CN102072916A - Method and device for measuring total hemispherical emissivity of non-metallic material - Google Patents
Method and device for measuring total hemispherical emissivity of non-metallic material Download PDFInfo
- Publication number
- CN102072916A CN102072916A CN 201010529042 CN201010529042A CN102072916A CN 102072916 A CN102072916 A CN 102072916A CN 201010529042 CN201010529042 CN 201010529042 CN 201010529042 A CN201010529042 A CN 201010529042A CN 102072916 A CN102072916 A CN 102072916A
- Authority
- CN
- China
- Prior art keywords
- testing sample
- hemisphere
- temperature
- target analysis
- analysis zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The present invention relates to the technical field of measurement of thermal physical parameters of a material, in particular to a method and a device for measuring total hemispherical emissivity of a non-metallic material. The measurement method comprises the following steps: selecting a center area in the middle section of a multi-section combined and cylindrical sleeve-shaped sample to be tested as a target analysis area in a vacuum environment; embedding a powered heating module into the sample to be tested in a penetrating way; and calculating the total hemispherical emissivity through measuring the geometric dimensions of the middle section of the sample to be tested, the geometric dimensions of the target analysis area, the internal temperature of the vacuum environment in a thermal equilibrium state, and the surface temperature and the heat power of the middle section of the sample to be tested and the target analysis area. Since the heating module is embedded in the cylindrical sleeve-shaped sample to be tested, the demands are satisfied for measurement of the total hemispherical emissivity of the non-metallic material at high temperature, and the present invention has the advantages that the measurement device has a simple structure and high-precision measurement data can be obtained.
Description
Technical field
The present invention relates to measure material thermophysical parameter technical field, particularly a kind of nonmetallic materials hemisphere is to the measuring method and the device of total emissivity.
Background technology
Hemisphere is one of important thermal physical property parameter of material to total emissivity, has characterized the material surface thermal radiation capability, is the important foundation physical data of research radiation heat transfer and Thermal Efficiency Analysis.At high-technology fields such as Aero-Space, energy source and powers, the novel fire resistant nonmetallic materials are widely used, yet as the hot physical data of exosyndrome material performance, the high temperature hemisphere of nonmetallic materials extremely lacks to emissivity.
Measuring method mainly can be divided into calorimeter method, reflectivity method, energy comparison etc. at present.Its experimental principle is that the hemisphere that calculates material surface is to total emissivity by the heat and the surface temperature of measuring samples under thermal equilibrium state.Wherein, calorimeter method has higher accuracy because used device structure is simple, easy to operate, therefore uses the most widely.Adopt the main related work of calorimeter method as follows:
First kind of scheme is for to utilize heating plate that the material bottom surface is heated in vacuum chamber, by measuring electric current, voltage and material upper surface temperature, calculate the long emissivity of all-wave (The Institute of Physics J.Phys.E:Sci.Instrum., 13:873-876,1980 of material; Solar energy journal, 3 (2): 202-211,1982).
Second kind of scheme is for being close to two sample thin slices on the two sides of heating plate, utilize the lead of heating plate that it is suspended in the vacuum chamber, pass to current flow heats, by measuring electric power and material surface temperature, find the solution hemisphere to total emissivity (Journal of heat transfer, 128:302-306,2006; The low temperature physics journal, 30 (3): 266-269,2008).
There are some limitation in above-mentioned two kinds of typical measuring methods:
1) sample surfaces heated temperatures non-uniform Distribution brings error for the calculating of emissivity;
2) the radiation heat transfer amount adopts the electric power value of heating during thermal equilibrium, and the reliability to measured value does not give labor;
3) sample test temperature lower (＜400 ℃) is not seen to have and can be satisfied the explanation and actual test that high temperature (＞1000 ℃) is measured.
In addition, prior art adopts pulse current that sample is carried out transient heating to high temperature (1200～2000 ℃) in addition, radiation heat transfer amount when calculating balance by measuring electrodymamometer, utilize the laser optics thermometry to obtain the sample surfaces temperature, and then calculation sample hemisphere is to total emissivity (Meas.Sci.Technol.12 (2001) 2095-2102.).Although this method can satisfy the measurement demand under the high temperature, the result is also more accurate, the experimental system complex and expensive, and the institute measure and monitor the growth of standing timber the material only limit to conductor, can not be used for measuring idioelectric nonmetallic materials.
