CN104793076B - Intelligent Auto-Test System and method of testing - Google Patents

Intelligent Auto-Test System and method of testing Download PDF

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CN104793076B
CN104793076B CN201510164922.0A CN201510164922A CN104793076B CN 104793076 B CN104793076 B CN 104793076B CN 201510164922 A CN201510164922 A CN 201510164922A CN 104793076 B CN104793076 B CN 104793076B
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test
data
testing
tester
platform
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CN104793076A (en
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陈中
李俊庆
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PONOVO POWER Co.,Ltd.
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Nanjing Neng Yun Power Tech Corp Inc
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Abstract

The invention discloses a kind of intelligent Auto-Test System and method of testing, wherein intelligent Auto-Test System includes:The tester being connected by testing connecting line with tested device, and the testing workstation being connected by communication data line with tester and tested device, the testing workstation includes standard secondary developing platform layer, automatic test layer and tester hardware interface layer, wherein, the standard secondary developing platform layer includes tested device testing scheme, device to test profile data-interface storehouse and device to test solution development platform;The automatic test layer includes the test report that automatically testing platform, communication protocol platform and automatically testing platform are formed;The tester hardware interface layer includes tester control interface module.The present invention is a kind of self-verifying method of the regulation and standardization for tested device and high efficiency, and having reduces personnel requirement, simplifies the advantages of course of work and authority data form.

Description

Intelligent Auto-Test System and method of testing
Technical field
The invention belongs to intelligent Power Station apparatus field, especially a kind of intelligent Auto-Test System and method of testing.
Background technology
At present, China's power network development is rapid, and the development of especially intelligent substation is rapider, still, either to passing Blanket insurance shield or the debugging to digitalizer but also rest on the pattern of traditional debugging.Tester is tested using relay system Instrument, according to the failure arrange parameter of simulation, the action situation of monitoring device, verify whether apparatus function and definite value setting are correct, Record test result;Or whether output voltage electric current, checking device sampling are qualified.After the completion of test, detection report is filled in manually Accuse.Therefore, for the method for protection device debugging yet without standardization is formed, test process can not realize automatic test, it is impossible to Automatically form the test report of reference format.
The above situation causes the debugging cycle to traditional transformer station, intelligent substation device long.Existing digitlization Device debugging software, it is impossible to communicated with device, realize that the reading and modification, the reading of pressing plate and modification, device of definite value are surveyed The functions such as the reading of value, the parsing of device event report, straighforward operation.Each not phase of each tester producer testing and control software Together, control interface disunity, it is difficult compatible each producer's tester in system.
The content of the invention
Goal of the invention:A kind of intelligent Auto-Test System and method of testing are provided, it is undue existing for prior art to solve Rely on that profile, test job efficiency is low and the skimble-scamble problem of test data form.
Technical scheme:A kind of intelligent Auto-Test System, including:
The tester being connected by testing connecting line with tested device, and by communication data line and tester and The testing workstation of tested device connection,
The testing workstation includes standard secondary developing platform layer, automatic test layer and tester hardware interface layer, Wherein, the standard secondary developing platform layer include tested device testing scheme, device to test profile data-interface storehouse and Device to test solution development platform;It is flat that the automatic test layer includes automatically testing platform, communication protocol platform and automatic test The test report that platform is formed;The tester hardware interface layer includes tester control interface module.
Preferably, the communication protocol platform includes:
Communication module is developed, calls communication protocol template to realize and is communicated with tested device, including realize reading device equipment Data model, reading device data, modification device data and transmission control command;
Wherein, the communication protocol template is used for the details for describing device communication protocol, including communication packet is described and led to Interrogate process description;The communication packet description defines parsing and the manufacture rule of the various messages of stipulations, and and number of devices The method that data interaction is carried out according to model;The communication process description defines the various communication commands of communication protocol, and respectively The execution flow of communication command.
Preferably, described device test function standard data interface storehouse uses the information description side of the structuring of object-oriented Formula describes the detailed data information of the various test functions of tested device;
Wherein, tested device test function is from device to test principle, the device basic test function of induction and conclusion;
The various test function detailed data informations of tested device include the title of test function, ID, and test work( Fault parameter data and result parameter the data description of energy;Wherein, the title of the detailed description information of supplemental characteristic including parameter, ID, data type, unit and default value.
