CN102426089A - Method and device for realizing quick stress screen of product - Google Patents
Method and device for realizing quick stress screen of product Download PDFInfo
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- CN102426089A CN102426089A CN2011103049660A CN201110304966A CN102426089A CN 102426089 A CN102426089 A CN 102426089A CN 2011103049660 A CN2011103049660 A CN 2011103049660A CN 201110304966 A CN201110304966 A CN 201110304966A CN 102426089 A CN102426089 A CN 102426089A
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Abstract
The invention relates to electronic equipment detection technology, and discloses a method and device for realizing quick stress screen of a product. The method comprises the following steps of: theoretically deducing to obtain theoretical reliability limit of the product; actually measuring whether the product meets a theoretical value through a test; finding out a weak point (potential failure) of the product in the actual measurement and gradually improving and eliminating to reach the theoretical design limit; and derating the theoretical design limit as the quick stress screen condition for the product. The embodiment of the invention provides the method for realizing quick stress screen of the product. The product is verified and improved to reach the theoretical stress limit by designing and calculating the theoretical stress limit of the product and then gradually applying step stressing actual test; the design limit is tested and verified according to theoretical calculation and is derated and screened; and thus, a part of failure can be screened without damaging more reliability of the product.
Description
Technical field
The present invention relates to the electronic equipment detection technique, particularly relate to a kind of method and device of realizing the quick stress screening of product.
Background technology
Environmental stress screening (Environment Stress Screen; ESS) be a kind of process means; Be through apply rational environmental stress (like temperature stress or vibration stress) to electronic product; The latent defect that it is inner quickens to become fault, and through checking the process of finding and fixing a breakdown.
Please refer to Fig. 1, Fig. 1 is existing a kind of process flow diagram of realizing the method for the quick stress screening of product, and is as shown in the figure, and the method comprising the steps of: S1, test product is carried out reliability testing, obtain confidence limit; S2, in the confidence limit scope, set the initial testing value; S3, in the confidence limit scope, progressively change current test value, the product through the setting of fault trap is carried out the reliable in function property testing at each test value; S4, judge whether to measure the fault of test product,, otherwise return step S3 if then change step S5 over to; S5, current test value are set to the possibility screening conditions; S6, in the possible screening conditions that obtain, normal product is carried out once or above reliable in function property testing; S7, judge whether the function of test product is normal,, otherwise return step S2 if then change step S8 over to; S8, should maybe screening conditions be set to product rapid screening condition.
In such scheme; Among the step S1; Confidence limit obtains by test product being carried out the environmental reliability test, is merely the confidence limit of sample, not the Design Theory boundary of representative products; If supplied materials reliability performance of certain batch test product is higher or lower than manufacturer and promises to undertake, then the confidence limit that goes out of its product test can be higher or lower than the product reliability under institute of the manufacturer promise supplied materials condition; Moreover, among the step S3, the difficult realization of mode of fault trap is set, if insufficient or do not meet actual conditions, will directly cause screening conditions insufficient or produce mistake; In addition, in step S6 and S7, be difficult to judge whether the sample presentation product is certified products; If the sample presentation performance of products is higher or lower than the management and control specification; To cause screening conditions to be judged by accident, only whether test products is normal under screening conditions, and do not know how many reliability of products lost; Cause product after screening, to arrive limiting edge probably, just damage soon after dispatching from the factory.
Therefore, demand urgently improving to existing product screening scheme.
Summary of the invention
In view of this, in order to overcome above-mentioned defective and deficiency, the technical scheme that the present invention takes is: deriving theoretically earlier obtains the theoretical limit of reliability of product, whether satisfies theoretical value through test actual measurement product again; In actual measurement, find out the thin spot (incipient fault) of product, and after progressively improving the elimination back, reach the Design Theory limit; According to the reliability requirement that dispatches from the factory of product, to after the Design Theory limit derate as the quick stress screening condition of product.
Particularly, on the one hand, the invention provides a kind of method that realizes the quick stress screening of product.The method comprising the steps of:
A, obtain the theoretical confidence limit of product;
B, in theoretical confidence limit scope, set the initial testing value;
C, in theoretical confidence limit scope, progressively change current test value, product is applied corresponding test stress and carries out functional reliability test at each test value;
D, judge whether test product produces fault, if then eliminate the fault of test product, and return step b, otherwise change step e over to;
E, judge whether the test value of test product reaches theoretical confidence limit, if then with after the theoretical confidence limit derate as the condition of the quick stress screening of product, otherwise return step c;
Further, step a is specially: draw the theoretical proof stress limit of product through designing and calculating, as the theoretical confidence limit of product.
