CN104516144A - Touch sensor capacitance detection device and detection method thereof - Google Patents
Touch sensor capacitance detection device and detection method thereof Download PDFInfo
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- CN104516144A CN104516144A CN201410810972.7A CN201410810972A CN104516144A CN 104516144 A CN104516144 A CN 104516144A CN 201410810972 A CN201410810972 A CN 201410810972A CN 104516144 A CN104516144 A CN 104516144A
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- ito
- ito pattern
- touch sensing
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/13338—Input devices, e.g. touch panels
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Human Computer Interaction (AREA)
- Mathematical Physics (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Liquid Crystal (AREA)
Abstract
The invention provides a touch sensor capacitance detection device and a detection method thereof. The capacitance detection device comprises a touch sensor, a liquid crystal display panel, a first power supply and a second power supply, the touch sensor is provided with a line ITO (indium tin oxide) graphic, a row ITO graphic, a line IC (integrated circuit) and a row IC, the line IC is connected with the line ITO graphic, the row IC is connected with the row ITO graphic, the liquid crystal display panel is positioned above the ITO graphics and comprises an upper substrate, an ITO electrode, a lower substrate and a liquid crystal, the ITO electrode is positioned at the bottom of the upper substrate, the liquid crystal is clamped between the upper substrate and the lower substrate, one end of the first power supply is connected to the ITO electrode, the other end of the first power supply is connected to the line IC, one end of the second power supply is connected to the ITO electrode, and the other end of the second power supply is connected to the row IC. The specific positions of defects of the ITO graphics can be detected in advance after each ITO manufacture procedure is finished, and the change of each area capacitance value can be directly detected, so that uniformity of the capacitance of the whole touch sensor can be detected.
Description
Technical field
The present invention relates to a kind of capacitance detecting device for touch sensing and detection method thereof.
Background technology
Touch sensing (Touch Sensor) generally all refers to the touch-control electro-conductive glass (ITO Glass) plating ITO conductive layer, or touch-control conductive film (ITO Film).Touch sensing (Touch Sensor) common material comprises glass and plastic sheeting PET, in touch technology, comprise resistance-type and condenser type to be all through the conducting medium such as ITO Glass or ITO Film and to carry out touch-control sensing, wherein touch-control electro-conductive glass (ITO Glass), or touch-control conductive film (ITO Film) is all called TIO figure, be therefore called as touch sensing (Touch Sensor).
The detection of existing touch sensing (Touch Sensor) is energized to IC after whole processing procedure terminates, and judges the position of defect according to the waveform exported.
As shown in Figure 1, touch sensing (Touch Sensor) comprises row ITO pattern 11, row TIO figure 12, the row IC 20 be connected with row ITO pattern 11 and the row IC 30 be connected with row ITO pattern 12, by being energized to row IC 10 and row IC 20, the position that the waveform breakthrough detecting row ITO pattern 11 and row ITO pattern 12 in touch sensing falls into, but the method is unfavorable for pinpointing the problems early, and when the pattern of touch sensing is individual layer ITO structure, cannot accurately location defect occur particular location.
Summary of the invention
The object that the present invention carries detects pick-up unit and the detection method of the homogeneity of monoblock touch sensing electric capacity.
The invention provides a kind of capacitance detecting device of touch sensing, comprise touch sensing, the row ITO that touch sensing has row ITO pattern and row ITO pattern, the row IC be connected with row ITO pattern and is connected with row ITO pattern, this pick-up unit also comprises the display panels be positioned at above ITO pattern, this display panels comprises upper substrate, ITO electrode, infrabasal plate and the liquid crystal between sandwiched upper substrate and infrabasal plate bottom upper substrate, and one end of one first power supply is connected to ITO electrode, the other end of the first power supply is connected to row IC; One end of one second source is connected to ITO electrode, and the other end of second source is connected to row IC.
The present invention provides again a kind of capacitance detecting device of touch sensing, comprise touch sensing, the IC that touch sensing has individual layer ITO pattern and is connected with ITO pattern, this pick-up unit also comprises the display panels be positioned at above ITO pattern, this display panels comprises upper substrate, ITO electrode, infrabasal plate and the liquid crystal between sandwiched upper substrate and infrabasal plate bottom upper substrate, and one end of a power supply is connected to ITO electrode, the other end of power supply is connected to IC.
The present invention provides again a kind of detection method, comprises the steps:
Be energized to ITO electrode and row IC, the change of detect lines ITO pattern regional capacitance, when somewhere defectiveness in row ITO pattern, display panels shows the optical anomaly of the row ITO pattern of corresponding defect;
To ITO electrode and row IC energising, detect the change of row ITO pattern regional capacitance, when somewhere defectiveness in row ITO pattern, display panels shows the optical anomaly of the row ITO pattern of corresponding defect;
Give row IC and row IC energising simultaneously, when row IC and row IC gives different voltage, foreign matter is had between row ITO pattern and row ITO pattern, when causing row ITO pattern and the series connection of row ITO pattern, cause a full line of fault location or column voltage to change because connecting, display panels shows the row ITO of corresponding defect and the optical anomaly of row ITO pattern.
The present invention provides again a kind of detection method, comprises the steps:
To ITO electrode and IC energising, detect the change of ITO pattern regional capacitance, when somewhere defectiveness in ITO pattern, display panels shows the optical anomaly of the ITO pattern of corresponding defect.
The present invention not only just can detect the particular location of ITO pattern defect ahead of time after per pass ITO processing procedure terminates, and also can go out the change of every block area capacitance value by direct-detection, thus can detect the homogeneity of monoblock touch sensing electric capacity.
Accompanying drawing explanation
Figure 1 shows that the structural representation of existing touch sensing;
Fig. 2 is the structural representation of the capacitance detecting device of touch sensing of the present invention;
Fig. 3 is the structural representation of the line direction energising of capacitance detecting device of the present invention;
Fig. 4 is the structural representation of the column direction energising of capacitance detecting device of the present invention;
Fig. 5 is the structural representation of the row and column direction energising of capacitance detecting device of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, illustrate the present invention further, these embodiments should be understood only be not used in for illustration of the present invention and limit the scope of the invention, after having read the present invention, the amendment of those skilled in the art to the various equivalent form of value of the present invention has all fallen within the application's claims limited range.
Lcd technology is a kind of electro-optic conversion technology, namely according to the electric field level being added in liquid crystal both sides, changes the ordered state of liquid crystal, thus changes the optical path direction through liquid crystal layer, the final light-out effect changing liquid crystal indicator.Lcd technology directly can be transformed into the electric signal of different size the light signal of different brightness, thus is shown as pattern.Push away from the electro-optical characteristic of lcd technology is counter, according to the light signal of different brightness, the electric field level being added in liquid crystal both sides can be judged.Utilize this feature, the particular location of the ITO pattern defect of touch sensing (Touch Sensor) can be tested with liquid crystal indicator.
Be illustrated in figure 2 the structural representation of the capacitance detecting device of touch sensing of the present invention, by a display panels 1 being suspended on the top of touch sensing 2, image machine (CCD) 5 is provided with above display panels 1, this image machine 5 connector computer 6, this image machine 5 can read the data message on display panels 1.
Wherein, the discotic liquid crystal layer 13 that display panels 1 comprises glass upper substrate 11, ITO electrode 12 bottom upper substrate 11, infrabasal plate 14 and is folded between upper substrate 11 and infrabasal plate 14, wherein infrabasal plate 14 is for having the infrabasal plate of insulating effect, the ITO pattern 21,22 of the corresponding touch sensing 1 of infrabasal plate 14.
