CN104808146A - High-accuracy motor testing system - Google Patents
High-accuracy motor testing system Download PDFInfo
- Publication number
- CN104808146A CN104808146A CN201510225199.2A CN201510225199A CN104808146A CN 104808146 A CN104808146 A CN 104808146A CN 201510225199 A CN201510225199 A CN 201510225199A CN 104808146 A CN104808146 A CN 104808146A
- Authority
- CN
- China
- Prior art keywords
- triode
- pin
- field effect
- effect transistor
- signal processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Control Of Direct Current Motors (AREA)
Abstract
The invention discloses a high-accuracy motor testing system which mainly comprises a tested motor (4). The high-accuracy motor testing system is characterized by comprising a single chip microcomputer (1), a power source module (2), a motor rotating speed control module (3), a rotating speed signal processing module (5), a displayer (7) and a speed sensor (6), the power source module (2), the motor rotating speed control module (3), the rotating speed signal processing module (5) and the displayer (7) are connected with the single chip microcomputer (1), one end of the speed sensor (6) is connected with the rotating speed signal processing module (5) while the other end of the same is connected with the tested motor (4), the motor rotating speed control (3) is connected with the power source module (2) and the tested motor (4), and the rotating speed signal processing module (5) is composed of a signal screening circuit (51), a signal processing circuit (52) connected with the signal screening circuit (51), and a voltage transformation output circuit (53) connected with the signal processing circuit (52). By the high-accuracy motor testing system, rotating speed of the motor can be tested accurately, and testing personnel can judge performance of the motor better.
Description
Technical field
The present invention relates to a kind of Motor Measuring System, specifically refer to a kind of high-precision motor test macro.
Background technology
Along with national economy and scientific and technical development, the effect that motor plays in all trades and professions is more and more important.Meanwhile, along with the development of every profession and trade, more and more higher requirement is proposed to motor product, so motor product needs to verify whether its characteristic reaches application requirement by some pilot projects.Therefore, Motor Measuring Technology has considerable meaning for the performance verification of motor.
But traditional Motor Measuring System is when testing of electric motors rotating speed because the running time is long, and the instrument that need observe is many, manually reads test data and carry out data analysis, calculating, have impact on quality and the precision of motor test to a certain extent.Therefore, provide a kind of simple and measuring accuracy is high Motor Measuring System is then the current task of top priority.
Summary of the invention
The object of the invention is to overcome traditional Motor Measuring System complex structure and the low defect of measuring accuracy, a kind of high-precision motor test macro is provided.
Object of the present invention is achieved through the following technical solutions: a kind of high-precision motor test macro, mainly comprise by measured motor, single-chip microcomputer, the power module be connected with single-chip microcomputer, motor speed control module, tach signal processing module, display, and the speed pickup that one end is connected with tach signal processing module, the other end is connected with by measured motor.Described motor speed control module is also connected with power module and by measured motor respectively; Described tach signal processing module by signal screening circuit, the signal processing circuit be connected with signal screening circuit, and the transformation output circuit be connected with signal processing circuit forms.
Further, described signal screening circuit is by companion chip U, triode VT1, triode VT2, Sheffer stroke gate A1, Sheffer stroke gate A2, negative pole is connected with the VIN pin of companion chip U, the polar capacitor C1 that positive pole is then connected with the emitter of triode VT1 after resistance R1, positive pole is connected with the LX pin of companion chip U, the polar capacitor C2 that negative pole is then connected with the collector of triode VT2, positive terminal is connected with the PGND pin of companion chip U, the polarity-inverting amplifier D1 that end of oppisite phase is then connected with the negative pole of Sheffer stroke gate A2, negative pole is connected with the negative pole of Sheffer stroke gate A1, the polar capacitor C3 that positive pole is then connected with the emitter of triode VT2 after resistance R2, and minus earth, the polar capacitor C4 that positive pole is then connected with the positive pole of Sheffer stroke gate A2 after resistance R3 forms, the LX pin of described companion chip U is connected with the collector of triode VT1, its OUT pin is then connected with the negative pole of Sheffer stroke gate A2, GND pin ground connection, the output terminal of described Sheffer stroke gate A2 is connected with signal processing circuit, its positive pole is then connected with the output terminal of Sheffer stroke gate A1 and signal processing circuit respectively, and the positive pole of described Sheffer stroke gate A1 is connected with the collector of triode VT2, its negative pole is then connected with signal processing circuit, the positive pole of described polar capacitor C4 is also connected with signal processing circuit.
Described signal processing circuit is by process chip U1, field effect transistor Q1, field effect transistor Q2, triode VT3, P pole is connected with the positive pole of Sheffer stroke gate A2, the diode D2 that N pole is then connected with the BOOT pin of process chip U1, positive pole is connected with the GND pin of process chip U1, the polar capacitor C5 that negative pole is then connected with the FB pin of process chip U1, positive pole is connected with the drain electrode of field effect transistor Q1, the polar capacitor C7 of minus earth, one end is connected with the PHASE pin of process chip U1, the inductance L 1 that the other end is then connected with the emitter of triode VT3, one end is connected with the OCSET pin of process chip U1, the resistance R4 that the other end is then connected with the source electrode of field effect transistor Q1, one end is connected with the LGATE pin of process chip U1, the resistance R5 that the other end is then connected with the base stage of triode VT3, and negative pole is connected with the LGAET pin of process chip U1, the polar capacitor C6 that positive pole is then connected with the collector of triode VT3 after resistance R6 forms, the VCC pin of described process chip U1 is connected with the positive pole of polar capacitor C4, its FB pin is then connected with the negative pole of Sheffer stroke gate A1, GND pin ground connection, LGATE pin are connected with the grid of field effect transistor Q2, UGATE pin is then connected with the grid of field effect transistor Q1, the drain electrode of described field effect transistor Q1 is respectively with the output terminal of Sheffer stroke gate A2 and transformation output circuit is connected, its source electrode is then connected with the drain electrode of field effect transistor Q2, the source ground of described field effect transistor Q2, the emitter of triode VT3 is then connected with transformation output circuit.
Described transformation output circuit is by transformer T, triode VT4, field effect transistor Q3, N pole is connected with transformer T former limit non-same polarity, the diode D3 of P pole ground connection, the diode D4 that P pole is connected with transformer T secondary non-same polarity, N pole is then connected with the grid of field effect transistor Q3 after resistance R8, the resistance R9 that one end is connected with transformer T secondary Same Name of Ends, the other end is then connected with the grid of field effect transistor Q3, and the resistance R7 that one end is connected with transformer T secondary Same Name of Ends, the other end is then connected with the base stage of triode VT4 forms; Described transformer T former limit Same Name of Ends is connected with the drain electrode of field effect transistor Q1, its non-same polarity is then connected with the emitter of triode VT3, and the grid of described field effect transistor Q3 is connected with the collector of triode VT4, its source electrode is then connected with the emitter of triode VT4 and transformer T secondary Same Name of Ends respectively.
Described companion chip U is MAX1921 integrated circuit, and process chip U1 is then APW7120 integrated circuit.
The present invention comparatively prior art compares, and has the following advantages and beneficial effect:
(1) structure of the present invention is simple, and easy to operate, system cost is cheap.
(2) the present invention can test motor speed accurately, and tester can better judge motor performance.
(3) the present invention adopts APW7120 integrated chip as process chip, more energy-conservation.
Accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present invention;
Fig. 2 is tach signal processing module electrical block diagram of the present invention.
Reference numeral name in above accompanying drawing is called:
1-single-chip microcomputer, 2-power module, 3-motor speed control module, 4-by measured motor, 5-tach signal processing module, 6-speed pickup, 7-display, 51-signal screening circuit, 52-signal processing circuit, 53-transformation output circuit.
