CN104568392A - Optical system athermalization design effect evaluating system and method - Google Patents
Optical system athermalization design effect evaluating system and method Download PDFInfo
- Publication number
- CN104568392A CN104568392A CN201510032361.9A CN201510032361A CN104568392A CN 104568392 A CN104568392 A CN 104568392A CN 201510032361 A CN201510032361 A CN 201510032361A CN 104568392 A CN104568392 A CN 104568392A
- Authority
- CN
- China
- Prior art keywords
- optical system
- infrared
- objective
- detector
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Radiation Pyrometers (AREA)
Abstract
The invention provides an optical system athermalization design effect evaluating system and method, and belongs to the field of optical tests. The evaluating system comprises an optical source assembly, a collimator assembly, a supporting platform, an infrared microobjective, a probe, a mobile platform, a high-low temperature chamber, an electric displacement platform and a control cabinet. An infrared optical source emitted by the optical source assembly is collimated by a collimator and then is focused by a tested optical system to form an intermediary image, the intermediary image is formed on the focal plane of the probe through the infrared microobjective, and the probe converts light energy on the focal plane into electrical signals and transmits the electrical signals to the inside of the control cabinet. A provided optical system athermalization design effect evaluating device is designed for evaluating the optical system athermalization design results, the imaging quality of the optical system at different temperatures is tested through the method that different temperature environments are simulated through the high-low temperature chamber, and therefore the optical system athermalization design effect is evaluated.
Description
Technical field
The invention belongs to optical testing art, relate to a kind of optical system without thermalized design recruitment evaluation system and method.
Background technology
Along with the fast development of infrared imagery technique, more and more higher to the requirement of infrared imaging system, also more urgent to the demand of its measuring technology.Because the thermal refractive index coefficient of infrared optical material is comparatively large, the image quality of infrared imaging system is more easily subject to the impact of bad border temperature variation, so optical system is more and more subject to the attention of optical designers without thermalized design.And the domestic method of testing to infrared optical system still mainly rests on theoretical research and Computer Simulation stage at present, the precision of test and degree of confidence are also quite limited.
Summary of the invention
The object of this invention is to provide a kind of optical system without thermalized design recruitment evaluation system and method, by the test defocusing amount of system under test (SUT), the data such as size, spot energy distribution of imaging point, and automatically complete to optical system without thermalized design recruitment evaluation, compensate for domestic blank.
The object of the invention is to be achieved through the following technical solutions:
A kind of optical system, without thermalized design recruitment evaluation system, comprising: light source assembly, parallel light tube assembly, support platform, infrared micro-objective, detector, mobile platform, high-low temperature chamber, electricity driving displacement platform, switch board, wherein:
Described light source assembly and parallel light tube assembly are fixed on a mobile platform, can move axially with mobile platform;
Described high-low temperature chamber is fixed in support platform, places tested optical system in high-low temperature chamber;
Described infrared micro-objective and detector are fixed on electricity driving displacement platform;
Described switch board internal fixtion has TT&C system and output precision;
The infrared light supply that described light source assembly sends is after parallel light tube collimation, by tested optical system, become intermediary image after convergence, be imaged on detector focal plane by infrared micro-objective by its intermediary image, the luminous energy falling thereon is converted into electric signal and delivers in switch board by detector.
Utilize said system to carry out the method for optical system without thermalized design recruitment evaluation, comprise the steps:
One, at normal temperatures tested optical system is assemblied in and is positioned on the structural member of high-low temperature chamber, the height adjusting tested optical system makes its optical axis parallel with the optical axis alignment of parallel optical tube assembly, the interval adjusted between the optical element in tested optical system makes it meet design requirement, predetermined temperature can be set in and treat temperature stabilization by light source assembly, coarse adjustment mobile platform, makes the workplace of infrared micro-objective roughly overlap with the focal plane of tested optical system;
Two, an infrared spotlight is provided by light source assembly, pointolite becomes directional light after parallel light tube assembly, directional light converges through tested optical system and infrared micro-objective is drawn, detector sensitive area is arrived after amplifying, the luminous energy falling thereon is converted into electric signal by detector, and deliver to data handling system and carry out data processing, utilize control system to control electricity driving displacement platform to move, the workplace of infrared micro-objective is overlapped with the focal plane of tested optical system, obtain required picture point size, picture point shape and energy distribution data, it is for subsequent use that the data obtained measured at normal temperatures in record,
Three, to after the test of image quality under normal temperature, temperature and the size of maintenance target source are constant, change the environment temperature of high-low temperature chamber simultaneously, make tested optical system be in certain high and low temperature environment;
Four, after the temperature stabilization of tested optical system, signal is applied to electricity driving displacement platform, make infrared micro-objective and detector focal plane relative position constant, control moving axially of infrared micro-objective and detector, until the signal that detector exports is judged to be optimum image plane by data handling system, after system automatic focusing completes, infrared micro-objective and detector depart from zero-bit, have certain side-play amount
;
Five, namely this side-play amount is the defocusing amount of tested optical system at a set temperature, record
now picture point size, picture point shape and energy distribution data, measure the data obtained more at normal temperatures, can know the design effect of tested optical system without thermalization.
Optical system provided by the invention is without thermalized design recruitment evaluation device, for assessment optical system is developed without thermalized design result, different temperature environments is simulated by high-low temperature chamber, measuring optical system image quality at different temperatures, thus without thermalized design effect, evaluation is made to optical system.The tested object of system be without thermalized design after optical system, content measurement is optical system image quality at different ambient temperatures.When the variation of ambient temperature at optical system place, equipment can measure the picture point size of optical system and the change of spot energy distribution, thus assessing without thermalized design effect optical system, there is important practical application meaning.
Accompanying drawing explanation
Fig. 1 is that optical system is without thermalized design appraisal procedure theory diagram;
Fig. 2 is the structural front view of optical system without thermalization assessment apparatus;
Fig. 3 is the structure vertical view of optical system without thermalization assessment apparatus;
In figure: 1-light source assembly, 2-parallel light tube assembly, 3-support platform, 4-infrared micro-objective, 5-detector, 6-mobile platform, 7-high-low temperature chamber, 8-electricity driving displacement platform, 9-switch board, the tested optical system of 10-, 11-signal processing circuit assembly, 12-computing machine, 13-output precision.
Embodiment
Below in conjunction with accompanying drawing, technical scheme of the present invention is further described; but be not limited thereto; everyly technical solution of the present invention modified or equivalent to replace, and not departing from the spirit and scope of technical solution of the present invention, all should be encompassed in protection scope of the present invention.
Embodiment one: as shown in Figures 2 and 3, the optical system that present embodiment provides is made up of light source assembly 1, parallel light tube assembly 2, support platform 3, infrared micro-objective 4, detector 5, mobile platform 6, high-low temperature chamber 7, electricity driving displacement platform 8, switch board 9 without thermalized design recruitment evaluation system, wherein:
Described light source assembly 1 is fixed on mobile platform 6 with parallel light tube assembly 2, can move axially with mobile platform 6;
Described high-low temperature chamber 7 is fixed in support platform 3, places tested optical system 10 in high-low temperature chamber 7;
Described infrared micro-objective 4 and detector 5 are fixed on electricity driving displacement platform 8;
Described switch board 9 internal fixtion has TT&C system and output precision;
The infrared light supply that described light source assembly 1 sends is after parallel light tube 2 collimates, by tested optical system, intermediary image is become after convergence, by infrared micro-objective 4, its intermediary image is imaged on detector 5 focal plane, the luminous energy falling thereon is converted into electric signal and delivers in switch board by detector 5, completes test.
In present embodiment, described light source assembly 1 is made up of infrared light supply and apertured plate, apertured plate between infrared light supply and parallel light tube, for realize different size infrared spotlight.
In present embodiment, described infrared light supply adopts controllable temperature black matrix, and temperature range is 50 ~ 1000 DEG C.
In present embodiment, described smooth hurdle dish has diameter to be the Guang Lan hole of 1.0mm, 0.5mm, 2.85mm, 4.93mm, 0.2mm and 0.1mm, and precision 5%, separately has 2 blind holes for subsequent use.Aperture and blind hole for subsequent use totally 8 holes are equidistantly distributed on apertured plate axisymmetricly, change Guang Lan hole, the repetitive positioning accuracy ± 0.1mm of Guang Lan hole relative focal by rotating light hurdle dish.In present embodiment, described mobile platform 6 provides out of focus function, focusing range ± 30mm, mobile accuracy 0.01mm for this equipment, and display scale value.
In present embodiment, the focal length scope of application of described parallel light tube assembly is 100-1000mm.
In present embodiment, described parallel light tube assembly is taked to disappear the enclosed construction of parasitic light.
In present embodiment, described infrared micro-objective is image space wave deformation PV value in whole field range
, do not allow to there is vignetting and curvature of the image.
In present embodiment, described detector is placed in the focal plane place of infrared micro-objective.
In present embodiment, described mobile platform requires indeformable, damping, and avoids band magnetic or magnetic induction; The support platform of TT&C system and output precision is integrated in switch board.
Embodiment two: utilize system described in embodiment one to carry out the method for optical system without thermalized design recruitment evaluation, as shown in Figure 1, concrete steps are as follows for its theory diagram:
First at normal temperatures tested optical system 10 is assemblied in when one, using on the structural member being positioned at high-low temperature chamber 7, the height adjusting tested optical system 10 makes its optical axis parallel with the optical axis alignment of parallel optical tube assembly 2, the interval adjusted between the optical element in tested optical system 10 makes it meet design requirement, controllable temperature black matrix is set in predetermined temperature and treats temperature stabilization, coarse adjustment mobile platform 6, makes the workplace of infrared micro-objective 4 roughly overlap with the focal plane of tested optical system 10.
Two, now provide an infrared spotlight by light source assembly 1, pointolite becomes directional light after parallel light tube assembly 2, for tested optical system 10 provides the target of infinite distance, directional light converges through tested optical system 10 and infrared micro-objective 4 is drawn, follow-up detector 5 sensitive area is arrived after amplifying, the luminous energy falling thereon is converted into electric signal by detector 5, and give signal processing circuit assembly 11 and amplify, after A/D conversion waits process, give computing machine 12 and carry out data processing, through the analysis of image evaluation software, control electricity driving displacement platform 8 to move, the workplace of infrared micro-objective 4 is overlapped with the focal plane of tested optical system 10, output precision 13 exports the required picture point size recorded, the technical data such as picture point shape and energy distribution, it is for subsequent use that the data obtained measured at normal temperatures in record.
Three, after to the test of image quality under normal temperature, keep the temperature of target source and size constant, change the environment temperature of high-low temperature chamber 7 simultaneously, make tested optical system 10 be in certain high and low temperature environment.
Four, after the temperature stabilization of tested optical system 10, signal is applied to electricity driving displacement platform 8, make infrared micro-objective 4 and detector 5 focal plane relative position constant, control moving axially of infrared micro-objective 4 and detector 5 array component, until the signal that detector 5 exports is optimum image plane by computer-made decision, after system automatic focusing completes, infrared micro-objective 4 and detector 5 depart from zero-bit, have certain side-play amount
.
Five, namely this side-play amount is the defocusing amount of tested optical system 10 at a set temperature, record
now the technical data such as picture point size, picture point shape and energy distribution, measures the data obtained more at normal temperatures, can know the design effect of tested optical system 10 without thermalization.
Claims (10)
1. optical system is without thermalized design recruitment evaluation system, it is characterized in that described evaluating system is made up of light source assembly, parallel light tube assembly, support platform, infrared micro-objective, detector, mobile platform, high-low temperature chamber, electricity driving displacement platform, switch board, wherein:
Described light source assembly and parallel light tube assembly are fixed on a mobile platform, can move axially with mobile platform;
Described high-low temperature chamber is fixed in support platform, places tested optical system in high-low temperature chamber;
Described infrared micro-objective and detector are fixed on electricity driving displacement platform;
Described switch board internal fixtion has TT&C system and output precision;
The infrared light supply that described light source assembly sends is after parallel light tube collimation, by tested optical system, become intermediary image after convergence, be imaged on detector focal plane by infrared micro-objective by its intermediary image, the luminous energy falling thereon is converted into electric signal and delivers in switch board by detector.
2. optical system according to claim 1 is without thermalized design recruitment evaluation system, and it is characterized in that described light source assembly is made up of infrared light supply and apertured plate, apertured plate is between infrared light supply and parallel light tube.
3. optical system according to claim 2 is without thermalized design recruitment evaluation system, and it is characterized in that described infrared light supply adopts controllable temperature black matrix, temperature range is 50 ~ 1000 DEG C.
4. optical system according to claim 2 is without thermalized design recruitment evaluation system, and it is characterized in that described smooth hurdle dish is provided with 6 Guang Lan holes and 2 blind holes for subsequent use, aperture and blind hole for subsequent use are equidistantly distributed on apertured plate axisymmetricly.
5. optical system according to claim 4 is without thermalized design recruitment evaluation system, it is characterized in that the diameter in described Guang Lan hole is respectively 1.0mm, 0.5mm, 2.85mm, 4.93mm, 0.2mm, 0.1mm.
6. optical system according to claim 1 is without thermalized design recruitment evaluation system, it is characterized in that the focal length scope of application of described parallel light tube assembly is 100-1000mm.
7. the optical system according to claim 1 or 6, without thermalized design recruitment evaluation system, is characterized in that described parallel light tube assembly is taked to disappear the enclosed construction of parasitic light.
8. optical system according to claim 1 is without thermalized design recruitment evaluation system, it is characterized in that described infrared micro-objective image space wave deformation PV value in whole field range
.
9. optical system according to claim 1 is without thermalized design recruitment evaluation system, it is characterized in that described detector is placed in the focal plane place of infrared micro-objective.
10. utilize evaluating system described in claim 1 to carry out optical system without a thermalized design effect method, it is characterized in that described method step is as follows:
One, at normal temperatures tested optical system is assemblied in and is positioned on the structural member of high-low temperature chamber, the height adjusting tested optical system makes its optical axis parallel with the optical axis alignment of parallel optical tube assembly, the interval adjusted between the optical element in tested optical system makes it meet design requirement, predetermined temperature can be set in and treat temperature stabilization by light source assembly, coarse adjustment mobile platform, makes the workplace of infrared micro-objective roughly overlap with the focal plane of tested optical system;
Two, an infrared spotlight is provided by light source assembly, pointolite becomes directional light after parallel light tube assembly, directional light converges through tested optical system and infrared micro-objective is drawn, detector sensitive area is arrived after amplifying, the luminous energy falling thereon is converted into electric signal by detector, and deliver to data handling system and carry out data processing, utilize control system to control electricity driving displacement platform to move, the workplace of infrared micro-objective is overlapped with the focal plane of tested optical system, obtain required picture point size, picture point shape and energy distribution data, it is for subsequent use that the data obtained measured at normal temperatures in record,
Three, to after the test of image quality under normal temperature, temperature and the size of maintenance target source are constant, change the environment temperature of high-low temperature chamber simultaneously, make tested optical system be in certain high and low temperature environment;
Four, after the temperature stabilization of tested optical system, signal is applied to electricity driving displacement platform, make infrared micro-objective and detector focal plane relative position constant, control moving axially of infrared micro-objective and detector, until the signal that detector exports is judged to be optimum image plane by data handling system, after system automatic focusing completes, infrared micro-objective and detector depart from zero-bit, have certain side-play amount
;
Five, namely this side-play amount is the defocusing amount of tested optical system at a set temperature, record
now picture point size, picture point shape and energy distribution data, measure the data obtained more at normal temperatures, can know the design effect of tested optical system without thermalization.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510032361.9A CN104568392A (en) | 2015-01-22 | 2015-01-22 | Optical system athermalization design effect evaluating system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510032361.9A CN104568392A (en) | 2015-01-22 | 2015-01-22 | Optical system athermalization design effect evaluating system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104568392A true CN104568392A (en) | 2015-04-29 |
Family
ID=53084973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510032361.9A Pending CN104568392A (en) | 2015-01-22 | 2015-01-22 | Optical system athermalization design effect evaluating system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104568392A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105865756A (en) * | 2016-06-07 | 2016-08-17 | 长春理工大学 | Thermal-optical test calibrating device |
| CN106568577A (en) * | 2016-10-18 | 2017-04-19 | 中国航空工业集团公司洛阳电光设备研究所 | Optical athermalization design detection system and detection method |
| CN112255696A (en) * | 2020-10-30 | 2021-01-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detection equipment |
| CN113639966A (en) * | 2021-08-04 | 2021-11-12 | 孝感华中精密仪器有限公司 | Device for detecting consistency of optical axes of continuous zooming television under high-temperature and low-temperature conditions |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012220200A (en) * | 2011-04-04 | 2012-11-12 | Canon Inc | Optical characteristic measuring apparatus |
| CN103528800A (en) * | 2013-10-30 | 2014-01-22 | 陕西高新实业有限公司 | Optical athermal design effect detection system based on image processing |
-
2015
- 2015-01-22 CN CN201510032361.9A patent/CN104568392A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012220200A (en) * | 2011-04-04 | 2012-11-12 | Canon Inc | Optical characteristic measuring apparatus |
| CN103528800A (en) * | 2013-10-30 | 2014-01-22 | 陕西高新实业有限公司 | Optical athermal design effect detection system based on image processing |
Non-Patent Citations (3)
| Title |
|---|
| 师途 等: "《非球面光学元件的面形检测技术》", 《中国光学》 * |
| 朱帆: "《无热化系统离焦量检测设备控制系统设计》", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
| 范哲源: "《无热化检测仪的中短波光学系统设计》", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105865756A (en) * | 2016-06-07 | 2016-08-17 | 长春理工大学 | Thermal-optical test calibrating device |
| CN106568577A (en) * | 2016-10-18 | 2017-04-19 | 中国航空工业集团公司洛阳电光设备研究所 | Optical athermalization design detection system and detection method |
| CN112255696A (en) * | 2020-10-30 | 2021-01-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detection equipment |
| CN112255696B (en) * | 2020-10-30 | 2024-02-20 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detecting equipment |
| CN113639966A (en) * | 2021-08-04 | 2021-11-12 | 孝感华中精密仪器有限公司 | Device for detecting consistency of optical axes of continuous zooming television under high-temperature and low-temperature conditions |
| CN113639966B (en) * | 2021-08-04 | 2024-01-12 | 孝感华中精密仪器有限公司 | Device for detecting consistency of optical axes of continuous zooming televisions under high and low temperature conditions |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109632104B (en) | Infrared array radiation source calibration device and calibration method | |
| CN105675266B (en) | Infinite conjugate optical path measures the device and method of the modulation transfer function of optical lens | |
| CN105784334B (en) | Optical-fiber laser beam quality measurement method based on photodetector and CCD camera | |
| CN104568392A (en) | Optical system athermalization design effect evaluating system and method | |
| CN107144356B (en) | Non-refrigerated infrared focal plane probe array thermal Response Time Test System and method | |
| KR100661794B1 (en) | Infrared thermal image microscope with blackbody source | |
| CN104089582B (en) | Metal film optical detection apparatus and detection method | |
| CN103454070B (en) | A kind of X-ray combination refractor focusing performance method of testing based on CCD detection | |
| CN104390931A (en) | Device and method for measuring spectral emissivity of infrared sample material at high precision | |
| CN112985775B (en) | Light spot tracker optical axis calibration device based on precise angle measurement | |
| TWI757795B (en) | Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods | |
| CN103278311A (en) | Uniformity measurement device and method for infrared radiation surface | |
| CN104634539A (en) | Optical element laser damage threshold value test device in high-temperature environment and test method | |
| CN108519054B (en) | calibration device and calibration method for arc-shaped infrared target simulator | |
| CN107707906A (en) | The ground caliberating device and method of a kind of optical lens defocusing amount under high altitude conditions | |
| CN207439442U (en) | A kind of laser pick-off emission element commissioning device | |
| CN110470406A (en) | A kind of measurement method of thermal infrared spectrum instrument stray radiation | |
| CN109297685A (en) | A kind of spectral transmittance test device and method for heavy caliber parallel light tube | |
| CN203688198U (en) | Laser pointing stability test system | |
| CN103606155A (en) | Camera view field calibrating method and device | |
| CN107886823B (en) | Optimization integrated single-light-path laser ionization effect simulation system | |
| Wang et al. | Metrology camera system of prime focus spectrograph for Subaru telescope | |
| JP2010101808A (en) | Method and device for measuring radius of curvature | |
| CN203163880U (en) | Hartmann wave-front testing system | |
| CN201680914U (en) | Device for improving temperature measurement uniformity of infrared thermal imager |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150429 |
|
| WD01 | Invention patent application deemed withdrawn after publication |