Further, said theoretical confidence limit is the high temperature Design Theory limit;
Step b further comprises: in high temperature Design Theory limit range, set initial high temperature test value;
Step c further comprises: in high temperature Design Theory limit range, progressively increase current high temperature test value, in each high temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
Further, said theoretical confidence limit is the low temperature Design Theory limit;
Step b further comprises: in low temperature Design Theory limit range, set initial low-temperature test value;
Step c further comprises: in low temperature Design Theory limit range, gradually reduce current low-temperature test value, in each low-temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
Further, said theoretical confidence limit is the theory of oscillation design limit;
Step b further comprises: in theory of oscillation design limit scope, set the initial vibration test value;
Step c further comprises: in theory of oscillation design limit scope, progressively increase current vibration-testing value, in each vibration-testing value product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing.
Further, said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit;
Step b further comprises: in high temperature and vibration integrated Design Theory limit range, set initial high temperature test value and initial vibration test value;
Step c further comprises: in high temperature and vibration integrated Design Theory limit range; Progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
Further, said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit;
Step b further comprises: in low temperature and vibration integrated Design Theory limit range, set initial low-temperature test value and initial vibration test value;
Step c further comprises: in low temperature and vibration integrated Design Theory limit range; Gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
Further, the initial testing value in the theoretical confidence limit scope is 50% of a theoretical confidence limit.
Further, in step e, if the test value of test product reaches theoretical confidence limit, then with theoretical confidence limit 50% to 80% in arbitrary value as the condition of the quick stress screening of product.
On the other hand, the present invention also provides a kind of device of realizing the quick stress screening of product.
This device comprises: acquiring unit is used to obtain the theoretical confidence limit of product;
Setup unit is used in the theoretical confidence limit scope that said acquiring unit obtains, setting the initial testing value;
Test cell is used in theoretical confidence limit scope, on the basis of the initial testing value that said setup unit is set, progressively changes current test value, product is applied corresponding test stress and carry out the functional reliability test at each test value;
First judges to be used to judge whether test product produces fault by performance element, if then eliminate the fault of test product, and will eliminate product after the fault and be back to setup unit and reset, otherwise launch the second judgement performance element;
Second judges to be used to judge whether the test value of test product reaches theoretical confidence limit by performance element, if then with after the theoretical confidence limit derate as the condition of the quick stress screening of product, otherwise launch test cell product is tested once more.
Further, said acquiring unit comprises: calculation execution unit is used for through calculating the theoretical proof stress limit of product, as the theoretical confidence limit of product.
Further, said setup unit comprises:
First setting module is used for when said theoretical confidence limit is the high temperature Design Theory limit, in its scope, setting initial high temperature test value;
Second setting module is used for when said theoretical confidence limit is the low temperature Design Theory limit, in its scope, setting initial low-temperature test value;
The 3rd setting module is used for when said theoretical confidence limit is the theory of oscillation design limit, in its scope, setting the initial vibration test value;
The 4th setting module is used for when said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit, in its scope, setting initial high temperature test value and initial vibration test value;
The 5th setting module is used for when said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit, in its scope, setting initial low-temperature test value and initial vibration test value;
Said test cell comprises:
First test module; Be used in high temperature Design Theory limit range; On the basis of the initial high temperature test value that first setting module is set, progressively increase current high temperature test value, product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing in each high temperature test value;
Second test module; Be used in low temperature Design Theory limit range; On the basis of the initial low-temperature test value that second setting module is set, gradually reduce current low-temperature test value, product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing in each low-temperature test value;
The 3rd test module; Be used in theory of oscillation design limit scope; On the basis of the initial vibration test value that the 3rd setting module is set, progressively increase current vibration-testing value, product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing in each vibration-testing value;
The 4th test module; Be used in high temperature and vibration integrated Design Theory limit range; On the basis of initial high temperature test value that the 4th setting module is set and initial vibration test value, progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each;
The 5th test module; Be used in low temperature and vibration integrated Design Theory limit range; On the basis of initial low-temperature test value that the 5th setting module is set and initial vibration test value, gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each.
A kind of method and device of realizing the quick stress screening of product provided by the invention; Draw the theoretical confidence limit of product earlier through derivation; Progressively apply stepstress through actual tests again, checking improves product, makes it reach theoretical confidence limit; The confidence limit that so obtains meets the theoretical specification of product design and parts; At last will through after the theoretical confidence limit derate of testing authentication as the condition of the quick stress screening of product, can effectively filter out partial fault like this, be unlikely to too much to damage reliability of products again; In addition; The ultimate value of only also having avoided in the prior art obtaining with a small amount of tested article test is as screening conditions; And when tested article reality does not satisfy design specification; During follow-up large quantities of volume production because the product that the performance drift causes meeting design specification possibly not meet initial test value, and cause can't management and control problem; Also avoided employing fault trap to judge screening whether effectively the time, the fault trap is difficult to be provided with, and the shortcoming that wastes time and energy.
Description of drawings
Fig. 1 is existing a kind of process flow diagram of realizing the method for the quick stress screening of product;
A kind of process flow diagram of realizing the method for the quick stress screening of product that Fig. 2 provides for the embodiment of the invention;
A kind of structured flowchart of realizing the device of the quick stress screening of product that Fig. 3 provides for the embodiment of the invention.
Embodiment
In order to make those skilled in the art understand technical scheme of the present invention better, the present invention is done further detailed description below in conjunction with accompanying drawing and specific embodiment.Should be pointed out that description and the description order to concrete structure only is the explanation to specific embodiment in this part, should not be regarded as that protection scope of the present invention is had any restriction.
Please refer to Fig. 2, a kind of process flow diagram of realizing the method for the quick stress screening of product that Fig. 2 provides for the embodiment of the invention.
As shown in the figure, the method comprising the steps of:
S11: calculate the theoretical confidence limit that obtains product through theoretical derivation;
Particularly; Various calculation of parameter during according to product design draw the theoretical proof stress limit of product; As the theoretical confidence limit of product, this theory confidence limit includes but not limited to the high temperature Design Theory limit, the low temperature Design Theory limit, theory of oscillation design limit, high temperature and the vibration integrated Design Theory limit and low temperature and theory of oscillation design limit etc.
S12: in theoretical confidence limit scope, set the initial testing value;
Particularly, in above-mentioned theory confidence limit scope, set one and be used for the initial testing value of test for the first time, for example, can select the above-mentioned theory confidence limit 50% as the initial testing value.
S13: in theoretical confidence limit scope, progressively change current test value, product is applied corresponding test stress and carry out the functional reliability test at each test value;
Particularly, product is applied corresponding test stress and carry out the functional reliability test at each test value in initial testing value to theoretical confidence limit, for example; Supposing that the initial testing value is X, is that current test value applies corresponding test stress to product and carries out functional reliability test with initial testing value X, carries out other steps behind the S13 then; If when behind step S16, returning step S13; Then the initial testing value is increased the back as new current test value, be about to X+ Δ X, repeat foregoing then as current test value; If after N test; X+N Δ X still is in the theoretical confidence limit scope, then with X+ (N+1) Δ X as current test value, the rest may be inferred.
S14: judge whether test product produces fault;
Particularly, after the each test among the S13, need to judge whether test product produces fault, if generation fault then change step S15 over to, otherwise would change step S16 over to;
S15: the fault of eliminating test product;
Particularly; When judging that test product produces fault among the step S14; Fault type through the check and analysis product; And (for example through improving the product design coming of new of laying equal stress on) after the product eliminates fault be back to step S12 again to product test verification again, and can in time find to cause product to have the variety of issue of incipient fault through this step, make product meet the Design Theory specification through analyzing after improving; In the practical implementation process, this step can realize the fault diagnosis and the fault elimination of test product through manual type or machine mode (fault diagnosis system).
S16: whether the test value of judging test product reaches theoretical confidence limit;
Particularly, judge whether the test value (current test value) of test product reaches theoretical confidence limit,, otherwise return among the step S13, test value is increased the back also test again as new current test value if then change step S17 over to.
S17: with after the theoretical confidence limit derate as the condition of the quick stress screening of product.
Particularly, can be according to the reliability requirement that dispatches from the factory of product, with theoretical confidence limit 50% to 80% between arbitrary value as the condition of the quick stress screening of product.
Need to prove, in the practical implementation process:
1, if said theoretical confidence limit is the high temperature Design Theory limit;
Then step S2 is: in high temperature Design Theory limit range, set initial high temperature test value;
Step S3 is: in high temperature Design Theory limit range, progressively increase current high temperature test value, in each high temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
2, if said theoretical confidence limit is the low temperature Design Theory limit;
Then step S2 is: in low temperature Design Theory limit range, set initial low-temperature test value;
Step S3 is: in low temperature Design Theory limit range, gradually reduce current low-temperature test value, in each low-temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
3, if said theoretical confidence limit is the theory of oscillation design limit;
Then step S2 is: in theory of oscillation design limit scope, set the initial vibration test value;
Step S3 is: in theory of oscillation design limit scope, progressively increase current vibration-testing value, in each vibration-testing value product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing.
4, if said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit;
Then step S2 is: in high temperature and vibration integrated Design Theory limit range, set initial high temperature test value and initial vibration test value;
Step S3 is: in high temperature and vibration integrated Design Theory limit range; Progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
5, if said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit;
Then step S2 is: in low temperature and vibration integrated Design Theory limit range, set initial low-temperature test value and initial vibration test value;
Step S3 is: in low temperature and vibration integrated Design Theory limit range; Gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
For the foregoing description is described better, the electronic product with excavator illustrates below.
At first, analyze to confirm that the electronic product of excavator experiences several kinds of maximum stress during use, such as random vibration and temperature stress (following be superposed to example simultaneously) with random vibration and high temperature stress;
Secondly; Calculate the random vibration and the high temperature Design Theory limit (being a kind of of theoretical confidence limit) of this electronic product through theoretical derivation; In the scope of this Design Theory limit, set an initial random vibration-testing value and a corresponding initial high temperature test value; Initial random vibration-testing value is all got 50% of high temperature and vibration mark with initial high temperature test value; Tested electronic product is applied the combined stress of corresponding temperature and random vibration, treat that the stable or random vibration of product temperature (gets in two times than the elder) after 10 minutes, whether the function that detects this electronic product is normal; If function is normal, progressively increase test synthesis stress, this instance is a gradient with 5 ℃ of temperature, amplitude 0.5Grms, up to the Design Theory limit; If function is undesired, the fault of electronic product analyzed improvement after, test again, the product after improving reaches the Design Theory limit;
At last, the Design Theory limit is carried out derate, this instance is got 50% of opinion design limit, as the condition of quick stress screening.
A kind of method that realizes the quick stress screening of product that the embodiment of the invention provides; Calculate the theoretical confidence limit of product earlier through theoretical derivation; Progressively apply stepstress through actual tests again, checking improves product, makes it reach theoretical confidence limit; The confidence limit that so obtains meets the theoretical specification of product design and parts; At last will through after the theoretical confidence limit derate of testing authentication as the condition of the quick stress screening of product, can effectively filter out partial fault like this, be unlikely to too much to damage reliability of products again; In addition; The ultimate value of only also having avoided in the prior art obtaining with a small amount of tested article test is as screening conditions; And when tested article reality does not satisfy design specification; During follow-up large quantities of volume production because the product that the performance drift causes meeting design specification possibly not meet initial test value, and cause can't management and control problem; Also avoided employing fault trap to judge screening whether effectively the time, the fault trap is difficult to be provided with, and the shortcoming that wastes time and energy.
Please refer to Fig. 3, a kind of structured flowchart of realizing the device of the quick stress screening of product that Fig. 3 provides for the embodiment of the invention.
As shown in the figure, the device 1 of the quick stress screening of this realization product comprises:
Acquiring unit 11 is used to obtain the theoretical confidence limit of product;
First judges performance element 14; Be used for each test of test cell 13 is judged whether test product produces fault; If then eliminate the fault of test product, and will eliminate product after the fault and be back to setup unit 12 and reset, judge performance element 15 otherwise launch second;
Second judges to be used to judge whether the test value of test product reaches theoretical confidence limit by performance element 15, if then with after the theoretical confidence limit derate as the condition of the quick stress screening of product, test once more otherwise launch 13 pairs of products of test cell.
Said acquiring unit 11 further comprises: calculate execution module 111, be used for through calculating the theoretical proof stress limit of product, as the theoretical confidence limit of product.