Summary of the invention
(1) technical matters that will solve
The technical problem to be solved in the present invention provides measuring method and the device of a kind of simple, reliable non-metal material high temperature hemisphere to total emissivity, overcome existing hemisphere and can not be applicable to the high temperature nonmetallic materials, device complexity and the not high shortcoming of measuring accuracy to the total emissivity measuring method.
(2) technical scheme
In order to address the above problem, one aspect of the present invention provides the measuring method of a kind of nonmetallic materials hemisphere to total emissivity, comprises step:
S1, in vacuum environment, the central area of the interlude of the cylindrical sleeve tubular testing sample of selected multistage combination is as the target analysis zone;
S2 runs through the inside that embeds described testing sample with the heating module after the energising;
S3 measures the physical dimension in testing sample interlude and target analysis zone and under thermal equilibrium state, the surface temperature and the heat power in vacuum environment internal temperature, described testing sample target analysis zone calculate hemisphere to total emissivity.
On the other hand, the invention provides the measurement mechanism of a kind of nonmetallic materials hemisphere, comprising to total emissivity:
The central area of the cylindrical sleeve tubular testing sample interlude of selected multistage combination is as the target analysis zone;
Vacuum module comprises vacuum chamber and vacuum pump, is used for vacuum environment;
Heating module by heating module being run through the inside that embeds described testing sample, heats described testing sample;
Measurement module is measured the physical dimension in testing sample interlude and target analysis zone and under thermal equilibrium state, the surface temperature and the heat power in vacuum environment internal temperature, described testing sample target analysis zone calculate hemisphere to total emissivity.
(3) beneficial effect
Nonmetallic materials hemisphere provided by the invention compared with prior art, has following outstanding advantage to the measuring method and the device of total emissivity:
(1) heating module adopts the columniform heating rod that refractory metal is made, nonmetal testing sample adopts multistage cylindrical sleeves structural design, heating rod is embedded in the testing sample, for nonmetal sample provides uniform and stable thermal source, be applicable to the heating of non-conductive material, the calculating of radiation heat transfer amount is simple, accurate, can make the temperature range of specimen reach 20～1600 ℃ simultaneously, be better than the current experiments device, satisfied the demand that high temperature hemisphere is measured to total emissivity.
(2) nonmetal testing sample adopts the cylindrical sleeves structural design of multistage combination, the central area of selecting the testing sample interlude is as the measurement target analyzed area, its Temperature Distribution has homogeneity preferably, has solved specimen temperature non-uniform Distribution and has calculated the influence that brings to emissivity.Simultaneously, adopt the Temperature Distribution of contact and two kinds of technology on-line measurements of non-contact temperature measuring sample surfaces, solved effective measurement of 20～1600 ℃ of wide temperature ranges, thereby guaranteed the accuracy of temperature measuring data effectively.
Description of drawings
Fig. 1 is the measuring method schematic flow sheet of embodiment of the invention nonmetallic materials hemisphere to total emissivity;
Fig. 2 is the measurement mechanism structural representation of embodiment of the invention nonmetallic materials hemisphere to total emissivity.
Among the figure: 1, vacuum chamber; 2, vacuum pump; 3, heating rod; 4, window; 5, cooling dome; 6, support; 7, clip; 8, testing sample; 9, supply terminals; 10-13, thermopair; 14, voltage measurement end.
Embodiment
Below in conjunction with drawings and Examples, the specific embodiment of the present invention is described in further detail.Following examples are used to illustrate the present invention, but are not used for limiting the scope of the invention.
With reference to figure 1, embodiment of the invention nonmetallic materials hemisphere specifically comprises the steps: to the measuring method of total emissivity
Step 1, in vacuum environment, the central area of the cylindrical sleeve tubular testing sample interlude of selected multistage combination is as the target analysis zone.
