CN104734004A - Method and device for generating optical module temperature lookup table - Google Patents

Method and device for generating optical module temperature lookup table Download PDF

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Publication number
CN104734004A
CN104734004A CN201510135103.3A CN201510135103A CN104734004A CN 104734004 A CN104734004 A CN 104734004A CN 201510135103 A CN201510135103 A CN 201510135103A CN 104734004 A CN104734004 A CN 104734004A
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temperature
bias current
register value
value
spot
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CN104734004B (en
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陈彪
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Hisense Broadband Multimedia Technology Co Ltd
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Hisense Broadband Multimedia Technology Co Ltd
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Abstract

The invention discloses a method and device for generating an optical module temperature lookup table. The method comprises the steps of adjusting optical power and an extinction ratio which are output by a test optical module to preset target values, acquiring test temperature values, test bias current setting register values and test modulating current setting register values of temperature spots of the test optical module, conducting normalization processing on acquired current values, acquiring current normalized slope parameters of a temperature interval formed by the temperature spots, adjusting optical power and an extinction ratio which are output by an optical module to be applied to the preset target values, acquiring working temperature values, bias current setting register values and modulating current setting register values of the optical module to be applied under normal temperature environment, combining the current normalized slope parameters acquired in advance to generate a current temperature lookup table of the optical module to be applied, and writing the generated current temperature lookup table in the optical module to be applied. By means of the method and device for generating the optical module temperature lookup table, the efficiency for generating the optical module temperature lookup table can be improved.

Description

Generate method and the device of temperature lookup table of optical module
The divisional application of the application to be the denomination of invention proposed on 01 06th, 2013 be Chinese invention patent application 201310003863.X of " the generation method of temperature lookup table of optical module and device ".
Technical field
The present invention relates to optical communication technique, particularly relate to a kind of method and the device that generate temperature lookup table of optical module.
Background technology
Current domestic market and international market, the optical fiber communication direction of merging with multiple business with a large bandwidth and at a high rate has started application; In numerous solutions, the appearance of fiber to the home (FTTH, FiberTo The Home) is considered to the ultimate solution of broadband access, and domestic market is large-area applications.
Optical module is as the core component of FTTH in optical fiber telecommunications system, stablizing of optical module overall performance is directly relevant to the stable performance of optical fiber telecommunications system, and the light mouth performance of optical module transmitting terminal, the optical signal quality namely launched is again the key factor affecting optical fiber telecommunications system stable performance.
In the optical signal quality parameter that the light mouth affecting optical module transmitting terminal is launched, main it is considered that eye diagram quality, wherein, the principal element affecting eye diagram quality is average light power and extinction ratio, average light power and extinction ratio are supplied to the bias current of laser by the laser-driven chip in optical module and modulated current size determines, bias current is larger, and average light power is larger; When average light power is fixed, modulated current is larger, and extinction ratio is larger; On this basis, because laser is the device with temperature characterisitic, also need the temperature characterisitic considering device, for fixing bias current and modulated current, when the temperature decreases, luminous power can become large, and extinction ratio can reduce; When the temperature increases, luminous power can diminish, and extinction ratio can raise.
Optical module in actual applications, needs to remain in operating temperature range, and such as, the temperature range of business level application is 0 ~ 70 DEG C, and the temperature range of industrial scale applications is-40 ~ 85 DEG C.If the light mouth parameter of optical module transmitting terminal is unstable, such as, light eye pattern parameter fluctuation is comparatively large, all may cause receiving end None-identified, and then cause communication disruption.
In practical application, in order to the light mouth parameter of light stable module transmitting terminal, optical module transmitting terminal generally adopts closed-loop control, (APC is controlled by introducing luminous power automated power in optical module, AutomaticPower Control) loop, for regulating laser diode in bias current control circuit and backlight diode, APC loop is that an amount of negative feedback introduced by the bias current control circuit of transmitting terminal, by the backlight diode close with laser diode, the luminous power that coupling unit laser diode sends, produce the back facet current of feedback, thus make APC loop according to this feedback current and bias current, after compared with the reference value of setting, adjustment exports the bias current of light-emitting diode to, and then stable average light power.
In theory, backlight diode does not have temperature characterisitic, as long as namely the luminescence of laser diode is constant, and, the coupling coefficient of laser diode and backlight diode is constant, the feedback current (bias current) that backlight diode is supplied to APC loop is constant, but in practical application, laser diode and backlight diode are carried out the optical device of making a start encapsulated, i.e. light emission secondary module (TOSA, Transmitter Optical Subassembly), temperature influence, when laser diode launches constant optical power, if variations in temperature, the bias current that backlight diode exports also can change, and the change of bias current can affect the luminous power that laser diode is launched.Like this, APC loop will be caused when variation of ambient temperature, the luminous power that optical module is launched cannot be stabilized in set point; And if average light power change, extinction ratio also can change thereupon, and meanwhile, the change of temperature, also will affect the effect of modulating electric current.
In practical application, in APC loop, need the temperature according to optical module transmitting terminal, the modulated current of input laser diode is controlled, to make the light signal that laser diode transmitting power is constant.Thus, in prior art, in the software of optical module, by defining a temperature lookup table of optical module, according to the micro-control unit (MCU comprising temperature sensor, Micro Control Unit) observed temperature come bias current (APCset) value in compensating light module and modulated current (MODset) value, namely according to variations in temperature adjustment APCset, MODset, thus compensating light power and extinction ratio, the luminous power of optical module output optical signal and extinction ratio are stablized.Wherein,
APCset, MODset be correspondence one independently temperature lookup table of optical module respectively, when MCU monitors temperature change, according to the Current Temperatures that MCU monitors, APCset, MODset value that this current temperature spot is corresponding is searched in the temperature lookup table of optical module pre-set, and using the value that finds as current APCset, MODset set point, to control laser diode, thus the optical signal quality that light stable module is made a start.
The method of existing generation temperature lookup table of optical module, for each optical module, according to its operating temperature range, choose multiple working temperature point, at each working temperature point, record the MCU comprising temperature sensor and monitor the temperature obtained, regulate bias current and the modulated current of laser diode, the luminous power of the light signal launched to make laser diode and extinction ratio meet the numerical value pre-set simultaneously, and by monitor temperature corresponding for this working temperature point, and, the bias current that this working temperature point is corresponding and modulated current set-up register value write temperature lookup table of optical module, according to same mode, obtain bias current corresponding to each working temperature point and modulated current set-up register value, and write temperature lookup table of optical module.Like this, in the follow-up work of this optical module, the temperature obtained is monitored according to MCU, search temperature lookup table of optical module, obtain corresponding bias current and modulated current set-up register value, as the controling parameters of laser diode, thus the luminous power that laser diode is exported and extinction ratio constant, promote the stability of optical fiber telecommunications system.
From above-mentioned, the method of existing generation temperature lookup table of optical module, need the test each optical module carried out in operating temperature range, to be used for determining modulated current and the bias current sets value of corresponding check point in follow-up work, the temperature of optical module is adjusted to each working temperature point by usual employing high-low temperature chamber or air pressure gun, and from lifting/lowering temperature to optical module temperature stabilization, all need the time, thus, this routine generates the method for temperature lookup table of optical module, need for each optical module, required time is long, the efficiency generating temperature lookup table of optical module is low, the resources of production taken are many, be unfavorable for the raising of production line production efficiency.
Summary of the invention
The embodiment provides a kind of method generating temperature lookup table of optical module, improve the efficiency generating temperature lookup table of optical module.
Embodiments of the invention additionally provide a kind of device generating temperature lookup table of optical module, improve the efficiency generating temperature lookup table of optical module.
According to an aspect of the present invention, provide a kind of method generating temperature lookup table of optical module, comprising:
Dividing ambient temperature is in advance multiple temperature spot, and at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value;
The extinction ratio that adjustment test light module exports, to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot;
The test bias current sets register value obtained is normalized, obtains the temperature range bias current normalization Slope Parameters that each temperature spot is formed; The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed;
Adjust the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively;
According to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generate the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.
Wherein, the described test bias current sets register value to obtaining is normalized, and the temperature range bias current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
According to each temperature spot divided, form corresponding temperature range;
Obtain the test bias current sets register value pre-setting temperature spot;
Obtain the difference of the interval corresponding probe temperature value of each temperature spot;
Obtain the difference of the interval corresponding test bias current sets register value of each temperature spot;
Interval for each temperature spot, by the difference of the difference of the test bias current sets register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test bias current sets register value pre-setting temperature spot, obtain this temperature range bias current normalization Slope Parameters.
Wherein, the formula obtaining described bias current normalization Slope Parameters is:
k b = I bu - I bd T u - T d × 1 I bc
In formula,
K bfor bias current normalization Slope Parameters;
I bufor the test bias current sets register value that the interval ceiling temperature of temperature spot is corresponding;
I bdfor the test bias current sets register value that temperature spot interval limit temperature is corresponding;
T ufor the probe temperature value that the interval ceiling temperature of temperature spot is corresponding;
T dfor the probe temperature value that temperature spot interval limit temperature is corresponding;
I bcfor pre-setting the test bias current sets register value of temperature spot.
Wherein, the described test modulated current set-up register value to obtaining is normalized, and the temperature range modulated current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
According to each temperature spot divided, form corresponding temperature range;
Obtain the test modulated current set-up register value pre-setting temperature spot;
Obtain the difference of the interval corresponding probe temperature value of each temperature spot;
Obtain the difference of the interval corresponding test modulated current set-up register value of each temperature spot;
Interval for each temperature spot, by the difference of the difference of the test modulated current set-up register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test modulated current set-up register value pre-setting temperature spot, obtain this temperature range modulated current normalization Slope Parameters.
Wherein, the formula obtaining described modulated current normalization Slope Parameters is:
k m = I mu - I md T u - T d × 1 I mc
In formula,
K mfor modulated current normalization Slope Parameters;
I mufor the test modulated current set-up register value that the interval ceiling temperature of temperature spot is corresponding;
I mdfor the test modulated current set-up register value that temperature spot interval limit temperature is corresponding;
T ufor the probe temperature value that the interval ceiling temperature of temperature spot is corresponding;
T dfor the probe temperature value that temperature spot interval limit temperature is corresponding;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
Wherein, obtain each temperature spot formed temperature range bias current normalization Slope Parameters and modulated current normalization Slope Parameters after, described method comprises further:
Build the mapping relations of temperature spot and bias current normalization Slope Parameters, and, build the mapping relations of temperature spot and modulated current normalization Slope Parameters.
Wherein, described operating temperature value, bias current sets register value according to obtaining, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied comprises:
The temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
According to this slope value and bias current sets register value, calculate the bias current sets register value of other temperature spot in this temperature spot interval;
The bias current sets register value corresponding according to the interval bound temperature spot of this temperature spot and the bias current normalization Slope Parameters in adjacent temperature spot interval obtained in advance, calculate the bias current sets register value of each temperature spot in adjacent temperature spot interval, until calculate the bias current sets register value of each temperature range of this optical module to be applied, generate bias current temperature lookup table.
Wherein, in this temperature spot interval of described calculating, the formula of the bias current sets register value of other temperature spot is:
I bt=I bw-k b×(T w-T t)×I bc
In formula,
I btfor interval other work temperature inherent of temperature spot that working temperature is corresponding ttime bias current sets register value;
I bwfor the bias current sets register value that working temperature is corresponding;
K bfor the bias current normalization Slope Parameters in temperature spot interval corresponding to working temperature;
T wfor operating temperature value;
I bcfor pre-setting the test bias current sets register value of temperature spot.
Wherein, in described calculating adjacent temperature spot interval, the formula of the bias current sets register value of each temperature spot is:
I bt'=I bwu-k b'×(T w'-T t')×I bc
In formula,
I bt'for the interval inherent work temperature of adjacent temperature spot t'time bias current sets register value;
I bwufor the interval bias current sets register value corresponding with the intersection point temperature in adjacent temperature spot interval of temperature spot that working temperature is corresponding;
K b'for the bias current normalization Slope Parameters in adjacent temperature spot interval;
T w'for intersection point temperature value;
I bcfor pre-setting the test bias current sets register value of temperature spot.
Wherein, described operating temperature value, bias current sets register value according to obtaining, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied comprises:
The temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
Build the coordinate system of temperature and bias current sets register value, take temperature as abscissa, bias current sets register value is ordinate, with bias current sets register value corresponding to operating temperature value for basic point, with bias current normalization slope value corresponding to this operating temperature value for slope, build the interval straight line of temperature spot corresponding to this operating temperature value;
Obtain the bias current sets register value that the bound temperature spot of the straight line built is corresponding, with the interval corresponding bias current normalization slope value of adjacent temperature spot for slope, build the interval straight line of adjacent temperature spot, generate the bias current temperature lookup table represented with coordinate system.
Wherein, the described operating temperature value according to acquisition and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, the temperature range modulated current temperature lookup table generating this optical module to be applied comprises:
The temperature range modulated current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
According to this slope value and modulated current set-up register value, calculate the modulated current set-up register value of other temperature spot in this temperature spot interval;
The modulated current set-up register value corresponding according to the interval bound temperature spot of this temperature spot and the modulated current normalization Slope Parameters in adjacent temperature spot interval obtained in advance, calculate the modulated current set-up register value of each temperature spot in adjacent temperature spot interval, until calculate the modulated current set-up register value of each temperature range of this optical module to be applied, generate modulated current temperature lookup table.
Wherein, in this temperature spot interval of described calculating, the formula of the modulated current set-up register value of other temperature spot is:
I mt=I mw-k m×(T w-T t)×I mc
In formula,
I mtfor interval other work temperature inherent of temperature spot that working temperature is corresponding ttime modulated current set-up register value;
I mwfor the modulated current set-up register value that working temperature is corresponding;
K mfor the modulated current normalization Slope Parameters in temperature spot interval corresponding to working temperature;
T wfor operating temperature value;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
Wherein, in described calculating adjacent temperature spot interval, the formula of the modulated current set-up register value of each temperature spot is:
I mt'=I mwu-k m'×(T w'-T t')×I mc
In formula,
I mt'for the interval inherent work temperature of adjacent temperature spot t'time modulated current set-up register value;
I mwufor the interval modulated current set-up register value corresponding with the intersection point temperature in adjacent temperature spot interval of temperature spot that working temperature is corresponding;
K m'for the modulated current normalization Slope Parameters in adjacent temperature spot interval;
T w'for intersection point temperature value;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
Generate a device for temperature lookup table of optical module, this device comprises: test bias current acquisition module, test modulated current acquisition module, normalized module, application optical module electric current acquisition module and temperature lookup table generation module, wherein,
Test bias current acquisition module, be multiple temperature spot for dividing ambient temperature in advance, at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value;
Test modulated current acquisition module, for adjusting the extinction ratio of test light module output to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot;
Normalized module, for being normalized the test bias current sets register value obtained, obtains the temperature range bias current normalization Slope Parameters that each temperature spot is formed; The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed;
Application optical module electric current acquisition module, for adjusting the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively;
Temperature lookup table generation module, for according to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generates the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.
