CN104376042A - Method and system for acquiring test questions from test question database - Google Patents
Method and system for acquiring test questions from test question database Download PDFInfo
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Abstract
The invention relates to a method and system for acquiring test questions from a test question database. The method comprises the steps of acquiring parameters input by a user; calculating a test question match value of each test question in the test question database according to the parameters and test question attributes, and saving the test question match values in a match value data sheet; ranking all the test questions according to the descending order of the test question match values in the match value data sheet, obtaining the total working time by accumulating the working time of all the test questions ranked according to descending order of the test question match values, acquiring all the accumulated test questions corresponding to the total working time from the match value data sheet when the difference between the total working time and the working time parameter is minimum and the total working time is smaller than or equal to the working time parameter, and saving all the acquired test questions in a test question distribution data sheet and outputting the test questions.
Description
Technical field
The present invention relates to data query field, particularly relate to a kind of item database examination question acquisition methods and system.
Background technology
In IT application in education sector system, more and more pay attention to the application to item database, item database is also more and more developed.Setting up the object of item database, is to be undertaken making the test, arranging the operations such as operation by the examination question data in item database.
In current item database application case, user is making the test or is arranging in the work such as operation, all manually in item database, choose examination question, or by some simple querying conditions of input, reduce the scope of examination question data, and then manually select some examination questions to carry out making the test or arranging operation.By such method, although the simple acquisition of examination question data can be carried out by assisted user, there is user's manual screening examination question workload large, the problem that search efficiency is low.
How to pass through examination question data parameters, realize the examination question data acquisition of automated intelligent, solving user in traditional mode needs the mode of manually setting a question, and improve examination question efficiency data query, this is technical matters to be solved by this invention.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of item database examination question acquisition methods and system, and the method can reduce the workload of user's manual screening examination question data, improves search efficiency.
For solving the problems of the technologies described above, item database examination question acquisition methods of the present invention comprises the following steps:
The first step, obtain the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute;
Second step, the examination question matching value of per pass examination question in item database is calculated respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values;
3rd step, according to the described examination question matching value in matching value tables of data is descending, all examination questions are sorted, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
The invention has the beneficial effects as follows: as long as by above method user input parameter, the automatic acquisition that just can realize examination question data with mate, match examination question data that the parameter that inputs with user conforms to most and automatically export examination question data, reduce the workload that user manually chooses examination question data, improve search efficiency.
On the basis of technique scheme, the present invention can also do following improvement:
Further, before the first step, also comprise the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
Further, described examination question matching value equals knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum; Described examination question attribute comprises knowledge point number, item difficulty value, subjective and objective topic type and examination question duration;
The number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision;
If the described subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O;
Described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.
Further, when described examination question matching value is identical, from long to short all examination questions are sorted according to the examination question duration of per pass examination question.
The beneficial effect of above-mentioned further scheme is adopted to be that the present invention is in the process of carrying out the acquisition of item database examination question, examination question matching value is calculated by parameter, the operation expression relevant by examination question matching value carries out examination question data query, not only reduce the workload of user's manual screening examination question data, and improve search efficiency.
For solving the problems of the technologies described above, item database examination question of the present invention obtains system and comprises: parameter acquisition module, examination question matching value computing module and examination question acquisition module;
Described parameter acquisition module is for obtaining the parameter of user's input, and described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute;
Described examination question matching value computing module is used for the examination question matching value calculating per pass examination question in item database according to described parameter and examination question attribute respectively, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values;
Described examination question acquisition module is used for sorting to all examination questions according to the described examination question matching value in matching value tables of data is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
The invention has the beneficial effects as follows: pass through input parameter by this system user, the automatic acquisition that just can realize examination question data with mate, match examination question data that the parameter that inputs with user conforms to most and export examination question data result, reduce the workload that user manually chooses examination question data, improve search efficiency.
Further, before the first step, also comprise the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
Further, described examination question matching value equals knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum; Described examination question attribute comprises knowledge point number, item difficulty value, subjective and objective topic type and examination question duration;
The number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision;
If the described subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O;
Described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.
Further, when described examination question matching value is identical, from long to short all examination questions are sorted according to the examination question duration of per pass examination question.
The beneficial effect of above-mentioned further scheme is adopted to be that the present invention is carrying out in item database examination question acquisition process, examination question matching value is calculated by examination question matching value computing module, the operation expression relevant by examination question matching value carries out examination question data query, not only reduce the workload of user's manual screening examination question data, and improve search efficiency.
Accompanying drawing explanation
Fig. 1 is item database examination question acquisition methods process flow diagram of the present invention;
Fig. 2 is the process flow diagram of the second step of step shown in Fig. 1;
Fig. 3 is the process flow diagram of the step of step the three shown in Fig. 1;
Fig. 4 is that item database examination question of the present invention obtains system construction drawing
In accompanying drawing, the list of parts representated by each label is as follows:
1, parameter acquisition module, 2, examination question matching value computing module, 3, examination question acquisition module.
Embodiment
Be described principle of the present invention and feature below in conjunction with accompanying drawing, example, only for explaining the present invention, is not intended to limit scope of the present invention.
Fig. 1 shows item database examination question acquisition methods flow process in one embodiment of the invention.Comprise the following steps:
The first step, obtain the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute.
Second step, the examination question matching value of per pass examination question in item database is calculated respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
3rd step, according to the described examination question matching value in matching value tables of data is descending, all examination questions are sorted, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
Before the first step, also comprise the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
Concrete, set up parameter matching value metadata table, by the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
In a first step, obtain the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute.
Concrete, obtain the examination question parameter of user's input.Described parameter comprises: knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter.Wherein knowledge point parameter, operation time parameter and item difficulty parameter are the parameters that user must input, and subjective and objective topic type parameter is optional parameter.
Item database comprises examination question and examination question attribute, and the examination question attribute of per pass examination question comprises: examination question ID, knowledge point number, item difficulty value, subjective and objective topic type and examination question duration.
First, when user is in interface after input parameter, the parameter that user inputs is kept in multiple variable by system automatically, and a parameter adopts a variable to preserve.If knowledge point parameter comprises multiple knowledge point, then "@" is adopted to separate between knowledge point.Such as, knowledge point parameter comprises: trigonometric function and equation 2 knowledge points, and so this knowledge point parameter value be saved in variable is exactly " trigonometric function@equation ".
Fig. 2 is the process flow diagram of the second step of step shown in Fig. 1, comprises the following steps:
In second step, the examination question matching value of per pass examination question in item database is calculated respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
Concrete, set up matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
The examination question matching value of per pass examination question equals the knowledge point parameter matching value of per pass examination question, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum.
The computing method of knowledge point parameter matching value: the number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision.Knowledge point parameter total score is by User Defined.
Subjective and objective topic type parameter matching value computing method: if the described subjective and objective topic type parameter that the subjective and objective topic type of per pass examination question and user input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O.Subjective and objective topic type parameter total score is by User Defined.
Item difficulty parameter matching value calculating method: described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.Item difficulty parameter total score is by User Defined.
Finally, the summation of the knowledge point parameter matching value of per pass examination question, subjective and objective topic type parameter matching value and item difficulty parameter matching value is obtained the examination question matching value of per pass examination question.The examination question ID inquired from item database, examination question duration are saved in matching value tables of data together with the examination question matching value calculated.
Fig. 3 is the process flow diagram of middle step the three step embodiment illustrated in fig. 1.Comprise the following steps:
In the third step, according to the described examination question matching value in matching value tables of data is descending, all examination questions are sorted, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
Concrete: the examination question in matching value tables of data is sorted to all examination questions according to examination question matching value is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when described total operation time and described operation time parameter difference is minimum and described total operation time is less than or equal to described operation time parameter time, by corresponding with described total operation time cumulative after all examination questions to be saved in as a result in examination question distributing data table and to export.
Fig. 4 shows item database examination question in one embodiment of the present of invention and obtains the structure of system.This system comprises parameter acquisition module 1, examination question matching value computing module 2 and examination question acquisition module 3.
Described parameter acquisition module 1 is for obtaining the parameter of user's input, and described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute.
Item database comprises examination question and examination question attribute, and the examination question attribute of per pass examination question comprises: examination question ID, knowledge point number, item difficulty value, subjective and objective topic type and examination question duration.
Wherein, knowledge point parameter, operation time parameter and item difficulty parameter are the parameters that user must input, and subjective and objective topic type parameter is optional parameter.
The described parameter that user inputs by system is saved in multiple variable, and a parameter adopts a variable to preserve.If knowledge point parameter comprises multiple knowledge point, then "@" is adopted to separate between knowledge point.
Described examination question matching value computing module 2 is for calculating the examination question matching value of per pass examination question in item database respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
Concrete, set up examination question matching value tables of data, examination question matching value tables of data comprises three field examination question ID, examination question duration and examination question matching value.
The examination question matching value of per pass examination question equals the knowledge point parameter matching value of per pass examination question, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum.
The computing method of knowledge point parameter matching value: the number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision.Knowledge point parameter total score is by User Defined.
Subjective and objective topic type parameter matching value computing method: if the described subjective and objective topic type parameter that the subjective and objective topic type of per pass examination question and user input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O.Subjective and objective topic type parameter total score is by User Defined.
Item difficulty parameter matching value calculating method: described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.Item difficulty parameter total score is by User Defined.
Finally, the summation of the knowledge point parameter matching value of per pass examination question, subjective and objective topic type parameter matching value and item difficulty parameter matching value is obtained the examination question matching value of per pass examination question.The examination question ID inquired from item database, examination question duration are saved in matching value tables of data together with the examination question matching value calculated.
Described examination question acquisition module 3 is for sorting to all examination questions according to the described examination question matching value in matching value tables of data is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
Concrete: set up examination question distributing data table, for preserving the satisfactory examination question data result finally inquired.Examination question distributing data table comprises three field examination question ID, examination question duration and examination question matching value.
All examination questions in matching value tables of data are sorted to all examination questions according to examination question matching value is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum, and described total operation time is when being less than or equal to described operation time parameter, by corresponding with described total operation time cumulative after all examination questions to be saved in as a result in examination question distributing data table and to export.
Here is the example of acquisition methods of the present invention, simulates the operation distribution parameters that an item database inputs according to user, obtains out qualified examination question data.
Known item database, item database comprises examination question and examination question attribute, and examination question attribute comprises: examination question ID, knowledge point number, item difficulty value, subjective and objective topic type and examination question duration.As shown in the table:
Known knowledge-ID tables of data, the knowledge point that knowledge-ID tables of data display per pass examination question comprises, as shown in the table:
| Examination question ID | Knowledge point 01 | Knowledge point 02 | Knowledge point 03 | Knowledge point 04 | Knowledge point 05 |
| Examination question 01 | Triangle neutrality line theorem | Angular bisector character | Parallel lines character | ||
| Examination question 02 | Parallel lines character | Corresponding angle and alternate interior angle | |||
| Examination question 03 | Parallel lines character | Corresponding angle and alternate interior angle | Complementary angle and supplementary angle | Isosceles triangle | Vertical line |
| Examination question 04 | Equation character | Quadratic equation with one unknown | Root and Relationship of Coefficients | Linear equation with one unknown | |
| Examination question 05 | There is ordinal number pair | Sine function sin | Cosine function cos | ||
| Examination question 06 | Corresponding angle and alternate interior angle | ||||
| Examination question 07 | Corresponding angle and alternate interior angle | Parallel lines character | |||
| Examination question 08 | Parallel lines character | ||||
| Examination question 09 | Parallel lines character | Corresponding angle and alternate interior angle | Internal angles on the same side | ||
| Examination question 10 | Right-angle triangle | Pythagorean theorem | Sine function sin | Tan tan | |
| Examination question 11 | Corresponding angle and alternate interior angle | Parallel lines character | Angular bisector character | ||
| Examination question 12 | Corresponding angle and alternate interior angle | Parallel lines character |
[0079]first, by the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.As shown in the table:
| param_name | param_sum |
| Knowledge point parameter total score | 100 |
| Subjective and objective topic type parameter total score | 200 |
| Item difficulty parameter total score | 100 |
In parameter matching value metadata table, param_name preserves parameter name, and param_sum preserves parameter matching value total score.
The first step, obtain the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter.
Before acquisition examination question data, user inputs following parameter:
1, corresponding angle and alternate interior angle knowledge point parameter: two knowledge points, respectively: the 1) character 2 of parallel lines)
2, subjective and objective type parameter: objective item
3, item difficulty parameter: 40
4, operation time parameter: 20 minutes.
Wherein, knowledge point parameter, item difficulty parameter, operation time parameter are the parameter that user must input, and subjective and objective topic type parameter is optional parameter.
Second step, the examination question matching value of per pass examination question in item database is calculated respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
For the per pass examination question in item database, according to the parameter of user's input and the examination question matching value of examination question property calculation per pass examination question: the examination question matching value of per pass examination question equals the knowledge point parameter matching value of per pass examination question, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum.
For examination question 01, introduce the computation process of examination question matching value:
1) calculation knowledge point parameter matching value
Inquire about from parameter matching value metadata table and learn: the knowledge point parameter matching value total score of user preset is 100 points.
The computing method of knowledge point parameter matching value: the number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again.
Learn from the inquiry of knowledge-ID tables of data: user have input 2 knowledge point parameters, " character of parallel lines " and " corresponding angle and alternate interior angle " respectively, wherein examination question 01 has only included " character of parallel lines " knowledge point, namely examination question 01 is actual 1 knowledge point and knowledge point parameter matching, so the knowledge point parameter matching value of examination question 01 is 50 points.
The knowledge point parameter matching value of examination question 01 equals knowledge point parameter matching value total score and obtains quotient divided by the knowledge point number of parameters that user inputs and the knowledge point number quotient obtained being multiplied by again the knowledge point parameter actual match that examination question 01 inputs with user, the i.e. knowledge point parameter matching value=100/2*1=50 of examination question 01, namely the knowledge point parameter matching value of examination question 01 is 50 points.
If user have input 3 knowledge points, the every actual match of per pass examination question 1 knowledge point then knowledge point parameter matching value is 33.33, and knowledge point parameter matching value retains two precision.
2) subjective and objective topic type parameter matching value is calculated
Inquire about from parameter matching value metadata table and learn: the subjective and objective topic type parameter matching value total score of user preset is 200 points.
Subjective and objective topic type parameter matching value computing method: if the described subjective and objective topic type parameter that the subjective and objective topic type of per pass examination question and user input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O.
From item database, inquiry learns that examination question 01 is objective item, mates, so the subjective and objective topic type parameter matching value of examination question 01 is 200 points with " objective item " that user inputs.When the subjective and objective topic type of examination question 01 is not mated with the subjective and objective topic type parameter that user inputs or when user does not input subjective and objective topic type parameter, subjective and objective topic type parameter matching value is 0 point.
3) item difficulty parameter matching value is calculated
Inquire about from parameter matching value metadata table and learn: the item difficulty parameter matching value total score of user preset is 100 points.Learn from item database inquiry: the difficulty property value of examination question 01 is 35 points.The item difficulty parameter of user's input is 40 points.
Item difficulty parameter matching value calculating method: described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.
According to the computing formula of item difficulty parameter matching value, the item difficulty parameter matching value=100-|35-40|=95 of examination question 01.
4) the examination question matching value of per pass examination question is calculated
Examination question matching value=knowledge point parameter matching value+subjective and objective topic type parameter matching value+item difficulty parameter matching value.
The item difficulty parameter matching value=50+200+95=345 of the subjective and objective topic type parameter matching value+examination question 01 of the knowledge point parameter matching value+examination question 01 of the examination question matching value=examination question 01 of examination question 01 divides.
By the above-mentioned computing method to examination question 01 examination question matching value, can calculate the examination question matching value of examination questions all in item database, finally can obtain the examination question matching value of all examination questions in item database, the examination question matching value of all examination questions is saved in examination question matching value tables of data, examination question matching value tables of data comprises three fields: examination question ID, examination question duration, examination question matching value.
Final examination question matching value tables of data, as shown in the table:
| Examination question ID | Examination question duration (minute) | Examination question matching value |
| Examination question 11 | 6 | 395 |
| Examination question 07 | 5 | 395 |
| Examination question 12 | 2 | 395 |
| Examination question 02 | 2 | 389 |
| Examination question 01 | 5 | 345 |
| Examination question 06 | 1 | 340 |
| Examination question 08 | 2 | 329 |
| Examination question 05 | 4 | 281 |
| Examination question 09 | 8 | 189 |
| Examination question 03 | 15 | 164 |
| Examination question 04 | 10 | 84 |
| Examination question 09 | 8 | 62 |
3rd step, according to the described examination question matching value in matching value tables of data is descending, all examination questions are sorted, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
When described examination question matching value is identical, more from long to short all examination questions are sorted according to the examination question duration of per pass examination question.Learn from matching value tables of data: the examination question matching value of examination question 07, examination question 11 and examination question 12 is all 395, can sort from long to short according to the examination question duration of examination question 07,11,12.
In this subjob distribution, the operation time parameter of user's input is 20 minutes, so require that total operation time is less than or equal to 20 minutes and difference is minimum.
Examination question duration=20 minute of the examination question duration+examination question 01 of the examination question duration+examination question 02 of the examination question duration+examination question 12 of the examination question duration+examination question 07 of examination question 11, total operation time and operation time difference are 0 and equal the operation time parameter that user inputs, meet the requirement of operation distribution, above-mentioned acquisition result is saved in examination question distributing data table, examination question distributing data table is distributed to user, this completes the distribution of examination question.
Final examination question distributing data table is as shown in the table:
| Examination question ID | Examination question duration (minute) | Examination question matching value |
| Examination question 11 | 6 | 395 |
| Examination question 07 | 5 | 395 |
| Examination question 12 | 2 | 395 |
| Examination question 02 | 2 | 389 |
| Examination question 01 | 5 | 345 |
Here is the example that the present invention obtains system.Obtain system by this item database examination question and obtain out the examination question meeting operation distribution conditions.
Described parameter acquisition module 1: for obtaining the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute.
Parameter acquisition module is for obtaining the parameter of user's input, and knowledge point parameter, operation time parameter, item difficulty parameter are the parameters that user must input, and wherein subjective and objective topic type parameter is optional parameter.
The described parameter that user inputs by system is saved in multiple variable, and a parameter adopts a variable to preserve.Wherein, if knowledge point parameter comprises multiple knowledge point, then "@" is adopted to separate between knowledge point.Such as, the knowledge point of acquisition comprises: trigonometric function and equation 2 knowledge points, and so this knowledge point parameter value be saved in variable is exactly " trigonometric function@equation ".
Described examination question matching value computing module 2: for calculating the examination question matching value of per pass examination question in item database respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values.
Set up matching value tables of data, for preserving the examination question matching value of all examination questions in item database.Examination question matching value tables of data comprises three fields: examination question ID, examination question duration and examination question matching value.
Examination question matching value=knowledge point parameter matching value+subjective and objective topic type parameter matching value+item difficulty parameter matching value.
Calculation knowledge point parameter matching value.
Calculate subjective and objective topic type parameter matching value.
Calculate item difficulty parameter matching value.
Finally, be saved in inquiring about examination question ID, the examination question duration learnt in examination question tables of data in matching value tables of data together with examination question matching value.
Described examination question acquisition module 3: for sorting to all examination questions according to the described examination question matching value in matching value tables of data is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
When described examination question matching value is identical, from long to short all examination questions are sorted according to the examination question duration of per pass examination question.Set up examination question distributing data table, for preserving the examination question data result finally obtaining out and meet distribution and require, and acquisition result being saved in examination question distributing data table, being finally distributed to user.
By above embodiment, effectively can solve in conditional electronic operating system and cannot carry out the drawback that automated intelligent obtains examination question, user only need input examination question parameter, system can obtain out the examination question data conformed to most automatically from database, significantly reduce the workload of user's manual arrangement operation, improve work efficiency.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. an item database examination question acquisition methods, comprises the following steps:
The first step, obtain the parameter of user's input, described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute;
Second step, the examination question matching value of per pass examination question in item database is calculated respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values;
3rd step, according to the described examination question matching value in matching value tables of data is descending, all examination questions are sorted, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
2. item database examination question acquisition methods according to claim 1, it is characterized in that, before the first step, also comprise the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
3. item database examination question acquisition methods according to claim 2, is characterized in that, described examination question matching value equals knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum; Described examination question attribute comprises knowledge point number, item difficulty value, subjective and objective topic type and examination question duration;
The number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision;
If the described subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O;
Described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.
4. item database examination question acquisition methods according to claim 1, is characterized in that, when described examination question matching value is identical, sorts from long to short according to the examination question duration of per pass examination question to all examination questions.
5. item database examination question obtains a system, comprises parameter acquisition module (1), examination question matching value computing module (2) and examination question acquisition module (3);
Described parameter acquisition module (1) is for obtaining the parameter of user's input, and described parameter comprises knowledge point parameter, item difficulty parameter, subjective and objective topic type parameter and operation time parameter, sets up item database according to examination question and examination question attribute;
Described examination question matching value computing module (2) is for calculating the examination question matching value of per pass examination question in item database respectively according to described parameter and examination question attribute, and described examination question matching value is saved in matching value tables of data, described matching value tables of data comprises three field examination question ID, examination question duration and examination question matching values;
Described examination question acquisition module (3) is for sorting to all examination questions according to the described examination question matching value in matching value tables of data is descending, by all examination questions after sequence according to the descending order of described examination question matching value, the examination question duration of cumulative per pass examination question obtains total operation time successively, when the difference of described total operation time and described operation time parameter is minimum and described total operation time is less than or equal to described operation time parameter, the all examination questions after corresponding with described total operation time adding up are obtained from matching value tables of data, the all examination questions got to be saved in examination question distributing data table and to export.
6. item database examination question according to claim 5 obtains system, it is characterized in that, before the first step, also comprise the knowledge point parameter total score of user preset, item difficulty parameter total score and subjective and objective topic type parameter total score, be kept in parameter matching value metadata table.
7. item database examination question according to claim 6 obtains system, and it is characterized in that, described examination question matching value equals knowledge point parameter matching value, subjective and objective topic type parameter matching value and item difficulty parameter matching value sum; Described examination question attribute comprises knowledge point number, item difficulty value, subjective and objective topic type and examination question duration;
The number that described knowledge point parameter matching value equals the described knowledge point parameter that described knowledge point parameter total score inputs divided by user obtains quotient and the quotient obtained is multiplied by the knowledge point number of the described knowledge point parameter actual match that per pass examination question and user input again, and described quotient retains two precision;
If the described subjective and objective topic type parameter that subjective and objective topic type and the user of per pass examination question input mates, then described subjective and objective topic type parameter matching value is subjective and objective topic type parameter total score; Otherwise described subjective and objective topic type parameter matching value is O;
Described item difficulty parameter matching value equals described item difficulty parameter total score and deducts item difficulty absolute value, and described item difficulty absolute value equals the absolute value of the item difficulty value of per pass examination question and the difference of described item difficulty parameter.
8. item database examination question according to claim 5 obtains system, it is characterized in that, when described examination question matching value is identical, sorts from long to short according to the examination question duration of per pass examination question to all examination questions.
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