CN103308776A - Testing circuit of capacitive screen and testing method thereof - Google Patents
Testing circuit of capacitive screen and testing method thereof Download PDFInfo
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Abstract
The invention discloses a testing circuit of a capacitive screen and a testing method thereof. The testing method comprises the following steps: a controller receives an external testing signal, and starts a charging and discharging circuit; the charging and discharging circuit charges each tested capacitor; and the controller converting a count value generated by each tested capacitor in a charging or discharging process into the capacitance value of each tested capacitor, compares the capacitance value with a preset capacitance value range, judging that the tested capacitor is qualified if the capacitance value is within the preset capacitance value range, and judging that the tested capacitor is unqualified if the capacitance value is out of the preset capacitance value range. The testing circuit and the testing method have the advantages of short total testing time, high efficiency, elimination of troubles during manual testing of the capacitive screen or microscopic examination, low labor cost and high accuracy; and meanwhile, the capacitance value of each tested capacitor can be converted directly, and the electrical characteristics of the capacitive screen can be judged more intuitively.
Description
Technical field
The present invention relates to a kind of test circuit and method of testing thereof of capacitance plate.
Background technology
Existing factory end can shield the logical of sensor line by testing capacitor, short, disconnected method mainly contains, method one: directly ride on the sensor line with multitester probe and to test, because pickup wire route ITO makes now, the connecting line width that is connected with ITO is below 30 microns or 30 microns, the spacing of etween the lines is also below 30 microns, and the resistance value of ITO material is large, article one, the resistance of passage is more than 8K ohm, above phenomenon has determined the measuring accuracy with multitester probe, tester's performance accuracy and eyesight all can't be accurate, test out easily the logical of sensor, short, disconnected phenomenon, and what obtain when measuring is a resistance value, can not react the capacitive sensing amount of sensor, can't be judged the response characteristic of sensor.Method two: microscopic method, by the method for microscope amplification sensor lead-in wire touch-screen to be carried out Physics View to look into, this method is to look into to have or not short circuit between the sensor or open circuit by sight screen is measured, need see each position of screen and look into, the survey crew workload is large, speed is slower, can't the electrical specification of screen be judged.
Summary of the invention
The invention provides a kind of test circuit and method of testing thereof of capacitance plate, it has overcome the existing deficiency of background technology.
One of technical scheme that adopts that the present invention solves its technical matters is:
A kind of test circuit of capacitance plate, described capacitance plate has conductive layer, this conductive layer is comprised of many strip electrodes, form a measured capacitance (800) between electrode and the ground, it is characterized in that, comprise: for the charge-discharge circuit (100) that measured capacitance is carried out charge or discharge, be used for when measured capacitance (800) charge or discharge, producing the pulse oscillator (200) of pulse, the counter (300) that is used for the umber of pulse of calculating pulse oscillator (200), be used for memory counter (300) numerical value storer (400) and the numerical value of counter (300) can be converted into the controller (500) of the capacitance of measured capacitance (800), described controller (500) is electrically connected charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), the electrode of capacitance plate is electrically connected charge-discharge circuit (100), counter (300) is electrically connected charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) is electrically connected pulse oscillator (200).
Among one preferred embodiment: also comprise: be used for the display (600) of the capacitance of demonstration measured capacitance, described display (600) signal connects controller (500).
Among one preferred embodiment: also comprise: gauge tap (700), described gauge tap (700) are connected between the electrode and charge-discharge circuit (100) of capacitance plate.
Among one preferred embodiment: described charge-discharge circuit is a capacitor.
The present invention solve its technical matters the technical scheme that adopts two be: use the method for testing of the capacitance plate of above-mentioned test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, controller produces each measured capacitance in charging or discharge process count value is converted to the capacitance of each measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
The present invention solve its technical matters the technical scheme that adopts three be: use the method for testing of the capacitance plate of above-mentioned test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
The present invention solve its technical matters the technical scheme that adopts four be: use the method for testing of the capacitance plate of above-mentioned test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, repeating step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
Above-mentioned technical scheme is compared with background technology, and it has following advantage:
1. this test circuit structure is simple, cost is low, being fit to most factory uses, popularity rate is high, and use the method for testing of this test circuit, adopt charge-discharge circuit that measured capacitance is charged or discharge, owing to the electrode size of capacitance plate is little, to the required time of its charge or discharge be the microsecond rank, so that the whole test duration is short, efficient is high, and has removed manual testing's capacitance plate or fractographic trouble from, and cost of labor is low, precision is high, simultaneously, can directly converse the capacitance of each measured capacitance of capacitance plate, the electrical specification of capacitance plate judges more intuitively.
2. charge-discharge circuit adopts capacitor, and capacitor is directly to electrode charge or the discharge of measured capacitance, discharges and recharges effectively, and efficient is higher, and cost is also lower.
3. can be scaled by the count value of charging process the capacitance of measured capacitance, also can convert by the count value of discharge process, perhaps, also can convert by the weighted mean value of charging and discharging process, also can the mode that measured capacitance is carried out repeated charge and calculated the mean value that discharges and recharges be converted, thus, can set different test modes according to different capacitance plates, compatibility is strong.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples.
Fig. 1 has illustrated the electrical block diagram of test circuit of a kind of capacitance plate of a preferred embodiment.
Fig. 2 has illustrated the control flow chart of controller.
Fig. 3 has illustrated the process flow diagram of method of testing.
Embodiment
Please refer to Fig. 1, an a kind of preferred embodiment of test circuit of capacitance plate, the test circuit of described a kind of capacitance plate, it comprises charge-discharge circuit 100, pulse oscillator 200, counter 300, storer 400, controller 500 and display 600.
Described capacitance plate has conductive layer, and this conductive layer is comprised of many strip electrodes, forms a measured capacitance 800 between electrode and the ground.In Fig. 1, measured capacitance 800 numbers are made as two, not as limit, can be made as a plurality ofly, are as the criterion with the virtual electrode quantity of capacitance plate.
Described charge-discharge circuit 100 is used for measured capacitance is carried out charge or discharge.In the present embodiment, described charge-discharge circuit 100 is a capacitor.This charge-discharge circuit 100 is electrically connected with electrode tip, controller 500, counter 300 and the pulse oscillator 200 of measured capacitance.
Described pulse oscillator 200 is used for producing pulse when measured capacitance 800 charge or discharge, itself and counter 300 and controller 500 are electrically connected.
Described counter 300 is used for calculating the umber of pulse of pulse oscillator 200, and itself and controller 500 and storer 400 are electrically connected.
Described storer 400 is used for the numerical value of memory counter 300, and itself and controller 500 are electrically connected.
Described display 600 is used for showing the capacitance of measured capacitance, and it is connected with controller 500 signals.
Described controller 500 can be converted into the numerical value of counter 300 capacitance of measured capacitance 800.
In the present embodiment, this test circuit also comprises gauge tap 700, and described gauge tap 700 is connected between the electrode tip and charge-discharge circuit 100 of measured capacitance.
A kind of specific embodiment one of method of testing of capacitance plate:
A kind of method of testing of capacitance plate comprises:
Step 10, the test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, also namely, the count value of counter can be converted into the duration of charging of measured capacitance, stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer, at this moment, can automatic clear when counter is prepared the vibration number of next measured capacitance counted;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, when reaching preset value, the electrode ports magnitude of voltage stops discharge, counter stops counting, count value is stored in the storer meeting automatic clear when counter preparation is counted the vibration number of next measured capacitance;
Step 40, controller produces each measured capacitance in charging or discharge process count value is converted to the capacitance of each measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.In the present embodiment, the capacitance of each measured capacitance can show by display, and test result also can show by display.In the present embodiment, after controller has conversed the capacitance of each measured capacitance and test result has been judged, start immediately communicating interrupt, also be, by gauge tap measured capacitance and charge-discharge circuit are disconnected, again the capacitance of measured capacitance and test result are delivered to display and show.
A kind of specific embodiment two of method of testing of capacitance plate:
A kind of method of testing of capacitance plate comprises:
Step 10, the test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, when reaching preset value, the electrode ports magnitude of voltage stops charging, counter stops counting, count value is stored in the storer meeting automatic clear when counter preparation is counted the vibration number of next measured capacitance;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, when reaching preset value, the electrode ports magnitude of voltage stops discharge, counter stops counting, count value is stored in the storer meeting automatic clear when counter preparation is counted the vibration number of next measured capacitance;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.In the present embodiment, the capacitance of each measured capacitance can show by display, and test result also can show by display.In the present embodiment, after controller has conversed the capacitance of each measured capacitance and test result has been judged, start immediately communicating interrupt, also be, by gauge tap measured capacitance and charge-discharge circuit are disconnected, again the capacitance of measured capacitance and test result are delivered to display and show.
A kind of specific embodiment three of method of testing of capacitance plate:
A kind of method of testing of capacitance plate comprises:
Step 10, the test control sends test signal, and controller receives test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, when reaching preset value, the electrode ports magnitude of voltage stops charging, counter stops counting, count value is stored in the storer meeting automatic clear when counter preparation is counted the vibration number of next measured capacitance;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, when reaching preset value, the electrode ports magnitude of voltage stops discharge, counter stops counting, count value is stored in the storer meeting automatic clear when counter preparation is counted the vibration number of next measured capacitance;
Step 40, repeating step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.In the present embodiment, the capacitance of each measured capacitance can show by display, and test result also can show by display.In the present embodiment, after controller has conversed the capacitance of each measured capacitance and test result has been judged, start immediately communicating interrupt, also be, by gauge tap measured capacitance and charge-discharge circuit are disconnected, again the capacitance of measured capacitance and test result are delivered to display and show.
The above, only for preferred embodiment of the present invention, therefore can not limit according to this scope of the invention process, the equivalence of namely doing according to claim of the present invention and description changes and modifies, and all should still belong in the scope that the present invention contains.
Claims (7)
1. the test circuit of a capacitance plate, described capacitance plate has conductive layer, this conductive layer is comprised of many strip electrodes, form a measured capacitance (800) between electrode and the ground, it is characterized in that, comprise: for the charge-discharge circuit (100) that measured capacitance is carried out charge or discharge, be used for when measured capacitance (800) charge or discharge, producing the pulse oscillator (200) of pulse, the counter (300) that is used for the umber of pulse of calculating pulse oscillator (200), be used for memory counter (300) numerical value storer (400) and the numerical value of counter (300) can be converted into the controller (500) of the capacitance of measured capacitance (800), described controller (500) is electrically connected charge-discharge circuit (100), pulse oscillator (200), counter (300) and storer (400), the electrode of capacitance plate is electrically connected charge-discharge circuit (100), counter (300) is electrically connected charge-discharge circuit (100), pulse oscillator (200) and storer (400), charge-discharge circuit (100) is electrically connected pulse oscillator (200).
2. the test circuit of a kind of capacitance plate according to claim 1 is characterized in that: also comprise: be used for the display (600) of the capacitance of demonstration measured capacitance, described display (600) signal connection controller (500).
3. the test circuit of a kind of capacitance plate according to claim 1, it is characterized in that: also comprise: gauge tap (700), described gauge tap (700) are connected between the electrode and charge-discharge circuit (100) of capacitance plate.
4. the test circuit of a kind of capacitance plate according to claim 1, it is characterized in that: described charge-discharge circuit (100) is a capacitor.
5. application rights requires the method for testing of the capacitance plate of 1 or 2 or 3 or 4 test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, controller produces each measured capacitance in charging or discharge process count value is converted to the capacitance of each measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
6. application rights requires the method for testing of the capacitance plate of 1 or 2 or 3 or 4 test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
7. application rights requires the method for testing of the capacitance plate of 1 or 2 or 3 or 4 test circuit, it is characterized in that: comprising:
Step 10, controller receives outside test signal, starts charge-discharge circuit;
Step 20, charge-discharge circuit successively charges to each measured capacitance: during charging, the counter successively umber of pulse of paired pulses oscillator is counted, and stops charging when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 30, charge-discharge circuit successively discharges to each measured capacitance: during discharge, the counter successively umber of pulse of paired pulses oscillator is counted, and stops discharge when the electrode ports magnitude of voltage reaches preset value, counter stops counting, and count value is stored in the storer;
Step 40, repeating step 20 and step 30 several times;
Step 50, controller calculates the mean value of the count value that same measured capacitance produces and the count value that produces in discharge process in charging process, get the capacitance that its mean value is converted to this measured capacitance, this capacitance and predetermined capacitance scope are compared, if this capacitance is in the predetermined capacitance scope, then be qualified, if this capacitance not in the predetermined capacitance scope, then is defective.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310167385.6A CN103308776B (en) | 2013-05-08 | 2013-05-08 | A kind of test circuit of capacitance plate and method of testing thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310167385.6A CN103308776B (en) | 2013-05-08 | 2013-05-08 | A kind of test circuit of capacitance plate and method of testing thereof |
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| CN103308776B CN103308776B (en) | 2015-12-09 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105988041A (en) * | 2015-02-13 | 2016-10-05 | 宏达国际电子股份有限公司 | Capacitance measuring system and capacitance measuring method |
| CN106526398A (en) * | 2016-10-28 | 2017-03-22 | 昆山国显光电有限公司 | Detection method and device of capacitive touch screen |
| CN107632206A (en) * | 2017-09-22 | 2018-01-26 | 重庆纳尔利科技有限公司 | A kind of finger touching capacitance detecting device and its method of work |
| CN108152625A (en) * | 2017-12-21 | 2018-06-12 | 帝晶光电（深圳）有限公司 | A kind of efficient general holds capacitance plate Sensor function detecting systems and algorithm certainly |
| CN109460168A (en) * | 2018-10-31 | 2019-03-12 | 上海海栎创微电子有限公司 | A method of detection shunt capacitance between chip whether normal weld |
| CN113884833A (en) * | 2021-10-21 | 2022-01-04 | 迈普通信技术股份有限公司 | System and method for detecting welding quality of capacitor |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105988041A (en) * | 2015-02-13 | 2016-10-05 | 宏达国际电子股份有限公司 | Capacitance measuring system and capacitance measuring method |
| CN106526398A (en) * | 2016-10-28 | 2017-03-22 | 昆山国显光电有限公司 | Detection method and device of capacitive touch screen |
| CN106526398B (en) * | 2016-10-28 | 2019-08-27 | 昆山国显光电有限公司 | The detection method and detection device of capacitive touch screen |
| CN107632206A (en) * | 2017-09-22 | 2018-01-26 | 重庆纳尔利科技有限公司 | A kind of finger touching capacitance detecting device and its method of work |
| CN108152625A (en) * | 2017-12-21 | 2018-06-12 | 帝晶光电（深圳）有限公司 | A kind of efficient general holds capacitance plate Sensor function detecting systems and algorithm certainly |
| CN108152625B (en) * | 2017-12-21 | 2021-02-09 | 帝晶光电（深圳）有限公司 | Efficient general Sensor function detection system and algorithm for self-capacitance capacitive screen |
| CN109460168A (en) * | 2018-10-31 | 2019-03-12 | 上海海栎创微电子有限公司 | A method of detection shunt capacitance between chip whether normal weld |
| CN113884833A (en) * | 2021-10-21 | 2022-01-04 | 迈普通信技术股份有限公司 | System and method for detecting welding quality of capacitor |
| CN113884833B (en) * | 2021-10-21 | 2023-08-18 | 迈普通信技术股份有限公司 | System and method for detecting welding quality of capacitor |
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|---|---|
| CN103308776B (en) | 2015-12-09 |
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