CN104422903B - Debugging system and method for the sensor using SPUID - Google Patents
Debugging system and method for the sensor using SPUID Download PDFInfo
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Abstract
The present invention provides a kind of debugging system and method for being used to use the sensor of SPUID, at least includes：The digital voltage converter being connected with the reading circuit and SPUID, for external power supply to be converted into the bias voltage of SPUID and the offset voltage of reading circuit respectively；With the test signal input of the reading circuit, output end and the connected regulation device of digital voltage converter, for the cycle of the signal inputted based on the test signal input, detect the induced signal with the cycle that the output end is exported, and therefrom determine voltage peak-to-peak value and DC offset voltage in the cycle, the comparative results of two voltage peak-to-peak values based on adjacent detection progressively adjusts the bias voltage that the digital voltage converter is exported, and control the digital voltage converter to be adjusted to the offset voltage exported to offset identified offset voltage, realize that the automatic debugging of superconducting quantum interference device and its reading circuit running parameter is set.
Description
Technical field
It is used for the debugging system and method for the sensor using SPUID the present invention relates to a kind of.
Background technology
Using SPUID（Superconducting Quantum Interference Device, below
Abbreviation SQUID）Sensor be the most sensitive Magnetic Sensor being currently known.Due to its nonlinear characteristic and output voltage is extremely
It is faint（Within tens microvolts）The reason for, sensor can not judge the size in magnetic field by output voltage directly by detecting.
This make it that the uniformity and repeatability of sensor are poor.Device in the problems such as additionally, due to technology stability, different sensors
Running parameter it is also different.Therefore each device will independent tuning parameter.
Wherein, including in the sensor：SPUID（SQUID）And reading circuit.
SQUID is one by two Josephson junctions（The PN junction of similar semiconductor）The SPUID of composition,
When adding certain bias current to SQUID two ends, bias current arrives greatly certain value（10uA magnitudes）When, just show magnetic susceptibility
Characteristic, the i.e. voltage at SQUID two ends can change with the magnetic flux being carried in above it, referred to as magnetic flux voltage transfer characteristic, when
Now most sensitive when magnetic flux voltage transfer characteristic reaches most strong, this bias current now is referred to as recommended current, is also
This debugging system key parameter to be adjusted.In actual applications, SQUID this operating current is by an external load
Voltage source drive the big resistance connected with SQUID come what is produced, therefore, outside need loads this voltage source and is referred to as partially
Voltage is put, bias voltage correspondence produces bias current.
The function of reading circuit part is that the voltage signal at SQUID two ends is detected and amplified, and is sent to integrator and passes through product
Divide the mode of feedback（Magnetic flux locking principle）Realize the linear transformation of magnetic flux voltage.The requirement of this circuit theory is sent at operating point
The voltage for entering integrator is zero.And DC offset is carried in SQUID output voltages, therefore when sending into integrator input,
Contain DC offset voltage, it is therefore desirable to by a subtraction zeroing circuit, i.e., input an offset voltage, two from the outside
Voltage subtracts each other, and this DC offset voltage is eliminated, and meets the requirement of reading circuit work.Therefore this of external load is used for
Eliminate the zeroing voltage of DC quantity at SQUID device operating point, referred to as offset voltage.This is in order to needed for circuit energy normal work
Parameter.
At present, using the sensor of SPUID using preceding needing to be familiar with the professional of sensor characteristics
The debugging of parameter is accomplished manually, artificial parameter debugs the sensor, and not only precision is low, and will be in device before putting into operation
The time is expended in parameter testing so that system effectiveness is limited.Specifically, professional is mainly in the debugging mode of the sensor
Get off bias voltage described in manual debugging and offset voltage.
The application for the multi-channel system being made up of multiple superconductive quantum interference sensors is more and more wider, such as 64 passage heart magnetic systems
The SQUID detection array systems of system, the brain magnetic system of 200 passages, and astronomical observation application.In multi-channel system, it is necessary to
Sensor on each passage of manual debugging.Manual debugging needs the professional and technical personnel for being familiar with SQUID characteristics in external instrument
Such as oscillograph, under the auxiliary of signal generator etc., debug circuit parameter, sensor best effort is realized by artificial cognition one by one
The debugging of parameter.As can be seen here, the time spent by manual debugging will greatly increase with the increase of port number, as system
An obstacle during use, while manual debugging, the requirement of the professional technique in terms of SQUID device to commissioning staff
Height, is unfavorable for the popularization of SQUID systematic differences.
Accordingly, it would be desirable to improve debugging efficiency and precision of the sensor before use, shorten the time that sensor puts into operation,
The dependence to SQUID professionals is eliminated, the barrier of the popularization of SQUID applications is eliminated.
The content of the invention
The shortcoming of prior art, is used to do using Superconducting Quantum it is an object of the invention to provide one kind in view of the above
The debugging system and method for the sensor of device are related to, for solving debugging of the sensor before use in the prior art to professional people
The problem of dependency degree of member is too high.
In order to achieve the above objects and other related objects, the present invention provides a kind of be used for using SPUID
The debugging system of sensor, the sensor includes：SPUID and it is connected with the SPUID
Reading circuit, the debugging system at least includes：The numeral electricity being connected with the reading circuit and SPUID
Pressure converter, bias voltage and reading electricity for external power supply to be converted into the SPUID respectively
The offset voltage on road；The regulation and control being connected with the test signal input, output end of the reading circuit and digital voltage converter
Device, for the cycle of the signal inputted based on the test signal input, what the detection output end was exported has
The induced signal in the cycle, and voltage peak-to-peak value and offset voltage in the cycle are therefrom determined, based on adjacent detection
The comparative result of two voltage peak-to-peak values progressively adjusts the bias voltage that the digital voltage converter is exported, and controls
The digital voltage converter is made to be adjusted to the offset voltage exported to offset the offset voltage of identified offset voltage.
Preferably, the regulation device includes：The test signal being connected with the test signal input of the reading circuit
Generation module, the test signal of alternation is generated for the magnetic flux cycle according to the Superconducting Quantum, and is exported to the test letter
Number input；The sampling module being connected with the output end of the reading circuit, crosses for the cycle based on the test signal and adopts
The magnitude of voltage for the induced signal that output end described in sample is exported；The tune being connected with the test signal generator and sampling module
Unit is controlled, including：
The computing module being connected with the sampling module, for being extracted most from each magnitude of voltage for a cycle sampled
Big magnitude of voltage and minimum amount of voltage that, and the difference of the maximum voltage value and minimum amount of voltage that is defined as the voltage peak-to-peak value,
The half of maximum voltage value and minimum amount of voltage that sum is defined as the offset voltage；First be connected with the computing module
Regulate and control module, for two voltage peak-to-peak values of relatively more identified adjacent detection, in the latter voltage peak-to-peak value
During more than the previous voltage peak-to-peak value, the biased electrical after the default step-length of digital voltage converter output increase is controlled
Pressure, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting institute
State the bias voltage of digital voltage converter output.
Preferably, the first regulation and control module is additionally operable to be less than the previous voltage in the latter voltage peak-to-peak value
During peak-to-peak value, on the basis of the default step-length, halved on the basis of previous step-length, and control the digital voltage
Converter exports the bias voltage after the step-length after halving, until being more than or equal in the latter voltage peak-to-peak value previous
During the individual voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage of the digital voltage converter output.
Preferably, the first regulation and control module is additionally operable to described more than or equal to previous in the latter voltage peak-to-peak value
During voltage peak-to-peak value, halved on the basis of previous step-length, and control the digital voltage converter current inclined
Putting increases the step-length after this halves on the basis of voltage and is exported, until when the latter voltage peak-to-peak value is less than etc.
When the previous voltage peak-to-peak value, the digital voltage converter is controlled to reduce this on the basis of current bias voltage
Step-length after halving simultaneously is exported, so repeatedly, until this step-length after halving is less than or equal to default step-length threshold value,
Then determine no longer to adjust the bias voltage that the digital voltage converter is exported.
Preferably, the debugging system also includes：The controlled source switch being connected with extraneous power supply, in the regulation and control
Unit starts to close during debugging, determines no longer to adjust the bias voltage of the digital voltage converter output in the regulation and control unit
Disconnect.
Preferably, the regulation and control unit also includes：The second regulation and control module being connected with the computing module, if for institute really
Fixed offset voltage is more than default smallest offset voltage, then the offset voltage exported the digital voltage converter is adjusted
The offset voltage of offset voltage determined by offsetting, conversely, then not adjusting.
Based on above-mentioned purpose, the present invention also provides a kind of debugging side for being used to use the sensor of SPUID
Method, wherein, the external bias voltage of sensor and offset voltage at least include：Based on the signal for inputting the sensor
In the cycle, the induced signal with the cycle that the sensor is exported is detected, and therefrom determine the voltage in the cycle
Peak-to-peak value and offset voltage；The comparative result of two voltage peak-to-peak values based on adjacent detection is external progressively to adjust
Bias voltage；External offset voltage is adjusted to the inverse value of identified offset voltage or identified offset voltage.
Preferably, the step of voltage peak-to-peak value and the offset voltage in the cycle are determined from the induced signal detected
Including：Based on the cycle for the signal for inputting the sensor, the magnitude of voltage for the induced signal that sensor described in over-sampling is exported；
Extract maximum voltage value and minimum amount of voltage that from each magnitude of voltage for a cycle sampled, and by the maximum voltage value with
The difference of minimum amount of voltage that is defined as the voltage peak-to-peak value, and the half of maximum voltage value and minimum amount of voltage that sum is defined as into institute
State offset voltage.
Preferably, the mode for progressively adjusting external bias voltage includes：Compare described in two of adjacent detection
Voltage peak-to-peak value, when the latter voltage peak-to-peak value is more than the previous voltage peak-to-peak value, by external bias voltage
The default step-length of increase, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, it is determined that
No longer adjust external bias voltage.
Preferably, the mode for progressively adjusting external bias voltage also includes：In the latter voltage peak-to-peak value
During less than the previous voltage peak-to-peak value, on the basis of the default step-length, halved on the basis of previous step-length,
And the sensor is transported to after the step-length after external bias voltage is halved, until big in the latter voltage peak-to-peak value
When equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage.
Preferably, the mode for progressively adjusting external bias voltage also includes：At the latter Voltage Peak peak
When value is more than or equal to the previous voltage peak-to-peak value, halved on the basis of previous step-length, by external bias voltage
Increase the step-length after this halves and transport to the sensor, until when the latter voltage peak-to-peak value is less than or equal to previous
During the voltage peak-to-peak value, external bias voltage is reduced into the step-length after this halves and exported；So repeatedly, until originally
It is secondary halve after step-length be less than or equal to default step-length threshold value, it is determined that no longer adjust the inclined of digital voltage converter output
Put voltage.
Preferably, the mode for progressively adjusting external offset voltage includes：If identified offset voltage is more than
External offset voltage, then be adjusted to offset the offset voltage of identified offset voltage by default smallest offset voltage,
Conversely, then not adjusting.
Preferably, the adjustment method also includes：The sensor is controlled by current shape based on extraneous Start-up and Adjustment signal
State switchs to debugging mode；And when it is determined that no longer adjusting the bias voltage, control the sensor to be switched to by debugging mode
Working condition.
As described above, the debugging system and method that are used for the sensor using SPUID of the present invention, tool
There is following beneficial effect：In the outside adjustable digital voltage converter of access of sensor, and by regulation and control unit according to adjacent inspection
The comparison of the voltage peak-to-peak value of survey, adjusts the bias voltage of SPUID by the way of progressively adjusting, can
Effectively solve manual debugging brought it is inaccurate, time-consuming the problems such as, additionally it is possible to improve Adjustment precision, it is particularly suitable in multichannel
Sensor.
Brief description of the drawings
Fig. 1 is shown as the structural representation of the debugging system for being used for the sensor using SPUID of the present invention
Figure.
Fig. 2 is shown as one kind of the debugging system for being used for the sensor using SPUID of the present invention preferably
The structural representation of mode.
Fig. 3 is shown as one kind of the debugging system for being used for the sensor using SPUID of the present invention preferably
The structural representation of mode.
Fig. 4 is shown as the flow chart of the adjustment method for being used for the sensor using SPUID of the present invention.
Fig. 5 is shown as one kind of the adjustment method for being used for the sensor using SPUID of the present invention preferably
The flow chart of mode.
Fig. 6 be shown as the adjustment method for being used for the sensor using SPUID of the present invention another is excellent
Select the flow chart of mode.
Component label instructions
1 debugging system
11 digital voltage converters
12 regulation devices
121 sampling modules
122 computing modules
123 first regulation and control modules
124 second regulation and control modules
125 test signal generators
126 regulation and control units
13 controlled sources are switched
14 control units
2 sensors
21 SPUIDs
22 reading circuits
The controlled switch put 221 hilted broadswords more
222 reset controlled switch
S1~S3, S4, S5 step
Embodiment
Embodiments of the present invention are illustrated by particular specific embodiment below, those skilled in the art can be by this explanation
Content disclosed by book understands other advantages and effect of the present invention easily.
Fig. 1 is referred to Fig. 3.It should be clear that structure, ratio, size depicted in this specification institute accompanying drawings etc., is only used to
Coordinate the content disclosed in specification, so that those skilled in the art is understood with reading, being not limited to the present invention can be real
The qualifications applied, therefore do not have technical essential meaning, the tune of the modification of any structure, the change of proportionate relationship or size
It is whole, in the case where not influenceing effect of the invention that can be generated and the purpose that can reach, all should still it fall in disclosed skill
Art content is obtained in the range of covering.
As shown in figure 1, the present invention provides a kind of debugging system for being used to use the sensor of SPUID.Its
In, the sensor 2 includes：SPUID 21 and the reading circuit being connected with the SPUID 21
22。
Wherein, the reading circuit 22 has debugging function, as shown in Fig. 2 the integrating circuit in the reading circuit 22
Including：The controlled switch 221 put the hilted broadsword of open/close more, the controlled switch 221 put when the hilted broadsword more in open loop side,
Then the sensor 2 enters debugging mode, and the controlled switch 221 put when the hilted broadsword in closed loop side more, then the sensor 2
Into working condition.Integrating circuit in the reading circuit 22 also includes resetting controlled switch 222, and controlled open is resetted when described
When closing by 222 control closure, the integrating circuit is in reset state, conversely, the integrating circuit is in feedback states.Wherein,
The controlled switch 221 and reset controlled switch 222 put the hilted broadsword can be controlled more by outside computer equipment.It is preferred that
Ground, the debugging system 1 includes control unit 14.
Described control unit 14 is connected with the control end of the reading circuit 22, for based on the Start-up and Adjustment letter received
Number come to the control end output switching signal, to make the reading circuit 22 enter debugging mode.
Specifically, the control end is the controlled switch 221 the put hilted broadsword more and resets the control of controlled switch 222 and connect
Mouthful.When described control unit 14 is received from the Start-up and Adjustment signal that external computer device is sent, to the control end
The interface output for the controlled switch 221 put middle hilted broadsword closes the controlled switch 221 put the hilted broadsword to open loop feedback direction more more
The switching signal of conjunction, while the interface of the reset controlled switch 222 into the control end is exported the reset controlled switch
222 switching signals disconnected, thus, the reading circuit enters debugging mode.
The debugging system 1 is automatically debugged when the sensor 2 is in debugging mode to the sensor 2,
So that the sensor 2 being capable of normal work.
The debugging system 1 includes：Digital voltage converter 11, regulation device 12.
The digital voltage converter 11 is connected with the reading circuit 22 and SPUID 21, for by outside
The power supply connect is converted into the bias voltage of the SPUID 21 and the offset voltage of the reading circuit 22 respectively.
Wherein, the bias voltage and offset voltage during the debugging can empirically set initial value, and the initial value can be zero,
Can also empirically with far below 2 normal work of sensor when required relevant voltage preset.The digital voltage
Converter 11 is also connected with extraneous power supply, while being also connected with the regulation and control unit 12.
Test signal input, output end and digital voltage converter of the regulation device 12 with the reading circuit 22
11 are connected, for the cycle of the signal inputted based on the test signal input, detect the tool that the output end is exported
There is the induced signal in the cycle, and therefrom determine voltage peak-to-peak value and offset voltage in the cycle, based on adjacent detection
The comparative results of two voltage peak-to-peak values progressively adjust the bias voltage that the digital voltage converter 11 is exported,
And control the digital voltage converter 11 to be adjusted to the offset voltage exported to offset the skew of identified offset voltage
Voltage.Wherein, the regulation device 12 is the circuit of the chip comprising analog device, analog-digital converter and with disposal ability.
Specifically, the regulation device 12 inputs the three of predetermined period to the test signal input of the reading circuit 22
Angle ripple signal, the SPUID 21 is exported under the sensing of the triangular signal by the reading circuit 22
With the cycle identical induced signal of the triangular signal, the regulation device 12 is terminated from the output of the reading circuit 22
Receive the induced signal, and utilize included analog circuit detect in a cycle the voltage peak-to-peak value of the induced signal and
The offset voltage of the reading circuit 22, since the second period detected, when identified previous voltage peak-to-peak value is small
Give again after equal to latter voltage peak-to-peak value, then controlling the digital voltage converter 11 that bias voltage is increased to default step-length
Output, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting described
The bias voltage that digital voltage converter 11 is exported, meanwhile, the digital voltage converter 11 is controlled by the skew exported electricity
Pressure is changed to the inverse value of currently determined offset voltage or identified offset voltage, and the digital voltage converter 11 will be adjusted
Offset voltage after whole is transported in the zeroing circuit in the reading circuit 22, is thus produced to offset in the reading circuit 22
Offset voltage.Wherein, the zeroing circuit can be adder or subtracter.
For example, the bias voltage that the digital voltage converter 11 is exported is 0, offset voltage is 0, then the regulation and control dress
12 induced signals for passing through two cycles of detection are put, the voltage peak-to-peak value and skew electricity of the induced signal in described two cycles is determined
Pressure is also 0, then controls the digital voltage converter 11 to be adjusted to bias voltage（0+L）, wherein, L is default step-length,
The output of the digital voltage converter 11 0v offset voltages are still made simultaneously；Then, exported partially in the digital voltage converter 11
When putting voltage L and offset voltage 0, the regulation device 12 detects the induced signal of a cycle again, and determines current period
Voltage peak-to-peak value be a1, offset voltage a2, wherein, a1>0, by comparing, the voltage peak-to-peak value in the previous cycle detected
a0<（It is less than）The voltage peak-to-peak value a1 in latter cycle, then control the digital voltage converter 11 to be adjusted to bias voltage（a1
+L）, and control the digital voltage converter 11 that offset voltage is adjusted into-a2, by that analogy, until the latter institute detected
Voltage peak-to-peak value is stated less than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting what the digital voltage converter 11 was exported
Bias voltage, meanwhile, control the digital voltage converter 11 that the offset voltage exported is changed to currently determined skew
The inverse value of voltage.
Preferably, as shown in figure 3, the regulation device 12 includes：Test signal generator 125, sampling module 121,
Regulate and control unit 126,.Wherein, the regulation and control unit 126 includes：The regulation and control regulation and control mould of module 123 and second of computing module 122, first
Block 124.Wherein, the debugging unit automatically, can carry out big numerical quantity meter at high speed to be a kind of according to the program being previously stored
The modernization intelligent electronic device with various information processings is calculated, and can be entered with test signal generator 125, sampling module 121
Row data transfer, its hardware includes but is not limited to microprocessor, FPGA, DSP, embedded device etc..
The test signal generator 125 is connected with the test signal input of the reading circuit 22, for according to
The magnetic flux cycle of the Superconducting Quantum generates the test signal of alternation, and exports to the test signal input.
Specifically, the test signal generator 125 is produced loads flux quantum satisfaction on SQUID：Φ0=2.07*
10-15Wb cycle magnetic flux is as test signal, to detect SQUID induced signal.Wherein, the test signal is preferably
Triangular signal.
The sampling module 121 is connected with the output end of the reading circuit 22, for based on test signal input
The magnitude of voltage for the induced signal that output end described in the inputted cycle over-sampling in end is exported.
Specifically, the sampling module 121 is sample circuit, according to the test signal input institute of the reading circuit 22
More than 8 times of the cycle of the triangular signal of input（Or 16 times, 24 times etc.）, the sensing letter that the reading circuit 22 is exported
Number over-sampling is carried out, and preserve each magnitude of voltage sampled in a cycle.
The computing module 122 is connected with the sampling module 121, for each magnitude of voltage from a cycle sampled
Middle extraction maximum voltage value and minimum amount of voltage that, and the difference of the maximum voltage value and minimum amount of voltage that is defined as the voltage
Peak-to-peak value, the offset voltage is defined as by the half of maximum voltage value and minimum amount of voltage that sum.Wherein, the computing module
122 can be MCU（Micro-control unit）Or the computing circuit comprising arithmetic unit.
The first regulation and control module 123 is connected with the computing module 122, and two for relatively more identified adjacent detection
The individual voltage peak-to-peak value, when the latter voltage peak-to-peak value is more than the previous voltage peak-to-peak value, controls the number
Bias voltage after the default step-length of the output increase of word electric pressure converter 11, until the latter voltage peak-to-peak value is less than etc.
When the previous voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage that the digital voltage converter 11 is exported.
The second regulation and control module 124 is connected with the computing module 122, if being more than for identified offset voltage pre-
If smallest offset voltage, then the offset voltage exported the digital voltage converter 11 be adjusted to offset determined by partially
The offset voltage of voltage is moved, conversely, then not adjusting.
Wherein, the first regulation and control module 123 and the second regulation and control module 124 may be mounted in a MCU, also may be used
To be realized by multiple MCU.
For example, the sampling module 121 is (n-1) individual and 12 institutes of reading circuit 22 that sampled in n-th of cycle
The magnitude of voltage of the induced signal of output, and sampled 12 magnitudes of voltage are transported into the computing module 122, the computing module
122 therefrom extract maximum voltage value and minimum amount of voltage that, and substitute into formula respectively：Vpp=（Vmax–Vmin）With Vdc=（Vmax+
Vmin）/ 2, to obtain the voltage peak-to-peak value Vpp (n-1) and offset voltage Vdc (n- of induced signal in (n-1) the individual cycle
1) the voltage peak-to-peak value Vpp (n) and offset voltage Vdc (n) of induced signal, and in n-th of cycle, wherein, Vpp is institute
Voltage peak-to-peak value in the cycle of sampling, Vmax is the maximum voltage value in cycle for being sampled, and Vmin is cycle for being sampled
Interior minimum amount of voltage that, Vdc is the offset voltage in cycle for being sampled；
Then, Vpp (n), Vpp (n-1) are compared by the first regulation and control module 123, if Vpp (n)>Vpp (n-1),
Then control the digital voltage converter 11 by current bias voltage improve to（a3+L）, done to transport to the Superconducting Quantum
Device 21 is related to, wherein, a3 is the bias voltage before adjustment, and L is default step-length；
At the same time, the second regulation and control module 124 judges whether Vdc (n) is more than default smallest offset voltage, if greatly
In the smallest offset voltage, then current offset voltage is adjusted to-Vdc (n), and the bag transported in the reading circuit 22
In zeroing circuit containing adder, conversely, then not adjusting.
It should be noted that it should be appreciated by those skilled in the art that the first regulation and control module 123 and second regulation and control module
124 can perform simultaneously, can also first carry out the second regulation and control module 124 and perform the first regulation and control module 123, Huo Zhexian again
Perform the first regulation and control module 123 and perform the second regulation and control module 124 again.
Preferably, the first regulation and control module 123 is additionally operable to described less than previous in the latter voltage peak-to-peak value
During voltage peak-to-peak value, on the basis of the default step-length, it will halve on the basis of previous step-length, and control the digital voltage
Converter 11 exports the bias voltage after the step-length subtracted after described halve, until be more than in the latter voltage peak-to-peak value etc.
When the previous voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage that the digital voltage converter 11 is exported.
Specifically, when the described first regulation and control module 123 is it is determined that the latter voltage peak-to-peak value is described less than previous
During voltage peak-to-peak value, it is meant that the bias voltage of SPUID 21 was adjusted, therefore, using the default step-length as base
Plinth, will halve on the basis of previous step-length, and control the digital voltage converter 11 to export the step subtracted after described halve
Bias voltage after length, with the anti-bias voltage for adjusting the SPUID 21, until the latter Voltage Peak peak
When value is more than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting the biased electrical that the digital voltage converter 11 is exported
Pressure.
For example, the bias voltage that the digital voltage converter 11 is exported is a4, the first regulation and control module 123 is true
When fixed presently described voltage peak-to-peak value Vpp (n) is less than previous voltage peak-to-peak value Vpp (n-1), step-length is adjusted to L/2,
Wherein, L is default step-length, then the bias voltage that the first regulation and control module 123 is exported the digital voltage converter 11
It is adjusted to（a4–L/2）, then, then obtain by sampling module 121 and computing module 122 the voltage peak-to-peak value Vpp in a new cycle
(n+1), as Vpp (n+1)<Vpp (n), then be adjusted to L/4 by step-length, then described first regulates and controls module 123 by the digital voltage
The bias voltage that converter 11 is exported is adjusted to（a4–L/2–L/4）, by that analogy, until voltage peak-to-peak value Vpp (n+i) >=
Vpp (n+i-1), then no longer adjust the bias voltage that the digital voltage converter 11 is exported.
It is further preferable that the first regulation and control module 123 be additionally operable to the latter voltage peak-to-peak value by less than or equal to
When the previous voltage peak-to-peak value switchs to the latter voltage peak-to-peak value more than or equal to the previous voltage peak-to-peak value,
Halved on the basis of previous step-length, and control the digital voltage converter to increase on the basis of current bias voltage
This step-length after halving simultaneously is exported, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage
During peak-to-peak value, the digital voltage converter is controlled to reduce the step-length after this halves simultaneously on the basis of current bias voltage
Exported, so repeatedly, until this step-length after halving is less than or equal to default step-length threshold value, it is determined that no longer adjust institute
State the bias voltage of digital voltage converter output.
For example, the first regulation and control module 123 is more than previous electricity in the initial debugging stage based on latter voltage peak-to-peak value
During voltage crest peak value, the bias voltage of the digital voltage converter is incrementally increased according to default step-length L, until latter described
When voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, bias voltage M is obtained, and using the default step-length as base
Standard, controls the digital voltage converter to be changed to the bias voltage of output (M-L/2), and judges that the step-length after being halved is big
In default step-length threshold value, and continue judgement and obtain the latter voltage peak-to-peak value by less than or equal to the previous Voltage Peak peak
During value, then the digital voltage converter is controlled to be changed to the bias voltage of output (M-L/2-L/4)...By that analogy；
Until judge the latter voltage peak-to-peak value more than or equal to the previous voltage peak-to-peak value, and after halving
Step-length L/ (2(n+1)) when being more than default step-length threshold value, control the digital voltage converter that the bias voltage of output is changed into (M-
L/2-L/4-…-L/(2n))+L/(2(n+1)), and continue to judge that the latter voltage peak-to-peak value is described more than or equal to previous
Voltage peak-to-peak value, and the step-length L/ (2 after halving(n+2)) when being more than default step-length threshold value, control the digital voltage converter will
The bias voltage of output is changed to (M-L/2-L/4- ...-L/ (2n))+L/(2(n+1))+L/(2(n+2))...By that analogy；
Until judge the latter voltage peak-to-peak value less than or equal to the previous voltage peak-to-peak value, and after halving
Step-length L/ (2(n+m+1)) when being more than default step-length threshold value, then control the digital voltage converter to be changed to the bias voltage of output
(M-L/2-L/4-…-L/(2n))+L/(2(n+1))+L/(2(n+2))+…+L/(2(n+m))-L/(2(n+m+1)), now, judge to obtain
L/(2(n+m+2)) it is less than or equal to default step-length threshold value, it is determined that no longer adjust the biased electrical of the digital voltage converter output
Pressure, then the bias voltage of the digital voltage converter output is (M-L/2-L/4- ...-L/ (2n))+L/(2(n+1))+L/(2(n +2))+…+L/(2(n+m))-L/(2(n+m+1)).Wherein, n is reduces the number of times of bias voltage, and m is the number of times of increase bias voltage.
As a kind of preferred scheme, as shown in figure 3, the debugging system 1 also includes：It is connected with the regulation device 12
Controlled source switch 13.
The controlled source switch 13 is connected with extraneous power supply, for being closed when the regulation device 12 starts debugging,
Determine no longer to adjust the bias voltage disconnection that the digital voltage converter 11 is exported in the regulation device 12.Wherein, it is described
Controlled source switch 13 can include d type flip flop and be switched by the d type flip flop control, can also be comprising NAND gate and by institute
State the switch of NAND gate control.
Specifically, the regulation device 12 is by external computer device control, when the external computer device controls institute
When stating regulation device 12 and starting debugging, high level are exported to controlled source switch 13, then the D in controlled source switch
Trigger（Or NAND gate）The corresponding switch closure of control, is powered with the active device into the regulation device 12, conversely, institute
State external computer device receive the regulation device 12 do not continue to debugging signal when, to the controlled source switch
13 output low levels, the then d type flip flop during the controlled source is switched（Or NAND gate）Control is switched off accordingly, is thus made
The regulation device 12 exits the debugging to the sensor 2.
The course of work of the regulator control system debugging sensor 2 is exemplified below：
When described control unit 14 is received from the Start-up and Adjustment signal that external computer device is sent, to the control
The controlled switch 221 put the hilted broadsword is fed back direction by the interface output for the controlled switch 221 put in end hilted broadsword more more to open loop
The switching signal of closure, while the interface output of the reset controlled switch 222 into the control end resets controlled open by described
222 switching signals disconnected are closed, thus, the reading circuit 22 enters debugging mode；
The controlled source switch 13 is closed under the control of external computer device, now on the regulation and control unit 12
Electricity, and bias voltage and offset voltage that the digital voltage converter 11 is exported are initialized as 0, and will be debugged
Sensor 2 in reading circuit 22 be adjusted to open loop feedback；
Then, the test signal generator 125 in the regulation and control unit 126 starts to input to the reading circuit 22 pre-
If the triangular signal in cycle, meanwhile, the sampling module 121 in the regulation and control unit 12 reads electricity according to the cycle to described
The induced signal that road 22 is exported carries out 12 samplings, and utilizes formula by computing module 122：Vpp=（Vmax–Vmin）And Vdc
=（Vmax+Vmin）/ 2 determine exported induced signal respective voltage peak-to-peak value Vpp (0), Vpp (1) within two cycles
And Vdc (0), Vdc (1), because the bias voltage and offset voltage of initialization are 0, then the first regulation and control module 123 compares
Vpp (0)=Vpp (1)=0, then control the digital voltage converter 11 that bias voltage is adjusted into (0+L), meanwhile, described second
The offset voltage that the digital voltage converter 11 is exported is adjusted to 0 by regulation and control module 124；
After first time adjusts, the sampling module 121 continues to export the reading circuit 22 according to the cycle
Induced signal carry out 12 samplings, and determine that exported induced signal is being adopted using above-mentioned formula by computing module 122
Voltage peak-to-peak value Vpp (2) and offset voltage Vdc (2) in the cycle of sample, then Vpp is compared by the described first regulation and control module 123
(1)<Vpp (2), then control the digital voltage converter 11 that bias voltage is adjusted into (L+L), meanwhile, second regulation and control
The offset voltage that the digital voltage converter 11 is exported is adjusted to-Vdc (2) by module 124；
After second adjusts, the sampling module 121 continues to export the reading circuit 22 according to the cycle
Induced signal carry out 12 samplings, and determine that exported induced signal is being adopted using above-mentioned formula by computing module 122
Voltage peak-to-peak value Vpp (3) and offset voltage Vdc (3) in the cycle of sample, then Vpp is compared by the described first regulation and control module 123
(2)>Vpp (3), then halve step-length, and the step-length after halving is compared with default step-length threshold value L ', now, after halving
Step-length L/2>L ', then it is described first regulation and control module 123 control the digital voltage converter 11 to be adjusted to bias voltage
(2L-L/2), meanwhile, the offset voltage that the digital voltage converter 11 is exported is adjusted to-Vdc by the second regulation and control module 124
(3)；
After third time is adjusted, the sampling module 121 continues to export the reading circuit 22 according to the cycle
Induced signal carry out 12 samplings, and determine that exported induced signal is being adopted using above-mentioned formula by computing module 122
Voltage peak-to-peak value Vpp (4) and offset voltage Vdc (4) in the cycle of sample, then Vpp is compared by the described first regulation and control module 123
(3)<Vpp (4) and L/4>L ', then it is described first regulation and control module 123 control the digital voltage converter 11 to adjust bias voltage
Whole is (2L-L/2+L/4), meanwhile, the offset voltage that the second regulation and control module 124 exports the digital voltage converter 11
It is adjusted to-Vdc (4)；
After the 4th time adjusts, the sampling module 121 continues to export the reading circuit 22 according to the cycle
Induced signal carry out 12 samplings, and determine that exported induced signal is being adopted using above-mentioned formula by computing module 122
Voltage peak-to-peak value Vpp (5) and offset voltage Vdc (5) in the cycle of sample, then Vpp is compared by the described first regulation and control module 123
(4)<Vpp (5) and L/8<L ', it is determined that no longer adjust bias voltage, meanwhile, the first regulation and control module 123 controls the number
Bias voltage is adjusted to (2L-L/2+L/4) by word electric pressure converter 11, and described second regulates and controls module 124 by the digital voltage
The offset voltage that converter 11 is exported is adjusted to-Vdc (5), and the first regulation and control module 123 notifies the controlled source to switch off
The sensor is switched into working condition by debugging mode with described control unit 14；
The controlled source is switched after 13 controlled switch-offs, and the regulation and control non-transformer of unit 12 is powered and automatically exits from debugging；
Described control unit 14 exports low level more to the controlled switch put the hilted broadsword, then the controlled switch put the hilted broadsword is turned to more
Connect the closed-loop of integrating circuit, thus, the formation closed loop feedback in the reading circuit 22 of the sensor 2, the numeral
Electric pressure converter 11 is according to the bias voltage (2L-L/2+L/4) and offset voltage-Vdc (5) of last time adjustment respectively to described
Zeroising road in SPUID 21 and reading circuit 22 powers.
As shown in figure 4, the present invention also provides a kind of adjustment method for being used to use the sensor of SPUID.
Wherein, sensor provides bias voltage and offset voltage by digital voltage converter.The adjustment method is main by regulation and control unit
To perform, the regulation and control unit is the application software installed in MCU.
In step sl, the cycle of the regulation and control unit based on the signal for inputting the sensor, the sensor is detected
The induced signal with the cycle exported, and therefrom determine voltage peak-to-peak value and offset voltage in the cycle.
Specifically, the regulation and control unit inputs the triangular wave of predetermined period to the test signal input of the reading circuit
Signal, the SPUID passes through reading circuit output and described three under the sensing of the triangular signal
The cycle identical induced signal of angle ripple signal, the regulation and control unit receives the sensing letter from the output end of the reading circuit
Number, and utilize the voltage peak-to-peak value and the reading circuit of the induced signal in included analog circuit detection a cycle
Offset voltage.
Preferably, the step S1 includes step S11, S12（It is unillustrated）.
In step s 11, the cycle of the regulation and control unit based on the signal for inputting the sensor, sensing described in over-sampling
The magnitude of voltage for the induced signal that device is exported.
Specifically, the triangular signal that the regulation and control unit is inputted according to the test signal input of the reading circuit
12 times of cycle（Or 16 times, 24 times etc.）, the induced signal that the reading circuit is exported carries out over-sampling, and preserves one
Each magnitude of voltage sampled in the individual cycle.
In step s 12, the regulation and control unit extracts maximum voltage value from each magnitude of voltage for a cycle sampled
And minimum amount of voltage that, and the difference of the maximum voltage value and minimum amount of voltage that is defined as the voltage peak-to-peak value, by maximum electricity
The half of pressure value and minimum amount of voltage that sum is defined as the offset voltage.Wherein, it can also be and include in the regulation and control unit
The circuit of arithmetic unit and MCU.
In step s 2, it is described regulation and control the two voltage peak-to-peak value of the unit based on adjacent detection comparative result come by
The external bias voltage of successive step.
Specifically, the regulation and control unit is since the second period detected, when identified previous voltage peak-to-peak value
Less than or equal to latter voltage peak-to-peak value, then give again after controlling the digital voltage converter that bias voltage is increased into default step-length
Output, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting described
The bias voltage of digital voltage converter output.
For example, the bias voltage that the digital voltage converter is exported is 0, offset voltage is 0, then the regulation and control unit
By detecting the induced signal in two cycles, the voltage peak-to-peak value and offset voltage of the induced signal in described two cycles are determined
It is 0, then controls the digital voltage converter to be adjusted to bias voltage（0+L）, wherein, L is default step-length, while still
Make the digital voltage converter output 0v offset voltages；Then, in digital voltage converter output bias voltage L and partially
When moving voltage 0, the regulation and control unit detects the induced signal of a cycle again, and determines that the voltage peak-to-peak value of current period is
A1, offset voltage a2, wherein, a1>0, by comparing, the voltage peak-to-peak value 0 in the previous cycle detected<The latter cycle
Voltage peak-to-peak value a1, then control the digital voltage converter to be adjusted to bias voltage（a1+L）, and control the numeral electricity
Offset voltage is adjusted to-a2 by pressure converter, by that analogy, until before the latter voltage peak-to-peak value detected is less than or equal to
Voltage peak-to-peak value described in one, it is determined that no longer adjusting the bias voltage of the digital voltage converter output.
Preferably, the mode that the regulation and control unit progressively adjusts external bias voltage includes：Compare adjacent detection
Two voltage peak-to-peak values, will be external when the latter voltage peak-to-peak value is more than the previous voltage peak-to-peak value
The default step-length of bias voltage increase, until the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value
When, it is determined that no longer adjusting external bias voltage.
For example, the regulation and control unit is (n-1) individual and samples what 12 reading circuits were exported in n-th of cycle
The magnitude of voltage of induced signal, and sampled 12 magnitudes of voltage are transported into the regulation and control unit, the regulation and control unit is therefrom extracted
Maximum voltage value and minimum amount of voltage that, and formula is substituted into respectively：Vpp=（Vmax–Vmin）With Vdc=（Vmax+Vmin）/ 2, with
The voltage peak-to-peak value Vpp (n-1) and offset voltage Vdc (n-1) of induced signal into (n-1) the individual cycle, and it is described
The voltage peak-to-peak value Vpp (n) and offset voltage Vdc (n) of induced signal in n-th of cycle, wherein, Vpp is cycle for being sampled
Interior voltage peak-to-peak value, Vmax is the maximum voltage value in cycle for being sampled, and Vmin is the minimum electricity in cycle for being sampled
Pressure value, Vdc is the offset voltage in cycle for being sampled；Then, the regulation and control unit is compared Vpp (n), Vpp (n-1)
Compared with if Vpp (n)>Vpp (n-1), then control the digital voltage converter by current bias voltage improve to（a3+L）, and
The SPUID is transported to, wherein, a3 is the bias voltage before adjustment, and L is default step-length.
It is further preferable that the mode that the regulation and control unit progressively adjusts external bias voltage also includes：In latter institute
When stating voltage peak-to-peak value less than the previous voltage peak-to-peak value, on the basis of the default step-length, in the base of previous step-length
Halve on plinth, and the sensor is transported to after the step-length after external bias voltage is halved, until in the latter electricity
When voltage crest peak value is more than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage.
Specifically, when the regulation and control unit is it is determined that the latter voltage peak-to-peak value is less than the previous Voltage Peak peak
During value, it is meant that the bias voltage of SPUID was adjusted, therefore, will be previous based on the default step-length
Halve on the basis of secondary step-length, and control the digital voltage converter output to subtract the biased electrical after the step-length after described halve
Pressure, with the anti-bias voltage for adjusting the SPUID, until the latter voltage peak-to-peak value be more than or equal to it is previous
During the individual voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage of the digital voltage converter output.
For example, the bias voltage that the digital voltage converter is exported is a4, the regulation and control unit is it is determined that current institute
When stating voltage peak-to-peak value Vpp (n) less than previous voltage peak-to-peak value Vpp (n-1), step-length is adjusted to L/2, wherein, L is
Step-length is preset, then the bias voltage that the digital voltage converter is exported is adjusted to by the regulation and control unit（a4–L/2）, connect
, then the voltage peak-to-peak value Vpp (n+1) in a new cycle is obtained by regulating and controlling unit and regulation and control unit, as Vpp (n+1)<Vpp
(n), then step-length is adjusted to L/4, then the bias voltage that the regulation and control unit is exported the digital voltage converter is adjusted
For（a4–L/2–L/4）, by that analogy, until voltage peak-to-peak value Vpp (n+i) >=Vpp (n+i-1), then no longer adjust the numeral
The bias voltage of electric pressure converter output.
It is further preferable that the mode that the regulation and control unit progressively adjusts external bias voltage also includes：At latter
The voltage peak-to-peak value is more than or equal to by switching to the latter voltage peak-to-peak value less than or equal to the previous voltage peak-to-peak value
During the previous voltage peak-to-peak value, halved on the basis of previous step-length, external bias voltage is increased into this subtracts
Step-length after half simultaneously transports to the sensor, until when the latter voltage peak-to-peak value is less than or equal to the previous Voltage Peak
During peak value, external bias voltage is reduced into the step-length after this halves and exported；
So repeatedly, until this step-length after halving is less than or equal to default step-length threshold value, it is determined that no longer adjust outer
The bias voltage connect.
For example, referring to shown in Fig. 5, the regulation and control unit is in the initial debugging stage, based on latter voltage peak-to-peak value Vpp
(2)>During previous voltage peak-to-peak value Vpp (1), external bias voltage is incrementally increased according to default step-length L, until latter described
When voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, bias voltage M is obtained, and using the default step-length as base
Standard, external bias voltage is changed to (M-L/2), and judges that the step-length after being halved is more than default step-length threshold value, and continues to sentence
It is disconnected when obtaining the latter voltage peak-to-peak value by less than or equal to the previous voltage peak-to-peak value, then external bias voltage is changed
For (M-L/2-L/4)...By that analogy；
Until judging that the latter voltage peak-to-peak value Vpp (n) is more than or equal to the previous voltage peak-to-peak value Vpp (n-
, and the step-length L/ (2 after halving 1)(n+1)) when being more than default step-length threshold value, external bias voltage is changed to (M-L/2-L/
4-…-L/(2n))+L/(2(n+1)), and continue to judge that the latter voltage peak-to-peak value is more than or equal to the previous Voltage Peak
Peak value, and the step-length L/ (2 after halving(n+2)) when being more than default step-length threshold value, external bias voltage is changed to (M-L/2-L/
4-…-L/(2n)+L/(2(n+1))+L/(2(n+2)))...By that analogy；
Until judging that the latter voltage peak-to-peak value Vpp (n+m) is less than or equal to the previous voltage peak-to-peak value Vpp (n
+ m-1), and the step-length L/ (2 after halving(n+m+1)) when being more than default step-length threshold value, then external bias voltage is changed to (M-L/
2-L/4-…-L/(2n)+L/(2(n+1))+L/(2(n+2))+…+L/(2(n+m))-L/(2(n+m+1))), now, judgement obtains L/ (2(n +m+2)) it is less than or equal to default step-length threshold value, it is determined that external bias voltage is no longer adjusted, then external bias voltage is (M-L/2-L/
4-…-L/(2n)+L/(2(n+1))+L/(2(n+2))+…+L/(2(n+m))-L/(2(n+m+1))).Wherein, n is reduction bias voltage
Number of times, m is the number of times of increase bias voltage.
In step s3, external offset voltage is adjusted to offset identified offset voltage by the regulation and control unit
Offset voltage.
Specifically, the regulation and control unit controls the digital voltage converter that the offset voltage exported is changed into current institute
The inverse value of the offset voltage of determination or identified offset voltage, the digital voltage converter is by the offset voltage after adjustment
Transport in the zeroing circuit in the reading circuit, thus offset the offset voltage produced in the reading circuit.Wherein, institute
It can be adder or subtracter to state zeroing circuit.
Preferably, if the regulation and control unit is more than default smallest offset electricity according to identified offset voltage in step S1
External offset voltage, then be adjusted to offset the offset voltage of identified offset voltage, conversely, then not adjusting by pressure.
For example, whether the regulation and control unit judges Vdc (n) is more than default smallest offset voltage, if more than the minimum
Offset voltage, then be adjusted to-Vdc (n), and the tune for including adder transported in the reading circuit by external offset voltage
In zero circuit, conversely, then not adjusting.
It should be noted that it should be appreciated by those skilled in the art that the step S2 and S3 can be simultaneously perform, also may be used
Step S3 is performed again to first carry out the step S2, or first carries out the S3 performs step S2 again.
Preferably, as shown in fig. 6, the adjustment method also includes：Step S4, S5.
Before step S1 execution, the debugging system first carries out step S4.
In step s 4, the debugging system is based on extraneous Start-up and Adjustment signal and controls the sensor by current state turn
For debugging mode.
Specifically, the Start-up and Adjustment signal transmitted by outside computer equipment is converted into being used to control by the debugging system
Make the reset that the controlled switch put the hilted broadsword in the sensor turns in open loop feedback, and the control sensor more controlled
Switch off, the state of the sensor is switched into debugging mode, then perform step S1.
When the debugging system no longer adjusts the bias voltage according to step S3 determinations, the debugging system performs step
Rapid S5.
In step s 5, the debugging system controls the sensor to switch to working condition by debugging mode.
Specifically, on the one hand the debugging system controls to put the hilted broadsword more when it is determined that no longer adjusting the bias voltage
Controlled switch turn to closed loop feedback, while continuing to make the reset controlled switch to disconnect, so that the sensor switchs to work
State, on the other hand cuts off own power source.
In summary, the of the invention debugging system and method that are used for the sensor using SPUID,
The outside adjustable digital voltage converter of access of sensor, and by ratio of the regulation and control unit according to the voltage peak-to-peak value of adjacent detection
Compared with adjusting the bias voltage of SPUID by the way of progressively adjusting, can effectively solve the problem that manual debugging institute
Bring it is inaccurate, time-consuming the problems such as, additionally it is possible to improve Adjustment precision, the particularly suitable sensor in multichannel；Particularly, root
According to the operation principle of SPUID, increase the stage with the increase of bias voltage in voltage peak-to-peak value, according to pre-
If step-length come increase the bias voltage of the SPUID can be rapidly by the SPUID
Bias voltage is adjusted near the maximum of voltage peak-to-peak value, meanwhile, subtract in voltage peak-to-peak value with the increase of bias voltage
Bias voltage high-precision can be positioned at Voltage Peak by small stage, the half that bias voltage is reduced to previous step-length progressively
Near peak maximum；In addition, after debugging is finished, switching off the power supply to regulating and controlling unit by controlled source so that described
Sensor is directly entered working condition, thoroughly avoids manual intervention；Further, it is described regulation and control unit debug complete when control by
Power switch is controlled to disconnect, to power off in time and make the sensor enter working condition, the full automatic treatment that thus time limit debugs,
To prevent artificial participation.So, the present invention effectively overcomes various shortcoming of the prior art and has high industrial utilization.
The above-described embodiments merely illustrate the principles and effects of the present invention, not for the limitation present invention.It is any ripe
Know the personage of this technology all can carry out modifications and changes under the spirit and scope without prejudice to the present invention to above-described embodiment.Cause
This, those of ordinary skill in the art is complete without departing from disclosed spirit and institute under technological thought such as
Into all equivalent modifications or change, should by the present invention claim be covered.
Claims (11)
1. a kind of be used for the debugging system of the sensor using SPUID, the sensor includes：Superconducting Quantum
Interfered device and the reading circuit being connected with the SPUID, it is characterised in that at least include：
The digital voltage converter being connected with the reading circuit and SPUID, for external power supply to be distinguished
It is converted into adjustable bias voltage of the SPUID and the offset voltage of reading circuit；
The regulation device being connected with the test signal input, output end of the reading circuit and digital voltage converter, is used for
The cycle of the test signal inputted based on the test signal input, what the detection output end was exported has the week
The induced signal of phase, and voltage peak-to-peak value and offset voltage in the cycle are therefrom determined, two institutes based on adjacent detection
State the comparative result of voltage peak-to-peak value progressively to adjust the bias voltage that the digital voltage converter is exported, and control described
Digital voltage converter adjusts offset voltage to offset identified offset voltage；Wherein, the regulation device includes：
The test signal generator being connected with the test signal input of the reading circuit, for according to the Superconducting Quantum
The magnetic flux cycle generate the test signal of alternation, and export to the test signal input；
The sampling module being connected with the output end of the reading circuit, for described in the cycle over-sampling based on the test signal
The magnitude of voltage for the induced signal that output end is exported；
The regulation and control unit being connected with the test signal generator and sampling module, including：
The computing module being connected with the sampling module, for extracting maximum electricity from each magnitude of voltage for a cycle sampled
Pressure value and minimum amount of voltage that, and the difference of the maximum voltage value and minimum amount of voltage that is defined as the voltage peak-to-peak value, will most
Big magnitude of voltage and the half of minimum amount of voltage that sum are defined as the offset voltage；
The first regulation and control module being connected with the computing module, two Voltage Peaks for relatively more identified adjacent detection
Peak value, when the latter voltage peak-to-peak value is more than the previous voltage peak-to-peak value, controls the digital voltage converter
Bias voltage after the default step-length of output increase, until the latter voltage peak-to-peak value is less than or equal to the previous electricity
During voltage crest peak value, it is determined that no longer adjusting the bias voltage of the digital voltage converter output；Or in the latter Voltage Peak
When peak value is less than the previous voltage peak-to-peak value, on the basis of the default step-length, give on the basis of previous step-length
Halve, and control the digital voltage converter to export the bias voltage after the step-length after halving, until in latter institute
When stating voltage peak-to-peak value more than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting the digital voltage converter output
Bias voltage.
2. according to claim 1 be used for the debugging system of the sensor using SPUID, its feature exists
In the first regulation and control module is additionally operable in the latter voltage peak-to-peak value by less than or equal to the previous voltage peak-to-peak value
When switching to the latter voltage peak-to-peak value more than or equal to the previous voltage peak-to-peak value, given on the basis of previous step-length
To halve, and the digital voltage converter is controlled to increase the step-length after this halves on the basis of current bias voltage
And exported, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, control is described
Digital voltage converter reduces the step-length after this halves and exported on the basis of current bias voltage, so anti-
It is multiple, until this step-length after halving is less than or equal to default step-length threshold value, it is determined that no longer adjust the digital voltage conversion
The bias voltage of device output.
3. according to claim 1 be used for the debugging system of the sensor using SPUID, its feature exists
In the regulation and control unit also includes：
The second regulation and control module being connected with the computing module, if being more than default smallest offset for identified offset voltage
Voltage, the then offset voltage exported the digital voltage converter is adjusted to offset the skew electricity of identified offset voltage
Pressure, conversely, then not adjusting.
4. according to claim 1 be used for the debugging system of the sensor using SPUID, its feature exists
In the regulator control system also includes：The control unit being connected with the control end of the reading circuit, for based on opening for being received
Control end output switching signal described in dynamic debugging direction of signal, to make the reading circuit enter debugging mode.
5. according to claim 1 be used for the debugging system of the sensor using SPUID, its feature exists
In the debugging system also includes：The controlled source switch being connected with extraneous power supply, for starting debugging in the regulation device
When close, determine that the bias voltage for no longer adjusting digital voltage converter output disconnects in the regulation device.
6. a kind of be used for the adjustment method of the sensor using SPUID, wherein, the external biasing of the sensor
Voltage and offset voltage, it is characterised in that sensor provides bias voltage and offset voltage, the number by digital voltage converter
Word electric pressure converter is used for adjustable bias voltage that external power supply is converted into the SPUID respectively
With the offset voltage of reading circuit；At least include：
Based on the cycle for the test signal for inputting the sensor, the sense with the cycle that the sensor is exported is detected
Induction signal, and therefrom determine voltage peak-to-peak value and offset voltage in the cycle；
The comparative result of two voltage peak-to-peak values based on adjacent detection is defeated progressively to adjust the digital voltage converter
The bias voltage gone out, and control the digital voltage converter adjustment offset voltage to offset identified offset voltage；
Based on the cycle of the test signal, the magnitude of voltage for the test signal that output end described in over-sampling is exported；Wherein, test
Signal is to generate the test signal of alternation the magnetic flux cycle of the Superconducting Quantum；
Extract maximum voltage value and minimum amount of voltage that from each magnitude of voltage for a cycle sampled, and by the maximum voltage
The difference of value and minimum amount of voltage that is defined as the voltage peak-to-peak value, and the half of maximum voltage value and minimum amount of voltage that sum is determined
For the offset voltage；
The mode of the bias voltage for progressively adjusting the digital voltage converter output includes：Adjacent inspection determined by comparing
The two voltage peak-to-peak values surveyed, when the latter voltage peak-to-peak value is more than the previous voltage peak-to-peak value, control
Bias voltage after the default step-length of digital voltage converter output increase, until the latter voltage peak-to-peak value is small
When equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage of the digital voltage converter output；Or
When the latter voltage peak-to-peak value is less than the previous voltage peak-to-peak value, on the basis of the default step-length, previous
Halved on the basis of secondary step-length, and control the digital voltage converter to export the biased electrical after the step-length after halving
Pressure, until when the latter voltage peak-to-peak value is more than or equal to the previous voltage peak-to-peak value, it is determined that no longer adjusting described
The bias voltage of digital voltage converter output；
External offset voltage is adjusted to the inverse value of identified offset voltage or identified offset voltage.
7. according to claim 6 be used for the adjustment method of the sensor using SPUID, its feature exists
In the mode for progressively adjusting external bias voltage includes：
Compare two voltage peak-to-peak values of adjacent detection, be more than the previous voltage in the latter voltage peak-to-peak value
During peak-to-peak value, external bias voltage is increased into default step-length, until before the latter voltage peak-to-peak value is less than or equal to
During one voltage peak-to-peak value, it is determined that no longer adjusting external bias voltage.
8. according to claim 7 be used for the adjustment method of the sensor using SPUID, its feature exists
In the mode for progressively adjusting external bias voltage also includes：It is less than previous institute in the latter voltage peak-to-peak value
When stating voltage peak-to-peak value, on the basis of the default step-length, halved on the basis of previous step-length, and by external biasing
Voltage halve after step-length after transport to the sensor, until being more than or equal in the latter voltage peak-to-peak value previous
During the voltage peak-to-peak value, it is determined that no longer adjusting the bias voltage.
9. according to claim 8 be used for the adjustment method of the sensor using SPUID, its feature exists
In the mode for progressively adjusting external bias voltage also includes：The latter voltage peak-to-peak value by less than or equal to
When the previous voltage peak-to-peak value switchs to the latter voltage peak-to-peak value more than or equal to the previous voltage peak-to-peak value,
Halved on the basis of previous step-length, external bias voltage is increased into the step-length after this halves and the sensing is transported to
Device, until when the latter voltage peak-to-peak value is less than or equal to the previous voltage peak-to-peak value, external bias voltage is subtracted
This few step-length after halving simultaneously is exported；
So repeatedly, until this step-length after halving is less than or equal to default step-length threshold value, it is determined that no longer adjust external
Bias voltage.
10. according to claim 6 be used for the adjustment method of the sensor using SPUID, its feature exists
In the mode for progressively adjusting external offset voltage includes：
If identified offset voltage is more than default smallest offset voltage, external offset voltage is adjusted to offset institute
The offset voltage of the offset voltage of determination, conversely, then not adjusting.
11. according to claim 6 be used for the adjustment method of the sensor using SPUID, its feature exists
In the adjustment method also includes：
Control the sensor that current state is switched into debugging mode based on extraneous Start-up and Adjustment signal；And
When it is determined that no longer adjusting the bias voltage, the sensor is controlled to switch to working condition by debugging mode.
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| CN104808156B (en) * | 2015-05-05 | 2018-02-13 | 中国科学院上海微系统与信息技术研究所 | SQUID Magnetic Sensors and best operating point locking means |
| CN106328211B (en) * | 2015-06-15 | 2021-06-08 | 中兴通讯股份有限公司 | Method and device for realizing time sequence test |
| CN108629421B (en) * | 2018-04-08 | 2019-10-11 | 北京梦之墨科技有限公司 | A kind of liquid metal quantum processor |
| CN108846483B (en) * | 2018-06-21 | 2023-04-14 | 广西师范大学 | Design method of modulo-N subtracter without destroying source operand |
| CN111724836B (en) * | 2020-06-03 | 2022-06-07 | 中国科学院上海微系统与信息技术研究所 | Superconducting magnetic flux storage unit and read-write method thereof |
| CN111722084B (en) * | 2020-06-29 | 2021-07-20 | 浪潮集团有限公司 | Automatic calibration method for superconducting quantum chip parameters and related components |
| CN113093067B (en) * | 2021-03-31 | 2022-01-18 | 中国科学院上海微系统与信息技术研究所 | Superconducting quantum interference sensor system and method for inhibiting output deviation thereof |
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| JP3148479B2 (en) * | 1993-09-17 | 2001-03-19 | セイコーインスツルメンツ株式会社 | High sensitivity magnetic field detector |
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| CA2303677A1 (en) * | 1999-04-09 | 2000-10-09 | Hideo Itozaki | Device and method for easily adjusting working point of squid |
| JP2000321343A (en) * | 1999-05-13 | 2000-11-24 | Sumitomo Electric Ind Ltd | Method and device for adjusting magnetic field bias in modulation drive circuit for squid |
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| CN102426343B (en) * | 2011-08-31 | 2014-03-26 | 中国科学院上海微系统与信息技术研究所 | Readout circuit based on SQUID (Superconducting Quantum Interference Device) offset voltage reversal and method for inhibiting low-frequency noises |
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