CN104678186A - Measurement system of capacitive touch screen sensor - Google Patents
Measurement system of capacitive touch screen sensor Download PDFInfo
- Publication number
- CN104678186A CN104678186A CN201510073745.5A CN201510073745A CN104678186A CN 104678186 A CN104678186 A CN 104678186A CN 201510073745 A CN201510073745 A CN 201510073745A CN 104678186 A CN104678186 A CN 104678186A
- Authority
- CN
- China
- Prior art keywords
- unit
- gating
- signal
- sampled measurements
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
The invention discloses a measurement system of a capacitive touch screen sensor. The measurement system is used for measuring electric parameters of a node capacitance and a channel series resistance of the capacitive touch screen sensor, and comprises a gating matrix, a function switching unit, a sampling measurement module, a signal source and a processing unit; the gating matrix and the function switching unit are controlled by the processing unit to gate different drive network units or receive network units or nodes according to different measurement modes; the sampling measurement module is respectively connected to different measurement circuits, so that the electric parameter of the channel series resistance of any network unit can be measured, and the electric parameter of the node capacitance can be measured efficiently.
Description
Technical field
The present invention relates to capacitive touch screen field, particularly relate to a kind of measuring system of capacitive touch screen sensor.
Background technology
At present, the electric parameter metering of capacitive touch screen sensor is becoming the basic demand of capacitive touch screen industry, but not yet forms unified standard for this measurement, and measure the item and measuring method vary, and has been formed the normal development of this industry and has hindered.
For capacitive touch screen sensor, its key parameter comprises the parameters such as node capacitor, interchannel insulation resistance, Tandem resistance.Wherein, node capacitor and insulation resistance are the characteristic parameters of product own, have conclusive impact for the design and setting parameter driving network and reception network; And Tandem resistance is brought by the factor such as material, pattern, technique driving network and reception network to adopt, belong to quadratic effect parameter.The delay that this parameter is brought and loss effect and number of nodes are in square proportionate relationship, and when node matrix equation scale is less, the impact brought network application is little; But along with the growth of node matrix equation scale, this parameter can produce serious attenuation loss to drive singal and Received signal strength, thus affect the application performance of product, in the consistance of product, stability and reliability etc., bring serious adverse effect.
At present, for the measurement of the partial parameters such as node capacitor, insulation resistance of capacitive touch screen sensor, general employing spot measurement mode, measuring accuracy can meet application demand substantially, but speed is relatively slow; Especially when sensor matrices node scale is larger, measure efficiency comparison low, cause product line Measuring Time long, tied down the production efficiency of overall product line.Because driving and reception network are all single ended leads, at one end can only apply probe, then for the measurement of the driving of sensor, the aisle resistance of reception network, traditional V-I metering system cannot be adopted to obtain; In theory, can using Tandem resistance and node capacitor as an equivalent RC network, by complex impedance measurement mode, measure real impedance and the imaginary impedance of equivalent network, calculate aisle resistance by real impedance, imaginary impedance calculates node capacitor.But be mainly used in single order RC network by said method, and each driving network of the touch screen sensor of reality exists multiple node capacitor, except tested node, no matter other node is floating, ground connection or adopt other process means, comprehensive effect impact when measuring all will much larger than the capacitance of the tested node of reality, whole network is made to there is uncertain error when equivalent by single order RC network, cause the degree of accuracy of measurement result and confidence level very low, the requirement of practical application cannot be met.
Summary of the invention
Fundamental purpose of the present invention is the measuring system providing a kind of capacitive touch screen sensor, and when being intended to solve Measurement channel resistance in series and node capacitor electric parameter, the efficiency of existence is low, the problem that error is large.
For achieving the above object, the invention provides a kind of measuring system of capacitive touch screen sensor, this measuring system is for measuring node capacitor and the Tandem resistance electric parameter of capacitive touch screen sensor, described capacitive touch screen sensor comprises driving network layer and receives network layer, described driving network layer comprises some driving network element be arranged in parallel, and described reception network layer comprises some reception network element be arranged in parallel; Described driving network element is formed network with described reception network element vertical interlaced and is connected by described node capacitor at Nodes, and described driving network element and described reception network element are forming described Tandem resistance between two between described node capacitor; Described measuring system comprises:
Gating matrix, for driving network element accordingly or receiving network element or node capacitor according to different measurement pattern gatings;
Function switching unit, measures for the node capacitor in the described driving network element of gating or described reception network element or described driving network element or the node capacitor in described reception network element being switched to corresponding metering circuit according to different measurement patterns;
Sampled measurements module, for being connected to electric parameter corresponding to corresponding metering circuit sampled measurements;
Signal source, for providing the signal source of corresponding test pumping signal for described metering circuit;
Processing unit, carries out gating, controlling functions switch unit according to different measurement patterns carry out switching according to different measurement patterns and the data of electric parameter sampled measurements module recorded carry out analytical calculation for controlling gating matrix.
Preferably, described gating matrix comprises some gating units, some gating interface ends, first signal end, secondary signal end, 3rd signal end, 4th signal end and the 5th signal end, described gating unit comprises the first port, second port, 3rd port, 4th port, five-port, 6th port, first port of each gating unit is connected to corresponding gating interface end respectively, second port of each gating unit is connected with described first signal end, 3rd port of each gating unit is connected with described secondary signal end, 4th port of each gating unit is connected with described 3rd signal end, the five-port of each gating unit is connected with described 4th signal end, 6th port of each gating unit is connected with described 5th signal end, one end of the driving network element of described sensor and one end of reception network element are test port, and described test port is connected to corresponding described gating interface end respectively.
