CN104459647A - Microwave multichannel product testing system - Google Patents
Microwave multichannel product testing system Download PDFInfo
- Publication number
- CN104459647A CN104459647A CN201410680759.9A CN201410680759A CN104459647A CN 104459647 A CN104459647 A CN 104459647A CN 201410680759 A CN201410680759 A CN 201410680759A CN 104459647 A CN104459647 A CN 104459647A
- Authority
- CN
- China
- Prior art keywords
- testing
- switch arrays
- low temperature
- microwave
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
- G01S7/4004—Means for monitoring or calibrating of parts of a radar system
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- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a microwave multichannel product testing system. The microwave multichannel product testing system comprises a testing control computer, a testing instrument, a testing signal source, a switch array drive controller, a single-pole multi-throw switch array and a multi-choice single-switch array, and is characterized in that the single-pole multi-throw switch array, the multi-choice single-switch array and a multichannel test piece are arranged in a high-low temperature box, and the testing control computer, the testing instrument, the testing signal source and the switch array drive controller are arranged outside the high-low temperature box. The microwave multichannel product testing system is a rapid and efficient product testing device, multichannel product testing at the microwave frequency band is achieved, the number of high frequency testing cables needing to be connected inside and outside the high-low temperature box is remarkably reduced, and production efficiency is improved.
Description
Technical field
The invention belongs to the electronic product such as radar, communication and manufacture field, be specifically related to a kind of microwave multichannel product testing system.
Background technology
In the exist such as radar, telecommunications at hyperchannel product, as the multichannel transmitting-receiving module in phased-array radar, multichannel receiver, hyperchannel transmitter etc., its feature is that passage is many, interface is many, need during test connect, change test cable line many, when high-low temperature chamber build-in test, inside and outside high-low temperature chamber, line is many, intricate operation during replacing test block, consuming time, efficiency is low.
Summary of the invention
The technical matters solved
In order to avoid the deficiencies in the prior art part, the present invention proposes a kind of microwave multichannel product testing system, is a kind of quick, efficient testing apparatus, reduces the inside and outside test cable quantity connected of high-low temperature chamber, shorten the replacing test block time.
Technical scheme
A kind of microwave multichannel product testing system, comprises testing and control computing machine, test instrumentation, testing source, switch arrays driving governor, hilted broadsword is many
throwswitch arrays and multiselect one switch arrays; It is characterized in that: hilted broadsword is many
throwswitch arrays, multiselect one switch arrays and multiple channel test part are placed in high-low temperature chamber, and testing and control computing machine, test instrumentation, testing source and switch arrays driving governor are placed in outside high-low temperature chamber.
Described hilted broadsword is many
throwdigital signal wire harness is adopted to be connected between switch arrays with switch arrays driving governor.
Described hilted broadsword is many
throwthe grafting of quick connector is adopted to be connected between switch arrays with multiple channel test part.
Beneficial effect
A kind of microwave multichannel product testing system that the present invention proposes, switch arrays, multiple channel test part are placed in high-low temperature chamber, the control of switch arrays is digital signal wire harness, decreases high frequency cable number of connection inside and outside high-low temperature chamber, shortens the connection cable time of test system building.Adopt the inserting mode of quick connector between switch arrays and multiple channel test part, improve and change test block efficiency.The present invention is a kind of product testing equipment of quickness and high efficiency, solves the hyperchannel product test of microwave frequency band, significantly reduces the high-frequency test number of cables needing inside and outside high-low temperature chamber to connect, enhances productivity.
The present invention adopts technique scheme to form, and compared with prior art, has following features:
1. switch arrays are placed in high-low temperature chamber, decrease the high-frequency test number of cables needing inside and outside high-low temperature chamber to connect, shorten the connection cable time of test system building;
2. adopt the plug-in type of quick connector between switch arrays and multiple channel test part, change test block quick.
Accompanying drawing explanation
Fig. 1: microwave multichannel product testing system schematic diagram.
Embodiment
Now in conjunction with the embodiments, the invention will be further described for accompanying drawing:
See Fig. 1, the present invention is by following hardware implementing.
The present invention is many by testing and control computing machine, test instrumentation, testing source, switch arrays driving governor, hilted broadsword
throwswitch arrays, multiselect one switch arrays, multiple channel test part are formed.Testing and control computing machine completes control and the setting also logging test results of test instrumentation, testing source, switch arrays driving governor; Test instrumentation test multiselect one switch arrays output signal; Testing source produces the test and excitation signal that test block needs; It is many that switch arrays driving governor produces hilted broadsword under testing and control computing machine controls
throwthe control signal that switch arrays and multiselect one switch arrays need; Hilted broadsword is many
throwswitch arrays test and excitation signal switching to current test channel; Multiselect one switch arrays is switched to test instrumentation current test channel; Multiple channel test part is the product needing test.This system in use hilted broadsword is many
throwswitch arrays, multiselect one switch arrays, multiple channel test part are placed in high-low temperature chamber, and testing and control computing machine, test instrumentation, testing source, switch arrays driving governor are positioned at outside high-low temperature chamber.Hilted broadsword is many
throwbe connected for digital signal wire harness between switch arrays with switch arrays driving governor, multiselect one switch arrays is digital signal wire harness with being connected between switch arrays driving governor, and this layout, connected mode decrease high frequency cable number of connection inside and outside high-low temperature chamber.Adopt the inserting mode of quick connector between switch arrays and multiple channel test part, this connected mode improves changes test block efficiency.
Claims (3)
1. a microwave multichannel product testing system, comprises testing and control computing machine, test instrumentation, testing source, switch arrays driving governor, single pole multiple throw battle array and multiselect one switch arrays; It is characterized in that: single pole multiple throw battle array, multiselect one switch arrays and multiple channel test part are placed in high-low temperature chamber, testing and control computing machine, test instrumentation, testing source and switch arrays driving governor are placed in outside high-low temperature chamber.
2. microwave multichannel product testing system according to claim 1, is characterized in that: described single pole multiple throw battle array is connected with adopting digital signal wire harness between switch arrays driving governor.
3. microwave multichannel product testing system according to claim 1, is characterized in that: described single pole multiple throw battle array is connected with adopting the grafting of quick connector between multiple channel test part.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410680759.9A CN104459647A (en) | 2014-11-24 | 2014-11-24 | Microwave multichannel product testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410680759.9A CN104459647A (en) | 2014-11-24 | 2014-11-24 | Microwave multichannel product testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104459647A true CN104459647A (en) | 2015-03-25 |
Family
ID=52906000
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410680759.9A Pending CN104459647A (en) | 2014-11-24 | 2014-11-24 | Microwave multichannel product testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104459647A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107478870A (en) * | 2017-08-23 | 2017-12-15 | 中国电子科技集团公司第四十研究所 | A kind of switching network for being applicable the experiment of aerospace level Multi-channel microwave component environment |
| CN107490738A (en) * | 2017-08-18 | 2017-12-19 | 湖南时变通讯科技有限公司 | A kind of radio-frequency devices test system |
| CN109375577A (en) * | 2018-10-25 | 2019-02-22 | 陕西航空电气有限责任公司 | A kind of testing stand multi-point output control system |
| CN109490860A (en) * | 2018-12-29 | 2019-03-19 | 中电科仪器仪表有限公司 | System protection circuit and method in a kind of high-power transmitting-receiving subassembly test |
-
2014
- 2014-11-24 CN CN201410680759.9A patent/CN104459647A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107490738A (en) * | 2017-08-18 | 2017-12-19 | 湖南时变通讯科技有限公司 | A kind of radio-frequency devices test system |
| CN107478870A (en) * | 2017-08-23 | 2017-12-15 | 中国电子科技集团公司第四十研究所 | A kind of switching network for being applicable the experiment of aerospace level Multi-channel microwave component environment |
| CN109375577A (en) * | 2018-10-25 | 2019-02-22 | 陕西航空电气有限责任公司 | A kind of testing stand multi-point output control system |
| CN109490860A (en) * | 2018-12-29 | 2019-03-19 | 中电科仪器仪表有限公司 | System protection circuit and method in a kind of high-power transmitting-receiving subassembly test |
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Legal Events
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| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150325 |