CN104913715B - Pipe wall thickness measuring module and pipe wall thickness measuring method using same - Google Patents

Pipe wall thickness measuring module and pipe wall thickness measuring method using same Download PDF

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Publication number
CN104913715B
CN104913715B CN201410128848.2A CN201410128848A CN104913715B CN 104913715 B CN104913715 B CN 104913715B CN 201410128848 A CN201410128848 A CN 201410128848A CN 104913715 B CN104913715 B CN 104913715B
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China
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contact
wall thickness
pipe thickness
pipe
measuring unit
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CN104913715A (en
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郭泰良
冯克林
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Industrial Technology Research Institute ITRI
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Industrial Technology Research Institute ITRI
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Abstract

A pipe wall thickness measuring module and a pipe wall thickness measuring method using the same are provided. The pipe wall thickness measuring module comprises a measuring unit group, a power supply, a voltage measuring unit and a wall thickness analyzing unit. The measuring unit group comprises a first joint, a second joint, a third joint and a fourth joint. The power supply is used for supplying current to the measuring unit group, wherein the current is input from one of the first contact, the second contact, the third contact and the fourth contact, and is output from the other of the first contact, the second contact, the third contact and the fourth contact. The voltage measuring unit is used for measuring voltage differences between the other two of the first joint, the second joint, the third joint and the fourth joint. The wall thickness analysis unit calculates a local wall thickness value of the conductive tube according to the voltage difference.

Description

Pipe thickness measurement module and apply its pipe thickness measuring method
Technical field
The present invention relates to a kind of pipe thickness measurement module and its pipe thickness measuring method is applied, and more particularly to one Plant the pipe thickness measurement module of the wall thickness of measurable contact tube and apply its pipe thickness measuring method.
Background technology
Pipe fitting can transmit fluid, and it can be applied to the fields such as nuclear energy, refrigerating and air conditioning, the vehicles.When inside pipe fitting transmits When high temperature, high pressure or acrid fluid, the durability of pipe fitting is tested.In general, just can after leaking It was found that pipe fitting produces thinning or breakage, however, because leakage has occurred and that, therefore inevitably produce corresponding danger and Maintenance cost.
The content of the invention
The present invention relates to a kind of pipe thickness measurement module and its pipe thickness measuring method is applied, pipe fitting thickness can be monitored Degree change.
According to one embodiment of the invention, a kind of pipe thickness measurement module is proposed.Pipe thickness measurement module is surveying Measure the local wall thickness of a contact tube.Pipe thickness measurement module includes a measuring unit group, a power supply unit, a voltage measurement Unit and a wall thickness analytic unit.Measuring unit group connects including one first contact, one second contact, one the 3rd contact and one the 4th Point.Power supply unit gives measuring unit group to supply an electric current, and wherein electric current is from the first contact, the second contact, the 3rd contact With one in the 4th contact input, and another from the first contact, the second contact, the 3rd contact and the 4th contact exports. Voltage measurement unit to measure the first contact, the second contact, the 3rd contact and the 4th contact it is other therebetween one One voltage difference.Wall thickness analytic unit calculates a local wall thickness value of contact tube according to first voltage difference.
According to another embodiment of the present invention, a kind of pipe thickness measuring method is proposed.Pipe thickness measuring method includes Following steps.There is provided a pipe thickness measurement module includes a measuring unit group in contact tube, wherein pipe thickness measurement module, Measuring unit group includes one first contact, one second contact, one the 3rd contact and one the 4th contact;It is single to measurement to supply an electric current Tuple, wherein electric current from one in the first contact, the second contact, the 3rd contact and the 4th contact input, and from the first contact, Another output of second contact, the 3rd contact and the 4th contact;Measure the first contact, the second contact, the 3rd contact and the 4th Other first voltages therebetween of contact are poor;And a local wall thickness value of contact tube is calculated according to first voltage difference.
More preferably understand to have to the above-mentioned and other aspect of the present invention, preferred embodiment cited below particularly, and coordinate attached Figure, is described in detail below:
Brief description of the drawings
Fig. 1 illustrates the pipe thickness measuring method flow chart according to one embodiment of the invention.
Fig. 2 illustrates the schematic diagram that contact tube is layed according to the pipe thickness measurement module of one embodiment of the invention.
Fig. 3 illustrates the schematic diagram from Fig. 2 the second contact input reverse current.
Fig. 4 illustrates the average voltage difference and the graph of a relation of thickness of pipe wall according to one embodiment of the invention.
Fig. 5 illustrates Fig. 2 measuring unit group and the partial sectional view of contact tube.
Fig. 6 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.
Fig. 7 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.
Fig. 8 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.
Fig. 9 illustrates the pipe thickness measuring method flow chart according to another embodiment of the present invention.
