CN104183206A - Display panel detecting method - Google Patents
Display panel detecting method Download PDFInfo
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- CN104183206A CN104183206A CN201410458633.7A CN201410458633A CN104183206A CN 104183206 A CN104183206 A CN 104183206A CN 201410458633 A CN201410458633 A CN 201410458633A CN 104183206 A CN104183206 A CN 104183206A
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Abstract
The invention discloses a display panel detecting method. A display panel comprises a substrate, a plurality of public electrode lines, a plurality of data lines and a plurality of gate lines are formed on the substrate. The public electrode lines intersect with the gate lines. The display panel detecting method comprises the step of judging the short-circuited positions of the public electrode lines and the gate lines by adjusting the voltage applied to the public electrode lines and the voltage applied to the data lines. By the adoption of the display panel detecting method, the short-circuited positions of the panel can be rapidly and accurately judged.
Description
Technical field
The present invention relates to display technique field, relate in particular to a kind of detection method of display panel.
Background technology
At present along with panel size strengthens, resolution increases, pixel increases and single pixel diminishes, the wiring cabling of line and line is all quite intensive, greatly improve the degree of difficulty that film forming is manufactured, in panel manufacture process, there are gate line in a large amount of panels and the short circuit problem of public electrode wire to cause increasing of fraction defective.
In prior art, panel checks that short circuit generally adopts the inspection of lighting a lamp, and it adopts source signal and the positive and negative balance mode of common electrode signal line to put on panel, and sequentially open every row membrane transistor comes display frame and inspection to grid voltage successively.This mode is lit a lamp has gate line and the public electrode wire overlapping intersection phenomenon that is short-circuited when panel, lights a lamp picture as shown in Figure 3, and human eye cannot be learnt short circuit where.
If just normal point modulating signal is added on inspections of lighting a lamp, and be present in panel when short circuit phenomenon, can only find out the panel existence bad problem of lighting a lamp, cannot learn it is what bad problem, also cannot obtain panel where what bad problem occurs.
Summary of the invention
In view of this, the present invention is directed to the deficiencies in the prior art, propose a kind of panel detection method, by applying after modulation driving voltage, just can judge that bad where the bad type of Display panel and panel be causes, and is conducive to engineering staff and judge fast bad type Quick overhaul, lifting yield.
In order to solve technical matters of the present invention, the present invention proposes a kind of detection method of display panel, described display panel comprises substrate, on described substrate, be formed with many public electrode wires, many data lines, many gate lines, wherein, described public electrode wire intersects with described gate line, and described detection method comprises:
Be applied to the voltage on described public electrode wire and be applied to the voltage on described data line by adjusting, judging the position of described public electrode wire and described gate line short circuit.
Preferably, the voltage being applied on described public electrode wire is low dc voltage, and the voltage on described public electrode wire is less than the voltage being applied on the data line of odd column and the data line of even column.
Preferably, when in former frame, the driving voltage of the data line of described odd column is greater than the driving voltage of the data line of described even column; In next frame, the driving voltage of the data line of described even column is greater than the driving voltage of the data line of described odd column.
Preferably, the data line of odd column is applied to the voltage of a domain of walker more than approximately 1 volt.
Preferably, the data line of dual sequence applies the voltage of a domain of walker more than approximately 1 volt.
Preferably, the frame reversion AC drive voltage of the data line of described odd column is 8.9V and 10.1V, and the driving voltage of the data line of described even column is 5.4V and 7.1V.
Preferably, be also included in described gate line and described data line infall and form thin film transistor (TFT), described low dc voltage input causes described short dot undercharge, and its size determines according to the volt-ampere characteristic curve characteristic of described thin film transistor (TFT).
Preferably, described low dc voltage is 3.4V.
Preferably, after lighting by panel, under white picture, demonstrate the position of described gate line and described public electrode wire short circuit.
Preferably, after lighting by panel, under black picture, demonstrate the position of described gate line and described public electrode wire short circuit.
Compared with prior art, its advantage is in the present invention:
The present invention is by proposing a kind of detection mode, be applied to the voltage on described public electrode wire and be applied to the voltage on described data line by adjusting, panel lighting and human eye are visual, though whole piece panel has millions of pixel arrangement, by lighting a lamp after skill, human eye just fast positioning panel where have gate line and the public electrode wire overlapping intersection phenomenon that is short-circuited.
Brief description of the drawings
Fig. 1 is the circuit theory diagrams of whole display panel in the present invention;
Fig. 2 is the circuit theory diagrams of local repressentation panel in Fig. 1 of the present invention;
Fig. 3 is the display frame schematic diagram of display panel testing method in prior art;
Fig. 4 is that the display panel testing method of one embodiment of the invention is executed alive sequential chart;
Fig. 5 is the display frame schematic diagram of display panel testing method in Fig. 4 of the present invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the present invention is further illustrated.
Fig. 1 is the circuit theory diagrams of whole display panel in the present invention.As shown in Figure 1, the invention provides a kind of display panel, comprise substrate 100, on substrate 100, be formed with crisscross many gate lines G 1～Gn and many data line S1～Sm, there are many public electrode wire CS1～CSk in many data line S1～Sm disposed adjacent of majority, wherein, described data line and described public electrode wire are positioned at same layer, described gate line is positioned at other one deck, described public electrode wire intersects with described gate line, and described data line intersects with described gate line and configures thin film transistor switch at described infall.
Display panel is for solving colour cast problem at present, capital adopts the colour cast of above-mentioned wiring mode under improving with great visual angle, panel resolution is done higher and higher at present, cause wiring distance more and more nearer, overlapping is reported to the leadship after accomplishing a task partly more and more, and manufacturing yield of products reduces, and the present invention will deal with problems and can show bad phenomenon by lighting a lamp, also can show the position of bad phenomenon, carry out faulty restoration point.
Substrate 100 is divided into non-display area 101, viewing area 102.Substrate 100 shown in Fig. 1 is the infrabasal plates in the two substrates of display panel, and Fig. 1 does not illustrate upper substrate.Fig. 2 is the circuit theory diagrams of local repressentation panel in Fig. 1 of the present invention.In the time that display panel shows inspection, there is short dot 103 in described gate line and described public electrode wire infall, is shown as line defect of display frame as shown in Figure 3.
For the display panel of m*n matrix pixel provided by the invention, the present invention proposes a kind of detection mode of line defect.The distribution of display panel is divided into data line and gate line, extends to respectively the terminal place, edge of display panel, and data line is X1, X2 ... .Xm cabling, gate line is Y1, Y2 ... .Yn cabling.The present invention proposes detection mode, puts on data line X1, the X3 of odd column .... wait cabling, apply the voltage of a domain of walker more than approximately 1 volt, the roughly about 8.9V～10.1V of voltage, the about 1/120/n*2=Th of conversion time; Put on data line X2, the X4 of even column .... wait cabling, apply the voltage of a domain of walker more than approximately 1 volt, the roughly about 7.1V～5.4V of voltage, the about 1/120/n*2=Th of conversion time.For example, be the display panel of 2160 for gate line radical, Th=1/120/2160*2=7.7us.
Whole gate line Y1, Y2 ... the driving voltage of Yn is the grid voltage of normal P-SCAN.For example, start as Y1=34V/7.7us then Y1=-6V Y2=34V/7.7us simultaneously, then Y2=-6V Y3=34V/7.7us simultaneously, circulation according to this.
The detailed driving voltage of data line and public electrode wire as shown in Figure 4.On the data line of odd column, apply specific source signal and drive alternating voltage, and on the data line of even column, also apply specific source electrode signal driver alternating voltage.In Fig. 4, in F (n) frame, the driving voltage on the data line of odd column is greater than the driving voltage on the data line of even column; In F (n+1) frame, the driving voltage on the data line of even column is greater than the driving voltage on the data line of odd column.
The voltage of public electrode is to apply a specific DC voltage according to thin film transistor (TFT) and pixel parameter characteristic, general decision public electrode voltages size depends primarily on thin film transistor (TFT) and discharges and recharges, and voltage swing is to allow pixel discharge and recharge almost nil flex point in pixel electric charge.In an embodiment of the present invention, the driving voltage of the public electrode of display panel is adjusted to 3.4V.
In the display panel of m*n matrix pixel provided by the invention, if the distribution of panel inside causes under the situation of public electrode wire and gate line short circuit in making technology, by applying the driving voltage of particular data line driving voltage and specific public electrode wire, the inspection of lighting a lamp after display panel is completed, can allow supervisory personnel's eyes just can differentiate bad problem and bad position, then panel is sorted out and is repaired.
The display panel of m*n matrix pixel as shown in Figure 1, by above-mentioned driving method, as shown in Figure 5, is short-circuited a little 503 in the gate line of display panel and public electrode wire overlapping intersection.Lighting a lamp in display frame shown in Fig. 5, what other regions showed is all that normal white GTG shows.The gate line voltage of short dot 503 can equate with the voltage of public electrode wire, be all 3.4V.The grid voltage of short dot 503 is 3.4V, cause the thin film transistor switch of the pixel being connected in gate line direction with short dot 503 in electric leakage and charging two states, pixel cannot keep electric charge, be greater than 3.4V away from the voltage of the gate line of short dot 503 when the open mode a little, in the time of off state, be less than 3.4V.Leave short dot 503 far away, the voltage of gate line more levels off to normal grid voltage, and the voltage of open mode is 34V, and the voltage of shutoff is-6V.So what Fig. 5 obtained is a super partially dark horizontal line, about 1cm is long.Wherein, short dot 503 is about 1cmChang center, more just can find out fast short dot 503 allocation really by microscope.
By apply the driving voltage of signal specific on data line, gate line and public electrode wire, allow panel light the rear bad position that directly demonstrates.For the display panel of the normal black display mode such as IPS, VA, under white picture, detect the short dot of public electrode wire and gate line, on the short dot of gate line and public electrode wire, occur that toward two side directions a water pixel shows partially black, the about 1cm of partially black length left and right, far away apart from short dot, show partially black slightlyer, remainder pixel shows all normal white grey menu.Human eye directly just can be found out grid and public electrode short dot scope.
For the display panel of the normal white display modes such as TN, under black picture, detect the short dot of public electrode wire and gate line, on the short dot of gate line and public electrode wire, occur that toward two side directions a water pixel shows partially black, the about 1cm of partially white and length left and right, far away apart from short dot, show partially black slightlyer, remainder pixel shows normal black grey menu all.Human eye directly just can be found out grid and public electrode short dot scope.
More than describe the preferred embodiment of the present invention in detail; but the present invention is not limited to the detail in above-mentioned embodiment, within the scope of technical conceive of the present invention; can carry out multiple equivalents to technical scheme of the present invention, these equivalents all belong to protection scope of the present invention.
It should be noted that in addition each the concrete technical characterictic described in above-mentioned embodiment, in reconcilable situation, can combine by any suitable mode.For fear of unnecessary repetition, the present invention is to the explanation no longer separately of various possible array modes.
Claims (10)
1. a detection method for display panel, described display panel comprises substrate, is formed with many public electrode wires, many data lines, many gate lines on described substrate, and wherein, described public electrode wire intersects with described gate line, and described detection method comprises:
Be applied to the voltage on described public electrode wire and be applied to the voltage on described data line by adjusting, judging the position of described public electrode wire and described gate line short circuit.
2. detection method according to claim 1, is characterized in that: the voltage being applied on described public electrode wire is low dc voltage, and the voltage on described public electrode wire is less than the voltage being applied on the data line of odd column and the data line of even column.
3. detection method according to claim 2, is characterized in that: when in former frame, the driving voltage of the data line of described odd column is greater than the driving voltage of the data line of described even column; In next frame, the driving voltage of the data line of described even column is greater than the driving voltage of the data line of described odd column.
4. detection method according to claim 3, is characterized in that: the data line of odd column is applied to the voltage of a domain of walker more than approximately 1 volt.
5. detection method according to claim 3, is characterized in that: the data line of dual sequence applies the voltage of a domain of walker more than approximately 1 volt.
6. detection method according to claim 2, is characterized in that: the frame reversion AC drive voltage of the data line of described odd column is 8.9V and 10.1V, and the driving voltage of the data line of described even column is 5.4V and 7.1V.
7. detection method according to claim 2, it is characterized in that: be also included in described gate line and described data line infall and form thin film transistor (TFT), described low dc voltage input causes described short dot undercharge, and its size determines according to the volt-ampere characteristic curve characteristic of described thin film transistor (TFT).
8. detection method according to claim 6, is characterized in that: described low dc voltage is 3.4V.
9. according to the detection method described in claim 1-8 any one, it is characterized in that: after lighting by panel, under white picture, demonstrate the position of described gate line and described public electrode wire short circuit.
10. according to the detection method described in claim 1-8 any one, it is characterized in that: after lighting by panel, under black picture, demonstrate the position of described gate line and described public electrode wire short circuit.
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| CN105739768A (en) * | 2016-01-29 | 2016-07-06 | 上海中航光电子有限公司 | Touch display panel and touch display equipment |
| CN109166506A (en) * | 2018-10-31 | 2019-01-08 | 苏州旷视智能科技有限公司 | The detection method of display panel based on high-accuracy machine vision |
| WO2021128639A1 (en) * | 2019-12-23 | 2021-07-01 | 武汉华星光电技术有限公司 | Array substrate, display panel, and electrical test method |
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| WO2021128639A1 (en) * | 2019-12-23 | 2021-07-01 | 武汉华星光电技术有限公司 | Array substrate, display panel, and electrical test method |
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| CN104183206B (en) | 2017-04-19 |
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