CN104569611A - PCB transmission line insertion loss testing method and probe device - Google Patents

PCB transmission line insertion loss testing method and probe device Download PDF

Info

Publication number
CN104569611A
CN104569611A CN201510002693.2A CN201510002693A CN104569611A CN 104569611 A CN104569611 A CN 104569611A CN 201510002693 A CN201510002693 A CN 201510002693A CN 104569611 A CN104569611 A CN 104569611A
Authority
CN
China
Prior art keywords
pcb
probe
transmission line
insertion loss
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510002693.2A
Other languages
Chinese (zh)
Other versions
CN104569611B (en
Inventor
王恩东
胡雷钧
邹定国
林楷智
李鹏翀
张柯柯
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inspur Beijing Electronic Information Industry Co Ltd
Original Assignee
Inspur Beijing Electronic Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspur Beijing Electronic Information Industry Co Ltd filed Critical Inspur Beijing Electronic Information Industry Co Ltd
Priority to CN201510002693.2A priority Critical patent/CN104569611B/en
Publication of CN104569611A publication Critical patent/CN104569611A/en
Application granted granted Critical
Publication of CN104569611B publication Critical patent/CN104569611B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention provides a PCB transmission line insertion loss testing method. The method comprises the steps that a specific testing PCB is constructed; de-embedded insertion loss of a transmission line of a specific length under the condition of specific frequency point is counted to serve as a testing empirical value; the testing empirical value is used as a comparison target value used for judging the design quality of an actual PCB. The invention further provides a probe device. The probe device comprises a probe end and a fixed end. The probe device is easy to operate, high in testing accuracy, low in cost and easy to maintain. The method is concise and effective in correction and high in accuracy.

