CN104702211A - Solar cell spring testing probe - Google Patents
Solar cell spring testing probe Download PDFInfo
- Publication number
- CN104702211A CN104702211A CN201410333359.0A CN201410333359A CN104702211A CN 104702211 A CN104702211 A CN 104702211A CN 201410333359 A CN201410333359 A CN 201410333359A CN 104702211 A CN104702211 A CN 104702211A
- Authority
- CN
- China
- Prior art keywords
- probe
- spring
- solar cell
- contact
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 75
- 238000012360 testing method Methods 0.000 title claims abstract description 50
- -1 aluminium copper-nickel Chemical compound 0.000 claims description 5
- 229910000906 Bronze Inorganic materials 0.000 claims description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 239000010974 bronze Substances 0.000 claims description 4
- 230000003139 buffering effect Effects 0.000 claims description 4
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims description 4
- 238000005452 bending Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 230000000694 effects Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 2
- 230000005489 elastic deformation Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a solar cell spring testing probe and relates to matching members for solar cell testing, in particular to a probe member for testing electrical performance of solar cell. The solar cell spring testing probe sequentially comprises a connecting head, a spring portion and a contact from top to bottom, the connecting head, the spring portion and the contact are of an integral structure, the spring portion is a S-like spring, and the contact is linear. The connecting head, the spring portion and the contact are designed to be of the integral structure, the connecting head is fixed inside a testing device, and the spring portion and the contact are compressed through the testing device to realize testing. Due to the integral structure, production cost is lowered, jamming between the spring and the contact is reduced, the solar cell spring testing probe is less prone to being damaged and high in practicability, and testing resistance and light shading area are reduced.
Description
Technical field
The present invention relates to solar cell built-in testing counterpart, particularly a kind of solar battery sheet electrical property carries out the probe part tested.
Background technology
Along with society is to the increase day by day of energy demand, with country to the attention of green energy resource and support, solar cell industry vigorous growth is got up, in manufacture of solar cells process, must detect the various electrical properties of cell piece, such as when photovoltaic cell IV tests, need the current-voltage information that collection cell piece produces under certain illumination condition; And when electroluminescence defects detection, need again to add electrical testing to cell piece.At present to the collection of the cell piece signal of telecommunication or power up, all utilize testing needle to contact main gate line on cell piece, and existing test probe is mostly by probe set, spring, probe three part forms, its concrete structure is movably arranged in probe set by one end of probe, and between probe and probe set, be provided with spring, probe set is pressed down during test, by the main gate line on press contacts cell piece under probe set drive probe, and under spring thrust effect close contact, the current and voltage signals that cell piece produces is transferred in computer through test probe head and connecting line, then spring plays a role in promoting on the one hand between probe and probe set, play cushioning effect on the other hand.But there is following defect in traditional test probe at present:
1. production cost is high; Traditional test pin by probe set, spring and probe three part form, the element of this three part is comparatively complicated in assembling process, need manpower process combination, have certain requirement to the accuracy of product, add production cost.
2. easily damage; Traditional test pin inside is that spring makees bullet core, because spring is arranged between probe and probe set, easily elastic deformation is there is after long-term pressing down, cause the phenomenon that gets stuck between probe and probe set, the phenomenon once get stuck, the main gate line on cell piece will be damaged by pressure, damage cell piece, must probe be changed.
3. useful life is short; Due between probe set and probe for what be slidably connected, therefore after Long-Time Service, produce between probe set inwall and probe outer wall and wear and tear, the phenomenon of loose contact can be caused, series resistance is tested unstable, thus affect FF measuring accuracy, disturbed test result.
4. resistance is large; In IV test, electric current and the voltage of tested battery are less, but electric current is by probe, spring, probe conduction in traditional test probe structure, each element all can have resistance, all can cause the loss of electric current and voltage, thus cause electric current cannot precise acquisition, unpredictable impact is caused on test result, the object accurately measured cannot be reached.
5. shading-area is large.In IV test, xenon lamp is directly over cell piece, and light can be crushed on test cutter on cell piece and test probe blocks a part.Because the spring in probe set can not be meticulous, therefore conventional probe diameter is difficult to be less than 1mm, and probe set can be larger, which dictates that test cutter can not be too thin, thus shading-area is comparatively large, and this is concerning very unfavorable the IV data needing accurately to measure.
Summary of the invention
It is simple that the present invention is intended to propose a kind of structure, and resistance is little, can meet the test probe of excellent test performance.
Solar cell flat spring test probe of the present invention, be provided with connector, spring and contact successively from top to bottom, described connector, spring and contact are structure as a whole; Wherein spring is class S shape spring, and contact is linearity.
Preferably, two inner bending ends of described class S shape kink are respectively equipped with a buffering ring.
Preferably, described connector be linearity or class "? " shape.
Further, described probe is made up of phosphor bronze or aluminium copper-nickel alloy silk.
Further, the connector of described probe, spring and contact are and have the cylindric of equal diameter.
More preferably, the diameter of described probe is 0.2-0.6mm.
Further, the diameter of described probe is 0.5mm.
Solar cell flat spring test probe of the present invention, due to connector, spring and contact are integral type structural design, therefore connector is only needed to be fixed in testing apparatus, when testing apparatus presses cell piece by probe, spring can play effective cushioning effect, the probe structure of integral type of the present invention, there is following advantage: 1, in process of production can one-shot forming, decrease because assembling causes human cost, production cost has also been reduced to a few mao by a few yuan, due to a large amount of uses of checkout equipment middle probe, therefore production cost is significantly reduced, 2, probe entirety is pliable and tough, avoids the phenomenon that gets stuck between spring and contact, reduces the damage of mesuring battary sheet, when going out spring now distortion, is also easy to repair, 3, avoid the skimming wear between probe set and probe, material can not produce fatigue point in repeating for a long time to press down, even if after using 5,000,000 times, the data obtained still are stablized, and probe does not almost have elastic deformation, 4, decrease the element of the connection of probe, reduce resistivity, improve the precision of test data, 5, from the angle views overlooked, decrease the shading-area of test resistance on cell piece, have and test effect significantly.
Accompanying drawing explanation
Fig. 1 is the front view of embodiment 1.
Fig. 2 is the front view of embodiment 2.
Fig. 3 is the front view of embodiment 3.
1-connector in figure; 2-spring; 3-contact; 4-buffering ring.
Embodiment
Embodiment 1
Solar cell flat spring test probe of the present invention, is provided with linearity connector 1, spring 2 and contact 3 from top to bottom successively, and described linearity connector 1, spring 2 and contact 3 are structure as a whole; Described spring 2 is class S shape spring, and contact 3 is linearity; A buffering ring 4 is respectively equipped with in the inner side of two bending ends of class S shape spring.The linearity connector 1 of probe described in the present embodiment, spring 2 and contact 3 are has the cylindric of equal diameter, and its diameter is 0.5mm.Probe described in the present embodiment is made up of phosphor bronze probe or aluminium copper-nickel alloy silk, and phosphor bronze probe or aluminium copper-nickel alloy silk probe have good compressive property, prevents material from producing fatigue point.Class S shape spring of the present invention instead of original spring structure, and between connector 1 and contact 3, serve good cushioning effect, buffering ring 4 effectively enhances the shock-absorbing capacity of spring, prevents spring under pressure deformation occurring.
During use, probe is arranged on testing apparatus, regulates position, aim at the main gate line of cell piece, pressed down by testing apparatus, make the contact 3 of probe touch the main gate line of cell piece, the data such as the current/voltage of cell piece, by after probe collection, are sent on other testing apparatuss.
Embodiment 2
The present embodiment is substantially the same manner as Example 1, difference to be described in the present embodiment connector 1 for class "? " the connector 1 of shape, utilize the connector 1 of this shape can be articulated on testing apparatus by probe, and fixing, hanging structure described in the present embodiment than linear structure described in embodiment 1 installation and fixing in there is better convenience.
Embodiment 3
The present embodiment is substantially identical with embodiment 1 or 2, and difference is that described in the present embodiment, spring 2 has many groups, and many group spring 2 have better shock-absorbing capacity, and elasticity is stronger, and protection solar battery sheet that can be more favourable, prevents it from being damaged by pressure.
Claims (7)
1. solar cell flat spring test probe, is characterized in that: be provided with connector (1), spring (2) and contact (3) from top to bottom successively, and described connector (1), spring (2) and contact (3) are structure as a whole; Wherein spring (2) is class S shape spring, and contact (3) is linearity.
2. solar cell flat spring test probe as claimed in claim 1, is characterized in that: two inner bending ends of described class S shape spring are respectively equipped with a buffering ring (4).
3. solar cell flat spring test probe as claimed in claim 1 or 2, is characterized in that: described connector (1) for linearity or class "? " shape.
4. solar cell flat spring test probe as claimed in claim 3, is characterized in that: described probe is made up of phosphor bronze or aluminium copper-nickel alloy silk.
5. solar cell flat spring test probe as claimed in claim 4, is characterized in that: the connector (1) of described probe, spring (2) and contact (3) are has the cylindric of equal diameter.
6. solar cell flat spring test probe as claimed in claim 5, is characterized in that: the diameter of described probe is 0.2-0.6mm.
7. solar cell flat spring test probe as claimed in claim 6, is characterized in that: the diameter of described probe is 0.5mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410333359.0A CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410333359.0A CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104702211A true CN104702211A (en) | 2015-06-10 |
| CN104702211B CN104702211B (en) | 2017-05-24 |
Family
ID=53349041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410333359.0A Active CN104702211B (en) | 2014-07-14 | 2014-07-14 | Solar cell spring testing probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104702211B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106603005A (en) * | 2016-11-30 | 2017-04-26 | 浙江创盛光能源有限公司 | Grounding voltage withstand insulation integrated testing method of photovoltaic component |
| CN107478872A (en) * | 2017-09-01 | 2017-12-15 | 浙江德清众鑫盛五金弹簧有限公司 | A kind of spring tests probe |
| CN110401412A (en) * | 2018-04-25 | 2019-11-01 | 共进电机株式会社 | Probe and solar battery cell measuring device |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07294552A (en) * | 1994-04-26 | 1995-11-10 | Onishi Denshi Kk | Continuity inspection jig for printed-wiring board |
| CN2494510Y (en) * | 2001-06-18 | 2002-06-05 | 陈淑女 | Probe |
| US6846184B2 (en) * | 2003-01-24 | 2005-01-25 | High Connection Density Inc. | Low inductance electrical contacts and LGA connector system |
| CN2681141Y (en) * | 2003-12-12 | 2005-02-23 | 陈东汉 | Probe improvement for composite fixture |
| KR100810044B1 (en) * | 2006-08-10 | 2008-03-05 | 리노공업주식회사 | A apparatus and method of contact probe |
| JP2013190270A (en) * | 2012-03-13 | 2013-09-26 | Nidec-Read Corp | Probe and connection jig |
| CN202975076U (en) * | 2012-12-18 | 2013-06-05 | 英利能源（中国）有限公司 | Solar cell module defect tester and probe thereof |
| CN203645626U (en) * | 2013-10-21 | 2014-06-11 | 陕西师范大学 | Contact-pressure type solar cell I-V characteristic test probe station |
| CN203951438U (en) * | 2014-07-14 | 2014-11-19 | 陕西众森电能科技有限公司 | Solar cell flat spring test probe |
-
2014
- 2014-07-14 CN CN201410333359.0A patent/CN104702211B/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106603005A (en) * | 2016-11-30 | 2017-04-26 | 浙江创盛光能源有限公司 | Grounding voltage withstand insulation integrated testing method of photovoltaic component |
| CN107478872A (en) * | 2017-09-01 | 2017-12-15 | 浙江德清众鑫盛五金弹簧有限公司 | A kind of spring tests probe |
| CN110401412A (en) * | 2018-04-25 | 2019-11-01 | 共进电机株式会社 | Probe and solar battery cell measuring device |
| US10938342B2 (en) | 2018-04-25 | 2021-03-02 | Kyoshin Electric Co., Ltd. | Probe and solar battery cell measurement apparatus |
| CN110401412B (en) * | 2018-04-25 | 2022-05-03 | 共进电机株式会社 | Probe and measuring device for solar cell |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104702211B (en) | 2017-05-24 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |