CN104677497B - Detection device and method for properties of terahertz waves - Google Patents

Detection device and method for properties of terahertz waves Download PDF

Info

Publication number
CN104677497B
CN104677497B CN201510077425.7A CN201510077425A CN104677497B CN 104677497 B CN104677497 B CN 104677497B CN 201510077425 A CN201510077425 A CN 201510077425A CN 104677497 B CN104677497 B CN 104677497B
Authority
CN
China
Prior art keywords
thz
light
light beam
terahertz
thz wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510077425.7A
Other languages
Chinese (zh)
Other versions
CN104677497A (en
Inventor
彭滟
朱亦鸣
马瑞杰
罗坤
陈向前
李敏
周云燕
庄松林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Shanghai for Science and Technology
Original Assignee
University of Shanghai for Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Shanghai for Science and Technology filed Critical University of Shanghai for Science and Technology
Priority to CN201510077425.7A priority Critical patent/CN104677497B/en
Publication of CN104677497A publication Critical patent/CN104677497A/en
Application granted granted Critical
Publication of CN104677497B publication Critical patent/CN104677497B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention relates to a detection device and method for properties of terahertz waves. The method comprises the following steps: an eigen germanium material panel with tunable reflection space terahertz wave effects, a parabolic reflector, a two-dimensional scan vibration mirror and two one-dimensional direct-current motors are used, the eigen germanium material panel is fixed in a transmitting path of a terahertz collimated light beam, the two-dimensional scan vibration mirror is regulated so that the light beam after beam shrinkage scans different space positions of eigen germanium materials, regions needing detection are reflected, besides, an electro-optical crystal is used for detecting the time domain spectrum of the terahertz light beam, and finally through later-stage spectrum analysis and treatment, the data extraction of the internal electric field range, the frequency and the phase of different regions of the terahertz light beam can be realized. The method disclosed by the invention can be used for solving the scientific difficult problem for detection of source characteristics internationally, can establish basis for later-stage scientific research work, can help users to use different characteristic selecting means according to different sources in practical application, and can improve the application efficiency of the terahertz waves.