Be specially: be coated with in the vacuum environment with high emissivity coating, be used to provide the environment of an approximate black matrix, the vacuum tightness in the vacuum environment is less than 1 * 10
-3Pa.Testing sample adopts the cylindrical sleeve tubular nonmetal sample of multistage combination, and testing sample is equally divided into three sections, is respectively the testing sample epimere, testing sample interlude, testing sample hypomere.In embodiments of the present invention, testing sample is the assembly of three sections cylindrical sleeve tubular samples.The interlude central area of the selected testing sample of the embodiment of the invention is as the target analysis zone of measuring.The concrete operations in selected center zone are: the centre that earlier one of them thermopair is installed in the testing sample interlude, the right equidistant both sides that are installed in the thermopair that is in middle position of latter two thermopair, relevant with the testing sample heat conductivility away from the spacing of central position thermopair according to the physical length of testing sample.If when the coefficient of heat conductivity of this testing sample was big, then this spacing can be provided with smallerly earlier, otherwise this spacing can be provided with more earlier.Observe three temperature that thermopair records,, adjust the placement location that is in the both sides thermopair if when the temperature that records of these three electroheat pairs exists than big-difference.When the temperature that records up to these three thermopairs reached unanimity substantially, the set-point of both sides thermopair was determined.This moment, the zone of distance between the thermopair of both sides was chosen to be the central area of testing sample interlude.This central area has guaranteed the homogeneity of temperature conduction, and it is even to guarantee to be positioned at the temperature that three thermopairs on the central area record, and error is less.Select testing sample the cylindrical sleeve tubular of multistage for use, can reduce the thermograde of testing sample effectively, obtain the equally distributed target analysis of temperature zone, the accuracy that helps measuring.
Be specially: the cylindrical heating rod that heating module adopts refractory metal to make, heating rod is run through in the embedding testing sample, for providing, testing sample is heated evenly stable thermal source.For testing sample is fully contacted with heating rod, the external diameter of this heating rod is identical with the internal diameter of testing sample, and the length of length and this testing sample is close.By heat-conduction effect, it is temperature required that heating rod can make testing sample be heated to.Among the utility model embodiment, the operating temperature range of this heating rod is 100-2000 ℃, and the temperature range of this testing sample is 20-1600 ℃.
Step 3, by the physical dimension in measurement testing sample interlude and target analysis zone and under thermal equilibrium state, the surface temperature and the heat power in vacuum environment internal temperature, testing sample target analysis zone calculate hemisphere to total emissivity.
Be specially: adopt a thermopair is installed in the vacuum environment, be used to measure vacuum environment internal temperature T
2Directly measure the surface temperature in target analysis zone by three thermopairs that are installed in the testing sample central area.Perhaps, adopt the radiation temperature measurement instrument in vacuum environment, non-direct contact measurement goes out the surface temperature in target analysis zone.Because the temperature range of testing sample is 20-1600 ℃, therefore, according to the actual requirements, can adopt lower temperature section in this temperature range of thermocouple measurement, for example the temperature below 1200 ℃; Adopt the radiation temperature measurement instrument to measure the higher temperature section of this temperature range, the temperature more than 1200 ℃ for example can guarantee the accuracy of temperature measuring data so effectively.The surface temperature value in the target analysis zone that repeatedly measures is averaged, draw the surface temperature mean value T in target analysis zone
1Adopt miking to go out the physical dimension in testing sample interlude and target analysis zone, comprise testing sample interlude length S, target analysis zone length H and outer diameter D.
Be embedded in the current value of the heating rod in the testing sample and the magnitude of voltage at testing sample interlude two ends by measurement, calculate the heat power in target analysis zone.After electrical bar energising heats up, because contact with the fixing specimen holder of testing sample, the heating rod two ends produce heat conduction, can make the axial thermograde of appearance on the heating rod, and the resistivity of conductor is relevant with temperature, so the distribution of the voltage on the heating rod is also non-homogeneous.And thermograde is less on the heating rod stage casing, the Temperature Distribution basically identical, so distributing, can divide equally voltage herein according to length, obtain the reduced value of measuring voltage under the corresponding length of heating rod central sections, because the target analysis zone of testing sample is coated on the periphery of heating rod central sections, the thermal energy in target analysis zone is directed to the radially heat conduction of heating rod, therefore, the radiation heat transfer amount power in target analysis zone can equivalence be the thermal power value of the heating rod central sections of correspondence, and promptly the voltage reduced value multiply by current value.
When heat that testing sample absorbs and vacuum environment radiations heat energy reached thermal equilibrium, hemisphere to the computing formula of total emissivity was:
Wherein, ε is that the hemisphere on testing sample surface is to total emissivity; Q is the radiation heat transfer amount in target analysis zone under the thermal equilibrium state; F is the area in target analysis zone; T
1Surface temperature mean value for the target analysis zone; T
2Be the vacuum environment internal temperature; σ is Si Difen-Boltzmann constant.Because the target analysis zone of testing sample is the cylindrical sleeve tubular, then F=π DH.