Preferably, the tested device testing scheme preserves note using the information describing mode of the structuring of object-oriented Record tested device device data model, the test item of tested device define, the testing process of test item, reporting format definition with And data reporting fills in definition;
The device data model of the tested device is used for the details for describing the various data sets of device;
The test event definition of the tested device includes test function project, desk checking project and communication command item Mesh;
The test function project, for the test event that is exported of control tester, tester is to tested device Apply test volume, test the response of tested device or the input function of tested device;
The desk checking project, for the hardware detection part to tested device, this part needs to receive manually to tested The operation information that device is checked, and receive testing result;Desk checking project also includes prompting operation information;
The function of communication protocol platform is called in the communication command project, description, including reads data, modification data and hair Send control command.
Preferably, the tested device testing scheme development platform, for being surveyed according to specific tested device editing device Examination scheme.
Preferably, the tester interface routine is used to control tester output test volume, record tested device to survey Test result;Tester control interface module opens external call interface, and external program passes through interface and tester interface program Interaction.
A kind of intelligent automatic test approach, realized, specifically comprised the following steps based on above-mentioned intelligent Auto-Test System:
S1. the test of tester control interface program finishing device test function is called;
S2. communication protocol platform is called to complete reading, the write-in of data and the execution of control command of data;
S3. desk checking project is performed, prompting user is operated or logging data;
S4. judge whether test result is qualified automatically according to the result Rule of judgment in scheme during experiment;
S5. parameter and result data are filled up in report automatically, form the test report of reference format.
Further, a kind of intelligent automatic test approach, comprises the following steps:
Step 1:Subtemplate editor,
Step 2:Testing scheme editor, detailed testing scheme is determined according to device data model and subtemplate storehouse;
Step 3:Automatic test, loading testing scheme are tested automatically, and the test report for eventually forming reference format is protected Deposit and export.
Preferably, the step 1 is further:
Step 11, using testing scheme development module it is newly-built test subtemplate be subtemplate establish data-interface define;
Step 12, the test event according to the functional test of tested device requirement editor's test subtemplate;
Step 13, test subtemplate is preserved, form the test subtemplate storehouse for covering the various test functions of tested device.
Preferably, the step 2 and step 3 are respectively:
Step 21, communicated by stipulations platform and tested device, enumerate the device data model of device, save as number of devices According to model file;
Step 22, using testing scheme development module, establish testing scheme, import device data model file;
Step 23, intellectual analysis device data model, either automatically or manually selected according to analysis result and functional test requirement Select test subtemplate;
Step 24, the device data model according to tested device, instantiation test subtemplate, automatically generate tested device Testing scheme;
While step 25, test subtemplate instantiation, splice the report template of each instantiation subtemplate, form tested dress The test report template put;
Step 26, each test subtemplate instantiation are completed, and preserve the testing scheme of tested device;
Step 31, test control center module device for opening testing scheme;
Step 32, start to test, test control center module is sequentially completed each according to the testing process of device to test scheme The test of test event, test result, automatic progress result judgement, Auto-writing report are recorded automatically;Device to test scheme bag Include the test of apparatus function test event, communication command project testing, desk checking project testing;
Step 33, test are completed, and form the test report of reference format.
Beneficial effect:
1. being converted into testing tool instant invention overcomes the manually test of conventional apparatus to test automatically, greatly improve Operating efficiency.
2. the present invention has formed standardization, tester control program interface specification, tested device test function are established Data interface standard specification, tested device testing scheme specification.
3. the present invention can automatically form the test report of reference format after test automatically.
4. communication protocol platform of the present invention, tested device debugging software can be used as, the communication with tested device is realized, is realized Reading (such as modification, reading and modification of pressing plate), parsing, the device straighforward operation of the report of device event of tested device data Etc. function.
5. the present invention can compatible each producer's tester.
Brief description of the drawings
Fig. 1 is the overall structure block diagram of the present invention.
Fig. 2 is the logical construction block diagram of the testing workstation of the present invention.
Embodiment
As shown in figure 1, the automatic test hardware of the intelligence of the present invention includes tester, tested device and testing workstation. Tester is linked to be test loop with tested device by testing connecting line, and tester, testing workstation, tested device pass through Respective connection connects into test closed loop;The intelligent automatic testing software system of the present invention is arranged in testing workstation.
