CN104501851A - Self-checking circuit, self-checking method and self-checking system for photosensitive element as well as air conditioner - Google Patents
Self-checking circuit, self-checking method and self-checking system for photosensitive element as well as air conditioner Download PDFInfo
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- CN104501851A CN104501851A CN201410743116.4A CN201410743116A CN104501851A CN 104501851 A CN104501851 A CN 104501851A CN 201410743116 A CN201410743116 A CN 201410743116A CN 104501851 A CN104501851 A CN 104501851A
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Abstract
The invention provides a self-checking circuit for a photosensitive element. The self-checking circuit comprises a photosensitive sensor, a light source and a micro processor, wherein the light source is arranged within a photosensitive range of the photosensitive sensor and used for providing a detecting light source for the photosensitive sensor in a self-checking process of the photosensitive sensor; the micro processor is connected to the light source and used for controlling the light source to switch on for realizing the self-checking process of the photosensitive element. The invention further provides a self-checking method and a self-checking system for a photosensitive element as well as an air conditioner. According to the technical scheme adopted by the invention, the self-checking process of the photosensitive element is realized so as to conveniently judge whether the photosensitive element effectively works or not; besides, the reliability of the photosensitive element is timely judged, so that the micro processor can be used for accurately obtaining a test signal of the photosensitive element and accurately controlling a functional module.
Description
Technical field
The present invention relates to photosensitive device field, in particular to a kind of photosensitive device self-checking circuit, a kind of photosensitive device self checking method, a kind of photosensitive device self-checking system and a kind of air conditioner
Background technology
In the related, light sensor is because its test philosophy is simple, cost of manufacture low signal compatibility advantages of higher is widely used in the fields such as home appliance, terminal device, environment measuring technology and energy recycling technology, wherein, light sensor is applied in home appliance, after mainly surround lighting being detected, after testing result is sent to microprocessor, by microprocessor to the Based Intelligent Control process of the result of testing result to functional circuit.
But, the working condition of light sensor is not tested in correlation technique, which results in the problem of many reduction equipment dependabilities, such as, when light sensor lost efficacy, the brightness of default contexts light is lower, and opertaing device is in the lower mode of operation of brightness for a long time, and equipment easily breaks down and run counter to the original intention of its intelligentized design.
Therefore, photosensitive device self-checking circuit and self-inspection scheme how is designed to realize becoming technical matters urgently to be resolved hurrily to the timely detection of light sensor.
Summary of the invention
The present invention is intended at least to solve one of technical matters existed in prior art or correlation technique.
For this reason, one object of the present invention is to propose a kind of photosensitive device self-checking circuit that can detect the validity of light sensor in time.
Another object of the present invention is to propose a kind of photosensitive device self checking method.
Another object of the present invention is to propose a kind of photosensitive device self-checking system.
Another object of the present invention is to propose a kind of air conditioner.
For achieving the above object, embodiment according to a first aspect of the invention, proposes a kind of photosensitive device self-checking circuit, comprising: light sensor; Light source, is arranged in the sensitive volume of described light sensor, for providing detection light source to described light sensor in the process of self-test of described light sensor; Microprocessor, is connected to described light source, for opening by controlling described light source with the process of self-test realizing described photosensitive device.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging light source to provide detection light source to light sensor in photosensitive device, achieve the process of self-test of photosensitive device, to judge whether photosensitive device effectively works easily, in addition, the reliability of photosensitive device is judged in time, and then makes microprocessor can obtain the test signal of photosensitive device exactly to carry out the accurate control to functional module.
According to one embodiment of present invention, described microprocessor is connected to described light sensor, for obtaining the signal of described light sensor.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by microprocessor is connected to light sensor, easily the output signal of light sensor is processed, and according to above-mentioned output signal, corresponding control procedure is carried out to functional circuit.
According to one embodiment of present invention, comprising: timer, be connected to described microprocessor, for not detecting that the free time of described signal is sent to described microprocessor.
According to one embodiment of present invention, described microprocessor, when judging that described free time is more than or equal to default free time, opens described light source.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, to not detect that the free time of signal is sent to microprocessor by timer, avoid light sensor lost efficacy the microprocessor caused mistake control, particularly, when judging that free time is more than or equal to default free time, on the one hand, may be because ambient light is poor, such as night-environment, on the other hand, may be that light sensor breaks down, therefore, the situation of the fault of and light sensor poor to ambient light is needed to distinguish, when light sensor continues output low level signal, open the performance of described light source to light sensor to detect.
According to one embodiment of present invention, comprising: power supply; First switching device, is connected between described light source and described power supply, and described first switching device is also connected to described microprocessor, and described microprocessor is opened to control described light source by controlling described first switch device conductive.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging power supply, and the first switching device be connected between power supply and light source, and just the first switching device is connected to microprocessor, achieve the convenient control procedure to light source, particularly, by the opening and closing state of Microprocessor S3C44B0X first switching device, indirectly can control the opening and closing state of light source, also namely carry out controlling easily to the beginning of process of self-test and end.
According to one embodiment of present invention, described light source comprises LED diode and/or infrared origin.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, LED diode and/or infrared origin is comprised by arranging light source, achieve the convenient test of photosensitive device, reduce the cost of test process simultaneously, and improve the accuracy of test process, meanwhile, due to low cost and the low power consumption characteristic of LED diode and/or infrared origin, cost and the power consumption of process of self-test is effectively reduced.
According to one embodiment of present invention, when described light source is described infrared origin, comprising: modulation module, be connected to described infrared origin, for when described infrared origin is opened, described infrared origin is modulated.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, when adopting infrared origin as light source, by increasing modulation module, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module, to realize the stable process of self-test of light sensor, prevent temperature from increasing to over light sensor threshold value and the device failure problem caused, in addition, by change modulating frequency, effectively can obtain the frequency response of light sensor, further verify the validity of light sensor.
Particularly, infrared origin is adopted to detect as light source, the light sensor of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor, can obtain the optimal response value of light sensor the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, described microprocessor is used in described process of self-test, will not detect that the detection time of detection signal is sent to described microprocessor.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by not detecting that the detection time of detection signal is sent to microprocessor, know the signal response time of light sensor accurately, and by judging whether light sensor effectively works detection time exactly, to realize the accurate control to the functional circuit of equipment, in addition, timer is after process of self-test terminates, the clearing of detection time can be carried out, to reduce internal memory and the operand of timer, improve detection efficiency and accuracy rate.
According to one embodiment of present invention, described microprocessor is connected to functional circuit, and described microprocessor is according to the duty of the testing result controlling functions circuit of described process of self-test.
According to one embodiment of present invention, also comprise: second switch device, be connected between described functional circuit and described microprocessor, start working for controlling described functional circuit according to the triggering command of described microprocessor, and quit work for controlling described functional circuit according to the out code of described microprocessor.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging second switch device between functional circuit and microprocessor, achieve the quick control to functional circuit, particularly, second switch device and the first switching device all can adopt the MOS of low-power consumption, NPN type triode or PNP type triode, and cost is low and respective rate is fast.
According to a second aspect of the invention, also proposed a kind of photosensitive device self checking method, be applicable to the photosensitive device self-checking circuit as described in above-mentioned any one technical scheme, comprise: control described microprocessor and open described light source; When being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then controlling functional circuit described in described Microprocessor S3C44B0X and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by opening light source, light sensor is detected, the mode detected comprises real-time detection (such as, low-power light source is at the appointed time adopted to carry out self-inspection in section) or timing detection, or adopt acyclic detection, by setting up light source, can be easily, neatly the reliability of light sensor is detected, particularly, light sensor at light poor or lost efficacy, low level state can be kept, when microprocessor does not detect high level signal for a long time, be necessary that and inefficacy both of these case poor to light is distinguished, now, whether normally work by opening light source detection light sensor, the i.e. fast verification reliability of light sensor, to achieve the accurate control to functional circuit, ensure that the reliability of system cloud gray model.
According to one embodiment of present invention, control described microprocessor and open described light source, comprise following concrete steps: when the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source; Control described light source according to described working curve and carry out work to realize the process of self-test of described light sensor.
According to the photosensitive device self checking method of the embodiment of the present invention, the duty of light source is controlled by default working curve, achieve the intellectuality of process of self-test, particularly, firm power can be adopted to control light source and to carry out work, or adopt and periodically detect, ensure the reliability of process of self-test with repeated detection, and then guarantee the validity of light sensor.
According to one embodiment of present invention, when described light source is described LED light source, preset the first working curve of described LED light source, described first working curve is used for controlling described power supply by described first switching device within first schedule time, keeps fixing luminous power.
According to the photosensitive device self checking method of the embodiment of the present invention, by arranging the first working curve of LED light source, ensure that the functional reliability of LED light source, to guarantee that test signal is steadily effective, and then ensure that reliability and the accuracy of process of self-test.
According to one embodiment of present invention, when described light source is described infrared origin, preset the second working curve of described infrared origin, described second working curve is used for controlling to modulate described infrared origin by described modulation module and described first switching device.
According to the photosensitive device self checking method of the embodiment of the present invention, by arranging the second working curve, infrared origin is modulated, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module, to realize the stable process of self-test of light sensor, prevent temperature from increasing to over light sensor threshold value and the device failure problem caused, in addition, by change modulating frequency, effectively can obtain the frequency response of light sensor, further verify the validity of light sensor.
Particularly, infrared origin is adopted to detect as light source, the light sensor of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor, can obtain the optimal response value of light sensor the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then control described microprocessor and close described functional circuit, comprise following concrete steps: when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then control described microprocessor and control described functional circuit by described second switch device and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by when being more than or equal to for first schedule time detection time, controlling functions circuit quits work, and ensure that when light sensor lost efficacy, can not false triggering functional circuit, to ensure the reliability of system cloud gray model.
According to a third aspect of the present invention, also proposed a kind of photosensitive device self-checking system, be applicable to the photosensitive device self-checking circuit as described in above-mentioned any one technical scheme, comprise: control module, opening described light source for controlling described microprocessor; And the described detection time for not producing described detection signal at described light sensor is when being more than or equal to for first schedule time, then controls functional circuit described in described Microprocessor S3C44B0X and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by opening light source, light sensor is detected, the mode detected comprises real-time detection (such as, low-power light source is at the appointed time adopted to carry out self-inspection in section) or timing detection, or adopt acyclic detection, by setting up light source, can be easily, neatly the reliability of light sensor is detected, particularly, light sensor at light poor or lost efficacy, low level state can be kept, when microprocessor does not detect high level signal for a long time, be necessary that and inefficacy both of these case poor to light is distinguished, now, whether normally work by opening light source detection light sensor, the i.e. fast verification reliability of light sensor, to achieve the accurate control to functional circuit, ensure that the reliability of system cloud gray model.
According to one embodiment of present invention, described control module also for, when the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source; And carry out work to realize the process of self-test of described light sensor for controlling described light source according to described working curve.
According to the photosensitive device self-checking system of the embodiment of the present invention, the duty of light source is controlled by default working curve, achieve the intellectuality of process of self-test, particularly, firm power can be adopted to control light source and to carry out work, or adopt and periodically detect, ensure the reliability of process of self-test with repeated detection, and then guarantee the validity of light sensor.
According to one embodiment of present invention, when described light source is described LED light source, preset the first working curve of LED light source, described first working curve is used for controlling described power supply by described first switching device within first schedule time, keeps fixing luminous power.
According to the photosensitive device self-checking system of the embodiment of the present invention, by arranging the first working curve of LED light source, ensure that the functional reliability of LED light source, to guarantee that test signal is steadily effective, and then ensure that reliability and the accuracy of process of self-test.
According to one embodiment of present invention, when described light source is described infrared origin, preset the second working curve during described infrared origin, described second working curve is used for controlling to modulate described infrared origin by described modulation module and described first switching device.
According to the photosensitive device self-checking system of the embodiment of the present invention, by arranging the second working curve, infrared origin is modulated, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module, to realize the stable process of self-test of light sensor, prevent temperature from increasing to over light sensor threshold value and the device failure problem caused, in addition, by change modulating frequency, effectively can obtain the frequency response of light sensor, further verify the validity of light sensor.
Particularly, infrared origin is adopted to detect as light source, the light sensor of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor, can obtain the optimal response value of light sensor the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, described control module also for, when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then controlling described microprocessor and close described functional circuit by described second switch device.
According to the photosensitive device self-checking system of the embodiment of the present invention, by when being more than or equal to for first schedule time detection time, controlling functions circuit quits work, and ensure that when light sensor lost efficacy, can not false triggering functional circuit, to ensure the reliability of system cloud gray model.
According to a forth aspect of the invention, also proposed a kind of air conditioner, comprising: the photosensitive self-checking circuit as described in above-mentioned any one technical scheme or the photosensitive device self-checking system as described in above-mentioned any one technical scheme.
Additional aspect of the present invention and advantage will part provide in the following description, and part will become obvious from the following description, or be recognized by practice of the present invention.
Accompanying drawing explanation
Above-mentioned and/or additional aspect of the present invention and advantage will become obvious and easy understand from accompanying drawing below combining to the description of embodiment, wherein:
Fig. 1 shows the structural representation of photosensitive device self-checking circuit according to an embodiment of the invention;
Fig. 2 shows the structural representation of photosensitive device self-checking circuit according to another embodiment of the invention;
Fig. 3 shows the structural representation of photosensitive device self-checking circuit according to still a further embodiment;
Fig. 4 shows the schematic flow diagram of photosensitive device self checking method according to an embodiment of the invention;
Fig. 5 shows the schematic flow diagram of photosensitive device self checking method according to an embodiment of the invention;
Fig. 6 shows the schematic block diagram of photosensitive device self-checking system according to an embodiment of the invention;
Fig. 7 shows working curve during the fixing luminous power of light source according to an embodiment of the invention;
Fig. 8 shows the working curve after the modulating frequency of infrared origin according to an embodiment of the invention.
Embodiment
In order to more clearly understand above-mentioned purpose of the present invention, feature and advantage, below in conjunction with the drawings and specific embodiments, the present invention is further described in detail.It should be noted that, when not conflicting, the feature in the embodiment of the application and embodiment can combine mutually.
Set forth a lot of detail in the following description so that fully understand the present invention; but; the present invention can also adopt other to be different from other modes described here and implement, and therefore, protection scope of the present invention is not by the restriction of following public specific embodiment.
As shown in Figure 1 to Figure 3, photosensitive device self-checking circuit comprises numerous embodiments according to an embodiment of the invention.
Embodiment one
As shown in Figure 1, photosensitive device self-checking circuit 100 according to an embodiment of the invention, comprising: light sensor 101; Light source 102, is arranged in the sensitive volume of described light sensor 101, for providing detection light source 102 to described light sensor 101 in the process of self-test of described light sensor 101; Microprocessor 103, is connected to described light source 102, for opening by controlling described light source 102 process of self-test realizing described photosensitive device.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging light source 102 to provide detection light source 102 to light sensor 101 in photosensitive device, achieve the process of self-test of photosensitive device, to judge whether photosensitive device effectively works easily, in addition, the reliability of photosensitive device is judged in time, and then makes microprocessor 103 can obtain the test signal of photosensitive device exactly to carry out the accurate control to functional module.
According to one embodiment of present invention, described microprocessor 103 is connected to described light sensor 101, for obtaining the signal of described light sensor 101.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by microprocessor 103 is connected to light sensor 101, easily the output signal of light sensor 101 is processed, and according to above-mentioned output signal, corresponding control procedure is carried out to functional circuit 109.
According to one embodiment of present invention, comprising: timer 104, be connected to described microprocessor 103, for not detecting that the free time of described signal is sent to described microprocessor 103.
According to one embodiment of present invention, described microprocessor 103, when judging that described free time is more than or equal to default free time, opens described light source 102.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, to not detect that the free time of signal is sent to microprocessor 103 by timer 104, avoid light sensor 101 lost efficacy the microprocessor 103 caused mistake control, particularly, when judging that free time is more than or equal to default free time, on the one hand, may be because ambient light is poor, such as night-environment, on the other hand, may be that light sensor 101 breaks down, therefore, the situation of the fault of and light sensor 101 poor to ambient light is needed to distinguish, when light sensor 101 continues output low level signal, the performance of opening described light source 102 pairs of light sensors 101 detects.
According to one embodiment of present invention, comprising: power supply 105; First switching device 106, be connected between described light source 102 and described power supply 105, described first switching device 106 is also connected to described microprocessor 103, and described microprocessor 103 is opened to control described light source 102 by controlling described first switching device 106 conducting.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging power supply 105, and the first switching device 106 be connected between power supply 105 and light source 102, and just the first switching device 106 is connected to microprocessor 103, achieve the convenient control procedure to light source 102, particularly, the opening and closing state of the first switching device 106 is controlled by microprocessor 103, indirectly can control the opening and closing state of light source 102, also namely carry out controlling easily to the beginning of process of self-test and end.
According to one embodiment of present invention, described light source 102 comprises LED diode and/or infrared origin.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, LED diode and/or infrared origin is comprised by arranging light source 102, achieve the convenient test of photosensitive device, reduce the cost of test process simultaneously, and improve the accuracy of test process, meanwhile, due to low cost and the low power consumption characteristic of LED diode and/or infrared origin, cost and the power consumption of process of self-test is effectively reduced.
According to one embodiment of present invention, when described light source 102 is described infrared origin, comprises: modulation module 107, be connected to described infrared origin, for when described infrared origin is opened, described infrared origin is modulated.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, when adopting infrared origin as light source 102, by increasing modulation module 107, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module 107, to realize the stable process of self-test of light sensor 101, prevent temperature from increasing to over light sensor 101 threshold value and the device failure problem caused, in addition, by change modulating frequency, as shown in Figure 8, effectively can obtain the frequency response of light sensor 101, further verify the validity of light sensor 101.
Particularly, infrared origin is adopted to detect as light source 102, the light sensor 101 of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor 101, can obtain the optimal response value of light sensor 101 the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, described microprocessor 103, in described process of self-test, is sent to described microprocessor 103 detection time of detection signal by not detecting.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by not detecting that the detection time of detection signal is sent to microprocessor 103, know the signal response time of light sensor 101 accurately, and by judging whether light sensor 101 effectively works detection time exactly, to realize the accurate control to the functional circuit 109 of equipment, in addition, timer 104 is after process of self-test terminates, the clearing of detection time can be carried out, to reduce internal memory and the operand of timer 104, improve detection efficiency and accuracy rate.
According to one embodiment of present invention, described microprocessor 103 is connected to functional circuit 109, and described microprocessor 103 is according to the duty of the testing result controlling functions circuit 109 of described process of self-test.
According to one embodiment of present invention, also comprise: second switch device 108, be connected between described functional circuit 109 and described microprocessor 103, start working for controlling described functional circuit 109 according to the triggering command of described microprocessor 103, and quit work for controlling described functional circuit 109 according to the out code of described microprocessor 103.
According to the photosensitive device self-checking circuit of the embodiment of the present invention, by arranging second switch device 108 between functional circuit 109 and microprocessor 103, achieve the quick control to functional circuit 109, particularly, second switch device 108 and the first switching device 106 all can adopt the MOS of low-power consumption, NPN type triode or PNP type triode, and cost is low and respective rate is fast.
Embodiment two
As shown in Figure 2, photosensitive device self-checking circuit according to an embodiment of the invention, comprise: fixed light source 102 and light sensor 101 in PCB substrate 201, after unlatching light source 102, light reflexes to light sensor 101 through panel 202, wherein, in order to reduce the loss in light source works process, can arrange at the reflector space of panel 202 and increase anti-coating, particularly, wave band for light source carries out increasing inverse processing, and do not affect the sensing of the surround lighting outside light sensor 101 counter plate 202, in addition, in order to strengthen the sensitometric characteristic of light sensor 101, the shirt rim of light sensor 101 is increased, or increase the height of the holder of light sensor 101.
Embodiment three
As shown in Figure 3, photosensitive device self-checking circuit according to an embodiment of the invention, comprise: with microprocessor 103 for core component, the opening and closing of light source 102 is controlled by the first switching device 106, the opposite side of the first switching device is connected to resistance R2 and power supply 105, wherein, power supply 105 is also for providing operating voltage to second switch device 108 and light sensor 101, second switch device 108 is for the duty of the instruction controlling functions circuit 109 according to microprocessor 103, wherein, R1 and R3 is used for carrying out voltage division processing to the output voltage of light sensor 101, and the voltage after voltage division processing is sent to microprocessor carries out computing and control.
As shown in Fig. 4 to Fig. 5, photosensitive device self checking method comprises numerous embodiments according to an embodiment of the invention.
Embodiment one
As shown in Figure 4, photosensitive device self checking method according to an embodiment of the invention, is applicable to the photosensitive device self-checking circuit described in above-mentioned any one technical scheme, comprises: control described microprocessor and open described light source; When being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then controlling functional circuit described in described Microprocessor S3C44B0X and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by opening light source, light sensor is detected, the mode detected comprises real-time detection (such as, low-power light source is at the appointed time adopted to carry out self-inspection in section) or timing detection, or adopt acyclic detection, by setting up light source, can be easily, neatly the reliability of light sensor is detected, particularly, light sensor at light poor or lost efficacy, low level state can be kept, when microprocessor does not detect high level signal for a long time, be necessary that and inefficacy both of these case poor to light is distinguished, now, whether normally work by opening light source detection light sensor, the i.e. fast verification reliability of light sensor, to achieve the accurate control to functional circuit, ensure that the reliability of system cloud gray model.
According to one embodiment of present invention, control described microprocessor and open described light source, comprise following concrete steps: when the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source; Control described light source according to described working curve and carry out work to realize the process of self-test of described light sensor.
According to the photosensitive device self checking method of the embodiment of the present invention, the duty of light source is controlled by default working curve, achieve the intellectuality of process of self-test, particularly, firm power can be adopted to control light source and to carry out work, or adopt and periodically detect, ensure the reliability of process of self-test with repeated detection, and then guarantee the validity of light sensor.
According to one embodiment of present invention, when described light source is described LED light source, preset the first working curve of described LED light source, described first working curve is used for controlling described power supply by described first switching device within first schedule time, keeps fixing luminous power, as shown in Figure 7.
According to the photosensitive device self checking method of the embodiment of the present invention, by arranging the first working curve of LED light source, ensure that the functional reliability of LED light source, to guarantee that test signal is steadily effective, and then ensure that reliability and the accuracy of process of self-test.
According to one embodiment of present invention, when described light source is described infrared origin, preset the second working curve of described infrared origin, described second working curve is used for controlling to modulate described infrared origin by described modulation module and described first switching device.
According to the photosensitive device self checking method of the embodiment of the present invention, by arranging the second working curve, infrared origin is modulated, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module, to realize the stable process of self-test of light sensor, prevent temperature from increasing to over light sensor threshold value and the device failure problem caused, in addition, by change modulating frequency, as shown in Figure 8, effectively can obtain the frequency response of light sensor, further verify the validity of light sensor.
Particularly, infrared origin is adopted to detect as light source, the light sensor of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor, can obtain the optimal response value of light sensor the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then control described microprocessor and close described functional circuit, comprise following concrete steps: when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then control described microprocessor and control described functional circuit by described second switch device and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by when being more than or equal to for first schedule time detection time, controlling functions circuit quits work, and ensure that when light sensor lost efficacy, can not false triggering functional circuit, to ensure the reliability of system cloud gray model.
Embodiment two
As shown in Figure 5, photosensitive device self checking method, comprising: step 502 according to an embodiment of the invention, works on power; Step 504, detecting light sensor output voltage is zero; Step 506, starts timing; Step 508, judge voltage be zero duration whether be greater than preset time T s, if so, then perform step 512, if not, then perform step 510; Step 510, timer 104 resets; Step 512, pause function circuit; Step 514, continues closed first switching element T 1 time; Step 516, judges, in the T1 time, whether light sensor has output signal, if so, then performs step 520, if not, then performs step 518; Step 518, closing function circuit; Step 520, open function circuit, carries out work after waiting for microprocessor triggering command.
Fig. 6 has gone out the schematic block diagram of photosensitive device self-checking system according to an embodiment of the invention.
As shown in Figure 6, photosensitive device self-checking system 600 according to an embodiment of the invention, is applicable to the photosensitive device self-checking circuit as described in above-mentioned any one technical scheme, comprises: control module 602, opens described light source for controlling described microprocessor; And the described detection time for not producing described detection signal at described light sensor is when being more than or equal to for first schedule time, then controls functional circuit described in described Microprocessor S3C44B0X and quit work.
According to the photosensitive device self checking method of the embodiment of the present invention, by opening light source, light sensor is detected, the mode detected comprises real-time detection (such as, low-power light source is at the appointed time adopted to carry out self-inspection in section) or timing detection, or adopt acyclic detection, by setting up light source, can be easily, neatly the reliability of light sensor is detected, particularly, light sensor at light poor or lost efficacy, low level state can be kept, when microprocessor does not detect high level signal for a long time, be necessary that and inefficacy both of these case poor to light is distinguished, now, whether normally work by opening light source detection light sensor, the i.e. fast verification reliability of light sensor, to achieve the accurate control to functional circuit, ensure that the reliability of system cloud gray model.
According to one embodiment of present invention, described control module 602 also for, when the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source; And carry out work to realize the process of self-test of described light sensor for controlling described light source according to described working curve.
According to the photosensitive device self-checking system of the embodiment of the present invention, the duty of light source is controlled by default working curve, achieve the intellectuality of process of self-test, particularly, firm power can be adopted to control light source and to carry out work, or adopt and periodically detect, ensure the reliability of process of self-test with repeated detection, and then guarantee the validity of light sensor.
According to one embodiment of present invention, when described light source is described LED light source, preset the first working curve of LED light source, described first working curve is used for controlling described power supply by described first switching device within first schedule time, keeps fixing luminous power, as shown in Figure 7.
According to the photosensitive device self-checking system of the embodiment of the present invention, by arranging the first working curve of LED light source, ensure that the functional reliability of LED light source, to guarantee that test signal is steadily effective, and then ensure that reliability and the accuracy of process of self-test.
According to one embodiment of present invention, when described light source is described infrared origin, preset the second working curve during described infrared origin, described second working curve is used for controlling to modulate described infrared origin by described modulation module and described first switching device.
According to the photosensitive device self-checking system of the embodiment of the present invention, by arranging the second working curve, infrared origin is modulated, overcome the problem of the constant temperature rising that infrared origin causes, the output power of infrared origin is set by modulation module, to realize the stable process of self-test of light sensor, prevent temperature from increasing to over light sensor threshold value and the device failure problem caused, in addition, by change modulating frequency, as shown in Figure 8, effectively can obtain the frequency response of light sensor, further verify the validity of light sensor.
Particularly, infrared origin is adopted to detect as light source, the light sensor of infrared wavelength range is mainly in for absorption maximum crest, when adopting infrared origin to detect above-mentioned light sensor, can obtain the optimal response value of light sensor the soonest, this process of self-test also the most accurately and reliably.
According to one embodiment of present invention, described control module 602 also for, when being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then controlling described microprocessor and close described functional circuit by described second switch device.
According to the photosensitive device self-checking system of the embodiment of the present invention, by when being more than or equal to for first schedule time detection time, controlling functions circuit quits work, and ensure that when light sensor lost efficacy, can not false triggering functional circuit, to ensure the reliability of system cloud gray model.
More than be described with reference to the accompanying drawings technical scheme of the present invention, consider in correlation technique and propose how to design photosensitive device self-checking circuit and self-inspection scheme to realize the technical matters to the timely detection of light sensor, the present invention proposes a kind of photosensitive device self-checking circuit, a kind of photosensitive self-inspection self checking method, a kind of photosensitive device self-checking system and a kind of air conditioner, by arranging light source to provide detection light source to light sensor in photosensitive device, achieve the process of self-test of photosensitive device, to judge whether photosensitive device effectively works easily, in addition, the reliability of photosensitive device is judged in time, and then make microprocessor can obtain the test signal of photosensitive device exactly to carry out the accurate control to functional module.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (12)
1. a photosensitive device self-checking circuit, is characterized in that, comprising:
Light sensor;
Light source, is arranged in the sensitive volume of described light sensor, for providing detection light source to described light sensor in the process of self-test of described light sensor;
Microprocessor, is connected to described light source, and for opening by controlling described light source with the process of self-test realizing described photosensitive device, described microprocessor is connected to described light sensor, for obtaining the signal of described light sensor.
2. photosensitive device self-checking circuit according to claim 1, is characterized in that, comprising:
Timer, is connected to described microprocessor, and for not detecting that the free time of described signal is sent to described microprocessor, described microprocessor, when judging that described free time is more than or equal to default free time, opens described light source;
Power supply;
First switching device, is connected between described light source and described power supply, and described first switching device is also connected to described microprocessor, and described microprocessor is opened to control described light source by controlling described first switch device conductive.
3. photosensitive device self-checking circuit according to claim 2, is characterized in that, described light source comprises LED diode and/or infrared origin.
4. photosensitive device self-checking circuit according to claim 3, is characterized in that, when described light source is described infrared origin, comprising:
Modulation module, is connected to described infrared origin and described microprocessor, and for when described infrared origin is opened, the predetermined modulation frequency according to described microprocessor is modulated described infrared origin.
5. photosensitive device self-checking circuit according to any one of claim 1 to 4, is characterized in that, described microprocessor is used in described process of self-test, will not detect that the detection time of detection signal is sent to described microprocessor.
6. photosensitive device self-checking circuit according to any one of claim 1 to 4, is characterized in that, described microprocessor is connected to functional circuit, and described microprocessor is according to the duty of the testing result controlling functions circuit of described process of self-test.
7. photosensitive device self-checking circuit according to claim 6, is characterized in that, also comprise:
Second switch device, be connected between described functional circuit and described microprocessor, start working for controlling described functional circuit according to the triggering command of described microprocessor, and quit work for controlling described functional circuit according to the out code of described microprocessor.
8. a photosensitive device self checking method, is applicable to the photosensitive device self-checking circuit according to any one of claim 1 to 7, it is characterized in that, comprising:
Control described microprocessor and open described light source;
When being more than or equal to for first schedule time described detection time that described light sensor does not produce described detection signal, then controlling functional circuit described in described Microprocessor S3C44B0X and quit work.
9. photosensitive device self checking method according to claim 8, is characterized in that, controls described microprocessor and opens described light source, comprise following concrete steps:
When the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source;
Control described light source according to described working curve and carry out work to realize the process of self-test of described light sensor.
10. a photosensitive device self-checking system, is applicable to the photosensitive device self-checking circuit according to any one of claim 1 to 7, it is characterized in that, comprising:
Control module, opens described light source for controlling described microprocessor; And
Described detection time for not producing described detection signal at described light sensor when being more than or equal to for first schedule time, then controlling functional circuit described in described Microprocessor S3C44B0X and quits work.
11. photosensitive device self-checking systems according to claim 10, it is characterized in that, described control module also for, when the described free time that described light sensor does not produce described signal was more than or equal to for second schedule time, preset the working curve of described light source; And
Work is carried out to realize the process of self-test of described light sensor for controlling described light source according to described working curve.
12. 1 kinds of air conditioners, is characterized in that, comprising: the photosensitive self-checking circuit according to any one of claim 1 to 7 or the photosensitive device self-checking system as described in claim 10 or 11.
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