Figure 10 A illustrate the schematic diagram of the pipe thickness measurement module according to another embodiment of the present invention.
Figure 10 B illustrate the schematic diagram from Figure 10 A the second concurrent contact input reverse current.
【Symbol description】
10:Contact tube
100、200:Pipe thickness measurement module
110、110’、110’’:Measuring unit group
111:First wire
111a:First contact
112:Second wire
112a:Second contact
113:Privates
113a:3rd contact
114:Privates
114a:4th contact
120:Power supply unit
130:Voltage measurement unit
140:Wall thickness analytic unit
150:Switch unit
160:Control device
C1:Geometric center
D1:Curve
I:Electric current
L1、L1’:Line
P1、P1’:Location point
S1:Circumferential paths
S2:Axial path
S110~S194:Step
t:Local wall thickness value
ΔV1:First voltage is poor
ΔV2:Second voltage is poor
ΔVa:Average voltage is poor
Embodiment
Fig. 1 illustrates the pipe thickness measuring method flow chart according to one embodiment of the invention.
In step S110, referring to Fig. 2, it illustrates the pipe thickness measurement module paving according to one embodiment of the invention Located at the schematic diagram of contact tube.Pipe thickness measurement module 100 is provided, pipe thickness measurement module 100 is layed in contact tube 10 Easy thinning at outside wall surface on, as pipe fitting bending part outside wall surface on, to measure the local wall thickness of contact tube 10, Jin Erjian Survey the wall thickness change of contact tube 10.Pipe thickness measurement module 100 include several measuring unit groups 110, power supply unit 120, Voltage measurement unit 130, wall thickness analytic unit 140, switch unit 150 and control device 160.
In one embodiment, voltage measurement unit 130, wall thickness analytic unit 140 can with wantonly two in switch unit 150 It is integrated into a firmware (firmware) or is integrated into an integrated circuit formed by semiconductor technology.In another embodiment, voltage Measuring unit 130, wantonly two of wall thickness analytic unit 140 and switch unit 150 can be integrated in control device 160.Control dress 160 electric connection measuring unit groups 110, power supply unit 120, voltage measurement unit 130, wall thickness analytic unit 140 are put with cutting Unit 150 is changed, to be uniformly controlled this little unit.In addition, control device 160 can be desktop computer, notebook computer, hand The electronic installation of machine, server or other species.
Each measuring unit group 110 includes the first wire 111, the second wire 112, privates 113 and privates 114, Wherein the first wire 111, the second wire 112, privates 113 and privates 114 have the first contact 111a, second respectively Contact 112a, the 3rd contact 113a and the 4th contact 114a.First wire 111, the second wire 112, privates 113 and the 4th Wire 114 is connected to contact tube with the first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a respectively In 10 outside wall surface.In the present embodiment, the first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a Separately positioned, i.e. the first contact 111a, the second contact 112a, the 3rd contact 113a and wantonly two in the 4th contact 114a are not straight Connect in succession.
The first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a of each measuring unit group 110 Array shape (array), rectangular (matrix) can be arranged in, or the corner arrangement along a polygon, wherein polygonal are in this way Rectangle, triangle or rhombus.All measuring unit groups 110 can be arranged in array shape or rectangular.As long as wall thickness measuring can be carried out, The embodiment of the present invention is unlimited to determine measuring unit group 110 and/or the spread pattern of its contact.
In step S120, as shown in Fig. 2 power supply unit 120 supplies electric current I to ith measurement by switch unit 150 Unit group 110.The switching electric current I of switch unit 150 is from the first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th Contact 114a jth person's input, and switching electric current I is from the first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th Contact 114a another output, wherein i and j are more than 1 positive integer, and wherein initial value is 1.Illustrated with measuring unit group 110 ' For, power supply unit 120 supplies first contact 111as of the electric current I to measuring unit group 110 ', and switching electric current I connects from second Point 112a is exported.
In step S130, voltage measurement unit 130 measures the first contact 111a, the second contact 112a, the 3rd contact 113a With the 4th contact 114a other voltage differences therebetween.With measuring unit group 110 ' for example, voltage measurement unit 130 First voltage difference Δ V1 between 3rd contact 113a and the 4th contact 114a is measured by switch unit 150.Due to wire ( Three wires 113 and privates 114) resistance coefficient and contact tube 10 resistance coefficient difference, first voltage difference Δ V1 phases Δ Va poor compared with average voltage produces an overgauge ε, as shown in following formula (1).
ΔV1=ΔVa+ε.......................................................... (1)
In step S140, as shown in figure 3, it illustrates the schematic diagram from Fig. 2 the second contact input reverse current.Power supply supplies Device 120 is answered to supply electric current I to ith measurement unit group 110 by switch unit 150.The switching electric current I of switch unit 150 is from One contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a another input, and switching electric current I from First contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a jth person export.For example, switch The switching electric current I of unit 150 inputs from the second contact 112a, and switching electric current I exports from the first contact 111a.
