CN104685362B - 分析工具构件 - Google Patents

分析工具构件 Download PDF

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Publication number
CN104685362B
CN104685362B CN201380048417.9A CN201380048417A CN104685362B CN 104685362 B CN104685362 B CN 104685362B CN 201380048417 A CN201380048417 A CN 201380048417A CN 104685362 B CN104685362 B CN 104685362B
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CN
China
Prior art keywords
component
analysis instrument
detachable
gemstone
gemstone analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201380048417.9A
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English (en)
Chinese (zh)
Other versions
CN104685362A (zh
Inventor
J·杨
D·龚
R·阿萨蒂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Preece Di Mu Instrument Private LP
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Preece Di Mu Instrument Private LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Preece Di Mu Instrument Private LP filed Critical Preece Di Mu Instrument Private LP
Publication of CN104685362A publication Critical patent/CN104685362A/zh
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Publication of CN104685362B publication Critical patent/CN104685362B/zh
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/389Precious stones; Pearls
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00Component parts of measuring arrangements not specially adapted for a specific variable
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/18Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201380048417.9A 2012-09-17 2013-09-12 分析工具构件 Active CN104685362B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261702153P 2012-09-17 2012-09-17
US61/702,153 2012-09-17
PCT/SG2013/000402 WO2014042597A1 (en) 2012-09-17 2013-09-12 An analysis tool member

Publications (2)

Publication Number Publication Date
CN104685362A CN104685362A (zh) 2015-06-03
CN104685362B true CN104685362B (zh) 2017-10-13

Family

ID=50278544

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380048417.9A Active CN104685362B (zh) 2012-09-17 2013-09-12 分析工具构件

Country Status (4)

Country Link
US (1) US9341502B2 (cg-RX-API-DMAC7.html)
CN (1) CN104685362B (cg-RX-API-DMAC7.html)
IN (1) IN2015DN03151A (cg-RX-API-DMAC7.html)
WO (1) WO2014042597A1 (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD857535S1 (en) * 2016-10-28 2019-08-27 Sy Kessler Sales, Inc. Grip for a gem tester
USD826753S1 (en) * 2017-06-02 2018-08-28 Jubilee Diamond Instrument Limited Tester
WO2024018278A1 (en) * 2022-07-20 2024-01-25 Smart Pro Instrument Co., Ltd. Gemstone multi-tester instrument with removable probe

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4151462A (en) * 1977-04-13 1979-04-24 Teyler A Lee Electrical test probe having a spring biased clip with an extendable and retractable tip movable within the clip
US5124645A (en) * 1991-04-24 1992-06-23 The United States Of America As Represented By The Secretary Of The Air Force Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor
CN2603388Y (zh) * 2003-01-21 2004-02-11 许济苍 两功能宝石检测鉴别仪
US20040061487A1 (en) * 2001-04-11 2004-04-01 Reasoner Kelly J. Test probe including control device
US20050229698A1 (en) * 2004-04-12 2005-10-20 Beecroft Michael T Hand-held spectrometer
US20070257657A1 (en) * 2006-05-08 2007-11-08 Stevens Kerry A Current probing system
CN201765202U (zh) * 2010-07-09 2011-03-16 朱秀玲 多功能宝石测试仪
US20120013350A1 (en) * 2010-07-16 2012-01-19 Loginov Boris Z Apparatus for imitating thermal conductivity and electrical resistance of diamonds and their substitutes
US20120049836A1 (en) * 2010-06-21 2012-03-01 Kessler Daniel L Gem Tester

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4860753A (en) * 1987-11-04 1989-08-29 The Gillette Company Monitoring apparatus

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4151462A (en) * 1977-04-13 1979-04-24 Teyler A Lee Electrical test probe having a spring biased clip with an extendable and retractable tip movable within the clip
US5124645A (en) * 1991-04-24 1992-06-23 The United States Of America As Represented By The Secretary Of The Air Force Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor
US20040061487A1 (en) * 2001-04-11 2004-04-01 Reasoner Kelly J. Test probe including control device
CN2603388Y (zh) * 2003-01-21 2004-02-11 许济苍 两功能宝石检测鉴别仪
US20050229698A1 (en) * 2004-04-12 2005-10-20 Beecroft Michael T Hand-held spectrometer
US20070257657A1 (en) * 2006-05-08 2007-11-08 Stevens Kerry A Current probing system
US20120049836A1 (en) * 2010-06-21 2012-03-01 Kessler Daniel L Gem Tester
CN201765202U (zh) * 2010-07-09 2011-03-16 朱秀玲 多功能宝石测试仪
US20120013350A1 (en) * 2010-07-16 2012-01-19 Loginov Boris Z Apparatus for imitating thermal conductivity and electrical resistance of diamonds and their substitutes

Also Published As

Publication number Publication date
WO2014042597A1 (en) 2014-03-20
US20150233740A1 (en) 2015-08-20
HK1205790A1 (en) 2015-12-24
US9341502B2 (en) 2016-05-17
CN104685362A (zh) 2015-06-03
IN2015DN03151A (cg-RX-API-DMAC7.html) 2015-10-02

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