CN104655999A - Tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules - Google Patents

Tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules Download PDF

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Publication number
CN104655999A
CN104655999A CN201310593101.XA CN201310593101A CN104655999A CN 104655999 A CN104655999 A CN 104655999A CN 201310593101 A CN201310593101 A CN 201310593101A CN 104655999 A CN104655999 A CN 104655999A
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CN
China
Prior art keywords
copper bar
igbt module
test
frock
bolt
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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CN201310593101.XA
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Chinese (zh)
Inventor
张强
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CRRC Xian Yongdian Electric Co Ltd
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Xian Yongdian Electric Co Ltd
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Application filed by Xian Yongdian Electric Co Ltd filed Critical Xian Yongdian Electric Co Ltd
Priority to CN201310593101.XA priority Critical patent/CN104655999A/en
Publication of CN104655999A publication Critical patent/CN104655999A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules. The tool comprises a first copper bar, a second copper bar and a third copper bar, wherein an elastic probe connected with external test equipment is arranged on at least one side wall of the first copper bar, the second copper bar and the third copper bar; one end of the first copper bar is connected with a collector of an auxiliary IGBT module through bolts, and the other end of the first copper bar is connected with a collector of a tested IGBT module through bolts; the second copper bar is connected with an emitter of the auxiliary IGBT module through bolts; the third copper bar is connected with an emitter of the tested IGBT module through bolts. The tool used for testing the switching characteristics of the crimp-type IGBT modules, disclosed by the invention, not only has a protection effect on electrodes of the IGBT modules but also guarantees the flatness and good electric contact of the electrodes of the IGBT modules in a dynamic test process, and guarantees the accuracy of a test result.

Description

A kind of frock for the test of compression joint type IGBT module switching characteristic
Technical field
The present invention relates to technical field of semiconductor encapsulation, particularly relate to a kind of frock for the test of compression joint type IGBT module switching characteristic.
Background technology
IGBT (Insulated Gate Bipolar Transistor), insulated gate bipolar transistor, there is the feature of high-frequency, high voltage, big current, especially there is the feature turning on and off driving circuit, and structure is simple, be the representational product of most of the Power Electronic Technique third time revolution of generally acknowledging in the world, developed into for the 6th generation so far, commercialization developed into for the 5th generation.At present, IGBT has been widely used in the every profession and trade of national economy.
Switching characteristic due to IGBT module can reflect the dynamic process performance of module work, is the important guarantee of high-power IGBT module electrical characteristics.Thus, in the switching characteristic test process of IGBT module, if unreasonable for the tool structure tested, easily cause the electrode stress deformation of IGBT module, thus cause IGBT module electrode and frock surface of contact gap to produce electric arc, finally affect the accuracy of IGBT module test result.
In addition, (wherein 1 is auxiliary IGBT module as can be seen from Figure 1,2 is tested IGBT module), inductance L P2 in test circuit, LP3, LP4, LP5 is that test fixture brings stray inductance, these stray inductances can impact the test result of IGBT module, such as, the increase of stray inductance can cause turning off energy and increase, turns off crest voltage and increase, open that energy reduces, DI/DT reduces, and what these impacts were tested for the switching characteristic of IGBT module is all accurately very disadvantageous factor.Therefore, the stray inductance that reduction test fixture brings is very important.
Further, the switching characteristic tests affect of impedance to IGBT module brought of test fixture is larger.Such as, under conditions of high current, as 3000A, the saturation voltage drop of test I GBT module, if the resistance of subsidiary 0.1 milliohm of test fixture, test result just has the deviation of 0.1V.Therefore, need the impedance drop of test fixture to be low to moderate minimum.
In view of the above problems, be badly in need of a kind of reasonable in design, for the frock of compression joint type IGBT module switching characteristic test, to ensure the degree of accuracy of compression joint type IGBT module the result of dynamic test.
Summary of the invention
The problem that the present invention solves is to provide a kind of test result accurately for the frock of compression joint type IGBT module switching characteristic test.
For solving the problem, present invention is disclosed a kind of frock for the test of compression joint type IGBT module switching characteristic, comprise the first copper bar, second copper bar and the 3rd copper bar, described first copper bar, second copper bar is provided with the elastic probe for being connected external test facility with at least one sidewall of the 3rd copper bar, one end of described first copper bar is connected by the collector of bolt with auxiliary IGBT module, the other end of described first copper bar is connected by the collector of bolt with tested IGBT module, described second copper bar is connected by the emitter of bolt with auxiliary IGBT module, described 3rd copper bar is connected by the emitter of bolt with tested IGBT module.
Preferably, the two ends of described first copper bar are respectively arranged with screw, and described screw is evenly arranged in the two ends of described first copper bar.
Preferably, described second copper bar is evenly placed with screw.
Preferably, described 3rd copper bar is evenly placed with screw.
Preferably, described bolt is M8 bolt.
Preferably, the sidewall perpendicular to described first copper bar, the second copper bar and the 3rd copper bar is respectively arranged with connecting portion, and described elastic probe is vertically installed in described connecting portion.
Preferably, the surface of contact of described first copper bar, the second copper bar and described auxiliary IGBT module is provided with Gold plated Layer, and the surface of contact of described first copper bar, the 3rd copper bar and described tested IGBT module is provided with Gold plated Layer.
Compared with prior art, the present invention has the following advantages: the disclosed frock for the test of compression joint type IGBT module switching characteristic, comprise the first copper bar, second copper bar and the 3rd copper bar, described first copper bar, second copper bar is provided with the elastic probe for being connected external test facility with at least one sidewall of the 3rd copper bar, one end of described first copper bar is connected by the collector of bolt with auxiliary IGBT module, the other end of described first copper bar is connected by the collector of bolt with tested IGBT module, described second copper bar is connected by the emitter of bolt with auxiliary IGBT module, described 3rd copper bar is connected by the emitter of bolt with tested IGBT module.The disclosed frock for the test of compression joint type IGBT module switching characteristic, the mode adopting copper bar to connect carries out module dynamic test, in test process, because the contact area of copper bar and IGBT module electrode is large, thermal diffusivity is good, improve current carrying capacity, protective effect is served to the electrode of IGBT module, ensure that the flatness of IGBT module electrode in dynamic testing process and good electrical contact, and reduce the impact that impedance that frock is connected to form tests IGBT module, reduce the stray inductance in test loop, ensure the accuracy of test result.
Accompanying drawing explanation
Fig. 1 is the structural representation of the first copper bar in the preferred embodiment of the present invention;
Fig. 2 is the structural representation of the second copper bar in the preferred embodiment of the present invention;
Fig. 3 is the structural representation of the 3rd copper bar in the preferred embodiment of the present invention;
Fig. 4 is structural representation when test fixture uses in the preferred embodiment of the present invention;
Wherein: 1, the first copper bar; 2, the second copper bar; 3, the 3rd copper bar; 4, elastic probe; 5, screw; 6, auxiliary IGBT module; 61, collector; 62, emitter; 7, tested IGBT module; 71, collector; 72, emitter; 8, connecting portion.
Embodiment
The existing frock for the test of compression joint type IGBT module switching characteristic, the stray inductance produced during its test and impedance have had a strong impact on the degree of accuracy of compression joint type IGBT module switching characteristic test result.
In view of the above-mentioned problems in the prior art, present invention is disclosed a kind of frock for the test of compression joint type IGBT module switching characteristic, comprise the first copper bar, second copper bar and the 3rd copper bar, described first copper bar, second copper bar is provided with the elastic probe for being connected external test facility with at least one sidewall of the 3rd copper bar, one end of described first copper bar is connected by the collector of bolt with auxiliary IGBT module, the other end of described first copper bar is connected by the collector of bolt with tested IGBT module, described second copper bar is connected by the emitter of bolt with auxiliary IGBT module, described 3rd copper bar is connected by the emitter of bolt with tested IGBT module.
Preferably, the two ends of described first copper bar are respectively arranged with screw, and described screw is evenly arranged in the two ends of described first copper bar.
Preferably, described second copper bar is evenly placed with screw.
Preferably, described 3rd copper bar is evenly placed with screw.
Preferably, described bolt is M8 bolt.
Preferably, the sidewall perpendicular to described first copper bar, the second copper bar and the 3rd copper bar is respectively arranged with connecting portion, and described elastic probe is vertically installed in described connecting portion.
Preferably, the surface of contact of described first copper bar, the second copper bar and described auxiliary IGBT module is provided with Gold plated Layer, and the surface of contact of described first copper bar, the 3rd copper bar and described tested IGBT module is provided with Gold plated Layer.
The disclosed frock for the test of compression joint type IGBT module switching characteristic, the mode adopting copper bar to connect carries out module dynamic test, in test process, because the contact area of copper bar and IGBT module electrode is large, thermal diffusivity is good, improve current carrying capacity, protective effect is served to the electrode of IGBT module, ensure that the flatness of IGBT module electrode in dynamic testing process and good electrical contact, and reduce the impact that impedance that frock is connected to form tests IGBT module, reduce the stray inductance in test loop, ensure the accuracy of test result.
Below in conjunction with accompanying drawing, the technical scheme in the embodiment of the present invention is described in detail.
Incorporated by reference to Fig. 1 to Fig. 4, present invention is disclosed a kind of frock for the test of compression joint type IGBT module switching characteristic, comprise the first copper bar 1, second copper bar 2 and the 3rd copper bar 3, first copper bar 1, second copper bar 2 and at least one sidewall of the 3rd copper bar 3 are provided with the elastic probe 4 for being connected external test facility, one end of first copper bar 1 is connected by the collector 61 of bolt with auxiliary IGBT module 6, the other end of the first copper bar 1 is connected by the collector 71 of bolt with tested IGBT module 7, second copper bar 2 is connected by the emitter 62 of bolt with auxiliary IGBT module 6, 3rd copper bar 3 is connected by the emitter 72 of bolt with tested IGBT module 7.
In a preferred embodiment of the invention, the two ends of the first copper bar 1 are respectively arranged with screw 5, and screw 5 is evenly arranged in the two ends of the first copper bar 1.
Second copper bar 2 is evenly placed with screw 5, the 3rd copper bar 3 is evenly placed with screw 5.
In a preferred embodiment of the invention, bolt is M8 bolt.
In view of IGBT module 6 thinner thickness, operating space is limited, therefore, in a preferred embodiment of the invention, sidewall perpendicular to the first copper bar 1, second copper bar 2 and the 3rd copper bar 3 is respectively arranged with connecting portion 8, and elastic probe 4 is vertically installed in connecting portion 8, thus completes the connection with external test facility.
In view of the electrode of IGBT module all adopts plating material, plating material is stressed easily leaves impression afterwards, and as device production producer, this is unallowed.Therefore, disclosed frock adopts copper bar, and the material of copper bar is softer, to avoid in use leaving impression to the electrode of IGBT module.Further, oxidation is there is in order to prevent the layers of copper of copper bar, impact electrical connection, the first copper bar 1, second copper bar 2 is provided with Gold plated Layer with the surface of contact of auxiliary IGBT module 6, and the first copper bar 1, the 3rd copper bar 3 are provided with Gold plated Layer with the surface of contact of tested IGBT module 7.Gold plated Layer can improve oxidation resistance and the electric conductivity of frock, reduces the impedance of frock, and reducing affects larger stray inductance in dynamic test.Herein, the first copper bar 1, second copper bar 2 and the 3rd copper bar 3 area that contacts with IGBT module electrode is larger, and copper bar more can be avoided to produce impression to electrode.Now, because the contact area of copper bar and electrode is comparatively large, in bolted process, should be noted that the order according to diagonal angle is fastening is carried out.
The disclosed frock for the test of compression joint type IGBT module switching characteristic, comprise the first copper bar 1, second copper bar 2 and the 3rd copper bar 3, first copper bar 1, second copper bar 2 and at least one sidewall of the 3rd copper bar 3 are provided with the elastic probe 4 for being connected external test facility, one end of first copper bar 1 is connected by the collector 61 of bolt with auxiliary IGBT module 6, the other end of the first copper bar 1 is connected by the collector 71 of bolt with tested IGBT module 7, second copper bar 2 is connected by the emitter 62 of bolt with auxiliary IGBT module 6, 3rd copper bar 3 is connected by the emitter 72 of bolt with tested IGBT module 7.The disclosed frock for the test of compression joint type IGBT module switching characteristic, have the following advantages: the mode adopting copper bar to connect carries out module dynamic test, in test process, because the contact area of copper bar and IGBT module electrode is large, thermal diffusivity is good, improve current carrying capacity, protective effect is served to the electrode of IGBT module, ensure that the flatness of IGBT module electrode in dynamic testing process and good electrical contact, and reduce the impact that impedance that frock is connected to form tests IGBT module, reduce the stray inductance in test loop, ensure the accuracy of test result, gold-plated process is carried out to copper bar surface of contact, improves oxidation resistance and the electric conductivity of frock, reduce the impedance of frock, reduce to affect larger stray inductance in dynamic test, avoid the damage that IGBT module electrode in test process is subject to mechanically.
To the above-mentioned explanation of the disclosed embodiments, professional and technical personnel in the field are realized or uses the present invention.To be apparent for those skilled in the art to the multiple amendment of these embodiments, General Principle as defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention can not be restricted to these embodiments shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.

Claims (7)

1. the frock for the test of compression joint type IGBT module switching characteristic, it is characterized in that: comprise the first copper bar, second copper bar and the 3rd copper bar, described first copper bar, second copper bar is provided with the elastic probe for being connected external test facility with at least one sidewall of the 3rd copper bar, one end of described first copper bar is connected by the collector of bolt with auxiliary IGBT module, the other end of described first copper bar is connected by the collector of bolt with tested IGBT module, described second copper bar is connected by the emitter of bolt with auxiliary IGBT module, described 3rd copper bar is connected by the emitter of bolt with tested IGBT module.
2. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, it is characterized in that: the two ends of described first copper bar are respectively arranged with screw, described screw is evenly arranged in the two ends of described first copper bar.
3. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, is characterized in that: described second copper bar is evenly placed with screw.
4. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, is characterized in that: described 3rd copper bar is evenly placed with screw.
5. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, is characterized in that: described bolt is M8 bolt.
6. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, it is characterized in that: the sidewall perpendicular to described first copper bar, the second copper bar and the 3rd copper bar is respectively arranged with connecting portion, and described elastic probe is vertically installed in described connecting portion.
7. the frock for the test of compression joint type IGBT module switching characteristic according to claim 1, it is characterized in that: the surface of contact of described first copper bar, the second copper bar and described auxiliary IGBT module is provided with Gold plated Layer, the surface of contact of described first copper bar, the 3rd copper bar and described tested IGBT module is provided with Gold plated Layer.
CN201310593101.XA 2013-11-20 2013-11-20 Tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules Pending CN104655999A (en)

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CN201310593101.XA CN104655999A (en) 2013-11-20 2013-11-20 Tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules

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CN201310593101.XA CN104655999A (en) 2013-11-20 2013-11-20 Tool used for testing switching characteristics of crimp-type IGBT (insulated gate bipolar transistor) modules

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106706963A (en) * 2015-07-28 2017-05-24 国网智能电网研究院 Large power compression type IGBT package module press mounting test clamp
CN107728032A (en) * 2016-08-16 2018-02-23 株洲中车时代电气股份有限公司 A kind of test device of crimp type power semiconductor
CN107977066A (en) * 2017-11-24 2018-05-01 郑州云海信息技术有限公司 A kind of RACK server nodes electric power-feeding structure
CN109298305A (en) * 2017-07-24 2019-02-01 株洲中车时代电气股份有限公司 A kind of test device and method for compression joint type IGBT module submodule group
CN111487515A (en) * 2020-04-21 2020-08-04 华北电力大学 Static characteristic measurement system of crimping type power device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101752997A (en) * 2010-01-18 2010-06-23 合肥阳光电源有限公司 Parallel IGBT module copper bar installation structure
CN102012440A (en) * 2010-11-11 2011-04-13 嘉兴斯达微电子有限公司 Optimally-designed test fixture for power module
JP2013024684A (en) * 2011-07-20 2013-02-04 Mitsubishi Electric Corp Inspection tool and inspection device
CN103293344A (en) * 2012-02-24 2013-09-11 西安永电电气有限责任公司 Test circuit board and test fixture for IGBT module

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101752997A (en) * 2010-01-18 2010-06-23 合肥阳光电源有限公司 Parallel IGBT module copper bar installation structure
CN102012440A (en) * 2010-11-11 2011-04-13 嘉兴斯达微电子有限公司 Optimally-designed test fixture for power module
JP2013024684A (en) * 2011-07-20 2013-02-04 Mitsubishi Electric Corp Inspection tool and inspection device
CN103293344A (en) * 2012-02-24 2013-09-11 西安永电电气有限责任公司 Test circuit board and test fixture for IGBT module

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106706963A (en) * 2015-07-28 2017-05-24 国网智能电网研究院 Large power compression type IGBT package module press mounting test clamp
CN107728032A (en) * 2016-08-16 2018-02-23 株洲中车时代电气股份有限公司 A kind of test device of crimp type power semiconductor
CN109298305A (en) * 2017-07-24 2019-02-01 株洲中车时代电气股份有限公司 A kind of test device and method for compression joint type IGBT module submodule group
CN109298305B (en) * 2017-07-24 2020-12-11 株洲中车时代半导体有限公司 Testing device and method for crimping type IGBT module sub-module
CN107977066A (en) * 2017-11-24 2018-05-01 郑州云海信息技术有限公司 A kind of RACK server nodes electric power-feeding structure
CN111487515A (en) * 2020-04-21 2020-08-04 华北电力大学 Static characteristic measurement system of crimping type power device
CN111487515B (en) * 2020-04-21 2021-03-16 华北电力大学 Static characteristic measurement system of crimping type power device

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