CN104374778A - Optical system of low-temperature scanning laser microscope - Google Patents
Optical system of low-temperature scanning laser microscope Download PDFInfo
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- CN104374778A CN104374778A CN201410694429.5A CN201410694429A CN104374778A CN 104374778 A CN104374778 A CN 104374778A CN 201410694429 A CN201410694429 A CN 201410694429A CN 104374778 A CN104374778 A CN 104374778A
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- laser
- optical system
- circulator
- laser microscope
- optical fiber
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- 230000003287 optical effect Effects 0.000 title claims abstract description 28
- 239000013307 optical fiber Substances 0.000 claims abstract description 24
- 238000002955 isolation Methods 0.000 claims description 3
- 230000005611 electricity Effects 0.000 abstract description 2
- 239000000463 material Substances 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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Abstract
The invention discloses an optical system of a low-temperature scanning laser microscope. The optical system comprises a laser device, a circulator, a photoelectric detector, an optical fiber and a gradient refractive index prism, wherein the laser device, the photoelectric detector and the optical fiber are connected with the circulator; the gradient refractive index prism is connected with the optical fiber. According to the optical system of the low-temperature scanning laser microscope, by the use of the circulator and the gradient refractive index prism, the complexity of the optical system and the corresponding size of the optical system are effectively reduced, so that the optical system can be conveniently integrated in the scanning laser microscope; when the optical system is applied to the scanning laser microscope, the physical phenomena which generate in small-size instruments with specific requirements on the working temperature and are relevant to thermology and electricity can be researched, and the use demand can be met.
Description
Technical field
The invention belongs to the mini-plant technical field for studying microscopic mechanism, being specifically related to a kind of optical system of scanned-laser microscope.
Background technology
Along with the development of micro-processing technology, the size of electronic devices and components has arrived micron or even nanometer scale.Due to the reduction of device dimension, no matter be based semiconductor material, or the electron device of based superconductive material, its inner thermal phenomenon existed all has important impact to devices function state.Some special electron device, is determined by its material, and under must operate at extreme condition (superconductive electronic device as based superconductive material need be operated in low temperature environment), at this moment the impact of thermal effect is just more remarkable.While utilizing these device macroeffects (the terahertz emission source as based on BSCCO high temperature superconducting materia), wish the micromechanism more in depth studying these devices function, its inside from thermal phenomenon, the distribution of electromagnetic field etc. affect device performance various factors.But the size of these electron devices and operational temperature conditions, propose harsh requirement to the micromechanism of its inside of research.Existing research equipment, can't meet user demand completely.
Summary of the invention
Goal of the invention: for the deficiencies in the prior art, the object of the present invention is to provide a kind of optical system of scanned-laser microscope, use circulator and graded index prism, effectively reduce optical system complexity and corresponding volume, meet user demand.
Technical scheme: in order to realize foregoing invention object, the technical solution used in the present invention is:
An optical system for scanned-laser microscope, comprises laser instrument, circulator, photodetector, optical fiber and graded index prism; Described laser instrument, photodetector are all connected with circulator with optical fiber, and described graded index prism is connected with optical fiber.
Described circulator is for the laser of isolation laser device outgoing and the laser that reflects from sample; Be coupled to optical fiber from the laser of laser emitting by circulator, the laser reflected from sample is coupled on photodetector through circulator.
Described photodetector is for detecting the light intensity of the laser reflected from sample.
The thermostat that described graded index prism is located at scanned-laser microscope is inner.
The thermostat that described circulator is located at scanned-laser microscope is outside.
Described graded index prism is the hot spot of 1 micron by becoming size from the Laser Focusing of outgoing on optical fiber.
The optical system of scanned-laser microscope of the present invention, the laser of laser emitting is by after circulator, optical fiber, graded index prism, the hot spot that size is about 1 micron can be obtained, this hot spot can carry out spot heating to the sample of scanned-laser microscope research, thus observes calorifics and the electrical signal of sample.From sample surfaces reflection laser after graded index prism, optical fiber, circulator, accepted by photodetector, the optical imagery of sample surfaces can be obtained thus.
Beneficial effect: compared with prior art, remarkable advantage of the present invention comprises: the optical system of this scanned-laser microscope, use circulator and graded index prism, efficiently reduce optical system complexity and corresponding volume, be convenient to be integrated in scanned laser microscope inner, for in low temperature scanning laser microscope, thus the calorifics physical phenomenon relevant with electricity small size can studied, have the device inside of specific requirement to occur to working temperature, meet user demand.
Accompanying drawing explanation
Fig. 1 is the structural representation of the optical system of scanned-laser microscope.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described further.
As shown in Figure 1, the optical system of scanned-laser microscope, primary structure comprises laser instrument 1, circulator 2, photodetector 3, optical fiber 4 and graded index prism 5.Laser instrument 1, photodetector 3 are all connected with circulator 2 with optical fiber 4, and graded index prism 5 is connected with optical fiber 4.Wherein, the thermostat that graded index prism 5 is located at low temperature scanning laser microscope is inner, and the thermostat that circulator 2 is located at scanned-laser microscope is outside, is connected by optical fiber 4.
Laser instrument 1, produces the laser needed for the work of low temperature scanning laser microscope.Circulator 2, for the laser of isolation laser device outgoing and the laser that reflects from sample.Be coupled to optical fiber from the laser of laser emitting by circulator, the laser reflected from sample is coupled on photodetector through circulator.Photodetector 3 is strong for detecting the laser reflected from sample.Optical fiber 4, for transmitting laser, by the Laser Transmission that is coupled into from circulator in graded index prism.Graded index prism 5, for converging, from the laser dispersed that optical fiber is coupled into.The laser of laser instrument 1 outgoing, by after circulator 2, optical fiber 4, graded index prism 5, can obtain the hot spot that size is about 1 micron, and this hot spot can carry out spot heating to the sample of scanned-laser microscope research, thus observes calorifics and the electrical signal of sample.From sample surfaces reflection laser after graded index prism 5, optical fiber 4, circulator 2, accepted by photodetector 3, the optical imagery of sample surfaces can be obtained thus.
This optical system, during work, first opens laser instrument and photodetection.By the mobile displacement platform fixing the scanned-laser microscope of this optical system, laser is focused on sample gradually, read the output valve of photodetector.When the registration of photodetector is maximum, the focus of laser is sitting at the surface of sample.Now, the measurement of scanned-laser microscope can just be carried out.
Claims (6)
1. an optical system for scanned-laser microscope, is characterized in that: comprise laser instrument (1), circulator (2), photodetector (3), optical fiber (4) and graded index prism (5); Described laser instrument (1), photodetector (3) are all connected with circulator (2) with optical fiber (4), and described graded index prism (5) is connected with optical fiber (4).
2. the optical system of scanned-laser microscope according to claim 1, is characterized in that: described circulator (2) is for the laser of isolation laser device (1) outgoing and the laser that reflects from sample; Be coupled to optical fiber (4) from the laser of laser instrument (1) outgoing by circulator (2), the laser reflected from sample is coupled on photodetector (3) through circulator (2).
3. the optical system of scanned-laser microscope according to claim 1, is characterized in that: described photodetector (3) is for detecting the light intensity of the laser reflected from sample.
4. the optical system of scanned-laser microscope according to claim 1, is characterized in that: the thermostat that described graded index prism (5) is located at low temperature scanning laser microscope is inner.
5. the optical system of scanned-laser microscope according to claim 1, is characterized in that: the thermostat that described circulator (2) is located at scanned-laser microscope is outside.
6. optical system according to claim 1, is characterized in that: described graded index prism (5) is the hot spot of 1 micron by becoming size from the Laser Focusing of outgoing on optical fiber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410694429.5A CN104374778A (en) | 2014-11-27 | 2014-11-27 | Optical system of low-temperature scanning laser microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410694429.5A CN104374778A (en) | 2014-11-27 | 2014-11-27 | Optical system of low-temperature scanning laser microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104374778A true CN104374778A (en) | 2015-02-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410694429.5A Pending CN104374778A (en) | 2014-11-27 | 2014-11-27 | Optical system of low-temperature scanning laser microscope |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1987417A (en) * | 2006-12-27 | 2007-06-27 | 浙江大学 | Conic optic fiber beam large range high resolution flexible imaging method and device |
| US20110032614A1 (en) * | 2009-08-04 | 2011-02-10 | Carl Zeiss Microlmaging Gmbh | Optoelectronic detector assembly and method of operating same |
| CN102788772A (en) * | 2012-07-13 | 2012-11-21 | 国电燃料有限公司 | Method for measuring content of powdery substantial elements based on dual pluses |
| CN103033920A (en) * | 2012-12-03 | 2013-04-10 | 苏州大猫单分子仪器研发有限公司 | Far infrared temperature jump microscope |
| CN204287056U (en) * | 2014-11-27 | 2015-04-22 | 南京大学 | A kind of optical system of low temperature scanning laser microscope |
-
2014
- 2014-11-27 CN CN201410694429.5A patent/CN104374778A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1987417A (en) * | 2006-12-27 | 2007-06-27 | 浙江大学 | Conic optic fiber beam large range high resolution flexible imaging method and device |
| US20110032614A1 (en) * | 2009-08-04 | 2011-02-10 | Carl Zeiss Microlmaging Gmbh | Optoelectronic detector assembly and method of operating same |
| CN102788772A (en) * | 2012-07-13 | 2012-11-21 | 国电燃料有限公司 | Method for measuring content of powdery substantial elements based on dual pluses |
| CN103033920A (en) * | 2012-12-03 | 2013-04-10 | 苏州大猫单分子仪器研发有限公司 | Far infrared temperature jump microscope |
| CN204287056U (en) * | 2014-11-27 | 2015-04-22 | 南京大学 | A kind of optical system of low temperature scanning laser microscope |
Non-Patent Citations (1)
| Title |
|---|
| 田兴华: "亚微米光纤探针制备及其对光信号的探测", 《中国优秀博硕士学位论文全文数据库（硕士）信息科技辑》 * |
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Application publication date: 20150225 |
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