CN114720311A - Handheld hardness meter, hardness measuring circuit and measuring method - Google Patents
Handheld hardness meter, hardness measuring circuit and measuring method Download PDFInfo
- Publication number
- CN114720311A CN114720311A CN202210257977.6A CN202210257977A CN114720311A CN 114720311 A CN114720311 A CN 114720311A CN 202210257977 A CN202210257977 A CN 202210257977A CN 114720311 A CN114720311 A CN 114720311A
- Authority
- CN
- China
- Prior art keywords
- circuit
- hardness
- voltage
- key
- voltage value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000001514 detection method Methods 0.000 claims abstract description 27
- 230000003321 amplification Effects 0.000 claims abstract description 21
- 238000003199 nucleic acid amplification method Methods 0.000 claims abstract description 21
- 238000005259 measurement Methods 0.000 claims description 23
- 239000000463 material Substances 0.000 claims description 18
- 230000007935 neutral effect Effects 0.000 claims description 16
- 238000007542 hardness measurement Methods 0.000 claims description 15
- 239000003990 capacitor Substances 0.000 claims description 6
- 238000013500 data storage Methods 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 229910001208 Crucible steel Inorganic materials 0.000 claims description 3
- 229910001315 Tool steel Inorganic materials 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 3
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- 229910000838 Al alloy Inorganic materials 0.000 claims description 2
- 229910001369 Brass Inorganic materials 0.000 claims description 2
- 229910000906 Bronze Inorganic materials 0.000 claims description 2
- 229910001018 Cast iron Inorganic materials 0.000 claims description 2
- 229910000831 Steel Inorganic materials 0.000 claims description 2
- 229910001297 Zn alloy Inorganic materials 0.000 claims description 2
- 239000010951 brass Substances 0.000 claims description 2
- 239000010974 bronze Substances 0.000 claims description 2
- 238000012790 confirmation Methods 0.000 claims description 2
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 claims description 2
- TVZPLCNGKSPOJA-UHFFFAOYSA-N copper zinc Chemical compound [Cu].[Zn] TVZPLCNGKSPOJA-UHFFFAOYSA-N 0.000 claims description 2
- 239000010959 steel Substances 0.000 claims description 2
- 238000005070 sampling Methods 0.000 abstract description 6
- 238000013461 design Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/52—Investigating hardness or rebound hardness by measuring extent of rebound of a striking body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/066—Special adaptations of indicating or recording means with electrical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0019—Compressive
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/0032—Generation of the force using mechanical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0076—Hardness, compressibility or resistance to crushing
- G01N2203/0083—Rebound strike or reflected energy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0617—Electrical or magnetic indicating, recording or sensing means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0676—Force, weight, load, energy, speed or acceleration
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention discloses a handheld hardness tester, a hardness measuring circuit and a hardness measuring method, wherein the hardness measuring circuit comprises: signal amplification circuit, reference source circuit, comparison circuit, ADC and MCU, wherein, signal amplification circuit is equipped with a connector interface, the external hardness of connector interface strikes detection device, signal amplification circuit still is equipped with the enlargies voltage signal's first amplifier, the reference source circuit includes: a chip N3 for providing a reference voltage, a first voltage division circuit, a second amplifier, and a second voltage division circuit. The hardness measuring circuit is provided with the reference source circuit, the reference source circuit provides reference voltage, and after the reference voltage is compared with the voltage signal converted by the hardness impact detection device, the reference voltage provides a reference point for the ADC sampling voltage signal, so that the voltage signal acquired by the ADC is more accurate, and the error is extremely small when the voltage signal is converted into the hardness value.
Description
Technical Field
The invention relates to the technical field of electronic products, in particular to a handheld hardness tester, a hardness measuring circuit and a hardness measuring method.
Background
The hardness measuring device is used for measuring the hardness of various materials, such as stainless steel, cast steel, alloy tool steel and the like, and can effectively judge whether the hardness of the materials is qualified or not through the hardness measurement, so that the problem of using defective products of the materials is avoided;
the existing hardness measuring device is not mature in technology, firstly, in the aspect of functions, menu selection steps are complex, shortcut key design is less, and operation is not convenient enough; secondly, in the aspect of circuit design, a voltage value corresponding to the hardness value of the material is directly acquired by the ADC and is sent to the MCU, and no reference voltage is compared, so that the error is extremely large when the acquired voltage value is converted into the hardness value, the hardness value of the material cannot be accurately measured, and potential safety hazards are easily caused when the material with unqualified hardness value is used; thirdly, in the aspect of software design, directly averaging the collected multiple groups of voltage value data and then calculating a hardness value, wherein actually, the collected multiple groups of voltage values comprise a neutral line voltage value, the neutral line voltage value needs to be removed to be the actual voltage value, if the neutral line voltage value is not removed, the finally converted hardness value is larger, some unqualified materials with lower hardness values are qualified, and the hardness value can not be accurately calculated by the method;
the prior art can not meet the requirements of people at the present stage, and the prior art is urgently needed to be reformed based on the current situation.
Disclosure of Invention
The present invention is directed to a hand-held hardness tester, a hardness measuring circuit, and a measuring method, which are used to solve the problems of the background art.
The invention provides a handheld hardness tester, a hardness measuring circuit and a measuring method, wherein the hardness measuring circuit comprises: the device comprises a signal amplification circuit, a reference source circuit, a comparison circuit, an ADC and an MCU;
the signal amplification circuit is provided with a connector interface which is externally connected with a hardness impact detection device, and is also provided with a first amplifier for amplifying the voltage signal, wherein the voltage signal is connected with a capacitor C4 in series through a capacitor C2 and then connected with a filter circuit consisting of a resistor network consisting of resistors R1, R2 and R4 in parallel, and the filter circuit is loaded at the positive input end of the first amplifier;
the reference source circuit includes: the chip N3 provides a reference voltage, a first voltage division circuit, a second amplifier and a second voltage division circuit, the reference voltage provided by the chip N3 is loaded on the positive input end of the second amplifier through the first voltage division circuit composed of resistors R10, R12 and R8, the output end of the second amplifier is coupled with the second voltage division circuit composed of resistors R9, R11 and R13, and a reference voltage signal divided by the first voltage division circuit is amplified and then divided by the second voltage division circuit to serve as the output of a reference source;
the output end of the signal amplification circuit is coupled to the forward input end of the comparison circuit, the output end of the reference source circuit is coupled to the reverse input end of the comparison circuit, the output end of the comparison circuit is coupled to the ADC, the ADC is coupled to the MCU, the comparison circuit outputs a voltage signal and loads the voltage signal to the voltage signal acquisition end of the ADC by comparing the voltage signal of the signal amplification circuit with the voltage signal provided by the reference source, and the ADC transmits the acquired voltage signal to the MCU for signal processing;
the durometer includes: the hardness impact detection device comprises a plugging interface, a display screen 1 and an operation panel, wherein the plugging interface is connected with the hardness impact detection device, one end of the plugging interface is coupled with a connector interface of the signal amplification circuit, and the other end of the plugging interface is externally connected with the hardness impact detection device;
the operation panel includes: a menu function key, a measurement material selection key, a return to main menu key, a work sustainable time key, a cancel key, a hardness measurement range key, a measurement direction key, a direction selection key, a return key, a confirm key, a power key, a data print key, a data storage key, and a pause key;
the hardness measuring method comprises the following specific steps:
firstly, sending interruption, reading an ADC sampling voltage value for 300 times, then, taking an impulse voltage value and a rebound voltage value, then delaying and clearing the interruption, setting a measurement mark, then, collecting a neutral line voltage, removing a maximum value and a minimum value, and taking an average value, and finally according to a formula: and HL is 1000VB/VA, and the hardness value is calculated.
Advantageous effects
(1) The invention is provided with a menu function key, can be used for selecting a menu in a display screen through an F1 key, an F2 key, an F3 key and an F4 key, and is also provided with a measurement material selection key, a hardness measurement range key, a measurement direction key, a data printing key, a data storage key and other shortcut keys, thereby having convenient use and convenient operation;
(2) the hardness measuring circuit is provided with the reference source circuit, the reference source circuit provides reference voltage, and after the reference voltage is compared with the voltage signal converted by the hardness impact detection device, the reference voltage provides a reference point for the ADC sampling voltage signal, so that the voltage signal acquired by the ADC is more accurate, and the error is extremely small when the voltage signal is converted into a hardness value;
(3) in the design of the hardness testing method, the impact voltage value minus the neutral line voltage value is taken as an actual impact voltage value VB, the rebound voltage value minus the neutral line voltage value is taken as an actual rebound voltage value VA, and according to a formula: and the HL is 1000VB/VA, and the calculated hardness value HL is more accurate.
Drawings
FIG. 1 is a schematic front view of a hardness tester according to the present invention;
FIG. 2 is a schematic diagram of a plug interface of the hardness tester of the present invention;
FIG. 3 is a circuit diagram of a hardness measuring circuit according to the present invention;
FIG. 4 is a detailed circuit diagram of a reference source circuit of the hardness measuring circuit of the present invention;
FIG. 5 is a flowchart of a hardness measuring method of the hardness tester of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the invention without making any creative effort, shall fall within the protection scope of the invention.
Referring to fig. 3 and 4, in one aspect, the present invention provides a hardness measuring circuit, including: the device comprises a signal amplification circuit, a reference source circuit, a comparison circuit, an ADC and an MCU;
the signal amplification circuit is provided with a connector interface, the connector interface is externally connected with a hardness impact detection device, a coil is arranged in the connector interface, a hardness value after the hardness impact detection device is back-struck can be converted into a voltage signal, the signal amplification circuit is also provided with a first amplifier for amplifying the voltage signal, the voltage signal is connected with a capacitor C4 in series through a capacitor C2, and then is connected with a filter circuit consisting of a resistor network consisting of resistors R1, R2 and R4 in parallel, and the filter circuit is loaded at the positive input end of the first amplifier;
the reference source circuit includes: the chip N3 provides a reference voltage, a first voltage division circuit, a second amplifier and a second voltage division circuit, the reference voltage provided by the chip N3 is loaded on the positive input end of the second amplifier through the first voltage division circuit composed of resistors R10, R12 and R8, the output end of the second amplifier is coupled with the second voltage division circuit composed of resistors R9, R11 and R13, and a reference voltage signal divided by the first voltage division circuit is amplified and then divided by the second voltage division circuit to serve as the output of a reference source;
the output end of the signal amplification circuit is coupled to the forward input end of the comparison circuit, the output end of the reference source circuit is coupled to the reverse input end of the comparison circuit, the output end of the comparison circuit is coupled to the ADC, the ADC is coupled to the MCU, the comparison circuit outputs a voltage signal and loads the voltage signal to the voltage signal acquisition end of the ADC by comparing the voltage signal of the signal amplification circuit with the voltage signal provided by the reference source, and the ADC transmits the acquired voltage signal to the MCU for signal processing;
the conventional technical means at present does not design a reference source circuit, and directly supplies voltage signals converted by the hardness impact detection device to an ADC (analog to digital converter) for sampling through an amplifier, so that the voltage signals acquired by the ADC are not accurate enough, and great error influence is caused on subsequent hardness conversion calculation;
when the hardness impact detection device is used for measuring hardness, a punch head in the hardness impact detection device impacts the surface of an object to be measured at a certain speed and rebounds back, so that the punch head has an impact speed and a rebound speed, the impact speed and the rebound speed respectively correspond to corresponding voltages, the impact speed and the rebound speed are sequentially transmitted to the hardness measurement circuit in the form of impact voltage and rebound voltage for voltage processing, the voltages are acquired by an ADC (analog to digital converter), and then a hardness value is calculated by the MCU according to a formula HL of 1000V1/V2, wherein HL represents a hardness value, V1 represents the impact speed, and V2 represents the rebound speed;
the reference source circuit arranged in the hardness measuring circuit provides reference voltage, and after the reference voltage is compared with the voltage signal converted by the hardness impact detection device, the reference voltage provides a reference point for the ADC sampling voltage signal, so that the voltage signal acquired by the ADC is more accurate, and the error is very small when the voltage signal is converted into the hardness value.
