CN104914307A - Frequency spectrograph and multi-parameter parallel frequency-sweeping frequency spectrum measurement method thereof - Google Patents
Frequency spectrograph and multi-parameter parallel frequency-sweeping frequency spectrum measurement method thereof Download PDFInfo
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Abstract
The invention discloses a frequency spectrograph and a multi-parameter parallel frequency-sweeping frequency spectrum measurement method thereof. The frequency spectrograph comprises a signal input module, a control processing module, a signal measurement module and a display module. In the frequency spectrum measurement process, the signal input module obtains an input signal; the control processing module divides the display module into a plurality of test windows according to the number of preset test windows or the number of test windows set by a user, and saves parameter set performed on each test window by the user and set, performed on each test window by the user, of a test frequency point or a frequency band according to user's set; the signal measurement module performs frequency spectrum measurements on the frequency points or frequency bands corresponding to the test windows; and the display module displays measurement results corresponding to the test windows. The user can divide the display module into the multiple test windows and set different parameters for the test windows aiming the different frequency points of the same signal or conditions of different signals, frequency spectrum measurement time can be saved, and tedious operation of parameter switching in the prior at is prevented.
Description
Technical field
The present invention relates to spectrum measurement field, be specifically related to a kind of frequency spectrograph and multiparameter thereof and walk abreast the spectral measuring method of frequency sweep.
Background technology
Spectrum measurement technology has become measuring method more and more widely, but when utilizing the spectral measuring method of prior art to test echo signal, frequency spectrograph only has a display window and a set of sweep parameter, when measuring the different frequent points of a signal or multiple signal, often need to arrange multiple different parameters, the method of prior art just needs to arrange different parameters by the input keyboard of instrument or on-screen menu and tests respectively, switch loaded down with trivial details between parameter, testing efficiency is lower.
Such as, for measuring multiple frequency signal frequency point apart from each other, need to use wider sweeping widely to contain these points simultaneously.If use larger frequency resolution (RBW, Resolution Band With), although Measuring Time can shorten, test result resolution is not meticulous, and details cannot be observed; If use less frequency resolution, although can observe the very meticulous measurement details in each frequency place, can cause the sweep time grown very much, because the Measuring Time of less RBW is long, (scanning resolution is little or sweep roomy, and sweep time is just long; Scanning resolution is large or sweep wide little, and sweep time is just short).So usually can only, on the frequency that these need careful observation, use less frequency range repeatedly independently to test, with increase measure details reduce sweep time simultaneously, but which results in switch between parameter loaded down with trivial details, the problem that testing efficiency is lower.
Again such as, for measuring the different signal of multiple level magnitudes, need to use different witness mark level could observe the difference obtaining these signals.If use larger datum (Reference Level) signal that measuring amplitude is higher, just need to increase decay, then make an uproar rising in the end, cannot observe the lower signal of amplitude simultaneously; If use the signal that less datum measuring amplitude is lower, just need to open prime amplifier, then add distortion, the higher signal of amplitude cannot be observed simultaneously.So usually can only, on the level that these need careful observation, use different datum frequency ranges to carry out repeatedly independently test process, measure details to increase and reduce to measure distortion.
In existing frequency spectrograph technical scheme, sweep the parameters such as wide/resolution/datum/sweep time can only be arranged in man-machine interface and arrange unique executable sweep parameter, from the beginning single pass sweeps to tail, and is shown by scanning result on a display screen.If when measuring multiple different frequency and the large signal of amplitude state comparison in difference, need to use wider wide or larger datum of sweeping to contain these points simultaneously, instrument state can not take into account the feature of multiple signal, so a set of sweep parameter just can not well adaptive each need frequency accuracy and the amplitude precision of measuring-signal, independently test process can only be carried out repeatedly, switch complicated, be also inconvenient to contrast.
Summary of the invention
According to a first aspect of the invention, the spectral measuring method providing a kind of multiparameter to walk abreast frequency sweep, comprising:
Split window: start segmentation test window function; According to the test window quantity that the test window quantity preset or user are arranged, screen is partitioned into multiple test window;
Optimum configurations: choose one of multiple test window successively and optimum configurations is carried out to it;
The setting testing frequency or frequency range is carried out to selected test window;
Signal measurement: on each test window, spectrum measurement is carried out to the frequency of its correspondence or frequency range;
Result shows: on screen, show the measurement result corresponding to each test window.
