CN104729718B - A kind of processing system and method for infrared imaging system NETD - Google Patents
A kind of processing system and method for infrared imaging system NETD Download PDFInfo
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Abstract
The present invention relates to a kind of processing system and method for infrared imaging system NETD, this method includes parameter setting module, data acquisition module, image display, state display module, NETD computing modules, storage module etc., parameter setting module is used for setting the temperature value of calibrated radiation source, the times N of collection and random pixel number M, data acquisition module and storage module are used for completing collection and the store function of data, computing module mainly completes gathered data average gray, mean square noise, NETD calculating, state display module is used to show current running status, image display is used to show current gray level image, present invention, avoiding use complicated NETD test equipments and professional operator, it can be obtained by the noise equivalent temperature difference of infrared imaging system.
Description
Technical field
The invention belongs to infrared imaging system testing field, it is related to a kind of for infrared imaging system NETD (noise equivalents
The temperature difference) processing system and method.
Background technology
The performance parameter of laboratory evaluation infrared imaging system, is divided into two classes：That is subjective performance parameter, they are by seeing
The person of examining is obtained by eye-observation, including minimum resolvable temperature difference (MRTD) and minimum detectable temperature difference (MDTD)；It is another kind of
It is objective performance parameter, it is obtained by actinometry or electric parameter measurement, has the parameter of reflection signal transfer characteristic (as believed
Number transmission, spectrum transmission, geometry transmission, the response of strong signal, LF-response, system time response), reflection optical transfer characteristic
Parameter (such as modulation transfer function, phase transfer function), reflect noise equivalent characteristic parameter (such as noise equivalent temperature difference NETD,
Spatial non-uniformity) etc..NETD (noise equivalent temperature difference) is the important objective evaluation index of thermal imaging system sensitivity, be can be used for
The detection range of small temperature difference point target is predicted, so as to realize conversion of the technical indicator to tactics index.MRTD is thermal imaging system
Sensitivity and the subjective assessment standard of resolution ratio.NETD and MRTD is the topmost performance evaluation parameters of current thermal imaging system,
Because the MRTD four bar targets tested on eye-observation monitor are completed.The shadow of easy tested person people's subjective factor in test process
Ring.It must be carried out by the several personnel Jing Guo professional training.Thus more approved as the NETD of objective examination's parameter.
When NETD is system observation test pattern, the peak signal that reference electronic filter output is produced is made an uproar with root mean square
Acoustic ratio be 1 when standard test images on black matrix target and background the temperature difference.According to definition, NETD measured equation is：
In formula, Δ T is the temperature difference of target and background；Vs is signal voltage value；Vn is root mean square noise.
At present, NETD acquisition pattern has two kinds, and one kind is theoretical calculation, and another entered using special test equipment
Row system testing.Shown in the formula such as formula (2) that wherein theoretical calculation is used：
In formula：F is optical system F numbers；AdFor the area of single pixel；τdFor the residence time of detector；τaIt is saturating for air
Cross rate；τ0For optical transmittance；D*For detector spectrum detectivity；Δ M/ Δs T is differential radiancy.Because this method is related to
Numerous parameters of system transmission characteristic, so a kind of simply theoretic computational methods, still have certain with actual measurement
Error.
The use of the measuring method of special test equipment is that infrared imaging system is placed in effective image-forming range, using flat
Row light pipe, black matrix, target, image data processing software are tested, and Fig. 2 is exactly the composition frame chart of special test equipment, this side
Method is real measuring method, but the special test equipment of needs and tester and enough spaces, particularly infrared
In the case that imaging system volume is larger, test is bothered very much, and flexibility is not strong.
The content of the invention
Present invention solves the technical problem that being：Overcome prior art not enough, propose a kind of for infrared imaging system noise
The processing system and method for equivalent temperature difference, find a kind of new noise equivalent temperature difference between theoretical calculation and special test equipment
Method of testing, the noise equivalent temperature difference for calculating infrared imaging system that can be authentic and valid do not need special test again
Survey standby, can just be completed in laboratory.So as to realize its flexibility, versatility.