If the electric current and the magnitude of voltage in the heating rod zone that the target analysis of testing sample zone is corresponding are respectively I, V, then during thermal equilibrium, the heat radiation heat that analyzed area and vacuum environment are interior
With F and the Q numerical value that calculates, in the substitution formula (1), then can calculate hemisphere to total emissivity.
With reference to figure 2, embodiment of the invention nonmetallic materials hemisphere comprises vacuum module to the measurement mechanism of total emissivity, and this vacuum module comprises vacuum chamber 1 and vacuum pump 2; The individual layer cylinder of vacuum chamber 1 for adopting stainless steel to make, the upper bottom surface sealing.Have window 4 on the vacuum chamber 1, this window 4 can the adopting quartz glass material, uses when being used to observe.The radiation temperature measurement instrument is equipped with at window 4 places, is used for the surface temperature of non-cpntact measurement testing sample.The inwall of vacuum chamber 1 is equipped with cooling dome 5, has the metal coil pipe of cooled with liquid nitrogen on the cooling dome 5, can open when the sample parameters under measuring lower temperature, guarantees the accuracy that low temperature is measured down.The inwall of cooling dome 5 evenly scribbles the coating of high emissivity, and emissivity of coatings should be greater than 0.9, so that the environment of an approximate black matrix to be provided.Cooling dome 5 inwalls are installed thermopair 10, are used to measure the vacuum environment internal temperature.Vacuum pump 2 can adopt the combination of mechanical pump and diffusion pump, makes pressure in the vacuum chamber 1 less than 1 * 10
-3Pa.
Testing sample 8 is nonmetallic materials, adopts multistage cylindrical sleeve tubular, can reduce the axial-temperature gradient of testing sample, and this testing sample 8 is equally divided into three sections, and three sections samples closely connect.In embodiments of the present invention, testing sample is the assembly of three sections cylindrical sleeve tubular samples.The central area of choosing testing sample 8 interludes is as the target analysis zone, the method in concrete selected center zone is: the centre that earlier one of them thermopair 11 is installed in the testing sample interlude, two other thermopair 12,13 equidistant both sides that are installed in the thermopair that is in middle position, relevant with the testing sample heat conductivility away from the spacing of the thermopair 11 of central position according to the physical length of testing sample.If when the coefficient of heat conductivity of this testing sample was big, this spacing can be provided with smallerly earlier, otherwise this spacing can be provided with more earlier.Observe three temperature that thermopair records,, adjust and be in the position that both sides thermopair 12,13 is placed if when the temperature that records of these three electroheat pairs 11,12,13 exists than big-difference.When the temperature that records up to these three thermopairs 11,12,13 reached unanimity substantially, the placement location of both sides thermopair 12,13 was determined.This moment, the central area of testing sample interlude was confirmed as in the zone of distance between the thermopair 12,13 on both sides.This central area has guaranteed the homogeneity of temperature conduction, it is even to guarantee to be positioned at the temperature that three thermopairs 11,12,13 on the central area record, and can avoid effectively that testing sample surface temperature axial distribution is inhomogeneous, influence such as heating edge edge effect and heat there are errors in computation difference.The surface temperature of these three thermopairs, 11,12,13 direct measurement target analyzed areas.Adopt miking to go out the physical dimension in testing sample interlude and target analysis zone, comprise testing sample interlude length S, target analysis zone length H and outer diameter D.
This nonmetallic materials hemisphere is to the heating module of total emissivity measurement mechanism, the columniform heating rod 3 that adopts refractory metal to make, with the inside of heating rod 3 through testing sample 8, the external diameter of heating rod 3 equates with the internal diameter of testing sample 8, the total length of the length of heating rod 3 and testing sample 8 is close, can guarantee that like this heating rod 3 fully contacts with testing sample 8,, make testing sample 8 be heated to required high temperature by heat conduction.Certain distance need be reserved in the two ends of heating rod 3, be convenient to heating rod 3 is fixed on the support 6 by clip 7, support 6 adopts metal material to make, the upper end is fixing, the lower end can be moved, and prevents that testing sample 8 from heating process thermal expansion taking place and damage, and can install cooling water recirculation system on the support 6, when high-temperature, open this cooling water recirculation system, guarantee support 6 operate as normal at high temperature.