Description

A kind of detection apparatus and method of THz wave performance
Technical field
The present invention relates to a kind of Electromagnetic Wave Detection technology, particularly to a kind of THz wave two dimensional electric field amplitude and the detection apparatus and method of frequency and PHASE DISTRIBUTION.
Background technology
After the eighties Terahertz in last century (THz) is formally recognized by the mankind, along with the development of ultrafast technology so that the pulse THz source obtaining broadband stable becomes a kind of quasi-routine techniques, and THz technology is developed rapidly.Terahertz emission is the frequency electromagnetic wave in 0.1 to 10 THz scopes, this wave band microwave and infrared between, its special performance brings far-reaching influence to field such as communication (broadband connections), radar, electronic countermeasure, ELECTROMAGNETIC WEAPON, astronomy, medical imaging (unmarked genetic test, the imaging of cellular level), Non-Destructive Testing, safety inspection (inspection of biological) etc..Owing to the frequency of Terahertz is the highest, so its spatial resolution is the highest;Again owing to its pulse the shortest (picosecond magnitude) is so having the highest temporal resolution.Additionally, THz has characteristics such as carrying informative, high temporal and spatial coherence, low photon energy, there is huge using value in the scientific domain such as astronomy, biology, computer, communication.Therefore the detection for information entrained in terahertz time-domain spectroscopy is just particularly important.And at present for device and the corresponding method of characteristic also these parameters of neither one energy synchro measure such as the energy on THz wave two dimensional surface, frequency, PHASE DISTRIBUTION.
Summary of the invention
The problem that the present invention be directed to lack the method and device that can the most simultaneously detect THz wave two dimensional electric field amplitude and frequency and PHASE DISTRIBUTION at present, propose the detection apparatus and method of a kind of THz wave performance, have employed the intrinsic germanium material flat board with tunable reflection space THz wave effect, paraboloidal mirror, two-dimensional scanning mirrors and two one-dimensional direct current generators, intrinsic germanium material flat board is fixed in the path of Terahertz collimated beam transmission, by regulation two-dimensional scanning mirrors, make the different spatial of the scanning intrinsic germanium material of the light beam after contracting bundle, reflection needs the region of detection, simultaneously with the time-domain spectroscopy of electro-optic crystal detection thz beam, process finally by later stage spectrum analysis, thz beam zones of different internal electric field amplitude can be realized, the data of frequency and phase place are extracted.
The technical scheme is that the detection device of a kind of THz wave performance, including two beam splitting chips;Three reflecting mirrors;THz source;Paraboloidal mirror A;Planar metal mirror;Intrinsic germanium;Two convex lenss;Concavees lens;Two-dimensional scanning mirrors;Paraboloidal mirror B;ZnTe crystal;/ 4th slides;Wollaston prism;PD pops one's head in;The primary laser pulse exported by femto-second laser, after the first beam splitting chip, reflection light enters THz source as light beam one through the first reflecting mirror, THz source output produces THz wave, after off axis paraboloidal mirror A, produce the thz beam of a collimation, through fixed intrinsic germanium flat board after being reflected by planar metal mirror;
By the transmission light of the first beam splitting chip through the second beam splitting chip, second beam splitting chip output reflection light as light beam two after the second reflecting mirror secondary reflection again, after the contracting bundle of the first convex lens and concavees lens, by regulation two-dimensional scanning mirrors, change light exit direction, be irradiated to the diverse location on intrinsic germanium flat board, form the surface of metalloid, reflected terahertz hereby light, the position THz wave not being irradiated to still is transmitted, the THz wave parallel entrance paraboloidal mirror B passed through;
By the transmission light of the first beam splitting chip through the second beam splitting chip, the transmission light of the second beam splitting chip output is as light beam three, reflect through the 3rd reflecting mirror, combiner is converged with paraboloidal mirror B, pass sequentially through electro-optic crystal, convex lens, 1/4th slides, wollaston prism again, enter PD probe and carry out the opto-electronic conversion of signal, follow-up carry out signal record and process.
Described device also includes two groups of delay systems, and delay system is made up of two illuminators and one-dimensional direct current generator, is placed in the light path of light beam two and light beam three, regulates light path light path.
Described THz source is selected ultra-short pulse laser to focus on formation plasma wire drawing in atmosphere thus is produced THz wave, or focus on ultrashort laser and excite carrier high-speed motion on photoconductive antenna thus produce THz wave, or i.e. produce THz wave with ultra-short pulse laser and the interaction of nonlinear dielectric with light method for rectifying.
Described electro-optic crystal is from ZnTe, GaP, GaAs, ZnCdTe, HgCdTe, LiNbO3In choose any one kind of them.
The THz wave method for testing performance of described device, specifically includes following steps
1) when gathering initial background signal, light beam two is first blocked, with detection light beam recording through the complete terahertz wave signal after intrinsic germanium flat board;
2) when light beam two is irradiated on intrinsic germanium flat board, irradiated regional reflex THz ripple, remaining THz ripple is through entering detection system after intrinsic germanium flat board;Complete terahertz wave signal and part are subtracted each other by the terahertz wave signal after reflecting the relevant Terahertz characteristic information that i.e. can get irradiated area;
3) controlling light beam two by 2-D vibration mirror regulation and be radiated at the diverse location on intrinsic germanium flat board, in conjunction with later stage spectrum analysis process and 2-D data recombinant, the data that can realize thz beam zones of different internal electric field amplitude, frequency and phase place are extracted.
The beneficial effects of the present invention is: the detection apparatus and method of THz wave performance of the present invention, the THz source distribution of energy, frequency, phase place on space plane that can be produced with synchronously tested different principle by new equipment and the new detection method of design, one, the sciences problems in the world to source feature detection can be solved, scientific research for the later stage lays the foundation, two, may help to user in actual applications and use different Feature Selection means for different sources, improve the application efficiency of THz wave.
Accompanying drawing explanation
Fig. 1 is the structure of the detecting device schematic diagram of THz wave performance of the present invention.
Detailed description of the invention:
Detect the apparatus structure schematic diagram of THz wave performance as shown in Figure 1, including: beam splitting chip 1;Reflecting mirror 2;THz source 3;Paraboloidal mirror A4;Planar metal mirror 5;Intrinsic germanium 6;Beam splitting chip 7;Reflecting mirror 8;Convex lens 9;Concavees lens 10;Reflecting mirror 11;One-dimensional direct current generator 12;Reflecting mirror 13;Two-dimensional scanning mirrors 14;Reflecting mirror 15;One-dimensional direct current generator 16;Reflecting mirror 17;Reflecting mirror 18;Paraboloidal mirror B19;ZnTe crystal 20;Convex lens 21;/ 4th slides 22;Wollaston prism 23;PD probe 24.The primary laser pulse exported by femto-second laser, after beam splitting chip 1, reflection light enters THz source 3 as light beam one through reflecting mirror 2.THz source 3 output produces THz wave, after off axis paraboloidal mirror A4, produces the thz beam of a collimation, through fixed intrinsic germanium flat board 6 after being reflected by planar metal mirror 5.By the transmission light of beam splitting chip 1 through beam splitting chip 7, beam splitting chip 7 output reflection light as light beam two after reflecting mirror 8 secondary reflection again, after the contracting bundle of convex lens 9 and concavees lens 10, by regulation two-dimensional scanning mirrors 14, change light exit direction, it is irradiated to the diverse location on intrinsic germanium flat board 6, at institute's irradiation area, the reflectance of intrinsic germanium 6 is greatly improved, form the surface of metalloid, reflected terahertz hereby light, and other positions of flat board are not irradiated by light beam, the THz wave in these regions that falls still is transmitted, the THz wave passed through is by parallel entrance paraboloidal mirror B19.By the transmission light of beam splitting chip 1 through beam splitting chip 7, the transmission light of beam splitting chip 7 output is as light beam three, reflect through reflecting mirror 18, combiner is converged with paraboloidal mirror B19, pass sequentially through electro-optic crystal 20, convex lens 21,1/4th slide 22, wollaston prism 23 again, enter the opto-electronic conversion that PD probe 24 carries out signal, follow-up carry out signal record and process.Thus detect the time-domain spectroscopy of thz beam, and processing finally by later stage spectrum analysis, the data that can realize thz beam zones of different internal electric field amplitude, frequency and phase place are extracted.
Reflecting mirror 11, one-dimensional direct current generator 12, reflecting mirror 13 form delay system, are placed in light beam three light path, play the effect of regulation detection light path light path.
Reflecting mirror 15, one-dimensional direct current generator 16, reflecting mirror 17 form delay system, are placed in light beam two light path, play regulation and control the effect of light path light path.
In the following embodiments, as a example by exporting the laser instrument that center wavelength of light is 800 nm, its all band is consistent with the implementation of this wave band.
Laser instrument output center wavelength of light is 800 nm, and spectral region 780-820 nm, pulse width is 30 fs, repetition rate 1 KHz.400 are obtained with BBO frequency-doubling crystal As a example by the frequency doubled light of nm.Said method utilizes intrinsic germanium flat board detection Terahertz two dimensional surface electric field amplitude frequency and PHASE DISTRIBUTION, the regulation process being embodied as selecting is as follows: by the primary laser pulse of femto-second laser output 800nm, by beam splitting chip 1 (1:1), reflection light beam forms light beam one (pumping pulse), transmitted light beam forms light beam two (control pulse) through the reflection light beam of beam splitting chip 7 again, and the transmitted light beam of beam splitting chip 7 forms light beam three (direct impulse).Light beam one produces THz wave through THz source 3, after off axis paraboloidal mirror A4, produces the thz beam of a collimation, through fixed intrinsic germanium flat board 6 after being reflected by planar metal reflecting mirror 5.Light beam two (control pulse) is after the contracting bundle of convex lens 9 and concavees lens 10, by regulation two-dimensional scanning mirrors, change light exit direction, allow and control pulse all with the oblique different spatial being mapped to scan intrinsic germanium flat board 6 of Brewster's angle, at institute's irradiation area, the reflectance of intrinsic germanium 6 is greatly improved, and forms the surface of metalloid, reflected terahertz hereby light, and other positions of flat board are not irradiated by light beam, the THz wave in these regions that falls still is transmitted.These THz waves passed through by parallel entrance paraboloidal mirror B19 and detect combiner with three beams simultaneously, by ZnTe crystal 20, convex lens 21,1/4th slide 22, wollaston prism 23, enter PD detector, thus detect the time-domain spectroscopy of thz beam.
When gathering initial background signal, first block light beam two (control pulse), with detection light beam recording through the complete terahertz wave signal after intrinsic germanium flat board 6.When light beam two (control pulse) is irradiated on intrinsic germanium flat board 6, irradiated regional reflex THz ripple, remaining THz ripple is through entering detection system after intrinsic germanium flat board 6.Complete terahertz wave signal and part are subtracted each other by the terahertz wave signal after reflecting the relevant Terahertz characteristic information that i.e. can get irradiated area.Controlling light beam two by 2-D vibration mirror regulation and be radiated at the diverse location on intrinsic germanium flat board 6, in conjunction with later stage spectrum analysis process and 2-D data recombinant, the data that can realize thz beam zones of different internal electric field amplitude, frequency and phase place are extracted.
Described THz source 3 can be selected for ultra-short pulse laser focusing formation plasma wire drawing in atmosphere thus produces THz wave, or focus on ultrashort laser and excite carrier high-speed motion on photoconductive antenna thus produce THz wave, or i.e. produce THz wave with ultra-short pulse laser and the interaction of nonlinear dielectric with light method for rectifying.
Described electro-optic crystal 20 can be from ZnTe, GaP, GaAs, ZnCdTe, HgCdTe, LiNbO3In choose any one kind of them.

Claims (5)

1. the detection device of a THz wave performance, it is characterised in that include two beam splitting chips;Three reflecting mirrors;THz source;Paraboloidal mirror A;Planar metal mirror;Intrinsic germanium;Two convex lenss;Concavees lens;Two-dimensional scanning mirrors;Paraboloidal mirror B;Electro-optic crystal;/ 4th slides;Wollaston prism;PD pops one's head in;The primary laser pulse exported by femto-second laser, after the first beam splitting chip, reflection light enters THz source as light beam one through the first reflecting mirror, THz source output produces THz wave, after off axis paraboloidal mirror A, produce the thz beam of a collimation, through fixed intrinsic germanium flat board after being reflected by planar metal mirror;
By the transmission light of the first beam splitting chip through the second beam splitting chip, second beam splitting chip output reflection light as light beam two after the second reflecting mirror secondary reflection again, after the contracting bundle of the first convex lens and concavees lens, by regulation two-dimensional scanning mirrors, change light exit direction, be irradiated to the diverse location on intrinsic germanium flat board, form the surface of metalloid, reflected terahertz hereby light, the position THz wave not being irradiated to still is transmitted, the THz wave parallel entrance paraboloidal mirror B passed through;
By the transmission light of the first beam splitting chip through the second beam splitting chip, the transmission light of the second beam splitting chip output is as light beam three, reflect through the 3rd reflecting mirror, combiner is converged with paraboloidal mirror B, pass sequentially through electro-optic crystal, convex lens, 1/4th slides, wollaston prism again, enter PD probe and carry out the opto-electronic conversion of signal, follow-up carry out signal record and process.
The detection device of THz wave performance the most according to claim 1, it is characterized in that, described device also includes two groups of delay systems, and delay system is made up of two illuminators and one-dimensional direct current generator, it is placed in the light path of light beam two and light beam three, regulates light path light path.
The detection device of THz wave performance the most according to claim 1 or claim 2, it is characterized in that, described THz source is selected ultra-short pulse laser to focus on formation plasma wire drawing in atmosphere thus is produced THz wave, or focus on ultrashort laser and excite carrier high-speed motion on photoconductive antenna thus produce THz wave, or i.e. produce THz wave with ultra-short pulse laser and the interaction of nonlinear dielectric with light method for rectifying.
The detection device of THz wave performance the most according to claim 1 or claim 2, it is characterised in that described electro-optic crystal is from ZnTe, GaP, GaAs, ZnCdTe, HgCdTe, LiNbO3In choose any one kind of them.
5. according to the THz wave method for testing performance of device described in Claims 1-4 any one, it is characterised in that specifically include following steps
1) when gathering initial background signal, light beam two is first blocked, with detection light beam recording through the complete terahertz wave signal after intrinsic germanium flat board;
2) when light beam two is irradiated on intrinsic germanium flat board, irradiated regional reflex THz wave, remaining THz wave is through entering detection system after intrinsic germanium flat board;Complete terahertz wave signal and part are subtracted each other by the terahertz wave signal after reflecting the relevant Terahertz characteristic information that i.e. can get irradiated area;
3) controlling light beam two by 2-D vibration mirror regulation and be radiated at the diverse location on intrinsic germanium flat board, in conjunction with later stage spectrum analysis process and 2-D data recombinant, the data that can realize thz beam zones of different internal electric field amplitude, frequency and phase place are extracted.
CN201510077425.7A 2015-02-13 2015-02-13 Detection device and method for properties of terahertz waves Active CN104677497B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510077425.7A CN104677497B (en) 2015-02-13 2015-02-13 Detection device and method for properties of terahertz waves

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510077425.7A CN104677497B (en) 2015-02-13 2015-02-13 Detection device and method for properties of terahertz waves

Publications (2)

Publication Number Publication Date
CN104677497A CN104677497A (en) 2015-06-03
CN104677497B true CN104677497B (en) 2017-01-11

Family

ID=53312851

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510077425.7A Active CN104677497B (en) 2015-02-13 2015-02-13 Detection device and method for properties of terahertz waves

Country Status (1)

Country Link
CN (1) CN104677497B (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105628642A (en) * 2016-01-08 2016-06-01 上海理工大学 Method for improving frequency spectrum signal-to-noise ratio of tera-hertz optical detection system
CN107015414A (en) * 2016-01-28 2017-08-04 首都师范大学 A kind of system and method for changing terahertz polarization state
CN105928624B (en) * 2016-04-18 2018-10-12 上海理工大学 Enhance the device and method of terahertz wave signal based on hollow metal waveguide fiber
CN106442379B (en) * 2016-10-09 2018-11-13 上海理工大学 The device backwards to laser far-distance detection dangerous goods based on THz wave
CN108321663B (en) * 2018-02-11 2019-10-01 成都清大华科微晶材料有限责任公司 A kind of continuous terahertz emission source of wideband and corresponding exciting method
CN108981915A (en) * 2018-06-05 2018-12-11 北京航空航天大学 High field Terahertz spin transmitter and spectrometer
CN109001836B (en) * 2018-09-03 2019-10-15 苏州耶拿微电子有限公司 Terahertz human body security check system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2874476Y (en) * 2006-02-10 2007-02-28 天津大学 Terahertz time domain spectral instrument based on optical rectification
CN101782432A (en) * 2010-03-16 2010-07-21 中国科学院苏州纳米技术与纳米仿生研究所 Universal photoelectric test system for tera-hertz spectra
CN103557941A (en) * 2013-10-31 2014-02-05 上海理工大学 Broadband TeraHertz wave time domain detection and light spot imaging integrated device and adjustment method
CN104330160A (en) * 2014-10-16 2015-02-04 中国电子科技集团公司第五十研究所 Terahertz spectrum analyzer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8759778B2 (en) * 2007-09-27 2014-06-24 Anis Rahman Terahertz time domain and frequency domain spectroscopy
JP5894575B2 (en) * 2011-03-29 2016-03-30 浜松ホトニクス株式会社 Terahertz wave spectrometer

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2874476Y (en) * 2006-02-10 2007-02-28 天津大学 Terahertz time domain spectral instrument based on optical rectification
CN101782432A (en) * 2010-03-16 2010-07-21 中国科学院苏州纳米技术与纳米仿生研究所 Universal photoelectric test system for tera-hertz spectra
CN103557941A (en) * 2013-10-31 2014-02-05 上海理工大学 Broadband TeraHertz wave time domain detection and light spot imaging integrated device and adjustment method
CN104330160A (en) * 2014-10-16 2015-02-04 中国电子科技集团公司第五十研究所 Terahertz spectrum analyzer

Also Published As

Publication number Publication date
CN104677497A (en) 2015-06-03

Similar Documents

Publication Publication Date Title
CN104677497B (en) Detection device and method for properties of terahertz waves
CN101526399B (en) Terahertz spectrometer
CN105973871B (en) A kind of the microcell scanning means and its microcell scan method of spectral detection Elemental redistribution
Van Rudd et al. Influence of substrate-lens design in terahertz time-domain spectroscopy
JP5489906B2 (en) Terahertz wave transceiver and tomographic image acquisition device
CN103743681B (en) Terahertz spectrograph and terahertz transceiver probe
CN105891144B (en) Terahertz scanning system and scan method
JP5209364B2 (en) Terahertz beam scanning apparatus and method
CN106442378B (en) The device of spectral absorption accurate testing degree is improved based on Terahertz light comb
US20080251720A1 (en) Beam scanning imaging method and apparatus
CN107860742B (en) Reflective terahertz time-domain near-field scanning microscope
CN105784634A (en) Terahertz time domain spectrograph capable of measuring transmission and reflection simultaneously under vertical incidence
CN106996918B (en) Terahertz imaging system based on photonics technology
CN107421910B (en) Terahertz strong field system of ultrashort pulse pump based on wave surface inclination method
CN107063480B (en) Based on four-wave mixing scan-type ultrashort laser pulse time domain contrast measuring instrument
CN110376156A (en) The THz wave spectra system that asynchronous optical sampling and double light combs integrate
CN106441576B (en) A kind of utilization space chirp terahertz pulse carries out the device of real time imagery
CN103364417A (en) Terahertz wave detection device
WO2009146561A1 (en) Dual mode terahertz spectroscopy and imaging systems and methods
US8724111B2 (en) Flash photolysis system
CN219201337U (en) Terahertz near-field detector
CN105181697A (en) Detecting device and method for continuous wave terahertz real-time watermark imaging
Cui et al. Broadband THz Bessel beam generation based on axicon
JP4393147B2 (en) Terahertz electromagnetic wave generating element
KR20170089613A (en) Terahertz device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant