CN104678186B - The measuring system of capacitive touch screen sensor - Google Patents
The measuring system of capacitive touch screen sensor Download PDFInfo
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- CN104678186B CN104678186B CN201510073745.5A CN201510073745A CN104678186B CN 104678186 B CN104678186 B CN 104678186B CN 201510073745 A CN201510073745 A CN 201510073745A CN 104678186 B CN104678186 B CN 104678186B
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Abstract
The invention discloses a kind of measuring system of capacitive touch screen sensor, the measuring system is used for the node capacitor and Tandem resistance electric parameter for measuring capacitive touch screen sensor, it includes gating matrix, function switching unit, sampled measurements module, signal source and processing unit, gating matrix and function switching unit are controlled according to different measurement patterns by processing unit, gate different driving NEs or receive NE or node, and sampled measurements module is connected in different measuring circuits respectively, realize the measurement of the Tandem resistance electric parameter of any NE, and it can expeditiously complete the measurement of node capacitor electric parameter.
Description
Technical field
The present invention relates to capacitive touch screen field, more particularly to a kind of measuring system of capacitive touch screen sensor.
Background technology
At present, the electric parameter metering of capacitive touch screen sensor turns into capacitive touch screen industry basic demand,
But unified standard is not yet formed for the measurement, measure the item varies with measuring method, to the normal hair of the industry
Spread is into obstruction.
For capacitive touch screen sensor, its key parameter includes node capacitor, interchannel insulaion resistance, passage
The parameters such as series resistance.Wherein, node capacitor and insulaion resistance are product characteristic parameters itself, for driving network and receive net
The design and parameter setting of network have conclusive influence；And Tandem resistance be by driving network and receive network used by
What the factors such as material, pattern, technique were brought, belong to quadratic effect parameter.Delay and loss effect and section caused by the parameter
Point quantity is in square proportionate relationship, little on being influenceed caused by network application in node matrix equation scale is smaller；But with section
The growth of dot matrix scale, the parameter can produce serious attenuation loss to drive signal and reception signal, so as to influence product
Application performance, bring serious adverse effect in uniformity, stability and reliability of product etc..
At present, the measurement of the partial parameters such as the node capacitor for capacitive touch screen sensor, insulaion resistance, is typically adopted
With spot measurement mode, measurement accuracy can meet application demand substantially, but speed is relatively slow；Especially in sensor matrices section
When point scale is bigger, measurement efficiency causes producing line time of measuring to be grown, has tied down the production efficiency of overall producing line than relatively low.By
All be single ended leads in driving and receiving network, probe can only be applied at one end, then the driving for sensor, receive network
The measurement of aisle resistance, it will be unable to obtain using traditional V-I metering systems；In theory, can be Tandem resistance and node
Electric capacity is as an equivalent RC network, by complex impedance measurement mode, measures the real impedance and imaginary impedance of equivalent network, by
Real impedance calculates aisle resistance, and imaginary impedance calculates node capacitor.But single order RC network is mainly used in by the above method, and
Multiple node capacitors be present on each driving network of actual touch screen sensor, in addition to tested node, other nodes are not
By being floating, ground connection or use other processing means, the comprehensive effect in measurement influences that actual tested node will be much larger than
Capacitance so that there is uncertain error when equivalent with single order RC network in whole network, cause the essence of measurement result
Exactness and confidence level are very low, can not meet the requirement of practical application.
The content of the invention
It is a primary object of the present invention to provide a kind of measuring system of capacitive touch screen sensor, it is intended to solve measurement
When Tandem resistance and node capacitor electric parameter, the problem of existing efficiency is low, and error is big.
To achieve the above object, the present invention provides a kind of measuring system of capacitive touch screen sensor, the measuring system
For measuring the node capacitor and Tandem resistance electric parameter of capacitive touch screen sensor, the capacitive touch screen sensing
Device includes driving Internet and receives Internet, and the driving Internet includes some driving NEs be arrangeding in parallel, institute
Stating reception Internet includes some reception NEs be arrangeding in parallel；The driving NE and the reception NE
Vertical interlaced forms network and connected at node by the node capacitor, the driving NE and the reception
NE forms the Tandem resistance between the node capacitor two-by-two；The measuring system includes：
Gate matrix, for according to the corresponding driving NE of different measurement pattern gatings or receive NE or
Node capacitor；
Function switching unit, for according to different measurement patterns by the driving NE of gating or the reception
NE or the node capacitor on the driving NE or the node capacitor on the reception NE switch to phase
The measuring circuit answered measures；
Sampled measurements module, for being connected to electric parameter corresponding to corresponding measuring circuit sampled measurements；
Signal source, for providing the signal source of corresponding test pumping signal for the measuring circuit；
Processing unit, gated for control gating matrix according to different measurement patterns, control function switch unit
The data for the electric parameter for being switched over according to different measurement patterns and measuring sampled measurements module simultaneously carry out analysis meter calculation.
Preferably, the gating matrix includes some gating units, some gating interface ends, the first signal end, the second letter
Number end, the 3rd signal end, the 4th signal end and the 5th signal end, the gating unit include first port, second port, the 3rd
Port, the 4th port, fifth port, the 6th port, the first port of each gating unit are respectively connecting to corresponding gating interface
End, the second port of each gating unit are connected with first signal end, the 3rd port of each gating unit and the described second letter
Number end connection, the 4th port of each gating unit is connected with the 3rd signal end, the fifth port of each gating unit with it is described
4th signal end is connected, and the 6th port of each gating unit is connected with the 5th signal end；The driving network of the sensor
One end of unit and the one end for receiving NE are test port, and the test port is respectively connecting to the corresponding choosing
Logical interface end.
Preferably, when the gating matrix gates wherein one gating interface end and is connected with the gating interface end
During test port, then the driving NE corresponding to the test port or reception NE are strobed；When the gating square
During the test port of wherein described corresponding two intersections of battle array gating, then driving NE corresponding to test port is gated with connecing
The node capacitor for receiving the intersection of NE is strobed.
Preferably, the function switching unit includes sampling resistor, for switching corresponding measurement according to different measurement patterns
The first switch unit and second switch unit of circuit, the fixing end of the first switch unit and the sampled measurements module
First sampling end is connected, and the first switch terminal of the first switch unit is connected with the first signal end of the gating matrix, institute
The second switch terminal for stating first switch unit is connected with the secondary signal end of the gating matrix；The second switch unit is consolidated
Fixed end is connected with the second sampling end of the sampled measurements module, the sampled resistance of the first switch terminal of the second switch unit
Be connected with the first signal end of the gating matrix, the second switch terminal of the second switch unit gates the of matrix with described
Three signal ends connect.
Preferably, when the measuring system is Tandem resistance delay wastage measurement pattern, the first switch list
The fixing end of member is connected with the first switch terminal of the first switch unit, the fixing end of the second switch unit and described the
The first switch terminal connection of two switch elements；First sampling end of the sampled measurements module is through the first switch unit and institute
The first signal end connection of gating matrix is stated, the second sampling end of the sampled measurements module is through the second switch unit, institute
Sampling resistor is stated to be connected with the first signal end.
Preferably, when the measuring system is node capacitor measurement pattern, the fixing end of the first switch unit with
The second switch terminal connection of the first switch unit, the fixing end of the second switch unit and the second switch unit
Second switch terminal connects；First sampling end of the sampled measurements module is through the first switch unit and the gating matrix
Secondary signal end connects, and the second sampling end of the sampled measurements module is through the second switch unit and the gating matrix
3rd signal end connects.
Preferably, the sampled measurements module includes the first sampled measurements unit, the second sampled measurements unit, the 3rd sampling
Measuring unit, the 4th sampled measurements unit, the sampling end of the first sampled measurements unit is as the sampled measurements module
First sampling end is connected with the fixing end of the first switch unit, described in the sampling end conduct of the second sampled measurements unit
Second sampling end of sampled measurements module is connected with the fixing end of the second switch unit, the 3rd sampled measurements unit
Sampling end is connected as the 3rd sampling end of the sampled measurements module through the function switching unit with the 4th signal end, described
The sampling end of 4th sampled measurements unit as the sampled measurements module the 4th sampling end through the function switching unit with
5th signal end connects.
Preferably, when the measuring system is Tandem resistance delay wastage measurement pattern, the signal source is sent
Pumping signal be carried in the both ends of the measuring circuit, the first sampled measurements unit measures the electric current of the sampling resistor
Signal, the second sampled measurements unit measure the total voltage signal of the measuring circuit, and the 3rd sampled measurements unit is adopted
Sample is close to the ascending current time of the driving NE or the node capacitor for the measurement port for receiving NE, and described the
Four sampled measurements unit samplings away from it is described driving NE or receive NE measurement port node capacitor it is upper
Rise current time；Measured each signal is transferred to processing unit by the sampled measurements module, and the processing unit is according to each
The value of the Tandem resistance is calculated in signal analysis.
Preferably, when the measuring system is node capacitor measurement pattern, the pumping signal that the signal source is sent adds
The both ends of the measuring circuit are loaded in, the first sampled measurements unit measures the current signal of wherein one node capacitor,
The second sampled measurements unit measures the current signal of wherein one node capacitor, the 3rd sampled measurements unit measurement
The current signal of wherein one node capacitor, the 4th sampled measurements unit measure the electric current of wherein one node capacitor
Signal；Measured each signal is transferred to processing unit by the sampled measurements module, and the processing unit is according to each signal point
The value of each node capacitor is calculated in analysis.
Preferably, the output end of the signal source is connected through the sampling resistor with first signal end.
A kind of measuring system of capacitive touch screen sensor provided by the present invention, gating square is controlled by processing unit
Battle array and function switching unit turn on different driving NEs or receive NE or section according to different measurement patterns
Point, and sampled measurements module is connected in different measuring circuits respectively, realize the Tandem of any NE
The measurement of resistance electric parameter, and can expeditiously complete the measurement of node capacitor electric parameter.
Brief description of the drawings
Fig. 1 is the structural representation of the sensor of capacitive touch screen of the present invention；
Fig. 2 is the high-level schematic functional block diagram of present pre-ferred embodiments；
Fig. 3 is the circuit connection diagram of the first test pattern of present pre-ferred embodiments；
Fig. 4 is second of test mode circuit connection diagram of present pre-ferred embodiments.
The realization, functional characteristics and advantage of the object of the invention will be described further referring to the drawings in conjunction with the embodiments.
Embodiment
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
The present invention provides a kind of measuring system of capacitive touch screen sensor.
In embodiments of the present invention, reference picture 1, Fig. 1 be capacitive touch screen sensor structural representation, the condenser type
Touch panel sensor 100 includes driving Internet 110 and receives Internet 120, and the driving Internet 110 includes some parallel
The driving NE 111 of setting, the reception Internet 120 include some reception NEs 121 be arrangeding in parallel；It is described
Driving NE 111 forms network with reception NE 121 vertical interlaced and passes through the section at node
Point electric capacity Ci connections, the driving NE 111 and the reception NE 121 are between the node capacitor Ci two-by-two
Form the Tandem resistance Ri.
Reference picture 2, Fig. 2 are the high-level schematic functional block diagram of present pre-ferred embodiments, the capacitive touch screen sensor
Measuring system includes：
Matrix 200 is gated, for according to the different corresponding driving NEs 111 of measurement pattern gating or reception network
Unit 121 or node capacitor Ci；
Function switching unit 300, for according to different measurement patterns by the driving NE 111 of gating or institute
The node capacitor Ci or described received on NE 121 or the driving NE 111 is stated to receive on NE 121
Node capacitor Ci switches to corresponding measuring circuit and measured；
Sampled measurements module 400, for being connected to electric parameter corresponding to corresponding measuring circuit sampled measurements；
Signal source Vs, for providing corresponding test pumping signal for the measuring circuit；
Processing unit 500, for controlling gating, matrix 200 is gated according to different measurement patterns, control function is cut
The data for changing the electric parameter that unit 300 switches over according to different measurement patterns and measures sampled measurements module 400 are gone forward side by side
Row analysis calculates.
Specifically, it is described gating matrix 200 include some gating units 210, some gating interface ends, the first signal end,
Secondary signal end, the 3rd signal end, the 4th signal end, the 5th signal end, the gating unit 210 include first port, second
Port, the 3rd port, the 4th port, fifth port, the 6th port, the first port of each gating unit 210 are respectively connecting to pair
The gating interface end answered, the second port of each gating unit 210 are connected with first signal end, and the of each gating unit 210
Three ports are connected with the secondary signal end, and the 4th port of each gating unit 210 is connected with the 3rd signal end, each gating
The fifth port of unit 210 is connected with the 4th signal end, the 6th port and the 5th signal end of each gating unit 210
Connection；One end of the driving NE 111 and the one end for receiving NE 121 are test port, the test lead
Mouth is respectively connecting to the corresponding gating interface end.Whether is the above-mentioned break-make respectively connected, can be provided by processing unit 500
Control signal be respectively controlled.When control signal selects to connect, referred to as strobe state；When control signal selects disjunction
When, referred to as disarmed state.
When the test lead that the gating matrix 200 gates one of gating interface end and is connected with the gating interface end
Mouthful, now, driving NE 111 or reception NE 121 corresponding to the test port are strobed, the driving network list
Each Tandem resistance of member 111 or reception NE 121 is located in measuring circuit；When the gating matrix 200 gating choosing
During the test port of logical wherein described corresponding two intersections, then driving NE 111 corresponding to test port is gated with connecing
The node capacitor Ci for receiving the intersection of NE 121 is in measuring circuit.
Specifically, the inside of gating unit 210 switchs the switch arrays to be formed for several low-impedance analogs, the array
In, each switching on-off state can be selected by the control signal that processing unit 500 provides.
The sampled measurements module 400 includes the first sampled measurements unit 410, the second sampled measurements unit the 420, the 3rd is adopted
Sample measuring unit 430, the 4th sampled measurements unit 440, the sampling end of the first sampled measurements unit 410 is as the sampling
First sampling end of measurement module 400 is connected with the fixing end of the first switch unit 310, the second sampled measurements unit
420 sampling end connects as the second sampling end of the sampled measurements module 400 and the fixing end of the second switch unit 320
Connect, the sampling end of the 3rd sampled measurements unit 430 is cut as the 3rd sampling end of the sampled measurements module 400 through function
Change unit 300 to be connected with the 4th signal end, the sampling end of the 4th sampled measurements unit 440 is as the sampled measurements
4th sampling end of module 400 is connected through function switching unit 300 with the 5th signal end.
Function switching unit 300 includes sampling resistor Rs, for switching corresponding measuring circuit according to different measurement patterns
First switch unit 310 and second switch unit 320, the fixing end of the first switch unit 310 are surveyed with the described first sampling
Measure the first sampling end connection of unit 410, the first switch terminal of the first switch unit 310 and the gating matrix 200
First signal end connects, and the second switch terminal of the first switch unit 310 and the secondary signal end of the gating matrix 200 connect
Connect；The fixing end of the second switch unit 320 is connected with the second sampling end of the second sampled measurements unit 420, described
The sampled resistance Rs of the first switch terminal of second switch unit 320 is connected with the first signal end of the gating matrix 200, described
Second switch terminal of second switch unit 320 is connected with the 3rd signal end of the gating matrix 200.
When the measuring system is Tandem resistance delay wastage measurement pattern, the first switch unit 310
Fixing end is connected with the first switch terminal of the first switch unit 310, the fixing end of the second switch unit 320 with it is described
The first switch terminal connection of second switch unit 320；First sampling end of the first sampled measurements unit 410 is through described first
Switch element 310 is connected with the first signal end of the gating matrix 200, and the second of the second sampled measurements unit 420 adopts
Sample end is connected through the second switch unit 320, the sampling resistor Rs with the first signal end.
When the measuring system is node capacitor measurement pattern, the fixing end of the first switch unit 310 with it is described
The second switch terminal connection of first switch unit 310, the fixing end of the second switch unit 320 and the second switch unit
320 the second switch terminal connection；First sampling end of the sampled measurements module 400 is through the first switch unit 310 and institute
The secondary signal end connection of gating matrix 200 is stated, the second sampling end of the sampled measurements module 400 is through the second switch list
Member 320 is connected with the 3rd signal end of the gating matrix 200.
The sampled resistance Rs of pumping signal is connected with the first signal end, in the present embodiment, the first signal end conduct
Encourage end.
Reference picture 3, Fig. 3 are the circuit connection diagram of the first test pattern of present pre-ferred embodiments；The survey
Amount system is under Tandem resistance delay wastage measurement pattern, and now, the control gating matrix 200 of processing unit 500 gates
One of driving NE 111 receives NE 121, and the present embodiment drives NE to gate one of them
Illustrated exemplified by 111.The driving NE 111 constitutes following measuring circuit：Several resistant series R1, R2 ... Ri,
And each two resistance node location be respectively connected with node capacitor C1, C2 ... Ci, node capacitor C1, C2 ... the Ci other end with
Ground connects；The measuring circuit is sequentially connected with equivalent to several RC networks.Now, the sampled resistance Rs of signal source Vs, the first letter
The ramp voltage signal of fixed slope is carried in the both ends of measuring circuit by number end, whole to drive for providing pumping signal
Measure network.
Fixing end of the first sampled measurements unit 410 successively through first switch unit 310, the of first switch unit 310
One switch terminal is connected to the first signal end, for gathering the voltage signal of whole measuring circuit over the ground；Second sampled measurements unit
420 fixing end, the first switch terminal of second switch unit 320 successively through second switch unit 320 is connected to the first signal end,
So as to which the second sampled measurements unit 420 is in parallel with the sampling resistor Rs, for gathering the total current signal of whole measuring circuit；
First sampled measurements unit 410 and the second sampled measurements unit 420 monitoring be driving voltage signal caused by signal source Vs and
Total driving current signal, in measuring circuit normal operation, driving voltage signal and total driving current signal will meet expected numbers
According to；When measuring circuit appearance electric leakage, short circuit or open circuit etc. are abnormal, the ripple of above-mentioned driving voltage signal and total driving current signal
Shape will appear from exception, can be analyzed and judged by the Monitoring Data of processing unit 500, be easy to sentence abnormality
It is disconnected, avoid whole measurement process from false judgment occur, influence the correctness of measurement result.
In order to measure the Tandem resistance of whole measuring circuit, according to the delay effect of RC network, close to the driving net
The node capacitor C1 of the measurement port of network unit 111, the current rise time under signal source Vs pumping signal will be faster than only
Node capacitor C2 current rise times inferior to node capacitor C1, by that analogy, the electricity of the node capacitor Ci away from measurement port
It is most slow to flow the rise time.Therefore when using some current reference value as benchmark, for same pumping signal, node capacitor C1
To shift to an earlier date at the time of reaching reference current in node capacitor Ci, the time difference Δ T of the two and each section Tandem resistance R1, R2 ...
The parameters such as Ri, each node capacitor C1, C2 ... Ci and node total number are related, and due to the first sampled measurements unit 410 to the 4th
Sampled measurements unit 440 is sampled by identical frequency continuous synchronization, so as to be reached by node capacitor C1 and node capacitor Ci
Time interval during reference current can calculate Δ T, and due to node total number, it is known that each node capacitor C1, C2 ... Ci
Standard value is known and basically identical, summary condition, you can extrapolates each Tandem resistance of the driving NE 111
The resistance of R1, R2 ... Ri resistances and overall channel series resistance R.Through above-mentioned analysis, the node electricity close to measurement port need to be only measured
Hold C1 and the node capacitor Ci away from measurement port current rise time.
Processing unit 500 will control gating matrix 200 to gate close to the node capacitor C1 of measurement port and away from measurement end
The node capacitor Ci of mouth, the node capacitor C1 that will be close to measurement port pass through the 4th signal end and the 3rd sampled measurements unit 430
Connection, so as to which node capacitor C1 is grounded through the 3rd sampled measurements unit 430, the measuring node electric capacity of the 3rd sampled measurements unit 430
C1 current value, processing unit 500 will record node capacitor C1 rise time；The node capacitor Ci that will be far from measurement port leads to
Cross the 5th signal end to be connected with the 4th sampled measurements unit 440, so as to which node capacitor Ci connects through the 4th sampled measurements unit 440
Ground, the measuring node electric capacity Ci of the 4th sampled measurements unit 440 current value, processing unit 500 will record the upper of node capacitor Ci
Rise the time.Now, processing unit 500 analyzes the time difference for the ascending current that node capacitor C1 and node capacitor Ci is calculated,
So as to draw the resistance of overall channel series resistance.
Pass through the above method, it is possible to achieve apply in any driving NE 111 or the one end for receiving NE 121
Probe can complete the measurement of channels in series resistance, and measurement accuracy is high, and reliability is high.
Reference picture 4, Fig. 4 are second of test mode circuit connection diagram of present pre-ferred embodiments；The measurement
System is under node capacitor measurement pattern, and now, the control gating gating of matrix 200 of processing unit 500 gating four is different
Node capacitor.Because a node capacitor Ci is correspondingly connected in the intersection of a driving NE 111 and a receiving unit,
So as to which processing unit 500 will control gating matrix 200 to gate 4 driving NEs 111 and 4 reception NEs simultaneously
121.Now, the first switch unit 310 of function switching unit 300 will switch to the second switch terminal from the first switch terminal, i.e., and
Fixing end, second switch terminal of first switch unit 310 of the one sampled measurements unit 410 successively through first switch unit 310 connect
The secondary signal end of gating matrix 200 is connected to, one of node capacitor Ci of gating is transferred to first and adopted by gating matrix 200
First sampling end of sample measuring unit 410；The second switch unit 320 of function switching unit 300 will switch from the first switch terminal
To the second switch terminal, i.e. fixing end of the second sampled measurements unit 420 successively through second switch unit 320, second switch unit
320 the second switch terminal is connected to the 3rd signal end of gating matrix 200, gates matrix 200 by the other in which section of gating
Point electric capacity Cj is transferred to the second sampling end of the second sampled measurements unit 420；Matrix 200 is gated by two other node of gating
Electric capacity Cm, Cn are transferred to the 3rd sampling end of the 3rd sampled measurements unit 430, the 5th signal end transmission through the 4th signal end respectively
To the 4th sampling end of the 4th sampled measurements unit 440.The signal source Vs sampled resistance Rs of pumping signal is connected to the first letter
Number end, as whole measuring circuit provide the ramp voltage signal of fixed slope.
When applying the ramp voltage of fixed slope, all node capacitors in same measuring circuit are all by coupling charging electricity
Stream, and the rise time of each Capacitance Coupled electric current is different.But as long as ramp voltage waveform adheres to the sufficiently long time,
Charging current on all node capacitor Ci will all enter stable state, and now, the pressure drop between each node on aisle resistance also will
Into stable state, its changing value is extremely faint, can ignore.Therefore, input voltage rate of change in this case will be straight
Connect and be applied to node capacitor both ends, the electric current of each node capacitor output is related to capacitance and input voltage rate of change, passes through
Measurement to the output current of node capacitor, you can draw the capacitance of node capacitor.
Analysis calculating is carried out by measuring the current output value of each node capacitor and transmitting to processing unit 500, you can
The capacitance of each node capacitor is drawn, by above-mentioned measuring circuit, can be switched under channels in series resistance measurement pattern, i.e.,
The capacitance size of four node capacitors can be measured simultaneously, and so as to improve the testing efficiency of node capacitor, and cost is relatively low.
The measuring system is additionally operable to measure the insulaion resistance electric parameter of the capacitive touch screen sensor, when the survey
When amount system is insulation measurement pattern, the pumping signal of the signal source Vs is direct current signal, the sampled measurements module
400 metering system is identical with the node capacitor measurement pattern, does not repeat one by one herein.
The preferred embodiments of the present invention are these are only, are not intended to limit the scope of the invention, it is every to utilize this hair
The equivalent structure or equivalent flow conversion that bright specification and accompanying drawing content are made, or directly or indirectly it is used in other related skills
Art field, is included within the scope of the present invention.
Claims (10)
1. a kind of measuring system of capacitive touch screen sensor, the measuring system is used to measure capacitive touch screen sensor
Node capacitor and Tandem resistance electric parameter, the capacitive touch screen sensor include driving Internet and receive network
Layer, the driving Internet include some driving NEs be arrangeding in parallel, and the reception Internet parallel is set including some
The reception NE put；The driving NE forms network with the reception NE vertical interlaced and saved
Connected at point by the node capacitor, the driving NE is with the reception NE in the node capacitor two-by-two
Between form the Tandem resistance；Characterized in that, the measuring system includes：
Matrix is gated, for according to the different corresponding driving NEs of measurement pattern gating or reception NE or node
Electric capacity；
Function switching unit, for according to different measurement patterns by the driving NE of gating or the reception network
Unit or the node capacitor on the driving NE or the node capacitor on the reception NE switch to accordingly
Measuring circuit measures；
Sampled measurements module, for being connected to electric parameter corresponding to corresponding measuring circuit sampled measurements；
Signal source, for providing the signal source of corresponding test pumping signal for the measuring circuit；
Processing unit, for control gating matrix gated according to different measurement patterns, control function switch unit according to
The data for the electric parameter that different measurement patterns switches over and measures sampled measurements module simultaneously carry out analysis meter calculation.
2. the measuring system of capacitive touch screen sensor as claimed in claim 1, it is characterised in that the gating matrix bag
Include some gating units, some gating interface ends, the first signal end, secondary signal end, the 3rd signal end, the 4th signal end and
Five signal ends, the gating unit include first port, second port, the 3rd port, the 4th port, fifth port, the 6th end
Mouthful, the first port of each gating unit be respectively connecting to corresponding to gating interface end, the second port of each gating unit with it is described
First signal end is connected, and the 3rd port of each gating unit is connected with the secondary signal end, the 4th port of each gating unit
It is connected with the 3rd signal end, the fifth port of each gating unit is connected with the 4th signal end, and the of each gating unit
Six ports are connected with the 5th signal end；One end of the driving NE of the sensor and the one of reception NE
Hold and be respectively connecting to the corresponding gating interface end for test port, the test port.
3. the measuring system of capacitive touch screen sensor as claimed in claim 2, it is characterised in that when the gating matrix
When end gates wherein one gating interface end and the test port being connected with the gating interface end, then test port institute is right
The driving NE or reception NE answered are strobed；When wherein described corresponding two friendships of gating matrix end gating
During the test port of fork, then the node electricity of intersection of the driving NE corresponding to test port with receiving NE is gated
Appearance is strobed.
4. the measuring system of capacitive touch screen sensor as claimed in claim 2, it is characterised in that the function switch list
Member includes sampling resistor, first switch unit and second switch list for switching corresponding measuring circuit according to different measurement patterns
Member, the fixing end of the first switch unit are connected with the first sampling end of the sampled measurements module, the first switch list
First switch terminal of member is connected with the first signal end of the gating matrix, the second switch terminal of the first switch unit and institute
State the secondary signal end connection of gating matrix；The fixing end of the second switch unit is adopted with the second of the sampled measurements module
Sample end connects, and the first signal end of the sampled resistance of the first switch terminal of the second switch unit and the gating matrix connects
Connect, the second switch terminal of the second switch unit is connected with the 3rd signal end of the gating matrix.
5. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterised in that when the measuring system
For Tandem resistance delay wastage measurement pattern when, the fixing end of the first switch unit and the first switch unit
First switch terminal is connected, and the fixing end of the second switch unit is connected with the first switch terminal of the second switch unit；Institute
The first sampling end for stating sampled measurements module is connected through the first switch unit with the first signal end of the gating matrix, institute
The second sampling end for stating sampled measurements module is connected through the second switch unit, the sampling resistor with the first signal end.
6. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterised in that when the measuring system
For node capacitor measurement pattern when, the second switch terminal of the fixing end of the first switch unit and the first switch unit connects
Connect, the fixing end of the second switch unit is connected with the second switch terminal of the second switch unit；The sampled measurements mould
First sampling end of block is connected through the first switch unit with the secondary signal end of the gating matrix, the sampled measurements mould
Second sampling end of block is connected through the second switch unit with the 3rd signal end of the gating matrix.
7. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterised in that the sampled measurements mould
Block includes the first sampled measurements unit, the second sampled measurements unit, the 3rd sampled measurements unit, the 4th sampled measurements unit, institute
State first sampling end and the first switch unit of the sampling end of the first sampled measurements unit as the sampled measurements module
Fixing end connection, the second sampling end and institute of the sampling end of the second sampled measurements unit as the sampled measurements module
The fixing end connection of second switch unit is stated, the sampling end of the 3rd sampled measurements unit is as the sampled measurements module
3rd sampling end is connected through the function switching unit with the 4th signal end, the sampling end conduct of the 4th sampled measurements unit
4th sampling end of the sampled measurements module is connected through the function switching unit with the 5th signal end.
8. the measuring system of capacitive touch screen sensor as claimed in claim 7, it is characterised in that when the measuring system
For Tandem resistance delay wastage measurement pattern when, the pumping signal that the signal source is sent is carried in the measuring circuit
Both ends, the first sampled measurements unit measure the current signal of the sampling resistor, the second sampled measurements unit measurement
The total voltage signal of the measuring circuit, the 3rd sampled measurements unit sampling is close to the driving NE or receives net
The ascending current time of the node capacitor of the measurement port of network unit, the 4th sampled measurements unit sampling is away from the driving
The ascending current time of the node capacitor of the measurement port of NE or reception NE；The sampled measurements module is by institute
Each signal measured is transferred to processing unit, and the Tandem resistance is calculated according to each signal analysis in the processing unit
Value.
9. the measuring system of capacitive touch screen sensor as claimed in claim 8, it is characterised in that when the measuring system
For node capacitor measurement pattern when, the pumping signal that the signal source is sent is carried in the both ends of the measuring circuit, described
One sampled measurements unit measures the current signal of wherein one node capacitor, the second sampled measurements unit measurement wherein one
The current signal of the node capacitor, the 3rd sampled measurements unit measure the current signal of wherein one node capacitor,
The 4th sampled measurements unit measures the current signal of wherein one node capacitor；The sampled measurements module is by measured by
Each signal be transferred to processing unit, the value of each node capacitor is calculated according to each signal analysis for the processing unit.
10. the measuring system of capacitive touch screen sensor as claimed in claim 8 or 9, it is characterised in that the signal source
Output end be connected through the sampling resistor with first signal end.
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| CN105403752A (en) * | 2015-12-08 | 2016-03-16 | 重庆地质仪器厂 | Method and device for measuring electrode |
| CN105676053B (en) * | 2016-02-23 | 2018-09-25 | 上海芯什达电子技术有限公司 | A kind of touch screen defect detecting system |
| CN106370967B (en) * | 2016-09-12 | 2019-06-28 | 京东方科技集团股份有限公司 | A kind of touch-control structure, its test method, touch screen and display device |
| CN106526332B (en) * | 2016-10-25 | 2020-01-17 | 华南师范大学 | System and method for detecting capacitance on scanning line of capacitive touch screen |
| CN107799845B (en) * | 2017-10-23 | 2023-10-20 | 深圳市科列技术股份有限公司 | Battery management system and battery switching matrix interlocking circuit and interlocking method thereof |
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