CN104280580A - Testing needle head and semiconductor testing jig - Google Patents
Testing needle head and semiconductor testing jig Download PDFInfo
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- CN104280580A CN104280580A CN201410605989.9A CN201410605989A CN104280580A CN 104280580 A CN104280580 A CN 104280580A CN 201410605989 A CN201410605989 A CN 201410605989A CN 104280580 A CN104280580 A CN 104280580A
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Abstract
Provided are a testing needle head and a semiconductor testing jig. The testing needle head comprises an insulator, a first testing needle, an elastic element and a second testing needle. A cavity which penetrates through the two ends of the insulator is arranged in the insulator. The first testing needle is placed in the cavity of the insulator. The first testing needle comprises a first body, a first testing end placed at one end of the first body and a first connecting end placed at the other end of the first body. The elastic element is placed in the cavity. The elastic element is connected with the first testing needle and is suitable for driving the first testing needle to move up and down along the cavity. The second testing needle is placed on the surface of the side wall of the insulator and surrounds the first testing needle. The second testing needle and the first testing needle are coaxial. The second testing needle comprises a second body, a second testing end placed at the second body and a second connecting end placed at the other end of the second body. The second testing end is provided with a downward-concave arc face. The first testing needle of the testing needle head can move up and down, different testing requirements are met, and the testing needle head is suitable for testing of a spherical tested terminal.
Description
Technical field
The present invention relates to semiconductor test technical field, particularly one test syringe needle and semiconductor test tool.
Background technology
Test processing procedure is after IC encapsulation, the electrical functionality of the product that test package completes, to ensure IC integrality functionally of dispatching from the factory, and does to classify according to its electrical functionality to the product tested, as the Appreciation gist of IC different brackets product, last and visual testing operation is done to product.
Electrical functionality test is carry out testing to determine the normal operation of product energy for the various electrical parameters of product.
On traditional same tested terminal, the test of two-point contact is as Kelvin's test etc., the mode adopting Double ejection pin or the distribution of two golden finger parallel side-by-side more, and it mainly has the following disadvantages:
1, manufacturing accuracy is lower: along with constantly reducing of semiconductor product size, spacing between the size of tested terminal and different tested terminal is also constantly reducing, in order to comply with this trend, Conventional parallel the Double ejection pin of column distribution or two golden finger test mode bottleneck in the problem of its close spacing become increasingly conspicuous, accuracy requirement is more and more higher, and some cannot achieve even.
2, structural strength is more weak: in order to realize two-point contact test in space limited on tested terminal, thimble or golden finger corresponding more and more thinner, its Mechanical Structure Strength is also more and more weak.
3, serviceable life is shorter: the test contact head of traditional thimble or golden finger is more frayed, especially precision propose requirements at the higher level, physical strength relatively low time, the degree of wear is larger, and then reduces the serviceable life of measurement jig.
4, measuring accuracy is lower: for complying with the compact growth requirement of semiconductor, the resistance value that more and more thinner thimble or golden finger produce constantly increases, and simultaneously when carrying out high-current test, can produce larger pressure drop and affecting the judgement of test number; On the other hand, the Double ejection pin of parallel side-by-side distribution or the also easy deviation producing test number because of offset deviation between the two of two golden finger; In addition, the Double ejection pin of traditional also column distribution adopts two back to the way of contact on inclined-plane in order to the distance reduced between two pins, and contact head easily rotates tested terminal because of the torsion of telescopic spring in its one-piece construction and then affects measuring accuracy; Again on the one hand, when tested terminal is spherical, the test carrying out electric property is difficult to.
Summary of the invention
The problem that the present invention solves how to improve the precision and stability of existing electrical performance testing.
For solving the problem, the invention provides a kind of test syringe needle, comprising: insulator, there is in described insulator the cavity of through insulator two ends; Be arranged in the first testing needle of the cavity of insulator, described first testing needle comprises the first noumenon, is positioned at first test lead of the first noumenon one end and is positioned at the first link of the first noumenon other end; Be arranged in the flexible member of cavity, described flexible member is connected with the first testing needle, is suitable for driving described first testing needle to move up and down along cavity; Be positioned at second testing needle of insulator side wall surface around described first testing needle, second testing needle is coaxial with the first testing needle, second testing needle comprises the second body, is positioned at second test lead of second body one end and is positioned at the second link of the second body other end, and the second test lead has the first recessed cambered surface.
Optionally, chamber in described insulator comprises the first chamber, be positioned at the second chamber of the first chamber upper end and be positioned at the 3rd chamber of the first chamber lower end, described first chamber and the second chamber mutually through, described 3rd chamber and the first chamber mutually through, and the width of the width of the second chamber and the 3rd chamber is all less than the width of the first chamber, described first testing needle is through the first chamber, the second chamber and the 3rd chamber, and described flexible member is positioned at the first chamber.
Optionally, the first noumenon of described first testing needle has spacing preiection, and described spacing preiection is positioned at the first chamber, and one end of flexible member contacts with spacing preiection, and the other end of flexible member contacts with the chamber wall of the first cavity bottom.
Optionally, described flexible member is spring, and described first testing needle is through the hole in the middle of spring, and one end of spring contacts with spacing preiection, and the other end of spring contacts with the chamber wall of the first cavity bottom.
Optionally, described flexible member is metal clips, and metal clips one end contacts with spacing preiection, and the other end of metal clips contacts with the chamber wall of the first cavity bottom.
