CN104316774A - Absolute capacitor and differential capacitor measuring circuit - Google Patents

Absolute capacitor and differential capacitor measuring circuit Download PDF

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Publication number
CN104316774A
CN104316774A CN201410647452.9A CN201410647452A CN104316774A CN 104316774 A CN104316774 A CN 104316774A CN 201410647452 A CN201410647452 A CN 201410647452A CN 104316774 A CN104316774 A CN 104316774A
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circuit
frequency
differential capacitor
electric capacity
capacitor
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梁亮
石屹然
周秀文
石要武
高伟
李新波
马彦
方盛洲
付云博
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Jilin University
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Jilin University
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Abstract

The invention discloses an absolute capacitor and differential capacitor measuring circuit and method. The absolute capacitor and differential capacitor measuring circuit comprises a crystal oscillation circuit for measuring an absolute capacitor and a circuit for measuring a differential capacitor, and the absolute capacitor and differential capacitor measuring method comprises a method for measuring the absolute capacitor and a method for measuring the differential capacitor. According to the absolute capacitor and differential capacitor measuring circuit, the principle of the crystal oscillation circuit is utilized, all elements are common electronic elements, the structure is simple, the floor area of the circuit is small, and the elements are convenient to purchase, low in power consumption and extremely low in cost; a single power supply is adopted for supplying electricity to the circuit, voltage of a VCC of the power supply ranges from 2V to 6V, a TTL and a CMOS level are completely compatible, and the circuit has a wider application range; the resolution of the circuit mainly depends on frequency measurement precision, an existing frequency measurement technology is mature, and high-precision capacitance measurement can be achieved; according to the circuit for measuring the differential capacitor, a frequency difference is extracted only by using a data flip-flop; the circuit for measuring the differential capacitor is simple and can be used for measuring not only the differential capacitor but also the absolute capacitor.

Description

A kind of absolute capacitance and differential capacitor metering circuit
Technical field
The present invention relates to a kind of capacitance measurement circuit and method, particularly relate to a kind of crystal oscillating circuit that utilizes to measure capacitance measurement circuit and the method for absolute capacitance and differential capacitor, belong to electrotechnical, electronic measuring method and device field.
Background technology
Current capacitance measurement and treatment circuit are broadly divided into: frequency modulation method circuit, bridge method, direct current charge-discharge circuit, synchronous demodulator method etc.
(1) frequency modulation method is also oscillatory circuit method, and it detects surveyed electric capacity based on the thought of electric capacity/frequency inverted.These class methods are positioned in LC or RC resonant tank by capacitive transducer to form oscillatory circuit, when measured capacitance changes, the oscillation frequency of oscillatory circuit will change thereupon, the frequency variation of signal be detected by frequency-discriminating circuit or counting circuit the change namely obtaining measured capacitance.The method has that structure is simple, anti-electromagnetic interference capability is strong, be convenient to Signal transmissions, export the advantage being easy to digitizing and can obtaining high level output.Main Problems existing is: output nonlinear is larger; Poor dynamic.
(2) bridge-type method is also modulation method, often adopts the method to realize the accurate measurement of capacitance variations in lower frequency.Capacitance type sensor is accessed electric bridge as four alternate arms by alternating current bridge, usually adopts resistance/capacitance or inductance/capacitance composition alternating current bridge, converts the voltage being converted to electric bridge export by electric capacity.Again through amplifying, after detection and filtering, output voltage signal.Also can adopt differential capacitor, respectively as ratio brachium pontis, measuring accuracy can be improved further like this, nonlinear error reduction.The measuring accuracy of this method is high, sensitivity and stability, and effect of parasitic capacitance is little.But the method requires the operational amplifier of a high impedance, low temperature shift, this all has higher difficulty concerning designed capacity and process conditions.
(3) circuit that in direct current charge-discharge circuit, performance is comparatively excellent surely belong to switched-capacitor circuit it by controlling the break-make of several cmos switch, discharge and recharge is carried out to measured capacitance, a magnitude of voltage relevant to being charged or discharged electric capacity is exported to reach the object measuring electric capacity, as patent " differential capacitor metering circuit and multi-range measurement instrument (No:88106571.4) " and patent " capacitance measurement circuit and method (No:01143629.8) " by operational amplifier A.But the circuit of the type often adopts a large amount of electronic switches, and electronic switch often brings Charge injection effect to cause measuring error, in addition, DC circuit certainly exists drifts about, and this makes integrated circuit easily produce the problem of shakiness at zero point.
(4) synchronous demodulator method is modulated the amplitude of sine or square wave oscillation according to capacitance variations and is utilized low-pass filtering to be converted to measuring-signal.It uses the standard delta-sigma modulator of the pulse Charger transfer in sensor electronics: utilize reference voltage to operate delta-sigma modulator at input end and also assess the change of electric capacity in input end branch road to measure capacitance, as patent " capacitance measurement circuit, sensing system and use sine voltage signal measure the method (No:201180049243.9) of electric capacity ".The method measuring accuracy is higher, but needs to provide sinusoidal wave or square wave and positive-negative power, and therefore metering circuit is complicated, and cost is higher.
Summary of the invention
For existing capacitance measurement circuit and method Problems existing, the invention discloses a kind of absolute capacitance and differential capacitor metering circuit and method, namely a kind of crystal oscillating circuit that utilizes is to measure capacitance measurement circuit and the method for absolute capacitance and differential capacitor.
For achieving the above object, the technical solution used in the present invention is:
A kind of absolute capacitance and differential capacitor metering circuit, comprise and a kind ofly measure the crystal oscillating circuit of absolute capacitance and a kind of differential capacitor metering circuit.
Described a kind of crystal oscillating circuit measuring absolute capacitance, comprises two NPN triode Q1 and Q2, four resistance R1, R2, R3 and R4, three known capacitance C1, C2 and C3, an inductance L 1, crystal oscillator Y1, a phase inverter U1A and testing capacitance Cx.
An end ground connection of described testing capacitance Cx, an end of No. two termination crystal oscillator Y1; An end of No. two ends of crystal oscillator Y1, resistance R1, R2 an end and electric capacity C1 separately connects, and is connected to the base stage of NPN triode Q1; No. two end ground connection of No. two termination power VCC of resistance R1, R2, namely R1, R2 series connection centre tap has received the base stage of triode Q1, utilizes them to the dividing potential drop of power supply VCC to provide the starting of oscillation voltage of crystal oscillator Y1.
An end of No. two ends of described electric capacity C1, an end of electric capacity C2, inductance L 1 and the emitter of NPN triode Q1 connect, and are connected to the base stage of NPN triode Q2; Power supply VCC all received by the collector of NPN triode Q1, Q2.
An end of No. two ends of described electric capacity C2, No. two ends of inductance L 1, electric capacity C3 and an end of resistance R3 connect; No. two ends of electric capacity C3 and No. two ends of resistance R3 all connect with ground; Such electric capacity C2 and L1 just forms a LC loop, its resonance frequency f 0can be calculated by following formula: in practical application, the nominal frequency of crystal oscillator should be greater than f 0, to make circuit starting of oscillation.
The described emitter of NPN triode Q2 is held with No. of resistance R4 and is connected with the input end of phase inverter U1A, and No. two ends of resistance R4 are connected to the ground; The effect of phase inverter U1A carries out shaping to output waveform, because the emitter output waveform of NPN triode Q2 is irregular but the waveform of near sinusoidal, after phase inverter U1A shaping, output signal becomes the square wave of certain frequency.
After described phase inverter U1A shaping, output signal frequency is relevant with the capacitance size of testing capacitance Cx with the nominal frequency of crystal oscillator Y1; After crystal oscillator Y1 determines, during the capacitance variation of testing capacitance Cx, the frequency that phase inverter U1A can be caused to output signal changes, in certain temperature range, this change is linear, frequency like this by measuring phase inverter U1A output signal just can obtain the capacitance of testing capacitance Cx, measured capacitance is the absolute capacitance values of testing capacitance Cx, the measuring accuracy of this capacitance is relevant with the frequency measurement accuracy that phase inverter U1A outputs signal, write in scope one, frequency measurement accuracy is higher, and measured capacitance value precision is higher.
Described a kind of differential capacitor metering circuit, comprises a differential capacitor to be measured, crystal oscillating circuit 1, crystal oscillating circuit 2 and a difference on the frequency and extracts circuit.
Described differential capacitor to be measured generally has three pole plates, they are top crown, middle plate and lower step respectively, every block step all draws wire, and such top crown and dynode, middle plate and lower step form an electric capacity respectively, can be set to electric capacity Cx1 and electric capacity Cx2; During the change in location of then middle plate, the capacitance of electric capacity Cx1 and electric capacity Cx2 all can change, if variable quantity is Cd, if the capacitance of electric capacity Cx1 increases Cd/2, then the capacitance of electric capacity Cx2 reduces Cd/2 accordingly, and vice versa; A kind of differential capacitor metering circuit of the present invention is mainly used to measure this variable quantity Cd.
Described crystal oscillating circuit 1 and crystal oscillating circuit 2 are all identical with the crystal oscillating circuit structure measuring absolute capacitance, but component parameters may be different; Two electric capacity formed between differential capacitor three pole plates can be considered as the testing capacitance in crystal oscillating circuit 1 and crystal oscillating circuit 2 respectively; Wherein the extension line of top crown connects an end of crystal oscillator in crystal oscillating circuit 1, middle plate ground connection, bottom crown connects an end of crystal oscillator in crystal oscillating circuit 2, and be equivalent to crystal oscillating circuit 1 like this for measuring electric capacity Cx1, crystal oscillating circuit 2 is for measuring electric capacity Cx2; In order to obtain the capacitance variation direction of electric capacity Cx1 and electric capacity Cx2, metering circuit 1 should be not identical with the nominal frequency of crystal oscillator in metering circuit 2.
It is ask difference on the frequency to the output signal of described crystal oscillating circuit 1 and crystal oscillating circuit 2 above that described difference on the frequency extracts circuit function; The core of this circuit is a d type flip flop, the inverter output of crystal oscillating circuit 1 connects the D end of d type flip flop, the inverter output of crystal oscillating circuit 2 connects the CLK end of d type flip flop, CLR and the PR termination power VCC of d type flip flop, the output signal of difference on the frequency extraction circuit is the output signal of the output terminal Q of d type flip flop, and the frequency of this signal is the difference on the frequency of the output signal of crystal oscillating circuit 1 and crystal oscillating circuit 2; The capacitance change Cd that difference on the frequency extracts the frequency of output signal of circuit and differential capacitor is linear, because just can Cd be obtained by the frequency of the output signal of survey frequency difference extraction circuit a bit, this measured capacitance value precision is relevant with the frequency measurement accuracy of output signal simultaneously, write in scope one, frequency measurement accuracy is higher, and measured capacitance value precision is higher.
Described a kind of differential capacitor metering circuit, when differential capacitor top crown or bottom crown ground connection, when other circuit is constant, can record the absolute capacitance values of electric capacity Cx2 or electric capacity Cx1.
Advantage of the present invention and good effect:
1, this circuit adopts single power supply, and the voltage of power supply VCC can be 2V ~ 6V, and complete compatible TTL and CMOS level, has range of application widely.
2, circuit structure is simple, and components and parts used are the electronic component all commonly used, and not only circuit floor area is little, low in energy consumption, and element buying is convenient, cost is extremely low.
3, this circuit resolution depends primarily on the precision of frequency measurement, and current frequency measurement technology maturation, can realize high-precision capacitance measurement.
4, only just achieve the extraction of difference on the frequency with a d type flip flop, circuit is simple, and differential capacitor metering circuit also can survey absolute capacitance by error of measurement dynamic condenser.
Accompanying drawing explanation
Fig. 1 is absolute capacitive measurement circuit;
The output signal of Fig. 2 is Cx when being 7pF absolute capacitive measurement circuit;
The output signal of Fig. 3 is Cx when being 20pF absolute capacitive measurement circuit;
Fig. 4 is differential capacitor metering circuit functional block diagram
Fig. 5 is two-way crystal oscillating circuit;
Fig. 6 is that difference on the frequency extracts circuit;
Fig. 7 is Cx1 when be 20pF, Cx2 being 22pF, and difference on the frequency extracts the output waveform of circuit;
Fig. 8 is Cx1 when be 20pF, Cx2 being 27pF, and difference on the frequency extracts the output waveform of circuit;
Embodiment
Below in conjunction with embodiment and accompanying drawing, the present invention is described in further detail, but embodiments of the present invention are not limited only to this.
One, as shown in Figure 1, concrete implementation step is as follows for a kind of crystal oscillating circuit circuit diagram measuring absolute capacitance:
(1) Fig. 1 is the crystal oscillating circuit of the measurement absolute capacitance in a kind of absolute capacitance of the present invention and differential capacitor metering circuit.This circuit comprises two NPN triode Q1 and Q2 as shown in Figure 1, four resistance R1, R2, R3 and R4, three known capacitance C1, C2 and C3, an inductance L 1, crystal oscillator Y1, a phase inverter U1A and testing capacitance Cx.
(2) No. one of testing capacitance Cx end ground connection as shown in Figure 1, an end of No. two termination crystal oscillator Y1; An end of No. two ends of crystal oscillator Y1, resistance R1, R2 an end and electric capacity C1 separately connects, and is connected to the base stage of NPN triode Q1; No. two end ground connection of No. two termination power VCC of resistance R1, R2, an end of No. two ends of electric capacity C1, an end of electric capacity C2, inductance L 1 and the emitter of NPN triode Q1 connect, and are connected to the base stage of NPN triode Q2; Power supply VCC all received by the collector of NPN triode Q1, Q2; An end of No. two ends of electric capacity C2, No. two ends of inductance L 1, electric capacity C3 and an end of resistance R3 connect; No. two ends of electric capacity C3 and No. two ends of resistance R3 all connect with ground; The emitter of NPN triode Q2 is held be connected with the input end of phase inverter U1A with No. one of resistance R4, and No. two ends of resistance R4 are connected to the ground.
(3) after phase inverter U1A shaping, output signal frequency is relevant with the capacitance size of testing capacitance Cx with the nominal frequency of crystal oscillator Y1; After crystal oscillator Y1 determines, during the capacitance variation of testing capacitance Cx, the frequency that phase inverter U1A can be caused to output signal changes, in certain temperature range, this change is linear, and the frequency like this by measuring phase inverter U1A output signal just can obtain the capacitance of testing capacitance Cx.
(4) output waveform of Fig. 2 is testing capacitance Cx capacitance size when being 7pF phase inverter U1A, the output waveform of Fig. 3 is testing capacitance Cx capacitance size when being 20pF phase inverter U1A; As can be seen from Figures 2 and 3, the frequency of output signal is respectively 4.91476MHz and 4.91520MHz, when capacitance increases 13pF, the frequency of output signal adds 440Hz, and in the frequency resolution of follow-up frequency measurement circuit for 0.1Hz, capacitance measurement precision will be less than 0.003pF, if frequency resolution improves, capacitance measurement precision can also be higher, and current frequency measurement technology maturation, this capacitance measurement circuit has very high measuring accuracy as seen.
Two, as shown in Figure 4, concrete implementation step is as follows for a kind of differential capacitor metering circuit functional block diagram:
(1) Fig. 4 is differential capacitor metering circuit functional block diagram.In Fig. 4, differential capacitor equivalent electrical circuit is the equivalent electrical circuit of differential capacitor to be measured, wherein A, B and C tri-terminals, represent the extraction wire of the top crown of differential capacitor to be measured, lower step and middle plate respectively, the capacitor equivalent that differential capacitor top crown to be measured and dynode are formed is electric capacity Cx1, and the capacitor equivalent that differential capacitor middle plate to be measured and lower step are formed is electric capacity Cx2; The input end of the A termination crystal oscillating circuit 1 of differential capacitor in figure, the input end of the B termination crystal oscillating circuit 2 of differential capacitor; The output terminal of crystal oscillating circuit 1 and the output terminal of crystal oscillating circuit 2 have received two input ends that difference on the frequency extracts circuit respectively; The frequency of the output signal of difference on the frequency extraction circuit is the difference of the frequency of the frequency of the output signal of crystal oscillating circuit 1 and the output signal of crystal oscillating circuit 2, the difference of the capacitance of this frequency direct ratio and electric capacity Cx1 and electric capacity Cx2.
(2) two-way crystal oscillating circuit is illustrated in figure 5.In Fig. 5, in dotted-line ellipse frame, circuit corresponds to " the differential capacitor equivalent electrical circuit " in Fig. 4, and in the dotted line frame of upper right side, circuit corresponds to " the crystal oscillating circuit 1 " in Fig. 4, and in the dotted line frame of lower right, circuit corresponds to " the crystal oscillating circuit 2 " in Fig. 4; One of them equivalent capacity Cx1 of differential capacitor is identical with the circuit structure that crystal oscillating circuit 2 is formed with another equivalent capacity Cx2 of differential capacitor with the circuit that crystal oscillating circuit 1 is formed as shown in Figure 5, and circuit structure is also identical shown in these two forming circuits with Fig. 1, therefore can annexation in reference diagram 1, here no longer describe in detail, but in practical application according to demand, component parameters used may be different from Fig. 1.