As shown in Fig. 2 intelligent ATS software is three-decker:Standard secondary developing platform layer, automatic test Layer, tester hardware interface layer.The standard secondary developing platform layer includes tested device testing scheme, device to test function Standard data interface storehouse, device to test solution development platform.Standard secondary developing platform layer realizes the test of tested protection device The secondary development of scheme and test subtemplate, i.e., according to device data model, test subtemplate storehouse and testing scheme data-interface Storehouse generates testing scheme.
The automatic test layer includes the test report that Auto-Test System, communication protocol platform and Auto-Test System are formed Accuse.Automatic test layer realizes automatic test, and described communication protocol platform is realized to be communicated with tested device, and communication platform program carries Called for access interface for Auto-Test System.Described Auto-Test System provides man-machine interaction during a testing experiment Environment, Auto-Test System device for opening testing scheme is automatic to perform test event in testing scheme, automatic decision test knot Whether fruit is qualified, and test result will be filled up in the reporting modules of standard.Automatic test outputting standard report, system testing Record storehouse, XML standard reports.The tester hardware interface layer includes tester control interface module.This interface is to open Com interface is put, Auto-Test System can be supplied to call, realize the various protection test functions of tested device.
In certain embodiments, the hardware configuration part of the intelligent Auto-Test System of the present invention includes tester, is tested Device, testing workstation, tester are linked to be test loop, tester, test work with tested device by testing connecting line Stand, tested device is connected to interchanger into test closed loop by grid line.The test closed loop, PC pass through netting twine connecting test instrument Device and tested device, device are connected with digital testing system by testing connecting line, so as to form test closed loop, closed loop automatic testing Detailed process is:
1) testing workstations PC softwares control tester, failure amount, quilt are applied to tested device by testing connecting line Survey device to act to tester by testing connecting line return mechanism, while network message is sent by network and gives PC softwares, survey Work station PC softwares are tried according to the two return informations, judge whether test result is qualified;
2) testing workstations PC softwares send message commands (device is outputed) and give device, and device is sent out by testing connecting line Send and output displacement message to tester, tester returns result to testing workstation PC softwares, testing workstation PC softwares according to Whether this result automatic decision test result is qualified;
3) testing workstations PC softwares control tester, apply test volume to tested device by testing connecting line, survey Work station PC softwares are tried by sending message read command, reading device relevant data value, and judge whether test result is qualified.
Testing workstation built-in intelligence Auto-Test System, system are three-decker, including standard secondary developing platform layer, Automatic test layer, tester hardware interface layer.The standard secondary developing platform layer includes tested device testing scheme, device Test function standard data interface storehouse, device to test solution development platform;The automatic test layer includes automatically testing platform, led to Interrogate the test report that stipulations platform and automatically testing platform are formed;The tester hardware interface layer controls including tester Interface module.
Described device testing scheme, including two parts of test template and report template;
The test template, XML1.0 grammer standard of the data format based on W3C, uses the letter of the structuring of object-oriented Describing mode is ceased, describes attribute definition, device data model definition, testing process and the various test events of tested device;
The attribute definition of the tested device, including:Device name, device id, the test function data-interface text used Part, communication command configuration file etc.;
The device data model definition, describe the details of the various data acquisition systems of device;
Measurement data set of the data acquisition system including device, semaphore data acquisition system, control command data set, dress The parameter put and set-point data set, device event and alarm data set etc.;
Described testing process includes apparatus function test event testing process, communication command project testing flow, artificial Detection project performs flow;
Described apparatus function test event testing process includes being calculated according to each fault parameter of device to test function successively Formula, the parameter value of test function is calculated, perform fault parameter and calculate script, realize specific calculations function;Call tester Control interface program, the sign and device to test functional parameter data of device to test function are passed to tester interface program, is opened Begin to test;Tester control software is waited to return to test end;After receiving test end, from tester control software Result data is read, test result is performed and judges script, judge whether test result is qualified;Test result data is filled up to report In slide former;
Described communication command project testing flow includes each data for calculating the data set of communication command association successively Value;The com interface opened by stipulations platform program, the value of data set is set;Call holding for communication protocol platform device object Row communication command procedure function, perform communication process;Communication process is waited to be finished;Receive the communication life of communication protocol platform Make process perform end, concentrated from the device data model data of communication protocol platform and obtain related data, called and survey Test result judges script, judges whether test result is qualified;Test result data is filled up in report template;
Described artificial detection project implementation flow, according to hardware detection project, prompting interface is ejected, prompts user to carry out Corresponding operation;If data need typing, user's logging data is waited;User is confirmed after completing operation, performs test knot Fruit judges script, judges whether test result is qualified;Test result data is filled up in report template;
The tested device test event, including apparatus function test event, desk checking project, communication command project.
Described device functional test project, it is tester to quilt for the test event that is exported of control tester Survey device and apply electrical quantity, test response or the input function of tested device;The definition of apparatus function test event includes as follows Definition:
1) attribute definition of project, including:Title, ID, the device to test functional identity used, number of repetition, report processing Mode, the type examined;
2) fault parameter defines:Defined according to the fault parameter of device to test function, each parameter of test function is set Calculation formula;
3) failure script defines:Define complex fault parameter and calculate script;
4) result script defines:Define result and judge script.
The desk checking project, is the artificial detection part of device, and this part needs artificially to examine tested device Look into, then according to testing result is filled in, desk checking project definition is as follows:
1) attribute definition of project, including:Title, ID, the type examined, voice prompt;
2) data definition:Defining artificial project needs the data of typing, and each data include:Title, ID, unit, data Type, form, default value definition;
3) prompt message defines:The prompt message of desk checking project is defined, prompt message can be text message, also may be used To be graphical information;
4) initializtion script:The script of project data initialization process;
5) result script defines:Define result and judge script.
The communication command project, it is to read data from tested device or send the project of control command, is defined as follows:
1) item attribute defines, including:Prolong before title, ID, the type examined, number of repetition, communication after delay, communication When;
2) communications parameter data defines:Order for needing transmission data, the supplemental characteristic of transmission is set;
3) spreading result data:The spreading result data of communication command are defined, for preserving the specially treated of communication command Result data;
4) initializtion script:The script of project data initialization process;
5) result script defines:Define result and judge script.
The classified catalogue is the classified catalogue of test event, realizes the test event of tested device carrying out classification pipe Reason, definition include:Title, ID.
The report template, is Word document, supplemental characteristic, result data in description standard reporting format and test template The position being filled up in Word document.
The tested device test function standard data interface storehouse is XML file, the XML1.0 grammer standards based on W3C, File saves the description of the various test functions of tested device;
Described device test function includes:Attribute data, test function fault parameter data and the result ginseng of test function Number data;
The attribute data of described device test function includes:Test function title name, test function ID;
Described device test function fault parameter data:The fault parameter data set of test function is defined, description performs this Test function needs the parameter set;
The result parameter data, the result data collection that the functional test of description device to test is formed when completing;
The supplemental characteristic, attribute definition include:Data name name, data ID, data type datatype, unit Unit, default value def-value, data value value;
The data type of the supplemental characteristic, the species of defined parameters data, such as:Floating number float, integer int, word Symbol string string, (codomain is zero-sequence fault:AN, BN, CN), (codomain is Transformer Winding number:Double winding, three winding) etc.;
Described device testing scheme development platform, including test template edit routine and report template edit routine.
Testing scheme development platform is according to the device data model of specific tested device, manual edit device to test scheme Or automatically generating device testing scheme;
The test template edit routine, realize the test of the standard testing flow and each test event to tested device Method editor, and according to inspection procedure/standard, the method for testing of standard testing flow and each test event to tested device Editor, detailed functions include:Device attribute editting function, device data model data collection editting function, device data model are special Linearity curve editting function, test event editting function, apparatus function test event editting function, desk checking project editor's work( Energy, communication command project editting function, classification item editting function, device data model import feature.