Preferably, described test bias current acquisition module comprises: temperature range division unit, probe temperature difference computational unit, test bias current difference computational unit, bias current normalization slope calculation unit SCU, test modulated current difference computational unit and modulated current normalization slope calculation unit SCU, wherein
Temperature range division unit, for according to each temperature spot divided, forms corresponding temperature range;
Probe temperature difference computational unit, for obtaining the difference of the interval corresponding probe temperature value of each temperature spot;
Test bias current difference computational unit, for the test bias current sets register value according to the set temperature point obtained, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
Bias current normalization slope calculation unit SCU, for interval for each temperature spot, by the difference of the difference of the test bias current sets register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test bias current sets register value pre-setting temperature spot, obtain this temperature range bias current normalization Slope Parameters;
Test modulated current difference computational unit, for according to the test modulated current set-up register value pre-setting temperature spot obtained, obtains the difference of the interval corresponding test modulated current set-up register value of each temperature spot;
Modulated current normalization slope calculation unit SCU, for interval for each temperature spot, by the difference of the difference of the test modulated current set-up register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test modulated current set-up register value pre-setting temperature spot, obtain this temperature range modulated current normalization Slope Parameters.
Preferably, described temperature lookup table generation module comprises: bias current normalization slope acquiring unit, bias current sets register value acquiring unit, bias current temperature lookup table generation unit, modulated current normalization slope acquiring unit, modulated current set-up register value acquiring unit and modulated current temperature lookup table generation unit, wherein
Bias current normalization slope acquiring unit, for inquiring about bias current normalization slope calculation unit SCU, obtains the bias current normalization slope value that operating temperature value is corresponding;
Bias current sets register value acquiring unit, for according to this slope value obtained and bias current sets register value corresponding to this working temperature, calculates the bias current sets register value of other temperature spot in this temperature spot interval;
Bias current temperature lookup table generation unit, for according to bias current sets register value corresponding to the interval bound temperature spot of this temperature spot and the bias current normalization Slope Parameters in adjacent temperature spot interval that obtains in advance, calculate the bias current sets register value of each temperature spot in adjacent temperature spot interval, until calculate the bias current sets register value of each temperature range of this optical module to be applied, generate bias current temperature lookup table;
Modulated current normalization slope acquiring unit, for inquiring about modulated current normalization slope calculation unit SCU, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
Modulated current set-up register value acquiring unit, for according to this slope value obtained and modulated current set-up register value corresponding to this working temperature, calculates the modulated current set-up register value of other temperature spot in this temperature spot interval;
Modulated current temperature lookup table generation unit, for according to modulated current set-up register value corresponding to the interval bound temperature spot of this temperature spot and the modulated current normalization Slope Parameters in adjacent temperature spot interval that obtains in advance, calculate the modulated current set-up register value of each temperature spot in adjacent temperature spot interval, until calculate the modulated current set-up register value of each temperature range of this optical module to be applied, generate modulated current temperature lookup table.
From above-mentioned, the method of the generation temperature lookup table of optical module of the embodiment of the present invention and device, the method comprises: dividing ambient temperature is in advance multiple temperature spot, at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value; The extinction ratio that adjustment test light module exports, to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot; The test bias current sets register value obtained is normalized, obtains the temperature range bias current normalization Slope Parameters that each temperature spot is formed; The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed; Adjust the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively; According to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generate the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.Like this, without the need to each optical module, all need test in operating temperature range, improve the efficiency generating temperature lookup table of optical module, reduce the time generated needed for temperature lookup table of optical module.
Accompanying drawing explanation
Fig. 1 is embodiment of the present invention APC loop control circuit structural representation.
Fig. 2 is the bias current of embodiment of the present invention laser triode and the schematic diagram of Output optical power and on-load voltage.
Fig. 3 is the modulating characteristic schematic diagram of embodiment of the present invention laser triode.
Fig. 4 is the method flow schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.
Fig. 5 is embodiment of the present invention normalization Slope Parameters schematic diagram.
Fig. 6 is the apparatus structure schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.
Embodiment
For making object of the present invention, technical scheme and advantage clearly understand, enumerate preferred embodiment referring to accompanying drawing, the present invention is described in more detail.But it should be noted that, the many details listed in specification are only used to make reader to have a thorough understanding, even if do not have these specific details also can realize these aspects of the present invention to one or more aspect of the present invention.
The term such as " module " used in this application, " system " is intended to comprise the entity relevant to computer, such as but not limited to hardware, firmware, combination thereof, software or executory software.Such as, module can be, but be not limited in: the thread of the process that processor runs, processor, object, executable program, execution, program and/or computer.For example, application program computing equipment run and this computing equipment can be modules.One or more module can be positioned at an executory process and/or thread, and module also and/or can be distributed on a computer between two or more platform computers.
The method of existing generation temperature lookup table of optical module, need each optical module, under the luminous power pre-set and extinction ratio situation, carry out the test in operating temperature range, to be used for determining follow-up modulated current and bias current sets value, required time efficiency that is long, that generate temperature lookup table of optical module is low.
In the embodiment of the present invention, consider the test in advance the optical module sample of some carried out in operating temperature range, obtain each bias current sets register value under predetermined luminous power and extinction ratio and modulated current set-up register value, be normalized, obtain the optical module probe temperature look-up table comprising working temperature and current value mapping relations, then, according to the test of optical module during normal temperature, obtain the modulated current of this optical module when this normal temperature and bias current sets value, and combine the optical module probe temperature look-up table obtained in advance, calculate, generate the temperature lookup table of this optical module, and be written in this optical module, thus make without the need to each optical module, all need test in operating temperature range, improve the efficiency generating temperature lookup table of optical module, reduce the time generated needed for temperature lookup table of optical module.
First the APC loop that the embodiment of the present invention relates to is described below.
Fig. 1 is embodiment of the present invention APC loop control circuit structural representation.See Fig. 1, this control circuit comprises: bias current circuit and modulated current circuit, wherein,
Modulated current circuit comprises: the first laser triode V1, the second laser triode V2 and the first resistance R1;
Bias current circuit comprises: the 3rd laser triode V3, the first amplifier amplifier A1, the second amplifier amplifier A2, the 3rd comparator A3, the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5 and inductance L 1, wherein,
The base stage of the first laser triode V1 accesses the first modulated current (MOD-), radio pole is extremely connected with the radio of the second laser triode V2, and access the voltage (VCC) pre-set, emitter is connected with the emitter of the second laser triode V2, and is connected with one end of the first resistance R1;
The base stage of the second laser triode V2 accesses the second modulated current (MOD+);
The other end ground connection of the first resistance R1;
The negative phase end of the first amplifier amplifier A1 is connected with one end of the second resistance R2, and positive terminal is connected with one end of the second resistance R2, and output is connected with the other end of the second resistance R2;
The negative phase end of the second amplifier amplifier A2 is connected with one end of the 3rd resistance R3, and positive terminal is connected with one end of the 4th resistance R4, and output is connected with the other end of the 3rd resistance R3;
One end of 4th resistance R4 is also connected with one end of inductance L 1, the other end ground connection of the 4th resistance R4, the other end access predetermined voltage of inductance L 1;
The negative phase end of the 3rd comparator A3 is connected with the output of the first amplifier amplifier A1, and positive terminal is connected with the output of the second amplifier amplifier A2, and output is connected with the base stage of the 3rd laser triode V3;
The emitter of the 3rd laser triode V3 is connected with one end of the 5th resistance R5, and collector electrode is connected with the collector electrode of the second laser triode V2;
The other end ground connection of the 5th resistance R5.
