CN104374636A - Mobile display terminal-based Leeb hardness tester circuit - Google Patents
Mobile display terminal-based Leeb hardness tester circuit Download PDFInfo
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- CN104374636A CN104374636A CN201410507518.4A CN201410507518A CN104374636A CN 104374636 A CN104374636 A CN 104374636A CN 201410507518 A CN201410507518 A CN 201410507518A CN 104374636 A CN104374636 A CN 104374636A
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Abstract
The invention provides a mobile display terminal-based Leeb hardness tester circuit. The mobile display terminal-based Leeb hardness tester circuit includes a Leeb impact device probe A, an audio plug, a three-core cable and a data acquisition and code modulation circuit module, the data acquisition and code modulation circuit module comprises a data processing circuit, and the data processing circuit includes a U5 microcontroller with the model of MKL05Z32VFK4. The mobile display terminal-based Leeb hardness tester allows a detection result to be displayed through a mobile phone terminal, so the universality of the mobile terminal is fully used, the use rate of the mobile terminal is increased, and the separate production cost of the Leeb hardness tester reduced by 50%; and the adjustment and data processing of the circuit provided by the invention has the characteristics of high automation degree, high measurement accuracy and error limited below 3HLD, so the technical problem that the error of most circuits is 4HLD in the industry is overcome. The problems of individual networking and data backup of Leeb hardness testers are effectively solved by using the Internet technology of the mobile terminal.
Description
Technical field
The present invention relates to technical field of electric appliances, particularly relate to a kind of Leeb Hardness Tester circuit based on mobile display terminal.
Background technology
The form that traditional Leeb Hardness Tester adopts main frame to add percussion mechanism forms hardness detecting instrument, and as a kind of special instrument, this pattern has continued to use decades.But there is following shortcoming in this traditional Leeb Hardness Tester:
1. displaying contents is abundant not, current sclerometer many employings low resolution (normally 128*64) FSTN liquid crystal dot matrix.Although can show some menus and measurement result, if will carry out caulocarpic comparative analysis, can only complete on computers by PC software, this just causes very large inconvenience.
2. conversion table can not unconfinedly expand.Leeb Hardness Tester is widely applied to replace the desktop computers such as Rockwell Bu Shi to carry out scene, online hardness measurement with its portability in industrial detection, and this replacement must have the conversion table under the various standard of various material, it is restricted that the memory headroom of traditional Leeb Hardness Tester determines this table.
3. data-handling capacity is limited.Tradition Leeb Hardness Tester only can complete simple measurement function and Presentation Function, and is helpless to the compare of analysis of mass data, data statistics, data mining.
4. traditional Leeb Hardness Tester major part cost spends on main frame, the especially non-measured circuit part of main frame.The cost of metering circuit only accounts for less than 1/10, that is most of cost be dropped on it and the display be bad at, data processing, data transmission and other subsidiary functions above.
Summary of the invention
The technical problem to be solved in the present invention is for the weak point existing for prior art, a kind of Leeb Hardness Tester circuit based on mobile display terminal is provided, this circuit is by being arranged on percussion mechanism, then by being combined with the APP software of research and development supporting on mobile terminal, data transmission is carried out by the audio jack of the mobile terminals such as mobile phone, the result of detection is shown by mobile phone terminal, take full advantage of the ubiquity of mobile terminal, improve mobile terminal utilization rate, reduce the cost producing separately Leeb Hardness Tester, production cost reduces by 50%, and utilize adjustment and the data processing of this circuit, automaticity is high, measuring accuracy accuracy is high, the limits of error is at below 3HLD, overcome most technical barrier only controlled at 4HLD in industry, utilize the Internet technology of mobile terminal, efficiently solve independent Leeb Hardness Tester networking problem and data backup problem.
Technical solution of the present invention is, a kind of Leeb Hardness Tester circuit based on mobile display terminal is as follows provided, comprise Richter scale percussion mechanism probe A, audio jack, 3 core cables, data acquisition and code modulated circuits module, described data acquisition and code modulated circuits module comprise data processing circuit.
As preferably, a kind of Leeb Hardness Tester circuit based on mobile display terminal, described data processing circuit comprises the U5 microcontroller that model is MKL05Z32VFK4, and described U5 microcontroller comprises 1 ~ No. 24, amounts to 24 wiring pins; No. 3 wiring pins of wherein said U5 microcontroller are that VDD VREFH holds, and No. 3 wiring pins are connected to D3.3V power supply, and No. 3 wiring pins are also connected to electric capacity C25, the other end ground connection of electric capacity C25.
As preferably, No. 5 wiring pins of described U5 microcontroller are PTA3/EXTAL0 end, No. 6 wiring pins are PTA4/LLWU_P0/XTAL0 end, be connected by resistance R5 between No. 5 wiring pins and No. 6 wiring pins, and resistance R5 is parallel with crystal oscillator X2, the both sides of crystal oscillator X2 are respectively by electric capacity C31 and electric capacity C32 ground connection.
As preferably, No. 13 wiring pins of described U5 microcontroller are PTB1/IRQ_9 end, No. 14 wiring pins are PTB2/IRQ_10/LLWU_P5 end, No. 15 is PTA8 end, No. 13, No. 14 and No. 15 wiring pins are connected to Leeb Hardness Tester conditioning circuit module M1, described Leeb Hardness Tester conditioning circuit module M1 is provided with 5 wiring pins, No. 13 wiring pins are held with No. 1 wiring pin Detect_Insert on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 14 wiring pins are held with No. 2 wiring pin Signal on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 15 wiring pins are held with No. 3 wiring pin VREF on Leeb Hardness Tester conditioning circuit module M1 and are connected, Leeb Hardness Tester conditioning circuit module M1 is also provided with No. 4 wiring pin+3.3V power ends and No. 5 wiring pin earth terminals.
As preferably, No. 17 wiring pins of described U5 microcontroller are PTB3/IRQ_14 end, be connected to STK_TX end, resistance R11 is connected to after STK_TX end, be connected with electric capacity C8 and electric capacity C9, ground connection after electric capacity C9 after resistance R11, after electric capacity C8, be connected to resistance R12, ground connection after resistance R12, is also connected to MIC end between electric capacity C8 and resistance R12.
As preferably, No. 18 wiring pins of described U5 microcontroller are PTB4/IRQ_15/LLWU_P6 end, electric capacity C5 is connected to after being connected to STK_RX end, LEFT end is connected to after electric capacity C5, resistance R9 is also connected to after STK_RX end, be connected to D3.3V power supply after resistance R9, after STK_RX end, be also connected to resistance R10, ground connection after resistance R10.
As preferably, No. 22 wiring pins of described U5 microcontroller are PTA0/IRQ_0/LLWU_P7/SWD_CLK end, and No. 22 wiring pins connect SWD_CLK end.
As preferably, No. 23 wiring pins of described U5 microcontroller are PTA1/IRQ_1/RESET_b end, connect nRESET end after No. 23 wiring pins, resistance R41 is connected to after nRESET end, be connected to D3.3V power supply after resistance R41, after nRESET end, be also connected to electric capacity C41, ground connection after electric capacity C41.
As preferably, No. 16 wiring pins of described U5 microcontroller are PTA9 end, are connected to POWER_EN end; Feed circuit are connected to after POWER_EN end, described feed circuit are be connected to resistance R7 after POWER_EN end, electric capacity C21 is connected to after resistance R7, ground connection after electric capacity C21, D3.3V power supply is also connected to after resistance R7, electric capacity C3 is connected to after resistance R7, electric capacity C3 is for there being polar capacitor, positive pole side is connected with resistance R7, ground connection after electric capacity C3, is also connected to resistance R24 after resistance R7, resistance R23 is connected to after resistance R24, ground connection after resistance R23, is also connected to diode D20 after resistance R7, is connected to inductance L 1 after diode D20;
Also comprise the U4 controller that model is TPS61040DBV, the SW end of U4 controller is connected with the positive terminal of diode D20, the GND of U4 controller holds ground connection, hold with the FB of U4 controller after resistance R24 and be connected, hold with the Vin of U4 controller after inductance L 1 to hold with the En of U4 controller and be connected, after inductance L 1, be also connected to electric capacity C30, electric capacity C30 is for there being polar capacitor, positive pole side is connected with inductance L 1, ground connection after electric capacity C30, is also connected to button cell P3 after inductance L 1;
The field effect transistor that model is SI2323DS is also connected to after POWER_EN end, the G termination POWER_EN of field effect transistor holds, D termination+3.3V the power supply of field effect transistor, the S termination D3.3V power supply of field effect transistor, the D end of field effect transistor is also connected to diode VQ5, holds be connected after diode VQ5 with the S of field effect transistor.
As preferably, No. 1 wiring pin of described U5 microcontroller is PTB6/IRQ_2 end, and No. 1 wiring pin is vacant; No. 2 wiring pins are PTB7/IRQ_3 end, and No. 2 wiring pins are vacant; No. 4 wiring pins are that VREFL VSS holds, No. 4 wiring pin ground connection; No. 7 wiring pins are PTA5/LLWU_P1/RTC_CLKIN end, and No. 7 wiring pins are vacant; No. 8 wiring pins are PTA6/LLWU_P2 end, and No. 8 wiring pins are vacant; No. 9 wiring pins are PTB10 end, and No. 9 wiring pins are vacant; No. 10 wiring pins are PTB11 end, and No. 10 wiring pins are vacant; No. 11 wiring pins are PTA7/IRQ_7/LLWU_P3 end, and No. 11 wiring pins are vacant; No. 12 wiring pins are PTB0/IRQ_8/LLWU_P4 end, and No. 12 wiring pins are vacant; No. 19 wiring pins are PTB5/IRQ_16 end, and No. 19 wiring pins are vacant; No. 20 wiring pins are PTA12/IRQ_17 end, and No. 20 wiring pins are vacant; No. 21 wiring pins are PTB13 end, and No. 21 wiring pins are vacant.
Adopt the beneficial effect of the technical program: this circuit can be placed in percussion mechanism, user only need purchase the percussion mechanism that this circuit is housed, and download free APP software on mobile terminals and just can use, reduce instrument cost, improve instrument performance, powerful data-handling capacity, data dump ability, data transmission capabilities, enhance instrument portability, a percussion mechanism only needs a simple packaging just can carry, and does not need with heavy instrument container to scene.
In addition, the circuit in this percussion mechanism has higher regulating action, and utilize mobile phone A PP software to carry out the analysis of data, display, preservation and network delivery etc. to the single-chip microcomputer on circuit in percussion mechanism, precision is high, and data processing is quick.
Through verification experimental verification, adopt the Leeb Hardness Tester circuit based on mobile display terminal of the present invention thicknessmeter measure coating thickness, its measuring error be no more than tested coating thickness ± 0.01%, measuring accuracy is high, dependable performance.
Accompanying drawing explanation
Fig. 1 is the connection diagram of data processing circuit of the present invention.
Fig. 2 is the circuit connection diagram in Fig. 1 after POWER_EN end;
Fig. 3 is fundamental diagram block diagram of the present invention.
Embodiment
For ease of illustrating, below in conjunction with accompanying drawing, the Leeb Hardness Tester circuit based on mobile display terminal of invention is elaborated.
As shown in Fig. 1 to Fig. 2, a kind of Leeb Hardness Tester circuit based on mobile display terminal, comprises Richter scale percussion mechanism probe A, audio jack, 3 core cables, data acquisition and code modulated circuits module.
Described data acquisition and code modulated circuits module comprise data processing circuit, and described data processing circuit comprises the U5 microcontroller that model is MKL05Z32VFK4, and described U5 microcontroller comprises 1 ~ No. 24, amounts to 24 wiring pins;
No. 1 wiring pin is PTB6/IRQ_2 end, and No. 1 wiring pin is vacant;
No. 2 wiring pins are PTB7/IRQ_3 end, and No. 2 wiring pins are vacant;
No. 3 wiring pins are that VDD VREFH holds, and No. 3 wiring pins are connected to D3.3V power supply, and No. 3 wiring pins are also connected to electric capacity C25, the other end ground connection of electric capacity C25;
No. 4 wiring pins are that VREFL VSS holds, No. 4 wiring pin ground connection;
No. 5 wiring pins are PTA3/EXTAL0 end, No. 6 wiring pins are PTA4/LLWU_P0/XTAL0 end, be connected by resistance R5 between No. 5 wiring pins and No. 6 wiring pins, and resistance R5 is parallel with crystal oscillator X2, the both sides of crystal oscillator X2 are respectively by electric capacity C31 and electric capacity C32 ground connection;
No. 7 wiring pins are PTA5/LLWU_P1/RTC_CLKIN end, and No. 7 wiring pins are vacant;
No. 8 wiring pins are PTA6/LLWU_P2 end, and No. 8 wiring pins are vacant;
No. 9 wiring pins are PTB10 end, and No. 9 wiring pins are vacant;
No. 10 wiring pins are PTB11 end, and No. 10 wiring pins are vacant;
No. 11 wiring pins are PTA7/IRQ_7/LLWU_P3 end, and No. 11 wiring pins are vacant;
No. 12 wiring pins are PTB0/IRQ_8/LLWU_P4 end, and No. 12 wiring pins are vacant;
No. 13 wiring pins are PTB1/IRQ_9 end, No. 14 wiring pins are PTB2/IRQ_10/LLWU_P5 end, No. 15 is PTA8 end, No. 13, No. 14 and No. 15 wiring pins are connected to Leeb Hardness Tester probe to identify and signal amplification circuit module M1, Leeb Hardness Tester conditioning circuit module M1, Leeb Hardness Tester conditioning circuit module M1 is provided with 5 wiring pins
No. 13 wiring pins are held with No. 1 wiring pin Detect_Insert on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 14 wiring pins are held with No. 2 wiring pin Signal on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 15 wiring pins are held with No. 3 wiring pin VREF on Leeb Hardness Tester conditioning circuit module M1 and are connected, and Leeb Hardness Tester conditioning circuit module M1 are also provided with No. 4 wiring pin+3.3V power ends and No. 5 wiring pin earth terminals;
No. 16 wiring pins are PTA9 end, are connected to POWER_EN end;
Also comprise feed circuit, described feed circuit are be connected to resistance R7 after POWER_EN end, are connected to electric capacity C21 after resistance R7, ground connection after electric capacity C21, is also connected to D3.3V power supply after resistance R7, is connected to electric capacity C3 after resistance R7, electric capacity C3 is for there being polar capacitor, positive pole side is connected with resistance R7, ground connection after electric capacity C3, is also connected to resistance R24 after resistance R7, resistance R23 is connected to after resistance R24, ground connection after resistance R23, is also connected to diode D20 after resistance R7, is connected to inductance L 1 after diode D20;
Also comprise the U4 controller that model is TPS61040DBV, the SW end of U4 controller is connected with the positive terminal of diode D20, the GND of U4 controller holds ground connection, hold with the FB of U4 controller after resistance R24 and be connected, hold with the Vin of U4 controller after inductance L 1 to hold with the En of U4 controller and be connected, after inductance L 1, be also connected to electric capacity C30, electric capacity C30 is for there being polar capacitor, positive pole side is connected with inductance L 1, ground connection after electric capacity C30, is also connected to button cell P3 after inductance L 1;
The field effect transistor that model is SI2323DS is also connected to after POWER_EN end, the G termination POWER_EN of field effect transistor holds, D termination+3.3V the power supply of field effect transistor, the S termination D3.3V power supply of field effect transistor, the D end of field effect transistor is also connected to diode VQ5, holds be connected after diode VQ5 with the S of field effect transistor;
No. 17 wiring pins are PTB3/IRQ_14 end, are connected to STK_TX end, are connected to resistance R11 after STK_TX end, be connected with electric capacity C8 and electric capacity C9, ground connection after electric capacity C9 after resistance R11, after electric capacity C8, be connected to resistance R12, ground connection after resistance R12, is also connected to MIC end between electric capacity C8 and resistance R12;
No. 18 wiring pins are PTB4/IRQ_15/LLWU_P6 end, are connected to electric capacity C5 after being connected to STK_RX end, are connected to LEFT end after electric capacity C5, resistance R9 is also connected to after STK_RX end, be connected to D3.3V power supply after resistance R9, after STK_RX end, be also connected to resistance R10, ground connection after resistance R10;
No. 19 wiring pins are PTB5/IRQ_16 end, and No. 19 wiring pins are vacant;
No. 20 wiring pins are PTA12/IRQ_17 end, and No. 20 wiring pins are vacant;
No. 21 wiring pins are PTB13 end, and No. 21 wiring pins are vacant;
No. 22 wiring pins are PTA0/IRQ_0/LLWU_P7/SWD_CLK end, and No. 22 wiring pins connect SWD_CLK end;
No. 23 wiring pins are PTA1/IRQ_1/RESET_b end, connect nRESET end after No. 23 wiring pins, be connected to resistance R41, be connected to D3.3V power supply after resistance R41 after nRESET end, are also connected to electric capacity C41, ground connection after electric capacity C41 after nRESET end.
Described resistance R7=100K Ω, electric capacity C21=0.1uF, electric capacity C3=10uF, resistance R24=200K Ω, resistance R23=120K Ω, diode D20 is MBR0530 type, inductance L 1=10uH, electric capacity C30=4.7uF, resistance R12=1K Ω, electric capacity C8=10uF, resistance R11=10K Ω, electric capacity C9=4.7nF, electric capacity C5=0.1uF, resistance R9=500K Ω, resistance R10=500 K Ω, electric capacity C41=1Uf, resistance R41=10K Ω, electric capacity C25=0.1uF, resistance R5=1M Ω, crystal oscillator X2=32.768MHz, electric capacity C31=5.6pF, electric capacity C32=5.6pF.
One of main points of the present invention are the developments of special percussion mechanism, and it two is develop supporting APP software on mobile terminals.
And the key of percussion mechanism is also in the design of circuit, this special percussion mechanism comprises 3.5mm audio jack, 3 core cables, data acquisition and code modulated circuits module 1, percussion mechanism is popped one's head in, and circuit module, because its volume is little, both can be integrated in percussion mechanism probe inner, also accessible site (is similar to the line traffic control terminal of walkman) on audio-frequency electric cable, is approximately 1.5m according to audio-frequency electric cable total length.
Principle of work of the present invention is, Signal-regulated kinase amplifies and filtering the signal that percussion mechanism probe A exports, then be input in single-chip microcomputer B and carry out data acquisition, the data collected are modulated according to communication protocol by single-chip microcomputer, be modulated into sound signal, started to mobile terminal by tone frequency channel wire C.The APP software run on mobile terminals carries out the operations such as data processing, display, preservation to the result that single-chip microcomputer B sends.
In addition, another key of the present invention is the microminiaturization being circuit module 1, namely reduce body to amass as far as possible, circuit is built and is adopted following device for this reason: instrument amplifier adopts AD623ARM(RM8 encapsulation), operational amplifier adopts OPA2340EA(MSOP8 encapsulation), single-chip microcomputer adopts MKL05Z32VFK4(QFN24 encapsulation), crystal oscillator adopts 2520 encapsulation, and capacitance resistance ware removes the higher resistance of precision requirement, and all the other all adopt 0402 encapsulation.
Powered battery, because power consumption of the present invention is very low, the present embodiment preferably adopts button cell to power, M1 is the conditioning circuit module of Leeb Hardness Tester, this modulate circuit has a variety of form, but its basic composition is the combination during operational amplifier or instrument amplifier and capacitance-resistance, in the present invention, think known circuits, thus no longer details is shown.
P3 is 3V button cell, also should at more than 2.3V time voltage is low, and the microcontroller operating voltage used by the present invention can between 1.8V-3.6V.RIGHT is that the R channel of 3.5mm audio port exports, from mobile terminal APP(such as mobile phone), this signal can reset to microcontroller, after reset, APP sends the instruction of startup work to microcontroller U5 by LEFT, now the program of microcontroller U5 is according to enable SHUTDOWN and POWER_EN of instruction, during SHUTDOWN high level, TPS61040 boosts, the D3.3V of stable output, and this stable D3.3V both can as the reference voltage of the A/D change-over circuit of microcontroller U5, can power to when POWER_EN drags down modulate circuit M1 again, export three tunnel simulating signals after M1 work and be input to 13 of U5, 14, 15 pin, these three pins are A/D ALT-CH alternate channel, lee ' hardness can be completed under program measure, after measuring, U5 is encoded to measurement result and is given the APP of mobile terminal by 17 human hair combing wastes.
When not needing to measure, circuit needs to enter holding state, its process is: after microcontroller U5 detects that APP does not send measurement instruction for a long time, SHUTDOWN is set to low level, now TPS61040 stops boosting, now the voltage of test point TP1 is close to cell voltage, but still can supply microcontroller U5 and work.Microprocessor program draws high POWER_EN (16 pin of U5), stops powering to M1, is now equivalent to battery only to untreated device and several resistance (R9, R10, R23, R24) power supply.The standby current of microcontroller U5 can drop to 2 μ about A, R9, R10, R23, R24 current sinking is no more than 3 μ A, and U4 typical case Shutdown electric current is 1 μ A, therefore in the standby state, total current is greatly about 6 μ A, and this power consumption can allow the standby operation of whole system more than 1 year (assuming that battery electric quantity 50mA).Therefore do not need to use on/off circuit.
Through verification experimental verification, the accuracy of coating thickness measured by thicknessmeter to utilize this circuit ensure that, its measuring error be no more than tested coating thickness ± 0.01%, measuring accuracy is high, dependable performance, improve serviceable life and the stability of thicknessmeter, standby and reach 1 year, effectively improve the usability of thicknessmeter.
In the above-described embodiments, preferred forms of the present invention is described, obviously, under inventive concept of the present invention, still can make a lot of change.At this, should illustrate, any change made under inventive concept of the present invention all will fall within the scope of protection of the present invention.
Claims (10)
1. the Leeb Hardness Tester circuit based on mobile display terminal, it is characterized in that: comprise Richter scale percussion mechanism probe A, audio jack, 3 core cables, data acquisition and code modulated circuits module, described data acquisition and code modulated circuits module comprise data processing circuit.
2. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 1, is characterized in that: described data processing circuit comprises the U5 microcontroller that model is MKL05Z32VFK4, and described U5 microcontroller comprises 1 ~ No. 24, amounts to 24 wiring pins; No. 3 wiring pins of wherein said U5 microcontroller are that VDD VREFH holds, and No. 3 wiring pins are connected to D3.3V power supply, and No. 3 wiring pins are also connected to electric capacity C25, the other end ground connection of electric capacity C25.
3. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, it is characterized in that: No. 5 wiring pins of described U5 microcontroller are PTA3/EXTAL0 end, No. 6 wiring pins are PTA4/LLWU_P0/XTAL0 end, be connected by resistance R5 between No. 5 wiring pins and No. 6 wiring pins, and resistance R5 is parallel with crystal oscillator X2, the both sides of crystal oscillator X2 are respectively by electric capacity C31 and electric capacity C32 ground connection.
4. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, it is characterized in that: No. 13 wiring pins of described U5 microcontroller are PTB1/IRQ_9 end, No. 14 wiring pins are PTB2/IRQ_10/LLWU_P5 end, No. 15 is PTA8 end, No. 13, No. 14 and No. 15 wiring pins are connected to Leeb Hardness Tester conditioning circuit module M1, described Leeb Hardness Tester conditioning circuit module M1 is provided with 5 wiring pins, No. 13 wiring pins are held with No. 1 wiring pin Detect_Insert on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 14 wiring pins are held with No. 2 wiring pin Signal on Leeb Hardness Tester conditioning circuit module M1 and are connected, No. 15 wiring pins are held with No. 3 wiring pin VREF on Leeb Hardness Tester conditioning circuit module M1 and are connected, Leeb Hardness Tester conditioning circuit module M1 is also provided with No. 4 wiring pin+3.3V power ends and No. 5 wiring pin earth terminals.
5. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, it is characterized in that: No. 17 wiring pins of described U5 microcontroller are PTB3/IRQ_14 end, be connected to STK_TX end, resistance R11 is connected to after STK_TX end, be connected with electric capacity C8 and electric capacity C9, ground connection after electric capacity C9 after resistance R11, after electric capacity C8, be connected to resistance R12, ground connection after resistance R12, is also connected to MIC end between electric capacity C8 and resistance R12.
6. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, it is characterized in that: No. 18 wiring pins of described U5 microcontroller are PTB4/IRQ_15/LLWU_P6 end, electric capacity C5 is connected to after being connected to STK_RX end, LEFT end is connected to after electric capacity C5, resistance R9 is also connected to after STK_RX end, be connected to D3.3V power supply after resistance R9, after STK_RX end, be also connected to resistance R10, ground connection after resistance R10.
7. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, is characterized in that: No. 22 wiring pins of described U5 microcontroller are PTA0/IRQ_0/LLWU_P7/SWD_CLK end, and No. 22 wiring pins connect SWD_CLK end.
8. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, it is characterized in that: No. 23 wiring pins of described U5 microcontroller are PTA1/IRQ_1/RESET_b end, nRESET end is connect after No. 23 wiring pins, resistance R41 is connected to after nRESET end, D3.3V power supply is connected to after resistance R41, electric capacity C41 is also connected to, ground connection after electric capacity C41 after nRESET end.
9. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, is characterized in that: No. 16 wiring pins of described U5 microcontroller are PTA9 end, are connected to POWER_EN end; Feed circuit are connected to after POWER_EN end, described feed circuit are be connected to resistance R7 after POWER_EN end, electric capacity C21 is connected to after resistance R7, ground connection after electric capacity C21, D3.3V power supply is also connected to after resistance R7, electric capacity C3 is connected to after resistance R7, electric capacity C3 is for there being polar capacitor, positive pole side is connected with resistance R7, ground connection after electric capacity C3, is also connected to resistance R24 after resistance R7, resistance R23 is connected to after resistance R24, ground connection after resistance R23, is also connected to diode D20 after resistance R7, is connected to inductance L 1 after diode D20;
Also comprise the U4 controller that model is TPS61040DBV, the SW end of U4 controller is connected with the positive terminal of diode D20, the GND of U4 controller holds ground connection, hold with the FB of U4 controller after resistance R24 and be connected, hold with the Vin of U4 controller after inductance L 1 to hold with the En of U4 controller and be connected, after inductance L 1, be also connected to electric capacity C30, electric capacity C30 is for there being polar capacitor, positive pole side is connected with inductance L 1, ground connection after electric capacity C30, is also connected to button cell P3 after inductance L 1;
The field effect transistor that model is SI2323DS is also connected to after POWER_EN end, the G termination POWER_EN of field effect transistor holds, D termination+3.3V the power supply of field effect transistor, the S termination D3.3V power supply of field effect transistor, the D end of field effect transistor is also connected to diode VQ5, holds be connected after diode VQ5 with the S of field effect transistor.
10. the Leeb Hardness Tester circuit based on mobile display terminal according to claim 2, is characterized in that: No. 1 wiring pin of described U5 microcontroller is PTB6/IRQ_2 end, and No. 1 wiring pin is vacant;
No. 2 wiring pins are PTB7/IRQ_3 end, and No. 2 wiring pins are vacant;
No. 4 wiring pins are that VREFL VSS holds, No. 4 wiring pin ground connection;
No. 7 wiring pins are PTA5/LLWU_P1/RTC_CLKIN end, and No. 7 wiring pins are vacant;
No. 8 wiring pins are PTA6/LLWU_P2 end, and No. 8 wiring pins are vacant;
No. 9 wiring pins are PTB10 end, and No. 9 wiring pins are vacant;
No. 10 wiring pins are PTB11 end, and No. 10 wiring pins are vacant;
No. 11 wiring pins are PTA7/IRQ_7/LLWU_P3 end, and No. 11 wiring pins are vacant;
No. 12 wiring pins are PTB0/IRQ_8/LLWU_P4 end, and No. 12 wiring pins are vacant;
No. 19 wiring pins are PTB5/IRQ_16 end, and No. 19 wiring pins are vacant;
No. 20 wiring pins are PTA12/IRQ_17 end, and No. 20 wiring pins are vacant;
No. 21 wiring pins are PTB13 end, and No. 21 wiring pins are vacant.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410507518.4A CN104374636A (en) | 2014-09-28 | 2014-09-28 | Mobile display terminal-based Leeb hardness tester circuit |
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| CN201410507518.4A CN104374636A (en) | 2014-09-28 | 2014-09-28 | Mobile display terminal-based Leeb hardness tester circuit |
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| CN104374636A true CN104374636A (en) | 2015-02-25 |
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| CN201410507518.4A Pending CN104374636A (en) | 2014-09-28 | 2014-09-28 | Mobile display terminal-based Leeb hardness tester circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111766169A (en) * | 2020-06-17 | 2020-10-13 | 西京学院 | Automatic measuring device for fixed Leeb hardness meter |
| CN114720311A (en) * | 2022-03-16 | 2022-07-08 | 青岛汉泰电子有限公司 | Handheld hardness meter, hardness measuring circuit and measuring method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111766169A (en) * | 2020-06-17 | 2020-10-13 | 西京学院 | Automatic measuring device for fixed Leeb hardness meter |
| CN114720311A (en) * | 2022-03-16 | 2022-07-08 | 青岛汉泰电子有限公司 | Handheld hardness meter, hardness measuring circuit and measuring method |
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Application publication date: 20150225 |