CN104624523A - Electronic component detection device and electronic component automatic detection method - Google Patents
Electronic component detection device and electronic component automatic detection method Download PDFInfo
- Publication number
- CN104624523A CN104624523A CN201310549856.XA CN201310549856A CN104624523A CN 104624523 A CN104624523 A CN 104624523A CN 201310549856 A CN201310549856 A CN 201310549856A CN 104624523 A CN104624523 A CN 104624523A
- Authority
- CN
- China
- Prior art keywords
- electronic component
- unit
- feeding unit
- control unit
- electron yuanjianjiancezhuangzhi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title abstract description 26
- 238000012545 processing Methods 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims abstract description 23
- 230000008569 process Effects 0.000 claims abstract description 15
- 230000002950 deficient Effects 0.000 claims description 43
- 238000012360 testing method Methods 0.000 claims description 31
- 238000005520 cutting process Methods 0.000 claims description 30
- 238000005259 measurement Methods 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 abstract description 14
- 239000000047 product Substances 0.000 description 31
- 230000006870 function Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 3
- 238000012856 packing Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention provides an electronic component detection device and an electronic component automatic detection method. The electronic component detection device comprises a feeding unit; a measuring unit for measuring the actual parameters of an electronic component; a control unit, which is connected to the feeding unit and the measuring unit and is used to determine whether an electronic component is qualified or not according to the relationship between the actual parameters and a target parameter range and send the qualified signal or disqualified signal, wherein the feeding unit receives the qualified signal; and a processing unit, which is used to receive the disqualified signal from the control unit and process the disqualified electronic components. The electronic components are detected by the provided electronic component detection device, the detection efficiency is improved, the work labor for workers is reduced, the production supply is guaranteed, and the production efficiency is ensured. The provided electronic component automatic detection method can achieve automatic feeding, automatic detection, and automatic processing on qualified products and disqualified products, thus the work labor on workers is reduced, and the detection efficiency is improved.
Description
Technical field
The present invention relates to electronic component detection technique field, more specifically, relate to a kind of Electron YuanJianJianCeZhuangZhi and electronic component automatic testing method.
Background technology
Needing in electric equipment products to use a lot of electronic components, in order to ensure the product qualified rate of electric equipment products, thus needing to detect each electronic component, in time underproof electronic component is screened out before use electronic component.
In prior art, adopt the method for manual detection to screen electronic component, cause that intensity of workers is large, detection efficiency is low.Meanwhile, because the volume of electronic component (such as braid resistance, braid electric capacity etc.) is little, consumption large (every consumption per day nearly several ten thousand even tens0000), thus the manual detection speed of staff cannot meet Production requirement, has a strong impact on production efficiency.
Summary of the invention
The present invention aims to provide a kind of Electron YuanJianJianCeZhuangZhi and electronic component automatic testing method, causes to solve manual detection electronic component in prior art the problem that intensity of workers is large, detection efficiency is low.
For solving the problems of the technologies described above, according to an aspect of the present invention, providing a kind of Electron YuanJianJianCeZhuangZhi, comprising: feeding unit, feeding unit has feed end and discharge end; Measuring unit, the operating position of measuring unit between the feed end and discharge end of feeding unit, for measuring the actual parameter of electronic component; Control unit, is connected with feeding unit and measuring unit, and whether qualified and send qualifying signal or defective signal according to the relation determination electronic component of actual parameter and target component scope, feeding unit receives qualifying signal; Processing unit, is connected with control unit, for the defective signal that reception control unit sends, and processes underproof electronic component.
Further, feeding unit comprises pole wheel, and pole wheel is for multiple, and the multiple direction interval of pole wheel along feed end to discharge end is arranged.
Further, measuring unit is resistance meter.
Further, processing unit is excision assembly.
Further, excision assembly comprise: cutting knife, the operating position of cutting knife between the operating position and the discharge end of feeding unit of measuring unit, for excising electronic component; Drive division, is connected with control unit, and the defective signal sent for reception control unit also drives cutting knife to move.
Further, Electron YuanJianJianCeZhuangZhi also comprises workbench, and workbench is between the feed end and discharge end of feeding unit, and the operating position of measuring unit is positioned on workbench, and the operating position of cutting knife is positioned on workbench.
Further, Electron YuanJianJianCeZhuangZhi also comprises the first incorporating section for the cut electronic component of access, and the first housing portion is in the below of workbench.
Further, Electron YuanJianJianCeZhuangZhi also comprises the second incorporating section for access electronic component, and the second housing portion is in the below of the discharge end of feeding unit.
Further, Electron YuanJianJianCeZhuangZhi also comprises input block, and input block is connected with control unit, transmits control signal to feeding unit, measuring unit, processing unit for setting target component scope and/or controlling control unit.
Further, Electron YuanJianJianCeZhuangZhi also comprises counting element, and counting element is connected with control unit, for receiving defective signal and counting.
Further, Electron YuanJianJianCeZhuangZhi also comprises alarm element, and alarm element is connected with counting element, for exceeding default value alarm when counting element counting.
According to another aspect of the present invention, provide a kind of electronic component automatic testing method, comprising: step S1: the operating position place by feeding unit, electronic component to be detected being delivered to measuring unit; Step S2: measure the electronic component at the operating position place being positioned at measuring unit, to obtain the actual parameter of electronic component; Step S3: whether control unit is qualified and send qualifying signal or defective signal according to the relation determination electronic component of actual parameter and target component scope; Step S4: when control unit sends qualifying signal, feeding unit receives the discharge end that electronic component is delivered to feeding unit by qualifying signal; When control unit sends defective signal, processing unit receives defective signal and processes electronic component.
Further, determine that the method whether electronic component is qualified is in step s3: when actual parameter is within the scope of target component, determine that electronic component is qualified products; Otherwise, determine that electronic component is substandard product.
Further, in step s 4 which, processing unit receives defective signal and comprises the method that electronic component processes: step S41: the drive division of processing unit receives defective signal and drives cutting knife to move; Step S42: bounce back after cutting knife cutting electronic components; Step S43: control unit drives feeding unit motion, next electronic component is delivered to the operating position place of measuring unit.
Further, the step S5 after electronic component automatic testing method is also included in step S4: electronic component is collected with the first incorporating section and the second incorporating section.
Further, target component scope is set by input block in step s3.
Further, also comprise between step S3 and step S4: step S31: by the number of the underproof electronic component of counting element record; Step S32: when the number of underproof electronic component exceedes the warning of default value alarm element.
Further, also comprised before step S1: step S01: by traffic direction and/or the speed of service of input block setting feeding unit; Step S02: by input block setting duplicate measurements number of times, when determining in step S3 that electronic component is substandard product, according to duplicate measurements number of times, duplicate measurements is carried out to electronic component; Step S03: set the testing time by input block, the testing time is carry out the duplicate measurements time used to electronic component.
Measuring unit in the present invention is for measuring the actual parameter of electronic component, feeding unit is connected with control unit with measuring unit, whether control unit is qualified and send qualifying signal or defective signal according to the relation determination electronic component of actual parameter and target component scope, feeding unit receives qualifying signal, processing unit is used for the defective signal that reception control unit sends, and processes underproof electronic component.Owing to adopting Electron YuanJianJianCeZhuangZhi to detect electronic component, thus improve detection efficiency, reduce the labour intensity of staff, ensure that production supply, ensure that production efficiency.Meanwhile, the Electron YuanJianJianCeZhuangZhi in the present invention has that structure is simple, the feature of low cost of manufacture.
Electronic component automatic testing method in the present invention can realize self-feeding, automatically detect, automatically processes the function of certified products and defective work, thus alleviate the labour intensity of staff, improve detection efficiency, thus ensure that produce materials supply, ensure that manufacturing schedule.
Accompanying drawing explanation
The accompanying drawing forming a application's part is used to provide a further understanding of the present invention, and schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 diagrammatically illustrates the structural representation of the Electron YuanJianJianCeZhuangZhi in the present invention; And
Fig. 2 diagrammatically illustrates the flow chart of the electronic component automatic testing method in the present invention.
Reference numeral in figure: 10, feeding unit; 11, pole wheel; 20, measuring unit; 30, processing unit; 31, cutting knife; 32, drive division; 40, workbench; 50, the second incorporating section.
Detailed description of the invention
Below in conjunction with accompanying drawing, embodiments of the invention are described in detail, but the multitude of different ways that the present invention can be defined by the claims and cover is implemented.