Second laser triode V2 is laser LD, and the first amplifier amplifier A1 is that backlight diode PD, PD are used for according to the power of induction luminosity, converts induction light signal to the corresponding signal of telecommunication, carries out amplifying, computing, obtains required modulation signal;
MOD+, MOD-are modulated current signal input, and Ibias is the bias current flowing through LD, and the size of this bias current determines the size of luminous power;
The setting voltage reference point that Vset (positive terminal of the 3rd comparator A3) is target light power;
After PD detects the output light of LD, the output optical signal of LD is amplified by amplifier amplifier A1, exports the inverting input to comparator A3 to, simultaneously, Vset reference voltage through adjusting is sent to the in-phase end of comparator A3, exports the 3rd comparator V3 after relatively to;
3rd comparator A3 and the 3rd laser triode V3 forms DC constant current power supply, regulate the bias current Ibias of LD, when LD Output optical power declines, PD exports reduction, and the end of oppisite phase input voltage of comparator A3 declines, comparator A3 output voltage rises, the base current of the 3rd laser triode V3 rises, so collector current Ibias rises, LD Output optical power increases, make PD export also corresponding increase, offset the decline of LD Output optical power.Otherwise then current Ib ias reduces, LD Output optical power declines.
Fig. 2 is the bias current of embodiment of the present invention laser triode and the schematic diagram of Output optical power and on-load voltage.See Fig. 2, abscissa is bias current, and ordinate is respectively Output optical power and on-load voltage.
Ith is the current threshold point of LD laser, when forward is carried in bias current on LD laser more than Ith, the luminous power of LD laser is negligible, and during more than Ith, the luminous power of LD laser increases obviously, and the size of Ibias and LD Output optical power is close to linear relationship.Along with the increasing of bias current Ibias, the voltage being loaded into LD laser two ends also can progressively increase.
If temperature raises, the Output optical power of LD can be made to reduce, such as, at high temperature, the Output optical power of same current Ib ias, LD can decrease, namely in fig. 2, as T1<T2, under same bias current, the Output optical power that T1 is corresponding is greater than Output optical power corresponding to T2.
Fig. 3 is the modulating characteristic schematic diagram of embodiment of the present invention laser triode.See Fig. 3, bias current Ibias determines the working point of LD laser, modulated current signal is loaded into the base stage of laser by Imod (MOD+, MOD-), Imod is an AC differential signal, and Ibias is a direct current signal, as shown in Figure 3, during by Ibias and Imod being loaded into laser two ends (base stage and radio pole), just obtain the signal that luminous intensity is modulated.
Fig. 4 is the method flow schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.See Fig. 4, this flow process comprises:
Step 401, dividing ambient temperature is in advance multiple temperature spot, at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value;
In this step, for conventional optical module, the ambient temperature residing for it generally in the temperature range of-40 DEG C ~ 85 DEG C, thus, getting ambient temperature is-40 DEG C ~ 85 DEG C, and this ambient temperature is divided into-40 DEG C ,-20 DEG C, 5 DEG C, 25 DEG C, 50 DEG C, 70 DEG C and 85 DEG C totally seven temperature spots.Certainly, in practical application, alternate manner also can be adopted to divide ambient temperature, such as, is temperature step dash time-sharing environment temperature with 5 DEG C.
Optical module in the course of the work, due to factor impacts such as luminescence, heatings, make temperature during its work not identical with ambient temperature, and temperature correlation when the characteristic of optical module utilizing emitted light signal (luminous power and extinction ratio) and work, thus, need to obtain when different ambient temperatures, the working temperature that optical module is corresponding, i.e. probe temperature.
Owing to being built-in with the MCU comprising temperature sensor in optical module, by the MCU sensing temperature comprising temperature sensor.
The 1# test light module that table 1 obtains for the embodiment of the present invention is at the probe temperature value of each temperature spot and test bias current sets register value parameter list.
Table 1
In table 1,
SN is the sequence number of test light module;
At probe temperature place field, second row value is temperature point value (-40 DEG C ~ 85 DEG C), the third line be test light module under relevant temperature point, the circuit board temperature that temperature sensor in MCU actual measurement circuit board obtains, i.e. probe temperature value, unit is DEG C;
At test bias current sets register value place field, second row value is temperature point value (-40 DEG C ~ 85 DEG C), the third line is that test light module is under relevant temperature point, when the luminous power that adjustment test light module exports is to the target light power pre-set, the test bias current sets register value obtained, without unit, the decimal system (Dec) is adopted to count.I.e. test light module each temperature spot of (-40 DEG C ~ 85 DEG C) under designated environment temperature conditions, the optical power adjustment exported by LD, to APCset register value during target light performance number-2.5 dBm (dBm), is decimal data.In practical application, the stated range minimum of this APCset register is 0, and maximum is 255.
Interval test sample 1# module, within the scope of ambient temperature-40 DEG C ~ 85 DEG C, get multiple probe temperature point, and optical power adjustment is adjusted to 6.5DB desired value to-2.5dBm, extinction ratio, bias current sets value APCset when recording each temperature spot and modulated current set point MODset.
Step 402, the extinction ratio that adjustment test light module exports, to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot;
In this step, can on the basis that step 401 obtains test bias current sets register value, regulate the extinction ratio of this test light module to the target extinction ratio pre-set, thus obtain the test modulated current set-up register value of test light module at this temperature spot; Also can be after step 401 obtains the test bias current sets register value of each temperature spot, again this test light module is placed in each temperature spot, and regulate the extinction ratio of this test light module to the target extinction ratio pre-set, thus obtain the test modulated current set-up register value of test light module at each temperature spot respectively.
The 1# test light module that table 2 obtains for the embodiment of the present invention is at the probe temperature value of each temperature spot and test modulation bias current sets register value parameter list.
Table 2
In table 2,
SN is the sequence number of test light module;
At probe temperature place field, second row value is temperature point value (-40 DEG C ~ 85 DEG C), the third line be test light module under relevant temperature point, the circuit board temperature that temperature sensor in MCU actual measurement circuit board obtains, i.e. probe temperature value, unit is DEG C;
At test modulated current set-up register value place field, second row value is temperature point value (-40 DEG C ~ 85 DEG C), the third line is that test light module is under relevant temperature point, when the extinction ratio that adjustment test light module exports is to the target extinction ratio pre-set, the test modulated current set-up register value obtained, without unit, the decimal system (Dec) is adopted to count.I.e. test light module each temperature spot of (-40 DEG C ~ 85 DEG C) under designated environment temperature conditions, the extinction ratio that LD exports being adjusted to MODset register value during target delustring ratio 6.5 decibels (DB), is decimal data.In practical application, the stated range minimum of this MODset register is 0, and maximum is 255.
In practical application, fixed bias current can be adopted to set reference point, light stable power is carried out by APC loop, and extinction ratio is stable, the write of temperature lookup table of optical module is then completed by triplet, such as, optical module is placed in respectively the low warm spot T1 of work, normal temperature point T2, work high temperature dot T3, adjustment modulated current, extinction ratio is made to be the desired value pre-set, if the modulated current set point that three temperature spots are corresponding is respectively A1, A2, A3, application program is automatically to { T1, T2, T3}, { A1, A2, A3} uses two polygometries, fit to modulated current set point-temperature curve, and then obtain the modulated current set point of temperature lookup table corresponding temperature point, and by look-up table data writing light module.
Step 403, is normalized the test bias current sets register value obtained, and obtains the temperature range bias current normalization Slope Parameters that each temperature spot is formed; The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed;
In this step, be normalized the test bias current sets register value obtained, the temperature range bias current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
A11, according to each temperature spot divided, forms corresponding temperature range;
In this step, as previously mentioned, if ambient temperature is divided into-40 DEG C ,-20 DEG C, 5 DEG C, 25 DEG C, 50 DEG C, 70 DEG C and 85 DEG C totally seven temperature spots, the temperature range then formed is respectively [-40,-20], [-20 ,-5], [5,25], [25,50], [50,70].
A12, obtains the test bias current sets register value pre-setting temperature spot;
In this step, preferably, pre-setting temperature spot is 25 DEG C.
A13, obtains the difference of the interval corresponding probe temperature value of each temperature spot;
In this step, each temperature spot is interval, corresponding two probe temperature values, and such as, for temperature range [-40 ,-20], corresponding probe temperature value interval is [-22.6 ,-2.72], then the difference of probe temperature value is 19.88.
A14, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
In this step, similar with steps A 13, each temperature spot is interval, corresponding two test bias current sets register values, such as, for temperature range [-40,-20], comprise two temperature spots, i.e. ceiling temperature point and lower limit temperature point, corresponding test bias current sets register value interval is [48,49], comprise test bias current sets register value corresponding to ceiling temperature point and test bias current sets register value corresponding to lower limit temperature point, then the difference of testing bias current sets register value is 1.
A15, interval for each temperature spot, by the difference of the difference of the test bias current sets register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test bias current sets register value pre-setting temperature spot, obtain this temperature range bias current normalization Slope Parameters.
In this step, the formula calculating bias current normalization Slope Parameters is:
k b = I bu - I bd T u - T d &times; 1 I bc
In formula,
K bfor bias current normalization Slope Parameters;
I bufor the test bias current sets register value that the interval ceiling temperature of temperature spot is corresponding;
I bdfor the test bias current sets register value that temperature spot interval limit temperature is corresponding;
T ufor the probe temperature value that the interval ceiling temperature of temperature spot is corresponding;
T dfor the probe temperature value that temperature spot interval limit temperature is corresponding;
I bcfor pre-setting the test bias current sets register value of temperature spot.
The each temperature spot interval corresponding bias current normalization Slope Parameters table of table 3 for calculating according to table 1.
Table 3
In table 3,
For the situation of ambient temperature more than more than 85 DEG C of optical module, its bias current normalization Slope Parameters can be given tacit consent to identical with the bias current normalization Slope Parameters in 70 ~ 85 DEG C of temperature spot intervals.
In table 3, process based on the test data of the table 1 of 1# module testing and table 2: according to normalization Slope Parameters computing formula, calculate the normalization slope of each temperature range of bias current APCset, modulated current MODset set point respectively.In the embodiment of the present invention, be normalized with set value during room temperature 25 DEG C.
Be normalized the test modulated current set-up register value obtained, the temperature range modulated current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
A21, according to each temperature spot divided, forms corresponding temperature range;
A22, obtains the test modulated current set-up register value pre-setting temperature spot;
In this step, preferably, pre-setting temperature spot is 25 DEG C.
A23, obtains the difference of the interval corresponding probe temperature value of each temperature spot;
A24, obtains the difference of the interval corresponding test modulated current set-up register value of each temperature spot;
A25, interval for each temperature spot, by the difference of the difference of the test modulated current set-up register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test modulated current set-up register value pre-setting temperature spot, obtain this temperature range modulated current normalization Slope Parameters.
In this step, the formula calculating modulated current normalization Slope Parameters is:
k m = I mu - I md T u - T d &times; 1 I mc
In formula,
K mfor modulated current normalization Slope Parameters;
I mufor the test modulated current set-up register value that the interval ceiling temperature of temperature spot is corresponding;
I mdfor the test modulated current set-up register value that temperature spot interval limit temperature is corresponding;
T ufor the probe temperature value that the interval ceiling temperature of temperature spot is corresponding;
T dfor the probe temperature value that temperature spot interval limit temperature is corresponding;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
The each temperature spot interval corresponding modulated current normalization Slope Parameters table of table 4 for calculating according to table 2.
Table 4
In table 4,
For the situation of ambient temperature more than more than 85 DEG C of optical module, its modulated current normalization Slope Parameters can be given tacit consent to identical with the modulated current normalization Slope Parameters in 70 ~ 85 DEG C of temperature spot intervals.
Preferably, after the bias current normalization Slope Parameters obtaining each temperature spot interval and modulated current normalization Slope Parameters, build the mapping relations of temperature spot and bias current normalization Slope Parameters, and, build the mapping relations of temperature spot and modulated current normalization Slope Parameters.Thus according to temperature spot, bias current normalization Slope Parameters corresponding to this temperature spot and modulated current normalization Slope Parameters can be obtained.
Fig. 5 is embodiment of the present invention normalization Slope Parameters schematic diagram.See Fig. 5, in figure, abscissa is ambient temperature, ordinate is bias current normalization Slope Parameters or modulated current normalization Slope Parameters, comprise seven temperature spot intervals, the interval corresponding normalization slope of each temperature spot, is respectively K1 ~ K7, wherein, ordinate is register value corresponding to 0 expression normalization Slope Parameters is 0, and ordinate is, 1 represents that register value corresponding to normalization Slope Parameters is 255.Normalization slope Trendline one is divided into 7 sections, and the slope of each section of normalization slope Trendline is known, thus, in subsequent applications, as long as obtain the offset (working temperature) of T temperature spot, just by point slope over 10 of normalization slope Trendline, the offset of whole Trendline can be derived.
Step 404, adjust the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively;
In this step, if need optical module to be placed in operating state, need in this optical module, write temperature range bias current normalization Slope Parameters and modulated current normalization Slope Parameters, to enable this optical module according to the change of working temperature, real-time adjustment bias current sets register value and modulated current set-up register value, thus maintain the constant of optical module luminous power and extinction ratio.
According to the method similar with step 401 and step 402, this optical module to be applied can be obtained in the bias current sets register value set under working temperature and modulated current set-up register value.
In the embodiment of the present invention, processing module sample 2#, under ambient temperature 30 DEG C of environment, by external program and MCU single chip communication, adjustment APCset, MODset Register Set value, obtain target light power-2.5dBm and extinction ratio 6.5DB, APCset, MODset Register Set value of this adjustment is respectively bias current sets register value under this setting working temperature and modulated current set-up register value.
Preferably, normal temperature environment is 25 DEG C or 30 DEG C.
Step 405, according to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generates the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.
In this step, according to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied comprises:
B11, the temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
In this step, from the bias current normalization Slope Parameters obtained in advance, the temperature spot that searching work temperature value is corresponding is interval, obtains the bias current normalization slope value in this interval.
B12, according to this slope value and bias current sets register value, calculates the bias current sets register value of other temperature spot in this temperature spot interval;
In this step, the formula calculating the bias current sets register value of other temperature spot in this temperature spot interval is:
I bt=I bw-k b×(T w-T t)×I bc
In formula,
I btfor interval other work temperature inherent of temperature spot that working temperature is corresponding ttime bias current sets register value;
I bwfor the bias current sets register value that working temperature is corresponding;
K bfor the bias current normalization Slope Parameters in temperature spot interval corresponding to working temperature;
T wfor operating temperature value;
I bcfor pre-setting the test bias current sets register value of temperature spot.
In the embodiment of the present invention, according to APCset, MODset set point under 30 degree of ambient temperatures obtained above, calculate by normalization slope is counter, obtain bias current APCset temperature lookup table data, modulated current MODset temperature lookup table data.Such as, as mentioned above, time under 30 degree of ambient temperatures, the temperature that MCU monitors is T1, after luminous power and extinction ratio adjust to desired value, APCset set point is now APCset1, MODset set point is MODset1, then use for reference table 3, table 4 and Fig. 5, if T1 is in the segmentation of K3, the then APCset of interior other temperature spots T2 of K3 segmentation, MODset offset is by as above formula acquisition, after being compensated value, on the basis obtaining temperature compensation table segmented compensation normalization slope, can be calculated by normalization slope, thus obtain the value of whole temperature range APCset compensation meter or MODset compensation meter, by PC program by the communication with MCU single-chip microcomputer, by the set point of each temperature spot of compensation meter write MCU software, complete modular debugging.
Like this, according to slope value and bias current sets register value, the bias current sets register value that in this temperature spot interval, each working temperature is corresponding can be calculated, thus avoid testing each temperature spot.
B13, the bias current sets register value corresponding according to the interval bound temperature spot of this temperature spot and the bias current normalization Slope Parameters in adjacent temperature spot interval obtained in advance, calculate the bias current sets register value of each temperature spot in adjacent temperature spot interval, until calculate the bias current sets register value of each temperature range of this optical module to be applied, generate bias current temperature lookup table.
In this step, the formula calculating the bias current sets register value of each temperature spot in adjacent temperature spot interval is:
I bt'=I bwu-k b'×(T w'-T t')×I bc
In formula,
I bt'for the interval inherent work temperature of adjacent temperature spot t'time bias current sets register value;
I bwufor the interval bias current sets register value corresponding with the intersection point temperature in adjacent temperature spot interval of temperature spot corresponding to working temperature, the ceiling temperature point in the temperature spot interval that namely working temperature is corresponding or bias current sets register value corresponding to lower limit temperature point;
K b'for the bias current normalization Slope Parameters in adjacent temperature spot interval;
T w'for intersection point temperature value;
I bcfor pre-setting the test bias current sets register value of temperature spot.
In practical application, according to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied can comprise:
B15, the temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
B16, build the coordinate system of temperature and bias current sets register value, take temperature as abscissa, bias current sets register value is ordinate, with bias current sets register value corresponding to operating temperature value for basic point, with bias current normalization slope value corresponding to this operating temperature value for slope, build the interval straight line of temperature spot corresponding to this operating temperature value;
B17, obtain the bias current sets register value that the bound temperature spot of the straight line built is corresponding, with the interval corresponding bias current normalization slope value of adjacent temperature spot for slope, build the interval straight line of adjacent temperature spot, generate the bias current temperature lookup table represented with coordinate system.
According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, the temperature range modulated current temperature lookup table generating this optical module to be applied comprises:
B21, the temperature range modulated current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
In this step, from modulated current normalization Slope Parameters, the temperature spot that searching work temperature value is corresponding is interval, obtains the slope value in this interval.
B22, according to this slope value and modulated current set-up register value, calculates the modulated current set-up register value of other temperature spot in this temperature spot interval;
In this step, the formula calculating the modulated current set-up register value of other temperature spot in this temperature spot interval is:
I mt=I mw-k m×(T w-T t)×I mc
In formula,
I mtfor interval other work temperature inherent of temperature spot that working temperature is corresponding ttime modulated current set-up register value;
I mwfor the modulated current set-up register value that working temperature is corresponding;
K mfor the modulated current normalization Slope Parameters in temperature spot interval corresponding to working temperature;
T wfor operating temperature value;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
Like this, according to slope value and modulated current set-up register value, the modulated current set-up register value that each working temperature in this temperature spot interval is corresponding can be calculated, thus obtain the modulated current normalization Slope Parameters in this temperature spot interval.
B23, the modulated current set-up register value corresponding according to the interval bound temperature spot of this temperature spot and the modulated current normalization Slope Parameters in adjacent temperature spot interval obtained in advance, calculate the modulated current set-up register value of each temperature spot in adjacent temperature spot interval, until calculate the modulated current set-up register value of each temperature range of this optical module to be applied, generate modulated current temperature lookup table.
In this step, the formula calculating the modulated current set-up register value of each temperature spot in adjacent temperature spot interval is:
I mt'=I mwu-k m'×(T w'-T t')×I mc
In formula,
I mt'for the interval inherent work temperature of adjacent temperature spot t'time modulated current set-up register value;
I mwufor the interval modulated current set-up register value corresponding with the intersection point temperature in adjacent temperature spot interval of temperature spot corresponding to working temperature, the ceiling temperature point in the temperature spot interval that namely working temperature is corresponding or modulated current set-up register value corresponding to lower limit temperature point;
K m'for the modulated current normalization Slope Parameters in adjacent temperature spot interval;
T w'for intersection point temperature value;
I mcfor pre-setting the test modulated current set-up register value of temperature spot.
Certainly, in practical application, according to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, the temperature range modulated current temperature lookup table generating this optical module to be applied also can comprise:
B25, the temperature range modulated current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
B26, take temperature as abscissa, modulated current set-up register value is the coordinate system that ordinate builds temperature and modulated current set-up register value, with modulated current set-up register value corresponding to operating temperature value for basic point, with modulated current normalization slope value corresponding to this operating temperature value for slope, build the interval straight line of temperature spot corresponding to this operating temperature value;
B27, obtain the modulated current set-up register value that the bound temperature spot of the straight line built is corresponding, with the interval corresponding modulated current normalization slope value of adjacent temperature spot for slope, build the interval straight line of adjacent temperature spot, generate the modulated current temperature lookup table represented with coordinate system.
Like this, obtaining the modulated current normalization Slope Parameters in adjacent temperature spot interval, again by the formula of the modulated current normalization Slope Parameters in adjacent temperature spot interval, the modulated current normalization Slope Parameters in interval next the adjacent temperature spot interval of adjacent temperature spot with this can be obtained, thus obtain the modulated current normalization Slope Parameters in all temperature spot intervals.Namely, when known compensation meter normalization slope and a normal temperature temperature spot set point, other temperature spot offsets can be extrapolated from formula.
Table 5 is the embodiment of the present invention by after the temperature lookup table of optical module writing light module that generates, and the temperature lookup table of optical module according to write controls optical module, the parameter signal table of the luminous power that the optical module obtained exports and extinction ratio.
Table 5
Temperature spot/DEG C -40 -20 -5 0 25 50 70 85
Luminous power/dBm -2.4 -2.46 -2.45 -2.49 -2.51 -2.5 -2.45 -2.42
Extinction ratio/DB 6.44 6.52 6.56 6.61 6.69 6.63 6.58 6.61
In table 5,
Optical module is under the ambient temperature of setting, such as, under multiple temperature spots in-40 DEG C ~ 85 DEG C, working temperature corresponding under obtaining ambient temperature by MCU, search temperature lookup table of optical module, obtain bias current corresponding to this working temperature and modulated current, thus the luminous power of optical module and extinction ratio are controlled, make it stable.
From table 5, the test value of luminous power and extinction ratio is all close to target setting: luminous power-2.5dBm, extinction ratio 6.5DB, shows that the method for embodiment of the present invention generation temperature lookup table of optical module is feasible.
From above-mentioned, the method of the generation temperature lookup table of optical module of the embodiment of the present invention, based on P-I curve and the temperature characterisitic of optical module laser diode, obtain each bias current sets register value under predetermined luminous power and extinction ratio and modulated current set-up register value in advance, process in conjunction with mathematics method for normalizing, obtain electric current normalization Slope Parameters, in subsequent applications, according to optical module bias current sets register value at normal temperatures and modulated current set-up register value, utilize the electric current normalization Slope Parameters obtained in advance, calculate the current value under each temperature spot, thus generate temperature lookup table and writing light module, effectively to control bias current sets and the modulated current setting of optical module, make bias current and modulated current in optical module operating temperature range, luminous power and extinction ratio meet instructions for use.Like this, in the generative process of temperature lookup table, for each optical module, only need to carry out normal temperature to test, low temperature when saving existing employing conventional method and high temperature test resource, improve the efficiency generating temperature lookup table of optical module, reduce the time generated needed for temperature lookup table of optical module, reduce optical module production cost simultaneously; Further, avoid optical module low temperature, high temperature test, effectively save process time, reduce the resources of production and take; And, by new work flow, simplify optical module production process.
Fig. 6 is the apparatus structure schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.See Fig. 6, this device comprises: test bias current acquisition module, test modulated current acquisition module, normalized module, application optical module electric current acquisition module and temperature lookup table generation module, wherein,
Test bias current acquisition module, be multiple temperature spot for dividing ambient temperature in advance, at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value;
Test modulated current acquisition module, for adjusting the extinction ratio of test light module output to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot;
Normalized module, for being normalized the test bias current sets register value obtained, obtains the temperature range bias current normalization Slope Parameters that each temperature spot is formed; The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed;
Application optical module electric current acquisition module, for adjusting the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively;
Temperature lookup table generation module, for according to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generates the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.
Wherein, test bias current acquisition module comprises: temperature range division unit, probe temperature difference computational unit, test bias current difference computational unit, bias current normalization slope calculation unit SCU, test modulated current difference computational unit and modulated current normalization slope calculation unit SCU (not shown), wherein
Temperature range division unit, for according to each temperature spot divided, forms corresponding temperature range;
Probe temperature difference computational unit, for obtaining the difference of the interval corresponding probe temperature value of each temperature spot;
Test bias current difference computational unit, for the test bias current sets register value according to the set temperature point obtained, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
Bias current normalization slope calculation unit SCU, for interval for each temperature spot, by the difference of the difference of the test bias current sets register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test bias current sets register value pre-setting temperature spot, obtain this temperature range bias current normalization Slope Parameters;
Test modulated current difference computational unit, for according to the test modulated current set-up register value pre-setting temperature spot obtained, obtains the difference of the interval corresponding test modulated current set-up register value of each temperature spot;
Modulated current normalization slope calculation unit SCU, for interval for each temperature spot, by the difference of the difference of the test modulated current set-up register value in this temperature spot interval divided by probe temperature value, again with the reciprocal multiplication of test modulated current set-up register value pre-setting temperature spot, obtain this temperature range modulated current normalization Slope Parameters.
Temperature lookup table generation module comprises: bias current normalization slope acquiring unit, bias current sets register value acquiring unit, bias current temperature lookup table generation unit, modulated current normalization slope acquiring unit, modulated current set-up register value acquiring unit and modulated current temperature lookup table generation unit (not shown), wherein
Bias current normalization slope acquiring unit, for inquiring about bias current normalization slope calculation unit SCU, obtains the bias current normalization slope value that operating temperature value is corresponding;
Bias current sets register value acquiring unit, for according to this slope value obtained and bias current sets register value corresponding to this working temperature, calculates the bias current sets register value of other temperature spot in this temperature spot interval;
Bias current temperature lookup table generation unit, for according to bias current sets register value corresponding to the interval bound temperature spot of this temperature spot and the bias current normalization Slope Parameters in adjacent temperature spot interval that obtains in advance, calculate the bias current sets register value of each temperature spot in adjacent temperature spot interval, until calculate the bias current sets register value of each temperature range of this optical module to be applied, generate bias current temperature lookup table;
Modulated current normalization slope acquiring unit, for inquiring about modulated current normalization slope calculation unit SCU, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
Modulated current set-up register value acquiring unit, for according to this slope value obtained and modulated current set-up register value corresponding to this working temperature, calculates the modulated current set-up register value of other temperature spot in this temperature spot interval;
Modulated current temperature lookup table generation unit, for according to modulated current set-up register value corresponding to the interval bound temperature spot of this temperature spot and the modulated current normalization Slope Parameters in adjacent temperature spot interval that obtains in advance, calculate the modulated current set-up register value of each temperature spot in adjacent temperature spot interval, until calculate the modulated current set-up register value of each temperature range of this optical module to be applied, generate modulated current temperature lookup table.
In the embodiment of the present invention, bias current temperature lookup table and modulated current temperature lookup table can be merged, obtain temperature lookup table.
One of ordinary skill in the art will appreciate that all or part of step realized in above-described embodiment method is that the hardware that can carry out instruction relevant by program has come, this program can be stored in a computer read/write memory medium, as: ROM/RAM, magnetic disc, CD etc.
The above is only the preferred embodiment of the present invention; it should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention; can also make some improvements and modifications, these improvements and modifications also should be considered as protection scope of the present invention.