The supply terminals 9 external low-voltage, high-current direct supply and the reometers that are connected in series.Voltage measurement end 14 is connected on the electrical bar 3, is positioned at the two ends of the testing sample interlude at place, target analysis zone.According to the length in target analysis zone, calculate the reduced value of corresponding heating rod 3 both end voltage in target analysis zone, and then be equivalent to the magnitude of voltage in target analysis zone.
Wherein, the operating temperature range of heating rod 3 is 100-2000 ℃, and the temperature range of testing sample 8 is 20-1600 ℃.
In the actual measurement process, read the surface temperature in target analysis zone respectively, the vacuum environment internal temperature, voltage table and electric current tabular value, when treating the not poor mistake 1% of continuous three observable above-mentioned numerical value change amplitudes, at this moment, think that this testing sample 8 and the heat of vacuum environment have reached thermal equilibrium, good each numerical value of record calculates the hemisphere on nonmetal sample surface to total emissivity according to formula (1).
The present invention adopts the measuring method that heating rod is embedded in testing sample inside, has satisfied and under the high temperature nonmetallic materials has been carried out the demand that hemisphere is measured to total emissivity, and had that measurement mechanism is simple in structure, the accurate advantages of higher of measurement data.
Above embodiment only is used to illustrate the present invention; and be not limitation of the present invention; the those of ordinary skill in relevant technologies field; under the situation that does not break away from the spirit and scope of the present invention; can also make various variations and modification; therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.
Claims (10)
1. a nonmetallic materials hemisphere is characterized in that to the measuring method of total emissivity, comprises step:
S1, in vacuum environment, the central area of the interlude of the cylindrical sleeve tubular testing sample of selected multistage combination is as the target analysis zone;
S2 runs through the inside that embeds described testing sample with the heating module after the energising;
S3, the physical dimension by measuring described testing sample interlude and target analysis zone and under thermal equilibrium state, the surface temperature and the heat power in vacuum environment internal temperature, testing sample target analysis zone calculate hemisphere to total emissivity.
2. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity, in described step S1,
When treating that equidistant three measured temperature of thermopair that are placed on the testing sample interlude are consistent, the distance areas between two thermopairs of both sides is as the central area of testing sample interlude.
3. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity the vacuum tightness in the described vacuum environment is less than 1 * 10
-3Pa.
4. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity described heating module is cylindrical, and the internal diameter of described testing sample equates with the external diameter of described heating module.
5. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity, in described step S3,
By being installed in three thermopairs on the testing sample interlude, the surface temperature of direct measurement target analyzed area;
Perhaps pass through the surface temperature of radiation temperature measurement instrument measurement target analyzed area.
6. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity the operating temperature range of described energising back heating module is 100-2000 ℃.
7. nonmetallic materials hemisphere as claimed in claim 1 is characterized in that to the measuring method of total emissivity under thermal equilibrium state, hemisphere to the computing formula of total emissivity is:
Wherein, ε is that the hemisphere on testing sample surface is to total emissivity; Q is the radiation heat transfer amount in target analysis zone under the thermal equilibrium state; F is the area in target analysis zone; T
1Surface temperature mean value for the target analysis zone; T
2Be temperature in the vacuum environment; σ is Si Difen-Boltzmann constant.
8. a nonmetallic materials hemisphere is characterized in that to the measurement mechanism of total emissivity, comprising:
The central area of the interlude of the cylindrical sleeve tubular testing sample of selected multistage combination is as the target analysis zone;
Vacuum module comprises vacuum chamber and vacuum pump, is used for vacuum environment;
Heating module by heating module being run through the inside that embeds described testing sample, heats described testing sample;
Measurement module is measured the physical dimension in testing sample interlude and target analysis zone and under thermal equilibrium state, the surface temperature and the heat power in vacuum environment internal temperature, described testing sample target analysis zone calculate hemisphere to total emissivity.
9. nonmetallic materials hemisphere as claimed in claim 8 is characterized in that to the measurement mechanism of total emissivity described heating module is cylindrical, and the internal diameter of described testing sample equates with the external diameter of described heating module.
10. nonmetallic materials hemisphere as claimed in claim 8 is characterized in that to the measurement mechanism of total emissivity described measurement module comprises milscale, voltage table, reometer, thermopair and radiation temperature measurement instrument, in described step S3,
Described milscale is used to measure the physical dimension in described testing sample interlude and target analysis zone;
By being installed in the thermopair on the described vacuum environment inwall, measure the vacuum environment internal temperature;
The reometer by being installed in described heating module two ends and the voltage table at testing sample interlude two ends are measured the heat power that calculates described testing sample target analysis zone;
By three thermopairs on the target analysis zone that is installed in testing sample, the surface temperature of measurement target analyzed area; Perhaps pass through the surface temperature of radiation temperature measurement instrument measurement target analyzed area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010529042 CN102072916B (en) | 2010-10-28 | 2010-10-28 | Method and device for measuring total hemispherical emissivity of non-metallic material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010529042 CN102072916B (en) | 2010-10-28 | 2010-10-28 | Method and device for measuring total hemispherical emissivity of non-metallic material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102072916A true CN102072916A (en) | 2011-05-25 |
| CN102072916B CN102072916B (en) | 2013-06-05 |
Family
ID=44031538
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010529042 Active CN102072916B (en) | 2010-10-28 | 2010-10-28 | Method and device for measuring total hemispherical emissivity of non-metallic material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102072916B (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565116A (en) * | 2012-01-17 | 2012-07-11 | 河南师范大学 | Device for measuring normal spectral emissivity of non-transparent material |
| CN103196840A (en) * | 2013-03-22 | 2013-07-10 | 清华大学 | System for testing high-temperature spectral emissivity of materials based on effective radiation |
| CN103217269A (en) * | 2013-02-28 | 2013-07-24 | 北京空间飞行器总体设计部 | Determination method for influence on star catalogue device by 10-N thruster plume |
| CN103245692A (en) * | 2013-04-24 | 2013-08-14 | 清华大学 | Steady-state analysis-based method for measuring hemispherical total emissivity and heat conduction coefficient |
| CN103257154A (en) * | 2013-04-24 | 2013-08-21 | 清华大学 | Method for measuring hemispherical total emissivity and heat conductivity of large temperature difference sample |
| CN103675019A (en) * | 2013-12-11 | 2014-03-26 | 中国电子科技集团公司第十三研究所 | Method for measuring material surface emissivity by virtue of thermal infrared imager rapidly |
| CN103969291A (en) * | 2014-04-17 | 2014-08-06 | 广州特种承压设备检测研究院 | Test instrument for hemispherical emissivity adopting homeostasis calorimeter method |
| CN109916952A (en) * | 2019-04-12 | 2019-06-21 | 中国工程物理研究院化工材料研究所 | The surface convection transfer rate measuring system and measurement method of georama configuration |
| CN110988019A (en) * | 2019-12-16 | 2020-04-10 | 中国石油大学(北京) | Testing device and testing method for shale thermal expansion coefficient |
| CN114264694A (en) * | 2022-01-28 | 2022-04-01 | 云南中烟工业有限责任公司 | Testing device and testing method for proportion of infrared heating and thermal radiation of atomizing core |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08107085A (en) * | 1994-10-05 | 1996-04-23 | Oki Electric Ind Co Ltd | Jig and method for measuring infrared emissivity of semiconductor wafer |
-
2010
- 2010-10-28 CN CN 201010529042 patent/CN102072916B/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08107085A (en) * | 1994-10-05 | 1996-04-23 | Oki Electric Ind Co Ltd | Jig and method for measuring infrared emissivity of semiconductor wafer |
Non-Patent Citations (3)
| Title |
|---|
| 《实验室研究与探索》 20020831 曹国霞等 半球全发射率测量系统的研制 第56－57，66页 1-10 第21卷, 第4期 * |
| 《工程热物理学报》 19820531 葛新石等 高温涂层及金属的半球向全热发射率测定装置 第169-175页 1-10 第3卷, 第2期 * |
| 《真空与低温》 20090930 王毅等 用稳态卡计法对热控材料半球发射率的测试研究 第153-155页 1-10 第15卷, 第3期 * |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565116A (en) * | 2012-01-17 | 2012-07-11 | 河南师范大学 | Device for measuring normal spectral emissivity of non-transparent material |
| CN103217269B (en) * | 2013-02-28 | 2016-01-13 | 北京空间飞行器总体设计部 | The defining method that a kind of 10N thruster plume affects star catalogue device temperature |
| CN103217269A (en) * | 2013-02-28 | 2013-07-24 | 北京空间飞行器总体设计部 | Determination method for influence on star catalogue device by 10-N thruster plume |
| CN103196840A (en) * | 2013-03-22 | 2013-07-10 | 清华大学 | System for testing high-temperature spectral emissivity of materials based on effective radiation |
| CN103245692A (en) * | 2013-04-24 | 2013-08-14 | 清华大学 | Steady-state analysis-based method for measuring hemispherical total emissivity and heat conduction coefficient |
| CN103257154A (en) * | 2013-04-24 | 2013-08-21 | 清华大学 | Method for measuring hemispherical total emissivity and heat conductivity of large temperature difference sample |
| CN103675019A (en) * | 2013-12-11 | 2014-03-26 | 中国电子科技集团公司第十三研究所 | Method for measuring material surface emissivity by virtue of thermal infrared imager rapidly |
| CN103969291A (en) * | 2014-04-17 | 2014-08-06 | 广州特种承压设备检测研究院 | Test instrument for hemispherical emissivity adopting homeostasis calorimeter method |
| CN103969291B (en) * | 2014-04-17 | 2016-09-07 | 广州特种承压设备检测研究院 | A kind of stable state calorimeter method hemispherical emissivity tester |
| CN109916952A (en) * | 2019-04-12 | 2019-06-21 | 中国工程物理研究院化工材料研究所 | The surface convection transfer rate measuring system and measurement method of georama configuration |
| CN109916952B (en) * | 2019-04-12 | 2024-01-19 | 中国工程物理研究院化工材料研究所 | System and method for measuring surface convection heat transfer coefficient of hollow sphere configuration |
| CN110988019A (en) * | 2019-12-16 | 2020-04-10 | 中国石油大学(北京) | Testing device and testing method for shale thermal expansion coefficient |
| CN114264694A (en) * | 2022-01-28 | 2022-04-01 | 云南中烟工业有限责任公司 | Testing device and testing method for proportion of infrared heating and thermal radiation of atomizing core |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102072916B (en) | 2013-06-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102072916B (en) | Method and device for measuring total hemispherical emissivity of non-metallic material | |
| CN100533133C (en) | Heat-pipe flat-plate type measuring instrument for coefficient of thermal conductivity | |
| CN100437042C (en) | Flow sensor | |
| CN101949873A (en) | Device for measuring solid material heat conductivity | |
| CN103983660B (en) | A kind of indoor rock sample test device of thermal conductivity coefficient | |
| CN101915778B (en) | Apparatus and method for measuring thermal coefficients by adopting guarded thermal plate method | |
| CN101113963A (en) | Method and device for measuring liquid thermal conductivity factor | |
| CN103196949A (en) | Heat resistance heat flow meter calibration method and implementation device thereof | |
| CN200950129Y (en) | Hot pipe flat type thermal conductivity coefficient tester | |
| CN102539472A (en) | Method for measuring heat conductivity of poor conductor by using steady-state comparison | |
| CN103713013B (en) | Test tubulose material shaft is to the device of coefficient of heat conductivity | |
| CN109142433A (en) | A method of low-dimensional micro-nano material thermal conductivity is measured based on alternating current method | |
| CN205607902U (en) | Metal heat preservation plate thermal insulation performance detection device | |
| CN101871900A (en) | Sensor for measuring heat conduction coefficient | |
| CN203849193U (en) | Indoor rock sample heat conduction coefficient testing device | |
| CN201041558Y (en) | Device for detecting liquid heat conduction coefficient and thermal diffusion rate based on harmonic wave detection technology | |
| CN206756728U (en) | A kind of good conductor thermal conductivity factor experiment instrument | |
| CN104062318A (en) | Sample seat and measuring method for measuring thermoelectric properties of sample | |
| CN103257154B (en) | Method for measuring hemispherical total emissivity and heat conductivity of large temperature difference sample | |
| CN102590274B (en) | System and method used for testing heat conductivity of thin film thermoelectric material | |
| Luo et al. | An experimental investigation on thermal contact resistance across metal contact interfaces | |
| Kanagaraj et al. | Simultaneous measurements of thermal expansion and thermal conductivity of FRPs by employing a hybrid measuring head on a GM refrigerator | |
| CN112730507B (en) | Liquid specific heat capacity measurement system and measurement method | |
| CN106768159B (en) | Nuclear power station reactor core liquid level detector | |
| Zaporozhets et al. | Information Measurement System for Thermal Conductivity Studying |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |