CN110715811A - Method for defining limit operating temperature through stepping stress - Google Patents
Method for defining limit operating temperature through stepping stress Download PDFInfo
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- CN110715811A CN110715811A CN201910832164.3A CN201910832164A CN110715811A CN 110715811 A CN110715811 A CN 110715811A CN 201910832164 A CN201910832164 A CN 201910832164A CN 110715811 A CN110715811 A CN 110715811A
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- 238000012360 testing method Methods 0.000 claims abstract description 24
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
The invention discloses a method for defining limit operating temperature through stepping stress, which comprises a high-temperature test and a low-temperature test, wherein the temperature is gradually increased during the high-temperature test, the temperature is kept for 8 hours at each stage, and whether the function of equipment is normal or not is checked during and after the high-temperature test, if so, the temperature is continuously increased, and if not, a failure mode and the current temperature are recorded; and gradually reducing the temperature during low-temperature testing, staying for 8 hours at each level of temperature, checking whether the function of the equipment is normal during and after the low-temperature testing, if so, continuously reducing the temperature, and if not, recording the failure mode and the current temperature. Through the mode, the device can obtain the performance of the device at each temperature, and data support is provided for future device improvement.
Description
Technical Field
The invention relates to the field of equipment temperature testing, in particular to a method for defining limit operating temperature through stepping stress.
Background
The limit temperature is the highest or lowest temperature that the material and product can reach before failure. Because the extreme operating temperatures in the specification are often empirical, no test data is available to support.
Disclosure of Invention
The invention mainly solves the technical problem of providing a method for defining the limit operating temperature through stepping stress, which can search the limit operating temperature of equipment in a stepping stress mode, obtain the performance of the equipment at each temperature and provide data support for the improvement of the equipment in the future.
In order to solve the technical problems, the invention adopts a technical scheme that: providing a method for defining limit operating temperature by stepping stress, comprising high temperature test and low temperature test;
the high temperature test comprises the following steps:
a1, beginning high temperature test part, staying at 23 ℃ for 8 hours;
a2, checking whether the function of the equipment is normal during and after the operation, if so, heating to 30 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a3, checking whether the function of the equipment is normal during and after the operation, if so, heating to 40 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a4, checking whether the function of the equipment is normal during and after the operation, if so, heating to 40 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a5, checking whether the function of the equipment is normal during and after the operation, if so, heating to 50 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a6, checking whether the function of the equipment is normal during and after the operation, if so, heating to 60 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a7, checking whether the function of the equipment is normal during and after the operation, if so, heating to 65 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a8, checking whether the function of the equipment is normal during and after the operation, if so, heating to 70 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a9, checking whether the function of the equipment is normal during and after the operation, if so, heating to 75 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a10, checking whether the function of the equipment is normal during and after the operation, if so, heating to 80 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a11, checking whether the function of the equipment is normal during and after the operation, recording the state and the current temperature of the equipment, and finishing the high-temperature part;
the low temperature test comprises the following steps:
b1, start low temperature test part, dwell at 23 ℃ for 8 hours;
b2, checking whether the function of the equipment is normal during and after the operation, if so, cooling to 15 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
b3, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 10 ℃ and staying for 8 hours;
b4, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 5 ℃ and staying for 8 hours;
b5, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 0 ℃ and staying for 48 hours;
b6, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-5 ℃ and staying for 48 hours;
b7, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-10 ℃ and staying for 48 hours;
b8, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-15 ℃ and staying for 48 hours;
b9, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-20 ℃ and staying for 48 hours;
b10, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-25 ℃ and staying for 48 hours;
b11, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-30 ℃ and staying for 48 hours;
b12, checking whether the function of the equipment is normal during and after, recording the equipment state and the current temperature, and ending the low-temperature part.
The invention has the beneficial effects that: the invention can search the limit operating temperature of the equipment in a stepping stress mode, obtain the performance of the equipment at each temperature and provide data support for the improvement of the equipment in the future.
Drawings
FIG. 1 is a flow chart of a high temperature test in a method of the present invention for defining an ultimate operating temperature by a step stress;
FIG. 2 is a flow chart illustrating a low temperature test in a method of defining a limit operating temperature by a step stress.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention easier to understand by those skilled in the art, and thus will clearly and clearly define the scope of the invention.
Referring to fig. 1 and 2, an embodiment of the present invention includes:
a method of defining a limit operating temperature by a step stress, comprising: (ii) a
High-temperature part: staying at 23 ℃ for 8 hours, and checking whether the equipment can be detected through functions; if yes, staying at 30 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 40 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 50 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 55 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 60 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if yes, staying at 65 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at 70 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if yes, staying at 75 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 80 ℃ for 8 hours, and checking whether the equipment can pass the function detection; and (5) after the high-temperature test is finished, recording the current temperature.
A low-temperature part: staying at 23 ℃ for 8 hours, and checking whether the equipment can be detected through functions; if yes, staying at 15 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 10 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 5 ℃ for 8 hours, and checking whether the equipment can pass the function detection; if yes, staying at 0 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at-5 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at-10 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at-15 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at-20 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if so, staying at-25 ℃ for 48 hours, and checking whether the equipment can pass the function detection; if yes, the temperature is kept at minus 30 ℃ for 48 hours, and whether the equipment can detect the end of the low-temperature test through functions is checked.