Said setup unit 12 further comprises:
The 3rd setting module 123 is used for when said theoretical confidence limit is the theory of oscillation design limit, in its scope, setting the initial vibration test value;
The 4th setting module 124 is used for when said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit, in its scope, setting initial high temperature test value and initial vibration test value;
The 5th setting module 125 is used for when said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit, in its scope, setting initial low-temperature test value and initial vibration test value;
Said test cell 13 further comprises:
The 3rd test module 133; Be used in theory of oscillation design limit scope; On the basis of the initial vibration test value that the 3rd setting module 123 is set, progressively increase current vibration-testing value, product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing in each vibration-testing value;
The 4th test module 134; Be used in high temperature and vibration integrated Design Theory limit range; On the basis of initial high temperature test value that the 4th setting module 124 is set and initial vibration test value, progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each;
The 5th test module 135; Be used in low temperature and vibration integrated Design Theory limit range; On the basis of initial low-temperature test value that the 5th setting module 125 is set and initial vibration test value, gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each.
A kind of device of realizing the quick stress screening of product that the embodiment of the invention provides; Calculate the theoretical confidence limit of product through theoretical derivation; Progressively apply stepstress through actual tests again, checking improves product, makes it reach theoretical confidence limit; The confidence limit that so obtains meets the theoretical specification of product design and parts; At last will through after the theoretical confidence limit derate of testing authentication as the condition of the quick stress screening of product, can effectively filter out partial fault like this, be unlikely to too much to damage reliability of products again; In addition; The ultimate value of only also having avoided in the prior art obtaining with a small amount of tested article test is as screening conditions; And when tested article reality does not satisfy design specification; During follow-up large quantities of volume production because the product that the performance drift causes meeting design specification possibly not meet initial test value, and cause can't management and control problem; Also avoided employing fault trap to judge screening whether effectively the time, the fault trap is difficult to be provided with, and the shortcoming that wastes time and energy.
One of ordinary skill in the art will appreciate that; All or part of step/the units/modules of realization the foregoing description can be accomplished through the relevant hardware of programmed instruction; Aforementioned program can be stored in the computer read/write memory medium; This program the step that comprises said method embodiment when carrying out; And aforesaid storage medium comprises: various media that can be program code stored such as ROM, RAM, magnetic disc or laser disc.
The above is merely preferred embodiment of the present invention, and is in order to restriction the present invention, not all within spirit of the present invention and principle, any modification of being done, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (12)
1. a method that realizes the quick stress screening of product is characterized in that, said method comprises step:
A, obtain the theoretical confidence limit of product;
B, in theoretical confidence limit scope, set the initial testing value;
C, in theoretical confidence limit scope, progressively change current test value, product is applied corresponding test stress and carries out functional reliability test at each test value;
D, judge whether test product produces fault, if then eliminate the fault of test product, and return step b, otherwise change step e over to;
E, judge whether the test value of test product reaches theoretical confidence limit, if then with after the theoretical confidence limit derate as the condition of the quick stress screening of product, otherwise return step c.
2. the method for claim 1 is characterized in that, step a is specially: draw the theoretical proof stress limit of product through designing and calculating, as the theoretical confidence limit of product.
3. method as claimed in claim 2 is characterized in that:
Said theoretical confidence limit is the high temperature Design Theory limit;
Step b further comprises: in high temperature Design Theory limit range, set initial high temperature test value;
Step c further comprises: in high temperature Design Theory limit range, progressively increase current high temperature test value, in each high temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
4. method as claimed in claim 2 is characterized in that:
Said theoretical confidence limit is the low temperature Design Theory limit;
Step b further comprises: in low temperature Design Theory limit range, set initial low-temperature test value;
Step c further comprises: in low temperature Design Theory limit range, gradually reduce current low-temperature test value, in each low-temperature test value product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing.
5. method as claimed in claim 2 is characterized in that:
Said theoretical confidence limit is the theory of oscillation design limit;
Step b further comprises: in theory of oscillation design limit scope, set the initial vibration test value;
Step c further comprises: in theory of oscillation design limit scope, progressively increase current vibration-testing value, in each vibration-testing value product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing.
6. method as claimed in claim 2 is characterized in that:
Said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit;
Step b further comprises: in high temperature and vibration integrated Design Theory limit range, set initial high temperature test value and initial vibration test value;
Step c further comprises: in high temperature and vibration integrated Design Theory limit range; Progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
7. method as claimed in claim 2 is characterized in that:
Said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit;
Step b further comprises: in low temperature and vibration integrated Design Theory limit range, set initial low-temperature test value and initial vibration test value;
Step c further comprises: in low temperature and vibration integrated Design Theory limit range; Gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress and after temperature and vibration are stable, product carried out the reliable in function property testing to product at each.
8. like each described method of claim 1 to 7, it is characterized in that the initial testing value in the theoretical confidence limit scope is 50% of a theoretical confidence limit.
9. like each described method of claim 1 to 7; It is characterized in that; In step e, if the test value of test product reaches theoretical confidence limit, then with theoretical confidence limit 50% to 80% in arbitrary value as the condition of the quick stress screening of product.
10. a device of realizing the quick stress screening of product is characterized in that, said device comprises:
Acquiring unit is used to obtain the theoretical confidence limit of product;
Setup unit is used in the theoretical confidence limit scope that said acquiring unit obtains, setting the initial testing value;
Test cell is used in theoretical confidence limit scope, on the basis of the initial testing value that said setup unit is set, progressively changes current test value, product is applied corresponding test stress and carry out the functional reliability test at each test value;
First judges to be used to judge whether test product produces fault by performance element, if then eliminate the fault of test product, and will eliminate product after the fault and be back to setup unit and reset, otherwise launch the second judgement performance element;
Second judges to be used to judge whether the test value of test product reaches theoretical confidence limit by performance element, if then with after the theoretical confidence limit derate as the condition of the quick stress screening of product, otherwise launch test cell product is tested once more.
11. device as claimed in claim 10 is characterized in that, said acquiring unit comprises: calculate execution module, be used for through calculating the theoretical proof stress limit of product, as the theoretical confidence limit of product.
12., it is characterized in that like claim 10 or 11 described devices:
Said setup unit comprises:
First setting module is used for when said theoretical confidence limit is the high temperature Design Theory limit, in its scope, setting initial high temperature test value;
Second setting module is used for when said theoretical confidence limit is the low temperature Design Theory limit, in its scope, setting initial low-temperature test value;
The 3rd setting module is used for when said theoretical confidence limit is the theory of oscillation design limit, in its scope, setting the initial vibration test value;
The 4th setting module is used for when said theoretical confidence limit is the high temperature and the vibration integrated Design Theory limit, in its scope, setting initial high temperature test value and initial vibration test value;
The 5th setting module is used for when said theoretical confidence limit is the low temperature and the vibration integrated Design Theory limit, in its scope, setting initial low-temperature test value and initial vibration test value;
Said test cell comprises:
First test module; Be used in high temperature Design Theory limit range; On the basis of the initial high temperature test value that first setting module is set, progressively increase current high temperature test value, product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing in each high temperature test value;
Second test module; Be used in low temperature Design Theory limit range; On the basis of the initial low-temperature test value that second setting module is set, gradually reduce current low-temperature test value, product is carried out the rapid temperature change and behind temperature stabilization, product carried out the reliable in function property testing in each low-temperature test value;
The 3rd test module; Be used in theory of oscillation design limit scope; On the basis of the initial vibration test value that the 3rd setting module is set, progressively increase current vibration-testing value, product is applied corresponding vibration stress and in the stable back of vibration product carried out the reliable in function property testing in each vibration-testing value;
The 4th test module; Be used in high temperature and vibration integrated Design Theory limit range; On the basis of initial high temperature test value that the 4th setting module is set and initial vibration test value, progressively increase current high temperature test value and correspondingly progressively increase the vibration-testing value, high temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each;
The 5th test module; Be used in low temperature and vibration integrated Design Theory limit range; On the basis of initial low-temperature test value that the 5th setting module is set and initial vibration test value, gradually reduce current low-temperature test value and correspondingly progressively increase the vibration-testing value, low-temperature test value and vibration-testing value are applied corresponding stress and vibration stress to product and product is carried out the reliable in function property testing with vibrating after stablizing in temperature at each.
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| CN201110304966.0A CN102426089B (en) | 2011-10-11 | 2011-10-11 | Method and device for realizing quick stress screen of product |
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| CN201110304966.0A CN102426089B (en) | 2011-10-11 | 2011-10-11 | Method and device for realizing quick stress screen of product |
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| CN102426089A true CN102426089A (en) | 2012-04-25 |
| CN102426089B CN102426089B (en) | 2014-01-15 |
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| CN108564224A (en) * | 2018-04-24 | 2018-09-21 | 华中科技大学 | A kind of time-optimized method and apparatus of environmental stress screening |
| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
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| CN114442593A (en) * | 2022-01-21 | 2022-05-06 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
| CN114442593B (en) * | 2022-01-21 | 2023-05-12 | 中国科学院苏州生物医学工程技术研究所 | High-temperature stress reliability strengthening test method for electric control system |
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