CN102566102A - Method for repairing line defects of liquid crystal panels - Google Patents

Method for repairing line defects of liquid crystal panels Download PDF

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Publication number
CN102566102A
CN102566102A CN2012100492026A CN201210049202A CN102566102A CN 102566102 A CN102566102 A CN 102566102A CN 2012100492026 A CN2012100492026 A CN 2012100492026A CN 201210049202 A CN201210049202 A CN 201210049202A CN 102566102 A CN102566102 A CN 102566102A
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line
signals
short circuit
liquid crystal
data line
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CN2012100492026A
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CN102566102B (en
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周刘飞
洪孟锋
许建中
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Nanjing CEC Panda LCD Technology Co Ltd
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Nanjing CEC Panda LCD Technology Co Ltd
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Abstract

The invention discloses a method for repairing line defects of liquid crystal panels. A data line of an array substrate side of a liquid crystal panel is stacked with a common line, signals of the data line are direct-current black screen voltage signals during light-on detection of the liquid crystal panel, signals of a scanning line are high-level pulse voltage signals which are sequentially opened, at least parts of signals of the common line are low-level pulse voltage signals when the signals of the scanning line are high-level signals, the signals of the common line are high-level voltage signals when the signals of the scanning line are low-level signals, bright trace is positioned at locations around short circuit of the data line and the common line, and is the brightest at a short circuit location, and the brightest location is the short circuit location of the data line and the common line, and the signals of the common line at the short circuit location are disconnected. The short circuit location of the data line and the common line can be accurately determined by the aid of the method.

Description

A kind of line defect restorative procedure of liquid crystal panel
Technical field
The present invention relates to a kind of line defect restorative procedure of liquid crystal panel.
Background technology
For reducing the cost backlight of LCD (LCD); The main flow design that is designed to the pixel high aperture that the data line of the array base palte side of liquid crystal panel and concentric line are overlapping; But such design has increased data line and concentric line short risk, and the exact position of both short circuits is difficult to confirm.
Summary of the invention
Goal of the invention:, the purpose of this invention is to provide a kind of line defect restorative procedure of liquid crystal panel, accurately the position of specified data line and concentric line short circuit to the problem and shortage that above-mentioned prior art exists.
Technical scheme: for realizing the foregoing invention purpose; The technical scheme that the present invention adopts is a kind of line defect restorative procedure of liquid crystal panel; The data line and the concentric line of the array base palte side of liquid crystal panel are overlapping; In said liquid crystal panel was lit a lamp the process that detects, data line signal was the black picture voltage of direct current, the high level pulse voltage of scanning-line signal for opening successively; The concentric line signal is that the part-time at least of high level is a low level pulse voltage at scanning-line signal, and the concentric line signal is to be high level voltage the low level time at scanning-line signal; Bright line appears in the position in data line and concentric line short circuit, and the position of short circuit is for the brightest, and then this high light is the position of data line and concentric line short circuit; Break off the concentric line signal of short circuit place at last.
The lateral part of said concentric line and the intersection of longitudinal component, the both sides that are positioned at corresponding data line can be provided with groove.
Beneficial effect: the present invention utilizes special detection signal, accurately confirms the data line of array base palte side and the location of short circuit of concentric line, and can under the prerequisite that does not cause other fault, repair.
Description of drawings
Fig. 1 is the pixel planes synoptic diagram of existing high open design;
Fig. 2 is the cross-sectional schematic of A-A ' among Fig. 1;
Fig. 3 is a signal sequence synoptic diagram of the present invention;
Fig. 4 is a testing result synoptic diagram of the present invention;
Fig. 5 is the part plan structural representation of pixel among the present invention.
Embodiment
Below in conjunction with accompanying drawing and specific embodiment; Further illustrate the present invention; Should understand these embodiment only be used to the present invention is described and be not used in the restriction scope of the present invention; After having read the present invention, those skilled in the art all fall within the application's accompanying claims institute restricted portion to the modification of the various equivalent form of values of the present invention.
As shown in Figure 1, data line and concentric line are overlapping fully, and (Color Filter, CF) (Black Matrix, width BM) is to improve aperture opening ratio for the side black matrix" can to reduce color membrane substrates.As shown in Figure 2; Be followed successively by concentric line, first insulation course, data line, second insulation course and pixel electrode from lower to upper, as can be seen from Figure 2, because data line and concentric line are overlapping fully; As long as insulation course has slightly and breaks; Data line and concentric line promptly possibly be short-circuited, and risk increases, and the position of short circuit is difficult to confirm.
As shown in Figure 3, a frame (Frame) is divided into the ON/OFF phase.At ON phase scanning-line signal (is the Gate signal; Among the figure be G1, G2, G3 ..., G12) open successively; Be divided into 12 zones (zone that also can be divided into other quantity), output enable (OE, the Output Enable) time is set between adjacent two sweep trace pulses (Gate Pulse); In addition, the public electrode voltages Vcom=0V of CF side; Source electrode (Source) voltage that offers data line is 5V, the black picture of output; The concentric line voltage Cs of array base palte side is the 5V/0V square wave, and the pulse sequence of concentric line is corresponding with the pulse sequence of sweep trace, is specially; The duration of the high level pulse voltage of every sweep trace is 16us; When sweep trace was high level, concentric line was moved low level at 9us to from high level, then; When sweep trace became low level by high level, concentric line was moved high level synchronously to.Be in the present embodiment; The time of concentric line low level pulse is the half the of sweep trace high level pulse time; In fact the time of concentric line low level pulse is specially the part of sweep trace high level pulse time, does not do strict the qualification here, regulates by the actual displayed effect.
Carrying out like the last period in the described testing process of lighting a lamp, as shown in Figure 4, normal liquid crystal panel shows black picture; But bright line can appear in the position of data line and concentric line short circuit, and location of short circuit is for the brightest, toward both sides deepening gradually up and down; Which point of available eye-observation is the brightest, also can under the situation that liquid crystal panel is lighted, check with microscope; Judgement is that which point is the brightest, and the brightest point is location of short circuit.The analysis reason is following: the upper area in data line and concentric line short circuit (S-Cs short) position; Because Source voltage is 5V; And receive the Cs voltage influence little (because data line is the galvanic current pressure; Be difficult for by the pulling of Cs pulse voltage, and the Cs voltage overwhelming majority times are similarly 5V with Source voltage), think black picture; It is also little that lower zone in S-Cs short position, Source voltage are influenced by Cs, so also approach black picture; Zone in S-Cs short position; Source voltage receives Cs voltage influence meeting to be pulled to white picture; But because Source exists resistance capacitance to postpone, so that the pixel of order at short, leaves short point pixel far away more for the brightest is dark more; Be gradual, therefore can judge that S-Cs short has taken place that the brightest pixel.Knowing the data line that is short-circuited and the particular location of concentric line; So when repairing; Be positioned at the concentric line of data line both sides with laser cutting short circuit place, make the concentric line of short circuit place itself not have signal (because the signal of concentric line from the two ends input (not shown) of concentric line lateral part, therefore must cut off concentric line of data line both sides) to get final product; As shown in Figure 5; The lateral part of concentric line and the intersection of longitudinal component, the both sides that are positioned at corresponding data line are provided with groove, like this in laser cutting; Just can not switch to pixel electrode, avoid causing concentric line and pixel electrode problem of short-circuit (being the position of laser cutting among Fig. 5 shown in the dotted line) because of the short circuit of repairing concentric line and data line.