The invention can search the limit operating temperature of the equipment in a stepping stress mode, obtain the performance of the equipment at each temperature and provide data support for the improvement of the equipment in the future.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (1)
1. A method of defining a limit operating temperature by a step stress, comprising a high temperature test and a low temperature test;
the high temperature test comprises the following steps:
a1, beginning high temperature test part, staying at 23 ℃ for 8 hours;
a2, checking whether the function of the equipment is normal during and after the operation, if so, heating to 30 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a3, checking whether the function of the equipment is normal during and after the operation, if so, heating to 40 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a4, checking whether the function of the equipment is normal during and after the operation, if so, heating to 40 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a5, checking whether the function of the equipment is normal during and after the operation, if so, heating to 50 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
a6, checking whether the function of the equipment is normal during and after the operation, if so, heating to 60 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a7, checking whether the function of the equipment is normal during and after the operation, if so, heating to 65 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a8, checking whether the function of the equipment is normal during and after the operation, if so, heating to 70 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a9, checking whether the function of the equipment is normal during and after the operation, if so, heating to 75 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a10, checking whether the function of the equipment is normal during and after the operation, if so, heating to 80 ℃ and staying for 48 hours, and if not, recording the failure mode and the current temperature;
a11, checking whether the function of the equipment is normal during and after the operation, recording the state and the current temperature of the equipment, and finishing the high-temperature part;
the low temperature test comprises the following steps:
b1, start low temperature test part, dwell at 23 ℃ for 8 hours;
b2, checking whether the function of the equipment is normal during and after the operation, if so, cooling to 15 ℃ and staying for 8 hours, and if not, recording the failure mode and the current temperature;
b3, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 10 ℃ and staying for 8 hours;
b4, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 5 ℃ and staying for 8 hours;
b5, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to 0 ℃ and staying for 48 hours;
b6, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-5 ℃ and staying for 48 hours;
b7, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-10 ℃ and staying for 48 hours;
b8, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-15 ℃ and staying for 48 hours;
b9, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-20 ℃ and staying for 48 hours;
b10, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-25 ℃ and staying for 48 hours;
b11, checking whether the function of the equipment is normal during and after the operation, and if not, recording the failure mode and the current temperature; if yes, cooling to-30 ℃ and staying for 48 hours;
b12, checking whether the function of the equipment is normal during and after, recording the equipment state and the current temperature, and ending the low-temperature part.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910832164.3A CN110715811A (en) | 2019-09-04 | 2019-09-04 | Method for defining limit operating temperature through stepping stress |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910832164.3A CN110715811A (en) | 2019-09-04 | 2019-09-04 | Method for defining limit operating temperature through stepping stress |
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| CN110715811A true CN110715811A (en) | 2020-01-21 |
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Citations (5)
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|---|---|---|---|---|
| CN102426311A (en) * | 2011-10-13 | 2012-04-25 | 西安航空制动科技有限公司 | Method for determining low-temperature working stress limit of airplane antiskid brake control box |
| CN102426313A (en) * | 2011-10-20 | 2012-04-25 | 西安航空制动科技有限公司 | Method for screening high-acceleration stress of aircraft anti-skid brake control box |
| CN104615517A (en) * | 2015-02-09 | 2015-05-13 | 浪潮电子信息产业股份有限公司 | Method for detecting server products through using HALT |
| CN104697564A (en) * | 2013-12-10 | 2015-06-10 | 中国航空工业第六一八研究所 | Highly accelerated stress test method of angular displacement sensor |
| US9989498B2 (en) * | 2013-02-06 | 2018-06-05 | The Regents Of The University Of California | Nonlinear ultrasonic testing for non-destructive measurement of longitudinal thermal stresses in solids |
-
2019
- 2019-09-04 CN CN201910832164.3A patent/CN110715811A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102426311A (en) * | 2011-10-13 | 2012-04-25 | 西安航空制动科技有限公司 | Method for determining low-temperature working stress limit of airplane antiskid brake control box |
| CN102426313A (en) * | 2011-10-20 | 2012-04-25 | 西安航空制动科技有限公司 | Method for screening high-acceleration stress of aircraft anti-skid brake control box |
| US9989498B2 (en) * | 2013-02-06 | 2018-06-05 | The Regents Of The University Of California | Nonlinear ultrasonic testing for non-destructive measurement of longitudinal thermal stresses in solids |
| CN104697564A (en) * | 2013-12-10 | 2015-06-10 | 中国航空工业第六一八研究所 | Highly accelerated stress test method of angular displacement sensor |
| CN104615517A (en) * | 2015-02-09 | 2015-05-13 | 浪潮电子信息产业股份有限公司 | Method for detecting server products through using HALT |
Non-Patent Citations (1)
| Title |
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| 石安利 等: "可靠性强化试验在硅压力传感器上的应用", 《仪表技术与传感器》 * |
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Application publication date: 20200121 |