the corresponding port of micro controller module; Described photoelectric conversion module comprises the light source and silicon photocell that connect successively;
Wherein, photoelectric conversion module, for becoming the magnitude of current by the micro-displacement variable transitions of metal material;
Current/voltage-converted module, for converting the magnitude of current to voltage signal;
Amplifying circuit, for carrying out amplification process to voltage signal;
Filtering short circuit, for carrying out filtering process to amplifying the voltage signal after processing;
Analog-to-digital conversion module, for converting the analog voltage signal after filtering process to digital signal;
Micro controller module, for carrying out analyzing and processing to the digital signal received, and then completes the measurement of Young modulus;
Display module, for showing the Young modulus that micro controller module is measured in real time.
As the further preferred version of the measuring system of a kind of metal Young modulus based on photoelectric sensor of the present invention, described micro controller module adopts AVR series monolithic.
As the further preferred version of the measuring system of a kind of metal Young modulus based on photoelectric sensor of the present invention, described display module is LCD display.
As the further preferred version of the measuring system of a kind of metal Young modulus based on photoelectric sensor of the present invention, the chip model of described analog-to-digital conversion module is AD574.
As the further preferred version of the measuring system of a kind of metal Young modulus based on photoelectric sensor of the present invention, described amplifying circuit adopts TL084 integrated amplifier.
The present invention adopts above technical scheme compared with prior art, has following technique effect:
1, the present invention simplifies original experimental provision greatly, improves efficiency and the accuracy rate of experiment, and cost is also lower than originally;
2, the present invention comes to measure tinsel Young modulus by using photoelectric sensor, substantially increases efficiency and the accuracy rate of experiment;
3, the present invention changes into voltage signal by the magnitude of current produced silicon photocell and carries out amplification filtering process again, effectively avoids the impact that noise brings.
Accompanying drawing explanation
Fig. 1 is structure principle chart of the present invention.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is described in further detail:
As shown in Figure 1, the present invention designs a kind of measuring system of the metal Young modulus based on photoelectric sensor, comprises photoelectric conversion module, current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module, micro controller module and display module; Described photoelectric conversion module is connected with micro controller module by current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module successively, and described display module is connected on the corresponding port of micro controller module; Described photoelectric conversion module comprises the light source and silicon photocell that connect successively;
Wherein, photoelectric conversion module, for becoming the magnitude of current by the micro-displacement variable transitions of metal material;
Current/voltage-converted module, for converting the magnitude of current to voltage signal;
Amplifying circuit, for carrying out amplification process to voltage signal;
Filtering short circuit, for carrying out filtering process to amplifying the voltage signal after processing;
Analog-to-digital conversion module, for converting the analog voltage signal after filtering process to digital signal;
Micro controller module, for carrying out analyzing and processing to the digital signal received, and then completes the measurement of Young modulus;
Display module, for showing the Young modulus that micro controller module is measured in real time.
Wherein, described micro controller module adopts AVR series monolithic, and described display module is LCD display, and the chip model of described analog-to-digital conversion module is AD574, and described amplifying circuit adopts TL084 integrated amplifier.
AVR single chip has prefetched instruction function, namely when an execution instruction, in advance next instruction is got into, and call instruction can be performed within a clock period; Multiple accumulator type, data processing speed is fast; AVR single chip has 32 general purpose working registers, and being equivalent to has 32 viaducts, can fast passing; Response time is fast.AVR single chip has multiple fixing interrupt vector entry address, can respond interruption fast; AVR single chip power consumption is low.For typical power consumption situation, be 100nA when WDT closes, be more suitable for battery powered application apparatus; Minimum 1.8 V of some devices get final product work; AVR single chip security performance is good.
Hardware components is it is crucial that to the process of current signal after silicon photocell conversion.Just current signal must be converted to voltage signal due to analog to digital conversion will be carried out, because the signal be converted to is very little and containing noise signal, still to be carried out amplifying and filtering.Realize current-voltage conversion and amplification at this with TL084 integrated amplifier, utilize RC circuit to carry out filtering.Voltage signal after conversion directly inputs the input end of A/D convertor circuit, then is carried out processing and showing by the output signal feeding single-chip microcomputer after AD conversion.That wherein AD conversion adopts is 12 bit pad AD574.
Process: first produce micro-displacement with the device measuring Young modulus, impinge upon on silicon photocell with uniform beam again, be placed between light source and silicon photocell with the baffle plate be connected with tinsel and be in the light, as shown in Figure 1, when moving stop, output current changes, and change is how many because baffle plate is in the light, output current has corresponding variable quantity, again electric signal is sent into single-chip microcomputer after amplification and analog-to-digital conversion, because the program of writing in advance inputs single-chip microcomputer, then can by chip microcontroller real-time automatic measuring, data processing and display, thus reach robotization and the high precision int of Young modulus measurement.Operator reaches requirement of experiment by the button on keyboard after only needing to be familiar with operation instructions, and last result can show on the light-emitting diode display be connected with single-chip microcomputer.
The key of this measurement is the accurate measurement to tiny length variable quantity wiry.First by photoelectric sensor, change in displacement is converted to the change of the magnitude of current, electric signal is after I-V conversion, amplification and analog-to-digital conversion, finally send into single-chip microcomputer and carry out data processing, realize man-machine conversation by keyboard simultaneously, and demonstrate result over the display, realize the intellectuality that Young modulus is measured
Those skilled in the art of the present technique are understandable that, unless otherwise defined, all terms used herein (comprising technical term and scientific terminology) have the meaning identical with the general understanding of the those of ordinary skill in field belonging to the present invention.Should also be understood that those terms defined in such as general dictionary should be understood to have the meaning consistent with the meaning in the context of prior art, unless and define as here, can not explain by idealized or too formal implication.
Above embodiment is only and technological thought of the present invention is described, can not limit protection scope of the present invention with this, and every technological thought proposed according to the present invention, any change that technical scheme basis is done, all falls within scope.By reference to the accompanying drawings embodiments of the present invention are explained in detail above, but the present invention is not limited to above-mentioned embodiment, in the ken that those of ordinary skill in the art possess, makes a variety of changes under can also or else departing from the prerequisite of present inventive concept.
Claims (5)
1. based on a measuring system for the metal Young modulus of photoelectric sensor, it is characterized in that: comprise photoelectric conversion module, current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module, micro controller module and display module; Described photoelectric conversion module is connected with micro controller module by current/voltage-converted module, amplifying circuit, filtering circuit, analog-to-digital conversion module successively, and described display module is connected on the corresponding port of micro controller module; Described photoelectric conversion module comprises the light source and silicon photocell that connect successively;
Wherein, photoelectric conversion module, for becoming the magnitude of current by the micro-displacement variable transitions of metal material;
Current/voltage-converted module, for converting the magnitude of current to voltage signal;
Amplifying circuit, for carrying out amplification process to voltage signal;
Filtering short circuit, for carrying out filtering process to amplifying the voltage signal after processing;
Analog-to-digital conversion module, for converting the analog voltage signal after filtering process to digital signal;
Micro controller module, for carrying out analyzing and processing to the digital signal received, and then completes the measurement of Young modulus;
Display module, for showing the Young modulus that micro controller module is measured in real time.
2. the measuring system of a kind of metal Young modulus based on photoelectric sensor according to claim 1, is characterized in that: described micro controller module adopts AVR series monolithic.
3. the measuring system of a kind of metal Young modulus based on photoelectric sensor according to claim 1, is characterized in that: described display module is LCD display.
4. the measuring system of a kind of metal Young modulus based on photoelectric sensor according to claim 1, is characterized in that: the chip model of described analog-to-digital conversion module is AD574.
5. the measuring system of a kind of metal Young modulus based on photoelectric sensor according to claim 1, is characterized in that: described amplifying circuit adopts TL084 integrated amplifier.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510348763.XA CN104931343A (en) | 2015-06-23 | 2015-06-23 | Metal Young-modulus measuring system based on photoelectric sensor |
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| CN201510348763.XA CN104931343A (en) | 2015-06-23 | 2015-06-23 | Metal Young-modulus measuring system based on photoelectric sensor |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105954100A (en) * | 2016-05-04 | 2016-09-21 | 东北大学 | Room temperature micro-tension tensile mechanical performance test method |
| CN109813608A (en) * | 2019-01-23 | 2019-05-28 | 徐州工程学院 | A method of steel wire Young's modulus is surveyed using polar distance formula capacitance sensor |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103994927A (en) * | 2014-05-21 | 2014-08-20 | 工业和信息化部电子第五研究所 | Young modulus testing method for metal |
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2015
- 2015-06-23 CN CN201510348763.XA patent/CN104931343A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103994927A (en) * | 2014-05-21 | 2014-08-20 | 工业和信息化部电子第五研究所 | Young modulus testing method for metal |
Non-Patent Citations (3)
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| 宫铁波等: "光电光杠杆测杨氏模量系统的研究", 《海军工程大学学报》 * |
| 崔青义等: "PSD的光电响应特征及其在杨氏模量测量中的应用", 《传感器与微系统》 * |
| 金三梅等: "基于光电传感器的金属杨氏模量的测量", 《电子技术》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105954100A (en) * | 2016-05-04 | 2016-09-21 | 东北大学 | Room temperature micro-tension tensile mechanical performance test method |
| CN109813608A (en) * | 2019-01-23 | 2019-05-28 | 徐州工程学院 | A method of steel wire Young's modulus is surveyed using polar distance formula capacitance sensor |
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Application publication date: 20150923 |