CN104167225A - Semi-open type testing machine rack - Google Patents
Semi-open type testing machine rack Download PDFInfo
- Publication number
- CN104167225A CN104167225A CN201310185800.0A CN201310185800A CN104167225A CN 104167225 A CN104167225 A CN 104167225A CN 201310185800 A CN201310185800 A CN 201310185800A CN 104167225 A CN104167225 A CN 104167225A
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- semi
- top panel
- gusset plate
- open type
- testing machine
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Abstract
The invention relates to a semi-open type testing machine rack which comprises a base, side enclosing plates and an upper panel, wherein the upper panel is connected with the base through the side enclosing plates, the base, the side enclosing plate and the upper panel form a cavity in a surrounding manner, a testing platform is arranged on the base, and an opening is formed in the upper panel. Compared with the prior art, the semi-open type testing machine rack provided by the invention has the advantages of ensuring that troubles on a test card can be found out conveniently and quickly, and improving the maintenance efficiency.
Description
Technical field
The present invention relates to a kind of test chassis, especially relate to a kind of semi-open-type test chassis.
Background technology
At present, high precision measurement equipment is widely used in production, manufacture field, for to product test and check.In existing high precision measurement equipment, operated by rotary motion has test chassis, and test chassis is to consist of section bar welding,, be convenient to product test.Existing test chassis is generally totally enclosed frame, as shown in Figure 1, in maintainability test process, can cause certain maintenance difficult to Maintenance Engineer: when board, in energising test process, met mistake, now slip-stick artist cannot remove to judge the erroneous bearin of board with various surveying instruments and be which electronic devices and components is out of joint in board galvanization.
In order to allow Maintenance Engineer more can find quickly and easily error reason in maintenance process, need to improve test chassis.
Summary of the invention
Object of the present invention is exactly to provide a kind of semi-open-type test chassis in order to overcome the defect of above-mentioned prior art existence, can find to more convenient and quicker the fault of test board in maintenance process, has improved maintenance efficiency.
Object of the present invention can be achieved through the following technical solutions:
A kind of semi-open-type test chassis, comprise pedestal, gusset plate and top panel, described top panel is connected with pedestal by gusset plate, and described pedestal, gusset plate, top panel are enclosed to form a cavity, described pedestal is provided with test board, and described top panel is provided with opening.
Described opening be shaped as rectangle.
Described opening is provided with 1～3, distributes and is arranged on top panel.
Described gusset plate is provided with for inserting the slot of test board.
Described gusset plate is provided with electrical power connection block.
Compared with prior art, the present invention arranges opening on the top panel of test chassis, in maintenance process, under can be the easily random state that is stuck in energising at test board, measure, solved maintenance personal in maintenance process because the data that can not get occurring under energising situation and the difficulty of the root of correct decision problem fast, can really accelerate the progress of maintenance, guarantee the time of shipment.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing test chassis;
Fig. 2 is the structural representation of frame of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in detail.The present embodiment be take technical solution of the present invention and is implemented as prerequisite, provided detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following embodiment.
As shown in Figure 2, a kind of semi-open-type test chassis, comprise pedestal, gusset plate 1 and top panel 2, described top panel 2 is connected with pedestal by gusset plate 1, described pedestal, gusset plate 1, top panel 2 are enclosed to form a cavity, described pedestal is provided with test board, and described top panel 2 is provided with opening 3.Described opening 3 be shaped as rectangle, can arrange as required 1～3, be distributed on top panel.The present embodiment opening is provided with two.Described gusset plate is provided with for inserting slot and the electrical power connection block of test board.
Use frame of the present invention, Maintenance Engineer can just directly can use surveying instrument to measure board under test board cartoon electricity situation, can correctly judge rapidly the root going wrong in test board, has improved maintenance efficiency, has guaranteed ETCD estimated time of commencing discharging.
Claims (5)
1. a semi-open-type test chassis, comprises pedestal, gusset plate and top panel, and described top panel is connected with pedestal by gusset plate, described pedestal, gusset plate, top panel are enclosed to form a cavity, described pedestal is provided with test board, it is characterized in that, described top panel is provided with opening.
2. a kind of semi-open-type test chassis according to claim 1, is characterized in that, described opening be shaped as rectangle.
3. a kind of semi-open-type test chassis according to claim 1, is characterized in that, described opening is provided with 1～3, distributes and is arranged on top panel.
4. a kind of semi-open-type test chassis according to claim 1, is characterized in that, described gusset plate is provided with for inserting the slot of test board.
5. a kind of semi-open-type test chassis according to claim 1, is characterized in that, described gusset plate is provided with electrical power connection block.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310185800.0A CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310185800.0A CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104167225A true CN104167225A (en) | 2014-11-26 |
| CN104167225B CN104167225B (en) | 2016-09-07 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310185800.0A Active CN104167225B (en) | 2013-05-17 | 2013-05-17 | A kind of semi-open-type test chassis |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104167225B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101126649A (en) * | 2007-09-27 | 2008-02-20 | 成都多沐汽车工程有限公司 | Adjustable firmware device of detecting rack for measuring |
| KR100890174B1 (en) * | 2007-10-02 | 2009-03-25 | 주식회사 이노와이어리스 | Measuring instrument with pront panel opened and closed slidably |
| US20100275687A1 (en) * | 2009-04-30 | 2010-11-04 | Koh Young Technology Inc. | Housing for a measuring equipment and measuring equipment having the same |
| CN102594962A (en) * | 2012-03-05 | 2012-07-18 | 东莞市每通电子科技有限公司 | Testing system for mobile terminal and testing method thereof |
| CN102879029A (en) * | 2012-09-29 | 2013-01-16 | 苏州新里程电控系统有限公司 | Control wheel debugging table |
| CN102901528A (en) * | 2012-09-25 | 2013-01-30 | 昆山荣科钣金科技有限公司 | Testing machine frame and manufacture process thereof |
-
2013
- 2013-05-17 CN CN201310185800.0A patent/CN104167225B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101126649A (en) * | 2007-09-27 | 2008-02-20 | 成都多沐汽车工程有限公司 | Adjustable firmware device of detecting rack for measuring |
| KR100890174B1 (en) * | 2007-10-02 | 2009-03-25 | 주식회사 이노와이어리스 | Measuring instrument with pront panel opened and closed slidably |
| US20100275687A1 (en) * | 2009-04-30 | 2010-11-04 | Koh Young Technology Inc. | Housing for a measuring equipment and measuring equipment having the same |
| CN102594962A (en) * | 2012-03-05 | 2012-07-18 | 东莞市每通电子科技有限公司 | Testing system for mobile terminal and testing method thereof |
| CN102901528A (en) * | 2012-09-25 | 2013-01-30 | 昆山荣科钣金科技有限公司 | Testing machine frame and manufacture process thereof |
| CN102879029A (en) * | 2012-09-29 | 2013-01-16 | 苏州新里程电控系统有限公司 | Control wheel debugging table |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104167225B (en) | 2016-09-07 |
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