As first aspect of the present invention, provide a kind of Electron YuanJianJianCeZhuangZhi.As shown in Figure 1, Electron YuanJianJianCeZhuangZhi comprises feeding unit 10, measuring unit 20, control unit and processing unit 30, and wherein, feeding unit 10 has feed end and discharge end; The operating position of measuring unit 20 between the feed end and discharge end of feeding unit 10, for measuring the actual parameter of electronic component; Control unit is connected with feeding unit 10 and measuring unit 20, and whether qualified and send qualifying signal or defective signal according to the relation determination electronic component of actual parameter and target component scope, feeding unit 10 receives qualifying signal; Processing unit 30 is connected with control unit, for the defective signal that reception control unit sends, and processes underproof electronic component.Owing to adopting Electron YuanJianJianCeZhuangZhi to detect electronic component, thus improve detection efficiency, reduce the labour intensity of staff, ensure that production supply, ensure that production efficiency.Meanwhile, the Electron YuanJianJianCeZhuangZhi in the present invention has that structure is simple, the feature of low cost of manufacture.
In enforcement as shown in Figure 1, owing to being provided with feeding unit 10, thus electronic component (such as braid resistance, braid electric capacity etc.) can be detected by the operating position that feeding unit 10 is transported to measuring unit 20 from feed end, and then deliver to the operating position place of processing unit 30 or the discharge end of feeding unit 10, thus realize the function of the self-feeding of Electron YuanJianJianCeZhuangZhi.
In embodiment as shown in Figure 1, feeding unit 10 comprises pole wheel 11, and pole wheel 11 is multiple, and the multiple direction interval of pole wheel 11 along feed end to discharge end is arranged.When electronic component is braid electronic component, because all electronic components are all connected by braid, and distance between adjacent two electronic components is identical, thus one end of braid electronic component be mounted in feed end pole wheel 11 on after, by the rolling of pole wheel 11, braid electronic component can be realized and moved to discharge end direction by feed end.Certainly, feeding unit 10 can also comprise driving-belt, and multiple pole wheels 11 are arranged on the below of driving-belt, and electronic component carries on the belt, thus realizes the function of self-feeding.Because the distance between adjacent two electronic components is identical, thus driving stepper motor pole can be adopted to take turns 11 rotate, by the step pitch of control step motor, the stepper motor primary electron element that often operates can be realized and move forward the spacing of a resistance, thus ensure that stepper motor operates at every turn, all can transmit a new electronic component to be detected to the operating position place of measuring unit 20, thus improve the dependability of Electron YuanJianJianCeZhuangZhi.
In embodiment as shown in Figure 1, owing to being provided with measuring unit 20, the actual parameter thus can treating detected electrons element is measured, thus for judge whether this electronic component reaches use criterion of acceptability, provides reliable Data support.Be in the example of braid resistance at electronic component, measuring unit 20 is resistance meter.
Preferably, the Electron YuanJianJianCeZhuangZhi in the present invention also comprises primary importance sensor, and primary importance sensor setting is at the operating position place of measuring unit 20, and primary importance sensor is connected with control unit.Further, primary importance sensor is Fibre Optical Sensor.When primary importance sensor detects that electronic component arrives the operating position place of measuring unit 20, primary importance sensor passes signal is to controller, and make controller transmit control signal to feeding unit 10, feeding unit 10 is made to stop feeding, so that the electronic component of measuring unit 20 to this position is measured, thus ensure that the accuracy of measurement.
Certainly, Fibre Optical Sensor can also be set at the sound end of measuring unit 20, for the distance of the pin of the sound end and electronic component that sense measuring unit 20, and be driven the sound end motion of measuring unit 20 by motor, to measure electronic component.
In the present invention, owing to being provided with control unit, the actual parameter that thus measuring unit 20 can be collected and target component scope are compared, and then determine whether this electronic component is qualified and send qualifying signal or defective signal, to control feeding unit 10 or processing unit 30 action.Preferably, control unit is PLC or other controllers.
In embodiment as shown in Figure 1, owing to being provided with processing unit 30, thus when substandard product being detected, defective signal can be sent by control unit, and after receiving this defective signal by processing unit 30, this underproof electronic component be processed.In a not shown embodiment, processing unit 30 comprises push rod and drives the motor of pushrod movement, and push rod is arranged on the side of feeding unit 10.When the defective signal that processing unit 30 reception control unit sends, pushrod movement, in order to push this underproof electronic component by feeding unit 10, to gather collection to substandard product.
In the example of braid electronic component, processing unit 30 is excision assembly.Because all electronic components connect by braid, thus when substandard product being detected, need underproof electronic component to excise from braid, so that by qualified electronic component and defective electronic component categorised collection.
In embodiment as shown in Figure 1, excision assembly comprise cutting knife 31 and drive division 32, the operating position of cutting knife 31 between the operating position of measuring unit 20 and the discharge end of feeding unit 10, for excising electronic component; Drive division 32 is connected with control unit, and the defective signal sent for reception control unit also drives cutting knife 31 to move.When control unit sends defective signal, the defective signal that drive division 32 reception control unit sends also drives cutting knife 31 to move, thus is excised from braid by this electronic component.
Preferably, the operating position place of cutting knife 31 is provided with second place sensor.When second place sensor detected electrons element puts in place, second place sensor sends a signal to control unit, feeding unit 10 stop motion is controlled to make control unit, now cutting knife 31 moves, excise this electronic component, thus ensure that the accuracy of excising electronic component, the dependability that improve Electron YuanJianJianCeZhuangZhi.
Preferably, the operating position of cutting knife 31 and the operating position of measuring unit 20 should be the integral multiple of distance between adjacent two electronic components or distance, can ensure that the operating position of cutting knife 31 accurately sent to by electronic component by feeding unit 10 from the operating position of measuring unit 20 like this, thus further ensure the dependability of Electron YuanJianJianCeZhuangZhi.
In embodiment as shown in Figure 1, Electron YuanJianJianCeZhuangZhi also comprises workbench 40, workbench 40 is between the feed end and discharge end of feeding unit 10, and the operating position of measuring unit 20 is positioned on workbench 40, and the operating position of cutting knife 31 is positioned on workbench 40.Owing to being provided with workbench 40, thus for electronic component carries out measuring or cutting process provides stable, reliable workbench, thus ensure that the dependability of Electron YuanJianJianCeZhuangZhi.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises the first incorporating section for the cut electronic component of access, and the first housing portion is in the below of workbench 40.In the example of braid electronic component, because underproof electronic component is cut, thus when feeding unit 10 moves forward, this electronic component drops by workbench 40, is collected by the first incorporating section.Certainly, can also arrange active window on workbench 40, active window is positioned at position corresponding with cutting knife 31 on workbench 40, after electronic component is cut, active window is opened, thus this electronic component is fallen and by the first incorporating section access by active window.
In embodiment as shown in Figure 1, Electron YuanJianJianCeZhuangZhi the second incorporating section 50, incorporating section 50, second also comprised for access electronic component is positioned at the below of the discharge end of feeding unit 10.In the example of braid electronic component, because substandard product is all cut, the braid electronic component thus sent by the discharge end of feeding unit 10 is qualified products, and these qualified braid electronic components are reclaimed, for the production of use by the second incorporating section 50.Braid electronic component utilizes the folding vestige of box-packed electronic component braid, the stacked shape of automatic blanking.Preferably, the second incorporating section 50 is corrugated case.Further, Electron YuanJianJianCeZhuangZhi also comprises packing apparatus.After full electronic component collected by corrugated case, packing apparatus by corrugated case packing process, thus is convenient to qualified electronic component to be transported to other fields of employment.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises input block, and input block is connected with control unit, transmits control signal to feeding unit 10, measuring unit 20, processing unit 30 for setting target component scope and/or controlling control unit.Owing to being provided with input block, thus staff can pass through the target component scope in input block change control unit, thus change is determined the standard whether electronic component is qualified to expand the scope of application of Electron YuanJianJianCeZhuangZhi.Certainly, by operating input block, the kinematic parameter of feeding unit 10, measuring unit 20, processing unit 30 can be controlled, thus make Electron YuanJianJianCeZhuangZhi except can automatically running, also there is the function of Non-follow control.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises counting element, and counting element is connected with control unit, for receiving defective signal and counting.Preferably, counting element is counter.Certainly, the tally function that control unit can also be used to carry.Because Electron YuanJianJianCeZhuangZhi has the function counted underproof electronic component, staff is thus facilitated to inquire about the quality condition of this batch products.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises alarm element, and alarm element is connected with counting element, for exceeding default value alarm when counting element counting.Preferably, this alarm element is buzzer or LED.Owing to being provided with alarm element, thus when there is the substandard product exceeding preset number in a certain batch products, Electron YuanJianJianCeZhuangZhi alarm.Like this, staff can check Electron YuanJianJianCeZhuangZhi in time, to avoid the problem causing due to hardware reason detecting error.Certainly, also remind this batch products quality of staff existing problems, avoid the problem causing wasting detection time due to product sole mass problem, reduce detection efficiency.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises for detecting the braid electronic component whether normal sensor of input and output material.Meanwhile, the Electron YuanJianJianCeZhuangZhi in the present invention also comprises memory cell, for recording the quantity, analysis report etc. of measuring production status, substandard product.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises display unit, and display unit is connected with memory cell.Preferably, display unit is LED display or touch-screen.
