IN2015DN03151A - - Google Patents

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Publication number
IN2015DN03151A
IN2015DN03151A IN3151DEN2015A IN2015DN03151A IN 2015DN03151 A IN2015DN03151 A IN 2015DN03151A IN 3151DEN2015 A IN3151DEN2015 A IN 3151DEN2015A IN 2015DN03151 A IN2015DN03151 A IN 2015DN03151A
Authority
IN
India
Prior art keywords
characteristics information
probe
detachable
circuitry component
separate processing
Prior art date
Application number
Inventor
Joanne; Yeo
Darren; Koong
Reza; Assadi
Original Assignee
Presidium Instr Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Presidium Instr Pte Ltd filed Critical Presidium Instr Pte Ltd
Publication of IN2015DN03151A publication Critical patent/IN2015DN03151A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/389—Precious stones; Pearls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

A detachable member and a processing member for an analysis tool the detachable member comprising a housing for a probe member said probe member capable of obtaining one or more characteristics information; and a circuitry component for co operating with said member the circuitry component comprising one or more electrical connections for transmitting said one or more characteristics information to a separate processing member such that said one or more characteristics information is capable of being used by the separate processing member for analysis.
IN3151DEN2015 2012-09-17 2013-09-12 IN2015DN03151A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261702153P 2012-09-17 2012-09-17
PCT/SG2013/000402 WO2014042597A1 (en) 2012-09-17 2013-09-12 An analysis tool member

Publications (1)

Publication Number Publication Date
IN2015DN03151A true IN2015DN03151A (en) 2015-10-02

Family

ID=50278544

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3151DEN2015 IN2015DN03151A (en) 2012-09-17 2013-09-12

Country Status (5)

Country Link
US (1) US9341502B2 (en)
CN (1) CN104685362B (en)
HK (1) HK1205790A1 (en)
IN (1) IN2015DN03151A (en)
WO (1) WO2014042597A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD857535S1 (en) * 2016-10-28 2019-08-27 Sy Kessler Sales, Inc. Grip for a gem tester
USD826753S1 (en) * 2017-06-02 2018-08-28 Jubilee Diamond Instrument Limited Tester

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4151462A (en) * 1977-04-13 1979-04-24 Teyler A Lee Electrical test probe having a spring biased clip with an extendable and retractable tip movable within the clip
US4860753A (en) * 1987-11-04 1989-08-29 The Gillette Company Monitoring apparatus
US5124645A (en) 1991-04-24 1992-06-23 The United States Of America As Represented By The Secretary Of The Air Force Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor
US20020149384A1 (en) * 2001-04-11 2002-10-17 Reasoner Kelly J. Test probe including control device
CN2603388Y (en) * 2003-01-21 2004-02-11 许济苍 Two-function gemestone detection identifying instrument
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US7294995B1 (en) * 2006-05-08 2007-11-13 Tektronix, Inc. Current probing system
US8564316B2 (en) * 2010-06-21 2013-10-22 Sy Kessler Sales, Inc. Gem tester
CN201765202U (en) * 2010-07-09 2011-03-16 朱秀玲 Multifunctional gem testing instrument
US8278906B2 (en) * 2010-07-16 2012-10-02 Tri Electronics Inc. Apparatus for simulating thermal conductivity and electrical resistance of diamonds and their substitutes

Also Published As

Publication number Publication date
HK1205790A1 (en) 2015-12-24
WO2014042597A1 (en) 2014-03-20
CN104685362A (en) 2015-06-03
CN104685362B (en) 2017-10-13
US20150233740A1 (en) 2015-08-20
US9341502B2 (en) 2016-05-17

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