CN104596568A - Lattice structure tester target lattice structure self-learning test method - Google Patents
Lattice structure tester target lattice structure self-learning test method Download PDFInfo
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- CN104596568A CN104596568A CN201510003026.6A CN201510003026A CN104596568A CN 104596568 A CN104596568 A CN 104596568A CN 201510003026 A CN201510003026 A CN 201510003026A CN 104596568 A CN104596568 A CN 104596568A
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Abstract
The invention discloses a lattice structure tester target lattice structure self-learning test method. The method comprises a lattice structure testing machine, an assistive device and a switching function test, the lattice structure inside the test set intelligent test processing module, and an external set of bays insertion slot connector, the function detects switching device is provided with a first end of the auxiliary cable mounted plugs, wiring harness cable group and the second end cable mount plug, in turn connected to each other, the lattice structure tester inserted through the slot and to be learning Bays lattice structure connected and the connection is completed, intelligent test processing module automatically performs a series of steps to be able to identify learning lattice structure specifications, and automatically generate the appropriate test procedures best combination. The invention allows the lattice structure of the test automatically identify unknown lattice structure of the new body, its automatic generation of test inspection procedures, eliminating the need for the artificial production of governance, programming, testing and other routine procedures, saving a lot of manpower and material resources , but also saving a lot of time.
Description
Technical field
The present invention relates to a kind of fireworks production test instrument, be specifically related to lattice structure body examination test-run a machine target dot matrix structure self study method of testing.
Background technology
Lattice structure body is the key components and parts realizing figure line fireworks, the display determining fireworks can accomplish the effect of user's request, also be that decision figure line fireworks can miniaturization, the critical component of integration, the volume of lattice structure body, dot matrix dense degree, shaping efficiency, the step of production cost and aft-loaded airfoil process all seriously constrains the holistic cost of figure line fireworks, security, reliability and production efficiency, lattice structure body needs precision die, precise forming, a large amount of accurate aftertreatment machining tool, quality testing instrument, shaping tool, tools for loading and anti-error, blast protection measure etc., the core component of figure line fireworks needs a large amount of inter-trade new and high technology supports across technical field and original daring to blaze new trails, the spirit that dare to test, existing every profession and trade lacks corresponding technical support, the data that particularly industry fireworks technical field can be for reference is so tragic that one cannot bear to look at it, need oneself to go developing everywhere.
Summary of the invention
The object of the invention is to the above problem overcoming prior art existence, lattice structure body examination test-run a machine target dot matrix structure self study method of testing is provided, the present invention can allow lattice structure body examination test-run a machine automatically identify unknown trendy lattice structure body, for trendy lattice structure body generates TCP automatically, save the conventional programs such as manual manufacture tool, programming, test, both save a large amount of manpowers, material resources, also save a large amount of time.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention is achieved through the following technical solutions:
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, comprise lattice structure body examination test-run a machine (1) and lattice structure body to be learned (4), intelligent test processing module is established in described lattice structure body examination test-run a machine (1), be connected with the bay insertion groove (3) of outer setting, described Function detection switches servicing unit (2) and is provided with first end winding displacement installation plug (5), wire harness winding displacement group (7) and the second end winding displacement install plug (6), be interconnected successively, described lattice structure body examination test-run a machine (1) is connected with lattice structure body (4) to be learned by bay insertion groove (3).
Further, described lattice structure body (4) to be learned switches servicing unit (2) with Function detection and is connected, and described Function detection switches approbate and reprobate and the combination that servicing unit (2) comprises sensor, switch, electronic devices and components and connector.
Further, described sensor comprises temperature sensor, pressure transducer, displacement transducer, speed pickup, humidity sensor, light sensor, infrared sensor, electromagnetic sensor; Described switch comprises mechanical switch, electronic switch, electro-mechanical switches and have the device of switching function; Described electronic devices and components comprise diode, triode, electric capacity and the circuit board with multiple electronic devices and components; Described connector comprises metal connector, plastics connector and compound substance connector.
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, intelligent test processing module automatically performs step by a series of, can identify the specifications and models of lattice structure body to be learned, and automatically generate the combination of corresponding optimum test procedure, its step is as follows:
Lattice structure body (4) to be learned to be completed with lattice structure body examination test-run a machine (1) by bay insertion groove (3) and is connected by step 1);
Step 2) lattice structure body examination test-run a machine (1) startup intelligent test processing module;
Step 3) intelligent test processing module exports learning signal by bay insertion groove (3);
Step 4) learning signal is transmitted by lattice structure body (4) to be learned;
Step 5) lattice structure body examination test-run a machine (1) receives the learning signal transmitted by lattice structure body (4) to be learned;
The analysis of step 6) intelligent test processing module judges the Structure and function of wire harness;
Step 7) intelligent test processing module exports validation signal by bay insertion groove (3);
Step 8) validation signal is transmitted by lattice structure body (4) to be learned;
Step 9) lattice structure body examination test-run a machine (1) receives the validation signal transmitted by lattice structure body (4) to be learned;
The analysis of step 10) intelligent test processing module judges validation signal, generates the wire harness specification after study and test data.
Further, described step 4) learning signal is subject to the disturbance that Function detection switches servicing unit (2) when being transmitted by lattice structure body (4) to be learned, the learning signal that described step 5) lattice structure body examination test-run a machine (1) receives is the learning signal after being disturbed.
Further, when described step 7) intelligent test processing module is transmitted by lattice structure body (4) to be learned by bay insertion groove (3) output validation signal and described step 8) validation signal, lattice structure body examination test-run a machine (1) can remind operating personnel or operating means operating function to detect switching servicing unit (2), coordinates validation signal to verify.
Further, described step 9) lattice structure body examination test-run a machine (1) receives the validation signal that transmitted by lattice structure body (4) to be learned and the analysis of step 10) intelligent test processing module judges validation signal, when validation signal meets expection, complete lattice structure body (4) to be learned study and checking.
Further, described step 9) lattice structure body examination test-run a machine (1) receives the validation signal that transmitted by lattice structure body (4) to be learned and the analysis of step 10) intelligent test processing module judges validation signal, when validation signal does not meet expection, send information and instruction, remind operating function to detect and switch servicing unit (2), exceed to preset and remind number of times or operation overtime, then point out authentication failed, request relearns operation or takes out the lattice structure body (4) to be learned of non-learning success.
Further, described step 4) can weave into group to step 7), repeatedly repeats, and described step 8) can weave into group to step 10, repeatedly repeats.
Further, described step 3) can weave into group to step 10), repeatedly repeats.
The invention has the beneficial effects as follows:
Lattice structure body examination test-run a machine can be allowed automatically to identify unknown trendy lattice structure body, for trendy lattice structure body generates TCP automatically, save the conventional programs such as manual manufacture tool, programming, test, both saved a large amount of manpowers, material resources, also save a large amount of time.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the axle side schematic diagram of a kind of embodiment of the present invention;
Fig. 2 is the axle side schematic diagram of a kind of embodiment of the present invention.
Number in the figure illustrates: 1, lattice structure body examination test-run a machine, 2, lattice structure body to be learned, 3, bay insertion groove, 4, Function detection switches servicing unit, 5, first end winding displacement installs plug, and the 6, second end winding displacement installs plug, and 7, wire harness winding displacement group.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Shown in Fig. 1-Fig. 2, lattice structure body examination test-run a machine target dot matrix structure self study method of testing, comprise lattice structure body examination test-run a machine 1 and lattice structure body 2 to be learned, intelligent test processing module is established in described lattice structure body examination test-run a machine 1, be connected with the bay insertion groove 3 of outer setting, described lattice structure body 2 junction to be learned is provided with first end winding displacement and installs plug 5, wire harness winding displacement group 7 and the second end winding displacement installation plug 6, be interconnected successively, described lattice structure body examination test-run a machine 1 is connected with lattice structure body 2 to be learned by bay insertion groove 3.
Further, described lattice structure body 2 to be learned is provided with Function detection and switches servicing unit 4, and described Function detection switches approbate and reprobate and the combination that servicing unit 4 comprises sensor, switch, electronic devices and components and connector.
Further, described sensor comprises temperature sensor, pressure transducer, displacement transducer, speed pickup, humidity sensor, light sensor, infrared sensor, electromagnetic sensor; Described switch comprises mechanical switch, electronic switch, electro-mechanical switches and have the device of switching function; Described electronic devices and components comprise diode, triode, electric capacity and the circuit board with multiple electronic devices and components; Described connector comprises metal connector, plastics connector and compound substance connector.
Lattice structure body examination test-run a machine target dot matrix structure self study method of testing, intelligent test processing module automatically performs step by a series of, can identify the specifications and models of lattice structure body to be learned, and automatically generate the combination of corresponding optimum test procedure, its step is as follows:
Lattice structure body 2 to be learned to be completed with lattice structure body examination test-run a machine 1 by bay insertion groove 3 and is connected by step 1;
Step 2 lattice structure body examination test-run a machine 1 starts intelligent test processing module;
Step 3 intelligent test processing module exports learning signal by bay insertion groove 3;
Step 4 learning signal is transmitted by lattice structure body 2 to be learned;
Step 5 lattice structure body examination test-run a machine 1 receives the learning signal transmitted by lattice structure body 2 to be learned;
The analysis of step 6 intelligent test processing module judges the Structure and function of wire harness;
Step 7 intelligent test processing module exports validation signal by bay insertion groove 3;
Step 8 validation signal is transmitted by lattice structure body 2 to be learned;
Step 9 lattice structure body examination test-run a machine 1 receives the validation signal transmitted by lattice structure body 2 to be learned;
The analysis of step 10 intelligent test processing module judges validation signal, generates the wire harness specification after study and test data.
Further, be subject to the disturbance that Function detection switches servicing unit 4 when described step 4 learning signal is transmitted by lattice structure body 2 to be learned, the learning signal that described step 5 lattice structure body examination test-run a machine 1 receives is the learning signal after being disturbed.
Further, described step 7 intelligent test processing module by bay insertion groove 3 export validation signal and described step 8 validation signal transmitted by lattice structure body 2 to be learned time, lattice structure body examination test-run a machine 1 can remind operating personnel or operating means operating function to detect switching servicing unit 4, coordinates validation signal to verify.
Further, described step 9 lattice structure body examination test-run a machine 1 receives the validation signal that transmitted by lattice structure body 2 to be learned and the analysis of step 10 intelligent test processing module judges validation signal, when validation signal meets expection, complete lattice structure body 2 to be learned and learn and verify.
Further, described step 9 lattice structure body examination test-run a machine 1 receives the validation signal that transmitted by lattice structure body 2 to be learned and the analysis of step 10 intelligent test processing module judges validation signal, when validation signal does not meet expection, send information and instruction, remind operating function to detect and switch servicing unit 4, exceed to preset and remind number of times or operation overtime, then point out authentication failed, request relearns operation or takes out the lattice structure body 2 to be learned of non-learning success.
Further, described step 4 can weave into group to step 7, repeatedly repeats, and described step 8 can weave into group to step 10, repeatedly repeats.
Further, described step 3 can weave into group to step 10, repeatedly repeats.
The principle of work of the present embodiment is as follows:
First lattice structure body 2 to be learned to be completed with lattice structure body examination test-run a machine 1 by bay insertion groove 3 and be connected, restart the intelligent test processing module on dot matrix structure test machine 1, intelligent test processing module exports learning signal by bay insertion groove 3, learning signal is transmitted by lattice structure body 2 to be learned, operating function detects and switches servicing unit 4, perturbation learning signal, lattice structure body examination test-run a machine 1 receives the learning signal by disturbance transmitted by lattice structure body 2 to be learned, the analysis of intelligent test processing module judges the Structure and function of wire harness, intelligent test processing module exports validation signal by bay insertion groove 3, reminding user compounding practice Function detection switches servicing unit 4, validation signal is transmitted by lattice structure body 2 to be learned, lattice structure body examination test-run a machine 1 receives the validation signal transmitted by lattice structure body 2 to be learned, the analysis of intelligent test processing module judges validation signal, according to the situation of correcting errors of validation signal, wire harness specification after automatic generation study and test data or reminding user operate learning again.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. lattice structure body examination test-run a machine target dot matrix structure self study method of testing, it is characterized in that: comprise lattice structure body examination test-run a machine (1) and lattice structure body to be learned (4), intelligent test processing module is established in described lattice structure body examination test-run a machine (1), be connected with the bay insertion groove (3) of outer setting, described Function detection switches servicing unit (2) and is provided with first end winding displacement installation plug (5), wire harness winding displacement group (7) and the second end winding displacement install plug (6), be interconnected successively, described lattice structure body examination test-run a machine (1) is connected with lattice structure body (4) to be learned by bay insertion groove (3).
2. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 1, it is characterized in that: described lattice structure body (4) to be learned switches servicing unit (2) with Function detection and is connected, described Function detection switches approbate and reprobate and the combination that servicing unit (2) comprises sensor, switch, electronic devices and components and connector.
3. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 2, it is characterized in that: described sensor comprises temperature sensor, pressure transducer, displacement transducer, speed pickup, humidity sensor, light sensor, infrared sensor, electromagnetic sensor; Described switch comprises mechanical switch, electronic switch, electro-mechanical switches and have the device of switching function; Described electronic devices and components comprise diode, triode, electric capacity and the circuit board with multiple electronic devices and components; Described connector comprises metal connector, plastics connector and compound substance connector.
4. lattice structure body examination test-run a machine target dot matrix structure self study method of testing, it is characterized in that: intelligent test processing module automatically performs step by a series of, the specifications and models of lattice structure body to be learned can be identified, and automatically generate the combination of corresponding optimum test procedure, its step is as follows:
Lattice structure body (4) to be learned to be completed with lattice structure body examination test-run a machine (1) by bay insertion groove (3) and is connected by step 1);
Step 2) lattice structure body examination test-run a machine (1) startup intelligent test processing module;
Step 3) intelligent test processing module exports learning signal by bay insertion groove (3);
Step 4) learning signal is transmitted by lattice structure body (4) to be learned;
Step 5) lattice structure body examination test-run a machine (1) receives the learning signal transmitted by lattice structure body (4) to be learned;
The analysis of step 6) intelligent test processing module judges the Structure and function of wire harness;
Step 7) intelligent test processing module exports validation signal by bay insertion groove (3);
Step 8) validation signal is transmitted by lattice structure body (4) to be learned;
Step 9) lattice structure body examination test-run a machine (1) receives the validation signal transmitted by lattice structure body (4) to be learned;
The analysis of step 10) intelligent test processing module judges validation signal, generates the wire harness specification after study and test data.
5. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 4, it is characterized in that: be subject to the disturbance that Function detection switches servicing unit (2) when described step 4) learning signal is transmitted by lattice structure body (4) to be learned, the learning signal that described step 5) lattice structure body examination test-run a machine (1) receives is the learning signal after being disturbed.
6. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 4, it is characterized in that: when described step 7) intelligent test processing module is transmitted by lattice structure body (4) to be learned by bay insertion groove (3) output validation signal and described step 8) validation signal, lattice structure body examination test-run a machine (1) can remind operating personnel or operating means operating function to detect switching servicing unit (2), coordinates validation signal to verify.
7. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 6, it is characterized in that: described step 9) lattice structure body examination test-run a machine (1) receives the validation signal that transmitted by lattice structure body (4) to be learned and the analysis of step 10) intelligent test processing module judges validation signal, when validation signal meets expection, complete lattice structure body (4) to be learned study and checking.
8. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 6, it is characterized in that: described step 9) lattice structure body examination test-run a machine (1) receives the validation signal that transmitted by lattice structure body (4) to be learned and the analysis of step 10) intelligent test processing module judges validation signal, when validation signal does not meet expection, send information and instruction, remind operating function to detect and switch servicing unit (2), exceed to preset and remind number of times or operation overtime, then point out authentication failed, request relearns operation or takes out the lattice structure body (4) to be learned of non-learning success.
9. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 4, it is characterized in that: described step 4) can weave into group to step 7), repeatedly repeat, described step 8) can weave into group to step 10, repeatedly repeats.
10. lattice structure body examination test-run a machine target dot matrix structure self study method of testing according to claim 4, is characterized in that: described step 3) can weave into group to step 10), repeatedly repeats.
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| US4778293A (en) * | 1986-08-01 | 1988-10-18 | Oki Electric Industry Co., Ltd. | Dot matrix print head |
| JPH08244309A (en) * | 1995-03-08 | 1996-09-24 | Mitsubishi Electric Corp | Printing device |
| CN101113951A (en) * | 2006-07-28 | 2008-01-30 | 北京航天医学工程研究所 | Clenobuterol hydrochloride residual fast testing instrument |
| CN203535665U (en) * | 2013-11-07 | 2014-04-09 | 青岛金弘测控技术发展有限公司 | RFID label batch automatic write-in, reading, detection, and counting device |
| CN104596566A (en) * | 2014-12-31 | 2015-05-06 | 苏州征之魂专利技术服务有限公司 | Lattice structure tester target lattice structure self-learning test method |
-
2015
- 2015-01-05 CN CN201510003026.6A patent/CN104596568A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4778293A (en) * | 1986-08-01 | 1988-10-18 | Oki Electric Industry Co., Ltd. | Dot matrix print head |
| JPH08244309A (en) * | 1995-03-08 | 1996-09-24 | Mitsubishi Electric Corp | Printing device |
| CN101113951A (en) * | 2006-07-28 | 2008-01-30 | 北京航天医学工程研究所 | Clenobuterol hydrochloride residual fast testing instrument |
| CN203535665U (en) * | 2013-11-07 | 2014-04-09 | 青岛金弘测控技术发展有限公司 | RFID label batch automatic write-in, reading, detection, and counting device |
| CN104596566A (en) * | 2014-12-31 | 2015-05-06 | 苏州征之魂专利技术服务有限公司 | Lattice structure tester target lattice structure self-learning test method |
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