Pick-up unit of the present invention is by applying first power supply 31 and second source 32, wherein one end of the first power supply 31 is connected with the ITO electrode 12 of display panels 1, the other end of the first power supply 31 is connected with the row IC 23 of touch sensing 1, one end of second source 32 is also connected with the ITO electrode 12 of display panels 1, the other end of second source 32 is connected with the row IC 24 of touch sensing 1, and be provided with between the first power supply 31 and row IC 22 first switch 41, second source 32 and row IC 24 between be provided with second switch 42.
Display panels 1 is as ITO top electrode of the present invention, the ITO pattern 21,22 of touch sensing 2 is as bottom electrode, electric field is produced by the ITO electrode 12 of the upper substrate 11 at display panels and IC corresponding to the ITO pattern of touch sensing 1 apply voltage, the state of liquid crystal 13 corresponding above ITO pattern 21,22 is changed, effectively can judge whether the ITO pattern 21,22 of touch sensing 1 exists the homogeneity of abnormal and whole capacitance plate capacitance according to the display effect of display panels 1.
This pick-up unit, compared with existing touch sensing, by the electrology characteristic with liquid crystal indicator testing circuit substrate, more visual pattern, and does not have additional mechanical force can not cause the surface damage of wiring board.
In fig. 2, the infrabasal plate 14 of display panels 1, as insulation course, can slacken the electric field intensity be loaded on liquid crystal.So, infrabasal plate 14 must accomplish micron-sized thickness, so thin substrate frequently touches circuit substrate and is is just easily worn and torn by circuit substrate, therefore display panels needs to maintain a certain distance with touch sensing, this distance is 1um to 3mm, and the existence of this distance also can slacken the electric field intensity be loaded on liquid crystal.
Figure 3 shows that the operating diagram that first switch of this capacitance detecting device merges, after being energized to row IC 23 by the first power supply 31, row ITO pattern 21 is as the bottom electrode of liquid crystal, in touch sensing 1, there is ITO pattern different with the induced charge without ITO pattern place, therefore its electric capacity is also different, can the change of detect lines ITO pattern 21 regional capacitance.When somewhere defectiveness in row ITO pattern 21, then the electric capacity of its defect corresponding position occurs abnormal, and on display panels 1, the optics of corresponding position is also abnormal.
Data on display panels 1 transfer to computer 6 after being caught by image machine (CCD) 5, can the particular location of accurate home row ITO pattern defect.
Figure 4 shows that the operating diagram that the second switch of this capacitance detecting device merges, after being energized to row IC 24 by second source 32, row ITO pattern 22 is as the bottom electrode of liquid crystal, in touch sensing 1, there is ITO pattern different with the induced charge without ITO pattern place, therefore its electric capacity is also different, can detect the change of row ITO pattern 22 regional capacitance.When somewhere defectiveness in row ITO pattern 22, then the electric capacity of its defect corresponding position occurs abnormal, and on display panels 1, the optics of corresponding position is also abnormal.
Data on display panels 1 transfer to computer 6 after being caught by image machine (CCD) 5, accurately can locate the particular location of row ITO pattern defect.
Figure 5 shows that the operating diagram that first switch of this capacitance detecting device and second switch all merge, when giving row IC 23 and row IC 24 is energized simultaneously, as required, can same voltage be given, also can give different voltage.When giving different voltage, between row ITO pattern 21 and row ITO pattern 22, there is foreign matter in somewhere, causes row ITO pattern 21 and row ITO pattern 22 to connect, and a full line of fault location or column voltage will be caused to change because connecting.Corresponding position induced charge changes, and electric capacity also changes thus, and on display panels 1, the optics of corresponding position is also abnormal.
Data on display panels 1 transfer to computer 6 after being caught by image machine (CCD) 5, can the particular location of accurately home row ITO pattern 21 and row ITO pattern 22 defect.
The present invention not only just can detect the particular location of ITO pattern defect ahead of time after per pass ITO processing procedure terminates, and also can go out the change of every block area capacitance value by direct-detection, thus can detect the homogeneity of monoblock touch sensing electric capacity.
When the pattern of touch sensing is individual layer ITO pattern, the method simplyr and accurate can detect the particular location of the defect appearance of touch sensing.
When the pattern of touch sensing is individual layer ITO pattern, the IC that touch sensing has individual layer ITO pattern and is connected with ITO pattern, this pick-up unit also comprises the display panels be positioned at above ITO pattern, this display panels comprises upper substrate, ITO electrode, infrabasal plate and the liquid crystal between sandwiched upper substrate and infrabasal plate bottom upper substrate, and one end of a power supply is connected to ITO electrode, the other end of power supply is connected to IC.
During detection, after being energized to IC by power supply, ITO pattern is as the bottom electrode of liquid crystal, in touch sensing, have ITO pattern different with the induced charge without ITO pattern place, therefore its electric capacity is also different, can the change of detect lines ITO pattern regional capacitance.When somewhere defectiveness in ITO pattern, then the electric capacity of its defect corresponding position occurs abnormal, and on display panels, the optics of corresponding position is also abnormal.
Data on display panels transfer to computer after being caught by image machine (CCD), accurately can locate the particular location of ITO pattern defect.
Claims (10)
1. the capacitance detecting device of a touch sensing, comprise touch sensing, the row ITO that touch sensing has row ITO pattern and row ITO pattern, the row IC be connected with row ITO pattern and is connected with row ITO pattern, it is characterized in that: this pick-up unit also comprises the display panels be positioned at above ITO pattern, this display panels comprises upper substrate, ITO electrode, infrabasal plate and the liquid crystal between sandwiched upper substrate and infrabasal plate bottom upper substrate, and one end of one first power supply is connected to ITO electrode, the other end of the first power supply is connected to row IC; One end of one second source is connected to ITO electrode, and the other end of second source is connected to row IC.
2. the capacitance detecting device of touch sensing according to claim 1, is characterized in that: be provided with the first switch between described first power supply and row IC, is provided with second switch between second source and row IC.
3. the capacitance detecting device of touch sensing according to claim 1, is characterized in that: the image machine also comprising the information of reading on display panels, image machine is connected with computer.
4. the capacitance detecting device of touch sensing according to claim 1, is characterized in that: described infrabasal plate is insulated substrate.
5. the capacitance detecting device of touch sensing according to claim 4, is characterized in that: the thickness of described infrabasal plate is micron order, and the distance of 1um-3mm between infrabasal plate and touch sensing.
6. the capacitance detecting device of a touch sensing, comprise touch sensing, the IC that touch sensing has individual layer ITO pattern and is connected with ITO pattern, it is characterized in that: this pick-up unit also comprises the display panels be positioned at above ITO pattern, this display panels comprises upper substrate, ITO electrode, infrabasal plate and the liquid crystal between sandwiched upper substrate and infrabasal plate bottom upper substrate, and one end of a power supply is connected to ITO electrode, the other end of power supply is connected to IC.
7. the capacitance detecting device of touch sensing according to claim 6, is characterized in that: the image machine also comprising the information of reading on display panels, image machine is connected with computer.
8. the detection method of pick-up unit according to claim 1, it is characterized in that, comprise the steps: to be energized to ITO electrode and row IC, the change of detect lines ITO pattern regional capacitance, when somewhere defectiveness in row ITO pattern, display panels shows the optical anomaly of the row ITO pattern of corresponding defect; To ITO electrode and row IC energising, detect the change of row ITO pattern regional capacitance, when somewhere defectiveness in row ITO pattern, display panels shows the optical anomaly of the row ITO pattern of corresponding defect; Give row IC and row IC energising simultaneously, when row IC and row IC gives different voltage, foreign matter is had between row ITO pattern and row ITO pattern, when causing row ITO pattern and the series connection of row ITO pattern, cause a full line of fault location or column voltage to change because connecting, display panels shows the row ITO of corresponding defect and the optical anomaly of row ITO pattern.
9. detection method according to claim 8, it is characterized in that: pick-up unit also comprises the image machine of the information of reading on display panels, image machine is connected with computer, and the optical anomaly data of described ITO pattern catch by image machine, and show in computer.
10. the detection method of pick-up unit according to claim 6, it is characterized in that, comprise the steps:, to ITO electrode and IC energising, to detect the change of ITO pattern regional capacitance, when somewhere defectiveness in ITO pattern, display panels shows the optical anomaly of the ITO pattern of corresponding defect.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410810972.7A CN104516144B (en) | 2014-12-23 | 2014-12-23 | The capacitance detecting device and its detection method of a kind of touch sensing |
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| CN201410810972.7A CN104516144B (en) | 2014-12-23 | 2014-12-23 | The capacitance detecting device and its detection method of a kind of touch sensing |
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| CN104516144A true CN104516144A (en) | 2015-04-15 |
| CN104516144B CN104516144B (en) | 2017-10-31 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106445259A (en) * | 2015-08-05 | 2017-02-22 | 南京瀚宇彩欣科技有限责任公司 | Manufacture method of touch display component and repairing equipment of touch display component |
| CN107346067A (en) * | 2016-05-06 | 2017-11-14 | 上海纪显电子科技有限公司 | Capacitance type touch-control panel detecting system and method |
| CN107346065A (en) * | 2016-05-06 | 2017-11-14 | 上海纪显电子科技有限公司 | Capacitance type touch-control panel detecting system and its detection method |
| CN108121097A (en) * | 2016-11-30 | 2018-06-05 | 乐金显示有限公司 | Display panel |
| CN110361870A (en) * | 2019-07-29 | 2019-10-22 | 深圳阜时科技有限公司 | A kind of optical module, transmitting unit, sensing mould group and electronic equipment |
| TWI707257B (en) * | 2018-10-08 | 2020-10-11 | 友達光電股份有限公司 | Touch device and driving method thereof |
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| JPH08146863A (en) * | 1994-11-21 | 1996-06-07 | Matsushita Electric Ind Co Ltd | Electronic test system |
| CA2529688A1 (en) * | 2003-06-20 | 2004-12-29 | Cirque Corporation | Single-layer touchpad and methods of use |
| JP4453710B2 (en) * | 2007-03-19 | 2010-04-21 | セイコーエプソン株式会社 | Liquid crystal device, electronic apparatus and position detection method |
| JP4945345B2 (en) * | 2007-07-03 | 2012-06-06 | 株式会社 日立ディスプレイズ | Display device with touch panel |
| CN101408825B (en) * | 2008-11-12 | 2010-07-21 | 友达光电股份有限公司 | Capacitance touching control panel and detection method thereof |
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2014
- 2014-12-23 CN CN201410810972.7A patent/CN104516144B/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106445259A (en) * | 2015-08-05 | 2017-02-22 | 南京瀚宇彩欣科技有限责任公司 | Manufacture method of touch display component and repairing equipment of touch display component |
| CN107346067A (en) * | 2016-05-06 | 2017-11-14 | 上海纪显电子科技有限公司 | Capacitance type touch-control panel detecting system and method |
| CN107346065A (en) * | 2016-05-06 | 2017-11-14 | 上海纪显电子科技有限公司 | Capacitance type touch-control panel detecting system and its detection method |
| CN108121097A (en) * | 2016-11-30 | 2018-06-05 | 乐金显示有限公司 | Display panel |
| CN108121097B (en) * | 2016-11-30 | 2021-04-16 | 乐金显示有限公司 | Display panel |
| TWI707257B (en) * | 2018-10-08 | 2020-10-11 | 友達光電股份有限公司 | Touch device and driving method thereof |
| CN110361870A (en) * | 2019-07-29 | 2019-10-22 | 深圳阜时科技有限公司 | A kind of optical module, transmitting unit, sensing mould group and electronic equipment |
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|---|---|
| CN104516144B (en) | 2017-10-31 |
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