Referring to fig. 1 and 2, in yet another aspect, the present disclosure discloses another embodiment, a hand-held durometer, comprising: the hardness impact detection device comprises a plugging interface, a display screen 1 and an operation panel, wherein the plugging interface is connected with the hardness impact detection device, one end of the plugging interface is coupled with a connector interface of the signal amplification circuit, and the other end of the plugging interface is externally connected with the hardness impact detection device;
the operation panel includes: a menu function key 2, a measurement material selection key 3, a return to main menu key 4, a work sustainable time key 5, a cancel key 6, a hardness measurement range key 7, a measurement direction key 8, a direction selection key 9, a return key 10, a confirm key 11, a power key 12, a data print key 13, a data storage key 14, and a pause key 15.
The method comprises the following steps:
firstly, connecting a plug of the hardness impact detection device with a plug interface of a hardness tester, starting the hardness tester through a power supply key, and enabling the hardness tester to enter a hardness measurement state after the power supply is switched on; aligning a punch of the hardness impact detection device to a body to be detected according to a certain direction, selecting one direction from vertical downward direction, oblique downward direction, horizontal direction, oblique upward direction and vertical upward direction through a measurement direction key to be matched with the direction of the punch, and enabling the impact direction of the punch to be vertical to a test surface of the body to be detected; calibrating the test point of the hardness impact detection device, sequentially calibrating for 6 times, taking the average value of the 6 times of calibration, and comparing the data of the 6 times of calibration with the average value, wherein the error between the 6 times of calibration data and the average value is within +/-15-20 HL; during measurement, an impact head in the hardness impact detection device is released to impact the surface of the to-be-measured body, so that rebound can be formed, the hardness impact detection device converts impact speed and rebound speed into voltage values, the voltage values are measured through a hardness measurement circuit, the MCU calculates the impact speed voltage value V1 and the rebound speed voltage value V2 through a formula HL of 1000V1/V2 to obtain corresponding hardness values, and the corresponding hardness values are displayed through a display screen;
during the measurement, the menu function key 2 includes: the F1 key, the F2 key, the F3 key and the F4 key are used for selecting a menu in the display screen 1 and performing selection, switching and page turning;
the measurement material selection button 3 is used for selecting a material to be measured, and includes: stainless steel, cast steel, alloy tool steel, cast aluminum alloy, copper zinc alloy, forged steel, bronze, brass, cast iron and other materials;
the return to main menu button 4 is used for returning the current operation in the display screen to the initial state before measurement and also used as a menu page;
the work sustainable time button 5 is used for checking the time of work and the time of continuous work;
the cancel key 6 is used for canceling the current operation;
the hardness measurement range key 7 is used for selecting a measurement range between 150-980 HL;
the measurement direction key 8 is used for selecting a direction, and includes: vertically downward, obliquely downward, horizontally, obliquely upward and vertically upward;
the direction selection key 9 is used for selecting a menu, and includes: an up key, a down key, a left key and a right key;
the return key 10 is used for returning the current operation to the previous operation;
the confirmation key 11 is used for confirming the current operation and carrying out the next operation;
the power supply key 12 is used for supplying power to a circuit inside the hardness tester and starting the hardness tester;
the data printing key 13 is used for connecting an external printer through Bluetooth and printing data of a currently selected page;
the data storage key 14 is used for storing data of a current page and can store 1200 times of measurement data;
the pause key 15 is used for temporarily stopping the measured data in the display screen, so that the measured data can be observed and recorded conveniently.
The invention is provided with a menu function key, a measurement material selection key, a hardness measurement range key, a measurement direction key, a data printing key, a data storage key and other shortcut keys besides a menu function key, namely an F1 key, an F2 key, an F3 key and an F4 key, which are used for selecting a menu in a display screen and selecting, switching and turning pages, and is convenient to use and convenient to operate.
Referring to fig. 5, in yet another aspect, the present invention also discloses another embodiment, a hardness measuring method, including:
firstly, sending an interrupt, and reading an ADC sampling voltage value for 300 times; specifically, after the hardness impact detection device is released, an interrupt is generated at the connector interface of the signal amplification circuit, and after the interrupt arrives, the MCU repeatedly reads the voltage value acquired by the ADC for 300 times;
secondly, taking an impact voltage value and a rebound voltage value; specifically, the read voltage value includes a positive voltage and a negative voltage, the read positive voltage value is used as an impulse voltage value, the negative voltage value is used as a rebound voltage value, and the rebound voltage value is stored in the same array for processing;
delaying and clearing interruption, and setting a measurement mark; specifically, after 300 groups of voltage values are read, delaying for 200ms and clearing the interruption, setting the measurement flag 1, and no longer continuing to read the voltage value sampled by the ADC;
collecting neutral line voltage, removing the maximum value and the minimum value and taking an average value; specifically, a reference source provides a neutral line voltage value, the neutral line voltage value is read for 6 times, the maximum value and the minimum value are removed, and the average value is taken as the neutral line voltage value;
calculating the hardness value; specifically, the neutral line voltage value obtained in the step (iv) is subtracted from the impulse voltage value obtained in the step (ii) to obtain an actual impulse voltage value VB, and the neutral line voltage value obtained in the step (iv) is subtracted from the rebound voltage value obtained in the step (iv) to obtain an actual rebound voltage value VA, according to a formula: and HL is 1000VB/VA, and the hardness value HL is calculated.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes in the embodiments and/or modifications of the invention can be made, and equivalents and modifications of some features of the invention can be made without departing from the spirit and scope of the invention.
Claims (5)
1. A hardness measurement circuit, comprising: the device comprises a signal amplification circuit, a reference source circuit, a comparison circuit, an ADC and an MCU;
the signal amplification circuit is provided with a first amplifier for amplifying the voltage signal, and the signal amplification circuit is provided with a connector interface for externally connecting a hardness impact detection device to generate a voltage signal;
the reference source circuit includes: the circuit comprises a chip for providing reference voltage, a first voltage division circuit, a second amplifier and a second voltage division circuit;
the reference voltage provided by the chip is loaded on the positive input end of the second amplifier through the first voltage division circuit, and the output end of the second amplifier is coupled with the second voltage division circuit to amplify the reference voltage signal divided by the first voltage division circuit and then divide the voltage by the second voltage division circuit to be used as the output of the reference source;
the output end of the signal amplifying circuit is coupled to the positive input end of the comparison circuit, and the output end of the reference source circuit is coupled to the negative input end of the comparison circuit;
the output end of the comparison circuit is coupled with the ADC, and the ADC is coupled with the MCU.
2. A hardness measurement circuit according to claim 1, wherein: the voltage signal generated by the hardness impact detection device is connected with a capacitor C4 in series through a capacitor C2, and then is connected with a filter circuit consisting of a resistor network consisting of resistors R1, R2 and R4 in parallel, and the filter circuit is loaded on the positive input end of the first amplifier.
3. A hardness measurement circuit according to claim 1, wherein: the comparison circuit loads the output voltage signal to a voltage signal acquisition end of the ADC by comparing the voltage signal of the signal amplification circuit with the voltage signal provided by the reference source, and the ADC transmits the acquired voltage signal to the MCU for signal processing.
4. A hand-held durometer, comprising: a plug interface, a display screen (1) and an operation panel which are connected with the hardness impact detection device, and the hardness measurement circuit of claims 1-3;
one end of the plug interface is coupled with the connector interface of the signal amplification circuit, and the other end of the plug interface is externally connected with a hardness impact detection device;
the operation panel includes:
a menu function key (2) for selecting a menu in a display screen (1), and performing selection, switching, and page turning, and the menu function key (2) includes: f1 keys, F2 keys, F3 keys, and F4 keys;
a measured material selection button (3) for selecting a measured material, and selecting the measured material includes: stainless steel, cast steel, alloy tool steel, cast aluminum alloy, copper zinc alloy, forged steel, bronze, brass, cast iron and other materials;
a return to main menu button (4) for returning the current operation in the display screen to the initial state before measurement and also to the menu page;
a work sustainable time button (5) for checking the time that has been worked and the time that can be worked continuously;
a cancel button (6) for canceling the current operation;
a hardness measurement range key (7) for selecting a measurement range between 150-980 HL;
for selecting a direction, comprising: a measuring direction key (8) which is vertically downward, obliquely downward, horizontally, obliquely upward and vertically upward;
for selecting a menu, comprising: a direction selection key (9) of an up key, a down key, a left key and a right key;
a return key (10) for returning the current operation to the previous operation;
a confirmation key (11) for confirming the current operation and performing the next operation;
a power supply key (12) for supplying power to the circuit inside the hardness tester and starting the hardness tester;
a data printing key (13) which is used for connecting an external printer through Bluetooth and printing the data of the current selected page;
a data storage key (14) used for storing the data of the current page and capable of storing 1200 times of measurement data;
and a pause button (15) for temporarily stopping the measured data in the display screen for observation and recording.
5. A hardness measuring method, characterized by comprising:
the method comprises the following steps: after the hardness impact detection device is released, an interrupt is generated at the connector interface of the signal amplification circuit, and after the interrupt arrives, the MCU repeatedly reads the voltage value acquired by the ADC for 300 times;
step two: taking the positive voltage value in the step one as an impulse voltage value, taking the negative voltage value as a rebound voltage value, and storing the rebound voltage value in the same array for processing;
step three: after 300 groups of voltage values are read, delaying for 200ms, clearing interruption, setting a measurement mark 1, and not continuously reading the voltage value sampled by the ADC;
step four: the MCU reads the neutral line voltage value provided by the reference source for 6 times, removes the maximum value and the minimum value and takes the average value as the final neutral line voltage value;
step five: according to the formula: and calculating to obtain a hardness value HL of 1000VB/VA, wherein VB is the impact voltage value obtained in the step II minus the neutral line voltage value obtained in the step IV, and VA is the rebound voltage value obtained in the step II minus the neutral line voltage value obtained in the step IV.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210257977.6A CN114720311A (en) | 2022-03-16 | 2022-03-16 | Handheld hardness meter, hardness measuring circuit and measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210257977.6A CN114720311A (en) | 2022-03-16 | 2022-03-16 | Handheld hardness meter, hardness measuring circuit and measuring method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114720311A true CN114720311A (en) | 2022-07-08 |
Family