Optionally, insulator head surface is lower than the second test lead surface of the second testing needle.
Optionally, the first test lead surface of described first testing needle and the top surface of insulator are plane, and an end margin of described first cambered surface contacts with insulator edge, and the other end edge of the first cambered surface contacts with the top surface of the second testing needle.
Optionally, first test lead surface of described first testing needle and the top surface of insulator have the second recessed cambered surface, one end margin of described first cambered surface and the edge contact of insulator, the other end edge of the first cambered surface contacts with the top surface of the second testing needle.
Optionally, described first cambered surface and the second cambered surface are spherical or one section of circular arc on ellipsoid or the spherical terminal to be tested of class.
Present invention also offers a kind of semiconductor test tool, comprising:
Support plate; Be positioned at the some test syringe needles on support plate, each test syringe needle comprises, insulator, has the cavity of through insulator two ends in described insulator; Be arranged in the first testing needle of the cavity of insulator, described first testing needle comprises the first noumenon, is positioned at first test lead of the first noumenon one end and is positioned at the first link of the first noumenon other end; Be arranged in the flexible member of cavity, described flexible member is connected with the first testing needle, is suitable for driving described first testing needle to move up and down along cavity; Be positioned at second testing needle of insulator side wall surface around described first testing needle, second testing needle is coaxial with the first testing needle, second testing needle comprises the second body, is positioned at second test lead of second body one end and is positioned at the second link of the second body other end, and the second test lead has the first recessed cambered surface.
Compared with prior art, technical scheme of the present invention has the following advantages:
First testing needle and the second testing needle are integrated on a test syringe needle by test syringe needle of the present invention, second testing needle is around described first testing needle, isolate with insulator between second testing needle and the first testing needle, thus while ensureing that the size of testing needle is less, promote the physical strength of testing needle; On the other hand, the first testing needle and the second testing needle are coaxial distributions, make the precision of spacing between the first testing needle and the second testing needle higher, improve the precision of test; Again on the one hand, need multiple testing needle (such as Double ejection pin or golden finger) just can carry out electrical performance testing compared to prior art, a test syringe needle of the present invention can carry out the test of electric property; On the other hand because the first test syringe needle can move up and down along cavity, even if when there are wearing and tearing and make the height of the first test lead change in the first test lead of the first testing needle, when testing, first testing needle is after being under pressure and moving down, first test lead surface of the first testing needle still can the surface of the second testing needle flush, and namely the first testing needle still can coordinate with the second testing needle the test carrying out electric property; Again on the one hand, when non-test state, the first test lead of the first test syringe needle outwardly, when testing, described first testing needle can first with tested termination contact, be conducive to judging tested terminal and test syringe needle and whether aim at well; Again on the one hand, second test lead has the first recessed cambered surface, first cambered surface can be corresponding with the cambered surface of spherical tested terminal surfaces, when carrying out the test of electric property, second testing needle of test syringe needle can well with the spherical surface contact of tested terminal, thus improve the precision of test.
The multiple tested terminal that semiconductor test tool of the present invention can realize treating test package structure carries out the test of electric property simultaneously.
Further, in described substrate, be formed with signal circuit, be convenient to transmission and the acquisition of test signal in test process, and improve semiconductor test tool integrated level.
Accompanying drawing explanation
Fig. 1 ~ Fig. 2 is the structural representation of embodiment of the present invention test syringe needle;
Fig. 3 ~ Fig. 4 is the structural representation of embodiment of the present invention semiconductor test tool.
Embodiment
As background technology sayed, the performance of existing thimble or golden finger still has much room for improvement.
For this reason, the invention provides one and coaxially test syringe needle, comprise insulator, there is in described insulator the cavity of through insulator two ends; Be arranged in the first testing needle of the cavity of insulator, described first testing needle comprises the first noumenon, is positioned at first test lead of the first noumenon one end and is positioned at the first link of the first noumenon other end; Be arranged in the flexible member of cavity, described flexible member is connected with the first testing needle, is suitable for driving described first testing needle to move up and down along cavity; Be positioned at second testing needle of insulator side wall surface around described first testing needle, second testing needle is coaxial with the first testing needle, second testing needle comprises the second body, is positioned at second test lead of second body one end and is positioned at the second link of the second body other end, and the second test lead has the first recessed cambered surface.First testing needle and the second testing needle are integrated on a test syringe needle by test syringe needle of the present invention, second testing needle is around described first testing needle, isolate with insulator between second testing needle and the first testing needle, thus while ensureing that the size of testing needle is less, promote the physical strength of testing needle; On the other hand, the first testing needle and the second testing needle are coaxial distributions, make the precision of spacing between the first testing needle and the second testing needle higher, improve the precision of test; Again on the one hand, need multiple testing needle (such as Double ejection pin or golden finger) just can carry out electrical performance testing compared to prior art, a test syringe needle of the present invention can carry out the test of electric property; On the other hand because the first test syringe needle can move up and down along cavity, even if when there are wearing and tearing and make the height of the first test lead change in the first test lead of the first testing needle, when testing, first testing needle is after being under pressure and moving down, first test lead surface of the first testing needle still can the surface of the second testing needle flush, and namely the first testing needle still can coordinate with the second testing needle the test carrying out electric property; Again on the one hand, when non-test state, the first test lead of the first test syringe needle outwardly, when testing, described first testing needle can first with tested termination contact, be conducive to judging tested terminal and test syringe needle and whether aim at well; Again on the one hand, second test lead has the first recessed cambered surface, first cambered surface can be corresponding with the cambered surface of spherical tested terminal surfaces, when carrying out the test of electric property, second testing needle of test syringe needle can well with the spherical surface contact of tested terminal, thus improve the precision of test.
