CN104702211B - Solar cell spring testing probe - Google Patents
Solar cell spring testing probe Download PDFInfo
- Publication number
- CN104702211B CN104702211B CN201410333359.0A CN201410333359A CN104702211B CN 104702211 B CN104702211 B CN 104702211B CN 201410333359 A CN201410333359 A CN 201410333359A CN 104702211 B CN104702211 B CN 104702211B
- Authority
- CN
- China
- Prior art keywords
- probe
- spring
- solar cell
- contact
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000523 sample Substances 0.000 title claims abstract description 73
- 238000012360 testing method Methods 0.000 title claims abstract description 48
- -1 aluminium copper-nickel Chemical compound 0.000 claims description 5
- 230000003139 buffering effect Effects 0.000 claims description 5
- 229910000906 Bronze Inorganic materials 0.000 claims description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 239000010974 bronze Substances 0.000 claims description 4
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims description 4
- 238000005452 bending Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000007774 longterm Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000005489 elastic deformation Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 241001191009 Gymnomyza Species 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a solar cell spring testing probe and relates to matching members for solar cell testing, in particular to a probe member for testing electrical performance of solar cell. The solar cell spring testing probe sequentially comprises a connecting head, a spring portion and a contact from top to bottom, the connecting head, the spring portion and the contact are of an integral structure, the spring portion is a S-like spring, and the contact is linear. The connecting head, the spring portion and the contact are designed to be of the integral structure, the connecting head is fixed inside a testing device, and the spring portion and the contact are compressed through the testing device to realize testing. Due to the integral structure, production cost is lowered, jamming between the spring and the contact is reduced, the solar cell spring testing probe is less prone to being damaged and high in practicability, and testing resistance and light shading area are reduced.
Description
Technical field
The present invention relates to solar cell built-in testing counterpart, more particularly to a kind of solar battery sheet electrical property is surveyed
The probe part of examination.
Background technology
Increasingly increase with society to energy demand, and attention and support of the country to green energy resource, solar cell
Industry get up by vigorous growth, during manufacture of solar cells, it is necessary to which the various electrical properties to cell piece are examined
Survey, such as, it is necessary to gather the current-voltage information that cell piece is produced under certain illumination condition when photovoltaic cell IV is tested；
And in electroluminescent defects detection, need to power up cell piece again and test.To the collection of cell piece electric signal or add at present
Electricity, is all to contact main gate line on cell piece using testing needle, and existing test probe is mostly by probe set, spring, probe
Three parts constitute, and its concrete structure is that one end of probe is movably arranged in probe set, and between probe and probe set
Spring is provided with, probe set is pushed during test, by the main gate line on press contacts cell piece under probe set drive probe, and in spring
It is in close contact under thrust, the current and voltage signals that cell piece is produced are transferred to computer by test probe and connecting line
In, and then on the one hand spring plays a role in promoting between probe and probe set, on the other hand plays cushioning effect.But mesh
Preceding conventional measurement sounds out pin and there is following defect：
1. production cost is high；Conventional measurement test point is made up of probe set, spring and the part of probe three, the element of this three part
It is complex in assembling process to have certain requirement to the accuracy of product, it is necessary to manpower processing is combined, increased and be produced into
This.
2. it is easily damaged；It is that spring makees bullet core inside conventional measurement test point, because spring is arranged on probe and probe set
Between, by being susceptible to elastic deformation after long-term pushing, cause the phenomenon that gets stuck between probe and probe set, once hair
The raw phenomenon that gets stuck, will damage the main gate line on cell piece by pressure, damage cell piece, it is necessary to change probe.
3. service life is short；Due to being slidably connected between probe set and probe, therefore by after long-term use,
Abrasion is produced between probe set inwall and probe outer wall, the phenomenon of loose contact can be caused, test series resistance unstable,
So as to influence FF measuring accuracies, disturbed test result.
4. resistance is big；In IV tests, the electric current and voltage for being tested battery are smaller, but electricity in traditional test probe structure
Stream is conductive by probe, spring, probe, and each element can all have resistance, can cause the loss of electric current and voltage, so as to lead
Send a telegraph stream cannot precise acquisition, unpredictable influence is caused on test result, it is impossible to reach the purpose of accurate measurement.
5. shading-area is big.In IV tests, directly over cell piece, light can be crushed on the survey on cell piece to xenon lamp
Examination knife and test probe block a part.Due in probe set spring can not possibly it is meticulous, therefore conventional probe diameter be difficult it is small
In 1mm, probe set can be bigger, which dictates that test knife can not be too thin, so that shading-area is larger, this is to needing accurate measurement
It is very unfavorable for IV data.
The content of the invention
The present invention is directed to propose a kind of simple structure, resistance is small, can meet the test probe of excellent test performance.
Solar cell flat spring of the present invention tests probe, connector, spring is sequentially provided with from top to bottom and is touched
Head, the connector, spring and contact are structure as a whole；Wherein spring is class S-shaped spring, and contact is linear.
Preferably, two inner bending ends of the class S-shaped kink are respectively equipped with a buffering ring.
Preferably, the connector for linear or class "" shape.
Further, the probe is made up of phosphor bronze or aluminium copper-nickel alloy silk.
Further, the connector of the probe, spring and contact are with the cylindric of equal diameter.
It is highly preferred that a diameter of 0.2-0.6mm of the probe.
Further, a diameter of 0.5mm of the probe.
Solar cell flat spring of the present invention tests probe, because connector, spring and contact are integral type knot
Structure is designed, therefore only needs to be fixed on connector in test device, when test device presses cell piece by probe, spring
Portion can play effective cushioning effect, and the probe structure of integral type of the present invention has advantages below：1st, in production process
In can be reduced because assembling causes human cost with one-shot forming, production cost is also reduced to several maos by several yuans, by
A large amount of in testing equipment middle probe use, therefore significantly reduce production cost；2nd, probe is integrally flexible, it is to avoid spring and
The phenomenon that gets stuck between contact, reduces the damage of mesuring battary piece, when going out spring and now distorting, is also easy to repair；3rd, avoid
Skimming wear between probe set and probe, material will not produce fatigue point in long-term repetition is pushed, even if using 5,000,000
After secondary, resulting data are still stablized, and probe is almost without elastic deformation；4th, the element of the connection of probe is reduced, is reduced
Resistivity, improves the precision of test data；5th, from the angle observation overlooked, screening of the test resistance on cell piece is reduced
Light area, with significant test effect.
Brief description of the drawings
Fig. 1 is the front view of embodiment 1.
Fig. 2 is the front view of embodiment 2.
Fig. 3 is the front view of embodiment 3.
1- connectors in figure；2- spring；3- contacts；4- buffering rings.
Specific embodiment
Embodiment 1
Solar cell flat spring of the present invention tests probe, and linear connector 1, spring is sequentially provided with from top to bottom
Portion 2 and contact 3, the linear connector 1, spring 2 and contact 3 are structure as a whole；The spring 2 is class S-shaped spring,
Contact 3 is linear；A buffering ring 4 is respectively equipped with the inside of two bending ends of class S-shaped spring.Probe described in the present embodiment
Linear connector 1, spring 2 and contact 3 are with the cylindric of equal diameter, and its a diameter of 0.5mm.This implementation
The example probe is made up of phosphor bronze probe or aluminium copper-nickel alloy silk, and phosphor bronze probe or aluminium copper-nickel alloy silk probe have good crushing resistance
Can, prevent material from producing fatigue point.Class S-shaped spring of the present invention instead of original spring structure, connector 1 and contact 3 it
Between serve good cushioning effect, buffering ring 4 effectively enhances the shock-absorbing capacity of spring, prevents spring under pressure
Deform upon.
When using, probe is arranged in test device, adjusts good position, be directed at the main gate line of cell piece, filled by test
Put and push, the contact 3 of probe is touched the data such as the main gate line of cell piece, the Current Voltage of cell piece and pass through probe collection
Afterwards, it is sent in other test devices.
Embodiment 2
The present embodiment is substantially the same manner as Example 1, difference be connector 1 described in the present embodiment for class "" shape
Connector 1, probe can be articulated in test device using the connector 1 of the shape, and fixed, hung described in the present embodiment
Binding structure has more preferable convenience than linear structure described in embodiment 1 in terms of installation and fixation.
Embodiment 3
The present embodiment is essentially identical with embodiment 1 or 2, and difference is that spring 2 has multigroup described in the present embodiment, many
Group spring 2 has more preferable shock-absorbing capacity, and elasticity is stronger, and protection solar battery sheet that can be more favourable prevents it from being pressed
It is bad.
Claims (6)
1. solar cell flat spring tests probe, it is characterised in that：Connector is sequentially provided with from top to bottom（1）, spring（2）
And contact（3）, the connector（1）, spring（2）And contact（3）It is structure as a whole；Wherein spring（2）It is class S-shaped bullet
Spring, contact（3）For linear, two inner bending ends of the class S-shaped spring are respectively equipped with a buffering ring（4）.
2. solar cell flat spring as claimed in claim 1 tests probe, it is characterised in that：The connector（1）For straight
Wire or class "" shape.
3. solar cell flat spring as claimed in claim 2 tests probe, it is characterised in that：The probe is by phosphor bronze
Or aluminium copper-nickel alloy silk is made.
4. solar cell flat spring as claimed in claim 3 tests probe, it is characterised in that：The connector of the probe
（1）, spring（2）And contact（3）It is with the cylindric of equal diameter.
5. solar cell flat spring as claimed in claim 4 tests probe, it is characterised in that：The probe it is a diameter of
0.2-0.6mm。
6. solar cell flat spring as claimed in claim 5 tests probe, it is characterised in that：The probe it is a diameter of
0.5mm。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410333359.0A CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410333359.0A CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104702211A CN104702211A (en) | 2015-06-10 |
| CN104702211B true CN104702211B (en) | 2017-05-24 |
Family
ID=53349041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410333359.0A Active CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104702211B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106603005A (en) * | 2016-11-30 | 2017-04-26 | 浙江创盛光能源有限公司 | Grounding voltage withstand insulation integrated testing method of photovoltaic component |
| CN107478872A (en) * | 2017-09-01 | 2017-12-15 | 浙江德清众鑫盛五金弹簧有限公司 | A kind of spring tests probe |
| US10938342B2 (en) * | 2018-04-25 | 2021-03-02 | Kyoshin Electric Co., Ltd. | Probe and solar battery cell measurement apparatus |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294552A (en) * | 1994-04-26 | 1995-11-10 | Onishi Denshi Kk | Continuity inspection jig for printed-wiring board |
| CN2494510Y (en) * | 2001-06-18 | 2002-06-05 | 陈淑女 | Probe |
| WO2004068692A2 (en) * | 2003-01-24 | 2004-08-12 | High Connection Density, Inc. | Low inductance electrical contacts and lga connector system |
| CN2681141Y (en) * | 2003-12-12 | 2005-02-23 | 陈东汉 | Probe improvement for composite fixture |
| CN101122614A (en) * | 2006-08-10 | 2008-02-13 | 李诺工业有限公司 | Test probe and manufacturing method thereof |
| CN202975076U (en) * | 2012-12-18 | 2013-06-05 | 英利能源（中国）有限公司 | Solar cell module defect tester and probe thereof |
| JP2013190270A (en) * | 2012-03-13 | 2013-09-26 | Nidec-Read Corp | Probe and connection jig |
| CN203645626U (en) * | 2013-10-21 | 2014-06-11 | 陕西师范大学 | Contact-pressure type solar cell I-V characteristic test probe station |
| CN203951438U (en) * | 2014-07-14 | 2014-11-19 | 陕西众森电能科技有限公司 | Solar cell flat spring test probe |
-
2014
- 2014-07-14 CN CN201410333359.0A patent/CN104702211B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294552A (en) * | 1994-04-26 | 1995-11-10 | Onishi Denshi Kk | Continuity inspection jig for printed-wiring board |
| CN2494510Y (en) * | 2001-06-18 | 2002-06-05 | 陈淑女 | Probe |
| WO2004068692A2 (en) * | 2003-01-24 | 2004-08-12 | High Connection Density, Inc. | Low inductance electrical contacts and lga connector system |
| CN2681141Y (en) * | 2003-12-12 | 2005-02-23 | 陈东汉 | Probe improvement for composite fixture |
| CN101122614A (en) * | 2006-08-10 | 2008-02-13 | 李诺工业有限公司 | Test probe and manufacturing method thereof |
| JP2013190270A (en) * | 2012-03-13 | 2013-09-26 | Nidec-Read Corp | Probe and connection jig |
| CN202975076U (en) * | 2012-12-18 | 2013-06-05 | 英利能源（中国）有限公司 | Solar cell module defect tester and probe thereof |
| CN203645626U (en) * | 2013-10-21 | 2014-06-11 | 陕西师范大学 | Contact-pressure type solar cell I-V characteristic test probe station |
| CN203951438U (en) * | 2014-07-14 | 2014-11-19 | 陕西众森电能科技有限公司 | Solar cell flat spring test probe |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104702211A (en) | 2015-06-10 |
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| GR01 | Patent grant |