CN104749462A - Method and device for testing appliance performance index - Google Patents
Method and device for testing appliance performance index Download PDFInfo
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- CN104749462A CN104749462A CN201510128171.7A CN201510128171A CN104749462A CN 104749462 A CN104749462 A CN 104749462A CN 201510128171 A CN201510128171 A CN 201510128171A CN 104749462 A CN104749462 A CN 104749462A
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Abstract
The invention is applicable to the electronic testing field, and particularly relates to a method for testing appliance performance index and a device for testing the appliance performance index. In the invention, the method comprises the following steps: testing a main board voltage of a tested device and a wire end voltage passing through a testing wire respectively; adjusting the main board voltage to the preset main board voltage, adjusting the tested device, and testing the charging current passing through the testing wire. The testing result cannot be influenced by different pressure drop caused by the testing wires with different lengths; and thereby, the testing precision is improved.
Description
Technical field
The invention belongs to Electronic Testing field, particularly relate to a kind of electric property indication test method and device.
Background technology
Along with the development of society, various electric equipment is widely used in the middle of daily life, is extremely necessary the test of electric property index, because this concerns the normal use of electrical equipment.Usually, we comprise voltage, electric current etc. performance test to the test of electric property index.
When electric equipment is tested, p-wire must be used and come connecting circuit equipment and testing apparatus, and adopt existing test to use the p-wire of different length, because the pressure drop of p-wire is different, the parameter difference tested out can be caused.Such as, same equipment under test is tested, if the voltage of equipment under test is the same, due to the pressure drop adopting the pressure drop of short p-wire to be less than long p-wire, so the electric current causing short p-wire to be measured is greater than long p-wire measure the electric current come.
Therefore, adopt present method of testing different due to the length of p-wire, test result can be caused different.
Summary of the invention
The object of the present invention is to provide a kind of electric property indication test method, be intended to solve the present method of testing of employing different due to the length of p-wire, the problem that test result is different can be caused.
The present invention is achieved in that a kind of electric property indication test method, and described method comprises the steps:
The mainboard voltage of test equipment under test;
Test the line end voltage of mainboard by p-wire of described equipment under test;
Be as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, described equipment under test adjusted, tests the charging current by described p-wire.
Another object of the present invention is to provide a kind of electric property index testing device, described device comprises:
First voltage tester unit, for testing the mainboard voltage of equipment under test;
Second voltage tester unit, for testing the line end voltage of mainboard by p-wire of described equipment under test;
Testing current unit, for being as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusting described equipment under test, testing the charging current by described p-wire.
In the present invention, respectively to the mainboard voltage of equipment under test with tested by the line end voltage of p-wire, and be as the criterion mainboard voltage to be adjusted to predetermined mainboard voltage, equipment under test is adjusted, test the charging current by p-wire, such test result can not be subject to the different impact of pressure drop that the different p-wire of length causes, thus improves the precision of test.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the electric property indication test method that the embodiment of the present invention provides;
Fig. 2 is the structural drawing of the electric property index testing device that the embodiment of the present invention provides.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
Fig. 1 shows the flow process of the electric property indication test method that the embodiment of the present invention provides, and for convenience of explanation, illustrate only the part relevant to the embodiment of the present invention.
A kind of electric property indication test method, described method comprises the steps:
Step S101, the mainboard voltage of test equipment under test;
Step S102, tests the line end voltage of mainboard by p-wire of described equipment under test;
Step S103, is as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusts, test the charging current by described p-wire to described equipment under test.
As one embodiment of the invention, step S103, is as the criterion mainboard voltage to be adjusted to predetermined mainboard voltage, adjusts, test and specifically comprised by the step of the charging current of described p-wire described equipment under test:
Be as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, described equipment under test adjusted, tests the charging current by described p-wire, specifically according to following formula:
I＝(U1-U2)*S/ρL
Wherein, U1 is line end voltage, U2 is mainboard voltage, S is p-wire cross-sectional area, ρ is p-wire resistivity, L is p-wire length.
As one embodiment of the invention, described p-wire adopts USB line or clip line.
Fig. 2 shows the structure of the electric property index testing device that the embodiment of the present invention provides, and for convenience of explanation, illustrate only the part relevant to the embodiment of the present invention.
A kind of electric property index testing device, described device comprises:
First voltage tester unit 1, for testing the mainboard voltage of equipment under test;
Second voltage tester unit 2, for testing the line end voltage of mainboard by p-wire of described equipment under test;
Testing current unit 3, for being as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusting described equipment under test, testing the charging current by described p-wire.
As one embodiment of the invention, described testing current unit 3 specifically comprises:
Testing current module 31, for being as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusting described equipment under test, testing the charging current by described p-wire, specifically according to following formula:
I＝(U1-U2)*S/ρL
Wherein, U1 is line end voltage, U2 is mainboard voltage, S is p-wire cross-sectional area, ρ is p-wire resistivity, L is p-wire length.
As one embodiment of the invention, described p-wire adopts USB line or clip line.
As one embodiment of the invention, electric property index testing device can for being integrated in the combination of software, hardware or software and hardware in testing tool.
Principle is explained:
In traditional method of testing, the mainboard that tester takes for equipment under test is the mainboard voltage of equipment under test by the line end voltage (i.e. the voltage of testing apparatus display) of p-wire, and ignore the p-wire adopting different length, because the pressure drop of p-wire is different, the parameter difference tested out can be caused.Such as, same equipment under test is tested, if the voltage of equipment under test is the same, due to the pressure drop adopting the pressure drop of short p-wire to be less than long p-wire, so the electric current causing short p-wire to be measured is greater than long p-wire measure the electric current come.