Description

A kind of PCB transmission line insertion loss method of testing and probe unit
Technical field
The present invention relates to printing board PCB design field, be specifically related to a kind of full-automatic PCB transmission line insertion loss method of testing and probe unit.
Background technology
Electron trade is under the driving of Moore's Law, and product function is more and more stronger, and integrated level is more and more higher, and the speed of signal is more and more faster, and the corresponding R&D cycle is also shorter and shorter.Due to microminiaturization, the high speed of electronic product, various challenge is brought to design and through engineering approaches.PCB is the physics realization of electrical connection, connects various different electric device, complete functional realiey by PCB.PCB comprises the metal transmission line coupled together by each device, and in high speed serialization system, we also need the dielectric loss performance of the insulation environment considering high-quality loss and transmission line place.PCB loss can cause signal amplitude to reduce, and the rise time slows down, thus produces function degradation.And metal transmission line geometric shape is comprised for the affecting parameters of PCB loss, Metal Surface Roughness, skin effect, dielectric loss parameter, specific inductive capacity, the many factors such as humiture, for the lifting of numerous affecting parameters and signal frequency, can measure more accurate loss parameter in each frequency range particularly important.Increasing product controls undesirable because of passive channel, causes the problems such as launch postpones or the reliable problem of product is uncontrollable.
The loss parameter of high speed signal becomes the important parameter judging passive channel electric property, and the parameter of the various PCB processing such as transmission line etching, lamination, brown, impedance Control directly affects this parameter, small-lot testing for product more and more can not meet us and judge the whether reliable requirement of product, different individual differences, different PCB factory,, all there is Related product whether reliably risk in different processing batch.Thus, namely our needs carry out the test of loss parameter in the PCB process segment, are used for differentiating PCB passive channel performance, reduce function and reduce risk, reduce the R&D cycle.But not after product completes at the active test of SI and system testing environment to verify product reliability, move after the discovery time that can only throw into question like this point, affect production life cycle.
To the loss test of high speed signal, comparatively ripe method uses VNA (vector networkanalyzer) or TDR (Time-Domain Reflectometry) testing of equipment.VNA equipment is Agilent Products equipment, is a kind of electromagnetic wave energy equipment, and with regard to network analysis, network refers to that one group of inside is mutually related electronic devices and components.One of function of network analyzer is exactly the impedance mismatch between quantification two radio-frequency (RF) component, improves the integrality of power efficiency and signal to greatest extent.When radiofrequency signal enters another by an element, always some signal is reflected, and another part is transmitted, so thus propose the concept of S parameter, treats from frequency the signal problem that we mention.Itself measuring accuracy is in the field of business at present generally to be approved, but due to probe and aut.eq. problem, detection calibration and testing efficiency are not high, therefore also fails to extend to test loss equipment in enormous quantities.TDR equipment also can be used for loss test, but due to test probe restriction, the factors such as precision controlling cause needing manual calibration and consuming time long, can not as testing scheme in enormous quantities.And it is poor that the Noise measarement of the instrument of TDR own compares VNA equipment, cause its higher frequency section test result and actual match not good, only generally approved in comparatively low-frequency range.
For S parameter concept, the network of general two-port has four groups of S parameter, is respectively: S11/S21/S22/S12.
S11 representative gets a radiofrequency signal by Port1, and then is received the signal reflected by Port1.
S21 representative gets a radiofrequency signal by Port1, then is received by Port2.
S22 gets a radiofrequency signal by Port2, and then is received the signal reflected by Port2.
S12 representative gets a radiofrequency signal by Port2, then is received by Port1.
Usually we measure the passive channel of PCB by the concept of insertion loss, i.e. S21 or S12 parameter, wherein the insertion loss of SDD21 Parametric Representation difference port.The concept source of insertion loss and reflection parameters is in the definition of S parameter, and the unit of insertion loss is decibel DB, and S parameter, as the Common Parameters described for passive channel, no longer repeats herein.
See Fig. 1, when measuring insertion loss, need to make to spend the FA21 that proving installation is quoted by embedding algorithm, the value of FB21 cuts, and these two numerical value can not directly be measured, or the result of directly testing is insincere, needs to be peeled off by certain algorithm.Parameter declaration: FA represents the part that test fixture is connected with instrument port one, and FB represents the part that test fixture is connected with instrument port 2.
Go embedding algorithm to be based on the test result organizing the length of transmission line of rule more, and computing is carried out to various result, the impact of proving installation for test result is removed, thus obtains accurate measurement result.Below simply introduce and traditionally in prior art remove embedding algorithm, S parameter is converted to Z matrix.Following formula, Tmeasured is for measuring, and Tde-embedded is for removing embedding principle formula.
[T A] -1[T A][T DUT][T B][T B] -1
=[T DUT]
[T Measured]=[T L][T DUT][T R]
[T De-embedded]=[T L] -1[T Measured][T R] -1
=[T L] -1[T L][T DUT][T R][T R] -1=[T DUT]
Visible by above-mentioned introduction, existingly go embedding algorithm more complicated, relate to matrixing and calculating, calculating process is loaded down with trivial details, affects computational accuracy.In addition, the kind of current probe has GGB, SMA/SMP, probe station etc., and these all can not meet the requirement of batch testing from cost, efficiency, the aspect such as easy-to-use.Wherein GGB probe is for coordinating the method for testing of SET2DIL, easily damages, and cost is high.SMA probe is commonly used to passive channel test, possesses higher precision, but needs the welding such as PCB the corresponding interface storehouse, convenience and easy designability poor.High-end Probe test station possesses high precision, high cost characteristic, test one piece of veneer cycle all at about 2 days, and test and human cost high, large batch of test can not be used for.
Summary of the invention
Based on the technical matters existed in above-mentioned prior art, the present invention proposes a kind of PCB transmission line insertion loss method of testing and probe unit, reduces and removes embedding algorithm complex, improves test result degree of accuracy, realizes extensive automatic test, reduces human cost.
Described method comprises:
S1: make PCB test board, on it, length of every transmission lines meets: F n+1=F n+ F n-1, wherein F nbe the length of the n-th transmission lines, n>2, and n is positive integer;
S2: when described transmission line transmitting the signal of a certain frequency, uses probe unit to measure the insertion loss of each transmission lines, remembers that the insertion loss of the n-th transmission lines is S n;
S3: use the every F of following formulae discovery nlength transmission line go embedding after insertion loss S/F n: S/F n=S n-(S n+1-S n-1), and record each S/F nvalue;
S4: the frequency changing described signal on transmission line, returns step S2, until travel through all frequencies, the whole S/F recorded under preserving all frequencies nvalue as test empirical value, flow process terminates.
Especially:
When detecting the PCB of actual design, use described test empirical value as comparison object value, in the PCB detecting described actual design, whether the insertion loss of corresponding length transmission line meets the requirements, and then determines the quality of PCB of described actual design.
A kind of needle device, comprising:
Sound end and stiff end;
Wherein stiff end comprises,
For being fixed to the Part I on the automatic arm of robot by screw or buckle,
For the Part II of stationary probe end,
And spring assembly, for connecting described Part I and Part II.
Especially:
Described sound end has differential probe or Single probe, and described probe has GND and holds pin.
Especially:
Described probe is half firm radio frequency coaxial cables, and one end is SMA interface, is connected to testing apparatus by cable, and one end is the stripping core of cable.
The invention has the beneficial effects as follows: test probe is easy-to-use, precision is high, and cost is low, easy care; Algorithm corrects effectively simple and clear, and precision is high; Full-automatic loss test method for designing and aftertreatment data analysis, all in conjunction with concrete test status, can realize unmanned, full-automatic, save human cost, improve product reliability.
Accompanying drawing explanation
Fig. 1 is embedding principle key diagram
Fig. 2 is the measurement jig wiring diagram going embedding method to use that the present invention proposes
Fig. 3 is the full-automatic PCB transmission line insertion loss method of testing flow process that the present invention proposes
Fig. 4 is test result normal distribution
Fig. 5 is the sniffer figure that the present invention proposes
Fig. 6 is the sniffer fixed part structural drawing that the present invention proposes
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in detail.
Embodiment one: go embedding method
Make the PCB layout test board of the present embodiment proposition involved by technical scheme, in the present invention, call measurement jig in the following text.In measurement jig (test board) design that the present embodiment proposes, in order to mate probe unit, devising corresponding test and visiting point.See accompanying drawing 2, use Fibonacci sequence (FibonacciSequence) to carry out wires design, design the PCB transmission line of different length respectively.
Transmission line design is except length difference, and all the other need identical attribute (place layer, cross-sectional area etc.).For how selecting two pairs of concrete length of differential lines, thus ensure the precision of removing embedding algorithm, method is as follows:
By a large amount of test and validation data accumulations and contrast, expect accurate test data, the difference of the length of long transmission line and short transmission line should meet Fibonacci sequence, be also called Fibonacci sequence, it refers to such ordered series of numbers: 0, 1, 1, 2, 3, 5, 8, 13, 21, mathematically, fibonacci series is to be defined by the method with recurrence as follows: F0=0, F1=1, Fn=Fn-1+Fn-2 (n>=2, n ∈ N*), with word, be exactly that Fibonacci sequence is by 0 and 1, Fibonacci sequence coefficient is afterwards added by two numbers before.We set comparatively short transmission line length minimum length and equal 3inchs, and longer length of transmission line needs to equal 8inchs, namely there is following formula:
Length B=Fn-1;LengthA=Fn+1;
Length A-length B=Fn wherein (n>=5);
Meet above formula and can obtain High Accuracy Parameter, during from Practical Project n=5, from cost, consider it is then best with the angle of design.The signal that the present embodiment provides also is arrange based on the ordered series of numbers of n=5.Certainly can be different according to Practical Project, adjust above parameter, but can precision problem be there is, can make concrete analyses of concrete problems.
By proving installation test SDD21 parameter, be designated as SDD21a respectively, SDD21b, SDD21c, (below referred to as Sa, Sb, Sc).Wherein a is longer transmission line Insertion Loss, and b is the transmission line Insertion Loss taken second place, and c is most short transmission line Insertion Loss, as Fig. 2.Wherein the parameter of SDD21 represents the S parameter insertion loss of a pair difference transmission lines 2 and 1 port, and unit is decibel DB, and its form of Definition is taken at the basic definition to S parameter, repeats no more herein.Herein in order to more simple and clear description algorithm structure, according to Fibonacci sequence, we set, Length C=3inchs, then Length B=5inchs, Length A=8inchs, Length D=13inchs.
Choose the insertion loss parameter of same frequency respectively.By unit decibel DB definition we can obtain.
Wherein according to we actual engineering design p1=p3, namely obtain:
Then obtain several groups of data below according to above formula, Insertion Loss below obtains according to power delivery loss difference correspondence above.
Db/2inchs=Sb-Sc;
Db/3inchs=Sa-Sb;
Db/5inchs=Sa-Sc;
Db(fixture)=Sb-(Sa-Sc);
The Insertion Loss value of what wherein last Db (fixture) obtained be a cancellation 5 inchage transmission lines that aforementioned FA21 and FB21 affect.
By above data, we can obtain the S Insertion Loss detail parameters of measurement jig and the every Inch of transmission line.Other veneers follow-up all only can survey a, to increase testing efficiency.
Repeat above-mentioned method of testing at different frequencies, S Insertion Loss detail parameters under each frequency can be obtained.
The present embodiment is optimized improvement on current De-embedding basis, it does not need to connect the equivalent-circuit model of DUT (Device Under Test) input and output feeder line, do not require the symmetry of incoming feeder and output feeder, do not need S-Y-Z matrix conversion yet yet.The present embodiment is the demand for paying close attention to special frequency, avoids the impact that probe unit is coarse, only obtains the insertion loss parameter of the corresponding frequency of transmission line.This method is simple and easy available, has good precision, and is applicable to test request in enormous quantities.
Referring to accompanying drawing 3, it illustrates the good and bad automated testing method flow process of Target Board that the present embodiment proposes.
In product design or process segment, the measurement jig (test board) of design is comprised in the design, and output designs coordinate file accordingly, according to this design coordinate file design automatic engineering programming file, this project file is the foundation of mechanical arm automatic addressing.The method of design automatic engineering programming file is more conventional in current engineering design, and does not belong to content of the present invention, repeats no more.Flow process is described below:
Before test board is tested, carry out Cable calibration, in the corresponding VNA testing apparatus of this calibration steps, comprise detection calibration part.
After completing calibration, carry out addressing and test according to engineering formula automatic mechanical arm, test script will record the test loss of corresponding frequency.
Carry out computational analysis to test result, and judge according to the reference value provided, this reference value is according to the per inch differential loss under aforementioned each characteristic frequency of going embedding method to obtain.
See accompanying drawing 4, generation normal distribution report is for manual analysis, and this normal distribution report is used for decision-making, and see the consistance of this lots processed from just too distributing, the less expression consistance of sigma value is better.Automatic testing process terminates.
For DB/Inch test result, compare according to our reference value of definition, obtain the conclusion of PASS/FAIL.Mathematical statistics is carried out to result, and carry out normal distribution analysis, expectation value μ determines its position, standard deviation sigma determines the amplitude of distribution, the overall performance of in enormous quantities batch is confirmed according to this by analyzing this two number, and test FAIL board is scrapped, the criterion of FAIL is determined by the target Target value provided; Also can extract the whole processing performance of PCB material and PCB factory by these data, this value can decide with non-source test by signal integrity is active.Thus improve design processing yield, ensure that electric function realizes.
Embodiment two: probe unit
Fig. 5 shows the probe unit that the present embodiment proposes.Described probe unit (cable stent pen) comprises two parts: sound end and stiff end.Wherein sound end comprises difference (differential probetip) specification and single-ended (single-ended probe tip) specification.The probe of these two kinds of specifications all comprises GND and holds pin, for connection PCB GND and testing apparatus GND.Signal probe is made up of half firm radio frequency coaxial cables, and also can be replaced by similar material, one end is SMA interface, is connected to testing apparatus by cable cable; One end is the stripping core design of cable, owing to being the design of semi-rigid material stripping core, so end pin pin adjustable interval, to tackle different test points.
See Fig. 6, the stiff end that it illustrates probe unit is divided into three parts, part1 is fixed on automatic arm by screw or buckle or other modes, part3 can utilize protruding canine teeth to design and corresponding screw fit stationary probe part, Part II is spring assembly, for connecting Part I and Part III, and stressed in order between buffered probe and PCB, increase test point contact stabilization, thus ensure consistance and the reliability of test.
Use the probe unit fixation of C able probe of this patent, by the coordinate file that exported by patent test board and corresponding fixed jig, the variable factor in engineering test can be reduced.Coordinate file according to test board carries out automated software script design, the loss test that automatic mechanical arm can carry out based on fc-specific test FC plate according to the information provided, and by the specific test board of design, reduce the complexity for automatic mechanical arm, thus minimizing arm needs motor quantity, optimal inspection cost.Robotization arm is the medium realizing patented method of the present invention, can have been customized, do not belong to the protection domain of this patent, repeat no more herein by third party factory.Test board can depend on motherboard design in design, the design of the impedance strip on similar engineering, tests loss in enormous quantities provide operability for systematization, design cost free scheme.

Claims (5)

1. a PCB transmission line insertion loss method of testing, is characterized in that, comprising:
S1: make PCB test board, on it, length of every transmission lines meets:
F n+1=F n+ F n-1, wherein F nbe the length of the n-th transmission lines, n>2, and n is positive integer;
S2: when described transmission line transmitting the signal of a certain frequency, uses probe unit to measure the insertion loss of each transmission lines, remembers that the insertion loss of the n-th transmission lines is S n;
S3: use the every F of following formulae discovery nlength transmission line go embedding after insertion loss S/F n:
S/F n=S n-(S n+1-S n-1), and record each S/F nvalue;
S4: the frequency changing described signal on transmission line, returns step S2, until travel through all frequencies, the whole S/F recorded under preserving all frequencies nvalue as test empirical value, flow process terminates.
2. the method for claim 1, is characterized in that:
When detecting the PCB of actual design, use described test empirical value as comparison object value, in the PCB detecting described actual design, whether the insertion loss of corresponding length transmission line meets the requirements, and then determines the quality of PCB of described actual design.
3. the probe unit used in method described in claim 1 or 2, is characterized in that, comprising: sound end and stiff end;
Wherein stiff end comprises,
For being fixed to the Part I on the automatic arm of robot by screw or buckle,
For the Part II of stationary probe end,
And spring assembly, for connecting described Part I and Part II.
4. probe unit as claimed in claim 3, is characterized in that:
Described sound end has differential probe or Single probe, and described probe has GND and holds pin.
5. probe unit as claimed in claim 4, is characterized in that:
Described probe is half firm radio frequency coaxial cables, and one end is SMA interface, is connected to testing apparatus by cable, and one end is the stripping core of cable.
CN201510002693.2A 2015-01-05 2015-01-05 A kind of PCB transmission line insertion loss method of testing and probe unit Active CN104569611B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510002693.2A CN104569611B (en) 2015-01-05 2015-01-05 A kind of PCB transmission line insertion loss method of testing and probe unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510002693.2A CN104569611B (en) 2015-01-05 2015-01-05 A kind of PCB transmission line insertion loss method of testing and probe unit

Publications (2)

Publication Number Publication Date
CN104569611A true CN104569611A (en) 2015-04-29
CN104569611B CN104569611B (en) 2018-02-06

Family

ID=53086148

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510002693.2A Active CN104569611B (en) 2015-01-05 2015-01-05 A kind of PCB transmission line insertion loss method of testing and probe unit

Country Status (1)

Country Link
CN (1) CN104569611B (en)

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106443416A (en) * 2016-11-18 2017-02-22 中国电子科技集团公司第二十九研究所 Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board
CN106680592A (en) * 2017-02-25 2017-05-17 郑州云海信息技术有限公司 Method and system for detecting loss of Cable with arbitrary lengths
CN108254625A (en) * 2017-12-29 2018-07-06 生益电子股份有限公司 A kind of insertion loss test-strips
CN110531167A (en) * 2019-09-16 2019-12-03 西安兆格电子信息技术有限公司 A kind of cable pathways Insertion Loss measuring device and measurement method
CN110579508A (en) * 2019-09-10 2019-12-17 广州兴森快捷电路科技有限公司 Substrate attribute consistency judging method, substrate and circuit board
CN110716128A (en) * 2019-10-29 2020-01-21 广州兴森快捷电路科技有限公司 PCB loss test method
CN112213617A (en) * 2020-09-15 2021-01-12 国网江苏省电力有限公司常州供电分公司 IC chip electromagnetic compatibility testing method and device and readable storage medium
CN113759231A (en) * 2020-06-02 2021-12-07 纬颖科技服务股份有限公司 Signal testing device and signal testing method
CN113900008A (en) * 2021-09-15 2022-01-07 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Test structure and test method
CN113935261A (en) * 2020-07-14 2022-01-14 深南电路股份有限公司 Insertion loss evaluation method and device, computer equipment and storage medium
CN114252703A (en) * 2021-11-19 2022-03-29 苏州浪潮智能科技有限公司 Method, device and system for removing far-end crosstalk influence of transmission line on jig plate
CN114915568A (en) * 2021-02-09 2022-08-16 大唐移动通信设备有限公司 Method and device for determining performance of signal transmission line and storage medium
CN115469641A (en) * 2022-09-14 2022-12-13 上海千顾汽车科技有限公司 Fault detection mechanism and method combining production mode and automobile controller state machine
CN117590123A (en) * 2023-11-22 2024-02-23 中科可控信息产业有限公司 Cable testing method, device, equipment and medium
WO2024198211A1 (en) * 2023-03-31 2024-10-03 安捷利(番禺)电子实业有限公司 Insertion loss calculation model construction method and apparatus, device, and storage medium

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103995185A (en) * 2014-06-13 2014-08-20 浪潮电子信息产业股份有限公司 Method for carrying out insertion loss test through simple probe
CN104020379A (en) * 2014-06-17 2014-09-03 浪潮电子信息产业股份有限公司 Simple low-cost test method
CN203949946U (en) * 2014-06-27 2014-11-19 北大方正集团有限公司 Probe for the test of PCB Insertion Loss
CN203949936U (en) * 2014-06-27 2014-11-19 北大方正集团有限公司 The fixture of SET2DIL test probe and SET2DIL test probe assembly

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103995185A (en) * 2014-06-13 2014-08-20 浪潮电子信息产业股份有限公司 Method for carrying out insertion loss test through simple probe
CN104020379A (en) * 2014-06-17 2014-09-03 浪潮电子信息产业股份有限公司 Simple low-cost test method
CN203949946U (en) * 2014-06-27 2014-11-19 北大方正集团有限公司 Probe for the test of PCB Insertion Loss
CN203949936U (en) * 2014-06-27 2014-11-19 北大方正集团有限公司 The fixture of SET2DIL test probe and SET2DIL test probe assembly

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘丰 等: "PCB信号完整性测试技术研究", 《印制电路信息》 *
葛鹰 等: "浅谈印制电路板信号损耗测试技术", 《印制电路信息》 *

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106443416A (en) * 2016-11-18 2017-02-22 中国电子科技集团公司第二十九研究所 Method and apparatus for realizing self-calibration of microwave performance of multi-layer circuit board
CN106443416B (en) * 2016-11-18 2018-12-25 中国电子科技集团公司第二十九研究所 One kind being able to achieve multilayer circuit board microwave property method for self-calibrating and device
CN106680592A (en) * 2017-02-25 2017-05-17 郑州云海信息技术有限公司 Method and system for detecting loss of Cable with arbitrary lengths
CN108254625A (en) * 2017-12-29 2018-07-06 生益电子股份有限公司 A kind of insertion loss test-strips
CN110579508A (en) * 2019-09-10 2019-12-17 广州兴森快捷电路科技有限公司 Substrate attribute consistency judging method, substrate and circuit board
CN110579508B (en) * 2019-09-10 2022-04-26 广州兴森快捷电路科技有限公司 Substrate attribute consistency judging method, substrate and circuit board
CN110531167A (en) * 2019-09-16 2019-12-03 西安兆格电子信息技术有限公司 A kind of cable pathways Insertion Loss measuring device and measurement method
CN110716128A (en) * 2019-10-29 2020-01-21 广州兴森快捷电路科技有限公司 PCB loss test method
CN113759231A (en) * 2020-06-02 2021-12-07 纬颖科技服务股份有限公司 Signal testing device and signal testing method
CN113935261A (en) * 2020-07-14 2022-01-14 深南电路股份有限公司 Insertion loss evaluation method and device, computer equipment and storage medium
CN112213617A (en) * 2020-09-15 2021-01-12 国网江苏省电力有限公司常州供电分公司 IC chip electromagnetic compatibility testing method and device and readable storage medium
CN114915568A (en) * 2021-02-09 2022-08-16 大唐移动通信设备有限公司 Method and device for determining performance of signal transmission line and storage medium
CN114915568B (en) * 2021-02-09 2024-04-09 大唐移动通信设备有限公司 Method and device for determining performance of signal transmission line and storage medium
CN113900008A (en) * 2021-09-15 2022-01-07 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Test structure and test method
CN114252703A (en) * 2021-11-19 2022-03-29 苏州浪潮智能科技有限公司 Method, device and system for removing far-end crosstalk influence of transmission line on jig plate
CN114252703B (en) * 2021-11-19 2024-01-12 苏州浪潮智能科技有限公司 Method, device and system for removing far-end crosstalk influence of transmission line on jig board
CN115469641A (en) * 2022-09-14 2022-12-13 上海千顾汽车科技有限公司 Fault detection mechanism and method combining production mode and automobile controller state machine
CN115469641B (en) * 2022-09-14 2024-05-24 上海千顾汽车科技有限公司 Fault detection mechanism and method combining production mode and automobile controller state machine
WO2024198211A1 (en) * 2023-03-31 2024-10-03 安捷利(番禺)电子实业有限公司 Insertion loss calculation model construction method and apparatus, device, and storage medium
CN117590123A (en) * 2023-11-22 2024-02-23 中科可控信息产业有限公司 Cable testing method, device, equipment and medium

Also Published As

Publication number Publication date
CN104569611B (en) 2018-02-06

Similar Documents

Publication Publication Date Title
CN104569611A (en) PCB transmission line insertion loss testing method and probe device
CN112684253A (en) Non-contact load impedance test system and working method thereof
US20080195344A1 (en) Method for determining measurement errors in scattering parameter measurements
JP2008046038A (en) Disconnection test method of coaxial cable assembly
CN103063939B (en) Ground cascade system external radio frequency electromagnetic environment test method
CN106950488B (en) Circuit board and detection method
CN114113704B (en) Device and method for measuring performance of finished aircraft harness part based on de-embedding technology
DeRoy et al. Full-wave modeling of bulk current injection probe coupling to multi-conductor cable bundles
Wyatt The HF current probe: Theory and application
US10481194B2 (en) Automated high frequency test station
US9417275B2 (en) Cable measuring device and method
TWI500936B (en) Rf probe
TW202301821A (en) System and method for compensating for power loss due to a radio frequency (rf) signal probe mismatch in conductive signal testing
CN105891261A (en) Plating material passive intermodulation online testing device based on dual-mode transmission line structures
CN115840084A (en) Impedance testing method, device and equipment based on coaxial cable and storage medium
CN114035016B (en) Power device transmission parameter determination method, device, terminal and storage medium
Gonser et al. Advanced simulations of automotive EMC measurement setups using stochastic cable bundle models
Wang et al. The impact of electrical contact degradation on differential signal transmission of high speed channel
Manesh et al. Experimental analysis and modelling of coaxial transmission lines with soft shield defects
CN105021870A (en) Measurement method for induced voltage of cable terminal
US9964573B2 (en) Method for measuring characteristic impedance of electric transmission line
Grassi et al. Assessment of the bulk current injection test procedure based on the substitution method
TW202301822A (en) System and method for measuring path loss of a conductive radio frequency (rf) test signal path
Finizio et al. De-embedding setup-related effects to characterize an EM clamp for conducted immunity testing
Zheng et al. Simulation and Experiment of Field-to-Cable Coupling Terminal Response

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant