CN104438022A - Method for coating sticky quartz crystal probe of lunar dust measuring instrument - Google Patents
Method for coating sticky quartz crystal probe of lunar dust measuring instrument Download PDFInfo
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- CN104438022A CN104438022A CN201410449967.8A CN201410449967A CN104438022A CN 104438022 A CN104438022 A CN 104438022A CN 201410449967 A CN201410449967 A CN 201410449967A CN 104438022 A CN104438022 A CN 104438022A
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Abstract
The invention discloses a method for coating a sticky quartz crystal (SQCM) probe of a lunar dust measuring instrument. By using the method, a quartz crystal can be coated with vacuum grease, and the sticky quartz crystal formed after coating is carried out can be used for measuring lunar dust. According to the method, at first, petroleum ether is adopted for cleaning the quartz crystal, and the quartz crystal with the frequency within 9990000 Hz-9995000 Hz is selected for being coated; Apiezion H grease is adopted as laminating of the sticky quartz crystal for carrying out coating, the frequency of the quartz crystal is monitored in the coating process, the frequency difference of the quartz crystal before and after coating is carried out is about 2 MHz, coating is finished, a Q value, resonance impedance and dynamic capacity of the quartz crystal are detected, and if the Q value, the resonance impedance and the dynamic capacity meet the technical indexes, the quartz crystal can be applied to the sticky quartz crystal probe.
Description
Technical field
The present invention relates to space environment dust field of measuring technique, be specifically related to a kind of lunar dust measuring instrument viscous quartz crystal (SQCM) and pop one's head in coating method.
Background technology
Lunar dust measuring instrument is the engineering parameter measurement device on lunar exploration the second stage of the project CE-3 lander, is now transmitted into moonscape, just at operation on orbit.Lunar dust measuring instrument comprises two probes, a SQCM probe, and one is solar cell probe.SQCM probe is main measures the special moon dust quantity of menology long-term lunar dust accumulation, the change of monitoring lunar dust mass accumulation; The moon dust quantity splashed during solar cell probe main measurement lander landing menology.Utilize SQCM probe measurement menology accumulation lunar dust to tire out, still belong to the first time in the world.Play vital effect in the development process of lunar dust measuring instrument SQCM probe coating method for lunar dust measuring instrument, coating process and oscillating circuit are two key technology difficult problems of lunar dust measuring instrument.In development process, attempted multiple coating process method, as evaporation coating method, lacquering technique, infusion process, spraying process and rolling brush coating method etc., but all unsuccessful.Such as:
Evaporation coating method: vacuum grease is placed on heating evaporation in vacuum environment, condensation, in strand DNA on Surface of Quartz crystal, forms adhesive membrane.The method, film is even, but the adhesive film of film loses original performance, and the adhesive film of coating can not meet instructions for use.
Lacquering technique: by easy for vacuum grease volatile organic solvent, make the solution of certain solubility, drop in the surface of quartz crystal, by rotating quartz crystal, makes solution be distributed in strand DNA on Surface of Quartz crystal, after solvent volatilizees naturally, forms adhesive film.The thickness of the adhesive film of the coating of the method radially distributes, and surrounding is thick, intermediate thin.
Infusion process: by easy for vacuum grease volatile organic solvent, make the solution of certain solubility, by quartz crystal dipping in the solution, after taking out solvent volatilization, obtains adhesive film.By controlling speed and the solution concentration of dipping, controlled the thickness of adhesive film.But to the bad control in the region of film.
Spraying process: by easy for vacuum grease volatile organic solvent, make the solution of certain solubility, utilizes spray gun spraying to the surface of quartz crystal, forms adhesive film after equal solvent volatilization.The spraying area of the method and the bad control of coating thickness.
Rolling brush coating method: be coated to by vacuum grease on cylinder, is coated to strand DNA on Surface of Quartz crystal by cylindrical rolling by grease.The method, bad control thickness.
Summary of the invention
In view of this, the invention provides a kind of lunar dust measuring instrument viscous quartz crystal probe coating method, vacuum grease can be applied on quartz crystal, and the viscous quartz crystal formed after film can be used in lunar dust measurement.
Lunar dust measuring instrument viscous quartz crystal probe coating method of the present invention, comprises the steps:
Step 1, is fixed on quartz crystal on fixture, adopts benzinum to clean quartz crystal;
Step 2, carries out no load test to quartz crystal: test quartzy crystal parallel resonance frequency with quartz crystal Network Analyzer; If test frequency is not within the scope of 9990000Hz ~ 9995000Hz, repeat step 1, after three cleanings, frequency does not reach requirement, changes quartz crystal; Test frequency is within the scope of 9990000Hz ~ 9995000Hz, recording frequency value, is designated as quartz crystal frequency before film;
Step 3, film;
Step 3.1, after gluing Apiezion H fat with cotton swab, on clean sheet glass, examination applies, and forms a facet in cotton swab end;
Step 3.2, adopt the examination coating cotton swab of step 3.1, quartz crystal evenly smears, and institute's film must cover upper electrode surface; Monitor quartz crystal frequency with Network Analyzer in coating process, if the frequency difference of the forward and backward quartz crystal of film is greater than 20500Hz, then glues the Apiezion H fat fewer than upper secondary amounts with a clean cotton swab and repeat 3.1 and 3.2; If the frequency difference of the forward and backward quartz crystal of film is less than 19500Hz, then glues the Apiezion H fat more than upper secondary amounts with a clean cotton swab and repeat 3.1 and 3.2; Until when the frequency difference of the forward and backward quartz crystal of film is within the scope of (20000 ± 500) Hz, stop coating, recording frequency value, be designated as quartz crystal frequency after film;
Step 3.3, under natural daylight, visually observes, and requires film surface free from admixture, spot, and institute's film covers upper electrode surface;
Step 4, carries out film properties detection: by quartz crystal Network Analyzer test quartz crystal Q value, resonance impedance and dynamic capacity, and judge whether quartz crystal meets following technical indicator: after film, quartz crystal Q value is greater than 1000; After film, Quartz crystal resonant impedance is less than 300 Ω; Quartz crystal dynamic capacity after film: be greater than 40fF, as met, then after film, quartz-crystal physical efficiency is used for lunar dust measuring instrument, otherwise, repeat step 1.
Beneficial effect:
(1) the inventive method solves the film problem that lunar dust measuring instrument SQCM pops one's head in, and the viscous quartz crystal formed after film can be used in lunar dust and measures, for lunar dust measuring instrument Orbital detection realizes providing the foundation.
(2) first the present invention adopts benzinum to clean quartz crystal, and petroleum ether dissolution is good, and after cleaning, benzinum can volatilize very soon, can not remain.
(3) number of times of restriction to quartz crystal cleaning, to prevent the damage to quarts crystal electrode in cleaning process.Because the certainty of measurement of viscous quartz crystal probe is high, therefore need to detect the parallel resonance frequency of quartz crystal after cleaning, require that it is within the scope of 9990000Hz ~ 9995000Hz, thus reach probe measurement precision.Also need quartz crystal can stablize starting of oscillation in oscillating circuit simultaneously.
(4) select Apiezion H fat as the overlay film of viscous quartz crystal, it can the instructions for use of meeting spatial environment, comprise Nonmetal materials for satellite to give vent to anger index, ultraviolet irradiation index and high energy particle irradiation index etc., and reliable and stablely can open the requirement of shaking and measuring range after this fat of quartz crystal film can be met.
(5) in the process of smearing, monitor the frequency of quartz crystal, the frequency difference of the quartz crystal before and after making to smear is about 2MHz, thus makes the quartz crystal after smearing can reach the index request of measurement category, and not easily failure of oscillation.
(6), when smearing, first carry out examination coating with cotton swab, after Apiezion H fat is even on cotton swab, then be coated on quartz crystal, like this, the problem of the uneven thickness formed when can effectively prevent from directly applying.
Accompanying drawing explanation
Fig. 1 is SQCM of the present invention probe adhesive film film position view.
Fig. 2 is film flow chart of the present invention.
Fig. 3 is adhesive film material hot vacuum environment test temperature curve of the present invention.
Detailed description of the invention
To develop simultaneously embodiment below in conjunction with accompanying drawing, describe the present invention.
The invention provides a kind of lunar dust measuring instrument viscous quartz crystal probe coating method, specifically comprise the steps:
Step 1, is fixedly mounted on quartz crystal in film frock as shown in Figure 1.
Step 2, cleans quartz crystal.
Because benzinum volatility is good, dissolubility is good, do not remain after adopting benzinum to clean, therefore, select benzinum to clean quartz crystal.Infiltrate cotton swab with benzinum, by position, viscous quartz germ nucleus, cotton swab is rotated in a clockwise direction cleaning strand DNA on Surface of Quartz crystal; Change clean cotton swab in triplicate; In cleaning process, firmly gently and evenly, in case crush quartz crystal.After cleaning, leave standstill 3 minutes, wait for benzinum volatilization.
Step 3, carries out no load test to quartz crystal.
Because the certainty of measurement of viscous quartz crystal probe is high, require that the reference frequency of quartz crystal reaches 10MHz, what adopt due to the present invention is the benchmark quartz crystal of parallel resonance simultaneously, general is all be positioned at below 10MHz, therefore, require that the quartz crystal frequency after cleaning is within the scope of 9990000Hz ~ 9995000Hz.2 pins of the quartz crystal after cleaning are inserted in quartz crystal Network Analyzer socket, tests quartzy crystal parallel resonance frequency with quartz crystal Network Analyzer; Test frequency, not within the scope of 9990000Hz ~ 9995000Hz, repeats step 2, and after three cleanings, frequency is arrived requirement, changes quartz crystal (this is because wash number too much may cause the electrode of quartz crystal to be dissolved).When test frequency reaches within the scope of 9990000Hz ~ 9995000Hz, show that this quartz crystal meets the requirements, record its frequency values, then test the quartz crystal after cleaning with quartz crystal Network Analyzer and record following items: quartz crystal Q value; Quartz crystal resonant impedance and quartz crystal dynamic capacity, technical requirement is had for the Q value of viscous quartz crystal of lunar dust detection, resonance impedance and dynamic capacity, generally speaking, quartz crystal all can reach requirement, after film, the performance of quartz crystal can significantly reduce, therefore, the Q value of quartz crystal after film, resonance impedance and dynamic capacity is also needed to test.
Step 4, film.
Consider the high vacuum of lunar dust measuring instrument viscous quartz crystal probe work, the space environment of high radiation, select Apiezion H fat as the overlay film of quartz crystal.
Step 4.1, glue a little Apiezion H fat with cotton swab, on clean sheet glass, examination coating, forms a facet in cotton swab end, thus Apiezion H fat is evenly distributed in cotton swab end, when being conducive to film by Apiezion H fat equably film on quartz crystal.
Step 4.2, adopt the examination coating cotton swab of step 4.1, quartz crystal evenly smears, and institute's film must cover upper electrode surface.In coating process, monitor quartz crystal frequency with Network Analyzer.Require that before and after coating, quartz crystal frequency difference is within the scope of (20000 ± 500) Hz, this scope is required to determine by the range of lunar dust measuring instrument viscous quartz crystal probe, if quartz crystal frequency difference is less than 19500Hz before and after coating, then can not meet lunar dust measuring instrument measuring amount range request, if quartz crystal frequency difference is greater than 20500Hz before and after coating, then the oscillation damping of quartz crystal can increase, easy failure of oscillation.
Before and after coating, quartz crystal frequency difference is greater than 20500Hz, then glue the Apiezion H fat fewer than upper secondary amounts with a clean cotton swab and repeat 4.1 and 4.2; Before and after coating, quartz crystal frequency difference is less than 19500Hz, then glue the Apiezion H fat more than upper secondary amounts with a clean cotton swab and repeat 4.1 and 4.2; Until quartz crystal frequency difference, within the scope of (20000 ± 500) Hz, stops coating, recording frequency value before and after coating.
Step 4.3, under natural daylight, visually observes, and requires film surface free from admixture, spot, and institute's film covers upper electrode surface.
Step 5, carries out film properties detection.
By the Q value of quartz crystal, resonance impedance and dynamic capacity after quartz crystal Network Analyzer test film, the requirement requiring the quartz crystal after film to meet lunar dust to detect, the Q value of the quartz crystal namely after film should be greater than 1000; Quartz crystal resonant impedance should be less than 300 Ω; Quartz crystal dynamic capacity should be greater than 40fF.
Require that adhesive film material does hot vacuum environment test, experiment condition is, vacuum :≤1.3 × 10
-3pa; Insulation forward horizontal stand 0.5h; Test period is 22h10min.After test, Apiezon H vacuum grease film still has test lunar dust function, refers to Fig. 3.
Require that adhesive film material does VUV Irradiation test, experiment condition is, vacuum :≤1.3 × 10
-3pa, irradiation spectrum: 200nm ~ 400nm, total irradiation: > 48.4 kilocalories/cm
2, the test period: 25 days.After test, Apiezon H vacuum grease film still has test function.
Require that adhesive film material does the test of 60Co gamma-ray irradiation, experiment condition is, close rate: 1 × 10
5rad (Si)/h; Absorb accumulated dose: 1.0 × 10
6rad (Si).After test, Apiezon H vacuum grease film still has test function.
Require that vacuum matter damages test, result of the test requires that TML is less than 1%, CVCM and is less than 0.1%.
Provide a concrete example below:
Step 1, is arranged on (frock number: SQCM01) in film frock by quartz crystal by Fig. 1, fixes with 3-M2 × 10 screw.
Step 2, cleaning.Infiltrate cotton swab with benzinum, by position, viscous quartz germ nucleus, cotton swab is rotated in a clockwise direction cleaning strand DNA on Surface of Quartz crystal; Change clean cotton swab in triplicate; Attention: in cleaning process, firmly gently and evenly, in case crush quartz crystal.After cleaning, leave standstill 3 minutes.
Step 3, no load test.Quartz crystal (being arranged in film frock) 2 pins are inserted in quartz crystal Network Analyzer socket, test following items: quartz crystal parallel resonance frequency: 9994747Hz; Quartz crystal Q value; 37K; Quartz crystal resonant impedance; 10.3 Ω; Quartz crystal dynamic capacity: 9.3pF.
Step 4, film.
Step 4.1, examination coating.Glue a little Apiezion H fat with cotton swab, on clean sheet glass, examination coating, forms a facet in cotton swab end.
Step 4.2, coating.With 4.1 examination coating cotton swabs, shown in Fig. 1, region evenly smears, and institute's film must cover upper electrode surface.Quartz crystal frequency change is monitored in coating process.
Step 4.3, test.Quartz crystal frequency is tested, quartz crystal frequency 9970422Hz with Network Analyzer.
Step 4.4, then apply.Difference frequency is 24325Hz, and glue the Apiezion H fat fewer than upper secondary amounts with a clean cotton swab and repeat 4.1 and 4.2, test frequency value is 9975605Hz; Glue the Apiezion H fat more than upper secondary amounts with a clean cotton swab again and repeat 4.1 and 4.2, test frequency value is 9974480Hz.Stop coating, recording frequency value.
Step 4.5, post processing.Under natural daylight, visually observe, require film surface free from admixture, spot, institute's film covers upper electrode surface.
Step 5, film properties detects.By quartz crystal Q value, resonance impedance, dynamic capacity after quartz crystal Network Analyzer test film, and record.Require as follows: the forward and backward parallel resonance frequency of quartz crystal film is poor: 20267Hz; Quartz crystal Q value: 10K; Quartz crystal resonant impedance: 40.4 Ω; Quartz crystal dynamic capacity: 27.2fF.
Step 6, post processing.
Step 6.1, takes pictures.Take pictures to quartz crystal coated surface with digital camera, shooting angle is respectively:
A. one, panorama directly over;
B. oblique 45 ° of four positive directions respectively clap one;
C. file after shooting.
Step 6.2, disassembling fixture.Remove film frock by Fig. 1, the quartz crystal after film is arranged in lunar dust measuring instrument SQCM probe.
In sum, these are only preferred embodiment of the present invention, be not intended to limit protection scope of the present invention.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (1)
1. a lunar dust measuring instrument viscous quartz crystal probe coating method, is characterized in that, comprise the steps:
Step 1, is fixed on quartz crystal on fixture, adopts benzinum to clean quartz crystal;
Step 2, carries out no load test to quartz crystal: test quartzy crystal parallel resonance frequency with quartz crystal Network Analyzer; If test frequency is not within the scope of 9990000Hz ~ 9995000Hz, repeat step 1, after three cleanings, frequency does not reach requirement, changes quartz crystal; Test frequency is within the scope of 9990000Hz ~ 9995000Hz, recording frequency value, is designated as quartz crystal frequency before film;
Step 3, film;
Step 3.1, after gluing Apiezion H fat with cotton swab, on clean sheet glass, examination applies, and forms a facet in cotton swab end;
Step 3.2, adopt the examination coating cotton swab of step 3.1, quartz crystal evenly smears, and institute's film must cover upper electrode surface; Monitor quartz crystal frequency with Network Analyzer in coating process, if the frequency difference of the forward and backward quartz crystal of film is greater than 20500Hz, then glues the Apiezion H fat fewer than upper secondary amounts with a clean cotton swab and repeat 3.1 and 3.2; If the frequency difference of the forward and backward quartz crystal of film is less than 19500Hz, then glues the Apiezion H fat more than upper secondary amounts with a clean cotton swab and repeat 3.1 and 3.2; Until when the frequency difference of the forward and backward quartz crystal of film is within the scope of (20000 ± 500) Hz, stop coating, recording frequency value, be designated as quartz crystal frequency after film;
Step 3.3, under natural daylight, visually observes, and requires film surface free from admixture, spot, and institute's film covers upper electrode surface;
Step 4, carries out film properties detection: by quartz crystal Network Analyzer test quartz crystal Q value, resonance impedance and dynamic capacity, and judge whether quartz crystal meets following technical indicator: after film, quartz crystal Q value is greater than 1000; After film, Quartz crystal resonant impedance is less than 300 Ω; Quartz crystal dynamic capacity after film: be greater than 40fF, as met, then after film, quartz-crystal physical efficiency is used for lunar dust measuring instrument, otherwise, repeat step 1.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108333076A (en) * | 2017-12-25 | 2018-07-27 | 兰州空间技术物理研究所 | A kind of room atmosphere surface density detection sensor and preparation method thereof |
| CN114674917A (en) * | 2022-03-25 | 2022-06-28 | 兰州空间技术物理研究所 | Lunar dust deposition quality in-situ detector and manufacturing method thereof |
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| CN101693598A (en) * | 2009-10-13 | 2010-04-14 | 中国航天科技集团公司第五研究院第五一〇研究所 | Process for preparing adhesive film |
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