Split window step also comprises: the sequence number automatically generating multiple test window.
Or arranging the sequence number of test window at parameter setting step, can be carry out sequence number setting to the test window chosen; Or the sequence number layout of test window is generated according to the order that this test window is selected.
Carrying out optimum configurations to the test window chosen is: to sweeping wide and/or resolution and/or datum and/or arranging sweep time.
Signal measurement step is: utilize each test window to carry out spectrum measurement to the frequency of its correspondence or frequency range in order.
Spectral measuring method can also comprise: the quantity increasing or reduce test window.The parameter of the test window increased is with in original test window, last is identical by the parameter of the test window carrying out optimum configurations.
Spectral measuring method also can comprise and arranges measurement pattern, and arranging measurement pattern is: the measurement pattern arranging frequency spectrograph is that single measurement or circulation are measured; Single measurement is, after frequency spectrograph completes a spectrum measurement of multiple test window, terminates measuring process; Circulation is measured as, and after frequency spectrograph completes a spectrum measurement of multiple test window, circulation performs spectrum measurement process, until reach default cycle index or the cycle index of setting.
According to a second aspect of the invention, provide a kind of frequency spectrograph, comprise signal input module, control treatment module, signal measurement module and display module.Signal input module is connected to control treatment module, for obtaining input signal; Control treatment module is used for the test window quantity arranged according to the test window quantity preset or user, display module is partitioned into multiple test window, and according to the setting of user, preserve the setting of optimum configurations that user carries out each test window and test frequency or frequency range; Signal measurement module is connected to control treatment module, for carrying out spectrum measurement to the frequency corresponding to each test window or frequency range; Display module is connected to control treatment module and signal measurement module, for showing the measurement result corresponding to each test window.
Optimum configurations comprises sweeps wide and/or resolution and/or datum and/or sweep time setting.
Control treatment module also for increasing or reduce the quantity of test window, the parameter of the test window of increase is with in original test window, last is identical by the parameter of the test window carrying out optimum configurations.
Signal measurement module utilizes each test window to carry out spectrum measurement to the frequency of its correspondence or frequency range in order.
Control treatment module is also for arranging measurement pattern, and the measurement pattern namely arranging frequency spectrograph is that single measurement or circulation are measured; Single measurement is, after frequency spectrograph completes a spectrum measurement of multiple test window, terminates measuring process; Circulation is measured as, and after frequency spectrograph completes a spectrum measurement of multiple test window, circulation performs spectrum measurement process, until reach default cycle index or the cycle index of setting.
The invention has the beneficial effects as follows, user can for the situation of different frequent points or unlike signal in same signal, be partitioned into multiple test window and different parameters is arranged to multiple test window, for the frequency that precise requirements is high, higher resolution is set, low frequency is handed over for precise requirements, higher resolution need not be set, so both save the time of spectrum measurement, it also avoid the troublesome operation that prior art carries out parameter switching.
Accompanying drawing explanation
Fig. 1 is the structural scheme of mechanism of the frequency spectrograph of the embodiment of the present invention one;
Fig. 2 is the measured signal schematic diagram of the embodiment of the present invention one;
Fig. 3 is the Application of Splitting Window design sketch of the frequency spectrograph of the embodiment of the present invention one;
Fig. 4 is the spectrum measurement result display effect figure of the embodiment of the present invention one;
Fig. 5 is the measured signal schematic diagram of the embodiment of the present invention two;
Fig. 6 is the spectrum measurement result display effect figure of the embodiment of the present invention two.
Embodiment
By reference to the accompanying drawings the present invention is described in further detail below by embodiment.
Embodiment one:
Be illustrated in figure 1 the structural representation of the present embodiment frequency spectrograph, comprise load module 001, control treatment module 002, signal measurement module 003 and display module 004.Load module 001 is connected to control treatment module 002, for obtaining input signal; The test window quantity of control treatment module 002 for arranging according to the test window quantity preset or user, display module is partitioned into multiple test window, and according to the setting of user, preserve the setting of optimum configurations that user carries out each test window and test frequency or frequency range; Signal measurement module 003 is connected to control treatment module 002, for carrying out spectrum measurement to the frequency corresponding to each test window or frequency range; Display module 004 is connected to control treatment module 002 and signal measurement module 003, for showing the measurement result corresponding to each test window, and display module 004 i.e. screen.
The walk abreast spectral measuring method of frequency sweep of the multiparameter of the present embodiment comprises the steps:
S1, load module 001 obtain signal, and user starts segmentation test window function, and the test window quantity that control treatment module 002 is arranged according to the test window quantity preset or user is partitioned into multiple test window on screen.Particularly, as shown in Figure 2, user needs to scan tetra-frequencies of A1, A2, A3, the A4 on frequency spectrograph screen, known by analysis, four frequencies need to utilize different scanning resolutions to scan, therefore, the test window of the present embodiment is arranged in the input panel of frequency spectrograph or the remote menu of on-screen menu or correspondence by user, the quantity of test window is four, then screen is partitioned into four test windows, the segmentation effect of four test windows as shown in Figure 3.
S2, choose of four test windows, the setting testing frequency or frequency range is carried out to this test window, and optimum configurations is carried out to it, namely arranging sweeping wide, resolution // datum, sweep time etc., making this window can show scanning result to A1 frequency.The sequence number layout of test window is generated according to the order that this test window is selected, and the test window therefore chosen for the first time is numbered one.
In like manner, select second window, arrange test frequency or frequency range and parameter, make this window can show scanning result to A2 frequency, this test window is numbered two.
In like manner, the setting of the test window corresponding to A3 and A4 frequency is completed.
Because A1, A2, A3, A4 tetra-frequencies are mainly different to the requirement of scanning resolution, therefore the key distinction of the optimum configurations of four test windows is also that scanning resolution arranges different.
S3, unlatching scanning process, the signal measurement module 003 of frequency spectrograph utilizes four test windows to carry out spectrum measurement to the frequency of its correspondence or frequency range in order, and namely frequency spectrograph successively completes the scanning of No. first to fourth test window.
S4, screen show respectively the measurement result to A1, A2, A3, A4 tetra-frequencies, Figure 4 shows that the schematic diagram of the measurement result of A1, A2, A3, A4 tetra-frequencies.
In the implementation of spectral measuring method, can increase or reduce the quantity of test window.The parameter of the test window increased is with in original test window, last is identical by the parameter of carrying out the test window of optimum configurations No. four test window of A4 frequency (namely corresponding to).
Spectral measuring method also can comprise and arranges measurement pattern, and the step arranging measurement pattern can be before S3 step, and the measurement pattern that can arrange frequency spectrograph is that single measurement or circulation are measured.Single measurement is, after frequency spectrograph completes a spectrum measurement of multiple test window, terminates measuring process; Circulation is measured as, and after frequency spectrograph completes a spectrum measurement of multiple test window, circulation performs spectrum measurement process, until reach default cycle index or the cycle index of setting.
Embodiment two:
The walk abreast spectral measuring method of frequency sweep of the multiparameter of the present embodiment comprises the steps:
S1, startup segmentation test window function, as shown in Figure 5, user needs to scan B1, B2 two frequency bins on frequency spectrograph screen, known by analysis, due to distant, so the part between two frequencies does not need scanning, therefore, the test window of the present embodiment is set to two by user, then screen is partitioned into two test windows.
The parameters such as scanning resolution and datum that S2, two frequency bins need can be set to the same, choose one of them test window, the setting testing frequency is carried out to this test window, and wide, resolution, datum, sweep time etc. are swept to it arrange, make this window can show scanning result to B1 frequency.The sequence number layout of test window is generated according to the order that this test window is selected, and the test window therefore chosen for the first time is numbered one.
In like manner, select second window, arrange test frequency or frequency range and parameter, make this window can show scanning result to B2 frequency, this test window is numbered two.
S3, unlatching scanning process, frequency spectrograph utilizes two test windows to carry out spectrum measurement to the frequency of its correspondence in order.
S4, screen show respectively the measurement result to B1, B2 two frequency bins, Figure 6 shows that the schematic diagram of the measurement result of B1, B2 two frequency bins.For ease of checking, user can click number one test window, and such No. second test window is just blocked, and makes two test windows to be extruded on screen simultaneously, can show details better.
The present invention is in the structure of existing frequency spectrograph, by the setting of instrument in input keyboard (or long-range host computer order) split window function, original single on-screen display (osd) area is divided into multiple independently display window, and select to arrange the corresponding sweep parameter of many covers, often overlap sweep parameter to complete one and independently measure, realize by once to arrange and scanning process completes the measurement of overlapping parameter more.User can for the situation of different frequent points or unlike signal in same signal, different parameters is arranged to the multiple test windows be partitioned into, such as the frequency that precise requirements is high, higher resolution is set, low frequency is handed over for precise requirements, higher resolution need not be set, so both save the time of spectrum measurement, it also avoid the troublesome operation that prior art carries out parameter switching.
Above content is in conjunction with concrete embodiment further description made for the present invention, can not assert that specific embodiment of the invention is confined to these explanations.For general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, some simple deduction or replace can also be made.
Claims (10)
1. multiparameter walks abreast a spectral measuring method for frequency sweep, it is characterized in that, comprising:
Split window: start segmentation test window function;
According to the test window quantity that the test window quantity preset or user are arranged, screen is partitioned into multiple test window;
Optimum configurations: choose one of described multiple test window successively and optimum configurations is carried out to it;
The setting testing frequency or frequency range is carried out to selected test window;
Signal measurement: on each test window, spectrum measurement is carried out to the frequency of its correspondence or frequency range;
Result shows: on screen, show the measurement result corresponding to each test window.
2. the method for claim 1, is characterized in that, described split window step also comprises the sequence number generating described multiple test window;
The mode of the sequence number of the described multiple test window of described generation is: the sequence number automatically generating described multiple test window, or the sequence number of the test window chosen is generated through arranging, or the sequence number layout of test window is generated according to the order that this test window is selected.
3. the method for claim 1, is characterized in that, the described test window to choosing carries out optimum configurations and is: to sweeping wide and/or resolution and/or datum and/or arranging sweep time.
4. the method for claim 1, is characterized in that, described signal measurement step is: utilize each test window to carry out spectrum measurement to the frequency of its correspondence or frequency range in order.
5. the method for claim 1, is characterized in that, also comprises: the quantity increasing or reduce test window.
6. method as claimed in claim 5, is characterized in that, the parameter of the test window of described increase is with in original test window, last is identical by the parameter of the test window carrying out optimum configurations.
7. the method as described in any one of claim 1-6, is characterized in that, also comprises and arranges measurement pattern, and the described measurement pattern that arranges is: the measurement pattern arranging frequency spectrograph is that single measurement or circulation are measured;
Described single measurement is, after frequency spectrograph completes a spectrum measurement of described multiple test window, terminates measuring process;
Described circulation is measured as, and after frequency spectrograph completes a spectrum measurement of described multiple test window, circulation performs spectrum measurement process, until reach default cycle index or the cycle index of setting.
8. a frequency spectrograph, is characterized in that, comprises signal input module, control treatment module, signal measurement module and display module;
Described signal input module is connected to described control treatment module, for obtaining input signal;
Described control treatment module is used for the test window quantity arranged according to the test window quantity preset or user, display module is partitioned into multiple test window, and according to the setting of user, preserve the setting of optimum configurations that user carries out each test window and test frequency or frequency range;
Described signal measurement module is connected to described control treatment module, for carrying out spectrum measurement to the frequency corresponding to each test window or frequency range;
Described display module is connected to described control treatment module and described signal measurement module, for showing the measurement result corresponding to each test window.
9. method as claimed in claim 8, it is characterized in that, described optimum configurations comprises sweeps wide and/or resolution and/or datum and/or sweep time setting.
10. method as claimed in claim 8, it is characterized in that, described control treatment module also for increasing or reduce the quantity of test window, the parameter of the test window of described increase is with in original test window, last is identical by the parameter of the test window carrying out optimum configurations.
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