Electron YuanJianJianCeZhuangZhi in the present invention also comprises urgency and stops gauge tap, suddenly stops gauge tap and is connected with control unit, and for controlling, Electron YuanJianJianCeZhuangZhi is anxious to stop.
As second aspect of the present invention, provide a kind of electronic component automatic testing method.As shown in Figure 2, electronic component automatic testing method comprises: step S1: the operating position place by feeding unit 10, electronic component to be detected being delivered to measuring unit 20; Step S2: measure the electronic component at the operating position place being positioned at measuring unit 20, to obtain the actual parameter of electronic component; Step S3: whether control unit is qualified and send qualifying signal or defective signal according to the relation determination electronic component of actual parameter and target component scope; Step S4: when control unit sends qualifying signal, feeding unit 10 receives the discharge end that electronic component is delivered to feeding unit 10 by qualifying signal; When control unit sends defective signal, processing unit 30 receives defective signal and processes electronic component.Electronic component automatic testing method in the present invention can realize self-feeding, automatically detect, automatically processes the function of certified products and defective work, thus alleviate the labour intensity of staff, improve detection efficiency, thus ensure that produce materials supply, ensure that manufacturing schedule.
In the present invention, target component scope is set by input block in step s3.Owing to can set target component scope by input block, thus staff according to product or different detection demand modifying target parameter areas, thus can improve the scope of application of electronic component automatic testing method.
Determine in the present invention that the method whether electronic component is qualified is in step s3: when actual parameter is within the scope of target component, determine that electronic component is qualified products; Otherwise, determine that electronic component is substandard product.The qualified products being met instructions for use can be screened by said method, thus when this electronic component is applied in electrical equipment inside, effectively can ensure the end product quality of electrical equipment, decrease electrical equipment accident probability and repair rate.
In the present invention in step s 4 which, processing unit 30 receives defective signal and comprises the method that electronic component processes: step S41: the drive division 32 of processing unit 30 receives defective signal and drives cutting knife 31 to move; Step S42: bounce back after cutting knife 31 cutting electronic components; Step S43: control unit drives feeding unit 10 to move, and next electronic component is delivered to the operating position place of measuring unit 20.Because underproof electronic component excises by cutting knife 31, thus qualified electronic component is separated with defective electronic component by processing unit 30, thus is convenient to carry out categorised collection to two kinds of electronic components.
Step S5 after electronic component automatic testing method in the present invention is also included in step S4: electronic component is collected with the first incorporating section and the second incorporating section 50.After testing, electronic component is divided into certified products and defective work, and defective work is excised by cutting knife 31, thus cut defective work is collected with the first incorporating section, collect with the second incorporating section 50 and detect qualified electronic component, so that follow-up use, thus the categorised collection realizing certified products and defective work.
Also comprise between step S3 and step S4 in the present invention: step S31: by the number of the underproof electronic component of counting element record; Step S32: when the number of underproof electronic component exceedes the warning of default value alarm element.Because counting element can record the number of underproof electronic component, be thus convenient to the quality condition that staff inquires about this batch products.Simultaneously, owing to reporting to the police when the number of underproof electronic component exceedes default value alarm element, thus prompting staff improves attention to this batch products in time, checks whether the problem that there is erroneous judgement ahead of time, or delays the problem of detection progress because this batch of product substandard products are serious.
Also comprised before step S1 in the present invention: step S01: by traffic direction and/or the speed of service of input block setting feeding unit; Step S02: by input block setting duplicate measurements number of times, when determining in step S3 that electronic component is substandard product, according to duplicate measurements number of times, duplicate measurements is carried out to electronic component; Step S03: set the testing time by input block, the testing time is carry out the duplicate measurements time used to electronic component.Owing to can be set traffic direction and/or the speed of service of feeding unit by input block, thus staff can carry out Non-follow control to testing process, or sets according to detection needs.Due to duplicate measurements number of times can be set by input block, thus when substandard product being detected, repeating to detect this electronic component, to avoid the problem occurring judging by accident, thus ensure that the accuracy of detection of electronic component automatic testing method.Due to the testing time can be set by input block, thus effectively can control the efficiency detected, thus further increase the operating reliability of electronic component automatic testing method.
These are only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (18)
1. an Electron YuanJianJianCeZhuangZhi, is characterized in that, comprising:
Feeding unit (10), described feeding unit (10) has feed end and discharge end;
Measuring unit (20), between the described feed end that the operating position of described measuring unit (20) is positioned at described feeding unit (10) and described discharge end, for measuring the actual parameter of electronic component;
Control unit, be connected with described feeding unit (10) and described measuring unit (20), determine whether described electronic component is qualified according to the relation of described actual parameter and target component scope and send qualifying signal or defective signal, described feeding unit (10) receives described qualifying signal;
Processing unit (30), is connected with described control unit, for receiving the described defective signal that described control unit sends, and processes underproof described electronic component.
2. Electron YuanJianJianCeZhuangZhi according to claim 1, it is characterized in that, described feeding unit (10) comprises pole wheel (11), and described pole wheel (11) is for multiple, and multiple described pole wheel (11) is arranged along described feed end to the interval, direction of described discharge end.
3. Electron YuanJianJianCeZhuangZhi according to claim 1, is characterized in that, described measuring unit (20) is resistance meter.
4. Electron YuanJianJianCeZhuangZhi according to claim 1, is characterized in that, described processing unit (30) is excision assembly.
5. Electron YuanJianJianCeZhuangZhi according to claim 4, is characterized in that, described excision assembly comprises:
Cutting knife (31), the operating position of described cutting knife (31) is positioned between the operating position of described measuring unit (20) and the described discharge end of described feeding unit (10), for excising described electronic component;
Drive division (32), is connected with described control unit, for receiving described defective signal that described control unit sends and driving described cutting knife (31) to move.
6. Electron YuanJianJianCeZhuangZhi according to claim 5, it is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises workbench (40), between the described feed end that described workbench (40) is positioned at described feeding unit (10) and described discharge end, and the operating position of described measuring unit (20) is positioned on described workbench (40), the operating position of described cutting knife (31) is positioned on described workbench (40).
7. Electron YuanJianJianCeZhuangZhi according to claim 6, is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises the first incorporating section for the cut described electronic component of access, and described first housing portion is in the below of described workbench (40).
8. Electron YuanJianJianCeZhuangZhi according to claim 1, it is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises the second incorporating section (50) for electronic component described in access, and described second incorporating section (50) is positioned at the below of the described discharge end of described feeding unit (10).
9. Electron YuanJianJianCeZhuangZhi according to claim 1, it is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises input block, described input block is connected with described control unit, transmits control signal to described feeding unit (10), described measuring unit (20), described processing unit (30) for setting described target component scope and/or controlling described control unit.
10. Electron YuanJianJianCeZhuangZhi according to claim 1, is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises counting element, and described counting element is connected with described control unit, for receiving described defective signal and counting.
11. Electron YuanJianJianCeZhuangZhis according to claim 10, it is characterized in that, described Electron YuanJianJianCeZhuangZhi also comprises alarm element, described alarm element is connected with described counting element, for exceeding default value alarm when described counting element counting.
12. 1 kinds of electronic component automatic testing methods, is characterized in that, comprising:
Step S1: the operating position place by feeding unit (10), electronic component to be detected being delivered to measuring unit (20);
Step S2: measure the described electronic component at the operating position place being positioned at described measuring unit (20), to obtain the actual parameter of described electronic component;
Step S3: according to the relation of described actual parameter and target component scope, control unit is determined whether described electronic component is qualified and sent qualifying signal or defective signal;
Step S4: when described control unit sends described qualifying signal, described feeding unit (10) receives the discharge end that described electronic component is delivered to described feeding unit (10) by described qualifying signal; When described control unit sends described defective signal, processing unit (30) receives described defective signal and processes described electronic component.
13. electronic component automatic testing methods according to claim 12, it is characterized in that, in described step S3, determine that the method whether described electronic component is qualified is: when described actual parameter is within the scope of described target component, determine that described electronic component is qualified products; Otherwise, determine that described electronic component is substandard product.
14. electronic component automatic testing methods according to claim 12, is characterized in that, in described step S4, described processing unit (30) receives described defective signal and comprises the method that described electronic component processes:
Step S41: the drive division (32) of described processing unit (30) receives described defective signal and drives cutting knife (31) to move;
Step S42: bounce back after described cutting knife (31) cuts described electronic component;
Step S43: described control unit drives described feeding unit (10) to move, and described for next one electronic component is delivered to the operating position place of described measuring unit (20).
15. electronic component automatic testing methods according to claim 12, is characterized in that, the step S5 after described electronic component automatic testing method is also included in described step S4: collected by described electronic component with the first incorporating section and the second incorporating section (50).
16. electronic component automatic testing methods according to claim 12, is characterized in that, target component scope is set by input block described in described step S3.
17. electronic component automatic testing methods according to claim 12, is characterized in that, also comprise between described step S3 and described step S4:
Step S31: by the number of the underproof described electronic component of counting element record;
Step S32: when the number of underproof described electronic component exceedes the warning of default value alarm element.
18. electronic component automatic testing methods according to claim 12, is characterized in that, also comprised before described step S1:
Step S01: the traffic direction and/or the speed of service that are set described feeding unit (10) by input block;
Step S02: by described input block setting duplicate measurements number of times, when determining that described electronic component is substandard product in described step S3, according to described duplicate measurements number of times, duplicate measurements is carried out to described electronic component;
Step S03: by the described input block setting testing time, the described testing time is carry out the duplicate measurements time used to described electronic component.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310549856.XA CN104624523B (en) | 2013-11-07 | 2013-11-07 | Electron YuanJianJianCeZhuangZhi and electronic component automatic testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310549856.XA CN104624523B (en) | 2013-11-07 | 2013-11-07 | Electron YuanJianJianCeZhuangZhi and electronic component automatic testing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104624523A true CN104624523A (en) | 2015-05-20 |
| CN104624523B CN104624523B (en) | 2017-10-03 |
Family
ID=53204038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310549856.XA Expired - Fee Related CN104624523B (en) | 2013-11-07 | 2013-11-07 | Electron YuanJianJianCeZhuangZhi and electronic component automatic testing method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104624523B (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106391491A (en) * | 2016-08-31 | 2017-02-15 | 苏州阳明诚商业管理有限公司 | Intelligent management system for yield detection |
| CN107402336A (en) * | 2017-06-23 | 2017-11-28 | 南京铁道职业技术学院 | A kind of electronic component finished product debugging detection device |
| CN108345234A (en) * | 2017-01-23 | 2018-07-31 | 迅得机械股份有限公司 | Process monitoring methods |
| CN109406533A (en) * | 2018-10-25 | 2019-03-01 | 北京阿丘机器人科技有限公司 | A kind of detection system and method for surface defects of products |
| CN109448334A (en) * | 2018-12-30 | 2019-03-08 | 杭州翰融智能科技有限公司 | A kind of alarm system |
| CN110434094A (en) * | 2019-08-01 | 2019-11-12 | 格力电器（武汉）有限公司 | Electronic component detection processing device |
| CN112698098A (en) * | 2019-10-23 | 2021-04-23 | 神讯电脑(昆山)有限公司 | Device for measuring winding wrapping type resistance |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0857433A (en) * | 1993-12-29 | 1996-03-05 | Lucky Metals Corp | Automatic sorting machine for permanent magnet |
| CN201434665Y (en) * | 2009-03-31 | 2010-03-31 | Aem科技（苏州）有限公司 | Plate type device tape appearance detector |
| CN101992189A (en) * | 2009-08-25 | 2011-03-30 | 康准电子科技（昆山）有限公司 | Sorting device and method for workpiece detection |
| CN201930934U (en) * | 2010-12-16 | 2011-08-17 | 江阴格朗瑞科技有限公司 | Marking device of strip testing separator |
| CN203133193U (en) * | 2013-01-10 | 2013-08-14 | 深圳市晶导电子有限公司 | Electronic element detection equipment |
| JP2013221936A (en) * | 2012-04-12 | 2013-10-28 | Mire Kk | Semiconductor element handling system |
| CN203526088U (en) * | 2013-11-07 | 2014-04-09 | 珠海格力电器股份有限公司 | Detection device for electronic components |
-
2013
- 2013-11-07 CN CN201310549856.XA patent/CN104624523B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0857433A (en) * | 1993-12-29 | 1996-03-05 | Lucky Metals Corp | Automatic sorting machine for permanent magnet |
| CN201434665Y (en) * | 2009-03-31 | 2010-03-31 | Aem科技（苏州）有限公司 | Plate type device tape appearance detector |
| CN101992189A (en) * | 2009-08-25 | 2011-03-30 | 康准电子科技（昆山）有限公司 | Sorting device and method for workpiece detection |
| CN201930934U (en) * | 2010-12-16 | 2011-08-17 | 江阴格朗瑞科技有限公司 | Marking device of strip testing separator |
| JP2013221936A (en) * | 2012-04-12 | 2013-10-28 | Mire Kk | Semiconductor element handling system |
| CN203133193U (en) * | 2013-01-10 | 2013-08-14 | 深圳市晶导电子有限公司 | Electronic element detection equipment |
| CN203526088U (en) * | 2013-11-07 | 2014-04-09 | 珠海格力电器股份有限公司 | Detection device for electronic components |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106391491A (en) * | 2016-08-31 | 2017-02-15 | 苏州阳明诚商业管理有限公司 | Intelligent management system for yield detection |
| CN108345234A (en) * | 2017-01-23 | 2018-07-31 | 迅得机械股份有限公司 | Process monitoring methods |
| CN107402336A (en) * | 2017-06-23 | 2017-11-28 | 南京铁道职业技术学院 | A kind of electronic component finished product debugging detection device |
| CN109406533A (en) * | 2018-10-25 | 2019-03-01 | 北京阿丘机器人科技有限公司 | A kind of detection system and method for surface defects of products |
| CN109448334A (en) * | 2018-12-30 | 2019-03-08 | 杭州翰融智能科技有限公司 | A kind of alarm system |
| CN110434094A (en) * | 2019-08-01 | 2019-11-12 | 格力电器（武汉）有限公司 | Electronic component detection processing device |
| CN112698098A (en) * | 2019-10-23 | 2021-04-23 | 神讯电脑(昆山)有限公司 | Device for measuring winding wrapping type resistance |
| CN112698098B (en) * | 2019-10-23 | 2023-10-13 | 神讯电脑(昆山)有限公司 | Device for measuring coiled tape wrapped resistor |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104624523B (en) | 2017-10-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104624523A (en) | Electronic component detection device and electronic component automatic detection method | |
| CN203526088U (en) | Detection device for electronic components | |
| CN101405611B (en) | Method and device for indicating an electric discharge inside a bearing of an electric drive system | |
| CN205628654U (en) | Automatic vision detection system of electric appliance plug connector | |
| CN1331618C (en) | Method and apparatus for testing and sorting join arrangement electronic devices | |
| CN102553831A (en) | Method and device for distributing and sorting lithium ion power cell pole pieces | |
| CN103486918A (en) | Automatic tester and test method for electronic detonator | |
| US20160203445A1 (en) | Work order integration and equipment status tracking | |
| CN113172000A (en) | Cigarette system with weight supervision and management platform | |
| CN104515776A (en) | Device and method for determining positions of strip steel surface defect | |
| CN203249595U (en) | Multifunctional detector | |
| CN110497248A (en) | Flying shear scale shear precision real-time detecting system and method | |
| CN111002328A (en) | Wheeled robot checking system and method | |
| CN109378526A (en) | A kind of equipment of assembling and measurement for lithium ion battery | |
| CN108500737A (en) | A kind of contactless tool detection devices and method | |
| CN202614176U (en) | Multi-channel casing length measuring machine | |
| CN209673943U (en) | Partial discharge of transformer on-line monitoring system | |
| CN203922011U (en) | Charging self-checking device and bulk cargo foreign matter testing agency | |
| CN110116279A (en) | Tablet perforating device | |
| CN107961978A (en) | A kind of novel measuring test point needle divider | |
| CN208584036U (en) | A kind of aluminium sheet rotary shear equipment fault detection means | |
| CN205120830U (en) | Detection mechanism of battery block | |
| CN205192467U (en) | Metal sheet on -line measuring device | |
| EP0359434B1 (en) | Cable insulation eccentricity and diameter monitor | |
| CN204480013U (en) | The bad loss value data of streamline is collected, warning device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171003 |