Preferably, when the wherein said gating interface end of described gating matrix gating and be connected with this gating interface end test port time, then the driving network element corresponding to this test port or receive network element be strobed; When the test port of two intersections of the wherein said correspondence of described gating matrix gating, then the driving network element that gating test port is corresponding is strobed with the node capacitor of the intersection receiving network element.
Preferably, described function switching unit comprises sampling resistor, for switching the first switch element and the second switch unit of corresponding metering circuit according to different measuring pattern, the stiff end of described first switch element is connected with the first sampling end of described sampled measurements module, first switch terminal of described first switch element is connected with the first signal end of described gating matrix, and the second switch terminal of described first switch element is connected with the secondary signal end of described gating matrix; The stiff end of described second switch unit is connected with the second sampling end of described sampled measurements module, first switch terminal of described second switch unit is connected through first signal end of sampling resistor with described gating matrix, and the second switch terminal of described second switch unit is connected with the 3rd signal end of described gating matrix.
Preferably, when described measuring system is Tandem resistance delay wastage measurement pattern, the stiff end of described first switch element is connected with the first switch terminal of described first switch element, and the stiff end of described second switch unit is connected with the first switch terminal of described second switch unit; First sampling end of described sampled measurements module is connected through first signal end of described first switch element with described gating matrix, and the second sampling end of described sampled measurements module is connected with the first signal end through described second switch unit, described sampling resistor.
Preferably, when described measuring system is node capacitor measurement pattern, the stiff end of described first switch element is connected with the second switch terminal of described first switch element, and the stiff end of described second switch unit is connected with the second switch terminal of described second switch unit; First sampling end of described sampled measurements module is connected through the secondary signal end of described first switch element with described gating matrix, and the second sampling end of described sampled measurements module is connected with the 3rd signal end of described gating matrix through described second switch unit.
Preferably, described sampled measurements module comprises the first sampled measurements unit, second sampled measurements unit, 3rd sampled measurements unit, 4th sampled measurements unit, the sampling end of described first sampled measurements unit is connected with the stiff end of described first switch element as the first sampling end of described sampled measurements module, the sampling end of described second sampled measurements unit is connected with the stiff end of described second switch unit as the second sampling end of described sampled measurements module, the sampling end of described 3rd sampled measurements unit is connected with the 4th signal port through described function switching unit as the 3rd sampling end of described sampled measurements module, the sampling end of described 4th sampled measurements unit is connected with the 5th signal port through described function switching unit as the 4th sampling end of described sampled measurements module.
Preferably, when described measuring system is Tandem resistance delay wastage measurement pattern, the pumping signal that described signal source sends is carried in the two ends of described metering circuit, described first sampled measurements unit measures the current signal of described sampling resistor, described second sampled measurements unit measures the total voltage signal of described metering circuit, described 3rd sampled measurements unit sampling is near described driving network element or the ascending current time of node capacitor of measurement port receiving network element, described 4th sampled measurements unit sampling is away from described driving network element or the ascending current time of node capacitor of measurement port receiving network element, described sampled measurements module is by measured each signal transmission to processing unit, and described processing unit calculates the value of described Tandem resistance according to each signal analysis.
Preferably, when described measuring system is node capacitor measurement pattern, the pumping signal that described signal source sends is carried in the two ends of described metering circuit, described first sampled measurements unit measures the current signal of wherein node capacitor described in, described second sampled measurements unit measures the current signal of wherein node capacitor described in, described 3rd sampled measurements unit measures the current signal of wherein node capacitor described in, and described 4th sampled measurements unit measures the current signal of wherein node capacitor described in; Described sampled measurements module is by measured each signal transmission to processing unit, and described processing unit calculates the value of each described node capacitor according to each signal analysis.
Preferably, the output terminal of described signal source is connected with described first signal end through described sampling resistor.
The measuring system of a kind of capacitive touch screen sensor provided by the present invention, gating matrix and function switching unit is controlled according to different measurement patterns by processing unit, the driving network element that conducting is different or receive network element or node, and respectively sampled measurements module is connected in different metering circuits, realize the measurement of the Tandem resistance electric parameter of arbitrary network element, and the measurement of node capacitor electric parameter can be completed expeditiously.
Accompanying drawing explanation
Fig. 1 is the structural representation of the sensor of capacitive touch screen of the present invention;
Fig. 2 is the high-level schematic functional block diagram of present pre-ferred embodiments;
Fig. 3 is the circuit connection diagram of the first test pattern of present pre-ferred embodiments;
Fig. 4 is the second test mode circuit connection diagram of present pre-ferred embodiments.
The realization of the object of the invention, functional characteristics and advantage will in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
The invention provides a kind of measuring system of capacitive touch screen sensor.
In embodiments of the present invention, with reference to Fig. 1, Fig. 1 is the structural representation of capacitive touch screen sensor, this capacitive touch screen sensor 100 comprises driving network layer 110 and receives network layer 120, described driving network layer 110 comprises some driving network element 111 be arranged in parallel, and described reception network layer 120 comprises some reception network element 121 be arranged in parallel; Described driving network element 111 is formed network with described reception network element 121 vertical interlaced and is connected by described node capacitor Ci at Nodes, and described driving network element 111 and described reception network element 121 are forming described Tandem resistance Ri between two between described node capacitor Ci.
Reference Fig. 2, Fig. 2 are the high-level schematic functional block diagram of present pre-ferred embodiments, and the measuring system of this capacitive touch screen sensor comprises:
Gating matrix 200, for driving network element 111 accordingly or receiving network element 121 or node capacitor Ci according to different measurement pattern gatings;
Function switching unit 300, measures for the node capacitor Ci in the described driving network element 111 of gating or described reception network element 121 or described driving the network element 111 or node capacitor Ci in described reception network element 121 being switched to corresponding metering circuit according to different measurement patterns;
Sampled measurements module 400, for being connected to electric parameter corresponding to corresponding metering circuit sampled measurements;
Signal source Vs, for providing corresponding test pumping signal for described metering circuit;
Processing unit 500, carries out gating, controlling functions switch unit 300 according to different measurement patterns carry out switching according to different measurement patterns and the data of electric parameter sampled measurements module 400 recorded carry out analytical calculation for controlling gating matrix 200.
Particularly, described gating matrix 200 comprises some gating units 210, some gating interface ends, first signal end, secondary signal end, 3rd signal end, 4th signal end, 5th signal end, described gating unit 210 comprises the first port, second port, 3rd port, 4th port, five-port, 6th port, first port of each gating unit 210 is connected to corresponding gating interface end respectively, second port of each gating unit 210 is connected with described first signal end, 3rd port of each gating unit 210 is connected with described secondary signal end, 4th port of each gating unit 210 is connected with described 3rd signal end, the five-port of each gating unit 210 is connected with described 4th signal end, 6th port of each gating unit 210 is connected with described 5th signal end, one end of described driving network element 111 and one end of reception network element 121 are test port, and described test port is connected to corresponding described gating interface end respectively.Whether the break-make of above-mentioned each connection, and the control signal that can be provided by processing unit 500 is controlled respectively.When control signal is selected to connect, be called strobe state; When control signal selects disjunction, be called disarmed state.
When described one of them gating interface end of gating matrix 200 gating and the test port that is connected with this gating interface end, now, driving network element 111 corresponding to this test port or reception network element 121 are strobed, and each Tandem resistance of this driving network element 111 or reception network element 121 is arranged in metering circuit; When the test port of two intersections of the wherein said correspondence of described gating matrix 200 gating gating, then the driving network element 111 that gating test port is corresponding is in metering circuit with the node capacitor Ci of the intersection receiving network element 121.
Particularly, described gating unit 210 inside is the switch arrays that several low-impedance analog switch is formed, and in this array, the control signal that the on off operating mode of each switch can be provided by processing unit 500 is selected.
Described sampled measurements module 400 comprises the first sampled measurements unit 410, second sampled measurements unit 420, 3rd sampled measurements unit 430, 4th sampled measurements unit 440, the sampling end of described first sampled measurements unit 410 is connected with the stiff end of described first switch element 310 as the first sampling end of described sampled measurements module 400, the sampling end of described second sampled measurements unit 420 is connected with the stiff end of described second switch unit 320 as the second sampling end of described sampled measurements module 400, the sampling end of described 3rd sampled measurements unit 430 is connected with described 4th signal port through function switching unit 300 as the 3rd sampling end of described sampled measurements module 400, the sampling end of described 4th sampled measurements unit 440 is connected with described 5th signal port through function switching unit 300 as the 4th sampling end of described sampled measurements module 400.
Function switching unit 300 comprises sampling resistor Rs, for switching the first switch element 310 and the second switch unit 320 of corresponding metering circuit according to different measuring pattern, the stiff end of described first switch element 310 is connected with the first sampling end of described first sampled measurements unit 410, first switch terminal of described first switch element 310 is connected with the first signal end of described gating matrix 200, and the second switch terminal of described first switch element 310 is connected with the secondary signal end of described gating matrix 200; The stiff end of described second switch unit 320 is connected with the second sampling end of described second sampled measurements unit 420, first switch terminal of described second switch unit 320 is connected with the first signal end of described gating matrix 200 through sampling resistor Rs, and the second switch terminal of described second switch unit 320 is connected with the 3rd signal end of described gating matrix 200.
When described measuring system is Tandem resistance delay wastage measurement pattern, the stiff end of described first switch element 310 is connected with the first switch terminal of described first switch element 310, and the stiff end of described second switch unit 320 is connected with the first switch terminal of described second switch unit 320; First sampling end of described first sampled measurements unit 410 is connected with the first signal end of described gating matrix 200 through described first switch element 310, and the second sampling end of described second sampled measurements unit 420 is connected with the first signal end through described second switch unit 320, described sampling resistor Rs.
When described measuring system is node capacitor measurement pattern, the stiff end of described first switch element 310 is connected with the second switch terminal of described first switch element 310, and the stiff end of described second switch unit 320 is connected with the second switch terminal of described second switch unit 320; First sampling end of described sampled measurements module 400 is connected with the secondary signal end of described gating matrix 200 through described first switch element 310, and the second sampling end of described sampled measurements module 400 is connected with the 3rd signal end of described gating matrix 200 through described second switch unit 320.
Described pumping signal is connected with the first signal end through sampling resistor Rs, and in the present embodiment, the first signal end is as excitation end.
With reference to the circuit connection diagram that Fig. 3, Fig. 3 are the first test pattern of present pre-ferred embodiments; Under described measuring system is in Tandem resistance delay wastage measurement pattern, now, processing unit 500 controls gating matrix 200 gating, and one of them drives network element 111 or receives network element 121, and for gating, one of them drives network element 111 to be described to the present embodiment.This driving network element 111 constitutes following metering circuit: several resistant series R1, R2 ... Ri, and be all connected with node capacitor C1, C2 at the node location of every two resistance ... Ci, node capacitor C1, C2 ... the other end of Ci is connected to ground; This metering circuit is equivalent to several RC network and connects in turn.Now, the ramp voltage signal of fixed slope is carried in the two ends of metering circuit by signal source Vs through sampling resistor Rs, the first signal port, for providing pumping signal, to drive whole measurement network.
First sampled measurements unit 410 is connected to the first signal end through the first switch terminal of the stiff end of the first switch element 310, the first switch element 310 successively, for gathering whole metering circuit voltage signal over the ground; Second sampled measurements unit 420 is connected to the first signal end through the first switch terminal of the stiff end of second switch unit 320, second switch unit 320 successively, thus the second sampled measurements unit 420 is in parallel with described sampling resistor Rs, for gathering the total current signal of whole metering circuit; What the first sampled measurements unit 410 and the second sampled measurements unit 420 were monitored is driving voltage signal that signal source Vs produces and total driving current signal, when metering circuit normal operation, driving voltage signal and total driving current signal will meet anticipatory data; When metering circuit occurs that electric leakage, short circuit or open circuit etc. are abnormal, the waveform of above-mentioned driving voltage signal and total driving current signal will occur abnormal, can be analyzed by the Monitoring Data of processing unit 500 and judge, be easy to judge abnormality, avoid whole measuring process to occur false judgment, affect the correctness of measurement result.
In order to measure the Tandem resistance of whole metering circuit, according to the late effect of RC network, near the node capacitor C1 of the measurement port of this driving network element 111, current rise time under the pumping signal of signal source Vs is by faster than the node capacitor C2 current rise time being only second to node capacitor C1, by that analogy, the current rise time away from the node capacitor Ci of measurement port is the slowest.Therefore when using certain current reference value as benchmark, for same pumping signal, node capacitor C1 reaches moment of reference current will in advance in node capacitor Ci, the mistiming Δ T of the two and each joint Tandem resistance R1, R2 ... Ri, each node capacitor C1, C2 ... the parameter such as Ci and node total number is correlated with, and due to the first sampled measurements unit 410 to the four sampled measurements unit 440 be all sample by same frequency continuous synchronization, thus time interval when reaching reference current by node capacitor C1 and node capacitor Ci can calculate Δ T, and because node total number is known, each node capacitor C1, C2 ... the standard value of Ci is known and basically identical, comprehensive above-mentioned condition, each Tandem resistance R1 of this driving network element 111 can be extrapolated, R2 ... the resistance of Ri resistance and overall channel resistance in series R.Through above-mentioned analysis, the current rise time near the node capacitor C1 of measurement port and the node capacitor Ci away from measurement port only need be measured.
Processing unit 500 is by the control gating node capacitor C1 of matrix 200 gating near measurement port and the node capacitor Ci away from measurement port, node capacitor C1 near measurement port is connected with the 3rd sampled measurements unit 430 by the 4th signal port, thus node capacitor C1 is through the 3rd sampled measurements unit 430 ground connection, the current value of the 3rd sampled measurements unit 430 measured node electric capacity C1, processing unit 500 is by the rise time of record node capacitor C1; Node capacitor Ci away from measurement port is connected with the 4th sampled measurements unit 440 by the 5th signal port, thus node capacitor Ci is through the 4th sampled measurements unit 440 ground connection, the current value of the 4th sampled measurements unit 440 measured node electric capacity Ci, processing unit 500 is by the rise time of record node capacitor Ci.Now, processing unit 500 analytical calculation draws the mistiming of the ascending current of node capacitor C1 and node capacitor Ci, thus draws the resistance of overall channel resistance in series.
By said method, the one end that can be implemented in arbitrary driving network element 111 or reception network element 121 applies the measurement that probe can complete channels in series resistance, and measuring accuracy is high, and reliability is high.
With reference to the second test mode circuit connection diagram that Fig. 4, Fig. 4 are present pre-ferred embodiments; Under described measuring system is in node capacitor measurement pattern, now, processing unit 500 controls the different node capacitor of gating matrix 200 gating gating four.Because node capacitor Ci correspondence is connected in the intersection that drives network element 111 and a receiving element, thus the while that processing unit 500 will controlling gating matrix 200, gating 4 driving network element 111 and 4 receive network element 121.Now, first switch element 310 of function switching unit 300 will switch to the second switch terminal from the first switch terminal, namely the first sampled measurements unit 410 is connected to the secondary signal port of gating matrix 200 through the second switch terminal of the stiff end of the first switch element 310, the first switch element 310 successively, and one of them node capacitor Ci of gating is passed to the first sampling end of the first sampled measurements unit 410 by gating matrix 200; The second switch unit 320 of function switching unit 300 will switch to the second switch terminal from the first switch terminal, namely the second sampled measurements unit 420 is connected to the 3rd signal port of gating matrix 200 successively through the second switch terminal of the stiff end of second switch unit 320, second switch unit 320, and wherein another node capacitor Cj of gating is passed to the second sampling end of the second sampled measurements unit 420 by gating matrix 200; Gating matrix 200 by two other node capacitor Cm, Cn of gating respectively through the 4th signal port is passed to the 3rd sampling end of the 3rd sampled measurements unit 430, the 5th signal port is passed to the 4th sampled measurements unit 440 the 4th sampling end.The pumping signal of signal source Vs is connected to the first signal end through sampling resistor Rs, is the ramp voltage signal that whole metering circuit provides fixed slope.
When applying the ramp voltage of fixed slope, all node capacitors in same metering circuit all will be coupled charging current, and the rise time of each capacitive coupling electric current is different.But as long as ramp voltage waveform adheres to the sufficiently long time, the charging current on all node capacitor Ci all will enter steady state (SS), and now, the pressure drop between each node on aisle resistance also will enter steady state (SS), and its changing value is extremely faint, can ignore.Therefore, input voltage rate of change in this case will be applied directly to node capacitor two ends, the electric current that each node capacitor exports, to relevant with input voltage rate of change with capacitance, by the measurement of the output current to node capacitor, can draw the capacitance of node capacitor.
By measuring the current output value of each node capacitor and transferring to processing unit 500 and carry out analytical calculation, the capacitance of each node capacitor can be drawn, by above-mentioned metering circuit, can switch under channels in series resistance measurement pattern, the capacitance size of four node capacitors can be measured simultaneously, thus improve the testing efficiency of node capacitor, and cost is lower.
Described measuring system is also for measuring the insulation resistance electric parameter of described capacitive touch screen sensor, when described measuring system is insulation measurement pattern, the pumping signal of described signal source Vs is direct current signal, the metering system of described sampled measurements module 400 is identical with under described node capacitor measurement pattern, does not repeat one by one at this.
These are only the preferred embodiments of the present invention; not thereby the scope of the claims of the present invention is limited; every utilize instructions of the present invention and accompanying drawing content to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present invention.
Claims (10)
1. the measuring system of a capacitive touch screen sensor, described measuring system is for measuring node capacitor and the Tandem resistance electric parameter of capacitive touch screen sensor, described capacitive touch screen sensor comprises driving network layer and receives network layer, described driving network layer comprises some driving network element be arranged in parallel, and described reception network layer comprises some reception network element be arranged in parallel; Described driving network element is formed network with described reception network element vertical interlaced and is connected by described node capacitor at Nodes, and described driving network element and described reception network element are forming described Tandem resistance between two between described node capacitor; It is characterized in that, described measuring system comprises:
Gating matrix, for driving network element accordingly or receiving network element or node capacitor according to different measurement pattern gatings;
Function switching unit, measures for the node capacitor in the described driving network element of gating or described reception network element or described driving network element or the node capacitor in described reception network element being switched to corresponding metering circuit according to different measurement patterns;
Sampled measurements module, for being connected to electric parameter corresponding to corresponding metering circuit sampled measurements;
Signal source, for providing the signal source of corresponding test pumping signal for described metering circuit;
Processing unit, carries out gating, controlling functions switch unit according to different measurement patterns carry out switching according to different measurement patterns and the data of electric parameter sampled measurements module recorded carry out analytical calculation for controlling gating matrix.
2. the measuring system of capacitive touch screen sensor as claimed in claim 1, it is characterized in that, described gating matrix comprises some gating units, some gating interface ends, first signal end, secondary signal end, 3rd signal end, 4th signal end and the 5th signal end, described gating unit comprises the first port, second port, 3rd port, 4th port, five-port, 6th port, first port of each gating unit is connected to corresponding gating interface end respectively, second port of each gating unit is connected with described first signal end, 3rd port of each gating unit is connected with described secondary signal end, 4th port of each gating unit is connected with described 3rd signal end, the five-port of each gating unit is connected with described 4th signal end, 6th port of each gating unit is connected with described 5th signal end, one end of the driving network element of described sensor and one end of reception network element are test port, and described test port is connected to corresponding described gating interface end respectively.
3. the measuring system of capacitive touch screen sensor as claimed in claim 2, it is characterized in that, when the wherein said gating interface end of described gating matrix end gating and be connected with this gating interface end test port time, then the driving network element corresponding to this test port or receive network element be strobed; When the test port of two intersections of the wherein said correspondence of described gating matrix end gating, then the driving network element that gating test port is corresponding is strobed with the node capacitor of the intersection receiving network element.
4. the measuring system of capacitive touch screen sensor as claimed in claim 2, it is characterized in that, described function switching unit comprises sampling resistor, for switching the first switch element and the second switch unit of corresponding metering circuit according to different measuring pattern, the stiff end of described first switch element is connected with the first sampling end of described sampled measurements module, first switch terminal of described first switch element is connected with the first signal end of described gating matrix, and the second switch terminal of described first switch element is connected with the secondary signal end of described gating matrix; The stiff end of described second switch unit is connected with the second sampling end of described sampled measurements module, first switch terminal of described second switch unit is connected through first signal end of sampling resistor with described gating matrix, and the second switch terminal of described second switch unit is connected with the 3rd signal end of described gating matrix.
5. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterized in that, when described measuring system is Tandem resistance delay wastage measurement pattern, the stiff end of described first switch element is connected with the first switch terminal of described first switch element, and the stiff end of described second switch unit is connected with the first switch terminal of described second switch unit; First sampling end of described sampled measurements module is connected through first signal end of described first switch element with described gating matrix, and the second sampling end of described sampled measurements module is connected with the first signal end through described second switch unit, described sampling resistor.
6. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterized in that, when described measuring system is node capacitor measurement pattern, the stiff end of described first switch element is connected with the second switch terminal of described first switch element, and the stiff end of described second switch unit is connected with the second switch terminal of described second switch unit; First sampling end of described sampled measurements module is connected through the secondary signal end of described first switch element with described gating matrix, and the second sampling end of described sampled measurements module is connected with the 3rd signal end of described gating matrix through described second switch unit.
7. the measuring system of capacitive touch screen sensor as claimed in claim 4, it is characterized in that, described sampled measurements module comprises the first sampled measurements unit, second sampled measurements unit, 3rd sampled measurements unit, 4th sampled measurements unit, the sampling end of described first sampled measurements unit is connected with the stiff end of described first switch element as the first sampling end of described sampled measurements module, the sampling end of described second sampled measurements unit is connected with the stiff end of described second switch unit as the second sampling end of described sampled measurements module, the sampling end of described 3rd sampled measurements unit is connected with the 4th signal port through described function switching unit as the 3rd sampling end of described sampled measurements module, the sampling end of described 4th sampled measurements unit is connected with the 5th signal port through described function switching unit as the 4th sampling end of described sampled measurements module.
8. the measuring system of capacitive touch screen sensor as claimed in claim 7, it is characterized in that, when described measuring system is Tandem resistance delay wastage measurement pattern, the pumping signal that described signal source sends is carried in the two ends of described metering circuit, described first sampled measurements unit measures the current signal of described sampling resistor, described second sampled measurements unit measures the total voltage signal of described metering circuit, described 3rd sampled measurements unit sampling is near described driving network element or the ascending current time of node capacitor of measurement port receiving network element, described 4th sampled measurements unit sampling is away from described driving network element or the ascending current time of node capacitor of measurement port receiving network element, described sampled measurements module is by measured each signal transmission to processing unit, and described processing unit calculates the value of described Tandem resistance according to each signal analysis.
9. the measuring system of capacitive touch screen sensor as claimed in claim 8, it is characterized in that, when described measuring system is node capacitor measurement pattern, the pumping signal that described signal source sends is carried in the two ends of described metering circuit, described first sampled measurements unit measures the current signal of wherein node capacitor described in, described second sampled measurements unit measures the current signal of wherein node capacitor described in, described 3rd sampled measurements unit measures the current signal of wherein node capacitor described in, described 4th sampled measurements unit measures the current signal of wherein node capacitor described in, described sampled measurements module is by measured each signal transmission to processing unit, and described processing unit calculates the value of each described node capacitor according to each signal analysis.
10. the measuring system of capacitive touch screen sensor as claimed in claim 8 or 9, it is characterized in that, the output terminal of described signal source is connected with described first signal end through described sampling resistor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510073745.5A CN104678186B (en) | 2015-02-12 | 2015-02-12 | The measuring system of capacitive touch screen sensor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510073745.5A CN104678186B (en) | 2015-02-12 | 2015-02-12 | The measuring system of capacitive touch screen sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104678186A true CN104678186A (en) | 2015-06-03 |
| CN104678186B CN104678186B (en) | 2017-12-22 |
Family
ID=53313528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510073745.5A Active CN104678186B (en) | 2015-02-12 | 2015-02-12 | The measuring system of capacitive touch screen sensor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104678186B (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105021919A (en) * | 2015-06-29 | 2015-11-04 | 深圳市精智达技术有限公司 | Capacitive screen test card and test system |
| CN105403752A (en) * | 2015-12-08 | 2016-03-16 | 重庆地质仪器厂 | Method and device for measuring electrode |
| CN105676053A (en) * | 2016-02-23 | 2016-06-15 | 上海芯什达电子技术有限公司 | Touch screen defect detection system |
| CN106370967A (en) * | 2016-09-12 | 2017-02-01 | 京东方科技集团股份有限公司 | Touch control structure and test method thereof, touch screen, and display apparatus |
| CN106526332A (en) * | 2016-10-25 | 2017-03-22 | 华南师范大学 | System and method for detecting capacitor of scanning line of capacitive touch screen |
| CN107799845A (en) * | 2017-10-23 | 2018-03-13 | 深圳市科列技术股份有限公司 | A kind of battery management system and its battery switching matrix interlock circuit and interlock method |
| CN108152625A (en) * | 2017-12-21 | 2018-06-12 | 帝晶光电（深圳）有限公司 | A kind of efficient general holds capacitance plate Sensor function detecting systems and algorithm certainly |
| CN115834958A (en) * | 2022-12-19 | 2023-03-21 | 广州市保伦电子有限公司 | Touch screen writing delay test method and device |
| RU2811329C2 (en) * | 2022-05-04 | 2024-01-11 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Казанский национальный исследовательский технический университет им. А.Н. Туполева - КАИ" | Quasi-distribted rc sensor and method for measuring distribted physical fields |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006184273A (en) * | 2004-11-09 | 2006-07-13 | Sharp Corp | System for measuring capacitance |
| CN201251612Y (en) * | 2008-03-19 | 2009-06-03 | 杜波 | Implementing structure for detecting a plurality of capacity-type touch sensors |
| CN102043096A (en) * | 2009-10-15 | 2011-05-04 | 瑞鼎科技股份有限公司 | Capacitance measurement circuit and method |
| CN102253289A (en) * | 2010-05-18 | 2011-11-23 | 联咏科技股份有限公司 | Electric capacity measuring device for touch control device |
| JP2012122989A (en) * | 2010-12-06 | 2012-06-28 | Ftlab Co Ltd | Electrical characteristic inspection device of capacitance system touch screen panel using resonance frequency shift |
| US20120293336A1 (en) * | 2011-05-16 | 2012-11-22 | Research In Motion Limited | Apparatus, and associated method, for testing a touch sensing device |
| CN102830882A (en) * | 2012-09-04 | 2012-12-19 | 北京集创北方科技有限公司 | Touch detection method of capacitive touch screen and detection circuit |
| KR101235841B1 (en) * | 2012-03-22 | 2013-02-25 | 세원텔레텍 주식회사 | Device of measuring capacitance value of touch screen |
| US20130050140A1 (en) * | 2011-08-31 | 2013-02-28 | Chun-Hsueh Chu | Control circuit and control method for the touch panel |
| CN104330640A (en) * | 2014-11-24 | 2015-02-04 | 武汉大学 | Large scale and high accuracy RLC (radio link control) measurement device and method |
| CN204613307U (en) * | 2015-02-12 | 2015-09-02 | 深圳市精智达技术有限公司 | The measuring system of capacitive touch screen sensor |
-
2015
- 2015-02-12 CN CN201510073745.5A patent/CN104678186B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006184273A (en) * | 2004-11-09 | 2006-07-13 | Sharp Corp | System for measuring capacitance |
| CN201251612Y (en) * | 2008-03-19 | 2009-06-03 | 杜波 | Implementing structure for detecting a plurality of capacity-type touch sensors |
| CN102043096A (en) * | 2009-10-15 | 2011-05-04 | 瑞鼎科技股份有限公司 | Capacitance measurement circuit and method |
| CN102253289A (en) * | 2010-05-18 | 2011-11-23 | 联咏科技股份有限公司 | Electric capacity measuring device for touch control device |
| JP2012122989A (en) * | 2010-12-06 | 2012-06-28 | Ftlab Co Ltd | Electrical characteristic inspection device of capacitance system touch screen panel using resonance frequency shift |
| US20120293336A1 (en) * | 2011-05-16 | 2012-11-22 | Research In Motion Limited | Apparatus, and associated method, for testing a touch sensing device |
| US20130050140A1 (en) * | 2011-08-31 | 2013-02-28 | Chun-Hsueh Chu | Control circuit and control method for the touch panel |
| KR101235841B1 (en) * | 2012-03-22 | 2013-02-25 | 세원텔레텍 주식회사 | Device of measuring capacitance value of touch screen |
| CN102830882A (en) * | 2012-09-04 | 2012-12-19 | 北京集创北方科技有限公司 | Touch detection method of capacitive touch screen and detection circuit |
| CN104330640A (en) * | 2014-11-24 | 2015-02-04 | 武汉大学 | Large scale and high accuracy RLC (radio link control) measurement device and method |
| CN204613307U (en) * | 2015-02-12 | 2015-09-02 | 深圳市精智达技术有限公司 | The measuring system of capacitive touch screen sensor |
Non-Patent Citations (3)
| Title |
|---|
| BO LI,ETC: "A New Differential Measurement Scheme for", 《2014 IEEE 9TH CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS》 * |
| 李俊涛: "基于电容式触摸集成电路的高精度分段水位检测系统", 《科技论坛》 * |
| 舒勤茂: "平板电脑电容式触摸屏测试设计与实现", 《计算机光盘软件与应用》 * |
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105021919A (en) * | 2015-06-29 | 2015-11-04 | 深圳市精智达技术有限公司 | Capacitive screen test card and test system |
| CN105403752A (en) * | 2015-12-08 | 2016-03-16 | 重庆地质仪器厂 | Method and device for measuring electrode |
| CN105676053B (en) * | 2016-02-23 | 2018-09-25 | 上海芯什达电子技术有限公司 | A kind of touch screen defect detecting system |
| CN105676053A (en) * | 2016-02-23 | 2016-06-15 | 上海芯什达电子技术有限公司 | Touch screen defect detection system |
| CN106370967A (en) * | 2016-09-12 | 2017-02-01 | 京东方科技集团股份有限公司 | Touch control structure and test method thereof, touch screen, and display apparatus |
| CN106370967B (en) * | 2016-09-12 | 2019-06-28 | 京东方科技集团股份有限公司 | A kind of touch-control structure, its test method, touch screen and display device |
| WO2018045814A1 (en) * | 2016-09-12 | 2018-03-15 | 京东方科技集团股份有限公司 | Touch structure, test method therefor, touch panel, and display device |
| US10288655B2 (en) | 2016-09-12 | 2019-05-14 | Boe Technology Group Co., Ltd. | Touch structure, test method thereof, touch panel and display apparatus |
| CN106526332A (en) * | 2016-10-25 | 2017-03-22 | 华南师范大学 | System and method for detecting capacitor of scanning line of capacitive touch screen |
| CN106526332B (en) * | 2016-10-25 | 2020-01-17 | 华南师范大学 | System and method for detecting capacitance on scanning line of capacitive touch screen |
| CN107799845A (en) * | 2017-10-23 | 2018-03-13 | 深圳市科列技术股份有限公司 | A kind of battery management system and its battery switching matrix interlock circuit and interlock method |
| CN107799845B (en) * | 2017-10-23 | 2023-10-20 | 深圳市科列技术股份有限公司 | Battery management system and battery switching matrix interlocking circuit and interlocking method thereof |
| CN108152625A (en) * | 2017-12-21 | 2018-06-12 | 帝晶光电（深圳）有限公司 | A kind of efficient general holds capacitance plate Sensor function detecting systems and algorithm certainly |
| CN108152625B (en) * | 2017-12-21 | 2021-02-09 | 帝晶光电（深圳）有限公司 | Efficient general Sensor function detection system and algorithm for self-capacitance capacitive screen |
| RU2811329C2 (en) * | 2022-05-04 | 2024-01-11 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Казанский национальный исследовательский технический университет им. А.Н. Туполева - КАИ" | Quasi-distribted rc sensor and method for measuring distribted physical fields |
| CN115834958A (en) * | 2022-12-19 | 2023-03-21 | 广州市保伦电子有限公司 | Touch screen writing delay test method and device |
| CN115834958B (en) * | 2022-12-19 | 2023-10-20 | 广东保伦电子股份有限公司 | Touch screen writing delay test method and device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104678186B (en) | 2017-12-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104678186A (en) | Measurement system of capacitive touch screen sensor | |
| CN103529354A (en) | Circuit testing method and circuit testing system | |
| CN204613307U (en) | The measuring system of capacitive touch screen sensor | |
| CN103592477A (en) | Aerospace level capacitor test switch channel | |
| CN104865493A (en) | CELL panel open-short circuit detection device and method | |
| CN101625387A (en) | Fast scanning detecting device of two-wire system industrial instrument and detecting method | |
| CN108037449A (en) | A kind of high-voltage circuitbreaker automatic checkout system | |
| CN104655935A (en) | Method and device for testing node capacitor | |
| CN105182125B (en) | High speed ultra micro fine enamelled wire online test method | |
| CN109444650B (en) | Open-short circuit testing method and device for single film of oversized capacitive screen | |
| CN105021658A (en) | NI data acquisition card based two-phase flow grid sensor measurement method | |
| WO2013063904A1 (en) | Segmented detection device and detection method for line fault | |
| CN106405439A (en) | Uninterrupted power supply dynamic characteristic automatic measurement and calibration device and method | |
| CN201497780U (en) | Rapid cyclic-detection device for two-wire industrial instruments | |
| CN105676053B (en) | A kind of touch screen defect detecting system | |
| CN106054013A (en) | Touching device detection method and touching device | |
| CN102901904B (en) | A kind of Multifunctional intelligent detection device for circuit board | |
| CN104678983B (en) | Traction control unit self-detection circuit | |
| CN103698639B (en) | Crystal oscillator waveform parameter automatic measurement system and method | |
| CN103149545B (en) | The method of testing of VFTO sensor, device, equipment and system | |
| CN105021919B (en) | Capacitance plate test card, test macro | |
| CN204613306U (en) | The proving installation of node capacitor | |
| CN105784785A (en) | Two-phase flow measurement system for nuclear reactor rod bundle channel based on electrical resistance tomography | |
| CN204043759U (en) | Liquid level sensor automatic testing equipment | |
| CN107543574B (en) | Automatic detector for high-temperature aging test of airborne sensor and operation method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: The 6 floor D607/D608 Longhua District Guanlan Street sightseeing road 518000 Guangdong city of Shenzhen province No. 1301 Silver Star Silver Star Technology building high-tech industrial park area D Applicant after: SHENZHEN SEICHITECH TECHNOLOGY CO., LTD. Address before: 518000 Guangdong city of Shenzhen province Nanshan District Xili town tea light road on the south side of Shenzhen integrated circuit design and application of Industrial Park 410-2 Applicant before: Jing Zhida Technology Co., Ltd. of Shenzhen |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: 518000 East floor 1, building D, 101 Industrial Park, fuanna company, Qinghu village, Qinghu community, Longhua street, Longhua District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN SEICHITECH TECHNOLOGY Co.,Ltd. Address before: The 6 floor D607/D608 Longhua District Guanlan Street sightseeing road 518000 Guangdong city of Shenzhen province No. 1301 Silver Star Silver Star Technology building high-tech industrial park area D Patentee before: SHENZHEN SEICHITECH TECHNOLOGY Co.,Ltd. |