CN101634665A - Marginal voltage value testing device - Google Patents
Marginal voltage value testing device Download PDFInfo
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- CN101634665A CN101634665A CN200810029681A CN200810029681A CN101634665A CN 101634665 A CN101634665 A CN 101634665A CN 200810029681 A CN200810029681 A CN 200810029681A CN 200810029681 A CN200810029681 A CN 200810029681A CN 101634665 A CN101634665 A CN 101634665A
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Abstract
The invention discloses a marginal voltage value testing device, which comprises a test card and a control device, wherein the test card is used for decoding a command parameter and controlling to output corresponding digital voltage; the output end of the test card is connected with a computer mainboard to be tested; the control device is connected with the input end of the test card, and is used for sending the command parameter to the test card, receiving test data fed back by the computer mainboard to be tested, and displaying the marginal voltage value of a central processor or memory on the computer mainboard to be tested. According to an actual condition, the testing device can output arbitrarily expected output voltage instead of reference voltage (VREF) on the mainboard to be tested, thereby achieving the aims of replacing, testing and verifying, and realizing the automatic testing of the marginal voltage value of the central processor or the memory. Furthermore, the testing device can provide millivolt-grade accurate voltage below 3.3V instead of any circuit voltage below 3.3V without modifying the prior circuit on the mainboard to be tested.
Description
Technical field
The present invention relates to a kind of proving installation, especially relate to a kind of can the automatic centering central processor or internal memory carry out the proving installation of edge (Margin) magnitude of voltage.
Background technology
At the test event demand of current main-stream computermaker in the computer main board manufacture process, need carry out the test of edge (Margin) magnitude of voltage to central processing unit on the computer main board (CPU) or internal memory (Memory).
Yet at present domestic still do not have a proving installation that automatic centering central processor or internal memory carry out marginal voltage value, therefore is badly in need of this type of proving installation of exploitation.
Summary of the invention
The present invention discloses a kind of proving installation of marginal voltage value, can realize the marginal voltage value of automatic test central processing unit or internal memory automatically.
For reaching above-mentioned purpose, the proving installation of marginal voltage value disclosed by the invention comprises: be used for command parameter is carried out the test card of the output voltage of decoding processing and control output correspondence, the output terminal of this test card connects computer main board to be tested; Be connected control device with the input end of test card, be used for sending command parameter, and receive the test data of computer main board feedback to be tested, show the marginal voltage value of central processing unit on the computer main board to be tested or internal memory to test card.
Described test card comprises: be respectively applied for the USB interface that is connected with control device with computer main board to be tested; Adjustable resistance unit is connected between main control module and the output interface; Be used for command parameter being carried out decoding processing and controlling the main control module that adjustable resistance unit is exported corresponding output voltage, it connects adjustable resistance unit; Being used for the 5V voltage transitions that USB interface is exported is become 3.3V voltage is the low-voltage output module of main control module power supply, is connected between main control module and one of them USB interface; Be used to receive the automatic test module of the information of computer main board to be tested, be connected between main control module and another USB interface; Be used for digital voltage is exported to the output interface of computer main board to be tested, it connects holding circuit; Be used for the digital voltage of adjustable resistance unit output is carried out the holding circuit of overcurrent and overvoltage protection, it is connected between adjustable resistance unit and the output interface.
Compared with prior art, the present invention has following useful technique effect:
Thereby proving installation of the present invention can replace the purpose that the VREF on the mainboard to be tested reaches replacement, test and verifies according to this voltage of voltage that actual conditions output is wanted arbitrarily to export, and realizes the marginal voltage value of automatic test central processing unit or internal memory; In addition, proving installation of the present invention can provide 3.3V following millivolt level precise voltage, desirablely acts as the following circuit voltage of what 3.3V, and need not to revise the original circuit on the mainboard to be tested.
Description of drawings
Fig. 1 is the structural representation of proving installation of the present invention;
Fig. 2 is the electrical block diagram of test card among Fig. 1.
Embodiment
As shown in Figure 1, when needs are tested on the computer main board to be tested edge (Margin) magnitude of voltage of 10 central processing unit (CPU) or internal memory (Memory), test card 20 need be connected computer main board 10 to be tested, and make the output terminal of test card 20 connect control device 30, this control device can be a PC or server.
In conjunction with shown in Figure 2.This test card 20 mainly comprises: be respectively applied for the USB interface 21 and 22 that is connected to computer main board 10 to be tested and control device 30, this USB interface 21 and 22 includes USB connector and model is the USB1.1 chip for driving of PDIUSBDL2; The automatic test module 29 that is connected with USB interface 22, this automatic test module 29 can adopt the chip microcontroller of P89C52, is used to receive the information of computer main board 10 to be tested; The low-voltage output module 23 that is connected with USB interface 21, this low-voltage output module 23 adopts low pressure drop (Low DropOut, LDO) the linear regulation control chip is realized, be used for USB interface 21 output+the 5v voltage transition becomes 3.3v voltage and exports to main control module 24, for main control module 24 provides working power; After control device 30 is provided with command parameter, send main control module 24 to by USB interface 21, by main control module 24 command parameter is carried out decoding processing, the digital voltage of the corresponding command parameter of order control adjustable resistance unit 25 outputs that output is corresponding; Digital voltage is exported to computer main board 10 to be tested by after the holding circuit 26 from two output interfaces 28 and 29; Computer main board 10 to be tested feeds back to control device 30 with test result, is shown the marginal voltage value of central processing unit or internal memory by control device 30.
In addition, when testing, need draw 3 signal wire: VTT, VREF, GND signal wire from computer main board 10 to be tested, pressing as shown in Figure 2, mode is connected with test card 20; In addition, the slip-stick artist only needs to fill in necessary software setting and can produce command parameter output by control device 30 on control device 30.And this test card 20 both can the coarse adjustment output voltage (allotment arbitrarily of 0 ~ 255 step), also can finely tune output voltage; And after power down, still there is memory to keep configuration feature last time.
To sum up, thereby proving installation of the present invention can replace the purpose that the VREF on the mainboard 10 to be tested reaches replacement, test and verifies according to this voltage of voltage that actual conditions output is wanted arbitrarily to export, and realizes the marginal voltage value of automatic test central processing unit or internal memory.In addition, proving installation of the present invention can provide 3.3V following millivolt level precise voltage, desirablely acts as the following circuit voltage of what 3.3V, and need not to revise the original circuit on the mainboard 10 to be tested.
Claims (3)
1, a kind of proving installation of marginal voltage value is characterized in that, comprising:
Test card is used for command parameter is carried out decoding processing and the corresponding output voltage of control output, and the output terminal of this test card connects computer main board to be tested;
Control device is connected with the input end of test card, is used for sending command parameter to test card, and receives the test data of computer main board feedback to be tested, shows the marginal voltage value of central processing unit on the computer main board to be tested or internal memory.
2, the proving installation of marginal voltage value according to claim 1 is characterized in that, described test card comprises:
Two USB interface are used for being connected with control device with computer main board to be tested respectively;
Adjustable resistance unit is connected between main control module and the output interface;
Main control module is used for command parameter being carried out decoding processing and controlling the corresponding digital voltage of adjustable resistance unit output, and it connects adjustable resistance unit;
The low-voltage output module, being used for the 5V voltage transitions that USB interface is exported is become 3.3V voltage is the main control module power supply, is connected between main control module and one of them USB interface;
Automatic test module is used to receive the information of computer main board to be tested, is connected between main control module and another USB interface;
Output interface is used for exporting digital voltage to computer main board to be tested, and it connects adjustable resistance unit.
3, the proving installation of marginal voltage value according to claim 2 is characterized in that, described test card also comprises:
Holding circuit is used for the digital voltage of adjustable resistance unit output is carried out overcurrent and overvoltage protection, and it is connected between adjustable resistance unit and the output interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810029681A CN101634665A (en) | 2008-07-23 | 2008-07-23 | Marginal voltage value testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810029681A CN101634665A (en) | 2008-07-23 | 2008-07-23 | Marginal voltage value testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101634665A true CN101634665A (en) | 2010-01-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810029681A Pending CN101634665A (en) | 2008-07-23 | 2008-07-23 | Marginal voltage value testing device |
Country Status (1)
| Country | Link |
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| CN (1) | CN101634665A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103049360A (en) * | 2012-12-21 | 2013-04-17 | 西安华芯半导体有限公司 | Method for regulating power supply voltage applied to testing of memory module on mainboard |
| CN105738679A (en) * | 2016-01-29 | 2016-07-06 | 广东小天才科技有限公司 | Test data acquisition method used for mobile equipment and device and system thereof |
| CN106290994A (en) * | 2015-06-11 | 2017-01-04 | 鸿富锦精密工业(武汉)有限公司 | Card detection signal and signal detection system |
| CN112763893A (en) * | 2020-12-28 | 2021-05-07 | 南昌黑鲨科技有限公司 | Mainboard test system and method of intelligent terminal |
-
2008
- 2008-07-23 CN CN200810029681A patent/CN101634665A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103049360A (en) * | 2012-12-21 | 2013-04-17 | 西安华芯半导体有限公司 | Method for regulating power supply voltage applied to testing of memory module on mainboard |
| CN103049360B (en) * | 2012-12-21 | 2015-08-19 | 西安华芯半导体有限公司 | A kind of method of adjustment being applied to the supply voltage that memory modules is tested on mainboard |
| CN106290994A (en) * | 2015-06-11 | 2017-01-04 | 鸿富锦精密工业(武汉)有限公司 | Card detection signal and signal detection system |
| CN105738679A (en) * | 2016-01-29 | 2016-07-06 | 广东小天才科技有限公司 | Test data acquisition method used for mobile equipment and device and system thereof |
| CN112763893A (en) * | 2020-12-28 | 2021-05-07 | 南昌黑鲨科技有限公司 | Mainboard test system and method of intelligent terminal |
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Open date: 20100127 |