In step S150, voltage measurement unit 130 measures the second electricity between the 3rd contact 113a and the 4th contact 114a Pressure differential deltap V2.Due to the difference of the resistance coefficient and the resistance coefficient of contact tube 10 of wire (privates 113 and privates 114) It is different, second voltage difference Δ V2 is produced a minus deviation ε compared to the poor Δ Va of average voltage of reality, as shown in following formula (2).
ΔV2=ΔVa-ε.......................................................... (2)
In step S160, such as following formula (3), voltage measurement unit 130 calculates first voltage difference Δ V1 and second voltage difference Δ A V2 average voltage difference Δ Va, this average voltage difference Δ Va have excluded departure ε.Further say, due to above-mentioned steps The design of S140 and S150 reverse current, after average first voltage difference Δ V1 and second voltage difference Δ V2, obtain more accurate The average voltage difference Δ Va of (compare first voltage difference Δ V1 with second voltage difference Δ V2 for), this average voltage difference Δ Va are excluded Because voltage error of the resistance coefficient of wire caused by with the difference of the resistance coefficient of contact tube 10.
In step S170, as shown in figure 4, it illustrates average voltage difference and the pass of thickness of pipe wall according to one embodiment of the invention System's figure.Curve D1 represents average voltage difference Δ Va and local wall thickness value t relation.Curve D1 can use experiment or analogy method to take , it can be stored in wall thickness analytic unit 140.Wall thickness analytic unit 140 goes to calculate or inquired about average electric according to Fig. 4 curve D1 The local wall thickness value t of contact tube 10 corresponding to pressure differential deltap Va.Due to average voltage difference Δ Va Δ V1s poor compared to first voltage With local wall thickness value t that is more accurate, therefore calculating or inquire about according to average voltage difference Δ Va for second voltage difference Δ V2 It is more accurate.In another embodiment, if the part for calculating or inquiring about with first voltage difference Δ V1 or second voltage difference Δ V2 Wall thickness value t also can be used as figure in the case of step S120 and S130 is omitted in range of allowable error using second voltage difference Δ V2 The local wall thickness value t that 4 average voltage difference is gone to calculate or inquired about;Or can be in the case of step S140 and S150 be omitted, with The local wall thickness value t that one voltage difference delta V1 goes to calculate or inquired about as Fig. 4 average voltage difference.
In another embodiment, step S160 and S170 can also be performed between step S190 and S192.That is, can be with After average voltage difference corresponding to whole contacts all input currents and acquisition, step S192 is entered back into, to all average electricity Pressure difference carries out wall thickness analysis.
Because the electric current input, electric current output and voltage difference measurements of the embodiment of the present invention are all confined to the measurement list of small area In tuple 110, therefore the direct current of low amounts is only needed to obtain the local wall thickness value t of accuracy and high sensitivity, it is therein Low amounts electric current is, for example, between 1 to 3 ampere.Because the required magnitude of current is very low, therefore the pipe thickness of the embodiment of the present invention The power consumption of measurement module 100 is low, can save the energy.
When the spacing of the two point of measuring unit group 110 is smaller, then the required magnitude of current is fewer;It is on the contrary then the more.Work as conduction The wall thickness of pipe 10 is thicker, then the required magnitude of current is fewer;It is on the contrary then the more.Therefore, between the two point of visual measuring unit group 110 Away from and/or the wall thickness of contact tube 10 depending on, above-mentioned low amounts electric current is also smaller than 1 ampere or more than 10 ampere.In one embodiment, survey Measuring the spacing of the two point of unit group 110 can make the required magnitude of current be situated between 0.1 times to 10 times of the wall thickness of contact tube 10 In the range of low power consumption.
Fig. 5 illustrates Fig. 2 measuring unit group 110 and the partial sectional view of contact tube.Above-mentioned local wall thickness value t may be defined to The wall thickness of optional position point on the line of average voltage difference Δ Va two point.For measuring unit group 110 ', partial wall Thickness value t may be defined to the wall thickness of the optional position point P1 on the 3rd contact 113a and the 4th contact 114a line L1, this implementation The location point P1 of example illustrates by taking line L1 midpoint as an example.First contact 111a, the second contact 112a, the 3rd contact 113a and Four contact 114a define a geometry, such as rectangle.In another embodiment, above-mentioned local wall thickness value t may be defined to the 3rd contact 113a, the 4th contact 114a and optional position point P1 ' that should be in the geometric center C1 area defined of what shape wall thickness, this The location point P1 ' of embodiment is, for example, geometric center C1 and location point P1 line L1 ' midpoint.
In step S180, judge whether each contact of each measuring unit group 110 all input currents.If so, then perform step Rapid S192;If it is not, then perform step S190.
