CN104697564A - Highly accelerated stress test method of angular displacement sensor - Google Patents
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Abstract
The invention relates to the reliability test technology of an angular displacement sensor, in particular to a highly accelerated stress test method of an angular displacement sensor. The method is characterized in that high-temperature working limit and low-temperature working limit are determined through high-temperature and low-temperature stepping assessment, vibration working limit is determined through vibration stepping assessment, and the high-temperature working limit, the low-temperature working limit and the vibration working limit provide reliability assessment to the design parameters of the angular displacement sensor; the temperature lower limit in the test is lowered from -45 DEG C to -90 DEG C, the temperature upper limit is increased from 70 DEG C to 135 DEG C, temperature change rate is increased from 10 DEG C/min to 40 DEG C/min, vibration load is changed from single axis to three-axial-direction six-freedom-degree excitation, reliability assessment requirements of the angular displacement sensor are increased, time of the reliability test can be reduced correspondingly, and a new approach is provided to the reliability test method of highly accelerated stress.
Description
Technical field
The present invention relates to the fail-test technical field of device, particularly relate to the fail-test technical field of angular displacement sensor.
Background technology
In fly-by-wire flight control system, have a kind of critical component of angular displacement sensor, these parts provide in the system being mainly used in straight line/rotary motion, provide straight line/angle position voltage signal, and this voltage signal is passed to computing machine, to realize position measurement and feedback.The output voltage of angular displacement sensor and insulation resistance are the Important Parameters whether this product of mark is qualified.This sensor machine and detect its output voltage and insulation resistance qualified after, payment install before need to carry out reliability pre-test nuclear test.
Common certification test method is: at the low-temperature working limit insulation 110min of-55 DEG C, be warming up to 70 DEG C of insulation 110min with 10 DEG C/min, then be cooled to-55 DEG C with 10 DEG C/min, alternating temperature examination is carried out in circulation according to this; The compound examination of the single shaft random vibration that accekeration is 6.06g single shaft random vibration thus formation relents is added while alternating temperature examination.The output voltage of this displacement transducer and insulation resistance meet the requirements value when being greater than 452.6h by the compound of the above-mentioned condition examination cumulative time, namely think and have passed fail-test.
Original test method only considers the temperature of angular displacement sensor in normal transport, use procedure, vibration environment, and the dramatic temperature change in four seasons of not considering angular displacement sensor in storage process and short-distance transport or by temperature disturbance acute variation when disaster, particularly earthquake.Therefore there is the problem that temperature range is narrower, rate temperature change is low, temperature retention time is short in the temperature of working limit, and be adopt single shaft random vibration, angular displacement sensor potential faults is all caused fully not expose, examine with reality after original test method is examined and there is gap, even if having passed the examination of above-mentioned fail-test and actually examine unsanctioned disqualification rate still higher.
Summary of the invention
The object of invention is: in order to the potential faults of abundant exposure angle displacement transducer, the disqualification rate of the actual examination of reduction, the special a kind of high accelerated stress testing method proposing angular displacement sensor.
The technical scheme of invention is:
A high accelerated stress testing method for angular displacement sensor, its examined by low temperature stepping successively and determine the low-temperature working limit, examined by high temperature stepping and determine the hot operation limit, by the examination of five quick changeable temperatures, examine by vibration stepping and determine to vibrate working limit, the integrated environment of the vibration that relents finally by five times examines the high accelerated stress testing realizing diagonal displacement sensor.
The parameter of low temperature stepping examination and determine the low-temperature working limit: be a step totally two steps at interval of 10 DEG C from-55 DEG C to-75 DEG C, be a step totally five steps from-75 DEG C to-90 DEG C at interval of 5 DEG C, on each temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be cooled to 40 DEG C/min speed the test that next temperature step carries out output voltage and insulation resistance again after test passes, successively to-90 DEG C of these temperature steps, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be after test passes and examined by low temperature stepping, the qualified temperature corresponding to last step of parameter testing is its low-temperature working limit.
The parameter of high temperature stepping examination and determine the hot operation limit: be a step totally two steps at interval of 20 DEG C from 70 DEG C to 110 DEG C, be a step totally one step from 110 DEG C to 125 DEG C at interval of 15 DEG C, be a step totally two steps from 125 DEG C to 135 DEG C at interval of 5 DEG C, on each temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, , carry out the test of output voltage and insulation resistance again with 40 DEG C/min ramp to next temperature step after test passes, , successively to 135 DEG C this temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be after test passes and examined by high temperature stepping, the qualified temperature corresponding to last step of parameter testing is its hot operation limit.