Described device attribute editting function, the attribute of equipment is set, including:Title, ID, script library file, device are surveyed Try performance data interface document;
Described device data model data collection editting function:Data under the logical device of editing device, logical device Collection, each data attribute editor of data set;
Described device data model characteristics curve editing function:Characteristic curve is edited, it is bent to edit characteristic in test process Line, which is drawn, to be set;
Described test event editting function, including:Grassroot project, edit item, delete project, adjusted iterm it is suitable Sequence, import and export project, copy project, pasting items;
Described apparatus function test event editting function, attribute, the editor's failure ginseng of apparatus function test event are set Number calculation formula, editor's calculation of fault script, edited result judge script, and calculation of fault script, result are calculated script and carried out Syntax check;Apparatus function test event attribute includes:Title, ID, the test function id used, number of repetition, retest When test result processing mode;
Described desk checking project editting function, setting option purpose attribute, edit desk checking project result data, Editor's desk checking project initializtion script and result judge script;
The desk checking project result data editor, including:Newdata, delete data, modification data;
The initializtion script and result judge Scripting Edition, including typing script, inspection script grammer.
Described communication command project editting function, attribute, the editor's communication command parameter number of communication command project are set According to, editor's spreading result variable data, editor's initializtion script and result judge script;
The communication command supplemental characteristic editor, the communication command for writing data to device, sets for editing needs The data put;
The spreading result data variable editor, realize the addition, deletion, modification of growth data;
Described classification item editting function, the attribute of classification item is set, including:Title, ID, the characteristic curve quoted ID;
Described device data model import feature:It is externally introduced device data model;
The report template edit routine, realize and enter the data in test template and report file (Word document) position Row association, report template edit routine directly open Word programs, and the operation of correlation is performed in Word programs.And according to inspection The reporting format regulation of code/standard, edits the reporting format (Word document) of standard and result data is filled up in report Corresponding relation.
Manual editing's testing scheme, for specific device model, according to inspection procedure/standard customization tested device Testing scheme.
The automatically generating device testing scheme, according to device data model and test subtemplate storehouse, automatically generating device Testing scheme, process are as follows:
1) device data model is imported from external file, or device data mould is enumerated from device by communication protocol platform Type;
2) keyword that each packet of data set contains in intellectual analysis device data model;
3) each number of data sets evidence is traveled through, is matched with subtemplate storehouse neutron template interface data key words, for matching Successful subtemplate, instantiated by the data that the match is successful, forming apparatus test template;
4) report template in the subtemplate that the match is successful, forming apparatus report template;
The subtemplate editor, according to device to test functional unit, the test subtemplate and report of editor's test function unit Accuse subtemplate;
Described device test function unit, it is independent test function set.
The test subtemplate editor, according to the test request of device to test functional unit, edits test function unit Testing process and test event are as follows in detail:
1) test subtemplate data-interface editting function, including it is newly-built, delete, modification data-interface, it is necessary to editor Data attribute includes:Title, ID, unit, data type, data value
2) device action event data collection defines editting function, the associated device action event number of editor's test subtemplate According to collection, each data of data set include:Title name, sign ID, data type datatype;
3) test event editting function, with device to test template test project editting function;
4) apparatus function test event editting function, with device to test plate device functional test project editting function;
5) desk checking project editting function, with device to test template desk checking project editting function;
6) communication command project editting function, with device to test template communication command project editting function;
7) classification item editting function, with device to test template classification project editting function;
The report subtemplate editor, with device report template editting function.
The automatically testing platform, there is provided the environment of man-machine interaction during an experiment.Automatically testing platform opens dress Put testing scheme, the test of test event in performs device testing scheme, testing process is controlled and managed.Described test stream Journey includes apparatus function test event testing process, communication command project testing flow, hardware detection project implementation flow;
Described apparatus function test event testing process includes being calculated according to each fault parameter of device to test function successively Formula, the parameter value of test function is calculated, perform fault parameter and calculate script, realize specific calculations function;Call tester Control interface program, the sign and device to test functional parameter data of device to test function are passed to tester interface program, is opened Begin to test;Tester control software is waited to return to test end;After receiving test end, from tester control software Result data is read, test result is performed and judges script, judge whether test result is qualified;Test result data is filled up to report In slide former;
Described communication command project testing flow includes each data for calculating the data set of communication command association successively Value;The com interface opened by stipulations platform, the value of data set is set;The execution of communication protocol platform device object is called to lead to Command procedure function is interrogated, performs communication process;Communication process is waited to be finished;Receive the communication command mistake of communication protocol platform Cheng Zhihang ends, concentrated from the device data model data of communication protocol platform and obtain related data, call test knot Fruit judges script, judges whether test result is qualified;Test result data is filled up in report template;
Described hardware detection project implementation flow is included according to hardware detection project successively, ejects prompting interface, prompts User is operated accordingly;If data need typing, user's logging data is waited;User is confirmed after completing operation, is held Row test result judges script, judges whether test result is qualified;Test result data is filled up in report template;
The test report that described automatically testing platform is formed is Word standard reports, and autotest program is in test process The middle report formed according to Word report templates, this is reported as the report of reference format.
The communication protocol platform, realizes tested device communication function;Communication protocol platform opens com interface, is provided from moving Test program calls.
The tested device communication function includes:Enumerate device data model, read data set values, modification data set values, Send control command.
The device data model, the details of device data set are described, be external file or advised by communicating The about details for the various data sets of device that platform is enumerated to obtain from device.
The communication protocol platform opens com interface, and the communication function of tested device is accessed for external program.Interface includes Management interface, device object interface, logical equipment object interface, object data set interface.
The tester control interface module, open com interface, called for Auto-Test System, realization device it is each Kind device to test function;Tester control interface routine notifies Auto-Test System test mode using windows messaging Change, such as connecting test instrument succeed, start to test, test completion, test abnormal information etc..
The tester control interface module opens com interface, including device to test function performs object and test function Perform the management object of object.
Described device test function-execution object, realizes the control to tester, and Auto-Test System calls this object real Example realizes the test of tested device electrical quantity device to test function;
Described device test function performs the management object of object, realizes that test function performs establishment and the tester of object The closing of control interface program.
Automatic test approach based on Auto-Test System mainly includes three steps:The editor of subtemplate, testing scheme Editor and automatic test.
The editor of described subtemplate is the process in abundant subtemplate storehouse, and testing scheme development module can be with specific test Subtemplate is loaded from subtemplate storehouse, it is not necessary to carries out the editor of subtemplate every time;Described testing scheme editor will basis Device data model and subtemplate storehouse determine detailed testing scheme;Auto-Test System loading testing scheme is surveyed automatically Examination, the test report for eventually forming reference format are preserved and exported.Further, intelligent automatic test approach of the invention tool Body comprises the following steps:
1) testing scheme development module editor subtemplate, subtemplate storehouse is established.Specifically include following:
1. using testing scheme development module, newly-built test subtemplate, data-interface definition is established for subtemplate;
2. required according to the functional test of tested device, the test event of editor's test subtemplate;
3. preserving test subtemplate, the test subtemplate storehouse for covering the various test functions of tested device is formed.
2) testing scheme development module editing device testing scheme.Specifically include following:
1. being communicated by stipulations platform and tested device, the device data model of device is enumerated, saves as device data mould Type file;
2. using testing scheme development module, testing scheme is established, imports device data model file;
3. intellectual analysis device data model, survey survey is manually selected according to automatic protect of analysis result and functional test requirement Swab template;
4. according to the device data model of tested device, instantiation test subtemplate, the test of tested device is automatically generated Scheme;
5. test subtemplate instantiation, splice the report template of each instantiation subtemplate, form tested device Test report template;
6. respectively the instantiation of test subtemplate is completed, the testing scheme of tested device is preserved.
3) test control center module is tested according to testing scheme.Specifically include as follows:
1. test control center module device for opening testing scheme;
2. starting to test, test control center module (mainly includes apparatus function test event according to device to test scheme Test, communication command project testing, desk checking project testing and classification of the items catalogue test) testing process, be sequentially completed The test of each test event, test result, automatic progress result judgement, Auto-writing report are recorded automatically;
3. test is completed, the test report of reference format is formed.
The preferred embodiment of the present invention described in detail above, still, the present invention are not limited in above-mentioned embodiment Detail, in the range of the technology design of the present invention, a variety of equivalents can be carried out to technical scheme, this A little equivalents belong to protection scope of the present invention.It is further to note that described in above-mentioned embodiment Each particular technique feature, in the case of reconcilable, can be combined by any suitable means.In order to avoid not Necessary repetition, the present invention no longer separately illustrate to various combinations of possible ways.In addition, a variety of implementations of the present invention It can also be combined between mode, as long as it without prejudice to the thought of the present invention, it is public that it should equally be considered as institute of the invention The content opened.