For enabling above-mentioned purpose of the present invention, feature and advantage more become apparent, and are described in detail specific embodiments of the invention below in conjunction with accompanying drawing.When describing the embodiment of the present invention in detail, for ease of illustrating, schematic diagram can be disobeyed general ratio and be made partial enlargement, and described schematic diagram is example, and it should not limit the scope of the invention at this.In addition, the three-dimensional space of length, width and the degree of depth should be comprised in actual fabrication.
Fig. 1 ~ Fig. 2 is the structural representation of embodiment of the present invention test syringe needle; Fig. 3 ~ Fig. 4 is the structural representation tool tool of embodiment of the present invention semiconductor test tool.
Please refer to Fig. 1, provide test syringe needle 20 in one embodiment of the invention, comprising:
Insulator 202, has the cavity 212 of through insulator 202 two ends in described insulator 202;
Be arranged in the first testing needle 201 of the cavity 212 of insulator 202, described first testing needle 201 comprises the first noumenon, is positioned at first test lead 21 of the first noumenon one end and is positioned at the first link 22 of the first noumenon other end;
Be arranged in the flexible member 213 of cavity 212, described flexible member 213 is connected with the first testing needle 201, is suitable for driving described first testing needle 201 to move up and down along cavity 212;
Be positioned at second testing needle 203 of insulator 202 sidewall (lateral wall) surface around described first testing needle 201, second testing needle 203 coaxial with the first testing needle 201 (there is common central shaft), second testing needle 203 comprises the second body, is positioned at second test lead 23 of second body one end and is positioned at the second link 24 of the second body other end, described second test lead 23 there is the first recessed cambered surface 25.
Chamber 212 in described insulator 202 comprises the first chamber 212a, be positioned at the second chamber 212b of the first chamber 212a upper end, with the 3rd chamber 212c being positioned at the first chamber 212a lower end, described first chamber 212a and the second chamber 212b is mutually through, described 3rd chamber 212c and the first chamber 212a is mutually through, and the width (or size) of the width of the second chamber 212b and the 3rd chamber 212c is all less than the width (or size) of the first chamber 212a, described first testing needle 201 is through the first chamber 212a, second chamber 212b and the 3rd chamber 212c, described flexible member 213 is positioned at the first chamber 212a.
Corresponding described insulator 202 thickness also can be very little, and the thickness of described insulator 202 is 80 nanometer ~ 400 micron, and the thickness of insulator 202 can be 100 nanometer ~ 10 micron in one embodiment.
The material of described insulator 202 can also be resin material, such as, and epoxy resin, polyimide resin, polyvinyl resin, benzocyclobutane olefine resin or polybenzoxazoles resin etc.The material of described insulator 202 can also be insulating dielectric materials, one or more in such as monox, silicon nitride, silicon oxynitride, fire sand, fire sand.
Described insulator 202 can be single or multiple lift stacked structure.
The first noumenon of described first testing needle 201 has spacing preiection 211, described spacing preiection 211 is positioned at the first chamber 212a, one end of flexible member 213 contacts with spacing preiection 211, and the other end of flexible member 213 contacts with the chamber wall bottom the first chamber 212a.
Described spacing preiection 211 is for when non-test state (when flexible member 213 is in stretched condition), limit the position of the first testing needle 201, the position of the first testing needle 201 is made to keep fixing relative to the position of the second testing needle 203, particularly in subsequent embodiment, when some test syringe needles are applied to semiconductor test tool, under non-test state, first testing needle 201 of some test syringe needles 20 is all be limited to same position (the first test lead 21 of the first testing needle 201 is highly consistent), when encapsulating structure to be tested is placed on semiconductor test tool, prevent the inconsistent impact on test process and test structure of the height of the first test lead 21 of some first testing needles 201.
In the present embodiment, described flexible member 213 is spring, and described first testing needle 213 is through the hole in the middle of spring, and one end of spring contacts with spacing preiection 211, and the other end of spring contacts with the chamber wall bottom the first chamber 212a.When non-test state, described flexible member (spring) 213 pairs of spacing preiections 211 produce tension force upwards, spacing preiection 211 is contacted with the chamber wall at the first chamber 212a top, and the first test lead 21 surface of the first testing needle 201 is surperficial higher than the second test lead 23 of the second testing needle 203; When testing, encapsulating structure to be tested is placed on test syringe needle, first testing needle 21 moves down under the effect of external pressure, now flexible member (spring) 213 is compressed, until when the first test lead 21 surface of the first testing needle 201 flushes with the second test lead 23 surface of the second testing needle 203, first testing needle 201 stops moving down, now, the first test lead 21 surface of the first testing needle 201 all contacts with the tested terminal surfaces on encapsulating structure to be tested with the second test lead 23 surface of the second testing needle 203.
The size of described first testing needle 201 is less than the size of the second chamber 212b and the 3rd chamber 212c, can move up and down to make the first testing needle 201 along in cavity.
In other embodiments, described flexible member can be metal clips, and metal clips one end contacts with spacing preiection 211, and the other end of metal clips contacts with the chamber wall bottom the first chamber 212a.
The material of described metal clips is the metal or alloy such as copper, tungsten.
When non-test state, described flexible member (metal clips) is in straight configuration, and now spacing preiection 211 contacts with the chamber wall at the first chamber 212a top; When test mode, described first testing needle 201 moves down under the effect of external force, and described flexible member (metal clips) is in case of bending.
In one embodiment, when described flexible member (metal clips) is in straight configuration, the sidewall of described flexible member (metal clips) distance the first testing needle 201 and have the first distance with the sidewall of the first chamber 212a, now the distance on the second test lead 23 surface of the first outstanding second testing needle 202 in test lead 21 surface of the first testing needle 201 is second distance.In order to make when carrying out electrical performance testing, the first testing needle 201 be under pressure move down time, the first test lead 21 surface of the first testing needle 201 is surperficial concordant with the second test lead 23 of the second test lead 203, and described first distance is greater than second distance.
Described metal clips can be single bonding jumper, quantity >=2 of bonding jumper are followed, some bonding jumper symmetries or be equal angularly distributed in around the first testing needle, the acting force being subject to metal clips making the first testing needle 201 all directions is homogeneity, and the first testing needle 201 moves up and down and can not be affected.
In one embodiment, in the chamber wall at the bottom of described spacing preiection 211 and the top of the first chamber 212a, there is some grooves or through hole, the two ends of metal clips lay respectively in corresponding groove or through hole, metal clips end positions is fixed, prevents metal clips from producing unnecessary displacement.
Described second testing needle 203 is positioned at sidewall (lateral wall) surface of insulator 202, second testing needle 203 is fixed relative to insulator 202, and the second test lead 23 surface of the second testing needle 203 flushes with the top surface of insulator 203, in the present embodiment, first chamber 212a, the chamber wall thickness of the second chamber 212b and the 3rd chamber 212c is consistent, the width of the second chamber 212b and the width (or size) of the 3rd chamber 212c are all less than the width (or size) of the first chamber 212a, the portion outboard wall of insulator 202 (part of corresponding first chamber 212a) is made to have outside projection, corresponding second testing needle have the groove corresponding with projection, when second testing needle 203 is fixed on sidewall (lateral wall) surface of insulator 202, both contacts area and adhesive force all increase, the second testing needle 203 is made to be not easy to come off from the sidewall of insulator 202, add the serviceable life of testing needle.
The material of described first testing needle 201 and the second testing needle 203 is copper, gold, tungsten or alloy material or other suitable metal material or metal compound material.The material of the first testing needle 201 can be identical or not identical with the material of the second testing needle 203.
In the present embodiment, described insulator 202 top surface is lower than the second test lead 23 surface of the second testing needle 203, first test lead 21 surface of described first testing needle 201 and the top surface of insulator 202 are plane, when test mode (when the first testing needle 201 pressurized moves down), first test lead 21 surface flushes with insulator 202 top surface, a described end margin of the first cambered surface 25 and the edge contact of insulator 202, the other end edge of the first cambered surface 25 contacts with the top surface of the second testing needle 203, namely described first cambered surface is inclined upwardly from the edge of insulator 202 and extends to the top surface of the second testing needle 203.
In this enforcement, described second test lead 23 comprises the first cambered surface 25 and is positioned at the plane 26 at the second testing needle 203 top.In another embodiment, described second test lead 23 only can comprise the first cambered surface 25.
In this enforcement, the top surface of described second testing needle 203 is a plane 26.In another embodiment, the top surface of described second testing needle 203 is a curve overlapped with the second testing needle 203 sidewall (lateral wall), one end margin of the first cambered surface 25 and the edge contact of insulator 202, the other end edge of the first cambered surface 25 and the second testing needle 203 sidewall (lateral wall) surface contact, namely the first cambered surface 25 is inclined upwardly from the edge of insulator 202 and extends to the top surface of the second testing needle 203.
First test lead 21 surface of test syringe needle 20 of the present invention and the second test lead 23 surface be similar to spherical or ellipsoid or the spherical surface of class (the first test lead 21 of the first testing needle 201 move down into flush with insulator 202 surface time), thus test syringe needle 20 of the present invention can be applied to the test to spherical or ellipsoid or the spherical terminal to be tested of class, when carrying out electric property side test, the first object surface contact of the first test lead 21 of described first testing needle 201 and spherical or ellipsoid or the spherical terminal to be tested of class, first cambered surface 25 of described second test lead 23 and spherical or ellipsoid or spherical the second target surface of class contact (the second target surface is the region around first object surface), when testing, first testing needle 201 and the second testing needle 203 and spherical or ellipsoid or the spherical terminal to be tested of class form good face and contact, add the contact area of test syringe needle 20 and spherical or ellipsoid or the spherical terminal surfaces to be tested of class, thus the result of electrical performance testing accurately can reflect the electric property of spherical or ellipsoid or the spherical terminal reality to be tested of class, improve measuring accuracy.
In order to improve the precision of test further, in one embodiment, the radian of described first cambered surface 25 is at or about the radian of spherical or ellipsoid or the spherical terminal surfaces to be tested of class.
In one embodiment, from the direction pointing to the second test lead 23 away from the second test lead 23, the width of the part body of described second testing needle 203 reduces gradually, namely the width the closer to the second test lead 23 second testing needle is less, when by how being used for testing with test syringe needle 20, the distance between the test lead of adjacent test syringe needle 20 is increased.
First testing needle 201 and the second testing needle 203 are integrated on a test syringe needle by the test syringe needle 20 of the embodiment of the present invention, second testing needle 203 is around described first testing needle 201, isolate with insulator 202 between second testing needle 203 and the first testing needle 201, thus while ensureing that the size of testing needle is less, promote the physical strength of testing needle; On the other hand, first testing needle 201 and the second testing needle 203 are coaxial distributions, make the precision of spacing between the first testing needle 201 and the second testing needle 203 higher, and the spacing in test process between the first testing needle 201 and the second testing needle 203 can not change, and improves the precision of test; Again on the one hand, need multiple testing needle (such as Double ejection pin or golden finger) just can carry out electrical performance testing compared to prior art, the embodiment of the present invention is integrated on a test syringe needle due to the first testing needle 201 and the second testing needle 203, adopts because the embodiment of the present invention one test syringe needle can carry out the test of electric property; On the other hand because the first test syringe needle 201 can move up and down along cavity 212, even if when there are wearing and tearing and make the height of the first test lead 21 change in the first test lead 21 of the first testing needle 201, when testing, first testing needle 201 is after being under pressure and moving down, first test lead surface of the first testing needle 201 still can the surface of the second testing needle 203 flush, and namely the first testing needle 201 still can coordinate with the second testing needle the test carrying out electric property; Again on the one hand, when non-test state, the first test lead 21 of the first test syringe needle 201 outwardly, when testing, described first testing needle 201 can first with tested termination contact, be conducive to judging tested terminal and test syringe needle and whether aim at well; Again on the one hand, second test lead 23 has the first recessed cambered surface 25, first cambered surface 25 can be corresponding with the cambered surface of spherical tested terminal surfaces, when carrying out the test of electric property, second testing needle 203 of test syringe needle 20 can well with the spherical surface contact of tested terminal, thus improve the precision of test.
When test syringe needle 20 of the present invention for application is carried out electrical performance testing, in one embodiment, test syringe needle of the present invention can be applied to resistance test or high-current test, by one end of test syringe needle 20 and tested termination contact, make the surface contact of the first test lead 21 of the first testing needle 201 and the second test lead 23 surface of the second testing needle 203 and tested terminal, and test voltage is applied between the first testing needle 201 and the second testing needle 202, measure by the first testing needle 201, second testing needle 203, and the electric current on tested terminal, and obtain test resistance by test voltage divided by electric current.
Apply test syringe needle 20 of the present invention when carrying out the test of resistance, because the first testing needle 201 and the second testing needle 203 are coaxial, thus measuring current is spread to surrounding uniformly by the first testing needle 201, flow to the second testing needle 203, namely the electric current making the upper different directions of the annular region (part contacted with insulator 202) of the terminal to be tested between the first testing needle 201 and the second testing needle 203 flow through is average, improves the precision of test.
In other embodiments of the invention, test syringe needle of the present invention can be applied to other forms of electrical performance testing, such as can apply the test that multiple test syringe needle carries out electric property, such as measuring current can flow to the first testing needle or second testing needle of another test syringe needle from the first testing needle of a test syringe needle or the second testing needle, or test circuit can flow to the first testing needle and second testing needle of another test syringe needle from the second testing needle of a test syringe needle and the second testing needle.
Another embodiment of the present invention, additionally provide a kind of test syringe needle, please refer to Fig. 2, the difference of the present embodiment and previous embodiment is, first test lead 21 surface of described first testing needle 201 and the top surface of insulator have the second recessed cambered surface, a described end margin of the first cambered surface 25 and the edge contact of insulator, the other end edge of the first cambered surface 25 contacts with the top surface of the second testing needle 203
First test lead 21 surface of the first testing needle 201 and the top surface of insulator have the second recessed cambered surface, second test lead 23 surface of the second testing needle 201 has the first recessed cambered surface, when carrying out the test of electric property, first test lead 21 surface of the first testing needle 201 can form good face with spherical or ellipsoid or the spherical terminal to be tested of class and contact, and adds the area of contact.
In one embodiment, described first cambered surface and the second cambered surface 25 are spherical or one section of circular arc on ellipsoid or the spherical terminal to be tested of class, make to test syringe needle 20 to form good face with the surface of spherical or ellipsoid or the spherical terminal to be tested of class and contact, improve the precision of testing.
It should be noted that, in the present embodiment, please refer to previous embodiment about other restrictions or description testing syringe needle, do not repeat them here.
Additionally provide a kind of semiconductor test tool in the embodiment of the present invention, please refer to Fig. 3, described semiconductor test tool comprises:
Substrate 200;
Be positioned at the some test syringe needles 20 in substrate 200, described test syringe needle 20 comprises: insulator 202, has the cavity 212 of through insulator 202 two ends in described insulator 202; Be arranged in the first testing needle 201 of the cavity 212 of insulator 202, described first testing needle comprises the first noumenon, is positioned at first test lead 21 of the first noumenon one end and is positioned at the first link 22 of the first noumenon other end; Be arranged in the flexible member 213 of cavity, described flexible member 213 is connected with the first testing needle 201, is suitable for driving described first testing needle 201 to move up and down along cavity 212; Be positioned at second testing needle 203 of insulator 202 sidewall (lateral wall) surface around described first testing needle 201, second testing needle 203 is coaxial with the first testing needle 201, second testing needle 203 comprises the second body, is positioned at second test lead 23 of second body one end and is positioned at the second link 24 of the second body other end, described second test lead 23 there is the first recessed cambered surface 25.
It should be noted that, please refer to the aforementioned restriction about test syringe needle 20 or description about the restriction of test syringe needle 20 or description in the present embodiment, do not repeat them here.
The quantity of described test syringe needle 20 is more than or equal to two, in a specific embodiment, and the arrangement in ranks on a substrate 200 of described test syringe needle 20.
Second link 24 of described second testing needle 203 is fixed on the surface of substrate 200.In one embodiment, by welding technology, the second link 24 of the second testing needle 203 can be fixed on the surface of substrate 200.In other embodiments of the invention, described second testing needle 203 can be connected with substrate 200 surface by another way.
In described substrate 200, there is some through holes 216, when described through hole 216 moves up and down along cavity as the first testing needle 201, the movable passageway of the first link 22 of the first testing needle 201.
The first link 22 that the back side of described substrate 200 has metal link 215, first testing needle 201 is electrically connected with metal link 215 by a metal wire 217, and described metal wire 216 part is positioned at through hole 216.
Signal circuit is formed in described substrate 200, described signal circuit comprises first input end, the first output terminal, the second input end and the second output terminal, described first output terminal is electrically connected with the metal link 215 at substrate 200 back side, described second output terminal is electrically connected with the second link of the second testing needle 203, and described first input end and the second input end are electrically connected with the test circuit of outside respectively.Described test circuit is used for providing test signal, the test signal that described signal circuit is used for test circuit produces transfers to the first testing needle 201 and the second testing needle 203, and by the electric signal transmission that obtains in test process to test circuit, test circuit processes the electric signal received, and obtains test parameter.
The material PCB resin etc. of described substrate 200, described first input end and the first output terminal are by being positioned at intrabasement first metal wire electrical connection, and described second input end and the second output terminal are by being positioned at intrabasement second metal wire electrical connection.
In one embodiment, described substrate 200 comprises front and the back side with vis-a-vis, the back side of described substrate comprises interface area, some second output terminals are positioned at the front of substrate 200, be electrically connected with the second test lead 24 of the second testing needle 203, some first output terminals are positioned at the back side and are electrically connected with metal link 215, some first input ends and the second input end can concentrate on the interface area at substrate 200 back side, some first input ends can be connected with the test circuit of outside by one or more interface with the second input end, simplify the interface circuit between semiconductor test tool and the test circuit of outside.In a specific embodiment, described substrate 200 can be formed by the pressing of multi-layer PCB resin substrate, every one deck PCB resin substrate includes some interconnection structures, each interconnection structure comprises the through-hole interconnection structure that runs through this PCB resin substrate and is positioned at the metal level that PCB resin substrate is connected with through-hole interconnection structure on the surface, during the pressing of multi-layer PCB resin substrate, multiple interconnection structure is electrically connected to form the first metal wire or the second metal wire, thus makes some first input ends and the second input end can concentrate on the interface area at substrate 200 back side.
In another embodiment, described substrate 200 comprises front and the back side with vis-a-vis, the back side of described substrate comprises interface area, some second output terminals are positioned at the front of substrate 200, second output terminal is electrically connected with the second test lead 24 of the second testing needle 203, some second input ends are positioned at the back side of substrate 200, the through-hole interconnection structure running through substrate 200 can be formed in described substrate 200, described second input end and the second output terminal are by being positioned at the through-hole interconnection structure electrical connection of substrate 200, corresponding some first input ends and the first output terminal are all positioned at the back side of substrate 200, first output terminal is electrically connected with metal link 215, first input end and the first output terminal are by being positioned at the electrical connection of substrate 200 1 metal wire, the back side of described substrate 200 also has the some first interconnection metal layer and second interconnection metal layer more again, one end of described first interconnection metal layer again is electrically connected with first input end, the other end of the first interconnection metal layer is again positioned at interface area, one end of described second interconnection metal layer again is electrically connected with the second input end, the other end of the described second interconnection metal layer is again positioned at interface area, first in interface area again interconnection metal layer with second again interconnection metal layer be connected with the test circuit of outside by one or more interface.
In other embodiments, test circuit (not shown) can be formed with in described substrate 200, described test circuit comprises the first signal end and secondary signal end, first signal end is electrically connected with the first link of the first testing needle 201 by metal link 215 and metal wire 217, and secondary signal end is electrically connected with the second link of the second testing needle 203.Described test circuit is when testing, test signal (such as voltage signal or current signal) is applied to the first testing needle 201 and the second testing needle 203, and process acquisition test parameter (such as resistance etc.) is carried out to the electric signal (such as current signal etc.) obtained.In one embodiment, the dielectric layer that described substrate 200 comprises Semiconductor substrate (such as silicon substrate or substrate etc.) and is positioned in Semiconductor substrate, described Semiconductor substrate is formed with semiconductor devices (such as transistor etc.), metal interconnecting wires and passive device (such as resistance, electric capacity etc.) is formed in described dielectric layer, semiconductor devices and passive device are connected and composed test circuit by described metal interconnecting wires, and the first signal end and secondary signal end can by being arranged in the first metal wire that dielectric layer is electrically connected with test circuit and the second metal wire is drawn.
With reference to figure 4, Fig. 4 be semiconductor test tool of the present invention carry out electrical performance testing time structural representation, first semiconductor test tool is placed in tester table, then encapsulating structure 300 to be tested is loaded, described encapsulating structure to be tested 300 have some tested terminals 31, described tested terminal 31 is soldered ball, encapsulating structure 300 to be tested is placed on semiconductor test tool, tested terminal 31 elder generation of encapsulating structure 300 to be tested and the first test lead surface contact of the first testing needle 201, then encapsulating structure 300 to be tested moves down under pressure, corresponding first testing needle 201 also moves down under the effect of the pressure, until the second test lead 23 surface of the second testing needle 203 and the surface contact of tested terminal 31, now the part surface of described tested terminal 31 is electrically connected with the test lead (test lead is the first test lead of the first testing needle 201 and the second test lead of the second testing needle 203) of corresponding test syringe needle 20, then between the first testing needle 201 and the second testing needle 203, apply test signal, carry out the test of electric property.
In other embodiments of the invention, also can after loading encapsulating structure 300 to be tested, encapsulating structure 300 to be tested keeps fixing, and semiconductor test tool is under the effect of the mechanical arm of testing apparatus, test syringe needle 20 on semiconductor test tool is contacted with the tested terminal 30 of encapsulating structure 300 to be tested, carries out electric property side test.
In the test process of electric property, because the first testing needle 201 needs just can move up and down under the effect of external pressure, but when loading encapsulating structure 300 to be tested, be difficult to judge whether encapsulating structure 300 to be tested loads put and test syringe needle 20 in place and whether contact well with tested terminal, cross loading (physical location of loading encapsulating structure 300 to be tested exceedes target location) and then easily cause fractureing of test syringe needle 20 or bending, owe to load (loading the physical location of encapsulating structure 300 to be tested not to target location) and then easily bring the impacts such as loose contact, thus in the present embodiment, also there is in described substrate 200 the detecting unit (not shown) of the first link 22 position of detection first testing needle 201, described detecting unit is suitable in the test process of electric property, detect the position of the movement of the first link 22 of the first testing needle 201, thus judge that whether whether the surface of the first test lead 21 of the first testing needle 201 concordant with the second test lead 23 surface of the second testing needle 203.It should be noted that, the position at encapsulating structure place to be tested when target location refers to the second test lead 23 good contact of the tested terminal surfaces of encapsulating structure to be tested and the first test lead 21 of the first testing needle 201 and the second testing needle 203.
In one embodiment, described detecting unit is photosensitive detecting unit, photosensitive detecting unit comprises Optical Transmit Unit and light receiving unit, described smooth generating unit is suitable for launching and detects light, described light receiving unit is suitable for receiving and detects light, produce electric signal, described Optical Transmit Unit and light receiving unit are placed in the both sides sidewall surfaces of through hole 216 respectively, the second distance on the second test lead 23 surface of the first outstanding second testing needle 203 in test lead 21 surface of the first testing needle 216 when 3rd distance of the upper surface of Optical Transmit Unit and light receiving unit and substrate 200 is equal to or slightly less than non-test state.When testing, when the first link 22 of the first testing needle 201 moves down into the transmission light path between Optical Transmit Unit and light receiving unit, when stopping the transmission detecting light, the electric signal that light receiving unit produces produces the sudden change of level, thus judge that encapsulation unit to be tested reaches target location, now the second test lead 23 surface of the surface of the first test lead 21 of the first testing needle 201 and the second testing needle 203 is concordant, the surface of the first test lead 21 of the first testing needle 201 and the second test lead 23 of the second testing needle 203 and the surface contact of tested terminal 30 good.
In one embodiment, described detecting unit is magnetic induction unit, magnetic induction unit comprises exciting to be held and induction end, the described end that excites has magnetic, described induction end induced magnetism produces electric signal, described the first link 22 exciting end to be positioned at the first testing needle 201, such as can the magnetic material of tool (such as barium ferriferous oxide etc.) be adopted to make the first link 22 of the first testing needle 201, induction end is placed in the sidewall of through hole 216 both sides, the second distance on the second test lead 23 surface of the first outstanding second testing needle 203 in test lead 21 surface of the first testing needle 216 when 3rd distance of the upper surface of induction end and substrate 200 is equal to or slightly less than non-test state.When testing, when the first link 22 of the first testing needle 201 moves down into the position of induction end, induction end induced magnetism produces electric signal, and the electric signal of induction end produces the sudden change of level, thus judges that encapsulation unit to be tested reaches target location.
In one embodiment, described detecting unit is infrared distance measurement unit or supersonic sounding unit or laser ranging unit, infrared distance measurement unit or supersonic sounding unit or laser ranging unit directly measure the distance of the first link movement of the first testing needle 201, judge whether encapsulating structure to be tested arrives target location.
Electrical performance testing can be carried out to the multiple tested terminal of encapsulating structure 300 by semiconductor test tool of the present invention simultaneously, improve the efficiency of test and the accuracy of test.
It should be noted that, semiconductor test tool of the present invention can be applied to automatic test (mechanical hand loads encapsulating structure to be tested automatically), also can be applied to manual test (artificial loading encapsulating structure to be tested).
Although the present invention discloses as above, the present invention is not defined in this.Any those skilled in the art, without departing from the spirit and scope of the present invention, all can make various changes or modifications, and therefore protection scope of the present invention should be as the criterion with claim limited range.
Claims (10)
1. test a syringe needle, it is characterized in that, comprising:
Insulator, has the cavity of through insulator two ends in described insulator;
Be arranged in the first testing needle of the cavity of insulator, described first testing needle comprises the first noumenon, is positioned at first test lead of the first noumenon one end and is positioned at the first link of the first noumenon other end;
Be arranged in the flexible member of cavity, described flexible member is connected with the first testing needle, is suitable for driving described first testing needle to move up and down along cavity;
Be positioned at second testing needle of insulator side wall surface around described first testing needle, second testing needle is coaxial with the first testing needle, second testing needle comprises the second body, is positioned at second test lead of second body one end and is positioned at the second link of the second body other end, and the second test lead has the first recessed cambered surface.
2. test syringe needle as claimed in claim 1, it is characterized in that, chamber in described insulator comprises the first chamber, be positioned at the second chamber of the first chamber upper end and be positioned at the 3rd chamber of the first chamber lower end, described first chamber and the second chamber mutually through, described 3rd chamber and the first chamber mutually through, and the width of the width of the second chamber and the 3rd chamber is all less than the width of the first chamber, described first testing needle is through the first chamber, the second chamber and the 3rd chamber, and described flexible member is positioned at the first chamber.
3. test syringe needle as claimed in claim 2, it is characterized in that, the first noumenon of described first testing needle has spacing preiection, and described spacing preiection is positioned at the first chamber, one end of flexible member contacts with spacing preiection, and the other end of flexible member contacts with the chamber wall of the first cavity bottom.
4. test syringe needle as claimed in claim 3, it is characterized in that, described flexible member is spring, and described first testing needle is through the hole in the middle of spring, and one end of spring contacts with spacing preiection, and the other end of spring contacts with the chamber wall of the first cavity bottom.
5. test syringe needle tool as claimed in claim 3, it is characterized in that, described flexible member is metal clips, and metal clips one end contacts with spacing preiection, and the other end of metal clips contacts with the chamber wall of the first cavity bottom.
6. test syringe needle as claimed in claim 1, it is characterized in that, insulator head surface is lower than the second test lead surface of the second testing needle.
7. test syringe needle as claimed in claim 6, it is characterized in that, first test lead surface of described first testing needle and the top surface of insulator are plane, one end margin of described first cambered surface contacts with insulator edge, and the other end edge of the first cambered surface contacts with the top surface of the second testing needle.
8. test syringe needle as claimed in claim 6, it is characterized in that, first test lead surface of described first testing needle and the top surface of insulator have the second recessed cambered surface, one end margin of described first cambered surface and the edge contact of insulator, the other end edge of the first cambered surface contacts with the top surface of the second testing needle.
9. test syringe needle as claimed in claim 8, it is characterized in that, described first cambered surface and the second cambered surface are spherical or one section of circular arc on ellipsoid or the spherical terminal to be tested of class.
10. a semiconductor test tool, is characterized in that, comprising:
Support plate; Be positioned at the some test syringe needles on support plate, each test syringe needle comprises, insulator, has the cavity of through insulator two ends in described insulator; Be arranged in the first testing needle of the cavity of insulator, described first testing needle comprises the first noumenon, is positioned at first test lead of the first noumenon one end and is positioned at the first link of the first noumenon other end; Be arranged in the flexible member of cavity, described flexible member is connected with the first testing needle, is suitable for driving described first testing needle to move up and down along cavity; Be positioned at second testing needle of insulator side wall surface around described first testing needle, second testing needle is coaxial with the first testing needle, second testing needle comprises the second body, is positioned at second test lead of second body one end and is positioned at the second link of the second body other end, and the second test lead has the first recessed cambered surface.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410605989.9A CN104280580B (en) | 2014-10-30 | 2014-10-30 | Test syringe needle and semiconductor test tool |
| US14/927,169 US10006939B2 (en) | 2014-10-30 | 2015-10-29 | Testing probe and semiconductor testing fixture, and fabrication methods thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410605989.9A CN104280580B (en) | 2014-10-30 | 2014-10-30 | Test syringe needle and semiconductor test tool |
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| Publication Number | Publication Date |
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| CN104280580A true CN104280580A (en) | 2015-01-14 |
| CN104280580B CN104280580B (en) | 2018-01-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410605989.9A Active CN104280580B (en) | 2014-10-30 | 2014-10-30 | Test syringe needle and semiconductor test tool |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110121653A (en) * | 2016-12-27 | 2019-08-13 | 恩普乐股份有限公司 | Electrical contact and socket for electric component |
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| CN1936595A (en) * | 2006-09-05 | 2007-03-28 | 杭州高特电子设备有限公司 | Coaxial multi-detection-point detecting rod |
| CN101713790A (en) * | 2008-09-29 | 2010-05-26 | 日本电产理德株式会社 | Inspection fixture, electrode of the fixture, method of making the electrode |
| CN201436589U (en) * | 2009-06-15 | 2010-04-07 | 环旭电子股份有限公司 | Test probe |
| US20120105090A1 (en) * | 2009-07-03 | 2012-05-03 | Leeno Industrial Inc. | Probe device for testing |
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| Publication number | Publication date |
|---|---|
| CN104280580B (en) | 2018-01-30 |
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Address after: Jiangsu province Nantong City Chongchuan road 226006 No. 288 Applicant after: Tongfu Microelectronics Co., Ltd. Address before: 226006 Jiangsu Province, Nantong City Chongchuan District Chongchuan Road No. 288 Applicant before: Fujitsu Microelectronics Co., Ltd., Nantong |
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