(3) be illustrated in figure 6 the circuit diagram that difference on the frequency extracts circuit, corresponding to " difference on the frequency extraction circuit " in Fig. 4, its core is a d type flip flop.Output signal F_Cx1 in input signal F_Cx1 and Fig. 5 in Fig. 4 to be connected, output signal F_Cx2 and be connected in input signal F_Cx2 and Fig. 5, output signal F_OUT corresponds to " difference frequency signal " in Fig. 4.
(4) as Fig. 7 be equivalent capacity Cx1, the equivalent capacity Cx2 with the electric capacity replacement differential capacitor of a 22pF replacing differential capacitor with the electric capacity of a 20pF time, difference on the frequency extracts " difference frequency signal " waveform that circuit exports, and as can be seen from the figure this signal frequency is 82.1441Hz; As Fig. 8 be equivalent capacity Cx1, the equivalent capacity Cx2 with the electric capacity replacement differential capacitor of a 27pF replacing differential capacitor with the electric capacity of a 20pF time, difference on the frequency extracts " difference frequency signal " waveform that circuit exports, and as can be seen from the figure this signal frequency is 175.185Hz; Namely the capacitance of Cx2 adds 5pF, " difference frequency signal " frequency adds 93.0409Hz, set the frequency resolution of subsequent frequencies metering circuit as 0.1Hz equally, then capacitance measurement precision is less than 0.0054pF, if frequency resolution improves, capacitance measurement precision can also be higher, and current frequency measurement technology maturation, this capacitance measurement circuit has very high measuring accuracy as seen.
Three, the implementation method of above-mentioned capacitance measurement circuit, also comprises the steps:
(1) as shown in Figure 1 in " absolute capacitive measurement circuit " in order to obtain enough starting of oscillation voltage, should the ratio of suitable regulating resistance R1 and R2, one of them first can be replaced with steady arm, this position resistance under being adjusted to correct position postscript also replaces with fixed resistance; In order to make the emitter of NPN triode Q2 have enough output voltages to drive phase inverter to output signal shaping, the resistance of resistance R4 is unsuitable excessive; Electric capacity C2 and L1 forms a LC loop, its resonance frequency f 0can be calculated by following formula: in practical application, the nominal frequency of crystal oscillator should be greater than f 0, to make circuit starting of oscillation, also for ease of and ensure that the emitter of NPN triode Q2 has enough output voltages, the nominal frequency of selected crystal oscillator is also unsuitable excessive, but should be greater than f 0.Crystal oscillating circuit 1 in differential capacitor metering circuit is identical with above-mentioned " absolute capacitive measurement circuit " with the situation of crystal oscillating circuit 2.
(2) frequency of " difference frequency signal " F_OUT exported in differential capacitor metering circuit is the difference on the frequency of the frequency of the output signal F_Cx1 of " crystal oscillating circuit 1 " and the output signal F_Cx2 of " crystal oscillating circuit 2 ".When finding that the capacitance of testing capacitance is larger by Fig. 2, Fig. 3, output frequency is larger, when finding that the capacitance of differential capacitor to be measured two equivalent capacitys differs larger by Fig. 7, Fig. 8, output frequency is larger simultaneously, in practical application, Cx1 increases how many, Cx2 just reduces how many, same Cx1 reduces how many, and Cx2 just increases how many, in order to obtain the capacitance variation direction of two electric capacity, the nominal frequency of crystal oscillator Y1 and Y2 should be different, but difference is unsuitable excessive; If Y1 nominal frequency Δ f larger than Y2 nominal frequency, when then Cx1 capacitance equals Cx2 capacitance, the frequency exporting " difference frequency signal " will equal Δ f, when Cx1 capacitance is greater than Cx2 capacitance, the frequency exporting " difference frequency signal " will be greater than Δ f, otherwise is then less than Δ f, and capacitance difference is larger, it is larger that frequency and the Δ f of " difference frequency signal " also differ, and so just can distinguish the capacitance variation direction of two electric capacity and accurately measure the size of this variable quantity.

Claims (4)

1. absolute capacitance and a differential capacitor metering circuit, comprises and a kind ofly measures the crystal oscillating circuit of absolute capacitance and a kind of differential capacitor metering circuit.
2. a kind of crystal oscillating circuit measuring absolute capacitance described in claim 1, it is characterized in that: comprise two NPN triode Q1 and Q2, four resistance R1, R2, R3 and R4, three known capacitance C1, C2 and C3, an inductance L 1, a crystal oscillator Y1, a phase inverter U1A and testing capacitance Cx;
An end ground connection of testing capacitance Cx, an end of No. two termination crystal oscillator Y1; An end of the respective end of No. two ends of crystal oscillator Y1, resistance R1, R2 and electric capacity C1 connects, and is connected to the base stage of NPN triode Q1; No. two end ground connection of No. two termination power VCC of resistance R1, R2;
An end of No. two ends of electric capacity C1, an end of electric capacity C2, inductance L 1 and the emitter of NPN triode Q1 connect, and are connected to the base stage of NPN triode Q2;
Power supply VCC all received by the collector of NPN triode Q1, Q2;
An end of No. two ends of electric capacity C2, No. two ends of inductance L 1, electric capacity C3 and an end of resistance R3 connect; No. two ends of electric capacity C3 and No. two ends of resistance R3 all connect with ground; Such electric capacity C2 and L1 just forms a LC loop, its resonance frequency f 0can be calculated by following formula: in practical application, the nominal frequency of crystal oscillator should be greater than f 0, to make circuit starting of oscillation;
The emitter of NPN triode Q2 is held be connected with the input end of phase inverter U1A with No. one of resistance R4, and No. two ends of resistance R4 are connected to the ground;
The frequency measurement circuit that the output termination of phase inverter U1A is follow-up, sad measurement output frequency obtains the absolute capacitance values of surveyed electric capacity.
3. a kind of differential capacitor metering circuit described in claim 1, is characterized in that: comprise a differential capacitor to be measured, crystal oscillating circuit 1, crystal oscillating circuit 2 and a difference on the frequency and extract circuit;
Crystal oscillating circuit 1 and crystal oscillating circuit 2 are all identical with the crystal oscillating circuit structure measuring absolute capacitance described in claim 2, but component parameters may be different; Two electric capacity formed between differential capacitor three pole plates can be considered as the testing capacitance in crystal oscillating circuit 1 and crystal oscillating circuit 2 respectively; Wherein differential capacitor top crown to be measured connects an end of crystal oscillator in crystal oscillating circuit 1, middle plate ground connection, and bottom crown connects an end of crystal oscillator in crystal oscillating circuit 2; Crystal oscillating circuit 1 is not identical with the nominal frequency of crystal oscillator in crystal oscillating circuit 2, can obtain the capacitance variation direction of differential capacitor;
The core that difference on the frequency extracts circuit is a d type flip flop, the inverter output of crystal oscillating circuit 1 connects the D end of d type flip flop, the inverter output of crystal oscillating circuit 2 connects the CLK end of d type flip flop, CLR and the PR termination power VCC of d type flip flop, the output signal of difference on the frequency extraction circuit is the output signal of the output terminal Q of d type flip flop, the output terminal Q of d type flip flop connects follow-up frequency measurement circuit, is obtained the capacitive differential of institute's error of measurement dynamic condenser by the output frequency of the output terminal Q measuring d type flip flop.
4. a kind of differential capacitor metering circuit described in claim 3, when differential capacitor top crown ground connection, when other circuit is constant, can record the absolute capacitance values of the electric capacity formed between bottom crown and ground; When differential capacitor bottom crown ground connection, when other circuit is constant, the absolute capacitance values of the electric capacity formed between top crown and ground can be recorded.
CN201410647452.9A 2014-11-13 2014-11-13 Absolute capacitor and differential capacitor measuring circuit Pending CN104316774A (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110531165A (en) * 2019-08-20 2019-12-03 杭州电子科技大学 Novel high-precision dielectric constant test macro based on microwave remote sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110531165A (en) * 2019-08-20 2019-12-03 杭州电子科技大学 Novel high-precision dielectric constant test macro based on microwave remote sensor
CN110531165B (en) * 2019-08-20 2021-11-23 杭州电子科技大学 Novel high-precision dielectric constant test system based on microwave sensor

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Application publication date: 20150128