In step S190, the numerical value for the i and/or j that adds up, and repeat step S120 to S170., can be to same in one embodiment All contacts of one measuring unit group 110 (maintaining i values) are sequentially after (j=j+1) input current, then to next measuring unit group 110 (i=i+1) all contacts sequentially (j=j+1) input current I., can be to same measuring unit group 110 in another embodiment After at least contact input current I out of the ordinary, then at least contact input current I out of the ordinary to another measuring unit group 110.With regard to electricity , can be to the contact on a circumferential paths S1 (around the axial path of contact tube 10) for contact tube 10 sequentially for stream input path Or not sequentially input current I;Or can to the contact on an axial path S2 of contact tube 10 sequentially or not sequentially input current I;Or can to the contact on scanning path sequentially or not sequentially input current I, wherein scanning pattern is, for example, simultaneously along week (that is, the component being projected on circumferential paths S1 and axial path S2 is not equal in the path extended to path S1 and axial path S2 0), e.g. sigmoid curve.As long as can be to average corresponding to all contacts all input current I of each measuring unit group 110 and acquisition Voltage difference, the embodiment of the present invention inputs the order of contact to electric current I and/or path does not limit.
, can after four contact all input currents of a measuring unit group 110 ' according to above-mentioned steps S120 to S170 Obtain the local wall thickness value t of four location point P1 (as shown in Figure 5).When four location point P1 of each measuring unit group 110 ' office After portion wall thickness value t is obtained, step S192 can be entered.
In step S192, wall thickness analytic unit 140 judge this little local wall thickness value t any one or some whether be less than Safe wall thickness value;If so, performing step S194, a warning message is exported;If it is not, then repeat step S120~S192, continues to supervise Survey the wall thickness change of contact tube 10.Warning message can be exported by control device 160 (Fig. 2).For example, when warning message is a text When word or color, control device 160 can include a display, to show warning message;Or when warning message is a sound When, control device 160 includes a sound follower, with the message that gives a warning.In addition, wall thickness analytic unit 140 will can also own Local wall thickness value t depict a Thickness Distribution figure as, the Thickness Distribution figure is shown by the display of control device 160, with It is easy to monitor.
Fig. 6 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.In the present embodiment, switching The switching electric current I of unit 150 inputs from the first contact 111a of measuring unit group 110, and switching electric current I is from measuring unit group 110 The 4th contact 114a output;Under designing herein, the measurable second contact 112a and the 3rd contact 113a of voltage measurement unit 130 Between first voltage difference Δ V1 and second voltage difference Δ V2, and according to this calculate average voltage difference Δ Va, wall thickness analytic unit 140 The average voltage difference Δ Va institutes that can be gone to calculate according to Fig. 4 curve D1 or inquire about between the second contact 112a and the 3rd contact 113a Corresponding local wall thickness value t (not illustrating).This local wall thickness value t may be defined to the second contact 112a and the 3rd contact 113a company Line L1 any location point P1 wall thickness, the location point P1 of the present embodiment illustrate by taking line L1 midpoint as an example.
Fig. 7 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.In the present embodiment, switching The switching electric current I of unit 150 inputs from the first contact 111a of measuring unit group 110, and switching electric current I is defeated from the 3rd contact 113a Go out;Under designing herein, the first voltage between the measurable second contact 112a and the 4th contact 114a of voltage measurement unit 130 is poor Δ V1 and second voltage difference Δ V2, and the average voltage difference Δ between the second contact 112a and the 4th contact 114a can be calculated according to this Va.Wall thickness analytic unit 140 can be gone to calculate or inquire about between the second contact 112a and the 4th contact 114a according to Fig. 4 curve D1 Average voltage difference Δ Va corresponding to local wall thickness value t (not illustrating).Local wall thickness value t may be defined to the second contact 112a with 4th contact 114a line L1 any location point P1 wall thickness, the location point P1 of the present embodiment is by taking line L1 midpoint as an example Explanation.
Fig. 8 illustrates the schematic diagram of the pipe thickness measuring method according to another embodiment of the present invention.It is adjacent in the present embodiment The two points of two measuring unit groups 110 be concurrent.For example, the 3rd contact 113a of measuring unit group 110 ' and measuring unit group 110 ' ' the first contact 111a concurrents turn into a concurrent contact, and the 4th contact 114a of measuring unit group 110 ' and measurement are single Tuple 110 ' ' the second contact 112a concurrents turn into an another concurrent contact.When local wall thickness value t is defined as two concurrent contacts On line during the wall thickness of a location point, then the average voltage difference between two concurrent contacts can be measured only once.For example, according to The part calculated according to the average voltage difference Δ Va between the 3rd contact 113a of measuring unit group 110 ' and the 4th contact 114a Wall thickness value t and according to the average voltage difference Δ Va between the first contact 111a and the second contact 112a of measuring unit group 110 ' ' The local wall thickness value t calculated is corresponding same position point P1 wall thickness, as long as therefore for the of measuring unit group 110 ' Three contact 113a and the 4th contact 114a or the first contact 111a and the second contact 112a of measuring unit group 110 ' ' measurement are once Average voltage difference Δ Va.In this way, input current can be reduced and measure the number of voltage difference, thus capable of reducing power consumption and lifting Wall thickness analyze speed.
In another embodiment, when local wall thickness value t is defined as in two concurrent contacts and geometric center C1 area defined Optional position point wall thickness when, then the average voltage difference between two concurrent contacts needs to measure secondary.For example, please join again According to shown in Fig. 8, according to the average voltage difference Δ Va between the 3rd contact 113a and the 4th contact 114a of measuring unit group 110 ' The local wall thickness value t calculated is defined as location point P1 ' wall thickness, and according to the first contact 111a of measuring unit group 110 ' ' The local wall thickness value that average voltage difference Δ Va between the second contact 112a is calculated is defined as location point P1 ' ' wall thickness, by In location point P1 ' and location point P1 ' ' non-co-located points, therefore the 3rd contact 113a of measuring unit group 110 ' and measurement are single Tuple 110 ' ' between average voltage difference Δ Va, with the first contact 111a and the second contact 112a of measuring unit group 110 ' ' it Between average voltage difference Δ Va ' need indivedual measurements.
Fig. 9 illustrates the pipe thickness measuring method flow chart according to another embodiment of the present invention.
In step S110, as shown in Figure 10 A, it illustrates the pipe thickness measurement module according to another embodiment of the present invention Schematic diagram.Pipe thickness measurement module 200 is layed in the outside wall surface at the easy thinning of contact tube 10, such as the outer wall of bending part On face, to measure the local wall thickness of contact tube 10, and then the wall thickness change of contact tube 10 is monitored.Pipe thickness measurement module 200 Including several measuring unit groups 110, power supply unit 120, voltage measurement unit 130, wall thickness analytic unit 140, switch unit 150 and control device 160.
In the present embodiment, each measuring unit group 110 includes the first wire 111, the second wire 112, privates 113 and the Four wires 114, wherein the first wire 111, the second wire 112, privates 113 and privates 114 have first to connect respectively Point 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a.It is unlike the embodiments above, the present embodiment The first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a wantonly 2 concurrents, and the first contact 111a, the second contact 112a, the 3rd contact 113a and the 4th contact 114a other 2 concurrents.The present embodiment is with the first contact 111a and the 3rd contact 113a forms one first concurrent contact, and the second contact 112a and the 4th contact 114a forms one second and is total to Illustrate exemplified by point contact.
In the present embodiment, the first wire 111 forms a thermocouple (Thermocouple) with privates 113, with measurement The temperature of first concurrent contact (the first contact 111a and the 3rd contact 113a).First wire 111 is hot swollen with privates 113 Swollen coefficient is different, makes the first wire 111 different from the output voltage difference of privates 113.It can be obtained by this output voltage difference Temperature of the contact tube 10 in place of the first concurrent contact.
The thermal expansion coefficient difference of first wire 111 and privates 113 can be realized by material selection.Enter a ground to say, First wire 111 can be used as positive pole with one in privates 113, and another can be used as negative pole;In one embodiment, positive pole Material be iron, and the material of negative pole is made up of copper with nickel, and the ratio of wherein nickel accounts for 45%;Or the material of positive pole is by nickel and chromium Composition, the ratio of wherein chromium accounts for 10%, and the material of negative pole is made up of nickel, aluminium, manganese and silicon, and the ratio of wherein aluminium accounts for 2%, the ratio of manganese Example accounts for 2%, and the ratio of silicon accounts for 1%;Or the material of positive pole is made up of nickel, chromium and silicon, the ratio of wherein chromium accounts for 14%, the ratio of silicon Example accounts for 1.5%, and the material of negative pole is made up of nickel, manganese and silicon, and the ratio of wherein silicon accounts for 4.5%, and the ratio of manganese accounts for 0.1%;Or The material of positive pole is copper, and the material of negative pole is made up of copper with nickel, and the ratio of wherein nickel accounts for 45%;Or the material of positive pole is by nickel Formed with chromium, the ratio of wherein chromium accounts for 10%, and the material of negative pole is made up of copper with nickel, and the ratio of wherein nickel accounts for 45%;Or just The material of pole is made up of platinum and rhodium, and the ratio of wherein rhodium accounts for 13%, and the material of negative pole is platinum;Or the material of positive pole by platinum with Rhodium forms, and the ratio of wherein rhodium accounts for 10%, and the material of negative pole is platinum;Or the material of positive pole is made up of platinum and rhodium, wherein rhodium Ratio account for 30%, and the material of negative pole is made up of platinum with rhodium, and the ratio of wherein rhodium accounts for 6%;Or the material of positive pole is by tungsten and rhenium Composition, the ratio of wherein rhenium accounts for 5%, and the material of negative pole is made up of tungsten with rhenium, and the ratio of wherein rhodium accounts for 26%.However, positive pole and The material adapted not limited to this of negative pole, all can be as the positive pole of the embodiment of the present invention as long as the material of temperature survey can be realized And the material selection of negative pole.
In addition, the second wire 112 forms another thermocouple with privates 114, to measure the second concurrent contact, (second connects Point 112a and the 4th contact 114a) temperature.The material adapted of second wire 112 and privates 114 can be led similar in appearance to first Line 111 and privates 113, hold this and repeat no more.
In step S120, as shown in Figure 10 A, power supply unit 120 supplies electric current I to i-th of survey by switch unit 150 Measure unit group 110.The switching electric current I of switch unit 150 is from the first concurrent contact of ith measurement unit group 110 and the second concurrent One in contact input, and switching electric current I is from the first concurrent contact and the second concurrent contact of ith measurement unit group 110 In another output.Illustrate by taking measuring unit group 110 ' as an example, the switching electric current I of switch unit 150 is from measuring unit group 110 ' The first concurrent contact (the first contact 111a and the 3rd contact 113a) input, and switching electric current I is from measuring unit group 110 ' Second concurrent contact (the second contact 112a and the 4th contact 114a) exports.
In step S130, as shown in Figure 10 A, voltage measurement unit 130 measures measuring unit group by switch unit 150 First voltage difference Δ V1 between 110 ' the first concurrent contact and the second concurrent contact.
In step S140, as shown in Figure 10 B, it illustrates the signal from Figure 10 A the second concurrent contact input reverse current Figure.Power supply unit 120 supplies electric current I to ith measurement unit group 110 by switch unit 150.Switch unit 150 switches Electric current I switches from another input in the first concurrent contact and the second concurrent contact of ith measurement unit group 110 Electric current I exports from this in the first concurrent contact and the second concurrent contact of ith measurement unit group 110.It is single to measure Illustrate exemplified by tuple 110 ', second concurrent contact (second contacts of the switching electric current I of switch unit 150 from measuring unit group 110 ' 112a and the 4th contact 114a) input, and switching electric current I is from first concurrent contact (the first contact of measuring unit group 110 ' 111a and the 3rd contact 113a) output.
In step S150, as shown in Figure 10 B, voltage measurement unit 130 measures measuring unit group by switch unit 150 Second voltage difference Δ V2 between 110 ' the first concurrent contact and the second concurrent contact.
The step S160 of Fig. 9 step S160 similar diagrams 1, holds this and repeats no more.
In step S165, when the internal transmission high temperature of contact tube 10, high pressure or acrid fluid, cause voltage measurement Average voltage difference Δ Va measured by unit 130 contains temperature variations.However, by the step S165 of the present embodiment, can disappear Remove or reduce the average voltage difference variation caused by this temperature variations.
Such as following formula (4), voltage measurement unit 130 is repaiied according to the thermalexpansioncoefficientα of contact tube 10 and the temperature of contact tube 10 Positive average voltage difference Δ Va, to obtain revised average voltage difference Δ Va '.In formula (4), Δ Va (T) represents that contact tube 10 exists Measured average voltage is poor during temperature T (being, for example, the temperature of outside wall surface), T0Reference temperature is represented, Δ Va ' represents amendment Average voltage afterwards is poor (excluding the voltage difference after temperature variations), and α represents the thermal coefficient of expansion of contact tube 10.Thermal coefficient of expansion α can be different with material category, for example, using the material of contact tube 10 as carbon steel for, it is in reference temperature T0Thermal expansion system Number α is 0.005 DEG C-1
In step S170, average voltage of the wall thickness analytic unit 140 using revised average voltage difference Δ Va ' as Fig. 4 Poor Δ Va, and according to Fig. 4 curve D1 go to calculate or inquire about the local wall thickness value corresponding to revised average voltage difference Δ Va ' t。
Fig. 9 similar above-mentioned Fig. 1 of step S180 to S194 step S180 to S194, holds this and repeats no more.
In summary, although the present invention is disclosed as above with preferred embodiment, so it is not limited to the present invention.This hair Bright one of ordinary skill in the art, without departing from the spirit and scope of the present invention, when can be used for a variety of modifications and variations.Therefore, Protection scope of the present invention is worked as to be defined depending on appended claims confining spectrum.