And in this method of testing, U1=U2+I* ρ L/S, wherein, U1 is line end voltage, U2 is mainboard voltage, S is p-wire cross-sectional area, ρ is p-wire resistivity, L is p-wire length, I* ρ L/S is the pressure drop voltage of p-wire, adopt same material, same width, the p-wire that length is different, the pressure drop voltage of long p-wire is greater than short p-wire, when adopting long p-wire and short p-wire to test respectively, all be as the criterion so that mainboard voltage U2 is adjusted to predetermined mainboard voltage for twice, equipment under test is adjusted, the line end voltage U 1 of long p-wire is adopted to be greater than the line end voltage U 1 adopting short p-wire, such charging current by p-wire tested out for twice is substantially equal.
Such as, be as the criterion to set mainboard voltage U2=5V, equipment under test is adjusted, adopt the line end voltage U 1 of long p-wire to be adjusted to 5.62V, adopt the line end voltage U 1 of short p-wire to be adjusted to 5.45V, last test out for twice be 1.694A by the charging current of p-wire.
Therefore, in this method of testing, adopt the p-wire that length is different, the charging current that all can not result through p-wire is different.
In embodiments of the present invention, respectively to the mainboard voltage of equipment under test with tested by the line end voltage of p-wire, and be as the criterion mainboard voltage to be adjusted to predetermined mainboard voltage, equipment under test is adjusted, test the charging current by p-wire, such test result can not be subject to the different impact of pressure drop that the different p-wire of length causes, thus improves the precision of test.
One of ordinary skill in the art will appreciate that: the step or the part steps that realize said method embodiment can have been come by the hardware that programmed instruction is relevant, aforesaid program can be stored in computer read/write memory medium, this program is when performing, performs and comprise the step of said method embodiment, and aforesaid storage medium comprises: ROM, RAM, magnetic disc or CD etc. various can be program code stored medium.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. an electric property indication test method, is characterized in that, described method comprises the steps:
The mainboard voltage of test equipment under test;
Test the line end voltage of mainboard by p-wire of described equipment under test;
Be as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, described equipment under test adjusted, tests the charging current by described p-wire.
2. electric property indication test method as claimed in claim 1, is characterized in that, is describedly as the criterion mainboard voltage to be adjusted to predetermined mainboard voltage, adjusts, test and specifically comprised by the step of the charging current of described p-wire described equipment under test:
Be as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, described equipment under test adjusted, tests the charging current by described p-wire, specifically according to following formula:
I＝(U1-U2)*S/ρL
Wherein, U1 is line end voltage, U2 is mainboard voltage, S is p-wire cross-sectional area, ρ is p-wire resistivity, L is p-wire length.
3. electric property indication test method as claimed in claim 1 or 2, is characterized in that, described p-wire adopts USB line or clip line.
4. an electric property index testing device, is characterized in that, described device comprises:
First voltage tester unit, for testing the mainboard voltage of equipment under test;
Second voltage tester unit, for testing the line end voltage of mainboard by p-wire of described equipment under test;
Testing current unit, for being as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusting described equipment under test, testing the charging current by described p-wire.
5. electric property index testing device as claimed in claim 4, it is characterized in that, described testing current unit specifically comprises:
Testing current module, for being as the criterion so that described mainboard voltage is adjusted to predetermined mainboard voltage, adjusting described equipment under test, testing the charging current by described p-wire, specifically according to following formula:
I＝(U1-U2)*S/ρL
Wherein, U1 is line end voltage, U2 is mainboard voltage, S is p-wire cross-sectional area, ρ is p-wire resistivity, L is p-wire length.
6. the electric property index testing device as described in claim 4 or 5, is characterized in that, described p-wire adopts USB line or clip line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510128171.7A CN104749462B (en) | 2015-03-20 | 2015-03-20 | A kind of electric property indication test method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510128171.7A CN104749462B (en) | 2015-03-20 | 2015-03-20 | A kind of electric property indication test method and device |
Publications (2)
| Publication Number | Publication Date |
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| CN104749462A true CN104749462A (en) | 2015-07-01 |
| CN104749462B CN104749462B (en) | 2018-04-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510128171.7A Expired - Fee Related CN104749462B (en) | 2015-03-20 | 2015-03-20 | A kind of electric property indication test method and device |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0242366A (en) * | 1989-06-21 | 1990-02-13 | Energy Support Corp | Current detecting method and current detector |
| CN101566662A (en) * | 2009-05-27 | 2009-10-28 | 福州大学 | Electromagnetic appliance test system |
| CN104330606A (en) * | 2013-07-22 | 2015-02-04 | 技嘉科技股份有限公司 | Jig for measuring voltage and current of power supply and measuring method thereof |
-
2015
- 2015-03-20 CN CN201510128171.7A patent/CN104749462B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0242366A (en) * | 1989-06-21 | 1990-02-13 | Energy Support Corp | Current detecting method and current detector |
| CN101566662A (en) * | 2009-05-27 | 2009-10-28 | 福州大学 | Electromagnetic appliance test system |
| CN104330606A (en) * | 2013-07-22 | 2015-02-04 | 技嘉科技股份有限公司 | Jig for measuring voltage and current of power supply and measuring method thereof |
Non-Patent Citations (1)
| Title |
|---|
| 伴道远1: "关于导线的相关电流及压降等计算方式", 《百度文库》 * |
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| CN104749462B (en) | 2018-04-27 |
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