CN104779132B - 静电离子陷阱 - Google Patents

静电离子陷阱 Download PDF

Info

Publication number
CN104779132B
CN104779132B CN201510194511.6A CN201510194511A CN104779132B CN 104779132 B CN104779132 B CN 104779132B CN 201510194511 A CN201510194511 A CN 201510194511A CN 104779132 B CN104779132 B CN 104779132B
Authority
CN
China
Prior art keywords
ions
frequency
trap
ion
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201510194511.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN104779132A (zh
Inventor
葛拉多·A·布鲁克尔
安特卫普 肯尼斯·D·凡
G·杰佛瑞·拉司邦
史考特·C·海恩布希
麦可·N·肖特
巴巴拉·简·欣奇
列克谢·V·艾马柯夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MKS Instruments Inc
Original Assignee
MKS Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MKS Instruments Inc filed Critical MKS Instruments Inc
Publication of CN104779132A publication Critical patent/CN104779132A/zh
Application granted granted Critical
Publication of CN104779132B publication Critical patent/CN104779132B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622Ion mobility spectrometry
    • G01N27/623Ion mobility spectrometry combined with mass spectrometry
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205Device types
    • H01J49/4245Electrostatic ion traps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426Methods for controlling ions
    • H01J49/427Ejection and selection methods
    • H01J49/429Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electrochemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN201510194511.6A 2009-05-06 2010-05-05 静电离子陷阱 Expired - Fee Related CN104779132B (zh)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US21550109P 2009-05-06 2009-05-06
US61/215,501 2009-05-06
US17639009P 2009-05-07 2009-05-07
US61/176,390 2009-05-07
US32511910P 2010-04-16 2010-04-16
US61/325,119 2010-04-16
US32916310P 2010-04-29 2010-04-29
US61/329,163 2010-04-29
CN201080029456.0A CN102648511B (zh) 2009-05-06 2010-05-05 静电离子陷阱

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201080029456.0A Division CN102648511B (zh) 2009-05-06 2010-05-05 静电离子陷阱

Publications (2)

Publication Number Publication Date
CN104779132A CN104779132A (zh) 2015-07-15
CN104779132B true CN104779132B (zh) 2018-04-13

Family

ID=43050850

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201510194511.6A Expired - Fee Related CN104779132B (zh) 2009-05-06 2010-05-05 静电离子陷阱
CN201080029456.0A Expired - Fee Related CN102648511B (zh) 2009-05-06 2010-05-05 静电离子陷阱

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201080029456.0A Expired - Fee Related CN102648511B (zh) 2009-05-06 2010-05-05 静电离子陷阱

Country Status (6)

Country Link
US (1) US8586918B2 (https=)
EP (1) EP2430646B1 (https=)
JP (2) JP5688494B2 (https=)
KR (2) KR101724389B1 (https=)
CN (2) CN104779132B (https=)
WO (1) WO2010129690A2 (https=)

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5055285B2 (ja) 2005-09-30 2012-10-24 タータ スチール リミテッド 鋼プラント廃棄物及び廃熱から水素及び(又は)他の気体を製造する方法
TWI484529B (zh) * 2006-11-13 2015-05-11 Mks Instr Inc 離子阱質譜儀、利用其得到質譜之方法、離子阱、捕捉離子阱內之離子之方法和設備
GB2470599B (en) * 2009-05-29 2014-04-02 Thermo Fisher Scient Bremen Charged particle analysers and methods of separating charged particles
CN102906907B (zh) 2010-06-02 2015-09-02 株式会社半导体能源研究所 蓄电装置及其制造方法
DE102010034078B4 (de) * 2010-08-12 2012-06-06 Bruker Daltonik Gmbh Kingdon-Massenspektrometer mit zylindrischen Elektroden
WO2012177900A1 (en) * 2011-06-22 2012-12-27 Research Triangle Institute, International Bipolar microelectronic device
EP2774169A2 (en) * 2011-10-31 2014-09-10 Brooks Automation, Inc. Method and apparatus for tuning an electrostatic ion trap
US9653278B2 (en) * 2011-12-28 2017-05-16 DH Technologies Development Ptd. Ltd. Dynamic multipole Kingdon ion trap
EP2825875B1 (en) * 2012-03-13 2019-05-08 MKS Instruments, Inc. Trace gas concentration in art ms traps
DE102012008972B4 (de) * 2012-05-03 2018-02-01 Bruker Daltonik Gmbh Spannungsquellen für Massenspektrometer
US8921779B2 (en) * 2012-11-30 2014-12-30 Thermo Finnigan Llc Exponential scan mode for quadrupole mass spectrometers to generate super-resolved mass spectra
DE102013201499A1 (de) * 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US9214321B2 (en) * 2013-03-11 2015-12-15 1St Detect Corporation Methods and systems for applying end cap DC bias in ion traps
US8735810B1 (en) * 2013-03-15 2014-05-27 Virgin Instruments Corporation Time-of-flight mass spectrometer with ion source and ion detector electrically connected
DE102013213501A1 (de) * 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches
WO2015017401A1 (en) * 2013-07-30 2015-02-05 The Charles Stark Draper Laboratory, Inc. Continuous operation high speed ion trap mass spectrometer
WO2015026727A1 (en) 2013-08-19 2015-02-26 Virgin Instruments Corporation Ion optical system for maldi-tof mass spectrometer
WO2015138826A1 (en) * 2014-03-14 2015-09-17 Rutgers, The State University Of New Jersey An electrostatic ion trap mass spectrometer utilizing autoresonant ion excitation and methods of using the same
US10416131B2 (en) * 2014-03-31 2019-09-17 Leco Corporation GC-TOF MS with improved detection limit
US10211040B2 (en) * 2014-11-07 2019-02-19 The Trustees Of Indiana University Frequency and amplitude scanned quadrupole mass filter and methods
US9588004B2 (en) 2014-11-07 2017-03-07 Mks Instruments, Inc. Long lifetime cold cathode ionization vacuum gauge design
KR101786950B1 (ko) * 2014-12-30 2017-10-19 한국기초과학지원연구원 비행시간 질량분석기
TWI739300B (zh) 2015-01-15 2021-09-11 美商Mks儀器公司 離子化計及其製造方法
GB2536870B (en) * 2015-02-24 2019-09-11 Micromass Ltd A method and apparatus for tuning mass spectrometers
GB2551110B (en) * 2016-05-23 2020-03-11 Thermo Fisher Scient Bremen Gmbh Ion injection to an electrostatic trap
US10192730B2 (en) 2016-08-30 2019-01-29 Thermo Finnigan Llc Methods for operating electrostatic trap mass analyzers
US11227753B2 (en) * 2016-10-04 2022-01-18 Atonarp Inc. System and method for accurately quantifying composition of a target sample
US10622202B2 (en) * 2016-10-21 2020-04-14 Purdue Research Foundation Ion traps that apply an inverse Mathieu q scan
CN107219448B (zh) * 2017-06-07 2019-03-26 西安电子科技大学 基于特征时常数的势垒层内陷阱分布表征方法
US12237162B2 (en) 2017-07-18 2025-02-25 Duke University Small-volume UHV ion-trap package and method of forming
US10755913B2 (en) 2017-07-18 2020-08-25 Duke University Package comprising an ion-trap and method of fabrication
US10615016B2 (en) 2017-09-07 2020-04-07 Thermo Fisher Scientific (Bremen) Gmbh Determining isotope ratios using mass spectrometry
US10199207B1 (en) * 2017-09-07 2019-02-05 California Institute Of Technology Determining isotope ratios using mass spectrometry
CN107703430B (zh) * 2017-09-11 2019-02-22 西安电子科技大学 表面态陷阱对器件输出特性影响的测量方法
CN107703431B (zh) * 2017-09-11 2019-02-22 西安电子科技大学 基于频率可变脉冲技术的器件表面态陷阱测量方法
WO2019060538A1 (en) 2017-09-20 2019-03-28 The Trustees Of Indiana University METHODS FOR LIPOPROTEIN RESOLUTION BY MASS SPECTROMETRY
EP3688790B1 (en) * 2017-09-25 2025-05-28 DH Technologies Development Pte. Ltd. Electro static linear ion trap mass spectrometer
RU2683018C1 (ru) * 2017-11-07 2019-03-26 Евгений Васильевич Мамонтов Способ масс-анализа ионов в квадрупольных высокочастотных полях с дипольным возбуждением колебаний на границах стабильности
CN107993908B (zh) * 2017-11-27 2019-11-15 温州大学 一种基于场发射阴极电子源的电离真空计及其应用方法
EP3738137A1 (en) 2018-01-12 2020-11-18 The Trustees of Indiana University Electrostatic linear ion trap design for charge detection mass spectrometry
GB201802917D0 (en) * 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
SG11202008683RA (en) * 2018-03-23 2020-10-29 Adaptas Solutions Pty Ltd Particle detector having improved performance and service life
GB2572819B (en) 2018-04-13 2021-05-19 Thermo Fisher Scient Bremen Gmbh Method and apparatus for operating a vacuum interface of a mass spectrometer
CN108535403B (zh) * 2018-04-17 2019-07-02 西南大学 数据处理的方法及装置
US10622200B2 (en) * 2018-05-18 2020-04-14 Perkinelmer Health Sciences Canada, Inc. Ionization sources and systems and methods using them
JP7410935B2 (ja) 2018-05-24 2024-01-10 ザ リサーチ ファウンデーション フォー ザ ステイト ユニバーシティー オブ ニューヨーク 容量性センサ
US11145503B2 (en) * 2018-05-28 2021-10-12 Dh Technologies Development Pte. Ltd. Two-dimensional fourier transform mass analysis in an electrostatic linear ion trap
US10332732B1 (en) * 2018-06-01 2019-06-25 Eagle Technology, Llc Image intensifier with stray particle shield
EP4391015A3 (en) 2018-06-04 2024-10-09 The Trustees of Indiana University Ion trap array for high throughput charge detection mass spectrometry
WO2019236139A1 (en) 2018-06-04 2019-12-12 The Trustees Of Indiana University Interface for transporting ions from an atmospheric pressure environment to a low pressure environment
CA3100838A1 (en) 2018-06-04 2019-12-12 The Trustees Of Indiana University Charge detection mass spectrometry with real time analysis and signal optimization
WO2019236143A1 (en) 2018-06-04 2019-12-12 The Trustees Of Indiana University Apparatus and method for calibrating or resetting a charge detector
JP7398810B2 (ja) * 2018-06-04 2023-12-15 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 静電線形イオン・トラップにイオンを捕獲する装置および方法
DE102018121942B3 (de) 2018-09-07 2020-01-16 Quantum Factory GmbH Ionenfalle, Verfahren zum Regeln der Ionenfalle und Verwendungen als Antrieb einer Ionenfalle
CN113574632B (zh) 2018-11-20 2024-07-30 印地安纳大学理事会 用于单粒子质谱分析的轨道阱
EP4443473A3 (en) 2018-12-03 2025-01-01 The Trustees of Indiana University Apparatus for simultaneously analyzing multiple ions with an electrostatic linear ion trap
US10930485B2 (en) * 2019-03-25 2021-02-23 Hamilton Sundstrand Corporation Ion source for an ion mobility spectrometer
WO2020198332A1 (en) * 2019-03-25 2020-10-01 The Regents Of The University Of California Multiplex charge detection mass spectrometry
US10892398B2 (en) * 2019-03-28 2021-01-12 Johannes Pollanen Qubit hardware for electrons on helium
EP3959741A1 (en) 2019-04-23 2022-03-02 The Trustees of Indiana University Identification of sample subspecies based on particle charge behavior under structural change-inducing sample conditions
WO2020226977A1 (en) * 2019-05-07 2020-11-12 Transient Plasma Systems, Inc. Pulsed non-thermal atmospheric pressure plasma processing system
WO2021061650A1 (en) 2019-09-25 2021-04-01 The Trustees Of Indiana University Apparatus and method for pulsed mode charge detection mass spectrometry
CN114728237B (zh) 2019-10-10 2026-02-24 印地安纳大学理事会 用于识别、选择和纯化粒子的系统和方法
JP7690209B2 (ja) 2019-12-18 2025-06-10 ザ・トラスティーズ・オブ・インディアナ・ユニバーシティー 電荷測定装置を有する質量分析計
CN111044805B (zh) * 2019-12-27 2021-12-24 中国航空工业集团公司西安飞机设计研究所 一种静电放电射频噪声测试方法
EP4100991B1 (en) 2020-02-03 2025-01-29 The Trustees of Indiana University A charge detection mass spectrometer and related method
JP7508840B2 (ja) * 2020-04-06 2024-07-02 株式会社島津製作所 ガスクロマトグラフ質量分析計、質量分析方法およびプログラム
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
CN118402037A (zh) 2021-12-15 2024-07-26 水技术公司 具有集成放大器的感应式检测器
WO2024018275A1 (en) * 2022-07-17 2024-01-25 Nova Measuring Instruments Inc. Secondary ion mass spectroscopy adaptive count rate modulation

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5128542A (en) * 1991-01-25 1992-07-07 Finnigan Corporation Method of operating an ion trap mass spectrometer to determine the resonant frequency of trapped ions
TW200832490A (en) * 2006-11-13 2008-08-01 Brooks Automation Inc Electrostatic ion trap

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL86953C (https=) * 1950-12-02
NL240108A (https=) 1958-06-13
US3174034A (en) 1961-07-03 1965-03-16 Max Planck Gesellschaft Mass spectrometer
DE1448192A1 (de) 1961-07-03 1968-10-10 Inst Plasmaphysik Gmbh Massenspektrometer
US3258591A (en) 1961-12-22 1966-06-28 Pulse type mass spectrometer wherein ions are separated by oscillations in an electrostatic field
US3258592A (en) 1961-12-23 1966-06-28 Dynamic mass spectrometer wherein ions are periodically oscillated until se- lectively accelerated to a detector
DE1498870A1 (de) 1962-02-22 1969-03-27 Max Planck Gesellschaft Reflexions-Massenspektrometer
DE1498873A1 (de) 1962-05-02 1969-04-10 Max Planck Gesellschaft Mit elektrischen Feldern arbeitendes Massenspektrometer
US5200614A (en) * 1992-01-16 1993-04-06 Ion Track Instruments, Inc. Ion mobility spectrometers
US5371364A (en) * 1993-02-18 1994-12-06 Thermo King Corporation Practical implementations for ion mobility sensor
GB9506695D0 (en) 1995-03-31 1995-05-24 Hd Technologies Limited Improvements in or relating to a mass spectrometer
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
JPH10233187A (ja) * 1997-02-19 1998-09-02 Shimadzu Corp 四重極質量分析計
US7019289B2 (en) 2003-01-31 2006-03-28 Yang Wang Ion trap mass spectrometry
US7514674B2 (en) 2004-05-04 2009-04-07 The University Of North Carolina At Chapel Hill Octapole ion trap mass spectrometers and related methods
GB0416288D0 (en) 2004-07-21 2004-08-25 Micromass Ltd Mass spectrometer
US7498585B2 (en) 2006-04-06 2009-03-03 Battelle Memorial Institute Method and apparatus for simultaneous detection and measurement of charged particles at one or more levels of particle flux for analysis of same
JP2006286210A (ja) * 2005-03-31 2006-10-19 Shimadzu Corp 質量分析装置及び質量分析装置用印加電圧設定パラメータデータ
GB0526043D0 (en) 2005-12-22 2006-02-01 Micromass Ltd Mass spectrometer
US7511278B2 (en) 2006-01-30 2009-03-31 Spectro Analytical Instruments Gmbh & Co. Kg Apparatus for detecting particles
TWI417947B (zh) * 2006-04-26 2013-12-01 艾克塞利斯科技公司 捕捉離子束粒子與聚焦離子束之方法與系統
US7403065B1 (en) 2006-08-22 2008-07-22 Sandia Corporation Differential transimpedance amplifier circuit for correlated differential amplification
JP5081436B2 (ja) * 2006-11-24 2012-11-28 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5128542A (en) * 1991-01-25 1992-07-07 Finnigan Corporation Method of operating an ion trap mass spectrometer to determine the resonant frequency of trapped ions
TW200832490A (en) * 2006-11-13 2008-08-01 Brooks Automation Inc Electrostatic ion trap

Also Published As

Publication number Publication date
KR101570652B1 (ko) 2015-11-23
EP2430646A4 (en) 2016-11-09
WO2010129690A2 (en) 2010-11-11
JP2015072902A (ja) 2015-04-16
CN104779132A (zh) 2015-07-15
US8586918B2 (en) 2013-11-19
WO2010129690A3 (en) 2011-03-10
KR20120060941A (ko) 2012-06-12
KR20150133300A (ko) 2015-11-27
KR101724389B1 (ko) 2017-04-07
EP2430646A2 (en) 2012-03-21
CN102648511B (zh) 2015-05-06
EP2430646B1 (en) 2019-02-27
US20120112056A1 (en) 2012-05-10
JP5688494B2 (ja) 2015-03-25
JP5918821B2 (ja) 2016-05-18
JP2012526362A (ja) 2012-10-25
WO2010129690A8 (en) 2012-06-21
CN102648511A (zh) 2012-08-22

Similar Documents

Publication Publication Date Title
CN104779132B (zh) 静电离子陷阱
CN101578684B (zh) 静电离子阱
US11862448B2 (en) Instrument, including an electrostatic linear ion trap with charge detector reset or calibration, for separating ions
WO2019220296A1 (en) Ionization sources and systems and methods using them
Alexander et al. Determination of absolute ion yields from a MALDI source through calibration of an image-charge detector
Patterson Development of a portable ion trap mass spectrometer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
EXSB Decision made by sipo to initiate substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20180413

CF01 Termination of patent right due to non-payment of annual fee