Claims (18)

1. a kind of pipe thickness measurement module, to measure the local wall thickness of a contact tube, the pipe thickness measurement module includes:
One measuring unit group, including one first contact, one second contact, one the 3rd contact and one the 4th contact;
One power supply unit, to supply an electric current to the measuring unit group, wherein the electric current from first contact, this second connects An input in point, the 3rd contact and the 4th contact, and from first contact, second contact, the 3rd contact with Another output in 4th contact;
One switch unit, to switch the electric current from first contact, second contact, the 3rd contact and the 4th contact This another input, and switch the electric current and from first contact, second contact, the 3rd contact and the 4th contact This output;
One voltage measurement unit, to measure its in first contact, second contact, the 3rd contact and the 4th contact Its first voltage therebetween is poor, and measures in first contact, second contact, the 3rd contact and the 4th contact Other second voltages therebetween it is poor, and to calculate an average electricity of first voltage difference and second voltage difference Pressure difference;And
One wall thickness analytic unit, a local wall thickness value of the contact tube is calculated according to average voltage difference.
2. pipe thickness measurement module as claimed in claim 1,
Wherein, the switch unit also switches the electric current from first contact, second contact, the 3rd contact and the 4th contact In this input, and switch the electric current from first contact, second contact, the 3rd contact and the 4th contact Another output.
3. pipe thickness measurement module as claimed in claim 1, the wherein heat of the wall thickness analytic unit also according to the contact tube The temperature adjustmemt of the coefficient of expansion and the contact tube average voltage is poor, and also calculates this according to revised average voltage difference and lead The local wall thickness value of fulgurite.
4. pipe thickness measurement module as claimed in claim 1, wherein first contact, second contact, the 3rd contact The outside wall surface located at the contact tube is separated with the 4th contact.
5. pipe thickness measurement module as claimed in claim 1, in addition to:
One first wire, there is first contact;
One second wire, there is second contact;
One privates, there is the 3rd contact;And
One privates, there is the 4th contact;
Wherein, this in first contact, second contact, the 3rd contact and the 4th contact and first contact, Other one in the two in second contact, the 3rd contact and the 4th contact are concurrents, and first contact, should In second contact, the 3rd contact and the 4th contact this another and first contact, second contact, the 3rd contact It is concurrent with the two other another in the 4th contact.
6. pipe thickness measurement module as claimed in claim 1, wherein first contact, second contact, the 3rd contact An array shape is arranged in the 4th contact.
7. pipe thickness measurement module as claimed in claim 1, wherein the wall thickness analytic unit define first contact, this Two point, the pipe thickness of the 3rd contact and a location point of other lines of the two of the 4th contact are the partial wall Thickness value.
8. pipe thickness measurement module as claimed in claim 1, wherein first contact, second contact, the 3rd contact A geometry is formed with the 4th contact, the wall thickness analytic unit defines first contact, second contact, the 3rd contact The thickness of pipe wall of a location point in region is surrounded with the two other geometric center with the geometry in the 4th contact Spend for the local wall thickness value.
9. pipe thickness measurement module as claimed in claim 1, including:
One first contact in multiple measuring unit groups, wherein these measuring unit groups, the second contact, the 3rd First contact of contact and two in the 4th contact and the adjacent measuring unit group, second contact, the 3rd connect Point is concurrent with two in the 4th contact.
10. a kind of pipe thickness measuring method, including:
There is provided a pipe thickness measurement module includes a measuring unit group in the contact tube, wherein the pipe thickness measurement module, The measuring unit group includes one first contact, one second contact, one the 3rd contact and one the 4th contact;
An electric current is supplied from first contact, second contact, the 3rd contact and to be somebody's turn to do to the measuring unit group, the wherein electric current One in 4th contact input, and from first contact, second contact, the 3rd contact and the 4th contact another Output;
Measure first contact, second contact, other one first electricity therebetween of the 3rd contact and the 4th contact Pressure difference;
Switch first contact, second contact, the 3rd contact and another input in the 4th contact;
Switch first contact, second contact, the 3rd contact and this output in the 4th contact;
Measure in first contact, second contact, the 3rd contact and the 4th contact this it is other therebetween one the Two voltage differences;
The average voltage for calculating first voltage difference and second voltage difference is poor;And
A local wall thickness value of the contact tube is calculated according to average voltage difference.
11. pipe thickness measuring method as claimed in claim 10, in addition to:
Switch the electric current from first contact, second contact, the 3rd contact and this input in the 4th contact;With And
Switch the electric current from first contact, second contact, the 3rd contact and another output in the 4th contact.
12. pipe thickness measuring method as claimed in claim 10, in addition to:
According to the temperature adjustmemt of the thermal coefficient of expansion of the contact tube and the contact tube, the average voltage is poor;And according to revised Average voltage difference calculates the local wall thickness value of the contact tube.
13. pipe thickness measuring method as claimed in claim 10, wherein first contact, second contact, the 3rd connect Point separates the outside wall surface located at the contact tube with the 4th contact.
14. pipe thickness measuring method as claimed in claim 10, wherein the pipe thickness measurement module also include:
One first wire, there is first contact;
One second wire, there is second contact;
One privates, there is the 3rd contact;And
One privates, there is the 4th contact;
Wherein, this in first contact, second contact, the 3rd contact and the 4th contact and first contact, Second contact, other one in the two of the 3rd contact and the 4th contact are concurrents, and first contact, this In two point, the 3rd contact and the 4th contact this another with first contact, second contact, the 3rd contact with Other another in the two in 4th contact are concurrents.
15. pipe thickness measuring method as claimed in claim 10, wherein first contact, second contact, the 3rd connect Point is arranged in an array shape with the 4th contact.
16. pipe thickness measuring method as claimed in claim 10, wherein the wall thickness analytic unit define first contact, are somebody's turn to do Second contact, the pipe thickness of the 3rd contact and a location point of other lines of the two of the 4th contact are the part Wall thickness value.
17. pipe thickness measuring method as claimed in claim 10, wherein first contact, second contact, the 3rd connect Point forms a geometry with the 4th contact, and the wall thickness analytic unit defines first contact, second contact, the 3rd connect The geometric center of point and other the two and the geometries of the 4th contact surrounds the thickness of pipe wall of a location point in region Spend for the local wall thickness value.
18. pipe thickness measuring method as claimed in claim 10, in addition to:
Multiple pipe thickness measurement modules are provided in the contact tube, wherein a measuring unit group in these measuring unit groups First contact, second contact, two in the 3rd contact and the 4th contact with the measuring unit group that abuts First contact, second contact, the 3rd contact and two in the 4th contact are concurrents.
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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107655395A (en) * 2017-11-14 2018-02-02 成都六惠科技有限公司 wall thickness monitoring device and system
CN107702635A (en) * 2017-11-14 2018-02-16 成都六惠科技有限公司 Wall thickness monitoring method and device

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2659861A (en) * 1951-11-01 1953-11-17 Branson Instr Apparatus for electrical thickness measurement
US3735254A (en) * 1970-06-06 1973-05-22 Philips Corp Method of determining the sheet resistance and measuring device therefor
JPS5298467A (en) * 1976-02-16 1977-08-18 Hitachi Ltd Resistivity measuring method for semiconductor devices
US4764026A (en) * 1986-07-07 1988-08-16 Varian Associates, Inc. Semiconductor wafer temperature measuring device and method
JPS6466501A (en) * 1987-09-08 1989-03-13 Sumitomo Spec Metals Thickness measurement of insb single crystal wafer for compound substrate
EP0299875B1 (en) * 1987-07-13 1994-09-21 Mitsubishi Petrochemical Co., Ltd. Method of measuring resistivity, and apparatus therefor
US5670888A (en) * 1992-11-25 1997-09-23 Cheng; David Method for transporting and testing wafers
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
CN201096491Y (en) * 2007-08-31 2008-08-06 上海美维科技有限公司 Metal foil thickness meter measuring probe

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004053021A1 (en) * 2004-11-03 2006-05-04 Nexans Method for determining the wall thickness of a metal pipe
CN101241153B (en) * 2008-03-07 2010-12-15 华中科技大学 Thin film electric resistivity automatic measuring instruments
JP5679758B2 (en) * 2010-10-12 2015-03-04 株式会社東芝 Thickness measuring apparatus and measuring method thereof
CN202836500U (en) * 2012-01-06 2013-03-27 沈阳中科韦尔腐蚀控制技术有限公司 Metal wall thickness detector with probes distributed in matrix

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2659861A (en) * 1951-11-01 1953-11-17 Branson Instr Apparatus for electrical thickness measurement
US3735254A (en) * 1970-06-06 1973-05-22 Philips Corp Method of determining the sheet resistance and measuring device therefor
JPS5298467A (en) * 1976-02-16 1977-08-18 Hitachi Ltd Resistivity measuring method for semiconductor devices
US4764026A (en) * 1986-07-07 1988-08-16 Varian Associates, Inc. Semiconductor wafer temperature measuring device and method
EP0299875B1 (en) * 1987-07-13 1994-09-21 Mitsubishi Petrochemical Co., Ltd. Method of measuring resistivity, and apparatus therefor
JPS6466501A (en) * 1987-09-08 1989-03-13 Sumitomo Spec Metals Thickness measurement of insb single crystal wafer for compound substrate
US5691648A (en) * 1992-11-10 1997-11-25 Cheng; David Method and apparatus for measuring sheet resistance and thickness of thin films and substrates
US5670888A (en) * 1992-11-25 1997-09-23 Cheng; David Method for transporting and testing wafers
CN201096491Y (en) * 2007-08-31 2008-08-06 上海美维科技有限公司 Metal foil thickness meter measuring probe

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