Claims (14)

1. generate a method for temperature lookup table of optical module, the method comprises:
Dividing ambient temperature is in advance multiple temperature spot, and at each temperature spot, the luminous power that adjustment test light module exports, to the target light power pre-set, obtains test light module at the probe temperature value of temperature spot and test bias current sets register value;
The extinction ratio that adjustment test light module exports, to the target extinction ratio pre-set, obtains the test modulated current set-up register value of test light module at each temperature spot;
Be normalized the test bias current sets register value obtained, obtain the temperature range bias current normalization Slope Parameters that each temperature spot is formed, wherein, the formula obtaining described bias current normalization Slope Parameters is: , in this formula, for bias current normalization Slope Parameters; for the test bias current sets register value that temperature range ceiling temperature is corresponding; for the test bias current sets register value that temperature range lower limit temperature is corresponding; for the probe temperature value that temperature range ceiling temperature is corresponding; for the probe temperature value that temperature range lower limit temperature is corresponding; for pre-setting the test bias current sets register value of temperature spot;
The test modulated current set-up register value obtained is normalized, obtains the temperature range modulated current normalization Slope Parameters that each temperature spot is formed;
Adjust the luminous power of optical module to be applied output to the target light power pre-set, and, the extinction ratio exported, to the target extinction ratio pre-set, obtains the operating temperature value of this optical module to be applied under normal temperature environment, bias current sets register value and modulated current set-up register value respectively;
According to the operating temperature value, the bias current sets register value that obtain, in conjunction with the bias current normalization Slope Parameters obtained in advance, generate the bias current temperature lookup table of this optical module to be applied; According to the operating temperature value obtained and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, generate the modulated current temperature lookup table of this optical module to be applied, and the bias current temperature lookup table of generation and modulated current temperature lookup table are write this optical module to be applied.
2. the method for claim 1, wherein the described test bias current sets register value to obtaining is normalized, and the temperature range bias current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
According to each temperature spot divided, form corresponding temperature range;
Obtain the test bias current sets register value pre-setting temperature spot;
Obtain the difference of probe temperature value corresponding to each temperature range;
Obtain the difference of test bias current sets register value corresponding to each temperature range;
For each temperature range, by the difference of the difference of the test bias current sets register value of this temperature range divided by probe temperature value, again with the reciprocal multiplication of test bias current sets register value pre-setting temperature spot, obtain this temperature range bias current normalization Slope Parameters.
3. the method for claim 1, wherein the described test modulated current set-up register value to obtaining is normalized, and the temperature range modulated current normalization Slope Parameters obtaining the formation of each temperature spot comprises:
According to each temperature spot divided, form corresponding temperature range;
Obtain the test modulated current set-up register value pre-setting temperature spot;
Obtain the difference of probe temperature value corresponding to each temperature range;
Obtain the difference of test modulated current set-up register value corresponding to each temperature range;
For each temperature range, by the difference of the difference of the test modulated current set-up register value of this temperature range divided by probe temperature value, again with the reciprocal multiplication of test modulated current set-up register value pre-setting temperature spot, obtain this temperature range modulated current normalization Slope Parameters.
4. the formula the method for claim 1, wherein obtaining described modulated current normalization Slope Parameters is:
In formula,
for modulated current normalization Slope Parameters;
for the test modulated current set-up register value that temperature range ceiling temperature is corresponding;
for the test modulated current set-up register value that temperature range lower limit temperature is corresponding;
for the probe temperature value that temperature range ceiling temperature is corresponding;
for the probe temperature value that temperature range lower limit temperature is corresponding;
for pre-setting the test modulated current set-up register value of temperature spot.
5. the method as described in any one of Claims 1-4, wherein, obtain each temperature spot formed temperature range bias current normalization Slope Parameters and modulated current normalization Slope Parameters after, described method comprises further:
Build the mapping relations of temperature spot and bias current normalization Slope Parameters, and, build the mapping relations of temperature spot and modulated current normalization Slope Parameters.
6. method as claimed in claim 5, wherein, described operating temperature value, bias current sets register value according to obtaining, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied comprises:
The temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
According to this slope value and bias current sets register value, calculate the bias current sets register value of other temperature spot in this temperature range;
The bias current sets register value corresponding according to this temperature range bound temperature spot and the bias current normalization Slope Parameters of adjacent temperature range obtained in advance, calculate the bias current sets register value of each temperature spot in adjacent temperature range, until calculate the bias current sets register value of each temperature range of this optical module to be applied, generate bias current temperature lookup table.
7. method as claimed in claim 6, wherein, in this temperature range of described calculating, the formula of the bias current sets register value of other temperature spot is:
In formula,
for temperature range other working temperature inherent that working temperature is corresponding time bias current sets register value;
for the bias current sets register value that working temperature is corresponding;
for the bias current normalization Slope Parameters of temperature range corresponding to working temperature;
for operating temperature value;
for pre-setting the test bias current sets register value of temperature spot.
8. method as claimed in claim 7, wherein, in the adjacent temperature range of described calculating, the formula of the bias current sets register value of each temperature spot is:
In formula,
for the inherent working temperature of adjacent temperature range time bias current sets register value;
for the bias current sets register value that the temperature range that working temperature is corresponding is corresponding with the intersection point temperature of adjacent temperature range;
for the bias current normalization Slope Parameters of adjacent temperature range;
for intersection point temperature value;
for pre-setting the test bias current sets register value of temperature spot.
9. method as claimed in claim 5, wherein, described operating temperature value, bias current sets register value according to obtaining, in conjunction with the bias current normalization Slope Parameters obtained in advance, the bias current temperature lookup table generating this optical module to be applied comprises:
The temperature range bias current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the bias current normalization slope value that this operating temperature value is corresponding;
Build the coordinate system of temperature and bias current sets register value, take temperature as abscissa, bias current sets register value is ordinate, with bias current sets register value corresponding to operating temperature value for basic point, with bias current normalization slope value corresponding to this operating temperature value for slope, build the temperature range straight line that this operating temperature value is corresponding;
Obtain the bias current sets register value that the bound temperature spot of the straight line built is corresponding, with bias current normalization slope value corresponding to adjacent temperature range for slope, build the interval straight line of adjacent temperature spot, generate the bias current temperature lookup table represented with coordinate system.
10. method as claimed in claim 5, wherein, the described operating temperature value according to acquisition and modulated current set-up register value, in conjunction with the modulated current normalization Slope Parameters obtained in advance, the temperature range modulated current temperature lookup table generating this optical module to be applied comprises:
The temperature range modulated current normalization Slope Parameters that each temperature spot that inquiry obtains in advance is formed, obtains the modulated current normalization slope value that this operating temperature value is corresponding;
According to this slope value and modulated current set-up register value, calculate the modulated current set-up register value of other temperature spot in this temperature range;
The modulated current set-up register value corresponding according to this temperature range bound temperature spot and the modulated current normalization Slope Parameters of adjacent temperature range obtained in advance, calculate the modulated current set-up register value of each temperature spot in adjacent temperature range, until calculate the modulated current set-up register value of each temperature range of this optical module to be applied, generate modulated current temperature lookup table.
11. methods as claimed in claim 10, wherein, in this temperature range of described calculating, the formula of the modulated current set-up register value of other temperature spot is:
In formula,
for temperature range other working temperature inherent that working temperature is corresponding time modulated current set-up register value;
for the modulated current set-up register value that working temperature is corresponding;
for the modulated current normalization Slope Parameters of temperature range corresponding to working temperature;
for operating temperature value;
for pre-setting the test modulated current set-up register value of temperature spot.
12. methods as claimed in claim 10, wherein, in the adjacent temperature range of described calculating, the formula of the modulated current set-up register value of each temperature spot is:
In formula,
for the inherent working temperature of adjacent temperature range time modulated current set-up register value;
for the modulated current set-up register value that the temperature range that working temperature is corresponding is corresponding with the intersection point temperature of adjacent temperature range;
for the modulated current normalization Slope Parameters of adjacent temperature range;
for intersection point temperature value;
for pre-setting the test modulated current set-up register value of temperature spot.
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