CN104376042B - A kind of item database examination question acquisition methods and system - Google Patents
A kind of item database examination question acquisition methods and system Download PDFInfo
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- CN104376042B CN104376042B CN201410535161.0A CN201410535161A CN104376042B CN 104376042 B CN104376042 B CN 104376042B CN 201410535161 A CN201410535161 A CN 201410535161A CN 104376042 B CN104376042 B CN 104376042B
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- G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
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Abstract
The present invention relates to a kind of item database examination question acquisition methods and system, it the described method comprises the following steps：Obtain the parameter of user's input；Calculate the examination question matching value of per pass examination question in item database respectively according to the parameter and examination question attribute, and the examination question matching value is saved in matching value tables of data；The examination question matching value in matching value tables of data is descending to be ranked up to all examination questions, by all examination questions after sequence according to the descending order of the examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of total operation time and the operation time parameter is minimum and total operation time is less than or equal to the operation time parameter, all examination questions after add up corresponding with total operation time are obtained from matching value tables of data, all examination questions got are saved in examination question distribution tables of data and exported.
Description
Technical field
The present invention relates to data query field, more particularly to a kind of item database examination question acquisition methods and system.
Background technology
In IT application in education sector system, increasingly pay attention to the application to item database, item database is also more and more
Be developed.The purpose of item database is set up, is to be made the test by the examination question data in item database, arrange work
Industry etc. is operated.
In current item database application case, user is to arrive manually in making the test or arranging the work such as operation,
Examination question is chosen in item database, or by inputting some simple querying conditions, reduces the scope of examination question data, Ran Houzai
Manually select some examination questions and made the test or arranged operation.Pass through such method, although user can be aided in carry out examination question number
According to simple acquisition, but it is big to there is user's manual screening examination question workload, the problem of search efficiency is low.
How by examination question data parameters, the examination question data acquisition of automated intelligent is realized, solving user in traditional mode needs
The mode to set a question manually, improves examination question efficiency data query, this is the technical problems to be solved by the invention.
The content of the invention
The technical problem to be solved in the present invention is to provide a kind of item database examination question acquisition methods and system, this method energy
The workload of user's manual screening examination question data is reduced, search efficiency is improved.
In order to solve the above technical problems, the item database examination question acquisition methods of the present invention comprise the following steps：
The first step, obtains the parameter of user's input, and the parameter includes knowledge point parameter, item difficulty parameter, subjective and objective
Type parameter and operation time parameter are inscribed, item database is set up according to examination question and examination question attribute；
Second step, is matched according to the examination question that the parameter and examination question attribute calculate per pass examination question in item database respectively
Value, and the examination question matching value is saved in matching value tables of data, the matching value tables of data include three field examination question ID,
Examination question duration and examination question matching value；
3rd step, the examination question matching value in matching value tables of data is descending to be ranked up to all examination questions,
All examination questions after sequence are added up according to the descending order of the examination question matching value, successively the examination question duration of per pass examination question
Total operation time is obtained, when the difference of total operation time and the operation time parameter is minimum and total operation time is small
When the operation time parameter, obtained from matching value tables of data after add up corresponding with total operation time
All examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
The beneficial effects of the invention are as follows：As long as by above method user's input parameter, can be achieved with examination question data from
It is dynamic to obtain and match, match the examination question data being most consistent with the parameter of user's input and export examination question data automatically, reduction is used
The workload of examination question data is chosen at family manually, improves search efficiency.
On the basis of above-mentioned technical proposal, the present invention can also do following improvement：
Further, before the first step, in addition to by the knowledge point parameter total score of user preset, item difficulty parameter total score
With subjective and objective topic type parameter total score, it is stored in parameter matching value metadata table.
Further, the examination question matching value is equal to knowledge point parameter matching value, subjective and objective topic type parameter matching value and examination
Inscribe difficult parameters matching value sum；The examination question attribute includes knowledge point number, item difficulty value, subjective and objective topic type and examination question
Duration；
The knowledge point parameter matching value is equal to the knowledge point ginseng that the knowledge point parameter total score divided by user input
Several numbers obtains quotient and by obtained quotient multiplied by actual of the knowledge point parameter inputted with per pass examination question and user
The knowledge point number matched somebody with somebody, the quotient retains two precision；
If the subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input is matched, the master
Objective item type parameter matching value is main objective item type parameter total score；Otherwise the subjective and objective topic type parameter matching value is O；
The item difficulty parameter matching value subtracts item difficulty absolute value, institute equal to the item difficulty parameter total score
State the absolute value that item difficulty absolute value is equal to the item difficulty value of per pass examination question and the difference of the item difficulty parameter.
Further, when the examination question matching value is identical, according to the examination question duration of per pass examination question from long to short to all examinations
Topic is ranked up.
Using the beneficial effect of above-mentioned further scheme be the present invention carry out item database examination question acquisition during,
Examination question matching value is calculated by parameter, examination question data query is carried out by the related operation expression of examination question matching value, not only dropped
The low workload of user's manual screening examination question data, and improve search efficiency.
Include in order to solve the above technical problems, the item database examination question of the present invention obtains system：Parameter acquisition module, examination
Inscribe matching value computing module and examination question acquisition module；
The parameter acquisition module is used for the parameter for obtaining user's input, and it is difficult that the parameter includes knowledge point parameter, examination question
Parameter, subjective and objective topic type parameter and operation time parameter are spent, item database is set up according to examination question and examination question attribute；
The examination question matching value computing module is used to be calculated in item database respectively according to the parameter and examination question attribute
The examination question matching value of per pass examination question, and the examination question matching value is saved in matching value tables of data, the matching value tables of data
Including three field examination question ID, examination question duration and examination question matching value；
The examination question matching value that the examination question acquisition module is used in matching value tables of data is descending to all
Examination question is ranked up, by all examination questions after sequence according to the descending order of the examination question matching value, successively add up per pass
The examination question duration of examination question obtains total operation time, when the difference of total operation time and the operation time parameter is minimum and institute
When stating total operation time less than or equal to the operation time parameter, obtained and total operation time from matching value tables of data
It is corresponding it is cumulative after all examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
The beneficial effects of the invention are as follows：By the system user by input parameter, the automatic of examination question data can be achieved with
Obtain and match, match the examination question data being most consistent with the parameter of user's input and export examination question data result, reduce use
The workload of examination question data is chosen at family manually, improves search efficiency.
Further, before the first step, in addition to by the knowledge point parameter total score of user preset, item difficulty parameter total score
With subjective and objective topic type parameter total score, it is stored in parameter matching value metadata table.
Further, the examination question matching value is equal to knowledge point parameter matching value, subjective and objective topic type parameter matching value and examination
Inscribe difficult parameters matching value sum；The examination question attribute includes knowledge point number, item difficulty value, subjective and objective topic type and examination question
Duration；
The knowledge point parameter matching value is equal to the knowledge point ginseng that the knowledge point parameter total score divided by user input
Several numbers obtains quotient and by obtained quotient multiplied by actual of the knowledge point parameter inputted with per pass examination question and user
The knowledge point number matched somebody with somebody, the quotient retains two precision；
If the subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input is matched, the master
Objective item type parameter matching value is main objective item type parameter total score；Otherwise the subjective and objective topic type parameter matching value is O；
The item difficulty parameter matching value subtracts item difficulty absolute value equal to the item difficulty parameter total score, described
Item difficulty absolute value is equal to the absolute value of the item difficulty value of per pass examination question and the difference of the item difficulty parameter.
Further, when the examination question matching value is identical, according to the examination question duration of per pass examination question from long to short to all examinations
Topic is ranked up.
It is of the invention in item database examination question acquisition process is carried out using the beneficial effect of above-mentioned further scheme, leads to
Cross examination question matching value computing module and calculate examination question matching value, examination question data are carried out by the related operation expression of examination question matching value
Inquiry, not only reduces the workload of user's manual screening examination question data, and improve search efficiency.
Brief description of the drawings
Fig. 1 is item database examination question acquisition methods flow chart of the present invention；
Fig. 2 is the flow chart of step second step shown in Fig. 1；
Fig. 3 is the flow chart of the step of step the three shown in Fig. 1；
Fig. 4 is that item database examination question of the present invention obtains system construction drawing
In accompanying drawing, the list of parts representated by each label is as follows：
1st, parameter acquisition module, 2, examination question matching value computing module, 3, examination question acquisition module.
Embodiment
The principle and feature of the present invention are described below in conjunction with accompanying drawing, the given examples are served only to explain the present invention, and
It is non-to be used to limit the scope of the present invention.
Fig. 1 shows item database examination question acquisition methods flow in one embodiment of the invention.Comprise the following steps：
The first step, obtains the parameter of user's input, and the parameter includes knowledge point parameter, item difficulty parameter, subjective and objective
Type parameter and operation time parameter are inscribed, item database is set up according to examination question and examination question attribute.
Second step, is matched according to the examination question that the parameter and examination question attribute calculate per pass examination question in item database respectively
Value, and the examination question matching value is saved in matching value tables of data, the matching value tables of data include three field examination question ID,
Examination question duration and examination question matching value.
3rd step, the examination question matching value in matching value tables of data is descending to be ranked up to all examination questions,
All examination questions after sequence are added up according to the descending order of the examination question matching value, successively the examination question duration of per pass examination question
Total operation time is obtained, when the difference of total operation time and the operation time parameter is minimum and total operation time is small
When the operation time parameter, obtained from matching value tables of data after add up corresponding with total operation time
All examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
Before the first step, in addition to by knowledge point parameter total score, item difficulty parameter total score and the host and guest of user preset
Type parameter total score is inscribed in sight, is stored in parameter matching value metadata table.
Specifically, parameter matching value metadata table is set up, by knowledge point parameter total score, the item difficulty parameter of user preset
Total score and subjective and objective topic type parameter total score, are stored in parameter matching value metadata table.
In the first step, the parameter of user's input is obtained, the parameter includes knowledge point parameter, item difficulty parameter, master
Objective item type parameter and operation time parameter, item database is set up according to examination question and examination question attribute.
Specifically, obtaining the examination question parameter of user's input.The parameter includes：Knowledge point parameter, item difficulty parameter, master
Objective item type parameter and operation time parameter.Wherein knowledge point parameter, operation time parameter and item difficulty parameter are users
The parameter that must be inputted, subjective and objective topic type parameter is optional parameters.
Item database includes examination question and examination question attribute, and the examination question attribute of per pass examination question includes：Examination question ID, knowledge point
Number, item difficulty value, subjective and objective topic type and examination question duration.
First, when user is in interface after input parameter, the parameter that user inputs is stored in multiple changes by system automatically
In amount, a parameter is preserved using a variable.If knowledge point parameter includes adopting between multiple knowledge points, knowledge point
It is separated with "@".For example, knowledge point parameter includes：2 knowledge points of trigonometric function and equation, then the knowledge point parameter is protected
The value being stored in variable is exactly " trigonometric function@equations ".
Fig. 2 is the flow chart of step second step shown in Fig. 1, is comprised the following steps：
In second step, the examination question of per pass examination question in item database is calculated respectively according to the parameter and examination question attribute
It is saved in value, and by the examination question matching value in matching value tables of data, the matching value tables of data includes three field examination questions
ID, examination question duration and examination question matching value.
Specifically, set up matching value tables of data, the matching value tables of data include three field examination question ID, examination question duration and
Examination question matching value.
The examination question matching value of per pass examination question is equal to knowledge point parameter matching value, the subjective and objective topic type parameter of per pass examination question
With value and item difficulty parameter matching value sum.
The computational methods of knowledge point parameter matching value：The knowledge point parameter matching value is equal to the knowledge point parameter total score
Divided by the number of the knowledge point parameter of user's input obtains quotient and by obtained quotient multiplied by with per pass examination question and user
The knowledge point number of the knowledge point parameter actual match of input, the quotient retains two precision.Knowledge point parameter total score
By User Defined.
Subjective and objective topic type parameter matching value calculating method：If the institute that the subjective and objective topic type of per pass examination question is inputted with user
Subjective and objective topic type parameter matching is stated, then the subjective and objective topic type parameter matching value is main objective item type parameter total score；It is no
Then the subjective and objective topic type parameter matching value is O.Subjective and objective topic type parameter total score is by User Defined.
Item difficulty parameter matches value calculating method：The item difficulty parameter matching value is equal to the item difficulty parameter
Total score subtracts item difficulty absolute value, and the item difficulty value and the examination question that the item difficulty absolute value is equal to per pass examination question are difficult
Spend the absolute value of the difference of parameter.Item difficulty parameter total score is by User Defined.
Finally, the knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty of per pass examination question are joined
Number matching value summation obtains the examination question matching value of per pass examination question.By the examination question ID inquired from item database, examination question duration
The examination question matching value obtained with calculating is saved in matching value tables of data together.
Fig. 3 is the flow chart of the step of step the three in embodiment illustrated in fig. 1.Comprise the following steps：
In the third step, the examination question matching value in matching value tables of data is descending to be arranged all examination questions
Sequence, the examination question for per pass examination question that all examination questions after sequence are added up according to the descending order of the examination question matching value, successively
Duration obtains total operation time, when the difference of total operation time and the operation time parameter is minimum and during total operation
When length is less than or equal to the operation time parameter, obtain corresponding with total operation time cumulative from matching value tables of data
All examination questions afterwards, all examination questions got are saved in examination question distribution tables of data and exported.
Specifically：Examination question in matching value tables of data is arranged all examination questions according to examination question matching value is descending
Sequence, by all examination questions after sequence according to the descending order of the examination question matching value, the examination question for the per pass examination question that adds up successively
Duration obtains total operation time, when total operation time and the operation time parameter difference is minimum and total operation time
During less than or equal to the operation time parameter, by all examination questions after add up corresponding with total operation time as a result
It is saved in examination question distribution tables of data and exports.
Fig. 4 shows the structure of item database examination question acquisition system in one embodiment of the present of invention.The system includes
Including parameter acquisition module 1, examination question matching value computing module 2 and examination question acquisition module 3.
The parameter acquisition module 1 is used for the parameter for obtaining user's input, and it is difficult that the parameter includes knowledge point parameter, examination question
Parameter, subjective and objective topic type parameter and operation time parameter are spent, item database is set up according to examination question and examination question attribute.
Item database includes examination question and examination question attribute, and the examination question attribute of per pass examination question includes：Examination question ID, knowledge point
Number, item difficulty value, subjective and objective topic type and examination question duration.
Wherein, knowledge point parameter, operation time parameter and item difficulty parameter are the parameters that user must input, subjective and objective
It is optional parameters to inscribe type parameter.
The parameter that user inputs is saved in multiple variables by system, and a parameter is protected using a variable
Deposit.If knowledge point parameter includes between multiple knowledge points, knowledge point being separated using "@".
The examination question matching value computing module 2 is used to be calculated in item database respectively according to the parameter and examination question attribute
The examination question matching value of per pass examination question, and the examination question matching value is saved in matching value tables of data, the matching value tables of data
Including three field examination question ID, examination question duration and examination question matching value.
Specifically, setting up examination question matching value tables of data, examination question matching value tables of data includes three field examination question ID, during examination question
Long and examination question matching value.
The examination question matching value of per pass examination question is equal to knowledge point parameter matching value, the subjective and objective topic type parameter of per pass examination question
With value and item difficulty parameter matching value sum.
The computational methods of knowledge point parameter matching value：The knowledge point parameter matching value is equal to the knowledge point parameter total score
Divided by the number of the knowledge point parameter of user's input obtains quotient and by obtained quotient multiplied by with per pass examination question and user
The knowledge point number of the knowledge point parameter actual match of input, the quotient retains two precision.Knowledge point parameter total score
By User Defined.
Subjective and objective topic type parameter matching value calculating method：If the institute that the subjective and objective topic type of per pass examination question is inputted with user
Subjective and objective topic type parameter matching is stated, then the subjective and objective topic type parameter matching value is main objective item type parameter total score；It is no
Then the subjective and objective topic type parameter matching value is O.Subjective and objective topic type parameter total score is by User Defined.
Item difficulty parameter matches value calculating method：The item difficulty parameter matching value is equal to the item difficulty parameter
Total score subtracts item difficulty absolute value, and the item difficulty value and the examination question that the item difficulty absolute value is equal to per pass examination question are difficult
Spend the absolute value of the difference of parameter.Item difficulty parameter total score is by User Defined.
Finally, the knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty of per pass examination question are joined
Number matching value summation obtains the examination question matching value of per pass examination question.By the examination question ID inquired from item database, examination question duration
The examination question matching value obtained with calculating is saved in matching value tables of data together.
The examination question matching value that the examination question acquisition module 3 is used in matching value tables of data is descending to all
Examination question is ranked up, by all examination questions after sequence according to the descending order of the examination question matching value, successively add up per pass
The examination question duration of examination question obtains total operation time, when the difference of total operation time and the operation time parameter is minimum and institute
When stating total operation time less than or equal to the operation time parameter, obtained and total operation time from matching value tables of data
It is corresponding it is cumulative after all examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
Specifically：Set up examination question distribution tables of data, the satisfactory examination question data result finally inquired for preserving.
Examination question distribution tables of data includes three field examination question ID, examination question duration and examination question matching value.
All examination questions in matching value tables of data are ranked up according to examination question matching value is descending to all examination questions, will
All examination questions after sequence are growed according to the examination question matching value descending order during the examination question for the per pass examination question that adds up successively
To total operation time, when the difference minimum of total operation time and the operation time parameter, and total operation time is small
When the operation time parameter, by all examination questions after add up corresponding with total operation time as a result
It is saved in examination question distribution tables of data and exports.
Here is the example of acquisition methods of the present invention, and the operation that one item database of simulation is inputted according to user, which is distributed, to be joined
Number, obtains out qualified examination question data.
Known item database, item database includes examination question and examination question attribute, and examination question attribute includes：Examination question ID, knowledge
Point number, item difficulty value, subjective and objective topic type and examination question duration.It is as shown in the table：
Known knowledge-ID tables of data, knowledge-ID tables of data shows the knowledge point that per pass examination question is included, such as following table
It is shown：
| Examination question ID | Knowledge point 01 | Knowledge point 02 | Knowledge point 03 | Knowledge point 04 | Knowledge point 05 |
| Examination question 01 | Triangle neutrality line theorem | Angular bisector property | Parallel lines property | ||
| Examination question 02 | Parallel lines property | Corresponding angles and alternate interior angle | |||
| Examination question 03 | Parallel lines property | Corresponding angles and alternate interior angle | Complementary angle and supplementary angle | Isosceles triangle | Vertical line |
| Examination question 04 | Equation property | Quadratic equation with one unknown | Root and Relationship of Coefficients | Linear equation with one unknown | |
| Examination question 05 | There is ordinal number pair | SIN function sin | Cosine function cos | ||
| Examination question 06 | Corresponding angles and alternate interior angle | ||||
| Examination question 07 | Corresponding angles and alternate interior angle | Parallel lines property | |||
| Examination question 08 | Parallel lines property | ||||
| Examination question 09 | Parallel lines property | Corresponding angles and alternate interior angle | Internal angles on the same side | ||
| Examination question 10 | Right angled triangle | Pythagorean theorem | SIN function sin | Tan tan | |
| Examination question 11 | Corresponding angles and alternate interior angle | Parallel lines property | Angular bisector property | ||
| Examination question 12 | Corresponding angles and alternate interior angle | Parallel lines property |
First, it is the knowledge point parameter total score, item difficulty parameter total score and subjective and objective topic type parameter of user preset is total
Point, it is stored in parameter matching value metadata table.It is as shown in the table：
| param_name | param_sum |
| Knowledge point parameter total score | 100 |
| Subjective and objective topic type parameter total score | 200 |
| Item difficulty parameter total score | 100 |
Param_name preserves parameter name in parameter matching value metadata table, and it is total that param_sum preserves parameter matching value
Point.
The first step, obtains the parameter of user's input, and the parameter includes knowledge point parameter, item difficulty parameter, subjective and objective
Inscribe type parameter and operation time parameter.
Before examination question data are obtained, user inputs following parameter：
1st, knowledge point parameter：Two knowledge points, be respectively：1) property 2 of parallel lines) corresponding angles and alternate interior angle
2nd, subjective and objective type parameter：Objective item
3rd, item difficulty parameter：40
4th, operation time parameter：20 minutes.
Wherein, knowledge point parameter, item difficulty parameter, operation time parameter are the parameter that user must input, subjective and objective
It is optional parameters to inscribe type parameter.
Second step, is matched according to the examination question that the parameter and examination question attribute calculate per pass examination question in item database respectively
Value, and the examination question matching value is saved in matching value tables of data, the matching value tables of data include three field examination question ID,
Examination question duration and examination question matching value.
For the per pass examination question in item database, the parameter inputted according to user and examination question attribute calculate per pass examination question
Examination question matching value：The examination question matching value of per pass examination question is equal to the knowledge point parameter matching value of per pass examination question, subjective and objective topic type ginseng
Number matching value and item difficulty parameter matching value sum.
By taking examination question 01 as an example, the calculating process of examination question matching value is introduced：
1) calculation knowledge point parameter matching value
Inquire about and learn from parameter matching value metadata table：The knowledge point parameter matching value total score of user preset is 100 points.
The computational methods of knowledge point parameter matching value：The knowledge point parameter matching value is equal to the knowledge point parameter total score
Divided by the number of the knowledge point parameter of user's input obtains quotient and by obtained quotient multiplied by with per pass examination question and user
The knowledge point number of the knowledge point parameter actual match of input.
Learnt from the inquiry of knowledge-ID tables of data：User have input 2 knowledge point parameters, be " the property of parallel lines respectively
Matter " and " corresponding angles and alternate interior angle ", wherein examination question 01 have only included " properties of parallel lines " knowledge point, i.e. examination question 01 actually has 1
Individual knowledge point is matched with knowledge point parameter, so the knowledge point parameter matching value of examination question 01 is 50 points.
The knowledge point parameter matching value of examination question 01 is equal to the knowledge point that knowledge point parameter matching value total score divided by user input
Number of parameters obtains quotient and the knowing multiplied by the knowledge point parameter actual match inputted with examination question 01 with user by obtained quotient
Know knowledge point parameter matching value=100/2*1=50 of point number, i.e. examination question 01, i.e. the knowledge point parameter matching value of examination question 01 is
50 points.
If user have input 3 knowledge points, per pass examination question then knowledge point parameter matching value per 1 knowledge point of actual match
For 33.33, knowledge point parameter matching value two precision of reservation.
2) subjective and objective topic type parameter matching value is calculated
Inquire about and learn from parameter matching value metadata table：The subjective and objective topic type parameter matching value total score of user preset is
200 points.
Subjective and objective topic type parameter matching value calculating method：If the institute that the subjective and objective topic type of per pass examination question is inputted with user
Subjective and objective topic type parameter matching is stated, then the subjective and objective topic type parameter matching value is main objective item type parameter total score；It is no
Then the subjective and objective topic type parameter matching value is O.
Inquiry learns that examination question 01 is objective item from item database, and " objective item " inputted with user is matched, so examination
The subjective and objective topic type parameter matching value of topic 01 is 200 points.When subjective and objective topic type and the user of examination question 01 input it is subjective and objective
When topic type parameter is mismatched or when user does not input subjective and objective topic type parameter, subjective and objective topic type parameter matching value is 0 point.
3) item difficulty parameter matching value is calculated
Inquire about and learn from parameter matching value metadata table：The item difficulty parameter matching value total score of user preset is 100
Point.Learnt from item database inquiry：The difficulty property value of examination question 01 is 35 points.The item difficulty parameter of user's input is 40
Point.
Item difficulty parameter matches value calculating method：The item difficulty parameter matching value is equal to the item difficulty parameter
Total score subtracts item difficulty absolute value, and the item difficulty value and the examination question that the item difficulty absolute value is equal to per pass examination question are difficult
Spend the absolute value of the difference of parameter.
According to the calculation formula of item difficulty parameter matching value, item difficulty parameter matching value=100- of examination question 01 | 35-
40 |=95.
4) the examination question matching value of per pass examination question is calculated
Examination question matching value=knowledge point parameter matching value+subjective and objective topic type parameter matching value+item difficulty parameter matching
Value.
The subjective and objective topic type parameter of knowledge point parameter matching value+examination question 01 of examination question matching value=examination question 01 of examination question 01
Item difficulty parameter matching value=50+200+95=345 of matching value+examination question 01 points.
, can be to the examination questions of all examination questions in item database by the above-mentioned computational methods to the examination question matching value of examination question 01
Calculated with value, can finally obtain the examination question matching value of all examination questions in item database, the examination question of all examination questions is matched
Value is saved in examination question matching value tables of data, and examination question matching value tables of data includes three fields：Examination question ID, examination question duration, examination question
Matching value.
Final examination question matching value tables of data, it is as shown in the table：
| Examination question ID | Examination question duration (minute) | Examination question matching value |
| Examination question 11 | 6 | 395 |
| Examination question 07 | 5 | 395 |
| Examination question 12 | 2 | 395 |
| Examination question 02 | 2 | 389 |
| Examination question 01 | 5 | 345 |
| Examination question 06 | 1 | 340 |
| Examination question 08 | 2 | 329 |
| Examination question 05 | 4 | 281 |
| Examination question 09 | 8 | 189 |
| Examination question 03 | 15 | 164 |
| Examination question 04 | 10 | 84 |
| Examination question 09 | 8 | 62 |
3rd step, the examination question matching value in matching value tables of data is descending to be ranked up to all examination questions,
All examination questions after sequence are added up according to the descending order of the examination question matching value, successively the examination question duration of per pass examination question
Total operation time is obtained, when the difference of total operation time and the operation time parameter is minimum and total operation time is small
When the operation time parameter, obtained from matching value tables of data after add up corresponding with total operation time
All examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
In the case of the examination question matching value identical, further according to per pass examination question examination question duration from long to short to all examinations
Topic is ranked up.Learnt from matching value tables of data：The examination question matching value of examination question 07, examination question 11 and examination question 12 is all 395, can root
It is ranked up from long to short according to the examination question duration of examination question 07,11,12.
This subjob distribution in user input operation time parameter be 20 minutes, it requires total operation time be less than or
Equal to 20 minutes and difference is minimum.
The examination question duration of examination question duration+examination question 02 of examination question duration+examination question 12 of examination question duration+examination question 07 of examination question 11+
Examination question duration=20 minute of examination question 01, total operation time is 0 and equal to the operation time of user's input with operation time difference
Parameter, meets the requirement of operation distribution, and above-mentioned acquisition result is saved in examination question distribution tables of data, examination question is distributed into tables of data
User is distributed to, the distribution of examination question is this completes.
Final examination question distribution tables of data is as shown in the table：
| Examination question ID | Examination question duration (minute) | Examination question matching value |
| Examination question 11 | 6 | 395 |
| Examination question 07 | 5 | 395 |
| Examination question 12 | 2 | 395 |
| Examination question 02 | 2 | 389 |
| Examination question 01 | 5 | 345 |
Here is the example of acquisition system of the present invention.Obtain system by the item database examination question and obtain out and meet operation
The examination question of distribution conditions.
The parameter acquisition module 1：Parameter for obtaining user's input, the parameter includes knowledge point parameter, examination question
Difficult parameters, subjective and objective topic type parameter and operation time parameter, item database is set up according to examination question and examination question attribute.
Parameter acquisition module is used for the parameter for obtaining user's input, knowledge point parameter, operation time parameter, item difficulty ginseng
Number is the parameter that user must input, wherein subjective and objective topic type parameter is optional parameters.
The parameter that user inputs is saved in multiple variables by system, and a parameter is protected using a variable
Deposit.Wherein, if knowledge point parameter includes between multiple knowledge points, knowledge point being separated using "@".For example, obtaining
Knowledge point include：2 knowledge points of trigonometric function and equation, then the value that the knowledge point parameter is saved in variable is exactly " three
Angle function@equations ".
The examination question matching value computing module 2：For calculating item database respectively according to the parameter and examination question attribute
The examination question matching value of middle per pass examination question, and the examination question matching value is saved in matching value tables of data, the matching Value Data
Table includes three field examination question ID, examination question duration and examination question matching value.
Matching value tables of data is set up, the examination question matching value for preserving all examination questions in item database.Examination question matching value
Tables of data includes three fields：Examination question ID, examination question duration and examination question matching value.
Examination question matching value=knowledge point parameter matching value+subjective and objective topic type parameter matching value+item difficulty parameter matching
Value.
Calculation knowledge point parameter matching value.
Calculate subjective and objective topic type parameter matching value.
Calculate item difficulty parameter matching value.
Finally, the examination question ID learnt, examination question duration and examination question matching value will be inquired about in examination question tables of data to be saved in together
With in Value Data table.
The examination question acquisition module 3：It is descending to institute for the examination question matching value in matching value tables of data
There is examination question to be ranked up, all examination questions after sequence are added up often according to the descending order of the examination question matching value, successively
The examination question duration of road examination question obtains total operation time, when the difference of total operation time and the operation time parameter is minimum and
When total operation time is less than or equal to the operation time parameter, when being obtained from matching value tables of data with total operation
All examination questions after corresponding add up are grown, all examination questions got are saved in examination question distribution tables of data and exported.
When the examination question matching value is identical, all examination questions are arranged from long to short according to the examination question duration of per pass examination question
Sequence.Examination question distribution tables of data is set up, meets the examination question data result that distribution is required for preserving last obtain out, and tie obtaining
Fruit is saved in examination question distribution tables of data, is finally distributed to user.
It by embodiment of above, can effectively solve that automated intelligent acquisition examination question can not be carried out in conditional electronic operating system
The drawbacks of, user need to only input examination question parameter, and system can obtain out the examination question data being most consistent from database automatically, significantly
The workload of user's manual arrangement operation is alleviated, operating efficiency is improved.
The foregoing is only presently preferred embodiments of the present invention, be not intended to limit the invention, it is all the present invention spirit and
Within principle, any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.
Claims (8)
1. a kind of item database examination question acquisition methods, comprise the following steps：
The first step, obtains the parameter of user's input, and the parameter includes knowledge point parameter, item difficulty parameter, subjective and objective topic class
Shape parameter and operation time parameter, item database is set up according to examination question and examination question attribute；
Second step, the examination question matching value of per pass examination question in item database is calculated according to the parameter and examination question attribute respectively, and
The examination question matching value is saved in matching value tables of data, the matching value tables of data includes three field examination question ID, examination questions
Duration and examination question matching value；
3rd step, the examination question matching value in matching value tables of data is descending to be ranked up to all examination questions, will be arranged
Added up according to the descending order of the examination question matching value, the successively examination question duration of per pass examination question of all examination questions after sequence is obtained
Total operation time, when the difference of total operation time and the operation time parameter is minimum and total operation time is less than or
During equal to the operation time parameter, obtain all after add up corresponding with total operation time from matching value tables of data
Examination question, all examination questions got are saved in examination question distribution tables of data and exported.
2. item database examination question acquisition methods according to claim 1, it is characterised in that before the first step, also wrap
Include the knowledge point parameter total score, item difficulty parameter total score and subjective and objective topic type parameter total score of user preset, be stored in ginseng
In number matching value metadata table.
3. item database examination question acquisition methods according to claim 2, it is characterised in that the examination question matching value is equal to
Knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum；The examination question attribute
Including knowledge point number, item difficulty value, subjective and objective topic type and examination question duration；
The knowledge point parameter matching value is equal to the knowledge point parameter that the knowledge point parameter total score divided by user input
Number obtains quotient and by obtained quotient multiplied by the knowledge point parameter actual match inputted with per pass examination question and user
Knowledge point number, the quotient retains two precision；
If the subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input is matched, described subjective and objective
It is main objective item type parameter total score to inscribe type parameter matching value；Otherwise the subjective and objective topic type parameter matching value is O；
The item difficulty parameter matching value subtracts item difficulty absolute value, the examination question equal to the item difficulty parameter total score
Difficulty absolute value is equal to the absolute value of the item difficulty value of per pass examination question and the difference of the item difficulty parameter.
4. item database examination question acquisition methods according to claim 1, it is characterised in that when the examination question matching value phase
Meanwhile, all examination questions are ranked up from long to short according to the examination question duration of per pass examination question.
5. a kind of item database examination question obtains system, including parameter acquisition module (1), examination question matching value computing module (2) and
Examination question acquisition module (3)；
The parameter acquisition module (1) is used for the parameter for obtaining user's input, and the parameter includes knowledge point parameter, item difficulty
Parameter, subjective and objective topic type parameter and operation time parameter, item database is set up according to examination question and examination question attribute；
The examination question matching value computing module (2) is used to calculate every in item database respectively according to the parameter and examination question attribute
The examination question matching value of road examination question, and the examination question matching value is saved in matching value tables of data, the matching value tables of data bag
Include three field examination question ID, examination question duration and examination question matching value；
The examination question matching value that the examination question acquisition module (3) is used in matching value tables of data is descending to all examinations
Topic is ranked up, and all examination questions after sequence are added up according to the descending order of the examination question matching value, successively per pass examination
The examination question duration of topic obtains total operation time, when the difference of total operation time and the operation time parameter is minimum and described
When total operation time is less than or equal to the operation time parameter, obtained and total operation time pair from matching value tables of data
Answer it is cumulative after all examination questions, all examination questions got are saved in examination question distribution tables of data and exported.
6. item database examination question according to claim 5 obtains system, it is characterised in that before the first step, also wrap
Include the knowledge point parameter total score, item difficulty parameter total score and subjective and objective topic type parameter total score of user preset, be stored in ginseng
In number matching value metadata table.
7. item database examination question according to claim 6 obtains system, it is characterised in that the examination question matching value is equal to
Knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum；The examination question attribute
Including knowledge point number, item difficulty value, subjective and objective topic type and examination question duration；
The knowledge point parameter matching value is equal to the knowledge point parameter that the knowledge point parameter total score divided by user input
Number obtains quotient and by obtained quotient multiplied by the knowledge point parameter actual match inputted with per pass examination question and user
Knowledge point number, the quotient retains two precision；
If the subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input is matched, described subjective and objective
It is main objective item type parameter total score to inscribe type parameter matching value；Otherwise the subjective and objective topic type parameter matching value is O；
The item difficulty parameter matching value subtracts item difficulty absolute value, the examination question equal to the item difficulty parameter total score
Difficulty absolute value is equal to the absolute value of the item difficulty value of per pass examination question and the difference of the item difficulty parameter.
8. item database examination question according to claim 5 obtains system, it is characterised in that when the examination question matching value phase
Meanwhile, all examination questions are ranked up from long to short according to the examination question duration of per pass examination question.
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