Claims (2)

1. a kind of intelligent automatic test approach, it is characterised in that realized based on intelligent Auto-Test System, the intelligence is surveyed automatically Test system includes:
The tester being connected by testing connecting line with tested device, and by communication data line and tester and be tested The testing workstation of device connection,
The testing workstation includes standard secondary developing platform layer, automatic test layer and tester hardware interface layer, wherein, The standard secondary developing platform layer includes tested device testing scheme, device to test profile data-interface storehouse and device and surveyed Try solution development platform;The automatic test layer is formed including automatically testing platform, communication protocol platform and automatically testing platform Test report;The tester hardware interface layer includes tester control interface module;
The communication protocol platform includes:
Communication module is developed, calls communication protocol template to realize and is communicated with tested device, including realize reading device device data Model, reading device data, modification device data and transmission control command;
Wherein, the communication protocol template is used for the details for describing device communication protocol, including communication packet is described and communicated Journey describes;Communication packet description defines parsing and the manufacture rule of the various messages of stipulations, and with device data mould The method that type carries out data interaction;The communication process description defines the various communication commands of communication protocol, and each communication The execution flow of order;
Described device test function standard data interface storehouse is tested using the information describing mode description of the structuring of object-oriented The detailed data information of the various test functions of device;
Wherein, tested device test function is from device to test principle, the device basic test function of induction and conclusion;It is described The various test function details of tested device include the title of test function, ID, and the fault parameter data of test function Described with result parameter data;Wherein, the detailed description information of supplemental characteristic includes title, ID, data type, the unit of parameter And default value;
The tested device testing scheme uses the information describing mode of the structuring of object-oriented, keeping records tested device Device data model, the test item of tested device are defined, the definition of the testing process of test item, reporting format and data reporting are filled out Write definition;
The device data model of the tested device is used for the details for describing the various data sets of device;
The test event definition of the tested device includes test function project, desk checking project and communication command project;
The test function project, the test event exported for control tester, tester apply to tested device Test volume, test the response of tested device or the input function of tested device;
The desk checking project, for the hardware detection part to tested device, this part needs to receive manually to tested device The operation information checked, and receive testing result;Desk checking project also includes prompting operation information;
The function of communication protocol platform is called in the communication command project, description, including is read data, modification data and sent control System order;
The tested device testing scheme development platform, for according to specific tested device editing device testing scheme;
The tester interface routine is used to control tester output test volume, record tested device test result;Test Instrument controlling interface module opens external call interface, and external program passes through interface and tester interface program interaction;
Specifically comprise the following steps:
S1. the test of tester control interface program finishing device test function is called;
S2. communication protocol platform is called to complete reading, the write-in of data and the execution of control command of data;
S3. desk checking project is performed, prompting user is operated or logging data;
S4. judge whether test result is qualified automatically according to the result Rule of judgment in scheme during experiment;
S5. parameter and result data are filled up in report automatically, form the test report of reference format.
2. a kind of intelligent automatic test approach according to claim 1, it is characterised in that the S1 comprises the following steps:
Step 11:Fault parameter is performed according to each fault parameter of device to test function and calculates script, realizes the calculating of supplemental characteristic Function;
Step 12:Tester control interface program, the mark and work(of dispensing device test function are called in a manner of com interface Energy supplemental characteristic, starts to test;
Step 13:Read test instrument returning result data, test result calculations script is performed, and result is inserted into standard report;
The S2 comprises the following steps:
Step 21:Calculate the value of each data of the data set of communication command association;
Step 22:The com interface opened by stipulations platform, the value of data set is set;
Step 23:The execution communication command procedure function of communication protocol platform device object is called, performs communication process;
Step 24:Communication process is waited to be finished;
Step 25:The communication command process for receiving communication protocol platform performs end, from the number of devices of communication protocol platform Concentrated according to model data and obtain related data, call test result to judge script, and result is inserted into standard report;
The S3 comprises the following steps:
Step 31:According to hardware detection project, prompting interface is ejected, prompts user to be operated accordingly;
Step 32:User completes related device data inputting;
Step 33:User is confirmed after completing operation, calls test result to judge script, and result is inserted into standard report.
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