Claims (2)

1. the line defect restorative procedure of a liquid crystal panel; It is characterized in that: the data line and the concentric line of the array base palte side of liquid crystal panel are overlapping; In said liquid crystal panel was lit a lamp the process that detects, data line signal was the black picture voltage of direct current, the high level pulse voltage of scanning-line signal for opening successively; The concentric line signal is that the part-time at least of high level is a low level pulse voltage at scanning-line signal, and the concentric line signal is that low level time is a high level voltage at scanning-line signal; Bright line appears in the position in data line and concentric line short circuit, and the position of short circuit is for the brightest, and then this high light is the position of data line and concentric line short circuit; Break off the concentric line signal of short circuit place at last.
2. according to the line defect restorative procedure of the said a kind of liquid crystal panel of claim 1, it is characterized in that: the lateral part of said concentric line and the intersection of longitudinal component, the both sides that are positioned at corresponding data line are provided with groove.
CN201210049202.6A 2012-02-29 2012-02-29 Method for repairing line defects of liquid crystal panels Active CN102566102B (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
CN201210049202.6A CN102566102B (en) 2012-02-29 2012-02-29 Method for repairing line defects of liquid crystal panels

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CN102566102B CN102566102B (en) 2014-10-15

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103617772A (en) * 2013-11-12 2014-03-05 华映视讯(吴江)有限公司 Display panel and testing method thereof
CN104183206A (en) * 2014-09-10 2014-12-03 南京中电熊猫液晶显示科技有限公司 Display panel detecting method
CN107610663A (en) * 2017-09-25 2018-01-19 武汉华星光电技术有限公司 The virtual circuit and drive circuit of panel display apparatus
CN108469694A (en) * 2018-02-07 2018-08-31 深圳市华星光电半导体显示技术有限公司 A method of positioning TFT LCD display panels generate horizontal brightness bad position
CN109493769A (en) * 2018-11-12 2019-03-19 成都中电熊猫显示科技有限公司 Test method, device and storage medium

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1987571A (en) * 2005-12-19 2007-06-27 统宝光电股份有限公司 Display units, display panel, display devices, electronic devices and repair methods
CN201097400Y (en) * 2007-04-28 2008-08-06 上海广电光电子有限公司 Thin film transistor array base plate
CN101286468A (en) * 2007-04-12 2008-10-15 索尼株式会社 Method of manufacturing substrate, substrate manufacturing system, and method of manufacturing display
CN101324727B (en) * 2007-06-13 2011-12-07 群康科技(深圳)有限公司 LCD and drive method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1987571A (en) * 2005-12-19 2007-06-27 统宝光电股份有限公司 Display units, display panel, display devices, electronic devices and repair methods
CN101286468A (en) * 2007-04-12 2008-10-15 索尼株式会社 Method of manufacturing substrate, substrate manufacturing system, and method of manufacturing display
CN201097400Y (en) * 2007-04-28 2008-08-06 上海广电光电子有限公司 Thin film transistor array base plate
CN101324727B (en) * 2007-06-13 2011-12-07 群康科技(深圳)有限公司 LCD and drive method thereof

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103617772A (en) * 2013-11-12 2014-03-05 华映视讯(吴江)有限公司 Display panel and testing method thereof
CN103617772B (en) * 2013-11-12 2016-02-03 华映视讯(吴江)有限公司 Display panel and method of testing thereof
CN104183206A (en) * 2014-09-10 2014-12-03 南京中电熊猫液晶显示科技有限公司 Display panel detecting method
CN107610663A (en) * 2017-09-25 2018-01-19 武汉华星光电技术有限公司 The virtual circuit and drive circuit of panel display apparatus
CN108469694A (en) * 2018-02-07 2018-08-31 深圳市华星光电半导体显示技术有限公司 A method of positioning TFT LCD display panels generate horizontal brightness bad position
CN108469694B (en) * 2018-02-07 2020-12-25 深圳市华星光电半导体显示技术有限公司 Method for positioning poor position of horizontal bright line generated by TFT LCD display panel
CN109493769A (en) * 2018-11-12 2019-03-19 成都中电熊猫显示科技有限公司 Test method, device and storage medium
CN109493769B (en) * 2018-11-12 2022-03-01 成都中电熊猫显示科技有限公司 Test method, test device and storage medium

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