The present invention includes following technical scheme：One kind is used for infrared imaging system NETD (noise equivalent temperature difference) processing system
System and method, including parameter setting module, data acquisition module, image display, state display module, NETD calculate mould
Block, storage module；
Parameter setting module, for setting the temperature value of calibrated radiation source, systemic resolution, times of collection N, stochastical sampling
The number M of point；
When parameter setting module by calibrated radiation source temperature setting be T1, to treat state display module displays temperature stable to T1
Afterwards, gather the two-dimensional image data of first group of n times radiation source and be stored in storage module, while being shown in image display
The gray level image of first group of n times radiation source；
The view data of first group of n times radiation source of data collecting module collected, and according to the figure of first group of n times radiation source
As the first group of n times radiation source calculated in data view data stochastical sampling point M in a certain pixel average gray value Vs1
With mean square noise Vn1, current operation is then repeated, until M stochastical sampling point average gray value and mean square noise are calculated,
And shown by state display module；
When calibrated radiation source temperature setting is T2, and T2 ＞ T1 by parameter setting module, state display module display temperature is treated
Degree is stablized to T2, and the two-dimensional image data for gathering second group of n times radiation source is simultaneously stored in storage module, while aobvious in image
Show that module shows the gray level image of second group of n times radiation source；
The view data of second group of n times radiation source of data collecting module collected, and according to the figure of second group of n times radiation source
As the second group of n times radiation source calculated in data view data stochastical sampling point M in a certain pixel average gray value Vs2
With mean square noise Vn2, current operation is then repeated, until M stochastical sampling point average gray value and mean square noise are calculated,
And shown by state display module；
NETD computing modules, according to noise equivalent temperature difference calculation formula NETD=△ T/ (△ Vs/ △ Vn), calculate this with
△ T are T2-T1 value in the noise equivalent temperature difference of machine sampled point, formula, and △ Vs are Vs2-Vs1 value, and △ Vn are Vn2-Vn1's
Value；
The NETD of M stochastical sampling point is averaged, is exactly the NETD of system, and shows final result of calculation.
One kind is used for infrared imaging system NETD (noise equivalent temperature difference) processing method, comprises the following steps：
(1) be T1 by calibrated radiation source temperature setting, times of collection is set to N, the number of stochastical sampling point is set to M；
(2) after two-dimensional image data and the storage for after temperature stabilization to T1, gathering n times radiation source；
(3) view data of the n times radiation source preserved by step (2), the picture number of calculation procedure (2) n times radiation source
According to the average gray value Vs1 and mean square noise Vn1 of a certain pixel in M sampled point, current operation is then repeated, until calculating
Go out M stochastical sampling point average gray value and mean square noise；
(4) it is T2, and T2 ＞ T1 by calibrated radiation source temperature setting, after after temperature stabilization to T2, collection n times radiation source
View data is simultaneously stored；
(5) view data of the n times radiation source preserved by step (4), the picture number of calculation procedure (4) n times radiation source
According to the average gray value Vs2 and mean square noise Vn2 of a certain pixel in M sampled point, current operation is then repeated, until calculating
Go out M stochastical sampling point average gray value and mean square noise；
(6) according to noise equivalent temperature difference calculation formula NETD=△ T/ (△ Vs/ △ Vn), the noise of the sampled point is calculated
△ T are T2-T1 value in equivalent temperature difference, formula, and △ Vs are Vs2-Vs1 value, and △ Vn are Vn2-Vn1 value；
(7) NETD of multi-point sampling is averaged, obtains the noise equivalent temperature difference NETD of infrared imaging system to be measured.
The N is that 0 to 128, M is 0 to 32, can improve arithmetic speed, can effectively reduce statistical error again, improves and surveys
Try precision.
Compared with the prior art, the invention has the advantages that：
(1) method of testing of infrared imaging system noise equivalent temperature difference is mainly come using large-scale special test equipment at present
Measurement, such as U.S. SBIR, EOI companies, HGH companies of France, the test product of CI companies of Israel are, it is necessary to special software for calculation
And special test site and professional operator etc., and testing cost is higher, the present invention does not need special test site
And professional operator, it is only necessary to the blackbody radiation source of standard can be completed in laboratory, and extra cost is not needed substantially.
(2) present invention is derived in the definition of noise equivalent temperature difference, passes through effective demarcation of black-body reference
And the flexible selection of random point, particularly multiple spot is averaged, can effectively reduce error, result of calculation is more nearly noise
The actual value of equivalent temperature difference.
(3) present invention is compared with complicated theoretical calculation, with operability and authenticity, because theoretical calculation needs to relate to
And to parameters such as atmospheric transmittance, differential radiancy, be required for just providing under given conditions, be largely certain condition
Under valuation, this just brings very big error to theoretical calculation, so reference when theoretical calculation can only be system design.
(4) algorithm of the invention is simple, easy to use, it is not necessary to which professional training is just operable, is more suitable for promoting and answers
With.
Brief description of the drawings
Fig. 1 is used for the workflow diagram of infrared imaging system noise equivalent temperature difference computational methods for the present invention；
Fig. 2 is large-scale dedicated testing platform；
Fig. 3 is test platform of the present invention；
Fig. 4 is NETD computing systems composition frame chart of the present invention.
Embodiment
Just the specific implementation of the present invention is further described with reference to accompanying drawing below：
The present invention proposes a kind of processing system and method for infrared imaging system NETD (noise equivalent temperature difference), the party
Method is in the current existing method of testing of abundant contrast, by constantly summarizing and putting into practice what is drawn.In order to be able to which preferably completion is made an uproar
The calculating of sound equivalent temperature difference, it is necessary to build a set of test platform, the platform specifically include standard black body radiation source, focal plane subassembly,
Image capturing system, its composition frame chart is as shown in Figure 3.
Fig. 4 is NETD processing systems composition frame chart of the present invention, and it includes parameter setting module, data acquisition module, image
Display module, state display module, NETD computing modules, storage module.
Parameter setting module includes resolution ratio setting, sampling number N settings, stochastical sampling point number M settings, temperature setting
The resolution ratio for being used for setting current infrared imaging system, form are set Deng, its intermediate-resolution：x×y；Times of collection N, which is set, to be used for
Each temperature value number of times to be gathered is set；Stochastical sampling number M, which is set, to be used for setting the pixel number currently to be gathered, and is set
After the completion of system can select the random pixels of M, such as pixel 6, pixel 9, pixel 33 etc. automatically；Temperature setting, which is used for setting, to be worked as
Before the temperature value to be gathered.State display module can show whether the temperature of setting is stablized simultaneously, by data acquisition after stable
Module is acquired to current temperature, and image display shows current gray level image, and M are directly calculated after the completion of collection
The average gray value and mean square noise of stochastical sampling point, and be stored in storage module and result of calculation is shown by state display module,
Aforesaid operations are repeated once, finally by NETD computing modules by taking the average value of M collection point to draw infrared imaging system
NETD, and show in state display module result of calculation.
The specific workflow of the present invention is as shown in Figure 1：
When parameter setting module by calibrated radiation source temperature setting be T1, to treat state display module displays temperature stable to T1
Afterwards, gather the two-dimensional image data of first group of n times radiation source and be stored in storage module, while being shown in image display
The gray level image of first group of n times radiation source；
The view data of first group of n times radiation source of data collecting module collected, and according to the figure of first group of n times radiation source
As the first group of n times radiation source calculated in data view data stochastical sampling point M in a certain pixel average gray value Vs1
With mean square noise Vn1, current operation is then repeated, until M stochastical sampling point average gray value and mean square noise are calculated,
And shown by state display module:
If different images data same point (i, j) (0<i≤x,0<J≤y) gray value be respectively Vs1ijT1、Vs2ijT1、
Vs3ijT1…VsNijT1, calculate view data in certain point (i, j) average gray value and mean square noise be respectively：
When calibrated radiation source temperature setting is T2, and T2 ＞ T1 by parameter setting module, state display module display temperature is treated
Degree is stablized to T2, and the two-dimensional image data for gathering second group of n times radiation source is simultaneously stored in storage module, while aobvious in image
Show that module shows the gray level image of second group of n times radiation source；
The view data of second group of n times radiation source of data collecting module collected, and according to the figure of second group of n times radiation source
As the second group of n times radiation source calculated in data view data stochastical sampling point M in a certain pixel average gray value Vs2
With mean square noise Vn2, current operation is then repeated, until M stochastical sampling point average gray value and mean square noise are calculated,
And shown by state display module:
If the gray value of different images data same point (i, j) is respectively Vs1ijT2、Vs2ijT2、Vs3ijT2…VsNijT2, meter
The average gray value and mean square noise of certain point (i, j) are respectively in calculation view data：
Then, the noise equivalent temperature difference of the point is calculated, and is shown in state display module：
Finally, the noise equivalent temperature difference for calculating M difference is averaged the noise equivalent temperature difference of the system of obtaining and is：
Wherein NETDij、NETDkh、NETDuvIt is the noise equivalent temperature difference of difference, and 0<i≤x,0<j≤y；0<k≤x,0
<h≤y；0<u≤x,0<v≤y.
In the processing method of the above-mentioned noise equivalent temperature difference for infrared imaging system, N is 0 to 128 integer, M
For 0 to 32 integer.
It is described above, it is only the optimal embodiment of the present invention, but this bright protection domain is not limited thereto, and is appointed
What those familiar with the art is in the technical scope of this bright exposure, the variations and alternatives that can be readily occurred in, and all should
It is included within the scope of the present invention.
Unspecified part of the present invention belongs to general knowledge as well known to those skilled in the art.
Claims (3)
1. a kind of processing system for infrared imaging system NETD, it is characterised in that：Including parameter setting module, data acquisition
Module, image display, state display module, NETD computing modules, storage module；
Parameter setting module, for setting the temperature value of calibrated radiation source, systemic resolution, times of collection N, stochastical sampling point
Number M；
When parameter setting module by calibrated radiation source temperature setting for T1, after state display module displays temperature stabilization is to T1,
Gather the two-dimensional image data of first group of n times radiation source and be stored in storage module, while showing in image display
The gray level image of one group of n times radiation source；
The view data of first group of n times radiation source of data collecting module collected, and according to the picture number of first group of n times radiation source
According to the average gray value Vs1 of a certain pixel in M stochastical sampling point of the view data of first group of n times radiation source of middle calculating
With mean square noise Vn1, current operation is then repeated, until M stochastical sampling point average gray value and mean square noise are calculated,
And shown by state display module；
When calibrated radiation source temperature setting is T2, and T2 ＞ T1 by parameter setting module, treat that state display module displays temperature is steady
Determine to T2, the two-dimensional image data for gathering second group of n times radiation source is simultaneously stored in storage module, while showing mould in image
Block shows the gray level image of second group of n times radiation source；
The view data of second group of n times radiation source of data collecting module collected, and according to the picture number of second group of n times radiation source
According to a certain pixel in the view data stochastical sampling point M of second group of n times radiation source of middle calculating average gray value Vs2 and
Square noise Vn2, then repeats current operation, until calculating M stochastical sampling point average gray value and mean square noise, and leads to
State display module is crossed to be shown；
NETD computing modules, according to noise equivalent temperature difference calculation formula NETD=△ T/ (△ Vs/ △ Vn), calculate this and adopt at random
△ T are T2-T1 value in the noise equivalent temperature difference of sampling point, formula, and △ Vs are Vs2-Vs1 value, and △ Vn are Vn2-Vn1 value；
The NETD of M stochastical sampling point is averaged, is exactly the NETD of system, and shows final result of calculation.
2. a kind of processing method for infrared imaging system NETD, it is characterised in that：Comprise the following steps：
(1) be T1 by calibrated radiation source temperature setting, times of collection is set to N, the number of stochastical sampling point is set to M；
(2) after two-dimensional image data and the storage for after temperature stabilization to T1, gathering n times radiation source；
(3) view data of the n times radiation source preserved by step (2), the view data of calculation procedure (2) n times radiation source M
The average gray value Vs1 and mean square noise Vn1 of a certain pixel, then repeat current operation in sampled point, until calculating M
Stochastical sampling point average gray value and mean square noise；
(4) it is T2, and T2 ＞ T1 by calibrated radiation source temperature setting, after after temperature stabilization to T2, gathers the image of n times radiation source
Data are simultaneously stored；
(5) view data of the n times radiation source preserved by step (4), the view data of calculation procedure (4) n times radiation source M
The average gray value Vs2 and mean square noise Vn2 of a certain pixel, then repeat current operation in sampled point, until calculating M
Stochastical sampling point average gray value and mean square noise；
(6) according to noise equivalent temperature difference calculation formula NETD=△ T/ (△ Vs/ △ Vn), the noise equivalent of the sampled point is calculated
△ T are T2-T1 value in the temperature difference, formula, and △ Vs are Vs2-Vs1 value, and △ Vn are Vn2-Vn1 value；
(7) NETD of multi-point sampling is averaged, obtains the noise equivalent temperature difference NETD of infrared imaging system to be measured.
3. a kind of processing method for infrared imaging system NETD as claimed in claim 2, it is characterised in that：The step
(5) N span is 0 in<N≤128, M span is 0<M≤32, can improve arithmetic speed, can effectively subtract again
Small statistical error, improves measuring accuracy.
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Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106323901A (en) * | 2016-10-09 | 2017-01-11 | 北京理工大学 | MDTD (Minimum Detectable Temperature Difference)-based performance evaluation method for infrared-imaging gas leakage detection system |
| CN107421717B (en) * | 2017-07-03 | 2020-08-07 | 中国电力科学研究院 | Method and device for automatically testing minimum detectable temperature difference of infrared imager |
| CN107864347B (en) * | 2017-10-27 | 2020-07-28 | 天津津航技术物理研究所 | Statistical method for noise of preprocessing circuit of infrared TDI detector |
| CN108871587A (en) * | 2018-07-31 | 2018-11-23 | 电子科技大学 | The Intelligent target device and its application method of thermal infrared imager NETD test |
| CN109060144A (en) * | 2018-08-24 | 2018-12-21 | 电子科技大学 | The method that thermal infrared imager NETD is tested automatically |
| CN110095192B (en) * | 2019-04-26 | 2020-10-20 | 南京理工大学 | Thermal infrared imager comprehensive performance parameter testing system and method thereof |
| CN110095193B (en) * | 2019-05-14 | 2021-03-12 | 武汉高芯科技有限公司 | Thermal infrared imager noise equivalent temperature difference testing method and system |
| CN111076819B (en) * | 2019-12-04 | 2021-11-02 | 中国航空工业集团公司洛阳电光设备研究所 | Test method for noise equivalent temperature difference device of infrared thermal imager with ultra-large field of view |
| CN114383736B (en) * | 2021-12-23 | 2023-10-24 | 北京市遥感信息研究所 | Infrared remote sensing satellite temperature resolution assessment method and device based on intersection |
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