Embodiment
Below in conjunction with embodiment, the present invention is described in further detail, but embodiments of the present invention are not limited to this.
Embodiment
As shown in Figure 1, the present invention is by by measured motor 4, in order to realize object of the present invention, the present invention is also provided with single-chip microcomputer 1, the power module 2 be connected with single-chip microcomputer 1, motor speed control module 3, tach signal processing module 5, display 7, and the speed pickup 6 that one end is connected with tach signal processing module 5, the other end is connected with by measured motor 4.Described motor speed control module 3 is also connected with power module 2 and by measured motor 4 respectively.
Wherein, single-chip microcomputer 1 is as control center of the present invention, and power module 2 is for providing power supply to Motor Measuring System.Motor speed control module 3 is for controlling by the rotating speed of measured motor 4, namely after tester inputs motor speed value in single-chip microcomputer 1, by single-chip microcomputer 1 send signal to motor speed control module 3 by motor speed control module 3 the rotating speed set by the adjustment of rotational speed of measured motor 4 to tester.Speed pickup 6 is for gathering by the real-time rotate speed signal of measured motor 4, and tach signal processing module 5 then for processing tach signal, and sends to single-chip microcomputer 1.Display 7 is for showing intuitively by the tachometer value of measured motor 4.
Better effect is reached in order to enable the present invention, the MEMS type magnetic resistance speed sensor of the BNP-16 series that this speed pickup 6 adopts great Gong An road, Dalian instrument and meter for automation company to produce, this speed probe has extremely low velocity deviation, and the impact do not shaken.Motor speed control module 3, power module 2, display 7, single-chip microcomputer 1 all adopt existing technology to realize.Tach signal processing module 5 is then inventive point place of the present invention.
As shown in Figure 2, this tach signal processing module 5 by the signal screening circuit 51 screened tach signal, the signal processing circuit 52 be connected with signal screening circuit 51, and the transformation output circuit 53 be connected with signal processing circuit 52 forms.This signal processing circuit 52 is for processing tach signal, and the tach signal after process is more stable.Transformation output circuit 53 then can carry out transformation process to tach signal, makes the tach signal received by single-chip microcomputer 1 more clear.
Wherein, signal screening circuit 51 is by companion chip U, triode VT1, triode VT2, Sheffer stroke gate A1, Sheffer stroke gate A2, negative pole is connected with the VIN pin of companion chip U, the polar capacitor C1 that positive pole is then connected with the emitter of triode VT1 after resistance R1, positive pole is connected with the LX pin of companion chip U, the polar capacitor C2 that negative pole is then connected with the collector of triode VT2, positive terminal is connected with the PGND pin of companion chip U, the polarity-inverting amplifier D1 that end of oppisite phase is then connected with the negative pole of Sheffer stroke gate A2, negative pole is connected with the negative pole of Sheffer stroke gate A1, the polar capacitor C3 that positive pole is then connected with the emitter of triode VT2 after resistance R2, and minus earth, the polar capacitor C4 that positive pole is then connected with the positive pole of Sheffer stroke gate A2 after resistance R3 forms.The LX pin of described companion chip U is connected with the collector of triode VT1, its OUT pin is then connected with the negative pole of Sheffer stroke gate A2, GND pin ground connection, the output terminal of described Sheffer stroke gate A2 is connected with signal processing circuit 52, its positive pole is then connected with the output terminal of Sheffer stroke gate A1 and signal processing circuit 52 respectively, and the positive pole of described Sheffer stroke gate A1 is connected with the collector of triode VT2, its negative pole is then connected with signal processing circuit 52.The positive pole of described polar capacitor C4 is also connected with signal processing circuit 52.In order to better implement the present invention, this companion chip U preferentially adopts MAX1921 integrated circuit to realize.
Described signal processing circuit 52 is by process chip U1, field effect transistor Q1, field effect transistor Q2, triode VT3, P pole is connected with the positive pole of Sheffer stroke gate A2, the diode D2 that N pole is then connected with the BOOT pin of process chip U1, positive pole is connected with the GND pin of process chip U1, the polar capacitor C5 that negative pole is then connected with the FB pin of process chip U1, positive pole is connected with the drain electrode of field effect transistor Q1, the polar capacitor C7 of minus earth, one end is connected with the PHASE pin of process chip U1, the inductance L 1 that the other end is then connected with the emitter of triode VT3, one end is connected with the OCSET pin of process chip U1, the resistance R4 that the other end is then connected with the source electrode of field effect transistor Q1, one end is connected with the LGATE pin of process chip U1, the resistance R5 that the other end is then connected with the base stage of triode VT3, and negative pole is connected with the LGAET pin of process chip U1, the polar capacitor C6 that positive pole is then connected with the collector of triode VT3 after resistance R6 forms.The VCC pin of described process chip U1 is connected with the positive pole of polar capacitor C4, its FB pin is then connected with the negative pole of Sheffer stroke gate A1, GND pin ground connection, LGATE pin are connected with the grid of field effect transistor Q2, UGATE pin is then connected with the grid of field effect transistor Q1; The drain electrode of described field effect transistor Q1 is respectively with the output terminal of Sheffer stroke gate A2 and transformation output circuit 53 is connected, its source electrode is then connected with the drain electrode of field effect transistor Q2.The source ground of described field effect transistor Q2; The emitter of triode VT3 is then connected with transformation output circuit 53.In order to better implement the present invention, described process chip U1 is preferably APW7120 integrated circuit to realize.
Described transformation output circuit 53 is by transformer T, triode VT4, field effect transistor Q3, N pole is connected with transformer T former limit non-same polarity, the diode D3 of P pole ground connection, the diode D4 that P pole is connected with transformer T secondary non-same polarity, N pole is then connected with the grid of field effect transistor Q3 after resistance R8, the resistance R9 that one end is connected with transformer T secondary Same Name of Ends, the other end is then connected with the grid of field effect transistor Q3, and the resistance R7 that one end is connected with transformer T secondary Same Name of Ends, the other end is then connected with the base stage of triode VT4 forms.Described transformer T former limit Same Name of Ends is connected with the drain electrode of field effect transistor Q1, its non-same polarity is then connected with the emitter of triode VT3, and the grid of described field effect transistor Q3 is connected with the collector of triode VT4, its source electrode is then connected with the emitter of triode VT4 and transformer T secondary Same Name of Ends respectively.
As mentioned above, just well the present invention can be realized.
Claims (6)
1. a high-precision motor test macro, mainly comprise by measured motor (4), it is characterized in that: also include single-chip microcomputer (1), the power module (2) be connected with single-chip microcomputer (1), motor speed control module (3), tach signal processing module (5), display (7), and the speed pickup (6) that one end is connected with tach signal processing module (5), the other end is connected with by measured motor (4); Described motor speed control module (3) is also connected with power module (2) and by measured motor (4) respectively; Described tach signal processing module (5) by signal screening circuit (51), the signal processing circuit (52) be connected with signal screening circuit (51), and the transformation output circuit (53) be connected with signal processing circuit (52) forms.
2. a kind of high-precision motor test macro according to claim 1, it is characterized in that: described signal screening circuit (51) is by companion chip U, triode VT1, triode VT2, Sheffer stroke gate A1, Sheffer stroke gate A2, negative pole is connected with the VIN pin of companion chip U, the polar capacitor C1 that positive pole is then connected with the emitter of triode VT1 after resistance R1, positive pole is connected with the LX pin of companion chip U, the polar capacitor C2 that negative pole is then connected with the collector of triode VT2, positive terminal is connected with the PGND pin of companion chip U, the polarity-inverting amplifier D1 that end of oppisite phase is then connected with the negative pole of Sheffer stroke gate A2, negative pole is connected with the negative pole of Sheffer stroke gate A1, the polar capacitor C3 that positive pole is then connected with the emitter of triode VT2 after resistance R2, and minus earth, the polar capacitor C4 that positive pole is then connected with the positive pole of Sheffer stroke gate A2 after resistance R3 forms, the LX pin of described companion chip U is connected with the collector of triode VT1, its OUT pin is then connected with the negative pole of Sheffer stroke gate A2, GND pin ground connection, the output terminal of described Sheffer stroke gate A2 is connected with signal processing circuit (52), its positive pole is then connected with the output terminal of Sheffer stroke gate A1 and signal processing circuit (52) respectively, and the positive pole of described Sheffer stroke gate A1 is connected with the collector of triode VT2, its negative pole is then connected with signal processing circuit (52), the positive pole of described polar capacitor C4 is also connected with signal processing circuit (52).
3. a kind of high-precision motor test macro according to claim 2, it is characterized in that: described signal processing circuit (52) is by process chip U1, field effect transistor Q1, field effect transistor Q2, triode VT3, P pole is connected with the positive pole of Sheffer stroke gate A2, the diode D2 that N pole is then connected with the BOOT pin of process chip U1, positive pole is connected with the GND pin of process chip U1, the polar capacitor C5 that negative pole is then connected with the FB pin of process chip U1, positive pole is connected with the drain electrode of field effect transistor Q1, the polar capacitor C7 of minus earth, one end is connected with the PHASE pin of process chip U1, the inductance L 1 that the other end is then connected with the emitter of triode VT3, one end is connected with the OCSET pin of process chip U1, the resistance R4 that the other end is then connected with the source electrode of field effect transistor Q1, one end is connected with the LGATE pin of process chip U1, the resistance R5 that the other end is then connected with the base stage of triode VT3, and negative pole is connected with the LGAET pin of process chip U1, the polar capacitor C6 that positive pole is then connected with the collector of triode VT3 after resistance R6 forms, the VCC pin of described process chip U1 is connected with the positive pole of polar capacitor C4, its FB pin is then connected with the negative pole of Sheffer stroke gate A1, GND pin ground connection, LGATE pin are connected with the grid of field effect transistor Q2, UGATE pin is then connected with the grid of field effect transistor Q1, the drain electrode of described field effect transistor Q1 is respectively with the output terminal of Sheffer stroke gate A2 and transformation output circuit (53) is connected, its source electrode is then connected with the drain electrode of field effect transistor Q2, the source ground of described field effect transistor Q2, the emitter of triode VT3 is then connected with transformation output circuit (53).
4. a kind of high-precision motor test macro according to claim 3, it is characterized in that: described transformation output circuit (53) is by transformer T, triode VT4, field effect transistor Q3, N pole is connected with transformer T former limit non-same polarity, the diode D3 of P pole ground connection, P pole is connected with transformer T secondary non-same polarity, the diode D4 that N pole is then connected with the grid of field effect transistor Q3 after resistance R8, one end is connected with transformer T secondary Same Name of Ends, the resistance R9 that the other end is then connected with the grid of field effect transistor Q3, and one end is connected with transformer T secondary Same Name of Ends, the resistance R7 that the other end is then connected with the base stage of triode VT4 forms, described transformer T former limit Same Name of Ends is connected with the drain electrode of field effect transistor Q1, its non-same polarity is then connected with the emitter of triode VT3, and the grid of described field effect transistor Q3 is connected with the collector of triode VT4, its source electrode is then connected with the emitter of triode VT4 and transformer T secondary Same Name of Ends respectively.
5. a kind of high-precision motor test macro according to claim 4, is characterized in that: described companion chip U is MAX1921 integrated circuit.
6. a kind of high-precision motor test macro according to claim 4, is characterized in that: described process chip U1 is APW7120 integrated circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510225199.2A CN104808146A (en) | 2015-05-06 | 2015-05-06 | High-accuracy motor testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510225199.2A CN104808146A (en) | 2015-05-06 | 2015-05-06 | High-accuracy motor testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104808146A true CN104808146A (en) | 2015-07-29 |
Family
ID=53693139
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510225199.2A Withdrawn CN104808146A (en) | 2015-05-06 | 2015-05-06 | High-accuracy motor testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104808146A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105044600A (en) * | 2015-08-11 | 2015-11-11 | 成都思邦力克科技有限公司 | Motor tester |
| CN105068001A (en) * | 2015-07-31 | 2015-11-18 | 佛山市中格威电子有限公司 | Motor test tooling |
| CN105242209A (en) * | 2015-11-21 | 2016-01-13 | 成都科瑞信科技有限责任公司 | Voltage-stabilizing tested rotation speed automatic adjustment-type motor testing system |
| CN105277884A (en) * | 2015-11-21 | 2016-01-27 | 成都科瑞信科技有限责任公司 | Testing rotating speed automatic adjustment type motor test system on the basis of band-pass filtering |
| CN105445661A (en) * | 2015-11-21 | 2016-03-30 | 成都科瑞信科技有限责任公司 | Motor testing system of rotating speed automatic adjustment type based on bandpass filtering and voltage detection |
| CN105467315A (en) * | 2015-11-21 | 2016-04-06 | 成都科瑞信科技有限责任公司 | Test rotating speed automation adjusting type motor test system with high-efficiency signal conversion |
| CN105467316A (en) * | 2015-11-21 | 2016-04-06 | 成都科瑞信科技有限责任公司 | Voltage-stabilization-type test rotating speed automation adjusting type motor test system based on band-pass filtering |
| CN105487010A (en) * | 2015-11-21 | 2016-04-13 | 成都科瑞信科技有限责任公司 | Bandpass filtering based automatic adjusting type motor test system capable of testing rotating speed efficiently |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101275988A (en) * | 2007-12-27 | 2008-10-01 | 奇瑞汽车股份有限公司 | Permanent magnetism synchronous electric machine test system and method |
| CN201522549U (en) * | 2009-10-21 | 2010-07-07 | 南京威宝电气自动化有限公司 | Portable device for online diagnosing motor fault |
| CN101860127A (en) * | 2010-05-07 | 2010-10-13 | 中国石化集团南京化学工业有限公司 | Running protecting and monitoring diagnosis system of motor |
| CN103048963A (en) * | 2012-12-14 | 2013-04-17 | 新疆希望电子有限公司 | Motor intelligent real-time monitoring and control system |
| CN204166106U (en) * | 2014-11-19 | 2015-02-18 | 芜湖杰诺瑞汽车电器系统有限公司 | Threephase asynchronous machine malfunction monitoring and warning system |
-
2015
- 2015-05-06 CN CN201510225199.2A patent/CN104808146A/en not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101275988A (en) * | 2007-12-27 | 2008-10-01 | 奇瑞汽车股份有限公司 | Permanent magnetism synchronous electric machine test system and method |
| CN201522549U (en) * | 2009-10-21 | 2010-07-07 | 南京威宝电气自动化有限公司 | Portable device for online diagnosing motor fault |
| CN101860127A (en) * | 2010-05-07 | 2010-10-13 | 中国石化集团南京化学工业有限公司 | Running protecting and monitoring diagnosis system of motor |
| CN103048963A (en) * | 2012-12-14 | 2013-04-17 | 新疆希望电子有限公司 | Motor intelligent real-time monitoring and control system |
| CN204166106U (en) * | 2014-11-19 | 2015-02-18 | 芜湖杰诺瑞汽车电器系统有限公司 | Threephase asynchronous machine malfunction monitoring and warning system |
Non-Patent Citations (2)
| Title |
|---|
| ANPEC ELECTRONICS CORP: "《APW7120》", 《WWW.ANPEC.COM.TW》 * |
| 元器件交易网: "《MAX1921EUT18+中文资料》", 《百度》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105068001A (en) * | 2015-07-31 | 2015-11-18 | 佛山市中格威电子有限公司 | Motor test tooling |
| CN105044600A (en) * | 2015-08-11 | 2015-11-11 | 成都思邦力克科技有限公司 | Motor tester |
| CN105242209A (en) * | 2015-11-21 | 2016-01-13 | 成都科瑞信科技有限责任公司 | Voltage-stabilizing tested rotation speed automatic adjustment-type motor testing system |
| CN105277884A (en) * | 2015-11-21 | 2016-01-27 | 成都科瑞信科技有限责任公司 | Testing rotating speed automatic adjustment type motor test system on the basis of band-pass filtering |
| CN105445661A (en) * | 2015-11-21 | 2016-03-30 | 成都科瑞信科技有限责任公司 | Motor testing system of rotating speed automatic adjustment type based on bandpass filtering and voltage detection |
| CN105467315A (en) * | 2015-11-21 | 2016-04-06 | 成都科瑞信科技有限责任公司 | Test rotating speed automation adjusting type motor test system with high-efficiency signal conversion |
| CN105467316A (en) * | 2015-11-21 | 2016-04-06 | 成都科瑞信科技有限责任公司 | Voltage-stabilization-type test rotating speed automation adjusting type motor test system based on band-pass filtering |
| CN105487010A (en) * | 2015-11-21 | 2016-04-13 | 成都科瑞信科技有限责任公司 | Bandpass filtering based automatic adjusting type motor test system capable of testing rotating speed efficiently |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104808146A (en) | High-accuracy motor testing system | |
| CN104834332A (en) | Motor temperature control test system based on band-pass filtering | |
| CN104931878A (en) | Motor temperature control test system based on peak clipping pulse wave modulation control | |
| CN104568261A (en) | Digital strain torque sensor on basis of multifunctional signal conditioning system | |
| CN104808009A (en) | Motor speed measuring system based on phase processing | |
| CN104820185A (en) | Motor speed test system based on signal pre-amplification | |
| CN104808010A (en) | Motor rotation speed testing system based on triode double triggering circuit | |
| CN101303384B (en) | Test device and test method of rapid response electronic device response speed | |
| CN104820105A (en) | High-accuracy motor test system based on triode trigger circuit | |
| CN104808143A (en) | Field-effect transistor driving circuit based motor temperature control test system | |
| CN104833514A (en) | Engine test and control system based on adjustable filtering frequency | |
| CN104808144A (en) | Motor test system based on compound type oscillating circuit | |
| CN104950127A (en) | Motor speed testing system based on logical amplifying circuit | |
| CN104808145A (en) | Motor temperature control testing system based on self-gain control | |
| CN104820107A (en) | Motor speed test system based on phase-locked loop circuit | |
| CN104808011A (en) | Motor revolving speed testing system based on self-gain control | |
| CN104820106A (en) | Motor speed test system based on reverse current source | |
| CN104833817A (en) | Motor speed measuring system based on linear drive | |
| CN104897920A (en) | Motor rotating speed testing system based on double field-effect transistor oscillating circuit | |
| CN204495909U (en) | Wide-range high-accuracy electrical resistance collection circuit | |
| CN208569014U (en) | A kind of Partial discharge signal marking apparatus of pressure-adjustable | |
| CN104820186A (en) | Linear drive motor speed test system based on automatic level control | |
| CN105242209A (en) | Voltage-stabilizing tested rotation speed automatic adjustment-type motor testing system | |
| CN104990710A (en) | Engine measurement and control system based on constant current source driving | |
| CN106153228A (en) | A kind of new forms of energy electric machine combination property test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| EXSB | Decision made by sipo to initiate substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20150729 |
|
| WW01 | Invention patent application withdrawn after publication |