The parameter of five quick changeable temperature examinations is: based on the high/low temperature limiting value for operation that above-mentioned test is determined, take low temperature limit as the lower limit of alternating temperature examination, with the higher limit that high temperature limit value is examined for alternating temperature, first by the lower limit that alternating temperature is examined, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, , with the higher limit that 40 DEG C/min ramp is examined to alternating temperature after test passes, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be cooled to the lower limit of alternating temperature examination with 40 DEG C/min speed after test passes, back and forth carry out five times according to this, last circulation temperature lowering is to room temperature, the test carrying out its output voltage and insulation resistance after temperature stabilization is reached until angular displacement sensor, be after test passes by five alternating temperature examinations.
The parameter of vibration stepping examination and determine to vibrate working limit: angular displacement sensor is placed in after shaking table installs, apply vibration frequency from 5Hz to 10KHz, the non-gaussian broadband pseudorandom vibration of vibration stress to be 5Grms to 65Grms at interval of 5Grms or 10Grms the be step Triaxiality and six degrees of freedom of totally ten two steps, after each vibration stress step keeps 10min, diagonal displacement sensor carries out the test of output voltage, is promoted to next vibration stress step after test passes to vibrate rate of change 20Grms/min; All qualified at all enterprising line output voltages of vibration stress step, then vibrate stepping examination qualified, the qualified vibration values corresponding to last step of parameter testing is its vibration working limit.
Relent for five times the integrated environment examination of vibration: based on the parameter of the high/low temperature limiting value for operation determined by above-mentioned test, vibration working limit and five alternating temperature examinations, based on the parameter of determined high/low temperature limiting value for operation, vibration working limit and the examination of five alternating temperatures, alternating temperature process is one-period each time, low temperature to high temperature or high temperature to the temperature variation of low temperature first 5 minutes, vibrate rate of change with 20Grms/min and apply vibration, vibration frequency is from 5Hz to 10KHz, and vibration stress is
grms or excite the Triaxiality and six degrees of freedom non-gaussian broadband pseudorandom vibration of vibration stress value of fault, the test of its output voltage and insulation resistance is tested after retention time 15min, the follow-up continuation of insurance temperature of test passes, same stress is applied when first 5 minutes of next temperature variation, carry out same test, move in circles according to this to five alternating temperature cycles and all complete, the output voltage that after ten high/low temperature alternating temperature processes in whole five cycles apply vibration, 15min tests and insulation resistance is all qualified is by five vibration integrated environment examinations that relent.
The advantage of invention and beneficial effect: this method is examined determined high/low temperature working limit by high/low temperature stepping and examined determined vibration working limit by vibration stepping, and the design parameter being angular displacement sensor provides the examination of reliability; The low temperature stepping examination increased before the vibration integrated environment examination that relents, high temperature stepping examination, alternating temperature examination and vibration stepping examination are more close to the practical service environment of ring laser gyro integrated device; Rate temperature change is increased to 40 DEG C/min by 10 DEG C/min, the applying of oscillating load changes into three axial six degree of freedoms by single shaft and encourage, equal diagonal displacement sensor reliability examination improves requirement, correspondingly can shorten the used time of fail-test, the reliability test method for strengthening acceleration provides a new selection.
Specific embodiment
Below by specific embodiment, the present invention is described in further detail.
In order to reduce this gap, under the prerequisite that failure mode is constant, avoid the direct damage directly strengthening the angular displacement sensor that stress causes, the test method of stepstress is adopted progressively to improve proof stress, thus the defect that fully exposure angle displacement transducer is potential in Design and manufacture technique, improve its reliability level.
Following high accelerated stress testing is implemented at certain type angular displacement sensor:
(1) be a step totally two steps from-55 DEG C to-75 DEG C at interval of 10 DEG C, be a step totally five steps from-75 DEG C to-90 DEG C at interval of 5 DEG C, on each temperature step, temperature retention time is the laggard line output voltage of 45min and megger test, is cooled to next temperature step carries out output voltage and megger test again after test passes with 40 DEG C/min speed; Successively to-90 DEG C of these temperature steps, treat that angular displacement sensor reaches the laggard line output voltage of temperature stabilization and megger test, test passes.So by using 10 DEG C of step-lengths in low stress values region, use the method for 5 DEG C of step-lengths in higher stress value region, the low-temperature working limit obtaining this angular displacement sensor after the equal test passes of multiple temperature steps is-90 DEG C.
(2) be a step totally two steps from 70 DEG C to 110 DEG C at interval of 20 DEG C, be a step totally one step from 110 DEG C to 125 DEG C at interval of 15 DEG C, be a step totally two steps from 125 DEG C to 135 DEG C at interval of 5 DEG C, on each temperature step, temperature retention time is: the laggard line output voltage of 45min and megger test, output voltage and megger test is carried out again with the supreme temperature step of 40 DEG C/min ramp, successively to 135 DEG C this temperature step, treat that angular displacement sensor reaches the laggard line output voltage of temperature stabilization and megger test, test passes.So the hot operation limit obtaining this angular displacement sensor is 135 DEG C.So by using the method for 20 DEG C, 15 DEG C, 5 DEG C step-lengths respectively in different stress value regions, the hot operation limit obtaining this angular displacement sensor after the equal test passes of multiple temperature steps is 135 DEG C.
(3) based on the low-temperature working ultimate value of-90 DEG C determined by above-mentioned test and the hot operation ultimate value of 135 DEG C, and with the lower limit that-90 DEG C are examined for alternating temperature, the higher limit examined for alternating temperature with 135 DEG C, first by-90 DEG C, treat the angular displacement sensor insulation laggard line output voltage of 45min and megger test, with 40 DEG C/min ramp to 135 DEG C after test passes, treat the angular displacement sensor insulation laggard line output voltage of 45min and megger test,-90 DEG C are cooled to 40 DEG C/min speed after test passes, back and forth carry out five times according to this, what last circulated is cooled to room temperature, treat that angular displacement sensor reaches the test passes of the laggard line output voltage of temperature stabilization and insulation resistance, by five alternating temperature examinations, to determine the reliability of angular displacement sensor under quick temperature changing environment.
(4) angular displacement sensor is placed in after shaking table installs, apply vibration frequency from 5Hz to 10KHz, the non-gaussian broadband pseudorandom vibration of vibration stress to be 5Grms to 65Grms at interval of 5Grms or 10Grms the be step Triaxiality and six degrees of freedom of totally ten two steps, after each vibration stress step keeps 10min, diagonal displacement sensor carries out the test of output voltage, is promoted to next vibration stress step after test passes to vibrate rate of change 20Grms/min; All qualified at all enterprising line output voltages of vibration stress step, vibration stepping examination is qualified.So by using the method for 5Grms, 10Grms step-length respectively in different stress value regions, the vibration hot operation limit obtaining this angular displacement sensor after the equal test passes of multiple vibration steps is 65Grms.
(5) with the low-temperature working ultimate value of-90 DEG C that above-mentioned test is determined, the hot operation ultimate value of 135 DEG C and 65Grms vibrate based on working limit, high/low temperature limiting value for operation, based on the parameter of vibration working limit and five alternating temperature examinations, with determined high/low temperature limiting value for operation, based on the parameter of vibration working limit and five alternating temperature examinations, alternating temperature process is one-period each time, low temperature to high temperature or high temperature to the temperature variation of low temperature first 5 minutes, vibrate rate of change with 20Grms/min and apply vibration, vibration frequency is from 5Hz to 10KHz, vibration stress is the 40G exciting fault, 50G, the Triaxiality and six degrees of freedom non-gaussian broadband pseudorandom vibration of 65G, the test of its output voltage and insulation resistance is tested after retention time 15min, the follow-up continuation of insurance temperature of test passes, same stress is applied when first 5 minutes of next temperature variation, carry out same test, move in circles according to this to five alternating temperature cycles and all complete, the output voltage that after ten high/low temperature alternating temperature processes in whole five cycles apply vibration, 15min tests and all qualified being of insulation resistance are examined by five vibration integrated environment that relent, to determine the reliability of angular displacement sensor under quick temperature change and vibration integrated environment.
Embodiment:
By the enforcement of certain type angular displacement sensor height accelerated stress testing, the temperature stress low-temperature working limit is widened to-90 DEG C by designing given-55 DEG C, the hot operation limit is widened to 135 DEG C by designing given 70 DEG C, rate temperature change is increased to 40 DEG C/min by 10 DEG C/min, and have employed the vibration of three axial six degree of freedom excitations, both improve the efficiency that test method excites fault, and progressively strengthened stress by the method for stepstress again and avoid product and directly strengthen the damage that stress causes.Expose latent defect 10 times in test altogether, cover the fault mode occurred in all practical applications of this type product; The product low-temperature working limit after improvement improves 35 DEG C, and the hot operation limit improves 65 DEG C, and the fail-test time foreshortened to 85 hours by 452.6 hours, and the reliability test method for strengthening acceleration provides a new selection approach.
Claims (7)
1. a high accelerated stress testing method for angular displacement sensor, is characterized in that: examined by low temperature stepping successively and determine the low-temperature working limit, examined by high temperature stepping and determine the hot operation limit, by the examination of five quick changeable temperatures, examine by vibration stepping and determine to vibrate working limit, the integrated environment of the vibration that relents finally by five times examines the high accelerated stress testing realizing diagonal displacement sensor.
2. the high accelerated stress testing method of angular displacement sensor according to claim 1, it is characterized in that: to be required by the environmental suitability considering angular displacement sensor, the examination parameter of structure and starting material resistance to environmental characteristics determination Step test, the ultimate value determined according to Step test and the angular displacement sensor fault in Step test excites situation determination quick changeable temperature to examine parameter and integrated environment examination parameter.
3. the high accelerated stress testing method of angular displacement sensor according to claim 1, it is characterized in that: the parameter of low temperature stepping examination and determine that low-temperature working limit detailed process is as follows: be a step totally two steps from-55 DEG C to-75 DEG C at interval of 10 DEG C, be a step totally five steps from-75 DEG C to-90 DEG C at interval of 5 DEG C, on each temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be cooled to 40 DEG C/min speed the test that next temperature step carries out output voltage and insulation resistance again after test passes, successively to-90 DEG C of these temperature steps, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be after test passes and examined by low temperature stepping, the qualified temperature corresponding to last step of parameter testing is its low-temperature working limit.
4. the high accelerated stress testing method of angular displacement sensor according to claim 1, it is characterized in that: the parameter of high temperature stepping examination and determine that the detailed process of the hot operation limit is as follows: be a step totally two steps from 70 DEG C to 110 DEG C at interval of 20 DEG C, be a step totally one step from 110 DEG C to 125 DEG C at interval of 15 DEG C, be a step totally two steps from 125 DEG C to 135 DEG C at interval of 5 DEG C, on each temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, carry out the test of output voltage and insulation resistance again with 40 DEG C/min ramp to next temperature step after test passes, successively to 135 DEG C this temperature step, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be after test passes and examined by high temperature stepping, the qualified temperature corresponding to last step of parameter testing is its hot operation limit.
5. the high accelerated stress testing method of angular displacement sensor according to claim 1, it is characterized in that: the detailed process of five quick changeable temperature examinations is as follows: based on determined high/low temperature limiting value for operation, take low temperature limit as the lower limit of alternating temperature examination, with the higher limit that high temperature limit value is examined for alternating temperature, first by the lower limit that alternating temperature is examined, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, with the higher limit that 40 DEG C/min ramp is examined to alternating temperature after test passes, treat that angular displacement sensor reaches the test of the laggard line output voltage of temperature stabilization and insulation resistance, be cooled to the lower limit of alternating temperature examination with 40 DEG C/min speed after test passes, back and forth carry out five times according to this, last circulation temperature lowering is to room temperature, the test carrying out its output voltage and insulation resistance after temperature stabilization is reached until angular displacement sensor, be after test passes by five alternating temperature examinations.
6. the high accelerated stress testing method of angular displacement sensor according to claim 1, it is characterized in that: the parameter of vibration stepping examination and to determine to vibrate the detailed process of working limit as follows: angular displacement sensor is placed in after shaking table installs, apply vibration frequency from 5Hz to 10KHz, the non-gaussian broadband pseudorandom vibration of vibration stress to be 5Grms to 65Grms at interval of 5Grms or 10Grms the be step Triaxiality and six degrees of freedom of totally ten two steps, after each vibration stress step keeps 10min, diagonal displacement sensor carries out the test of output voltage, next vibration stress step is promoted to vibrate rate of change 20Grms/min after test passes, all qualified at all enterprising line output voltages of vibration stress step, then vibrate stepping examination qualified, the qualified vibration values corresponding to last step of parameter testing is its vibration working limit.
7. the high accelerated stress testing method of angular displacement sensor according to claim 2, it is characterized in that: the detailed process of the integrated environment examination of the vibration that relents for five times is as follows: based on the parameter of determined high/low temperature limiting value for operation, vibration working limit and the examination of five alternating temperatures, alternating temperature process is one-period each time, low temperature to high temperature or high temperature to the temperature variation of low temperature first 5 minutes, vibrate rate of change with 20Grms/min and apply vibration, vibration frequency is from 5Hz to 10KHz, and vibration stress is
grms or excite the vibration stress of fault, the test of its output voltage and insulation resistance is tested after retention time 15min, the follow-up continuation of insurance temperature of test passes, same stress is applied when first 5 minutes of next temperature variation, carry out same test, move in circles according to this to five alternating temperature cycles and all complete, the output voltage that after ten high/low temperature alternating temperature processes in whole five cycles apply vibration, 15min tests and insulation resistance is all qualified is by five vibration integrated environment examinations that relent.
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