ID=82238425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210257977.6A Pending CN114720311A (en) | 2022-03-16 | 2022-03-16 | Handheld hardness meter, hardness measuring circuit and measuring method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114720311A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201203559Y (en) * | 2008-06-04 | 2009-03-04 | 山西华宝焊接设备有限公司 | High precision Richter hardometer |
| CN202974952U (en) * | 2012-12-11 | 2013-06-05 | 东莞市中旺精密仪器有限公司 | Portable handheld terminal of ultrasonic hardness gauge |
| CN104280303A (en) * | 2014-09-28 | 2015-01-14 | 山东中科普锐检测技术有限公司 | Circuit for Leeb hardness tester probe recognition and signal amplification |
| CN104374636A (en) * | 2014-09-28 | 2015-02-25 | 山东中科普锐检测技术有限公司 | Mobile display terminal-based Leeb hardness tester circuit |
| CN112881865A (en) * | 2021-03-17 | 2021-06-01 | 福建奥通迈胜电力科技有限公司 | High-precision zero sequence voltage detection circuit and method for power distribution network |
-
2022
- 2022-03-16 CN CN202210257977.6A patent/CN114720311A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201203559Y (en) * | 2008-06-04 | 2009-03-04 | 山西华宝焊接设备有限公司 | High precision Richter hardometer |
| CN202974952U (en) * | 2012-12-11 | 2013-06-05 | 东莞市中旺精密仪器有限公司 | Portable handheld terminal of ultrasonic hardness gauge |
| CN104280303A (en) * | 2014-09-28 | 2015-01-14 | 山东中科普锐检测技术有限公司 | Circuit for Leeb hardness tester probe recognition and signal amplification |
| CN104374636A (en) * | 2014-09-28 | 2015-02-25 | 山东中科普锐检测技术有限公司 | Mobile display terminal-based Leeb hardness tester circuit |
| CN112881865A (en) * | 2021-03-17 | 2021-06-01 | 福建奥通迈胜电力科技有限公司 | High-precision zero sequence voltage detection circuit and method for power distribution network |
Non-Patent Citations (3)
| Title |
|---|
| AC黑皮: "STM32的ADC能测量微小的负电压值吗？", pages 1 - 3, Retrieved from the Internet <URL:https://zhidao.baidu.com/question/557157137.html> * |
| GGAIYANG: "请问STM32的AD转换输入能否是负的信号么？", pages 171 - 172, Retrieved from the Internet <URL:https://bbs.21ic.com/icview-108993-1-1.html> * |
| 郑晓峰: "模拟电子技术基础", 中国电力出版社, pages: 171 - 172 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0429366Y2 (en) | ||
| US10485642B2 (en) | Occlusion measurement device and method for detecting occlusal force | |
| CN102323474A (en) | Digital readout ampere meter for detecting pulse current | |
| JP4417853B2 (en) | DCVG-CIPS measuring device for detecting results about pipelines | |
| CN101581596A (en) | Flow detecting method based on double-time measurement technology and apparatus thereof | |
| CN114720311A (en) | Handheld hardness meter, hardness measuring circuit and measuring method | |
| CN211318715U (en) | Multi-terminal synchronous communication line calibration equipment | |
| CN209784243U (en) | Take bluetooth to upload steel bar scanner of function | |
| JPS59136612A (en) | Method for displaying value measured with measuring device | |
| CN108152125A (en) | A kind of secondary small line terminal strength testing tool of electric system | |
| CN106547268B (en) | Testing system and testing method of trunk controller | |
| CN101221055A (en) | Method for automatic testing linear pointer instrument and recording treatment | |
| CN210346623U (en) | Wireless thickness measurement ultrasonic probe | |
| CN108318172A (en) | Pantagraph current collector contact force device for testing and analyzing and its method for testing and analyzing | |
| CN210514461U (en) | Hand-held transformer direct-current resistance tester | |
| CN204202578U (en) | Manual testing device | |
| CN211043525U (en) | Measuring instrument with phase sequence testing function | |
| CN208091808U (en) | A kind of secondary small line terminal strength testing tool of electric system | |
| CN213067635U (en) | Acquisition circuit of precision displacement measuring instrument | |
| CN206489220U (en) | One kind is based on single-chip microcomputer microresistivity survey system | |
| CN213069011U (en) | Full-range automatic switching resistance measurement CPCI board card | |
| CN212963725U (en) | Temperature measuring instrument | |
| CN202383192U (en) | Digital display ammeter capable of detecting pulse current | |
| CN211824213U (en) | Measuring device for measuring engagement depth of elevator landing door guide device | |
| CN211180043U (en) | Safety standard tester with data statistics function |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |